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CN105606031A - Micro displacement testing system - Google Patents

Micro displacement testing system Download PDF

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Publication number
CN105606031A
CN105606031A CN201610029082.1A CN201610029082A CN105606031A CN 105606031 A CN105606031 A CN 105606031A CN 201610029082 A CN201610029082 A CN 201610029082A CN 105606031 A CN105606031 A CN 105606031A
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hole
spring
bulb
dynamometer
baffle
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CN105606031B (en
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杜秋月
余跃庆
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Beijing University of Technology
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Beijing University of Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

微位移测试系统属于微型机械领域。它包括温控系统和成像系统;温控系统包括弹簧测力计、热电偶、PC机、直流电源和开关;弹簧为形状记忆合金丝,弹簧测力计与灯泡、直流电源和开关串联,实现温度控制,并为成像系统提供光源;成像系统包括光具座、被测结构、灯泡、凸透镜、光屏五部分组成;光具座分两部分:一是下半部滑轨结构;二是上半部,设有挡板,能透光的被测结构贴在挡板上;灯泡固定于挡板一侧,凸透镜、光屏依次位于挡板另一侧,并保证灯泡、被测结构、凸透镜和光屏四者位于一条水平线上。被测结构通过凸透镜投射到光屏上,形成倒立放大的实像,在光屏上观察拉伸过程中被测结构上各点的运动情况,实现目标点的位移测量和记录。

The micro-displacement testing system belongs to the field of micro-mechanics. It includes a temperature control system and an imaging system; the temperature control system includes a spring dynamometer, a thermocouple, a PC, a DC power supply and a switch; the spring is a shape memory alloy wire, and the spring dynamometer is connected in series with a light bulb, a DC power supply and a switch to Temperature control, and provide light source for the imaging system; the imaging system consists of five parts: the optical bench, the structure to be tested, the bulb, the convex lens, and the light screen; the optical bench is divided into two parts: one is the lower half slide rail structure; the other is the upper half The half part is equipped with a baffle, and the structure to be tested that can transmit light is pasted on the baffle; the bulb is fixed on one side of the baffle, and the convex lens and light screen are located on the other side of the baffle in turn, and ensure that the light bulb, the structure to be tested, and the convex lens And the light screen four are located on a horizontal line. The measured structure is projected onto the light screen through a convex lens to form an inverted enlarged real image, and the movement of each point on the measured structure during the stretching process is observed on the light screen to realize the displacement measurement and recording of the target point.

Description

微位移测试系统Micro displacement test system

技术领域 technical field

本发明涉及一种构件变形和微位移测试的结合形状记忆合金特性的微位移测试系统,属于光测力学、工程材料、构件变形、微机电系统和微位移测试技术领域。 The invention relates to a micro-displacement testing system combined with shape memory alloy characteristics for component deformation and micro-displacement testing, and belongs to the technical fields of photomechanics, engineering materials, component deformation, micro-electromechanical systems and micro-displacement testing.

背景技术 Background technique

目前现有技术中应用的微位移测试系统主要分为两类:实验台上临时搭建的散装结构和便携式的商用微位移测试系统。实验台搭建的测试系统无法适用于现场构件变形测量。商用微测试仪器如MicroSense公司的高精度电容位移传感器、用于超精密金刚石机床等高精度运动平台的光栅尺、雷尼绍双频激光干涉仪XL-80等不同测量原理的微位移测量仪器。虽然可现场实现高精度位移测量,但造价较高,不具有普遍适用性。同时,现有为位移测试系统多通过光电信号输出,在PC机中进行信号处理和转换来进行位移数据的读取。 At present, the micro-displacement test systems used in the prior art are mainly divided into two categories: bulk structures temporarily built on the test bench and portable commercial micro-displacement test systems. The test system built on the test bench is not suitable for on-site component deformation measurement. Commercial micro-testing instruments such as MicroSense's high-precision capacitive displacement sensors, grating scales for high-precision motion platforms such as ultra-precision diamond machine tools, and Renishaw dual-frequency laser interferometer XL-80 and other micro-displacement measuring instruments with different measurement principles. Although high-precision displacement measurement can be realized on site, the cost is high and it is not universally applicable. At the same time, most of the existing displacement test systems output the photoelectric signal, and then process and convert the signal in the PC to read the displacement data.

