CA2206217A1 - Nickel carbonyl vapour deposition process - Google Patents
Nickel carbonyl vapour deposition processInfo
- Publication number
- CA2206217A1 CA2206217A1 CA 2206217 CA2206217A CA2206217A1 CA 2206217 A1 CA2206217 A1 CA 2206217A1 CA 2206217 CA2206217 CA 2206217 CA 2206217 A CA2206217 A CA 2206217A CA 2206217 A1 CA2206217 A1 CA 2206217A1
- Authority
- CA
- Canada
- Prior art keywords
- nickel
- nickel carbonyl
- carbonyl
- gaseous mixture
- produce
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45593—Recirculation of reactive gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/16—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal carbonyl compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
A closed loop, carbon monoxide self-contained continuous process for the production of nickel or nickel coated objects by the nickel vapour deposition process, comprising placing an object to be treated with nickel carbonyl by said nickel vapour deposition process in a deposition chamber; feeding a gaseous mixture of nickel carbonyl and carbon monoxide to said deposition chamber; depositing nickel on said object to produce said nickel or nickel coated object in said chamber and a nickel carbonyl-depleted gaseous mixture; removing said nickel carbonyl-depleted gaseous mixture from said chamber; removing nickel carbonyl from said nickel carbonyl-depleted gaseous mixture to produce an essentially nickel carbonyl-free gas; feeding said essentially nickel carbonyl-free gas to a nickel carbonyl reactor containing nickel powder to produce a fresh gaseous mixture comprising fresh nickel carbonyl and carbon monoxide; separating said fresh nickel carbonyl from said fresh gaseous mixture to produce a second carbonmonoxide containing gas; and recycling said second carbon monoxide containing gas to said nickel carbonyl reactor. The process and apparatus provides a more economic to operate, safe and more operably reliable than prior art NVD processes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA 2206217 CA2206217C (en) | 1997-05-27 | 1997-05-27 | Nickel carbonyl vapour deposition process |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA 2206217 CA2206217C (en) | 1997-05-27 | 1997-05-27 | Nickel carbonyl vapour deposition process |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2206217A1 true CA2206217A1 (en) | 1998-11-27 |
| CA2206217C CA2206217C (en) | 2003-01-07 |
Family
ID=4160745
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2206217 Expired - Lifetime CA2206217C (en) | 1997-05-27 | 1997-05-27 | Nickel carbonyl vapour deposition process |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA2206217C (en) |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6048578A (en) * | 1998-11-03 | 2000-04-11 | Chemical Vapour Deposition Systems, Inc. | Closed loop carbon monoxide self-contained nickel carbonyl deposition process |
| WO2000026432A1 (en) * | 1998-11-03 | 2000-05-11 | Chemical Vapour Deposition Systems Inc. | Nickel carbonyl vapour deposition apparatus and process |
| US6132518A (en) * | 1998-11-04 | 2000-10-17 | Chemical Vapour Deposition Systems, Inc. | Nickel carbonyl vapour deposition apparatus and method |
| WO2006104783A1 (en) * | 2005-03-31 | 2006-10-05 | Tokyo Electron Limited | Method and system for refurbishing a metal carbonyl precursor |
| US7678421B2 (en) * | 2004-11-23 | 2010-03-16 | Tokyo Electron Limited | Method for increasing deposition rates of metal layers from metal-carbonyl precursors |
| US7704879B2 (en) | 2007-09-27 | 2010-04-27 | Tokyo Electron Limited | Method of forming low-resistivity recessed features in copper metallization |
| US7776740B2 (en) | 2008-01-22 | 2010-08-17 | Tokyo Electron Limited | Method for integrating selective low-temperature ruthenium deposition into copper metallization of a semiconductor device |
