Schoenwetter, 1989 - Google Patents
Recent developments in digital oscilloscopesSchoenwetter, 1989
- Document ID
- 7197235056375157691
- Author
- Schoenwetter H
- Publication year
- Publication venue
- 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference
External Links
Snippet
The author reviews the latest developments in digital storage oscilloscopes (DSOs) as reported in the literature. DSOs are used to digitize and store waveforms, which can be compared, analyzed, and manipulated. DSO capabilities usually include programmability …
- 230000018109 developmental process 0 title abstract description 4
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's, e.g. LCD's
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's, e.g. LCD's
- G01R13/22—Circuits therefor
- G01R13/32—Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for sychronisation; Circuits for time-base expansion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
- G01R13/0254—Circuits therefor for triggering, synchronisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuit
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuit
- G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/029—Software therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0086305A1 (en) | Signal sampling system | |
| US5444459A (en) | Signal acquisition system utilizing ultra-wide time range time base | |
| US5854996A (en) | Logic signal extraction | |
| CN101144835A (en) | An Equivalent Sampling Device | |
| US6137749A (en) | Apparatus and method for measuring time intervals with very high resolution | |
| US6271773B1 (en) | Coherent sampling method and apparatus | |
| US5180971A (en) | Method and apparatus for increasing throughput in random repetitive digitizing systems | |
| US5578917A (en) | Repetitive digital sampling circuit using two delay lines for improved time accuracy | |
| US4654584A (en) | High-speed precision equivalent time sampling A/D converter and method | |
| US7746058B2 (en) | Sequential equivalent—time sampling with an asynchronous reference clock | |
| Pereira | The history and technology of oscilloscopes | |
| US5731984A (en) | Vector-based waveform acquisition and display | |
| US4733167A (en) | Measurement circuit for digital to analog converter | |
| Schoenwetter | Recent developments in digital oscilloscopes | |
| Lee et al. | A 16ps-resolution random equivalent sampling circuit for TDR utilizing a Vernier time delay generation | |
| US3634755A (en) | System to measure the frequency domain response of a radar component | |
| US6998834B2 (en) | Real-time time drift adjustment for a TDR step stimulus | |
| EP0444875B1 (en) | Method and apparatus for increasing throughput in random repetitive digitizing systems | |
| GB2337882A (en) | Testing analog to digital converters | |
| Hickman | Digital storage oscilloscopes | |
| JPH0454198B2 (en) | ||
| Schaub et al. | 13ghz on-chip oscilloscope with sub-picosecond resolution using asynchronous clock | |
| US3704416A (en) | Sequential sampling system | |
| Šíra | Noise and stability of Fluke 8588A in digitizing mode | |
| Breton et al. | 14-Bit and 2GS/s Low Power Digitizing Boards for Physics Experiments |