Hecht et al., 2022 - Google Patents
Laser cleaning of flux residues on copper surfaces in electronics productionHecht et al., 2022
- Document ID
- 1983066762946083419
- Author
- Hecht C
- Slama J
- Sprenger M
- Häußler F
- Sippel M
- Franke J
- Publication year
- Publication venue
- 2022 IEEE 28th International Symposium for Design and Technology in Electronic Packaging (SIITME)
External Links
Snippet
With the manifold of different laser sources, their application in power electronics production to remove solder flux residues on direct copper bonded substrates is a promising approach to ensure adequate surface cleanliness for further processing. For many subsequent …
- 230000004907 flux 0 title abstract description 53
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
- B23K26/0626—Energy control of the laser beam
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2201/00—Articles made by soldering, welding or cutting by applying heat locally
- B23K2201/36—Electric or electronic devices
- B23K2201/40—Semiconductor devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/12—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6917011B2 (en) | Method and apparatus for decapping integrated circuit packages | |
| US20210195756A1 (en) | System Producing a Conductive Path on a Substrate | |
| EP1779286B1 (en) | Laser-based method and system for processing targeted surface material and article produced thereby | |
| JP5826027B2 (en) | Laser-based material processing method and system | |
| CA2532959C (en) | Failure analysis methods and systems | |
| CN105081568B (en) | Method for laser welding | |
| JP2007508946A (en) | Laser processing of locally heated target materials | |
| JP2003506216A (en) | Circuit singulation system and method | |
| Hecht et al. | Laser cleaning of flux residues on copper surfaces in electronics production | |
| JP2003133690A (en) | Method for forming circuit by using ultra short pulse laser | |
| JP7012824B2 (en) | Polymer Resin Molded Compound-based substrate cutting method and its system | |
| John et al. | Laser Metal Bonding (LMB)-low impact joining of thin aluminum foil to silicon and silicon nitride surfaces | |
| JP2004351513A (en) | Material processing method using ultrashort pulse laser, printed wiring board, and manufacturing method thereof | |
| JP6619625B2 (en) | Electrode cleaning method and integrated circuit device manufacturing method | |
| Spletter et al. | A laser based system for tape automated bonding to integrated circuits | |
| JP2004074211A (en) | Laser beam machining method | |
| Klengel et al. | A New, Efficient Method for Preparation of 3D Integrated Systems by Laser Techniques | |
| Kancharla et al. | Processing of surfaces with kilowatt level nanosecond pulsed fiber lasers | |
| KR20210073374A (en) | Method for processing wafer | |
| Berényi | Laser processing of solder resist layers on laminated substrates | |
| Baek et al. | mu-BGA (ball grid array) singulation with a pulsed Nd: YAG laser | |
| WO2015015484A1 (en) | A system and method for producing a conductive path on a substrate | |
| Illyefalvi-Vitez et al. | Laser processing of polymer layers of laminated and flexible substrates | |
| JP2004148344A (en) | Laser beam machining method | |
| Hurtony et al. | Metallographic analysis of laser soldered chip resistors |