CN104576705B - A kind of array base palte and preparation method, display device - Google Patents
A kind of array base palte and preparation method, display device Download PDFInfo
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Abstract
Description
技术领域technical field
本发明涉及有机发光显示技术领域,尤其涉及一种阵列基板及制作方法、显示装置。The present invention relates to the technical field of organic light-emitting display, in particular to an array substrate, a manufacturing method, and a display device.
背景技术Background technique
现有技术作为以薄膜晶体管为控制元件,有机发光二极管(Organic LightEmitting Diode,OLED)为光发射介质的显示技术具有高清晰度、广视角、易实现弯曲柔性化显示等优势得到广泛的应用。In the prior art, a display technology using thin-film transistors as control elements and Organic Light Emitting Diode (OLED) as a light-emitting medium has been widely used due to its advantages of high definition, wide viewing angle, and easy realization of curved and flexible displays.
发明内容Contents of the invention
本发明实施例提供了一种阵列基板及制作方法、显示装置,用以在不增加现有工艺难度的条件下,降低阵列基板显示区和非显示区之间的电压降,提高显示质量。Embodiments of the present invention provide an array substrate, a manufacturing method, and a display device, which are used to reduce the voltage drop between the display area and the non-display area of the array substrate and improve display quality without increasing the difficulty of the existing process.
本发明实施例提供的一种阵列基板,包括衬底基板,所述衬底基板包括显示区和非显示区,所述衬底基板上设置有薄膜晶体管、有机发光层及设置于所述有机发光层之上的上电极,其中至少部分位于所述非显示区的所述上电极的厚度大于位于所述显示区的所述上电极的厚度。An array substrate provided by an embodiment of the present invention includes a base substrate, the base substrate includes a display area and a non-display area, and a thin film transistor, an organic light-emitting layer, and an organic light-emitting layer are arranged on the base substrate. The upper electrode above the layer, wherein at least part of the upper electrode located in the non-display area has a thickness greater than the thickness of the upper electrode located in the display area.
由本发明实施例提供的阵列基板,由于阵列基板包括设置在有机发光层上的上电极,其中至少部分位于所述非显示区的所述上电极的厚度大于位于所述显示区的所述上电极的厚度,即本发明实施例采用分区设置上电极层的厚度,在保证显示区的透光率的情况下,有效地降低非显示区的上电极的电阻率,减小电学接触区接触不良情况的产生,从而能够提高显示的均匀度与产品的制作良率。In the array substrate provided by the embodiments of the present invention, since the array substrate includes an upper electrode disposed on the organic light-emitting layer, at least a part of the thickness of the upper electrode located in the non-display area is greater than that of the upper electrode located in the display area. The thickness of the upper electrode layer, that is, the embodiment of the present invention uses partitions to set the thickness of the upper electrode layer, while ensuring the light transmittance of the display area, effectively reducing the resistivity of the upper electrode in the non-display area, and reducing the poor contact of the electrical contact area Therefore, the uniformity of the display and the production yield of the product can be improved.
较佳地,所述薄膜晶体管包括:依次位于所述衬底基板上的半导体有源层、栅极绝缘层、栅极、绝缘层、源极和漏极;或,Preferably, the thin film transistor includes: a semiconductor active layer, a gate insulating layer, a gate, an insulating layer, a source and a drain sequentially located on the substrate; or,
所述薄膜晶体管包括:依次位于所述衬底基板上的栅极、栅极绝缘层、半导体有源层、源极和漏极。The thin film transistor includes: a gate, a gate insulating layer, a semiconductor active layer, a source and a drain which are sequentially located on the substrate.
这样,薄膜晶体管可以采用顶栅型结构,也可以采用底栅型结构,在实际生产中更加灵活、方便。In this way, the thin film transistor can adopt a top-gate structure or a bottom-gate structure, which is more flexible and convenient in actual production.
较佳地,所述衬底基板和所述薄膜晶体管之间设置有缓冲层。Preferably, a buffer layer is provided between the base substrate and the thin film transistor.
这样,缓冲层的设置能够起到平坦衬底基板的作用,同时能够防止衬底基板中的杂质原子扩散到薄膜晶体管中。In this way, the arrangement of the buffer layer can function as a flat base substrate, and at the same time prevent impurity atoms in the base substrate from diffusing into the thin film transistor.
较佳地,还包括设置在衬底基板上的平坦层和像素电极,所述平坦层位于所述薄膜晶体管和有机发光层之间,所述像素电极位于所述平坦层上,且通过在平坦层上的过孔与薄膜晶体管暴露出的源极或漏极连接,所述有机发光层位于所述像素电极上。Preferably, it also includes a flat layer and a pixel electrode arranged on the base substrate, the flat layer is located between the thin film transistor and the organic light-emitting layer, the pixel electrode is located on the flat layer, and passes through the flat layer The via hole on the layer is connected to the exposed source or drain of the thin film transistor, and the organic light emitting layer is located on the pixel electrode.
