[go: up one dir, main page]

Son - Google Patents

SPAD-based Light Detection and Ranging for 3D imaging

Son

View PDF
Document ID
14744029019067247976
Author
Son D

External Links

Snippet

I wish to take this opportunity to express my sincerest gratitude to a group of precious and dear people. My foremost gratitude goes undoubtedly to Dr. Muhammed Bolatkale. His invaluable academic advices have indisputably played a significant role in this work …
Continue reading at repository.tudelft.nl (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/335Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
    • H04N5/369SSIS architecture; Circuitry associated therewith
    • H04N5/374Addressed sensors, e.g. MOS or CMOS sensors
    • H04N5/3745Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material

Similar Documents

Publication Publication Date Title
Piron et al. A review of single-photon avalanche diode time-of-flight imaging sensor arrays
Hu et al. A 32× 32-pixel flash LiDAR sensor with noise filtering for high-background noise applications
Charbon et al. SPAD-based sensors
Villa et al. SPAD smart pixel for time-of-flight and time-correlated single-photon counting measurements
Al Abbas et al. A CMOS SPAD sensor with a multi-event folded flash time-to-digital converter for ultra-fast optical transient capture
Ceccarelli et al. Fully integrated active quenching circuit driving custom-technology SPADs with 6.2-ns dead time
Seo et al. A time-resolved four-tap lock-in pixel CMOS image sensor for real-time fluorescence lifetime imaging microscopy
Aull et al. Three-dimensional imaging with arrays of Geiger-mode avalanche photodiodes
Gersbach et al. A parallel 32× 32 time-to-digital converter array fabricated in a 130 nm imaging CMOS technology
Keränen et al. $256\times8 $ SPAD array with 256 column TDCs for a line profiling laser radar
Morrison et al. A 64× 64 SPAD flash LIDAR sensor using a triple integration timing technique with 1.95 mm depth resolution
Conca et al. Gated SPAD arrays for single-photon time-resolved imaging and spectroscopy
Dandin et al. Characterization of Single-Photon Avalanche Diodes in a 0.5-$\mu\text {m} $ Standard CMOS Process—Part 2: Equivalent Circuit Model and Geiger Mode Readout
Baba et al. Development of an InGaAs SPAD 2D array for flash LIDAR
Riccardo et al. Fast-gated 16× 16 spad array with 16 on-chip 6 ps time-to-digital converters for non-line-of-sight imaging
Liu et al. A 16-channel analog CMOS SiPM with on-chip front-end for D-ToF LiDAR
Sesta et al. Range-finding SPAD array with smart laser-spot tracking and TDC sharing for background suppression
Incoronato et al. Single-shot pulsed-lidar spad sensor with on-chip peak detection for background rejection
Eshkoli et al. Characterization and Architecture of Monolithic N⁺ P-CMOS-SiPM Array for ToF Measurements
Vornicu et al. Compact CMOS active quenching/recharge circuit for SPAD arrays
Mandai et al. A 128-channel, 9ps column-parallel two-stage TDC based on time difference amplification for time-resolved imaging
Zappa et al. MiSPIA: microelectronic single-photon 3D imaging arrays for low-light high-speed safety and security applications
Seo et al. Multievent histogramming TDC with pre–post weighted histogramming filter for CMOS LiDAR sensors
Sergio et al. A 128/spl times/2 CMOS Single-Photon Streak Camera with Timing-Preserving Latchless Pipeline Readout
Charbon et al. Monolithic single-photon avalanche diodes: SPADs