Goldmann et al., 1994 - Google Patents
Photoelectron microspectroscopy using laboratory UV-photon sourcesGoldmann et al., 1994
- Document ID
- 12899410555619367331
- Author
- Goldmann A
- Kürpick U
- Publication year
- Publication venue
- Progress in Surface Science
External Links
Snippet
We present a survey on successful recent developments of laterally resolved ultraviolet  photoelectron spectroscopy (LARUPS). The particular advantages and shortcomings of  several attempts are compared. Results are presented which demonstrate the realisation of … 
    - 238000002229 photoelectron microspectroscopy 0 title description 3
Classifications
- 
        - H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
 
- 
        - G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
 
- 
        - H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
 
Similar Documents
| Publication | Publication Date | Title | 
|---|---|---|
| EP0669635B1 (en) | Scanning imaging high resolution electron spectroscopy | |
| Tonner et al. | Photoelectron microscopy with synchrotron radiation | |
| Nordgren et al. | Soft x‐ray emission spectroscopy using monochromatized synchrotron radiation | |
| US7714285B2 (en) | Spectrometer for surface analysis and method therefor | |
| Schueler et al. | A time-of-flight secondary ion microscope | |
| Denlinger et al. | First results from the SpectroMicroscopy beamline at the Advanced Light source | |
| EP0243060B1 (en) | A charged particle energy analyser | |
| EP0293924B1 (en) | Direct imaging monochromatic electron microscope | |
| US4916721A (en) | Normal incidence X-ray mirror for chemical microanalysis | |
| Warwick et al. | Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source | |
| Ding et al. | X‐ray source for x‐ray microfluorescence using a monolithic x‐ray focusing lens combined with aperture optics | |
| Beiersdorfer et al. | High‐resolution bent‐crystal spectrometer for the ultrasoft x‐ray region | |
| Goldmann et al. | Photoelectron microspectroscopy using laboratory UV-photon sources | |
| EP0617453B1 (en) | Charged particle analyser | |
| GB2268802A (en) | Photo-electron spectroscopy apparatus | |
| Tarrio et al. | The new NIST/ARPA national soft X-ray reflectometry facility | |
| Vis et al. | On the development of X-ray microprobes using synchrotron radiation | |
| EP0295653B1 (en) | High luminosity spherical analyzer for charged particles | |
| US4882487A (en) | Direct imaging monochromatic electron microscope | |
| Johnson | Electron energy loss microanalysis system with high collection efficiency | |
| Kürpick et al. | Ultraviolet photoelectron spectroscopy with energy-resolved imaging | |
| Niemann | X-ray microscopy with the Göttingen scanning x-ray microscope at 2.4 nm | |
| Knapp et al. | A high energy resolution, high spatial resolution photoemission microscope | |
| Kiyokura et al. | Submicrometre-area high-energy-resolution photoelectron spectroscopy system | |
| Ando et al. | X-Ray Magnetic Microspectroscopy Using the Circularly Polarized Undulator Radiation at the TRISTAN Accumulation Ring |