[go: up one dir, main page]

Claasen, 2006 - Google Patents

An industry perspective on current and future state of the art in system-on-chip (SoC) technology

Claasen, 2006

Document ID
5368203036418498963
Author
Claasen T
Publication year
Publication venue
Proceedings of the IEEE

External Links

Snippet

In fast-moving consumer electronics markets where product lifetimes may be measured in months rather than years, fast time-to-market development of the system-on-chip solutions that lie at the heart of these products has become critical to commercial success. New …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/78—Power analysis and optimization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for programme control, e.g. control unit
    • G06F9/06—Arrangements for programme control, e.g. control unit using stored programme, i.e. using internal store of processing equipment to receive and retain programme
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application

Similar Documents

Publication Publication Date Title
Claasen An industry perspective on current and future state of the art in system-on-chip (SoC) technology
Master The next big leap in reconfigurable systems
Parkhurst et al. From single core to multi-core: preparing for a new exponential
Saleh et al. System-on-chip: Reuse and integration
Sgroi et al. Addressing the system-on-a-chip interconnect woes through communication-based design
Henkel A low power hardware/software partitioning approach for core-based embedded systems
Edenfeld et al. 2003 technology roadmap for semiconductors
US7032191B2 (en) Method and architecture for integrated circuit design and manufacture
CN113544688A (en) System and method for designing integrated circuits
US7451426B2 (en) Application specific configurable logic IP
Zhu et al. Design automation and test solutions for monolithic 3D ICs
Sun et al. Estimating power, performance, and area for on-sensor deployment of ar/vr workloads using an analytical framework
Veendrick Effects of Scaling on MOS IC Design and Consequences for the Roadmap
Xiu VLSI circuit design methodology demystified: a conceptual taxonomy
Chakravarthi et al. Introduction to design of system on chips and future trends in VLSI
Ye et al. Power consumption in XOR-based circuits
Kim et al. Architectural implications of brick and mortar silicon manufacturing
Lu Emerging technology and business solutions for system chips
Vai et al. Application-specific integrated circuits
Leo Joseph et al. Efficient Architectures and Trade‐Offs for FPGA‐Based Real‐Time Systems
Watson Adaptive computing IC technology enables SDR and multifunctionality in next-generation wireless devices
Madisetti Electronic system, platform, and package codesign
Rezaee et al. Building an OTFT PDK and Its Integration in Open Source EDA Tools
Zhang et al. The changing landscape of micro/nanoelectronics
Gopalakrishnan Energy Reduction for Asynchronous Circuits in SoC Applications