较佳地,还包括辅助电极,所述辅助电极位于衬底基板的非显示区,与所述像素电极位于同一层,所述上电极位于所述辅助电极上并与所述辅助电极电连接,位于所述辅助电极上的上电极的厚度大于位于所述像素电极上方的上电极的厚度。Preferably, an auxiliary electrode is also included, the auxiliary electrode is located in the non-display area of the base substrate, and is located in the same layer as the pixel electrode, the upper electrode is located on the auxiliary electrode and is electrically connected to the auxiliary electrode, The thickness of the upper electrode on the auxiliary electrode is greater than the thickness of the upper electrode on the pixel electrode.
这样,辅助电极的设置能够进一步降低上电极的电阻率。In this way, the arrangement of the auxiliary electrode can further reduce the resistivity of the upper electrode.
较佳地,上电极为阳极,或所述上电极为阴极。Preferably, the upper electrode is an anode, or the upper electrode is a cathode.
这样,既可以对上电极施加正的电压,也可以对上电极施加负的电压,在实际工艺过程中更加方便、简单。In this way, both positive voltage and negative voltage can be applied to the upper electrode, which is more convenient and simple in the actual process.
较佳地,所述上电极的材料为氧化铟锡或氧化铟锌的单层膜,或为氧化铟锡和氧化铟锌的复合膜。Preferably, the material of the upper electrode is a single-layer film of indium tin oxide or indium zinc oxide, or a composite film of indium tin oxide and indium zinc oxide.
这样,上电极的材料选择更加方便、简单。In this way, the material selection of the upper electrode is more convenient and simple.
本发明实施例还提供了一种显示装置,所述显示装置包括上述的阵列基板。An embodiment of the present invention also provides a display device, which includes the above-mentioned array substrate.
由于本发明实施例的显示装置包括上述的阵列基板,因此本发明实施例的显示装置的显示均匀度较好。Since the display device of the embodiment of the present invention includes the above-mentioned array substrate, the display uniformity of the display device of the embodiment of the present invention is better.
本发明实施例还提供了一种阵列基板的制作方法,包括薄膜晶体管的制作、有机发光层的制作及上电极的制作,在所述上电极的制作中,通过构图工艺使至少部分位于阵列基板非显示区的所述上电极的厚度大于位于阵列基板显示区的所述上电极的厚度。The embodiment of the present invention also provides a method for fabricating an array substrate, including fabricating a thin film transistor, fabricating an organic light-emitting layer, and fabricating an upper electrode. The thickness of the upper electrode in the non-display area is greater than the thickness of the upper electrode in the display area of the array substrate.
由本发明实施例提供的阵列基板的制作方法,由于该制作方法制作得到的上电极至少部分位于阵列基板非显示区的厚度大于位于阵列基板显示区的厚度,因此本发明实施例制作得到的上电极在保证显示区的透光率的情况下,能够有效地降低非显示区的上电极的电阻率,减小电学接触区接触不良情况的产生,从而能够提高阵列基板显示的均匀度与产品的制作良率。According to the manufacturing method of the array substrate provided by the embodiment of the present invention, since the thickness of the upper electrode obtained by the manufacturing method is at least partially located in the non-display area of the array substrate is greater than that located in the display area of the array substrate, the upper electrode obtained in the embodiment of the present invention In the case of ensuring the light transmittance of the display area, the resistivity of the upper electrode in the non-display area can be effectively reduced, and the occurrence of poor contact in the electrical contact area can be reduced, thereby improving the display uniformity of the array substrate and the production of products. yield.
较佳地,所述构图工艺采用半色调掩膜板或灰色调掩膜板制作所述上电极,具体包括:Preferably, the patterning process uses a half-tone mask or a gray-tone mask to make the upper electrode, specifically including:
在有机发光层上形成透明导电薄膜;forming a transparent conductive film on the organic light-emitting layer;
在所述透明导电薄膜上形成光刻胶,通过半色调掩膜板或灰色调掩膜板进行曝光、显影,形成光刻胶完全覆盖区、光刻胶部分覆盖区和无光刻胶覆盖区,其中,所述光刻胶完全覆盖区对应阵列基板的非显示区,光刻胶部分覆盖区对应阵列基板的显示区;Form a photoresist on the transparent conductive film, expose and develop through a half-tone mask or a gray tone mask to form a photoresist full coverage area, a photoresist partial coverage area and a no photoresist coverage area , wherein, the photoresist full coverage area corresponds to the non-display area of the array substrate, and the photoresist partial coverage area corresponds to the display area of the array substrate;
通过刻蚀,去除无光刻胶覆盖区的所述透明导电薄膜,并去除光刻胶部分覆盖区的光刻胶,暴露出光刻胶部分覆盖区的透明导电薄膜;By etching, removing the transparent conductive film in the non-photoresist coverage area, and removing the photoresist in the photoresist partial coverage area, exposing the transparent conductive film in the photoresist partial coverage area;
通过刻蚀,去除暴露出的部分厚度的所述透明导电薄膜,形成位于阵列基板显示区的上电极;Removing the exposed part of the thickness of the transparent conductive film by etching to form an upper electrode located in the display area of the array substrate;
去除剩余光刻胶,形成位于阵列基板非显示区的上电极,位于所述非显示区的上电极的厚度大于位于所述显示区的上电极的厚度。The remaining photoresist is removed to form an upper electrode located in the non-display area of the array substrate, and the thickness of the upper electrode located in the non-display area is greater than that of the upper electrode located in the display area.
