[go: up one dir, main page]

He et al., 2015 - Google Patents

Electron correlation microscopy: a new technique for studying local atom dynamics applied to a supercooled liquid

He et al., 2015

View PDF
Document ID
15098006684747621773
Author
He L
Zhang P
Besser M
Kramer M
Voyles P
Publication year
Publication venue
Microscopy and Microanalysis

External Links

Snippet

Electron correlation microscopy (ECM) is a new technique that utilizes time-resolved coherent electron nanodiffraction to study dynamic atomic rearrangements in materials. It is the electron scattering equivalent of photon correlation spectroscopy with the added …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material

Similar Documents

Publication Publication Date Title
He et al. Electron correlation microscopy: a new technique for studying local atom dynamics applied to a supercooled liquid
Idell et al. Unexpected δ-phase formation in additive-manufactured Ni-based superalloy
Yamashita et al. Atomic number dependence of Z contrast in scanning transmission electron microscopy
Lefebvre et al. Nanoscale periodic gradients generated by laser powder bed fusion of an AlSi10Mg alloy
Viladot et al. Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art results
Yurtsever et al. 4D nanoscale diffraction observed by convergent-beam ultrafast electron microscopy
Jensen et al. X-ray microscopy in four dimensions
Dycus et al. Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy
Ahmad et al. Disorder trapping during the solidification of βNi3Ge from its deeply undercooled melt
Kirchlechner et al. In situ µLaue: Instrumental setup for the deformation of micron sized samples
Hilger et al. Bimodal grain size distribution of nanostructured ferritic ODS Fe–Cr alloys
Sánchez et al. Mean atomic number quantitative assessment in backscattered electron imaging
Roth et al. X-ray laminography and SAXS on beryllium grades and lenses and wavefront propagation through imperfect compound refractive lenses
Yoshida et al. Weak-beam scanning transmission electron microscopy for quantitative dislocation density measurement in steels
Woehl et al. Dark-field scanning transmission ion microscopy via detection of forward-scattered helium ions with a microchannel plate
Marceau et al. Multi-scale correlative microscopy investigation of both structure and chemistry of deformation twin bundles in Fe–Mn–C steel
Brodu et al. Depth resolution dependence on sample thickness and incident energy in on-axis transmission Kikuchi diffraction in scanning electron microscope (SEM)
Zhang et al. Applications and limitations of electron correlation microscopy to study relaxation dynamics in supercooled liquids
Boyce et al. Detecting rare, abnormally large grains by x-ray diffraction
Gilles et al. Stability of TaC precipitates in a Co–Re-based alloy being developed for ultra-high-temperature applications
US8836925B2 (en) Imaging crystalline domains of small molecules
Bagri et al. Measuring grain boundary character distributions in Ni-base alloy 725 using high-energy diffraction microscopy
Li et al. Quantitative fluctuation electron microscopy in the STEM: Methods to identify, avoid, and correct for artifacts
Parish et al. Aberration-corrected X-ray spectrum imaging and fresnel contrast to differentiate nanoclusters and cavities in helium-irradiated alloy 14YWT
Iv et al. Diffraction imaging in a He+ ion beam scanning transmission microscope