Janesick et al., 2014 - Google Patents
Mk x Nk gated CMOS imagerJanesick et al., 2014
View PDF- Document ID
- 10823120288750133350
- Author
- Janesick J
- Elliott T
- Andrews J
- Tower J
- Bell P
- Teruya A
- Kimbrough J
- Bishop J
- Publication year
- Publication venue
- Target diagnostics physics and engineering for inertial confinement fusion III
External Links
Snippet
Our paper will describe a recently designed Mk x Nk x 10 um pixel CMOS gated imager intended to be first employed at the LLNL National Ignition Facility (NIF). Fabrication involves stitching MxN 1024x1024x10 um pixel blocks together into a monolithic imager …
- 238000000034 method 0 abstract description 13
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/374—Addressed sensors, e.g. MOS or CMOS sensors
- H04N5/3745—Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/378—Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/357—Noise processing, e.g. detecting, correcting, reducing or removing noise
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/222—Studio circuitry; Studio devices; Studio equipment; Cameras comprising an electronic image sensor, e.g. digital cameras, video cameras, TV cameras, video cameras, camcorders, webcams, camera modules for embedding in other devices, e.g. mobile phones, computers or vehicles
- H04N5/225—Television cameras; Cameras comprising an electronic image sensor, e.g. digital cameras, video cameras, video cameras, camcorders, webcams, camera modules for embedding in other devices, e.g. mobile phones, computers or vehicles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems
- H04N3/10—Scanning details of television systems by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Claus et al. | An overview of the Ultrafast X-ray Imager (UXI) program at Sandia Labs | |
| Claus et al. | Design and characterization of an improved, 2 ns, multi-frame imager for the Ultra-Fast X-ray Imager (UXI) program at Sandia National Laboratories | |
| Bautz et al. | Toward fast, low-noise charge-coupled devices for Lynx | |
| Janesick et al. | Mk x Nk gated CMOS imager | |
| Drlica-Wagner et al. | Characterization of skipper CCDs for cosmological applications | |
| Hull et al. | Hybrid CMOS detectors for the Lynx x-ray surveyor high definition x-ray imager | |
| Tsuru et al. | Development and performance of Kyoto's x-ray astronomical SOI pixel (SOIPIX) sensor | |
| Miller et al. | The high-speed X-ray camera on AXIS | |
| Short et al. | The Euclid VIS CCD detector design, development, and programme status | |
| Bush et al. | Measurement and optimization of clock-induced charge in electron multiplying charge-coupled devices | |
| Otero et al. | Capella: CIS120 general purpose CMOS sensor for space applications | |
| Boulenc et al. | High speed TDI embedded CCD in CMOS sensor | |
| Greffe et al. | Characterization of low light performance of a complementary metal-oxide semiconductor sensor for ultraviolet astronomical applications | |
| Gallagher et al. | Characterizing radiation-tolerant single photon resolving CMOS detectors | |
| Maffessanti et al. | A 64k pixel CMOS-DEPFET module for the soft X-rays DSSC imager operating at MHz-frame rates | |
| Kenter et al. | Advancing the technology of monolithic CMOS detectors for use as x-ray imaging spectrometers | |
| Prigozhin et al. | Development of large, fast, low noise x-ray CCD for future space missions | |
| Bähr et al. | Development of DEPFET active pixel sensors to improve the spectroscopic response for high time resolution applications | |
| Kwiatkowski et al. | Ultra-fast high-resolution hybrid and monolithic CMOS imagers in multi-frame radiography | |
| JP2001111020A (en) | Imaging device and imaging system | |
| Trunk et al. | AGIPD: A multi megapixel, multi megahertz X-ray camera for the European XFEL | |
| Lofthouse-Smith et al. | Image lag optimisation in a 4T CMOS image sensor for the JANUS camera on ESA's JUICE mission to Jupiter | |
| Lin et al. | Sub-electron noise multi-amplifier sensing CCDs for spectroscopy | |
| Turchetta et al. | CMOS monolithic active pixel sensors (MAPS): Developments and future outlook | |
| Chen et al. | Radiation effects on scientific complementary metal-oxide-semiconductor detectors for x-ray astronomy: II. Total ionizing dose irradiation |