Dellacherie et al., 2003 - Google Patents
Improve-HDL-a DO-254 formal property checker used for design and verification of avionics protocol controllersDellacherie et al., 2003
- Document ID
- 2559015498336278265
- Author
- Dellacherie S
- Burgaud L
- Di Crescenzo P
- Publication year
- Publication venue
- Digital Avionics Systems Conference, 2003. DASC'03. The 22nd
External Links
Snippet
Today's airplane consists of a big network linking embedded controllers to sensors/actuators and communications equipment onboard. Efforts made in recent years to simplify network wirings have resulted in significant reductions in the aircraft weight and labor required to run …
- 238000004088 simulation 0 abstract description 24
Classifications
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- G06F17/50—Computer-aided design
- G06F17/5009—Computer-aided design using simulation
- G06F17/5022—Logic simulation, e.g. for logic circuit operation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/50—Computer-aided design
- G06F17/5009—Computer-aided design using simulation
- G06F17/504—Formal methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/362—Software debugging
- G06F11/3648—Software debugging using additional hardware
-
- G—PHYSICS
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- G06F—ELECTRICAL DIGITAL DATA PROCESSING
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
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-
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- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06F—ELECTRICAL DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/50—Computer-aided design
- G06F17/5068—Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
- G06F17/5081—Layout analysis, e.g. layout verification, design rule check
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
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- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
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- G06F17/5045—Circuit design
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
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