本发明的目的是提供一种高精度微位移测试系统,既便于携带、成本低廉,同时又操作简便,可在终端直接读取位移数据,使用方便,且灵敏度高,结构紧凑。 The purpose of the present invention is to provide a high-precision micro-displacement testing system, which is easy to carry, low in cost, and easy to operate. The displacement data can be read directly at the terminal, easy to use, high in sensitivity, and compact in structure.

发明内容 Contents of the invention

微位移测试系统,其特征在于:该微位移测试系统由两部分组成,分别是温控系统和成像系统;温控系统包括弹簧测力计、热电偶、PC机、直流电源和开关五部分;热电耦一端固定在弹簧测力计上弹簧的任意位置,另一端经过弹簧测力计底板上的通孔连入PC机,进行温度数据采集;弹簧测力计的弹簧为形状记忆合金丝,弹簧测力计与灯泡、直流电源和开关串联,实现温度控制,并为成像系统提供光源;成像系统包括光具座、被测结构、灯泡、凸透镜、光屏五部分组成;光具座分两部分:一是下半部滑轨结构;二是上半部,设有挡板,能透光的被测结构贴在挡板上;灯泡固定于挡板一侧,凸透镜、光屏依次位于挡板另一侧,并保证灯泡、被测结构、凸透镜和光屏四者位于一条水平线上。 The micro-displacement test system is characterized in that: the micro-displacement test system consists of two parts, namely a temperature control system and an imaging system; the temperature control system includes five parts: a spring dynamometer, a thermocouple, a PC, a DC power supply and a switch; One end of the thermocouple is fixed at any position of the spring on the spring dynamometer, and the other end is connected to the PC through the through hole on the bottom plate of the spring dynamometer to collect temperature data; the spring of the spring dynamometer is a shape memory alloy wire, and the spring The dynamometer is connected in series with the light bulb, DC power supply and switch to realize temperature control and provide light source for the imaging system; the imaging system consists of five parts: optical bench, measured structure, light bulb, convex lens, and light screen; the optical bench is divided into two parts : The first is the structure of the lower half of the slide rail; the second is the upper half, which is equipped with a baffle, and the structure to be tested that can transmit light is attached to the baffle; the bulb is fixed on one side of the baffle, and the convex lens and the light screen are located on the baffle in turn. On the other side, and ensure that the light bulb, the structure under test, the convex lens and the light screen are on a horizontal line.

在室温下使形状记忆合金丝保持直线状态;在沸水中密绕成螺旋状,形成微型圆柱螺旋拉伸弹簧;如此反复多次,稳定材料特性,即随温度升高,合金丝逐渐由直线变为弹簧;冷却至室温时逐渐恢复原状;形状记忆合金丝一端与指针固定,且形状记忆合金丝一端通过一段弹性材料与弹簧测力计提环连接;另一端通过一段弹性材料与弹簧测力计挂钩相连与测力计底板组装后既可用于测量力值大小,又可为成像系统提供拉力。 Keep the shape memory alloy wire in a straight line at room temperature; in boiling water, it is tightly wound into a helical shape to form a micro-cylindrical helical tension spring; repeat this many times to stabilize the material properties, that is, as the temperature rises, the alloy wire gradually changes from a straight line to a spring. It is a spring; it gradually returns to its original shape when cooled to room temperature; one end of the shape memory alloy wire is fixed to the pointer, and one end of the shape memory alloy wire is connected to the lifting ring of the spring dynamometer through a section of elastic material; the other end is connected to the spring dynamometer through a section of elastic material After the hook is connected with the base plate of the dynamometer, it can be used to measure the force value and provide tension for the imaging system.

形状记忆合金材料制成的弹簧通过弹簧测力计底板上的第一通孔,第四通孔分别固定于弹簧测力计底板两侧的提环和挂钩,得到形状记忆合金弹簧测力计;底板上第一通孔,第四通孔分别位于凹槽两端中央位置;第二通孔位于凹槽底部,靠近第一通孔;第三通孔位于凹槽底部第二通孔,第四通孔之间。 The spring made of the shape memory alloy material passes through the first through hole on the base plate of the spring dynamometer, and the fourth through hole is respectively fixed on the lifting rings and hooks on both sides of the base plate of the spring dynamometer to obtain a shape memory alloy spring dynamometer; The first through hole and the fourth through hole on the base plate are respectively located at the center of both ends of the groove; the second through hole is located at the bottom of the groove, close to the first through hole; the third through hole is located at the bottom of the groove, the second through hole, the fourth through hole between vias.

