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Chen et al., 2011 - Google Patents

A two-phase dynamic dispatching approach to semiconductor wafer testing

Chen et al., 2011

Document ID
10756968153572439970
Author
Chen Y
Lin J
Chen T
Publication year
Publication venue
Robotics and Computer-Integrated Manufacturing

External Links

Snippet

There have been numerous advancements and rising competition in semiconductor technologies. In light of this, the wafer test plays a more significant role in providing the most prompt yield feedback for quick process improvement. However, the wafer test shop floor is …
Continue reading at www.sciencedirect.com (other versions)

Classifications

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