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Trevillyan et al., 2004 - Google Patents

An integrated environment for technology closure of deep-submicron IC designs

Trevillyan et al., 2004

Document ID
16486690330553844532
Author
Trevillyan L
Kung D
Puri R
Reddy L
Kazda M
Publication year
Publication venue
IEEE Design & Test of Computers

External Links

Snippet

With larger chip images and increasingly aggressive technologies, key design processes must interoperate, PDS, a physical-synthesis system, accomplishes technology closure through interacting processes of logic optimization, placement, timing, clock insertion, and …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/5022Logic simulation, e.g. for logic circuit operation
    • G06F17/5031Timing analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081Layout analysis, e.g. layout verification, design rule check
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
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    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5072Floorplanning, e.g. partitioning, placement
    • GPHYSICS
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    • G06F17/5045Circuit design
    • G06F17/505Logic synthesis, e.g. technology mapping, optimisation
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    • G06F17/5045Circuit design
    • G06F17/5054Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
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    • GPHYSICS
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    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
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    • G06F1/00Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G06F1/04Generating or distributing clock signals or signals derived directly therefrom
    • G06F1/10Distribution of clock signals, e.g. skew
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    • G06F9/00Arrangements for programme control, e.g. control unit
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    • G06F9/30Arrangements for executing machine-instructions, e.g. instruction decode
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning

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