Nair et al., 2016 - Google Patents
XED: Exposing on-die error detection information for strong memory reliabilityNair et al., 2016
View PDF- Document ID
- 525037832865279498
- Author
- Nair P
- Sridharan V
- Qureshi M
- Publication year
- Publication venue
- ACM SIGARCH Computer Architecture News
External Links
Snippet
Large-granularity memory failures continue to be a critical impediment to system reliability. To make matters worse, as DRAM scales to smaller nodes, the frequency of unreliable bits in DRAM chips continues to increase. To mitigate such scaling-related failures, memory …
- 230000015654 memory 0 title abstract description 125
Classifications
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- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
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