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Radionova et al., 2016 - Google Patents

In pursuit of resolution in time‐of‐flight mass spectrometry: A historical perspective

Radionova et al., 2016

Document ID
18028577007222041833
Author
Radionova A
Filippov I
Derrick P
Publication year
Publication venue
Mass spectrometry reviews

External Links

Snippet

Time‐of‐flight mass spectrometry is reviewed from its inception in the 1940s to the present day. The review is concerned with fundamentals of time‐of‐flight analyzers and of ion sources to the extent that sources influence analyzers. The patent literature has been …
Continue reading at analyticalsciencejournals.onlinelibrary.wiley.com (other versions)

Classifications

    • H—ELECTRICITY
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    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
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    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
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    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/406—Time-of-flight spectrometers with multiple reflections
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    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
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    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
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    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
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    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
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    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
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    • H01J49/22—Electrostatic deflection
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    • H01J49/0054—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by an electron beam, e.g. electron impact dissociation, electron capture dissociation
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    • H01J2237/153—Correcting image defects, e.g. stigmators
    • H01J2237/1538—Space charge (Boersch) effect compensation
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    • H01J2237/04—Means for controlling the discharge
    • H01J2237/049—Focusing means

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