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Tiejun et al., 2008 - Google Patents

Defect tracing system based on orthogonal defect classification

Tiejun et al., 2008

Document ID
16110925323332008878
Author
Tiejun P
Leina Z
Chengbin F
Publication year
Publication venue
2008 International Conference on Computer Science and Software Engineering

External Links

Snippet

With the increase of the software complexity, the defect measurement becomes a task of high priority. We give a new software defect analytical methodology based on orthogonal classification. This method has two folds. Then a set of orthogonal defect classification …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management, e.g. organising, planning, scheduling or allocating time, human or machine resources; Enterprise planning; Organisational models
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    • G06Q10/00—Administration; Management
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    • G06Q10/00—Administration; Management
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