Kato, 2023 - Google Patents
D-band material characterization using a balanced-type circular disk resonator with waveguide interfaces and a modified full-wave modal analysisKato, 2023
View PDF- Document ID
- 3016343734307190818
- Author
- Kato Y
- Publication year
- Publication venue
- IEEE Transactions on Instrumentation and Measurement
External Links
Snippet
This study presents material characterization in the-band using a balanced-type circular disk resonator (BCDR) with waveguide interfaces. In the developed BCDR, ultrafine and brittle coaxial lines are covered by waveguide interfaces, which alleviates the robustness issues …
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/12—Coupling devices having more than two ports
- H01P5/16—Conjugate devices, i.e. devices having at least one port decoupled from one other port
- H01P5/18—Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
- H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced with unbalanced lines or devices
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/02—Coupling devices of the waveguide type with invariable factor of coupling
- H01P5/022—Transitions between lines of the same kind and shape, but with different dimensions
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P3/00—Waveguides; Transmission lines of the waveguide type
- H01P3/02—Waveguides; Transmission lines of the waveguide type with two longitudinal conductors
- H01P3/08—Microstrips; Strip lines
- H01P3/081—Micro-striplines
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/24—Terminating devices
- H01P1/26—Dissipative terminations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P11/00—Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
- H01P11/001—Manufacturing waveguides or transmission lines of the waveguide type
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Kato | D-band material characterization using a balanced-type circular disk resonator with waveguide interfaces and a modified full-wave modal analysis | |
| Kato et al. | Broadband permittivity measurements up to 170-GHz using balanced-type circular-disk resonator excited by 0.8-mm coaxial line | |
| Awang et al. | A free-space method for complex permittivity measurement of bulk and thin film dielectrics at microwave frequencies | |
| CN111880012B (en) | Method for detecting broadband continuous dielectric characteristic parameters of microwave dielectric substrate | |
| Zhu et al. | Extraction of dielectric and rough conductor loss of printed circuit board using differential method at microwave frequencies | |
| Penaranda-Foix et al. | Full-wave analysis of dielectric-loaded cylindrical waveguides and cavities using a new four-port ring network | |
| Heinola et al. | Dielectric characterization of printed wiring board materials using ring resonator techniques: A comparison of calculation models | |
| Wu et al. | A simple and accurate method for extracting super wideband electrical properties of the printed circuit board | |
| Zahedi et al. | Analytical transmission line model for complex dielectric constant measurement of thin substrates using T‐resonator method | |
| Dvorsky et al. | Microwave surface conductivity measurement using an open-ended circular waveguide probe | |
| Nishikata | A swept-frequency measurement of complex permittivity and complex permeability of a columnar specimen inserted in a rectangular waveguide | |
| Yu et al. | A novel parallel-plate dielectric resonator method for broadband complex permittivity measurement in the millimeter-wave bands | |
| US12278414B1 (en) | Millimeter wave connection device for rectangular/substrate integrated waveguides | |
| Khan et al. | Analysis of Q-factor for AM-SLM cavity based resonators using surface roughness models | |
| Bringhurst et al. | Thin-sample measurements and error analysis of high-temperature coaxial dielectric probes | |
| Itoh | A new method for measuring properties of dielectric materials using a microstrip cavity (short papers) | |
| Mattar et al. | Influence of wall contacts on measured complex permittivity spectra at coaxial line frequencies | |
| Tran et al. | Full-wave modeling of coplanar waveguide discontinuities with finite conductor thickness | |
| JP4726395B2 (en) | Electrical property value measurement method | |
| Wang et al. | Millimeter-wave material characterization using laminated waveguides | |
| Kawabata et al. | The analysis of a balanced-type circular disk resonator excited by coaxial cable lines to measure the complex permittivity | |
| Haidi et al. | Experimental approaches on properties characterization of magneto-dielectric material using SIW structure | |
| Zheng et al. | Analysis of dielectric-loaded waveguide slot antennas by the hybrid mode-matching/moment method | |
| Miyagawa et al. | Simultaneous determination of complex permittivity and permeability of columnar materials with arbitrarily shaped cross section | |
| Salski et al. | Characterization of Low-Loss Liquids With a Double-Concave Fabry–Perot Open Resonator in the 20–50-GHz Range |