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CN104332823B - It is a kind of to improve the method for wide bar shaped high power semiconductor lasers beam quality - Google Patents

It is a kind of to improve the method for wide bar shaped high power semiconductor lasers beam quality Download PDF

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Publication number
CN104332823B
CN104332823B CN201410674400.0A CN201410674400A CN104332823B CN 104332823 B CN104332823 B CN 104332823B CN 201410674400 A CN201410674400 A CN 201410674400A CN 104332823 B CN104332823 B CN 104332823B
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power semiconductor
wide
beam quality
semiconductor lasers
laser
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CN104332823A (en
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薄报学
高欣
乔忠良
张晶
李辉
李特
曲轶
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Changchun University of Science and Technology
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Changchun University of Science and Technology
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Abstract

一种改善宽条形大功率半导体激光器光束质量的方法,属于激光技术领域。该领域已知技术难以有效改善宽条形大功率半导体激光器的光束质量,使宽条形大功率半导体激光器的应用受到很大限制。本发明采用在宽条形波导区施加凸形强度分布的张应力的方法,减弱由于波导区凸形温度分布引起的凸形折射率分布,抑制激光器波导的热透镜效应,从而改善宽条形大功率半导体激光器的光束质量。该方法可应用于各类宽条形大功率半导体激光器的制造。

The invention discloses a method for improving the beam quality of a wide-strip high-power semiconductor laser, belonging to the technical field of lasers. Known technologies in this field are difficult to effectively improve the beam quality of wide-strip high-power semiconductor lasers, which greatly limits the application of wide-strip high-power semiconductor lasers. The invention adopts the method of applying the tensile stress of the convex intensity distribution in the wide strip waveguide area, weakens the convex refractive index distribution caused by the convex temperature distribution in the waveguide area, and suppresses the thermal lens effect of the laser waveguide, thereby improving the wide strip shape. Beam quality of power semiconductor lasers. The method can be applied to the manufacture of various wide-strip high-power semiconductor lasers.

Description

一种改善宽条形大功率半导体激光器光束质量的方法A Method for Improving the Beam Quality of Wide Strip High Power Semiconductor Laser

技术领域technical field

本发明涉及一种改善宽条形大功率半导体激光器光束质量的方法,属于激光技术领域。The invention relates to a method for improving the beam quality of a wide-strip high-power semiconductor laser, belonging to the technical field of lasers.

背景技术Background technique

宽条形大功率半导体激光器具有输出功率高、热管理简单、功率合成简单的优点。通常宽条形大功率半导体激光器芯片倒装焊在高导热的过渡热沉上,由于较大的工作电流集中在发光波导区内,载流子非辐射复合产生的废热导致波导区的温度分布为凸形分布,使发光波导区的有效折射率也呈现一凸形分布,增加了激光器工作时波导结构的不稳定性及光束发散角。通常主要通过改善激光器材料的外延生长质量、减少发光波导区的缺陷,抑制由于废热引起的折射率凸形分布,受到激光器结构外延生长源材料及气氛纯度的限制,仍存在一定的材料缺陷导致宽条形大功率半导体激光器大电流工作条件下光束质量明显变差。Wide-strip high-power semiconductor lasers have the advantages of high output power, simple thermal management, and simple power combination. Usually, the wide-strip high-power semiconductor laser chip is flip-chip-bonded on a transitional heat sink with high thermal conductivity. Since the large operating current is concentrated in the light-emitting waveguide area, the waste heat generated by the non-radiative recombination of carriers leads to the temperature distribution in the waveguide area as follows: The convex distribution makes the effective refractive index of the light-emitting waveguide region also present a convex distribution, which increases the instability of the waveguide structure and the beam divergence angle when the laser is working. Usually, it is mainly through improving the epitaxial growth quality of laser materials, reducing defects in the light-emitting waveguide region, and suppressing the convex refractive index distribution caused by waste heat. Due to the limitations of the laser structure epitaxial growth source material and the purity of the atmosphere, there are still certain material defects that lead to wide The beam quality of the bar-shaped high-power semiconductor laser becomes significantly worse under the high-current working condition.

发明内容Contents of the invention

本发明是这样实现的,见附图1所示,将激光器芯片(主要由芯片衬底1、发光波导区2、电流限制层3组成)通过焊料6焊装到激光器过渡热沉4上,通过在焊接面两侧引入焊装垫块5及焊装过程中激光器芯片中部施加压力,由于焊料凝固使焊装后的激光器芯片产生弯曲,并在发光波导区1引入凸形的张引力分布。The present invention is realized in this way, as shown in accompanying drawing 1, the laser chip (mainly made up of chip substrate 1, light-emitting waveguide region 2, current confinement layer 3) is welded on the laser transition heat sink 4 by solder 6, through Welding pads 5 are introduced on both sides of the welding surface and pressure is applied to the middle of the laser chip during the welding process. Due to the solidification of the solder, the welded laser chip is bent, and a convex tension distribution is introduced in the light-emitting waveguide region 1 .