这样,采用半色调掩膜板或灰色调掩膜板制作上电极,在实际制作过程中更加方便、简单。In this way, it is more convenient and simple to use a halftone mask or a gray tone mask to make the upper electrode in the actual manufacturing process.
附图说明Description of drawings
图1为一种阵列基板的截面结构示意图;1 is a schematic cross-sectional structure diagram of an array substrate;
图2为另一种降低上电极电阻率的阵列基板的截面结构示意图;2 is a schematic cross-sectional structure diagram of another array substrate that reduces the resistivity of the upper electrode;
图3为又一种降低上电极电阻率的阵列基板的截面结构示意图;3 is a schematic cross-sectional structure diagram of another array substrate that reduces the resistivity of the upper electrode;
图4为本发明实施例提供的一种阵列基板的截面结构示意图;4 is a schematic cross-sectional structure diagram of an array substrate provided by an embodiment of the present invention;
图5为本发明实施例提供的另一种阵列基板的截面结构示意图;FIG. 5 is a schematic cross-sectional structure diagram of another array substrate provided by an embodiment of the present invention;
图6为本发明实施例提供的设置有辅助电极的阵列基板的截面结构示意图;6 is a schematic cross-sectional structure diagram of an array substrate provided with auxiliary electrodes provided by an embodiment of the present invention;
图7为本发明实施例提供的一种阵列基板制作上电极的方法流程图;FIG. 7 is a flow chart of a method for fabricating an upper electrode on an array substrate according to an embodiment of the present invention;
图8为本发明实施例提供的一种阵列基板沉积透明导电薄膜后的截面结构示意图;8 is a schematic cross-sectional structure diagram of an array substrate provided by an embodiment of the present invention after depositing a transparent conductive film;
图9为本发明实施例提供的对图8沉积的透明导电薄膜进行光刻处理工艺时的截面结构示意图。FIG. 9 is a schematic diagram of a cross-sectional structure of the transparent conductive film deposited in FIG. 8 provided by an embodiment of the present invention when a photolithography process is performed.
具体实施方式Detailed ways
如图1所示,阵列基板的主要结构包括:衬底基板10,设置在衬底基板10上的缓冲层11,设置在缓冲层11上的半导体有源层12,设置在半导体有源层12上的栅极绝缘层13,设置在栅极绝缘层13上的栅极14,设置在栅极14上的绝缘层15,设置在绝缘层15上的源极16和漏极17,设置在源极16和漏极17上的平坦层18,设置在平坦层18上的像素电极19,设置在像素电极19上的有机发光限定层110,设置在有机发光限定层110上的有机发光层111,设置在有机发光层111上的上电极112。As shown in Figure 1, the main structure of the array substrate includes: a base substrate 10, a buffer layer 11 disposed on the base substrate 10, a semiconductor active layer 12 disposed on the buffer layer 11, a semiconductor active layer 12 disposed on the The gate insulating layer 13 on the gate insulating layer 13, the gate 14 disposed on the gate insulating layer 13, the insulating layer 15 disposed on the gate 14, the source 16 and the drain 17 disposed on the insulating layer 15, disposed on the source The flat layer 18 on the electrode 16 and the drain electrode 17, the pixel electrode 19 arranged on the flat layer 18, the organic light-emitting limiting layer 110 arranged on the pixel electrode 19, the organic light-emitting layer 111 arranged on the organic light-emitting limiting layer 110, An upper electrode 112 disposed on the organic light emitting layer 111 .
现有技术为了提高有机发光层111的光利用率,上电极112通常采用透明导电材料,而透明导电材料一般比单一导电金属材料具有更高的电阻率;此外,为了提高射出显示屏的显示亮度,还需要增加透明导电材料的透光率,透光率的增加则通常采用减薄透明导电层的方式来实现。透明导电层厚度的减小进一步增大了其电阻率,在大尺寸的显示屏中,显示区和非显示区之间会发生较大的电压降,影响发光层的发射电流注入,造成显示质量劣化。In the prior art, in order to improve the light utilization efficiency of the organic light-emitting layer 111, the upper electrode 112 usually uses a transparent conductive material, and the transparent conductive material generally has a higher resistivity than a single conductive metal material; in addition, in order to improve the display brightness of the emission display , it is also necessary to increase the light transmittance of the transparent conductive material, and the increase of the light transmittance is usually realized by thinning the transparent conductive layer. The reduction of the thickness of the transparent conductive layer further increases its resistivity. In a large-size display, a large voltage drop will occur between the display area and the non-display area, which will affect the emission current injection of the light-emitting layer and cause display quality. deteriorating.
如图2所示,为了降低阵列基板的显示区和非显示区之间的电压降,在非显示区增加一层金属走线层20,金属走线层20与上电极112电连接,达到减小电阻,进而降低显示区和非显示区之间的电压降的目的。另外,如图3所示,采用导电油墨30与上电极112相连接的方式减小电阻,进而降低显示区和非显示区之间的电压降。As shown in FIG. 2, in order to reduce the voltage drop between the display area and the non-display area of the array substrate, a layer of metal wiring layer 20 is added in the non-display area, and the metal wiring layer 20 is electrically connected with the upper electrode 112 to reduce the voltage drop between the display area and the non-display area. Small resistance, which in turn reduces the voltage drop between the display area and the non-display area. In addition, as shown in FIG. 3 , the resistance is reduced by connecting the conductive ink 30 to the upper electrode 112 , thereby reducing the voltage drop between the display area and the non-display area.
