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Jehle et al., 2014 - Google Patents

Optimal lighting for defect detection: illumination systems, machine learning, and practical verification

Jehle et al., 2014

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Document ID
10088591217093160810
Author
Jehle M
Jähne B
Publication year
Publication venue
Forum Bildverarbeitung

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Snippet

We propose a novel approach for defect detection based on illumination series data and machine learning. Illumination series are acquired using a device which allows for generating of arbitrary illumination environments by projecting illumination patterns onto a …
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Classifications

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    • G06COMPUTING; CALCULATING; COUNTING
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    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/00127Acquiring and recognising microscopic objects, e.g. biological cells and cellular parts
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    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/57Measuring gloss
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