[go: up one dir, main page]

Verbeyst et al., 2013 - Google Patents

Speeding up N-port VNA calibration eliminating one-port calibrations

Verbeyst et al., 2013

Document ID
3786270729145297478
Author
Verbeyst F
Vanden Bossche M
Publication year
Publication venue
2013 European Microwave Conference

External Links

Snippet

With the advent of new RF devices which have an increasing number of ports and to provide the opportunity to simultaneously test several devices in production, there is a growing need for Vector Network Analyzers (VNA) with an equally increased number of ports. At RF …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the preceding groups
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

Similar Documents

Publication Publication Date Title
US6853198B2 (en) Method and apparatus for performing multiport through-reflect-line calibration and measurement
US7068049B2 (en) Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration
US9581630B2 (en) Method for calibrating a vector network analyzer
US6639393B2 (en) Methods and apparatus for time-domain measurement with a high frequency circuit analyzer
US9921287B2 (en) Method for calibrating a test rig
US9176174B1 (en) Systems and methods for simultaneously measuring forward and reverse scattering parameters
US7777497B2 (en) Method and system for tracking scattering parameter test system calibration
US7994801B2 (en) Calibrated S-parameter measurements of a high impedance probe
CN103399286B (en) A kind of measurement calibration steps of many characteristic impedance network
JP2006201172A (en) Method and apparatus for performing minimum-connected multi-port through-reflect-line calibration and measurement
CN104515907B (en) A kind of scattering parameter test system and its implementation
JP2004251904A (en) Calibration of a multiport network analyzer using device reciprocity
US20160018450A1 (en) S-parameter measurements using real-time oscilloscopes
US20110199107A1 (en) Method and apparatus for calibrating a test system for measuring a device under test
US20100204941A1 (en) Method and device for calibrating a network analyzer for measuring at differential connections
US7113891B2 (en) Multi-port scattering parameter calibration system and method
CN111983538B (en) On-chip S-parameter measurement system calibration method and device
Reveyrand et al. SOLT and SOLR calibration methods using a single multiport “thru” standard connection
Verbeyst et al. Speeding up N-port VNA calibration eliminating one-port calibrations
Adamian et al. A novel procedure for characterization of multiport high-speed balanced devices
Schramm et al. A SOLR calibration procedure for the 16-term error model
Schramm et al. Comparison of S-Parameter Measurement Methods for Attenuators
Wagner et al. 15-Term Self-Calibration without an ideal THRU-or LINE-Standard
Staudinger Network analyzer calibration
Kolb et al. Multiport vna self-calibration of a partially leaky error model with a reciprocal standard