Jehle et al., 2014 - Google Patents
Optimal lighting for defect detection: illumination systems, machine learning, and practical verificationJehle et al., 2014
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- 10088591217093160810
- Author
- Jehle M
- Jähne B
- Publication year
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- Forum Bildverarbeitung
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Snippet
We propose a novel approach for defect detection based on illumination series data and machine learning. Illumination series are acquired using a device which allows for generating of arbitrary illumination environments by projecting illumination patterns onto a …
- 238000005286 illumination 0 title abstract description 55
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