Lee et al., 2013 - Google Patents
Eco cost measurement and incremental gate sizing for late process changesLee et al., 2013
View PDF- Document ID
- 1540860571258577227
- Author
- Lee J
- Gupta P
- Publication year
- Publication venue
- ACM Transactions on Design Automation of Electronic Systems (TODAES)
External Links
Snippet
Changes in the manufacturing process parameters may create timing violations in a design, making it necessary to perform an engineering change order (ECO) to correct these problems. We present a framework for performing incremental gate sizing for process …
- 238000000034 method 0 title abstract description 32
Classifications
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- G06F17/5081—Layout analysis, e.g. layout verification, design rule check
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- G—PHYSICS
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