Montecchi, 2013 - Google Patents
Approximated method for modelling hemispherical reflectance and evaluating near-specular reflectance of CSP mirrorsMontecchi, 2013
- Document ID
- 2446567359586946327
- Author
- Montecchi M
- Publication year
- Publication venue
- Solar Energy
External Links
Snippet
Commercial first-surface solar-mirrors, which are alternatives to conventional glass mirrors, reflect solar radiation in a broader manner because of light scattering. However, in concentrated solar power all the radiation reflected in the solid angle of receiver-viewing is …
- 238000005259 measurement 0 abstract description 20
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/02—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colour
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/024—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using means for illuminating a slit efficiently (e.g. entrance slit of a spectrometer or entrance face of fiber)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
- G01N33/48—Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
- G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Montecchi | Approximated method for modelling hemispherical reflectance and evaluating near-specular reflectance of CSP mirrors | |
| Levinson et al. | Solar spectral optical properties of pigments—Part I: model for deriving scattering and absorption coefficients from transmittance and reflectance measurements | |
| JP5797695B2 (en) | Apparatus and method for measuring chromaticity against angle | |
| Leloup et al. | Design of an instrument for measuring the spectral bidirectional scatter distribution function | |
| US20070201039A1 (en) | Method for optical characterization and evaluation of optically variable devices and media | |
| Bai et al. | A new method to measure spectral reflectance and film thickness using a modified chromatic confocal sensor | |
| Heimsath et al. | Angle resolved specular reflectance measured with VLABS | |
| Bernad et al. | Upgrade of goniospectrophtometer GEFE for near-field scattering and fluorescence radiance measurements | |
| Hébert et al. | Fundamentals of optics and radiometry for color reproduction | |
| Trost et al. | Roughness and scatter in optical coatings | |
| Lu et al. | Establishment and verification of diffraction BRDF model for scratched material surface | |
| Le Bohec et al. | Relationship between topographic parameters and BRDF for tungsten surfaces in the visible spectrum | |
| Montecchi | Upgrading of ENEA solar mirror qualification set-up | |
| Berger et al. | Modeling and verifying the polarizing reflectance of real-world metallic surfaces | |
| Heimsath et al. | Scattering and specular reflection of solar reflector materials–Measurements and method to determine solar weighted specular reflectance | |
| Ferrero et al. | Principal components analysis on the spectral bidirectional reflectance distribution function of ceramic colour standards | |
| Montecchi et al. | Soiling model for spectral reflectance of solar mirrors | |
| Tang et al. | Geometric optics applied to rough surfaces coated with an absorbing thin film | |
| Grobe et al. | Experimental validation of bidirectional reflection and transmission distribution measurements of specular and scattering materials | |
| Jin et al. | Polarization characteristics of scattered light from macroscopically rough surfaces | |
| Harmer et al. | Variation in optical constants between photocathodes | |
| Montecchi et al. | Enhanced equivalent model algorithm for solar mirrors | |
| Calderón et al. | Accounting for polarization–related effects in the measurement of the bidirectional reflectance distribution function | |
| Steiner et al. | Experimental determination of spectral and angular dependent optical properties of insulating glasses | |
| Montecchi | Solar mirror qualification setup, the key instrument in a new strategy for evaluating off-normal near-specular solar-reflectance |