Batson, 1993 - Google Patents
Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivityBatson, 1993
- Document ID
- 17778641440253361285
- Author
- Batson P
- Publication year
- Publication venue
- Nature
External Links
Snippet
Imaging with the scanning transmission electron microscope (STEM) has recently gained in resolution from the use of the annular dark-field (ADF) method1, 2, which produces a signal that is highly sensitive to atomic number. There is a possibility that electrons from the probe …
- 238000005430 electron energy loss spectroscopy 0 title abstract description 3
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/102—Different kinds of radiation or particles beta or electrons
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
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