Wu et al., 2024 - Google Patents
Battery degradation diagnosis under normal usage without requiring regular calibration dataWu et al., 2024
- Document ID
- 15786699421410046260
- Author
- Wu Z
- Zhang Y
- Wang H
- Publication year
- Publication venue
- Journal of Power Sources
External Links
Snippet
Lithium-ion batteries undergo capacity loss and power fade over time. Despite indicating degradation, these changes lack internal insights. Degradation modes group various mechanisms but are challenging to quantify due to aging complexity. In this paper, a …
- 238000006731 degradation reaction 0 title abstract description 152
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
- G01R31/3644—Various constructional arrangements
- G01R31/3648—Various constructional arrangements comprising digital calculation means, e.g. for performing an algorithm
- G01R31/3651—Software aspects, e.g. battery modeling, using look-up tables, neural networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
- G01R31/3644—Various constructional arrangements
- G01R31/3679—Various constructional arrangements for determining battery ageing or deterioration, e.g. state-of-health (SoH), state-of-life (SoL)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
- G01R31/3644—Various constructional arrangements
- G01R31/3662—Various constructional arrangements involving measuring the internal battery impedance, conductance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
- G01R31/3644—Various constructional arrangements
- G01R31/3675—Various constructional arrangements for compensating for temperature or ageing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
- G01R31/3606—Monitoring, i.e. measuring or determining some variables continuously or repeatedly over time, e.g. current, voltage, temperature, state-of-charge [SoC] or state-of-health [SoH]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06N—COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N99/00—Subject matter not provided for in other groups of this subclass
- G06N99/005—Learning machines, i.e. computer in which a programme is changed according to experience gained by the machine itself during a complete run
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