Berndt, 1998 - Google Patents
Photon emission from the scanning tunneling microscopeBerndt, 1998
- Document ID
- 466453737754483347
- Author
- Berndt R
- Publication year
- Publication venue
- Scanning Probe Microscopy: Analytical Methods
External Links
Snippet
Much of the fascination of Scanning Tunneling Microscopy (STM) results from its ability to directly image atomic and molecular structures of a wide variety of materials. Since its inception, one purpose of STM has been to go beyond imaging by performing local …
- 230000005641 tunneling 0 title abstract description 266
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANO-TECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
- B82Y10/00—Nano-technology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/813—Of specified inorganic semiconductor composition, e.g. periodic table group IV-VI compositions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/949—Radiation emitter using nanostructure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANO-TECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
- B82Y30/00—Nano-technology for materials or surface science, e.g. nano-composites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANO-TECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
- B82Y20/00—Nano-optics, e.g. quantum optics or photonic crystals
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Müller et al. | Monitoring surface charge migration in the spectral dynamics of single Cd Se∕ Cd S nanodot/nanorod heterostructures | |
| Berndt et al. | Photon emission in scanning tunneling microscopy: Interpretation of photon maps of metallic systems | |
| Alvarado et al. | Luminescence in scanning tunneling microscopy on iii–v nanostructures | |
| Heitz et al. | Quantum size effect in self-organized InAs/GaAs quantum dots | |
| Jdira et al. | Size-dependent single-particle energy levels and interparticle Coulomb interactions in CdSe quantum dots measured by scanning tunneling spectroscopy | |
| Berndt et al. | Inelastic tunneling excitation of tip-induced plasmon modes on noble-metal surfaces | |
| Ortner et al. | Control of vertically coupled InGaAs/GaAs quantum dots with electric fields | |
| Ogletree et al. | Revealing optical properties of reduced‐dimensionality materials at relevant length scales | |
| Liljeroth et al. | Can scanning tunnelling spectroscopy measure the density of states of semiconductor quantum dots? | |
| Kociak et al. | Nanoscale mapping of plasmons, photons, and excitons | |
| Loth et al. | Probing semiconductor gap states with resonant tunneling | |
| Peric et al. | Van Hove singularities and trap states in two-dimensional CdSe nanoplatelets | |
| Lienau et al. | Nanoscale mapping of confinement potentials in single semiconductor quantum wires by near-field optical spectroscopy | |
| Berndt | Photon emission from the scanning tunneling microscope | |
| Berndt | Scanning Tunneling Microscopy | |
| Ries | Optical analysis of InN and InGaN nanostructures | |
| Yu et al. | High-resolution near-field spectroscopy of InAs single quantum dots at 70 K | |
| Polovodov | Cathodoluminescence in semiconductor structures under local tunneling electron injection | |
| Babiński et al. | Electrically modulated photoluminescence in self-organized InGaAs/GaAs quantum dots | |
| Rader et al. | An Elastic “Sieve” to Probe Momentum Space: Gd Chains on W (110) | |
| Zrenner et al. | Optical and magneto-optical investigations on single-quantum dots | |
| Cockins et al. | Spatially resolved low-frequency noise measured by atomic force microscopy | |
| Tararan | Spectroscopy in fragile 2D materials: from Graphene Oxide to single molecules at hexagonal Boron Nitride | |
| Bolotov et al. | Electronic properties of assembled islands of hydrogen-saturated silicon clusters on Si (111)-(7 x 7) surfaces studied by scanning tunneling spectroscopy | |
| 임성준 | Electronic Structure and Blinking Kinetics of Single CdSe Quantum Dots Studied with Scanning Tunneling Microcopy and Spectroscopy |