| US7799681B2 (en) | 2008-07-15 | 2010-09-21 | Tokyo Electron Limited | Method for forming a ruthenium metal cap layer |
| US7829454B2 (en) | 2007-09-11 | 2010-11-09 | Tokyo Electron Limited | Method for integrating selective ruthenium deposition into manufacturing of a semiconductior device |
| US7884012B2 (en) | 2007-09-28 | 2011-02-08 | Tokyo Electron Limited | Void-free copper filling of recessed features for semiconductor devices |
| US7892358B2 (en) | 2006-03-29 | 2011-02-22 | Tokyo Electron Limited | System for introducing a precursor gas to a vapor deposition system |
| US7977235B2 (en) | 2009-02-02 | 2011-07-12 | Tokyo Electron Limited | Method for manufacturing a semiconductor device with metal-containing cap layers |
| US8247030B2 (en) | 2008-03-07 | 2012-08-21 | Tokyo Electron Limited | Void-free copper filling of recessed features using a smooth non-agglomerated copper seed layer |
| US8716132B2 (en) | 2009-02-13 | 2014-05-06 | Tokyo Electron Limited | Radiation-assisted selective deposition of metal-containing cap layers |
-
1997
- 1997-05-27 CA CA 2206217 patent/CA2206217C/en not_active Expired - Lifetime
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6048578A (en) * | 1998-11-03 | 2000-04-11 | Chemical Vapour Deposition Systems, Inc. | Closed loop carbon monoxide self-contained nickel carbonyl deposition process |
| WO2000026432A1 (en) * | 1998-11-03 | 2000-05-11 | Chemical Vapour Deposition Systems Inc. | Nickel carbonyl vapour deposition apparatus and process |
| US6132518A (en) * | 1998-11-04 | 2000-10-17 | Chemical Vapour Deposition Systems, Inc. | Nickel carbonyl vapour deposition apparatus and method |
| US7678421B2 (en) * | 2004-11-23 | 2010-03-16 | Tokyo Electron Limited | Method for increasing deposition rates of metal layers from metal-carbonyl precursors |
| WO2006104783A1 (en) * | 2005-03-31 | 2006-10-05 | Tokyo Electron Limited | Method and system for refurbishing a metal carbonyl precursor |
| US7345184B2 (en) | 2005-03-31 | 2008-03-18 | Tokyo Electron Limited | Method and system for refurbishing a metal carbonyl precursor |
| US7892358B2 (en) | 2006-03-29 | 2011-02-22 | Tokyo Electron Limited | System for introducing a precursor gas to a vapor deposition system |
| US7829454B2 (en) | 2007-09-11 | 2010-11-09 | Tokyo Electron Limited | Method for integrating selective ruthenium deposition into manufacturing of a semiconductior device |
| US7704879B2 (en) | 2007-09-27 | 2010-04-27 | Tokyo Electron Limited | Method of forming low-resistivity recessed features in copper metallization |
| US7884012B2 (en) | 2007-09-28 | 2011-02-08 | Tokyo Electron Limited | Void-free copper filling of recessed features for semiconductor devices |
| US7776740B2 (en) | 2008-01-22 | 2010-08-17 | Tokyo Electron Limited | Method for integrating selective low-temperature ruthenium deposition into copper metallization of a semiconductor device |
| US8247030B2 (en) | 2008-03-07 | 2012-08-21 | Tokyo Electron Limited | Void-free copper filling of recessed features using a smooth non-agglomerated copper seed layer |
| US7799681B2 (en) | 2008-07-15 | 2010-09-21 | Tokyo Electron Limited | Method for forming a ruthenium metal cap layer |
| US7977235B2 (en) | 2009-02-02 | 2011-07-12 | Tokyo Electron Limited | Method for manufacturing a semiconductor device with metal-containing cap layers |
| US8716132B2 (en) | 2009-02-13 | 2014-05-06 | Tokyo Electron Limited | Radiation-assisted selective deposition of metal-containing cap layers |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2206217C (en) | 2003-01-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKEX | Expiry |
Effective date: 20170529 |