第一微型螺钉位于挡板底部中央,第二微型螺钉固定于与挡板相对的挡板上,两螺钉在光具座内部用于连接弹簧测力计的提环和挂钩,并保证测力计与光具座下半部水平; The first micro-screw is located at the center of the bottom of the baffle, and the second micro-screw is fixed on the baffle opposite to the baffle. The two screws are used to connect the lifting ring and hook of the spring dynamometer inside the optical bench, and ensure that the dynamometer Level with the lower half of the optical bench;

应用所述的微位移测试系统,其特征在于: Applying the described micro-displacement testing system is characterized in that:

当温控系统的开关闭合时,直流电源为整个系统提供恒定电流;此时,形状记忆合金弹簧测力计内部的合金丝随温度的升高而逐渐收缩,产生相应拉力,拉动挡板偏转,通过测力计面板直接读取拉力值,被测结构被固定在挡板上,随挡板的运动产生竖直方向的拉伸;热电耦通连接PC机,随时测量并记录合金丝的温度;同时,灯泡亮起,被测结构通过凸透镜投射到光屏上,形成倒立放大的实像,在光屏上观察拉伸过程中被测结构上各点的运动情况,实现目标点的位移测量和记录。 When the switch of the temperature control system is closed, the DC power supply provides a constant current for the entire system; at this time, the alloy wire inside the shape memory alloy spring dynamometer gradually shrinks as the temperature rises, generating a corresponding pulling force, which pulls the baffle to deflect. The tension value is directly read through the dynamometer panel, and the structure under test is fixed on the baffle, which produces vertical stretching with the movement of the baffle; the thermocouple is connected to the PC to measure and record the temperature of the alloy wire at any time; At the same time, the light bulb lights up, and the measured structure is projected onto the light screen through the convex lens to form an inverted and enlarged real image. The movement of each point on the measured structure during the stretching process is observed on the light screen to realize the displacement measurement and recording of the target point. .

附图说明 Description of drawings

图1微位移测试系统示意 Figure 1 Schematic diagram of the micro-displacement testing system;

图2温控系统示意 Figure 2 Schematic diagram of the temperature control system;

图3成像系统示意 Figure 3 is a schematic diagram of the imaging system;

图4形状记忆合金丝工作原理 Figure 4 Schematic diagram of the working principle of the shape memory alloy wire;

图5(a)制成的弹簧原始状态The original state diagram of the spring made in Fig. 5 ( a);

图5(b)制成的弹簧温度升高后 Figure 5 ( b) made of the spring after the temperature rises;

图6光具座示意 Fig. 6 schematic diagram of optical bench;

图7微位移测试系统局部示意 Figure 7 is a partial schematic diagram of the micro-displacement testing system;

具体实施方式 detailed description

下面结合实施例对本发明作进一步详述: Below in conjunction with embodiment the present invention is described in further detail:

该微位移测试系统由两部分组成,分别是温控系统和成像系统;①温控系统包括弹簧测力计、热电偶、PC机、直流电源和开关五部分;热电耦一端固定在弹簧测力计上弹簧的任意位置,另一端经过弹簧测力计底板上的第三通孔3连入PC机,进行温度数据采集;弹簧测力计的弹簧为形状记忆合金丝,弹簧测力计与灯泡、直流电源和开关串联,实现温度控制,并为成像系统提供光源;成像系统包括光具座、被测结构、灯泡、凸透镜、光屏五部分组成;光具座分两部分:一是下半部滑轨结构;二是上半部,为左长右短,顶部连接的三面结构。设有挡板,能透光的被测结构贴在挡板上;灯泡固定于挡板一侧,凸透镜、光屏依次位于挡板8另一侧,并保证灯泡、被测结构、凸透镜和光屏四者位于一条水平线上。 The micro-displacement test system consists of two parts, namely temperature control system and imaging system; ①The temperature control system includes five parts: spring dynamometer, thermocouple, PC, DC power supply and switch; one end of the thermocouple is fixed on the spring dynamometer At any position of the spring on the meter, the other end is connected to the PC through the third through hole 3 on the bottom plate of the spring dynamometer to collect temperature data; the spring of the spring dynamometer is a shape memory alloy wire, and the spring dynamometer and the light bulb , DC power supply and switch are connected in series to realize temperature control and provide light source for the imaging system; the imaging system consists of five parts: the optical bench, the structure to be tested, the bulb, the convex lens, and the optical screen; the optical bench is divided into two parts: one is the lower half The first half is the slide rail structure; the second is the upper half, which is a three-sided structure with the left side long and the right side short, and the top is connected. There is a baffle, and the structure under test that can transmit light is pasted on the baffle; the bulb is fixed on one side of the baffle, and the convex lens and light screen are located on the other side of the baffle in turn, and the light bulb, the structure under test, the convex lens and the light screen are guaranteed The four are on a horizontal line.

在室温下使形状记忆合金丝保持直线状态;在沸水中密绕成螺旋状,形成微型圆柱螺旋拉伸弹簧;如此反复多次,稳定材料特性,即随温度升高,合金丝逐渐由直线变为弹簧;冷却至室温时逐渐恢复原状;形状记忆合金丝一端与指针固定,且形状记忆合金丝一端通过一段弹性材料与弹簧测力计提环连接;另一端通过一段弹性材料与弹簧测力计挂钩相连与测力计底板组装后既可用于测量力值大小,又可为成像系统提供拉力。 Keep the shape memory alloy wire in a straight line at room temperature; in boiling water, it is tightly wound into a helical shape to form a micro-cylindrical helical tension spring; repeat this many times to stabilize the material properties, that is, as the temperature rises, the alloy wire gradually changes from a straight line to a spring. It is a spring; it gradually returns to its original shape when cooled to room temperature; one end of the shape memory alloy wire is fixed to the pointer, and one end of the shape memory alloy wire is connected to the lifting ring of the spring dynamometer through a section of elastic material; the other end is connected to the spring dynamometer through a section of elastic material After the hook is connected with the base plate of the dynamometer, it can be used to measure the force value and provide tension for the imaging system.

形状记忆合金材料制成的弹簧通过弹簧测力计底板上的第一通孔1,第四通孔4分别固定于弹簧测力计底板两侧的提环和挂钩,得到形状记忆合金弹簧测力计;底板上第一通孔,第四通孔分别位于凹槽两端中央位置;第二通孔2位于凹槽底部,靠近第一通孔1;第三通孔3位于凹槽底部第二通孔2,第四通孔4之间。 The spring made of shape memory alloy material is respectively fixed to the lifting rings and hooks on both sides of the bottom plate of the spring dynamometer through the first through hole 1 and the fourth through hole 4 on the bottom plate of the spring dynamometer, so that the force measurement of the shape memory alloy spring is obtained. Meter; the first through hole and the fourth through hole on the base plate are respectively located at the center of both ends of the groove; the second through hole 2 is located at the bottom of the groove, close to the first through hole 1; the third through hole 3 is located at the second Between the through hole 2 and the fourth through hole 4 .

光具座下半部为带有滑轨的长方体,使用透光塑料制成。通孔9位于槽底部靠近挡板8,用于导线的穿过。第一微型螺钉5位于挡板底部中央,第二微型螺钉6固定于与挡板相对的挡板上,两螺钉在光具座内部用于连接弹簧测力计的提环和挂钩,并保证测力计与光具座下半部水平。 The lower part of the optical bench is a cuboid with slide rails, made of light-transmitting plastic. The through hole 9 is located at the bottom of the groove close to the baffle plate 8 for passing the wire. The first micro-screw 5 is located at the center of the bottom of the baffle, and the second micro-screw 6 is fixed on the baffle opposite to the baffle. The two screws are used to connect the lifting ring and the hook of the spring dynamometer inside the optical bench, and ensure that the measurement The force gauge is level with the lower half of the optical bench.

当温控系统的开关闭合时,直流电源为整个系统提供恒定电流;此时,形状记忆合金弹簧测力计内部的合金丝随温度的升高而逐渐收缩,产生相应拉力,拉动挡板8偏转,通过测力计面板直接读取拉力值,被测结构7被固定在挡板上,随挡板的运动产生竖直方向的拉伸;热电耦通连接PC机,随时测量并记录合金丝的温度;同时,灯泡亮起,被测结构7通过凸透镜投射到光屏上,形成倒立放大的实像,在光屏上观察拉伸过程中被测结构7上各点的运动情况,实现目标点的位移测量和记录。 When the switch of the temperature control system is closed, the DC power supply provides a constant current for the entire system; at this time, the alloy wire inside the shape memory alloy spring dynamometer gradually shrinks with the increase of temperature, generating a corresponding pulling force, which pulls the baffle 8 to deflect , the tension value is directly read through the dynamometer panel, the structure 7 under test is fixed on the baffle, and the vertical direction is stretched with the movement of the baffle; the thermocouple is connected to the PC, and the alloy wire is measured and recorded at any time temperature; at the same time, the bulb lights up, and the measured structure 7 is projected onto the light screen through a convex lens to form an inverted enlarged real image, and the movement of each point on the measured structure 7 is observed on the light screen during the stretching process, so as to realize the target point. Displacement measurement and recording.

Claims (5)

1. micrometric displacement test macro, is characterized in that: this micrometric displacement test macro is made up of two parts, pointNot temperature control system and imaging system; Temperature control system comprises weight beam, thermocouple, PC, straightStream power supply and switch five parts; Thermocouple one end is fixed on the optional position of weight beam upper spring, anotherOne end is connected into PC through the third through-hole on weight beam base plate, carries out temperature data acquisition; BulletThe spring of spring dynamometer is shape-memory alloy wire, weight beam and bulb, dc source and switch seriesConnection, realizes temperature control, and provides light source for imaging system; Imaging system comprises optical bench, tested knotStructure, bulb, convex lens, optical screen five part compositions; Optical bench divides two parts: the one, and Lower Half slide rail knotStructure; The 2nd, the first half, is provided with baffle plate, can printing opacity be attached on baffle plate by geodesic structure; Bulb is fixed on gearPlate one side, convex lens, optical screen are positioned at baffle plate opposite side successively, and ensure bulb, by geodesic structure, convex lensMirror and optical screen are positioned on a horizontal line.
2. micrometric displacement test macro according to claim 1, is characterized in that: marmemSilk one end and pointer are fixed, and shape-memory alloy wire one end is by one section of elastomeric material and weight beamDrop handle connects; The other end is connected with weight beam hook by one section of elastomeric material.
3. micrometric displacement test macro according to claim 2, is characterized in that: marmemThe spring that material is made is by the first through hole on weight beam base plate, and fourth hole is individually fixed in bulletDrop handle and the hook of spring dynamometer base plate both sides, obtain shape memory alloy spring dynamometer; On base plateOne through hole, fourth hole lays respectively at middle position, groove two ends; The second through hole is positioned at bottom portion of groove, leans onNearly the first through hole; Third through-hole is positioned at bottom portion of groove the second through hole, between fourth hole.
4. micrometric displacement test macro according to claim 3, is characterized in that: miniature screw thread is positioned atBaffle plate bottom center, miniature screw thread is fixed on the baffle plate relative with baffle plate, and two screws are in optical bench insideFor drop handle and the hook of linking springs dynamometer, and ensure dynamometer and optical bench Lower Half level.
5. the method for application micrometric displacement test macro as claimed in claim 1, is characterized in that:
In the time that the switch of temperature control system is closed, dc source provides constant current for whole system; Now,The B alloy wire of shape memory alloy spring dynamometer inside shrinks gradually with the rising of temperature, produces correspondingPulling force, pulls baffle plate deflection, directly reads value of thrust by dynamometer panel, is fixed on by geodesic structureOn baffle plate, produce the stretching of vertical direction with the motion of baffle plate; Thermocouple is led to and is connect PC, surveys at any timeMeasure and record the temperature of B alloy wire; Meanwhile, bulb lights, and is projected optical screen by geodesic structure by convex lensUpper, form the real image that stands upside down and amplify, on optical screen, observe in drawing process by the motion of each point on geodesic structureSituation, the displacement measurement of realize target point and record.
CN201610029082.1A 2016-01-17 2016-01-17 micro-displacement test system Expired - Fee Related CN105606031B (en)

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