[go: up one dir, main page]

Marin et al., 2019 - Google Patents

A Robust BBPLL-Based 0.18-$\mu $ m CMOS Resistive Sensor Interface With High Drift Resilience Over a− 40° C–175° C Temperature Range

Marin et al., 2019

Document ID
11423321012752029693
Author
Marin J
Sacco E
Vergauwen J
Gielen G
Publication year
Publication venue
IEEE Journal of Solid-State Circuits

External Links

Snippet

This paper presents a drift-resilient time-based resistive sensor interface in a 0.18-μm CMOS technology. The interface is built around only two oscillators, a phase detector, a digital filter, and a digital-to-analog converter (DAC), resulting in a simple first-order Delta-Sigma design …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00Conversion of analogue values to or from differential modulation
    • H03M3/30Delta-sigma modulation
    • H03M3/39Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
    • H03M3/412Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution
    • H03M3/422Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution having one quantiser only
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0678Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/36Analogue value compared with reference values simultaneously only, i.e. parallel type
    • H03M1/361Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66Digital/analogue converters
    • H03M1/74Simultaneous conversion
    • H03M1/80Simultaneous conversion using weighted impedances
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1009Calibration
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers

Similar Documents

Publication Publication Date Title
Marin et al. A Robust BBPLL-Based 0.18-$\mu $ m CMOS Resistive Sensor Interface With High Drift Resilience Over a− 40° C–175° C Temperature Range
CN110377093B (en) Sensor circuit, corresponding system and method
Park et al. A 78 dB SNDR 87 mW 20 MHz bandwidth continuous-time $\Delta\Sigma $ ADC With VCO-based integrator and quantizer implemented in 0.13$\mu $ m CMOS
Pan et al. A 0.25 mm 2-Resistor-Based Temperature Sensor With an Inaccuracy of 0.12° C (3$\sigma $) From− 55° C to 125° C
Van Rethy et al. Supply-noise-resilient design of a BBPLL-based force-balanced wheatstone bridge interface in 130-nm CMOS
Wu et al. A 20-b $\pm $40-mV Range Read-Out IC With 50-nV Offset and 0.04% Gain Error for Bridge Transducers
Zare-Hoseini et al. Modeling of switched-capacitor delta-sigma modulators in SIMULINK
CN204831597U (en) Integrated temperature sensor circuit on piece
Tang et al. A CMOS temperature sensor with versatile readout scheme and high accuracy for multi-sensor systems
US20210218411A1 (en) Successive approximation register (sar) analog to digital converter (adc)
Sacco et al. A 16.1-bit resolution 0.064-mm 2 compact highly digital closed-loop single-VCO-based 1-1 sturdy-MASH resistance-to-digital converter with high robustness in 180-nm CMOS
Son et al. A low-power wide dynamic-range current readout circuit for ion-sensitive FET sensors
Sacco et al. A 96.9-dB-resolution 109-μW second-order robust closed-loop VCO-based sensor interface for multiplexed single-ended resistance readout in 180-nm CMOS
de La Fuente-Cortes et al. A new CMOS comparator robust to process and temperature variations for SAR ADC converters
Wang et al. Design and implementation of a rail-to-rail 460-kS/s 10-bit SAR ADC for the power-efficient capacitance measurement
CN119509726A (en) A high-precision integrated temperature sensor circuit and its application
Marin et al. Digital-domain chopping technique for high-resolution PLL-based sensor interfaces
Gupta et al. Implementation of low supply rail-to-rail differential voltage comparator on flexible hardware for a flash adc
Koay et al. A 0.18-$\mu $ m CMOS Voltage-to-Frequency Converter With Low Circuit Sensitivity
CN110542849B (en) Full MOS voltage and temperature monitoring method and circuit
Marin et al. A Single-Temperature-Calibration 0.18-µm CMOS Time-Based Resistive Sensor Interface with Low Drift over a− 40° C to 175° C Temperature Range
Marin et al. Modeling and analysis of drift-cancellation techniques for time-based integrated resistive sensor interfaces
Reverter et al. Advanced techniques for directly interfacing resistive sensors to digital systems
Gielen et al. Time-encoding VCO-ADCs for Integrated Systems-on-Chip
Woestyn et al. A selectable-bandwidth 3.5 mW, 0.03 mm2 self-oscillating Sigma Delta modulator with 71 dB dynamic range at 5 MHz and 65 dB at 10 MHz bandwidth