综上所述,阵列基板显示区和非显示区之间会发生较大的电压降,影响发光层的发光,造成显示质量劣化;目前,降低显示区和非显示区之间的电压时,需要新增加导电金属走线层和导电油墨,增加了制作工艺步骤,提高了制作工艺难度,同时,由于新增加的导电金属走线层会占据显示区域,降低了显示的开口率,不利于高质量显示屏的制作。To sum up, there will be a large voltage drop between the display area and the non-display area of the array substrate, which will affect the light emission of the light-emitting layer and cause the display quality to deteriorate. At present, when reducing the voltage between the display area and the non-display area, it is necessary to The newly added conductive metal wiring layer and conductive ink increase the manufacturing process steps and increase the difficulty of the manufacturing process. At the same time, because the newly added conductive metal wiring layer will occupy the display area, the aperture ratio of the display is reduced, which is not conducive to high quality Production of display screens.
本发明实施例提供了一种阵列基板及制作方法、显示装置,用以在不增加现有工艺难度的条件下,降低阵列基板显示区和非显示区之间的电压降,提高显示质量。Embodiments of the present invention provide an array substrate, a manufacturing method, and a display device, which are used to reduce the voltage drop between the display area and the non-display area of the array substrate and improve display quality without increasing the difficulty of the existing process.
为了使本发明的目的、技术方案和优点更加清楚,下面将结合附图对本发明作进一步地详细描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其它实施例,都属于本发明保护的范围。In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
下面结合附图详细介绍本发明具体实施例提供的阵列基板。The array substrate provided by specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
如图4所示,本发明具体实施例提供了一种阵列基板,包括衬底基板10,衬底基板10划分为显示区41和非显示区42,衬底基板10上设置有薄膜晶体管43,薄膜晶体管43上设置有有机发光限定层110,有机发光限定层110上设置有有机发光层111,该阵列基板还包括设置在有机发光层111上的上电极112,其中至少部分位于非显示区42的上电极112的厚度大于位于显示区41的上电极112的厚度。本发明具体实施例中的上电极可以作为有机发光二极管的阳极,也可以作为有机发光二极管的阴极,即在实际工艺过程中既可以对上电极施加正的电压,也可以对上电极施加负的电压。优选地,本发明具体实施例中上电极的材料为氧化铟锡或氧化铟锌的单层膜,或为氧化铟锡和氧化铟锌的复合膜。As shown in FIG. 4, the specific embodiment of the present invention provides an array substrate, including a base substrate 10, the base substrate 10 is divided into a display area 41 and a non-display area 42, and a thin film transistor 43 is arranged on the base substrate 10. The thin film transistor 43 is provided with an organic light-emitting limiting layer 110, and the organic light-emitting limiting layer 110 is provided with an organic light-emitting layer 111. The array substrate also includes an upper electrode 112 arranged on the organic light-emitting layer 111, at least part of which is located in the non-display area 42 The thickness of the upper electrode 112 is greater than the thickness of the upper electrode 112 located in the display area 41 . The upper electrode in the specific embodiment of the present invention can be used as the anode of the organic light-emitting diode, and can also be used as the cathode of the organic light-emitting diode, that is, in the actual process, either a positive voltage can be applied to the upper electrode, or a negative voltage can be applied to the upper electrode. Voltage. Preferably, the material of the upper electrode in the specific embodiment of the present invention is a single-layer film of indium tin oxide or indium zinc oxide, or a composite film of indium tin oxide and indium zinc oxide.
优选地,本发明具体实施例在衬底基板和薄膜晶体管之间设置有缓冲层,缓冲层的设置能够起到平坦衬底基板的作用,同时能够防止衬底基板中的杂质原子扩散到薄膜晶体管中。Preferably, in the specific embodiment of the present invention, a buffer layer is provided between the base substrate and the thin film transistor. The setting of the buffer layer can play the role of a flat base substrate, and at the same time can prevent impurity atoms in the base substrate from diffusing into the thin film transistor. middle.
本发明具体实施例中的薄膜晶体管可以为顶栅结构的薄膜晶体管,也可以为底栅结构的薄膜晶体管,当然还可以为其它结构的薄膜晶体管,本发明具体实施例并不对薄膜晶体管的具体结构作限定。The thin film transistor in the specific embodiment of the present invention may be a thin film transistor with a top gate structure, or a thin film transistor with a bottom gate structure, and of course a thin film transistor with other structures. The specific embodiment of the present invention is not limited to the specific structure of the thin film transistor Make a limit.
优选地,本发明具体实施例中的薄膜晶体管包括:依次位于衬底基板上的半导体有源层、栅极绝缘层、栅极、绝缘层、源极和漏极;或,本发明具体实施例中的薄膜晶体管包括:依次位于衬底基板上的栅极、栅极绝缘层、半导体有源层、源极和漏极。Preferably, the thin film transistor in the specific embodiment of the present invention includes: a semiconductor active layer, a gate insulating layer, a gate, an insulating layer, a source and a drain sequentially located on the substrate; or, the specific embodiment of the present invention The thin film transistor in TFT includes: a gate, a gate insulating layer, a semiconductor active layer, a source and a drain which are sequentially located on a substrate.
具体地,如图4所示,本发明具体实施例中的薄膜晶体管43包括位于衬底基板10上的半导体有源层12,位于半导体有源层12上的栅极绝缘层13,位于栅极绝缘层13上的栅极14,位于栅极14上的绝缘层15,位于绝缘层15上的源极16和漏极17。本发明具体实施例在与有机发光层111底面接触的层作为阴极的情况下,如果源极16材料的功函数较小,可以直接作为阴极层,有机发光层111与源极16直接连接,这时不需要制作像素电极,使得制作工艺更加简单。本发明具体实施例中的有机发光限定层110起限定有机发光层111位置的作用。Specifically, as shown in FIG. 4 , a thin film transistor 43 in a specific embodiment of the present invention includes a semiconductor active layer 12 on the base substrate 10, a gate insulating layer 13 on the semiconductor active layer 12, and a gate insulating layer 13 on the gate. A gate 14 on the insulating layer 13 , an insulating layer 15 on the gate 14 , a source 16 and a drain 17 on the insulating layer 15 . In the specific embodiment of the present invention, when the layer in contact with the bottom surface of the organic light-emitting layer 111 is used as the cathode, if the work function of the material of the source electrode 16 is small, it can be directly used as the cathode layer, and the organic light-emitting layer 111 is directly connected to the source electrode 16. There is no need to make pixel electrodes, which makes the manufacturing process simpler. The organic light-emitting limiting layer 110 in the specific embodiment of the present invention functions to limit the position of the organic light-emitting layer 111 .
具体地,如图5所示,本发明具体实施例中的阵列基板还包括设置在平坦层18上的像素电极19,像素电极19通过在平坦层18上刻蚀出的过孔与薄膜晶体管暴露出的源极16连接,有机发光层111位于像素电极19上。通过施加在像素电极19和上电极112上的电信号诱发有机发光层111发光,本发明具体实施例中当上电极112作为有机发光二极管的阳极时,像素电极19作为有机发光二极管的阴极,当上电极112作为有机发光二极管的阴极时,像素电极19作为有机发光二极管的阳极,通过阵列基板上的薄膜晶体管等电路结构来控制像素电极19和上电极112之间的电压,从而控制有机发光层111的发光效果。本发明具体实施例中上电极的材料为氧化铟锡或氧化铟锌的单层膜,或为氧化铟锡和氧化铟锌的复合膜,本发明具体实施例中位于非显示区42的上电极112的厚度大于位于显示区41的上电极112的厚度。因此,本发明具体实施例通过将上电极112分区设置,在与有机发光层111接触的显示透光区的上电极112的膜层厚度较薄,以提高光的透过率;在非显示区的上电极112的膜层厚度较厚,以降低上电极的电阻率,在不增加现有工艺难度的条件下,提高显示质量与产品良率。Specifically, as shown in FIG. 5 , the array substrate in the specific embodiment of the present invention further includes a pixel electrode 19 disposed on the planar layer 18 , and the pixel electrode 19 is exposed to the thin film transistor through a via hole etched on the planar layer 18 . The output source electrode 16 is connected, and the organic light emitting layer 111 is located on the pixel electrode 19 . The organic light-emitting layer 111 is induced to emit light by an electrical signal applied to the pixel electrode 19 and the upper electrode 112. When the upper electrode 112 is used as the cathode of the organic light emitting diode, the pixel electrode 19 is used as the anode of the organic light emitting diode, and the voltage between the pixel electrode 19 and the upper electrode 112 is controlled through a circuit structure such as a thin film transistor on the array substrate, thereby controlling the organic light emitting layer. 111 glow effects. In the specific embodiment of the present invention, the material of the upper electrode is a single-layer film of indium tin oxide or indium zinc oxide, or a composite film of indium tin oxide and indium zinc oxide. In the specific embodiment of the present invention, the upper electrode located in the non-display area 42 The thickness of 112 is greater than the thickness of the upper electrode 112 located in the display area 41 . Therefore, in the specific embodiment of the present invention, the upper electrode 112 is arranged in partitions, and the film thickness of the upper electrode 112 in the display light-transmitting area in contact with the organic light-emitting layer 111 is relatively thin to improve the light transmittance; in the non-display area The film thickness of the upper electrode 112 is thicker, so as to reduce the resistivity of the upper electrode, and improve the display quality and product yield without increasing the difficulty of the existing process.
如图6所示,本发明具体实施例中的阵列基板还包括辅助电极60,辅助电极60与像素电极19位于同一层,辅助电极60位于衬底基板10的非显示区42,上电极112位于辅助电极60上与辅助电极60电连接,位于辅助电极60上的上电极112的厚度大于位于像素电极19上方的上电极112的厚度。辅助电极60的设置能够进一步降低非显示区的上电极112的电阻率,由于非显示区的上电极112的膜层厚度较厚,因此上电极112与辅助电极60电连接时,不容易出现因接触孔较深、上电极112较薄所造成的上电极断裂情况,从而降低电性能接触不良,提升产品良率。当然,本发明具体实施例中的辅助电极60也可以采用图2中与金属走线层20相同的设计方式,同样地,由于非显示区的上电极112的膜层厚度较厚,上电极112沉积在较厚的辅助电极上方时,不容易在辅助电极的边缘区出现断裂情况,从而降低电性能接触不良。As shown in FIG. 6 , the array substrate in the specific embodiment of the present invention further includes an auxiliary electrode 60 located on the same layer as the pixel electrode 19, the auxiliary electrode 60 is located on the non-display area 42 of the base substrate 10, and the upper electrode 112 is located on the The auxiliary electrode 60 is electrically connected to the auxiliary electrode 60 , and the thickness of the upper electrode 112 located on the auxiliary electrode 60 is greater than the thickness of the upper electrode 112 located above the pixel electrode 19 . The setting of the auxiliary electrode 60 can further reduce the resistivity of the upper electrode 112 in the non-display area. Since the film thickness of the upper electrode 112 in the non-display area is thicker, when the upper electrode 112 is electrically connected with the auxiliary electrode 60, it is not easy to cause due to The upper electrode breakage caused by the deeper contact hole and the thinner upper electrode 112 can reduce the poor contact of electrical properties and improve the product yield. Certainly, the auxiliary electrode 60 in the specific embodiment of the present invention can also adopt the same design method as the metal wiring layer 20 in FIG. When deposited on a thicker auxiliary electrode, it is not easy to break in the edge area of the auxiliary electrode, thereby reducing the poor contact of electrical properties.
本发明具体实施例还提供了一种包括上述阵列基板的显示装置,所述显示装置可以为OLED显示器件等。A specific embodiment of the present invention also provides a display device including the above-mentioned array substrate, and the display device may be an OLED display device or the like.
本发明具体实施例还提供了一种阵列基板的制作方法,包括薄膜晶体管的制作、平坦层的制作、有机发光层的制作,上电极的制作,其中至少部分位于阵列基板非显示区的所述上电极的厚度大于位于阵列基板显示区的所述上电极的厚度。A specific embodiment of the present invention also provides a method for manufacturing an array substrate, including manufacturing a thin film transistor, a flat layer, an organic light-emitting layer, and an upper electrode, wherein at least part of the array substrate is located in the non-display area. The thickness of the upper electrode is greater than the thickness of the upper electrode located in the display area of the array substrate.
优选地,如图7所示,本发明具体实施例采用半色调掩膜板或灰色调掩膜板制作上电极,具体包括:Preferably, as shown in Figure 7, the specific embodiment of the present invention uses a half-tone mask or a gray-tone mask to make the upper electrode, specifically including:
S701、在有机发光层上形成(例如采用沉积的方式)透明导电薄膜;S701, forming (for example, by depositing) a transparent conductive film on the organic light-emitting layer;
S702、在所述透明导电薄膜上形成(例如采用涂覆的方式)光刻胶,通过掩膜板(例如半色调掩膜板或灰色调掩膜板)进行曝光、显影,形成光刻胶完全覆盖区、光刻胶部分覆盖区和无光刻胶覆盖区,其中,所述光刻胶完全覆盖区对应阵列基板的非显示区,光刻胶部分覆盖区对应阵列基板的显示区;S702. Form (for example, by coating) a photoresist on the transparent conductive film, and perform exposure and development through a mask (for example, a halftone mask or a gray tone mask) to form a complete photoresist. a coverage area, a photoresist partial coverage area, and a photoresist-free coverage area, wherein the photoresist full coverage area corresponds to the non-display area of the array substrate, and the photoresist partial coverage area corresponds to the display area of the array substrate;
S703、通过刻蚀,去除无光刻胶覆盖区的所述透明导电薄膜,并去除光刻胶部分覆盖区的光刻胶,暴露出光刻胶部分覆盖区的透明导电薄膜;S703. By etching, remove the transparent conductive film in the area not covered by the photoresist, and remove the photoresist in the partially covered area of the photoresist, exposing the transparent conductive film in the partially covered area of the photoresist;
S704、通过刻蚀,去除暴露出的部分厚度的所述透明导电薄膜,形成位于阵列基板显示区的上电极;S704, removing the exposed part of the thickness of the transparent conductive film by etching to form an upper electrode located in the display area of the array substrate;
S705、去除剩余光刻胶,形成位于阵列基板非显示区的上电极,位于所述非显示区的上电极的厚度大于位于所述显示区的上电极的厚度。S705 , removing the remaining photoresist to form an upper electrode located in the non-display area of the array substrate, the thickness of the upper electrode located in the non-display area is greater than the thickness of the upper electrode located in the display area.
下面结合附图详细介绍本发明具体实施例提供的阵列基板的制作方法。The manufacturing method of the array substrate provided by the specific embodiment of the present invention will be described in detail below with reference to the accompanying drawings.
如图8所示,本发明具体实施例首先在衬底基板10上制作缓冲层11,衬底基板10可以是玻璃基板,也可以是柔性基板,缓冲层11的具体制作过程与现有技术相同,这里不再赘述。接着在缓冲层11上制作半导体有源层12,半导体有源层12可以是非晶硅膜,也可以是对非晶硅膜进行结晶制成的多晶硅膜,半导体有源层12的具体制作过程与现有技术相同,这里不再赘述。接着在半导体有源层12上制作栅极绝缘层13,栅极绝缘层13可以是二氧化硅膜(SiO2)、氮化硅膜(SiNx)、氮氧化硅膜(SiO2Nx),栅极绝缘层13的具体制作过程与现有技术相同,这里不再赘述。接着在栅极绝缘层13上制作栅极14,栅极14为金属钼(Mo)、金属铝(Al)、金属镍(Ni)等金属的单层膜,或为多种金属组成的复合膜,栅极14的具体制作过程与现有技术相同,这里不再赘述。接着在栅极14上制作绝缘层15,绝缘层15可以是二氧化硅膜(SiO2)、氮化硅膜(SiNx)、氮氧化硅膜(SiO2Nx),绝缘层15的具体制作过程与现有技术相同,这里不再赘述。接着在绝缘层15上制作源极16和漏极17,源极16和漏极17的具体制作过程与现有技术相同,这里不再赘述。接着在源极16和漏极17上制作平坦层18,平坦层18的具体制作过程与现有技术相同,这里不再赘述。接着在平坦层18上制作像素电极19,像素电极19的具体制作过程与现有技术相同,这里不再赘述。接着在像素电极19上制作有机发光限定层110,有机发光限定层110的具体制作过程与现有技术相同,这里不再赘述。接着在有机发光限定层110上制作有机发光层111,有机发光层111的具体制作过程与现有技术相同,这里不再赘述。接着在有机发光层111上沉积一层透明导电薄膜80,通过对透明导电薄膜80进行构图工艺后形成本发明具体实施例的上电极。As shown in FIG. 8 , in a specific embodiment of the present invention, a buffer layer 11 is first fabricated on a base substrate 10. The base substrate 10 can be a glass substrate or a flexible substrate, and the specific manufacturing process of the buffer layer 11 is the same as that of the prior art. , which will not be repeated here. Then make semiconductor active layer 12 on buffer layer 11, semiconductor active layer 12 can be amorphous silicon film, also can be the polysilicon film that crystallization is made to amorphous silicon film, the specific manufacturing process of semiconductor active layer 12 and The prior art is the same and will not be repeated here. Then make gate insulating layer 13 on semiconductor active layer 12, gate insulating layer 13 can be silicon dioxide film (SiO2), silicon nitride film (SiNx), silicon nitride oxide film (SiO2Nx), gate insulating layer The specific manufacturing process of 13 is the same as that of the prior art, and will not be repeated here. Next, the gate 14 is fabricated on the gate insulating layer 13, and the gate 14 is a single-layer film of metals such as metal molybdenum (Mo), metal aluminum (Al), metal nickel (Ni), or a composite film composed of multiple metals. , the specific manufacturing process of the gate 14 is the same as that of the prior art, and will not be repeated here. Then make insulating layer 15 on gate 14, insulating layer 15 can be silicon dioxide film (SiO2), silicon nitride film (SiNx), silicon oxynitride film (SiO2Nx), the concrete manufacturing process of insulating layer 15 is the same as existing The technology is the same and will not be repeated here. Next, the source electrode 16 and the drain electrode 17 are formed on the insulating layer 15. The specific manufacturing process of the source electrode 16 and the drain electrode 17 is the same as that of the prior art, and will not be repeated here. Next, a flat layer 18 is formed on the source electrode 16 and the drain electrode 17. The specific manufacturing process of the flat layer 18 is the same as that of the prior art, and will not be repeated here. Next, the pixel electrode 19 is fabricated on the flat layer 18, and the specific fabrication process of the pixel electrode 19 is the same as that of the prior art, and will not be repeated here. Next, an organic light emission limiting layer 110 is fabricated on the pixel electrode 19 . The specific fabrication process of the organic light emitting limiting layer 110 is the same as that of the prior art, and will not be repeated here. Next, the organic light-emitting layer 111 is fabricated on the organic light-emitting limiting layer 110. The specific fabrication process of the organic light-emitting layer 111 is the same as that of the prior art, and will not be repeated here. Next, a layer of transparent conductive film 80 is deposited on the organic light-emitting layer 111 , and the upper electrode of the specific embodiment of the present invention is formed after patterning the transparent conductive film 80 .
本发明具体实施例为了降低上电极的电阻率,需要制作膜层厚度较厚的上电极,为了提高上电极的透光率,需要制作膜层厚度较薄的上电极,本发明具体实施例为了在不影响透光率的条件下降低上电极的电阻率,将上电极分区设置,在与有机发光层接触的显示透光区,将上电极的膜层的厚度制作的较薄,以提高光的透过率;在非显示区,将上电极的膜层的厚度制作的较厚,以降低上电极的电阻率。In the specific embodiment of the present invention, in order to reduce the resistivity of the upper electrode, it is necessary to make an upper electrode with a thicker film thickness, and in order to improve the light transmittance of the upper electrode, it is necessary to make an upper electrode with a thinner film thickness. To reduce the resistivity of the upper electrode without affecting the light transmittance, the upper electrode is arranged in partitions, and the film thickness of the upper electrode is made thinner in the display light-transmitting area in contact with the organic light-emitting layer to improve the light transmittance. In the non-display area, the film thickness of the upper electrode is made thicker to reduce the resistivity of the upper electrode.
