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Xu et al., 2005 - Google Patents

Resource-constrained system-on-a-chip test: a survey

Xu et al., 2005

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Document ID
4546111133501439184
Author
Xu Q
Nicolici N
Publication year
Publication venue
IEE Proceedings-Computers and Digital Techniques

External Links

Snippet

Manufacturing test is a key step in the implementation flow of modern integrated electronic products. It certifies the product quality, accelerates yield learning and influences the final cost of the device. With the ongoing shift towards the core-based system-on-a-chip (SOC) …
Continue reading at www.cse.cuhk.edu.hk (PDF) (other versions)

Classifications

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    • G01—MEASURING; TESTING
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
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    • G01R31/318555—Control logic
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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    • G—PHYSICS
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31718—Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
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    • G06F17/50—Computer-aided design
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    • G—PHYSICS
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere

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