本发明的技术效果在于,在发光波导区1引入凸形的张引力分布导致波导的有效折射率分布附加一凹形的折射率分布,抑制了激光器工作时由于废热产生的凸形折射率分布,从而减小激光器高功率工作的光束发散角,提高光束质量。The technical effect of the present invention is that the introduction of a convex tension distribution in the light-emitting waveguide region 1 results in a concave refractive index distribution added to the effective refractive index distribution of the waveguide, which suppresses the convex refractive index distribution caused by waste heat when the laser is working. Therefore, the beam divergence angle of the high-power operation of the laser is reduced, and the beam quality is improved.

附图说明Description of drawings

所附图1 为引入张应力的宽条形大功率半导体激光器结构示意图,1 为发光波导区,2为芯片衬底,3 为电流限制层,4 为激光器过渡热沉,5 为焊装垫块,6 为焊料。Attached Figure 1 is a schematic diagram of the structure of a wide-strip high-power semiconductor laser that introduces tensile stress, 1 is the light-emitting waveguide area, 2 is the chip substrate, 3 is the current confinement layer, 4 is the laser transition heat sink, and 5 is the welding pad , 6 is solder.

具体实施方式detailed description

如附图1所示,将激光器芯片(主要由发光波导区1、芯片衬底2、电流限制层3组成)通过焊料6焊装到激光器过渡热沉4上,通过在焊接面两侧引入焊装垫块5及焊装过程中激光器芯片中部施加压力,由于焊料凝固使焊装后的激光器芯片产生弯曲,并在发光波导区1引入凸形的张引力分布,抑制激光器工作时由于废热产生的凸形折射率分布,从而减小激光器高功率工作的光束发散角,提高光束质量。As shown in Figure 1, the laser chip (mainly composed of a light-emitting waveguide region 1, a chip substrate 2, and a current confinement layer 3) is soldered to the laser transition heat sink 4 through solder 6, and the solder is introduced on both sides of the soldering surface. The pressure is applied to the middle part of the laser chip during the mounting block 5 and the welding process. Due to the solidification of the solder, the welded laser chip is bent, and a convex tension distribution is introduced in the light-emitting waveguide area 1 to suppress the loss of heat generated by waste heat when the laser is working. The convex refractive index distribution reduces the beam divergence angle of the high-power laser and improves the beam quality.

下面结合实例说明本发明,激光器芯片采用2毫米腔长的808nm波长量子阱结构激光器芯片,发光波导区1的宽度为100微米,芯片衬底2为110微米厚的N-GaAs材料,电流限制层3为120纳米厚的SiO2绝缘层,激光器过渡热沉4为厚度为0.5毫米的Ti/Pt/Au覆盖AlN基片,焊装垫块5的高度为25微米,焊料6为AuSn合金焊料,焊装过程中通过压针在激光器芯片中部施加50克的压力。焊装温度为320度,焊装气氛为99.999%纯度的氮气,当温度降低到50度以下时完成激光器芯片焊装过程。通过激光器工作时的远场发散角测量,表明激光器远场发散角明显减小,由通常的7.5度减小到5.0度。Illustrate the present invention below in conjunction with example, laser chip adopts the 808nm wavelength quantum well structure laser chip of 2 millimeter cavity length, the width of light-emitting waveguide region 1 is 100 microns, and chip substrate 2 is the thick N-GaAs material of 110 microns, and current confinement layer 3 is a SiO2 insulating layer with a thickness of 120 nanometers, the laser transition heat sink 4 is a Ti/Pt/Au covered AlN substrate with a thickness of 0.5 mm, the height of the welding pad 5 is 25 microns, and the solder 6 is AuSn alloy solder. During the assembly process, a pressure of 50 grams is applied to the middle of the laser chip by pressing the needle. The welding temperature is 320 degrees, and the welding atmosphere is 99.999% pure nitrogen. When the temperature drops below 50 degrees, the laser chip welding process is completed. Through the measurement of the far-field divergence angle when the laser is working, it shows that the far-field divergence angle of the laser is significantly reduced, from the usual 7.5 degrees to 5.0 degrees.

Claims (1)

1.一种改善宽条形大功率半导体激光器光束质量的方法,其特征在于,通过给宽条形大功率半导体激光器芯片的发光波导区(1)施加凸形强度分布的张应力,减弱由于波导区凸形温度分布引起的凸形折射率分布,抑制激光器波导的热透镜效应,从而改善宽条形大功率半导体激光器的光束质量。1. A method for improving the beam quality of wide-strip high-power semiconductor lasers is characterized in that, by applying the tensile stress of convex intensity distribution to the light-emitting waveguide region (1) of wide-strip high-power semiconductor laser chips, weakening due to waveguide The convex refractive index distribution caused by the convex temperature distribution in the region suppresses the thermal lens effect of the laser waveguide, thereby improving the beam quality of the wide-strip high-power semiconductor laser.
CN201410674400.0A 2014-11-20 2014-11-20 It is a kind of to improve the method for wide bar shaped high power semiconductor lasers beam quality Expired - Fee Related CN104332823B (en)

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US20070223549A1 (en) * 2006-03-23 2007-09-27 Nl Nanosemiconductor Gmbh High-Power Optoelectronic Device with Improved Beam Quality Incorporating A Lateral Mode Filtering Section
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