Moczała et al., 2014 - Google Patents
Investigation of multi-junction solar cells using electrostatic force microscopy methodsMoczała et al., 2014
- Document ID
- 8419280214384084128
- Author
- Moczała M
- Sosa N
- Topol A
- Gotszalk T
- Publication year
- Publication venue
- Ultramicroscopy
External Links
Snippet
Multi-junction III–V solar cells are designed to have a much broader absorption of the solar spectrum than Si-based or single junctions, thus yield the highest conversion. The conversion efficiency can be further scaled with sun concentration. The ability of high …
- 238000004667 electrostatic force microscopy 0 title abstract description 13
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GASES [GHG] EMISSION, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/54—Material technologies
- Y02E10/549—Material technologies organic PV cells
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infra-red, visible or ultra-violet radiation
- H01L31/102—Devices sensitive to infra-red, visible or ultra-violet radiation characterised by only one potential barrier or surface barrier
- H01L31/105—Devices sensitive to infra-red, visible or ultra-violet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the PIN type
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0304—Inorganic materials including, apart from doping materials or other impurities, only AIIIBV compounds
- H01L31/03046—Inorganic materials including, apart from doping materials or other impurities, only AIIIBV compounds including ternary or quaternary compounds, e.g. GaAlAs, InGaAs, InGaAsP
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/02016—Circuit arrangements of general character for the devices
- H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Qiu et al. | Laser beam induced current microscopy and photocurrent mapping for junction characterization of infrared photodetectors | |
| Mikulik et al. | Conductive-probe atomic force microscopy as a characterization tool for nanowire-based solar cells | |
| Moczała et al. | Investigation of multi-junction solar cells using electrostatic force microscopy methods | |
| US10158325B2 (en) | Inspection apparatus and inspection method | |
| CN102353815A (en) | Device and method for measuring surface local electronic state of material | |
| Pan et al. | Optoelectronic properties of semiconductor nanowires | |
| Leite et al. | Mapping the local photoelectronic properties of polycrystalline solar cells through high resolution laser-beam-induced current microscopy | |
| Schnedler et al. | Quantitative description of photoexcited scanning tunneling spectroscopy and its application to the GaAs (110) surface | |
| Barrigon et al. | Unravelling processing issues of nanowire-based solar cell arrays by use of electron beam induced current measurements | |
| Atamanuk et al. | Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics | |
| Tománek et al. | Detection and localization of defects in monocrystalline silicon solar cell | |
| Kong et al. | Performance evaluation of multi-junction solar cells by spatially resolved electroluminescence microscopy | |
| Narchi et al. | Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias | |
| Khoury et al. | Observation of photovoltaic effect within locally doped silicon nanojunctions using conductive probe AFM | |
| Xiao et al. | Near-field transport imaging applied to photovoltaic materials | |
| Yong et al. | Dependence of Photovoltage on Incident Photon Energies Investigated by Photo-assisted Kelvin Probe Force Microscopy on Cu (In, Ga) Se 2 Solar Cells | |
| Zhang et al. | Haynes-Shockley experiment analogs in surface and optoelectronics: Tunable surface electric field extracting nearly all photocarriers | |
| Narchi | Investigation of crystalline silicon solar cells at the nano-scale using scanning probe microscopy techniques | |
| Dobryden et al. | Nanoscale characterization of an all-oxide core–shell nanorod heterojunction using intermodulation atomic force microscopy (AFM) methods | |
| da Lisca | Local probe microscopies for the study of photovoltaic materials and structures | |
| Tománek et al. | Local optical and electric characteristics of solar cells | |
| Kwarikunda et al. | Application of LBIC measurements for characterisation of triple junction solar cells | |
| Xu et al. | Exploring Nanoscale Photoresponse Mechanisms for Enhanced Photothermoelectric Effects in van der Waals Interfaces | |
| da Lisca et al. | Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination | |
| Madl et al. | High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots |