CN104714176A - Power supply testing device for reducing surge current and control method thereof - Google Patents

Abstract

A power supply test device for reducing inrush current and a control method thereof, the power supply test device for reducing inrush current is used to test the charge and discharge status of a battery pack, comprising a switch transistor, a coupling unit and a voltage adjustment module. The first end, the second end and the control end of the switch transistor are respectively coupled to the battery pack, the coupling unit and the voltage adjustment module. The voltage adjustment module is used to provide a first voltage level to the switch transistor, and provide a second voltage level to the switch transistor at a preset time. The preset time is when the switch transistor operates in a linear region and the first voltage level is greater than the second voltage level.

Description

Power supply test device and control method for reducing inrush current

technical field

The invention relates to a power supply testing device for reducing inrush current and a control method thereof, and in particular to a power supply testing device for reducing inrush current and a control method thereof which can control the driving voltage provided to a switching transistor in sections.

Background technique

At present, the battery charge and discharge tester used to test the charge and discharge status of the battery is equipped with a set of protective switching elements (such as switching transistors or relays) and fuses at the output terminals of the battery charge and discharge tester for coupling the battery to be tested. (Also known as fuse, fuse).

This protective switch element and fuse can prevent the short circuit of the electronic circuit inside the battery charge and discharge tester caused by the tester at the moment when the battery to be tested is coupled to the output terminal of the battery charge and discharge tester, which may cause an explosion. In addition to the risk, it can also prevent the battery under test from being continuously discharged through the electronic circuit inside the battery charge and discharge tester after it is coupled to the output terminal of the battery charge and discharge tester.

However, at the moment of output of the battery charge and discharge tester, a huge inrush current (inrush current, also known as surge current) will still be generated for the battery to be tested, which will cause the load of the protective switching element and the fuse at the output end of the battery charge and discharge tester. And then reduce the service life of the protection switching element and the fuse.

Therefore, when selecting protection switching elements and fuses of battery charge and discharge testers, electronic components with higher current resistance are usually selected to avoid the large current stress generated at the moment of switching of the protection switching elements, so as to avoid the protection of switching elements and fuses. Damaged fuse. However, choosing a protective switch element with a higher rated current (current rating) will add a lot of load to the battery charge and discharge tester, no matter in terms of cost or space utilization.

Contents of the invention

In view of the above problems, the object of the present invention is to provide a power testing device and its control method, which can reduce the surge current ( inrush current, also known as surge current).

According to an embodiment of the present invention, a power supply test device for reducing inrush current, the power test device is used to test the charge and discharge status of the battery pack, the power test device includes a charge and discharge module and a voltage adjustment module, wherein the charge and discharge module It has a switching transistor and a coupling unit. The first end of the switch transistor is coupled to the battery pack, the second end of the switch transistor is coupled to the coupling unit, and the control end of the switch transistor is coupled to the voltage adjustment module. When the switch transistor is turned on, the coupling unit charges or discharges the battery pack. The voltage adjustment module is used for providing the first voltage level and providing the second voltage level to the switch transistor at a predetermined time. Wherein, the preset time is when the switch transistor operates in the linear region, and the first voltage level is greater than the second voltage level.

According to a control method of a power supply test device for reducing inrush current in an embodiment of the present invention, the control method of the power test device is used in the power test device to test the charging and discharging status of the battery pack, and the power test device includes a switching transistor and The coupling unit, the first terminal of the switch transistor is coupled to the battery pack, and the second terminal of the switch transistor is coupled to the coupling unit. The step process of the control method of the power testing device includes: providing the first voltage level to the switch transistor. When the switch transistor operates in the linear region, the second voltage level is provided to the switch transistor, and the first voltage level is greater than the second voltage level.

Based on the above, the present invention provides a power supply testing device and its control method for reducing inrush current. The voltage adjustment module can selectively provide a driving voltage whose voltage level is the first voltage level or the second voltage level to The switching transistor, so that the switching transistor can receive a driving voltage with a lower voltage level when it is in the linear region, so that the rising slope of the cross-voltage change of the switching transistor in the linear region is slower than that of the switching transistor in the cut-off region and saturation region The rising slope of the change in the trans-pressure.

The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

Description of drawings

FIG. 1A is a functional block diagram of a power testing device according to an embodiment of the present invention;

FIG. 1B is a functional block diagram of a power testing device according to another embodiment of the present invention;

FIG. 2A is a waveform diagram of the driving voltage output by the voltage adjustment module in FIG. 1A or FIG. 1B;

2B is a waveform diagram of the voltage across the switching transistor according to the driving voltage of FIG. 2A;

3 is a functional block diagram of a power testing device according to yet another embodiment of the present invention;

FIG. 4A is a waveform diagram of the input voltage input to the voltage adjustment module according to FIG. 3;

FIG. 4B is a waveform diagram of a pulse width modulation signal according to the pulse width modulation unit of FIG. 3;

FIG. 4C is a waveform diagram of the driving voltage output by the driving unit according to FIG. 3;

5 is a schematic circuit diagram of a power testing device according to another embodiment of the present invention;

FIG. 6A is a waveform diagram of the driving voltage output by the voltage adjustment module in FIG. 5;

6B is a waveform diagram of the voltage across the switching transistor according to the driving voltage of FIG. 6A;

7 is a flow chart of steps of a method for controlling a power testing device according to an embodiment of the present invention;

FIG. 8 is a flow chart of steps of a method for controlling a power testing device according to another embodiment of the present invention.

Among them, reference signs

1, 1’, 1” power test device

10 Charge and discharge module

100 switching transistors

102 coupling unit

12 voltage adjustment module

120 Pulse Width Modulation Units

122 drive units

14 detection module

16 filter module

2 battery packs

R1～R5 Impedance element

C1～C3 coupling capacitor

D1 Diode

M1 transistor

Vin input voltage source

V1 first voltage level

V2 second voltage level

t1～t4 time point

A1 Linear region

S700～S702, S800～S808 Step flow

Detailed ways

The detailed features and advantages of the present invention are described in detail below in the implementation manner, and its content is enough to make any person familiar with the related art understand the technical content of the present invention and implement it accordingly, and according to the content of the invention in this specification, the scope of claims and the accompanying drawings , anyone skilled in the relevant art can easily understand the related objects and advantages of the present invention. The following examples are to further describe the viewpoints of the present invention in detail, but not to limit the scope of the present invention in any way.

[One embodiment of the power supply testing device]

Please refer to FIG. 1A , which is a functional block diagram of a power testing device according to an embodiment of the present invention. As shown in FIG. 1A , the power testing device 1 is used for testing the charging and discharging status of the battery pack 2 , and the battery pack 2 is detachably coupled to the power testing device 1 . The power testing device 1 mainly includes a charging and discharging module 10 and a voltage adjustment module 12 , wherein the charging and discharging module 10 further includes a switching transistor 100 and a coupling unit 102 . A first terminal of the switching transistor 100 is coupled to the battery pack 2 , a second terminal of the switching transistor 100 is coupled to the coupling unit 102 , and a control terminal of the switching transistor 100 is coupled to the voltage adjustment module 12 .

In practice, the battery pack 2 includes at least one battery unit (not shown in the drawing), in other words, more than two battery units can be connected in series or in parallel to form the battery pack 2, which is not included in the present invention. Limit the number of battery cells used and how they are connected. In practice, the battery unit may be a lithium-ion battery, a nickel-metal hydride battery, a nickel-cadmium battery or a lead storage battery, but not limited thereto. Each functional module in the power testing device 1 will be described in detail below.

The coupling unit 102 in the charging and discharging module 10 is used for charging or discharging the battery pack 2 when the switching transistor 100 is turned on. In practice, the coupling unit 102 can be a charge and discharge circuit composed of at least one coupling capacitor or at least one coupling inductor, which is not limited in the present invention. In addition, in practice, the switching transistor 100 can be a metal oxide semiconductor field effect transistor (MOSFET, also known as a metal oxide semiconductor field effect transistor), a bipolar junction transistor (bipolar junction transistor) , BJT, also known as bipolar transistor, triode) or insulated gate bipolar transistor (insulated gate bipolar transistor, IGBT), but not limited thereto. Generally, a set of fuses (also known as fuses, fuses) can be provided between the first end of the switching transistor 100 and the battery pack 2 , but the fuse is not an essential component in the power testing device 1 of the present invention.

Taking the switching transistor 100 as an example of a MOSFET, the drain of the MOSFET is the first end of the switching transistor 100, and the source of the MOSFET is the switch. The second terminal of the transistor 100 , the gate of the MOSFET is the control terminal of the switch transistor 100 . If the switch transistor 100 is a bipolar transistor, then the collector of the bipolar transistor is the first end of the switch transistor 100, and the emitter of the bipolar transistor is the second end of the switch transistor 100, The base of the bipolar transistor is the control terminal of the switching transistor 100 .

The voltage adjustment module 12 is used for selectively providing the first voltage level or the second voltage level to the control terminal of the switch transistor 100 . In more detail, the voltage adjustment module 12 is used to provide the first voltage level to the switch transistor 100 and provide the second voltage level to the switch transistor 100 within a predetermined period of time. Wherein, the aforementioned preset time refers to a time interval during which the switching transistor 100 operates in a linear region, and the first voltage level is greater than the second voltage level. In actual operation, the voltage adjustment module 12 receives an input voltage provided by an input voltage source (not shown in the figure), and adjusts the output voltage level to be the first voltage level or the second voltage level The driving voltage (driving voltage) is given to the switching transistor 100. In general, the input voltage source can be, for example, an AC power supply provided by a commercial power supply, or an AC power supply or a DC power supply generated by a generator. Of course, those with ordinary knowledge in the technical field can regard the input voltage source as being provided by a host device (such as a desktop computer or a notebook computer) through a universal serial bus (universal serial bus, USB) or IEEE 1394 (also known as firewire) The DC power outputted by the interface is not limited in the present invention.

In order to more clearly illustrate the operation mode of the power testing device 1 of the present invention, please refer to FIG. 1A, FIG. 2A and FIG. 2B together. FIG. 2A is a waveform diagram of the driving voltage output by the voltage adjustment module according to FIG. 1A; FIG. 2B is a waveform diagram of a voltage across a switching transistor according to the driving voltage of FIG. 2A .

As shown in FIG. 2A and FIG. 2B, when the switching transistor 100 is coupled to the battery pack 2 at time point t1, the voltage adjustment module 12 will start to provide the first voltage level V1 to the control terminal of the switching transistor 100, so that the switching transistor 100 The voltage level from the control terminal to the second terminal of the control terminal will rise with the first rising slope in the interval from time point t1 to time point t2 (as shown in FIG. 2B ), and when the switching transistor 100 operates in the linear region A1 (that is, time point t2～time point t3), the voltage adjustment module 12 will provide the second voltage level V2 to the control terminal of the switching transistor 100, so that the voltage level from the control terminal to the second terminal of the switching transistor 100 is between the time point t2～time point The interval at point t3 (ie, the aforementioned preset time) will rise with the second rising slope (as shown in FIG. 2B ).

Next, when the switch transistor 100 is at the time point t3, the voltage level from the control terminal to the second terminal of the switch transistor 100 will not be in the linear region A1, and the voltage adjustment module 12 will provide the first voltage level V1 for the control of the switch transistor 100 terminal, so that the voltage level from the control terminal to the second terminal of the switching transistor 100 will rise with the first rising slope after the time point t3 and before the switching transistor 100 is turned on, and after the time point t4, the control terminal of the switching transistor 100 The voltage level to the second terminal will reach the threshold voltage (threshold voltage, also known as conduction voltage, critical voltage) of the switching transistor 100, so that the switching transistor 100 will continue to receive the first voltage level V1 output by the voltage adjustment module 12 driven and turned on.

In other words, when the switching transistor 100 is coupled to the battery pack 2 at the time point t1, the voltage adjustment module 12 receives the input voltage provided by the input voltage source, and adjusts the voltage level of the input voltage according to the characteristic parameter of the switching transistor 100 is the first voltage level V1 or the second voltage level V2, and outputs the driving voltage whose voltage level is the first voltage level V1 or the second voltage level V2 to the switching transistor 100, wherein the above-mentioned characteristic parameters include the switching The bias voltage ranges when the transistor 100 operates in the cut-off region, the linear region and the saturation region. Therefore, the continuous waveform of the driving voltage composed of the first voltage level V1 or the second voltage level V2 is a stepped waveform rising or falling in a stepwise manner.

It should be noted that since the first voltage level V1 shown in FIG. 2A is greater than the second voltage level V2 , the first rising slope shown in FIG. 2B will be greater than the second rising slope. In other words, when the switch transistor 100 receives the first voltage level V1 or the second voltage level V2 and the switch transistor 100 is not turned on, the voltage from the control terminal to the second terminal when the switch transistor 100 operates in the linear region A1 The rising slope is smaller than the rising slope of the voltage from the control terminal to the second terminal when operating in the cut-off region and the saturation region.

In addition, the bias voltage range of the switch transistor 100 operating in the linear region A1 can be obtained by the tester by referring to the data sheet of the switch transistor 100, or can be detected by the detection module 14 to detect the operation of the switch transistor 100. The bias voltage range in the linear region A1 is not limited by the present invention.

[Another embodiment of the power supply testing device]

Please refer to FIG. 1B , which is a functional block diagram of a power testing device according to another embodiment of the present invention. As shown in FIG. 1B , the power testing device 1' mainly includes a charge and discharge module 10, a voltage adjustment module 12, and a detection module 14, wherein the charge and discharge module 10 further includes a switching transistor 100 and a coupling unit 102. The first terminal of the switching transistor 100 is coupled to the battery pack 2, the second terminal of the switching transistor 100 is coupled to the coupling unit 102, the control terminal of the switching transistor 100 is coupled to the voltage adjustment module 12 and the detection module 14, and the detection module 14 is coupled to Between the control terminal of the switching transistor 100 and the voltage adjustment module 12 . Since most of the functional modules of the power test device 1' of this embodiment are the same as those of the power test device 1 of the previous embodiment, the connection and operation of the same functional modules will not be repeated in this embodiment. .

Different from the power testing device 1 of the previous embodiment, the power testing device 1' of this embodiment further includes a detection module 14. The detection module 14 is used to detect the voltage level of the control terminal of the switching transistor 100, and determine whether the voltage level from the control terminal to the second terminal of the switching transistor 100 is in the linear region, so as to control the voltage adjustment module 12 to output the first voltage level or the second voltage level. Two voltage levels. In order to more clearly describe the operation modes of the voltage adjustment module 12 and the detection module 14 of the power testing device 1 of the present invention, please refer to FIG. 1B , FIG. 2A and FIG. 2B together.

As shown in FIG. 2A and FIG. 2B , when the switch transistor 100 is coupled to the battery pack 2 at time point t1 , the voltage regulation module 12 will start to provide the driving voltage to the switch transistor 100 . At this time, since the voltage level from the control terminal to the second terminal of the switching transistor 100 detected by the detection module 14 (that is, the voltage across the switch transistor 100 ) is not yet in the linear region A1, the detection module 14 will control the voltage adjustment module 12 The output voltage level is the driving voltage of the first voltage level V1 (as shown in FIG. 2A ) to the switching transistor 100, so that the voltage level from the control terminal to the second terminal of the switching transistor 100 has not yet reached the linear region A1 ( That is, the interval from the time point t1 to the time point t2) will rise with the first rising slope (as shown in FIG. 2B ).

When the switching transistor 100 is at the time point t2, since the voltage level from the control terminal to the second terminal of the switching transistor 100 detected by the detection module 14 is in the linear region A1, the detection module 14 will control the voltage adjustment module 12 to output the voltage level The driving voltage (as shown in FIG. 2A ) which is the second voltage level V2 is applied to the switching transistor 100, so that the voltage level from the control terminal to the second terminal of the switching transistor 100 is in the linear region A1 (that is, the time point t2～ The interval at the time point t3) will rise with the second rising slope (as shown in FIG. 2B ).

When the switch transistor 100 is at the time point t3, since the voltage level from the control terminal to the second terminal of the switch transistor 100 detected by the detection module 14 is no longer in the linear region A1, the detection module 14 will control the voltage adjustment module 12 to output The voltage level is the driving voltage of the first voltage level V1 (as shown in FIG. 2A ) to the switching transistor 100, so that the voltage level from the control terminal to the second terminal of the switching transistor 100 is higher than the linear region A1 (ie The interval from time point t3 to time point t4) will rise with the first rising slope (as shown in FIG. 2B ).

When the switch transistor 100 is at the time point t4, since the voltage level from the control terminal to the second terminal of the switch transistor 100 has reached the threshold voltage of the switch transistor 100, the switch transistor 100 will continue to receive the first output from the voltage adjustment module 12 at this moment. A voltage level V1 is driven to conduct, and the voltage level from the control terminal to the second terminal of the switching transistor 100 is fixed within a specific range (as shown in FIG. 2B ).

[Another embodiment of the power supply testing device]

Please refer to FIG. 3 , which is a functional block diagram of a power testing device according to yet another embodiment of the present invention. As shown in Figure 3, the power supply test device 1" mainly includes a charge and discharge module 10, a voltage adjustment module 12, a detection module 14, and a filter module 16, wherein the charge and discharge module 10 further includes a switching transistor 100 and a coupling unit 102, and the voltage The adjustment module 12 further includes a pulse width modulation unit 120 and a drive unit 122. The filter module 16 is coupled between the drive unit 122 in the voltage adjustment module 12 and the control terminal of the switching transistor 100, and the detection module 14 is coupled to the switch Between the control terminal of the transistor 100 and the pulse width modulation unit 120 in the voltage adjustment module 12. Since most of the functional modules of the power test device 1 " of this embodiment are the same as the power test device 1 and the power test device of the previous embodiment The device 1' is the same, so this embodiment will not repeat the connection and operation of the same functional modules here.

Different from the power test device 1 of the previous embodiment, the voltage adjustment module 12 in the power test device 1" of this embodiment can be realized by the pulse width modulation unit 120 and the driving unit 122. The pulse width modulation The variable unit 120 is used to generate a set of pulse width modulation signals according to the voltage level of the control terminal of the switching transistor 100 detected by the detection module 14. In practice, the pulse width modulation unit 120 can be a A digital pulse width modulation controller (pulse width modulation controller, also known as pulse width modulation controller, PWM controller). The driving unit 122 is used to modulate the duty cycle (duty cycle, also known as work) of the signal according to the pulse width modulation period, duty cycle), and correspondingly generate a driving voltage whose voltage level is the first voltage level V1 or a driving voltage whose voltage level is the second voltage level V2.

The filtering module 16 is used to filter the first voltage level V1 and the second voltage level V2 output by the driving unit 122 to eliminate the noise of the driving voltage, so that the voltage level from the control terminal to the second terminal of the switching transistor 100 It is relatively flat when quasi-linear. In practice, the filtering module 16 can be a resistor capacitor circuit (RC circuit), and the resistor capacitor circuit can be a first-order resistor-capacitor series circuit or a second-order resistor-capacitor series circuit, but it is not limited thereto. . In other words, the filtering module 16 can be any order of electronic filters (electronic filters) such as a resistor-capacitor circuit, a resistor-inductor circuit (resistor inductor circuit, RL circuit).

In order to describe the operation modes of the pulse width modulation unit 120 , the driving unit 122 and the detection module 14 more clearly, please refer to FIG. 3 , FIG. 4A , FIG. 4B and FIG. 4C . FIG. 4A is a waveform diagram of the input voltage input to the voltage adjustment module according to FIG. 3; FIG. 4B is a waveform diagram of the pulse width modulation signal of the pulse width modulation unit according to FIG. 3; FIG. 4C is a waveform diagram according to FIG. The waveform diagram of the driving voltage output by the driving unit in FIG. 3 . It should be mentioned that the input voltage source in this embodiment is a voltage source of plus or minus 12 volts (as shown in FIG. 4A ).

When the switching transistor 100 is coupled to the battery pack 2 at the time point t1, the voltage level from the control terminal to the second terminal of the switching transistor 100 detected by the detection module 14 (that is, the voltage across the switching transistor 100 ) is not yet in the linear region. A1, therefore, the detection module 14 will control the pulse width modulation unit 120 to generate a pulse width modulation signal with a duty cycle of 100% (the interval from time point t1 to time point t2 as shown in FIG. 4B ), so that The driving unit 122 can generate a driving voltage with a voltage level of 12 volts (namely the first voltage level V1) according to the PWM signal with a duty cycle of 100% and the input voltage provided by the input voltage source (as shown in FIG. time point t1 to time point t2 shown in 4C), and output the driving voltage to the control terminal of the switching transistor 100 . In this way, for the voltage change of the voltage level from the control terminal to the second terminal of the switch transistor 100 , please refer to the interval from the time point t1 to the time point t2 in FIG. 2B .

When the switch transistor 100 is at the time point t2, since the voltage level from the control terminal to the second terminal of the switch transistor 100 detected by the detection module 14 is in the linear region A1, the detection module 14 will control the pulse width modulation unit 120 Generate a pulse width modulation signal with a duty cycle of 75% (as shown in the interval from time point t2 to time point t3 in FIG. 4B ), so that the drive unit 122 can perform pulse width modulation based on a duty cycle of 75%. signal and the input voltage provided by the input voltage source to generate a driving voltage with a voltage level of 6 volts (that is, the second voltage level V2) (the interval from time point t2 to time point t3 as shown in FIG. 4C ), and The driving voltage is output to the control terminal of the switching transistor 100 . In this way, for the voltage change of the voltage level from the control terminal to the second terminal of the switch transistor 100 , please refer to the interval from the time point t2 to the time point t3 in FIG. 2B .

When the switch transistor 100 is at the time point t3, since the voltage level from the control terminal to the second terminal of the switch transistor 100 detected by the detection module 14 is no longer in the linear region A1, the detection module 14 will control the PWM The unit 120 re-corrects the duty cycle of the generated PWM signal to 100% (the interval after the time point t3 shown in FIG. The WWM signal and the input voltage provided by the input voltage source generate a driving voltage with a voltage level of 12 volts (that is, the first voltage level V1) (the interval after the time point t3 shown in FIG. 4C ), And output the driving voltage to the control terminal of the switching transistor 100 . Therefore, for the voltage change of the voltage level from the control terminal to the second terminal of the switching transistor 100 , please refer to the interval after the time point t3 in FIG. 2B .

In this way, the voltage adjustment module 12 in the power test device 1" of this embodiment can control the cross-voltage of the switching transistor 100 by switching the duty cycle of the pulse width modulation signal through software, and use software to switch the pulse wave The duty cycle of the width modulation signal can be used for switching transistors that require multi-stage switching. However, the voltage adjustment module 12 can also use hardware to control the cross-voltage of the switching transistor 100 .

[Another embodiment of the power supply testing device]

Please refer to FIG. 5, FIG. 6A and FIG. 6B together. FIG. 5 is a schematic circuit diagram of a power testing device according to another embodiment of the present invention; FIG. 6A is a waveform of a driving voltage output by the voltage adjustment module according to FIG. 5 FIG. 6B is a waveform diagram of the cross-voltage of the switching transistor according to the driving voltage of FIG. 6A. As shown in Figure 5, the voltage adjustment module 12 is composed of a plurality of impedance elements R1, R2 and R3, a coupling capacitor C1, a diode D1 and a transistor M1, and the filter module 16 is composed of impedance elements R4 and R5 and a coupling capacitor A second-order resistor-capacitor series circuit composed of C2 and C3. The input voltage source Vin in this embodiment is a voltage source of plus or minus 12 volts.

In this embodiment, the voltage adjustment module 12 can generate the first voltage level V1 and the second voltage level V2 through resistor division. In more detail, when the switching transistor 100 is coupled to the battery pack 2 at the time point t1, the transistor M1 will be turned on. At this time, due to the turn-on of the transistor M1, the input voltage that can be provided by the input voltage source Vin will be The voltage is divided by the impedance elements R2 and R3 , so that the driving voltage input to the switch transistor 100 is 6 volts (second voltage level) during the interval from the time point t1 to the time point t3 . Due to the relationship that the coupling capacitor C1 is continuously charged, the cross voltage from the gate to the source of the transistor M1 at the time point t3 will be smaller than the critical voltage of the transistor M1, causing the transistor M1 to be cut off (turned off), so that the input to the switch The driving voltage of the transistor 100 is pulled up to 12V (the first voltage level) again after the time point t3.

Thus, the voltage adjustment module 12 in the power supply testing device of this embodiment generates a two-stage driving voltage through a hardware circuit, and after filtering through the filter module 16 of the second-order resistor-capacitor series circuit, the control of the switching transistor 100 The voltage variation of the voltage level from the terminal to the second terminal is shown in FIG. 6B .

[One embodiment of the control method of the power supply testing device]

Please refer to FIG. 1A and FIG. 7 together. FIG. 7 is a flow chart of steps of a method for controlling a power testing device according to an embodiment of the present invention. As shown in FIG. 7 , the power testing device control method is used in the power testing device 1 to test the charging and discharging status of the battery pack 2 . Wherein, the power testing device 1 includes a switching transistor 100 and a coupling unit 102 , the first terminal of the switching transistor 100 is coupled to the battery pack 2 , and the second terminal of the switching transistor 100 is coupled to the coupling unit 102 . Each step flow in the control method of the power testing device will be described in detail below.

In step S700 , the power testing device 1 provides a first voltage level V1 to the switch transistor 100 , and provides a second voltage level V2 to the switch transistor when the switch transistor 100 operates in a linear region. Wherein, the first voltage level V1 is greater than the second voltage level V2. In step S702 , when the switch transistor 100 is turned on, the coupling unit 102 will charge or discharge the battery pack 2 .

In addition, in the step of providing the first voltage level V1 to the switching transistor 100 by the power testing device 1, and providing the second voltage level V2 to the switching transistor when the switching transistor 100 operates in the linear region (step S700), it is further possible Realized by means of software or hardware. If it is realized by software, the pulse width modulation signal needs to be generated according to the voltage level of the control terminal of the switching transistor 100 detected by the power testing device 1 . Then, the power testing device 1 can generate the first voltage level V1 or the second voltage level V2 according to the aforementioned PWM signal. If it is realized by hardware, the power testing device 1 generates the first voltage level V1 and the second voltage level V2 through resistor voltage division.

In one embodiment, when the power test device 1 provides the first voltage level V1 or the second voltage level V2 to the switching transistor 100 therein, the first voltage level provided to the switching transistor 100 can be adjusted in advance. The standard V1 or the second voltage level V2 is filtered.

In one embodiment, when the switching transistor 100 receives the first voltage level V1 or the second voltage level V2 and is not yet turned on, the rising slope of the voltage from the control terminal to the second terminal when the switching transistor 100 operates in the linear region It is smaller than the rising slope of the voltage from the control terminal to the second terminal when operating in the cut-off region and the saturation region.

In addition, the bias voltage range of the switching transistor 100 operating in the linear region A1 can be obtained by the tester by referring to the data sheet of the switching transistor 100, or can be obtained by detecting the voltage level of the control terminal of the switching transistor 100. In the step (step S700 ), the bias voltage range when the switching transistor 100 operates in the linear region A1 is also detected.

[Another embodiment of the control method of the power supply testing device]

Please refer to FIG. 1B and FIG. 8 together. FIG. 8 is a flowchart of steps of a method for controlling a power testing device according to another embodiment of the present invention. As shown in FIG. 8, the control method of the power testing device is used in the power testing device 1' to test the charging and discharging status of the battery pack 2. Wherein, the power testing device 1 includes a switching transistor 100 and a coupling unit 102 , the first terminal of the switching transistor 100 is coupled to the battery pack 2 , and the second terminal of the switching transistor 100 is coupled to the coupling unit 102 . Each step flow in the control method of the power testing device will be described in detail below.

In step S800 , the power testing device 1 detects the voltage level of the control terminal of the switching transistor 100 . In step S802 , the power testing device 1 determines whether the voltage level from the control terminal to the second terminal of the switching transistor 100 is in the linear region. If the power testing device 1 determines that the voltage level from the control terminal to the second terminal of the switching transistor 100 is not in the linear region, then perform step S804; if the power testing device 1 determines the voltage level from the control terminal to the second terminal of the switching transistor 100 In the linear region, execute step S806.

In step S804 , the power testing device 1 outputs the first voltage level V1 to the switching transistor 100 . In step S806, the power testing device 1 outputs the second voltage level V2 to the switch transistor. Wherein, the first voltage level V1 is greater than the second voltage level V2. Finally, when the switch transistor 100 is continuously driven by the first voltage level V1 to be turned on, the coupling unit 102 will charge or discharge the battery pack 2 (that is, step S808 ).

[Possible efficacy of the embodiment]

Based on the above, the embodiments of the present invention provide a power supply testing device and a control method thereof. The voltage adjustment module can selectively provide a driving voltage whose voltage level is the first voltage level or the second voltage level to the switching transistor. When the switching transistor is in the linear region, it can receive a driving voltage with a lower voltage level, so that the rising slope of the cross-voltage change of the switching transistor in the linear region is slower than that of the switching transistor when it is in the cut-off region and the saturation region. The rising slope of the pressure change. In addition, the voltage adjustment module in the power supply testing device of the embodiment of the present invention may be implemented by a hardware circuit or a software program.

Thereby, the power supply test device and its control method according to the embodiment of the present invention can control the driving voltage provided to the switching transistor in sections according to the characteristic parameters of the switching transistor, thereby effectively reducing the voltage generated by the switching transistor during the conduction process. The inrush current (also known as surge current) can improve the service life and reliability of the switching transistor, and can achieve the effect of controlling the overall conduction time of the switching transistor, thereby increasing the overall conduction speed of the switching transistor. Therefore, the power supply testing device and the control method thereof in the embodiment of the present invention can use a switching transistor with a smaller current rating. In addition to saving the space occupied by the switching transistor in the power testing device and improving the power density, it can also It is very practical to reduce the installation cost of the switching transistor.

Certainly, the present invention also can have other multiple embodiments, without departing from the spirit and essence of the present invention, those skilled in the art can make various corresponding changes and deformations according to the present invention, but these corresponding Changes and deformations should belong to the scope of protection of the appended claims of the present invention.

Claims (10)

1. reduction is surged a power supply testing device for electric current, and for testing the discharge and recharge situation of an electric battery, it is characterized in that, this power supply testing device comprises:

One charge-discharge modules, there is a switching transistor and a coupling unit, the first end of this switching transistor couples this electric battery, and the second end of this switching transistor couples this coupling unit, and this coupling unit carries out charge or discharge to this electric battery when this switching transistor conducting; And

One voltage regulator module, couples the control end of this switching transistor, in order to provide one first voltage level to this switching transistor, and provides one second voltage level to this switching transistor in a Preset Time;

Wherein, this Preset Time is that this switching transistor operates in linear zone, and this first voltage level is greater than this second voltage level.

2. power supply testing device according to claim 1, it is characterized in that, more comprise a detection module, this detection module is coupled between the control end of this switching transistor and this voltage regulator module, this detection module is in order to detect the voltage level of the control end of this switching transistor, and judge that whether the voltage level of control end to the second end of this switching transistor is in linear zone, export this first voltage level or this second voltage level to control this voltage regulator module.

3. power supply testing device according to claim 1, is characterized in that, this voltage regulator module comprises:

One pulse wave width modulation unit, couples this detection module, in order to the voltage level of the control end according to this switching transistor detected by this detection module,

Produce a pulse wave width modulation signal; And

One driver element, is coupled between this pulse wave width modulation unit and this switching transistor, in order to according to this pulse wave width modulation signal, produces this first voltage level or this second voltage level.

4. power supply testing device according to claim 1, it is characterized in that, this power supply testing device more comprises a filtration module, this filtration module is coupled between this voltage regulator module and this switching transistor, and this filtration module carries out filtering in order to this first voltage level of exporting this voltage regulator module and this second voltage level.

5. power supply testing device according to claim 1, it is characterized in that, this voltage regulator module is at least made up of multiple impedor, multiple coupling element and at least one transistor, and produces this first voltage level and this second voltage level by electric resistance partial pressure.

6. a reduction is surged the power supply testing device control method of electric current, for a power supply testing device to test the discharge and recharge situation of an electric battery, this power supply testing device comprises a switching transistor and a coupling unit, the first end of this switching transistor couples this electric battery, second end of this switching transistor couples this coupling unit, it is characterized in that, this power supply testing device control method comprises:

There is provided one first voltage level to this switching transistor;

When this switching transistor operates in linear zone, provide one second voltage level to this switching transistor, this first voltage level is greater than this second voltage level; And

When this switching transistor conducting, this coupling unit carries out charge or discharge to this electric battery.

7. power supply testing device control method according to claim 6, is characterized in that, more comprise:

Detect the voltage level of the control end of this switching transistor, and in time judging the voltage level of control end to the second end of this switching transistor not in linear zone, export this first voltage level to this switching transistor, in time judging the voltage level of control end to the second end of this switching transistor in linear zone, export this second voltage level to this switching transistor.

8. power supply testing device control method according to claim 7, is characterized in that, in judging, in the step of the voltage level of control end to the second end of this switching transistor whether in linear zone, more to comprise:

According to the voltage level of the control end of this detected switching transistor, produce a pulse wave width modulation signal; And

According to this pulse wave width modulation signal, produce this first voltage level or this second voltage level.

9. power supply testing device control method according to claim 7, it is characterized in that, in judging in the step of the voltage level of control end to the second end of this switching transistor whether in linear zone, be produce this first voltage level and this second voltage level by electric resistance partial pressure.

10. power supply testing device control method according to claim 6, it is characterized in that, in providing this first voltage level or this second voltage level in the step of this switching transistor, more comprising and filtering is carried out to this first voltage level and this second voltage level for being provided to this switching transistor.