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Holst et al., 2009 - Google Patents

A diagnosis algorithm for extreme space compaction

Holst et al., 2009

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Document ID
10639813907307817747
Author
Holst S
Wunderlich H
Publication year
Publication venue
2009 Design, Automation & Test in Europe Conference & Exhibition

External Links

Snippet

During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including built- in self-test (BIST) and multi-site testing are quite effective cost reduction techniques which …
Continue reading at past.date-conference.com (PDF) (other versions)

Classifications

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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318335—Test pattern compression or decompression
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
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    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
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    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
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    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
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    • G—PHYSICS
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    • G—PHYSICS
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    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair

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