Rathburn, 1994 - Google Patents

Classifications

• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F11/00—Error detection; Error correction; Monitoring
  • G06F11/36—Preventing errors by testing or debugging software
  • G06F11/3668—Software testing
  • G06F11/3672—Test management
  • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F11/00—Error detection; Error correction; Monitoring
  • G06F11/36—Preventing errors by testing or debugging software
  • G06F11/3664—Environments for testing or debugging software
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F11/00—Error detection; Error correction; Monitoring
  • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
  • G06F11/26—Functional testing
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F11/00—Error detection; Error correction; Monitoring
  • G06F11/36—Preventing errors by testing or debugging software
  • G06F11/362—Software debugging
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
  • G01R31/317—Testing of digital circuits
  • G01R31/3181—Functional testing
  • G01R31/319—Tester hardware, i.e. output processing circuit
  • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
  • G01R31/31912—Tester/user interface
• • G—PHYSICS
  • G05—CONTROLLING; REGULATING
  • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
  • G05B19/00—Programme-control systems
  • G05B19/02—Programme-control systems electric
  • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
  • G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
• • G—PHYSICS
  • G05—CONTROLLING; REGULATING
  • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
  • G05B19/00—Programme-control systems
  • G05B19/02—Programme-control systems electric
  • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
  • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
  • G05B19/0426—Programming the control sequence
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
  • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F8/00—Arrangements for software engineering
  • G06F8/30—Creation or generation of source code
  • G06F8/34—Graphical or visual programming
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F9/00—Arrangements for programme control, e.g. control unit
  • G06F9/06—Arrangements for programme control, e.g. control unit using stored programme, i.e. using internal store of processing equipment to receive and retain programme
  • G06F9/44—Arrangements for executing specific programmes
  • G06F9/4443—Execution mechanisms for user interfaces
• • G—PHYSICS
  • G06—COMPUTING; CALCULATING; COUNTING
  • G06F—ELECTRICAL DIGITAL DATA PROCESSING
  • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
  • G06F17/50—Computer-aided design
  • G06F17/5009—Computer-aided design using simulation
• • G—PHYSICS
  • G05—CONTROLLING; REGULATING
  • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
  • G05B2219/00—Program-control systems
• • G—PHYSICS
  • G05—CONTROLLING; REGULATING
  • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
  • G05B23/00—Testing or monitoring of control systems or parts thereof
  • G05B23/02—Electric testing or monitoring
  • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
  • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
  • G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system

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