具体地,如图9所示,本发明具体实施例采用半色调掩膜板或采用灰色调掩膜板制作上电极,如本发明具体实施例采用半色调掩膜板91制作上电极,半色调掩膜板91包括半透光区911、遮光区912和全透光区(图中未示出)。具体实施时,在透明导电薄膜80上涂覆光刻胶90,通过半色调掩膜板91进行曝光、显影,形成光刻胶完全覆盖区、光刻胶部分覆盖区和无光刻胶覆盖区(图中未示出),其中,光刻胶完全覆盖区对应阵列基板的非显示区42,光刻胶部分覆盖区对应阵列基板的显示区41,无光刻胶覆盖区对应阵列基板不需要保留上电极的区域。本发明具体实施例的光刻胶90以正性光刻胶为例,显示区41对应的光刻胶经过半色调掩膜板91的半透光区911进行光照射,非显示区42对应的光刻胶经过半色调掩膜板91的遮光区912进行光照射,当然,本发明具体实施例中的光刻胶90也可以为负性光刻胶,若为负性光刻胶时,非显示区42对应半色调掩膜板91的全透光区。Specifically, as shown in FIG. 9, the specific embodiment of the present invention uses a halftone mask or a gray tone mask to make the upper electrode, such as the specific embodiment of the present invention uses a halftone mask 91 to make the upper electrode, halftone The mask plate 91 includes a semi-transparent region 911 , a light-shielding region 912 and a fully transparent region (not shown in the figure). During specific implementation, the photoresist 90 is coated on the transparent conductive film 80, and the exposure and development are carried out through the half-tone mask 91 to form a photoresist full coverage area, a photoresist partial coverage area and no photoresist coverage area. (not shown in the figure), wherein, the photoresist full coverage area corresponds to the non-display area 42 of the array substrate, the photoresist partial coverage area corresponds to the display area 41 of the array substrate, and the non-photoresist coverage area corresponds to the array substrate. Reserve the area for the upper electrode. The photoresist 90 of the specific embodiment of the present invention takes positive photoresist as an example, the photoresist corresponding to the display area 41 is irradiated with light through the semi-transparent area 911 of the halftone mask 91, and the photoresist corresponding to the non-display area 42 The photoresist is irradiated with light through the light-shielding region 912 of the halftone mask plate 91. Of course, the photoresist 90 in the specific embodiment of the present invention can also be a negative photoresist. If it is a negative photoresist, it is not The display area 42 corresponds to the fully transparent area of the halftone mask 91 .
接着通过刻蚀,去除无光刻胶覆盖区的透明导电薄膜,并去除光刻胶部分覆盖区的光刻胶,暴露出光刻胶部分覆盖区的透明导电薄膜;接着再通过刻蚀,去除暴露出的部分厚度的透明导电薄膜,形成位于阵列基板显示区的上电极,由于显示区的透明导电薄膜被刻蚀掉一部分,故位于显示区的透明导电薄膜的厚度较薄;最后去除剩余光刻胶,形成位于阵列基板非显示区的上电极,由于非显示区的透明导电薄膜没有被刻蚀,故位于非显示区的透明导电薄膜的厚度较厚,即本发明具体实施例制作得到的上电极位于非显示区的厚度大于位于显示区的厚度,本发明具体实施例最后形成的上电极112如图5所示。Then by etching, remove the transparent conductive film in the non-photoresist coverage area, and remove the photoresist in the photoresist partial coverage area, exposing the transparent conductive film in the photoresist partial coverage area; then by etching, remove The exposed part of the thickness of the transparent conductive film forms the upper electrode located in the display area of the array substrate. Since a part of the transparent conductive film in the display area is etched away, the thickness of the transparent conductive film located in the display area is relatively thin; finally remove the remaining light Resist to form the upper electrode located in the non-display area of the array substrate. Since the transparent conductive film in the non-display area has not been etched, the thickness of the transparent conductive film located in the non-display area is relatively thick, which is obtained by the specific embodiment of the present invention. The thickness of the upper electrode in the non-display area is greater than that in the display area. The upper electrode 112 finally formed in the specific embodiment of the present invention is shown in FIG. 5 .
综上所述,本发明具体实施例提供的一种阵列基板及制作方法,将阵列基板中面向显示出光面的上电极进行分区设置,以形成不同厚度的上电极区域,在与有机发光层接触的显示透光区的上电极的膜层厚度较薄,以提高光的透过率,在非显示区的上电极的膜层厚度较厚,以降低其电阻率,同时还可以减小与辅助电极走线接触区的接触不良情况,在不增加现有工艺难度的条件下,提高显示质量与产品良率。To sum up, the specific embodiments of the present invention provide an array substrate and a manufacturing method. The upper electrode facing the light-displaying surface in the array substrate is partitioned to form regions of the upper electrode with different thicknesses. The film thickness of the upper electrode in the display light-transmitting area is thinner to increase the light transmittance, and the film thickness of the upper electrode in the non-display area is thicker to reduce its resistivity, and at the same time it can reduce and assist Poor contact in the electrode wiring contact area can improve display quality and product yield without increasing the difficulty of the existing process.
显然,本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样,倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these modifications and variations.
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