CN105676109B - A kind of motherboard test method and equipment - Google Patents
A kind of motherboard test method and equipment Download PDFInfo
- Publication number
- CN105676109B CN105676109B CN201610012934.6A CN201610012934A CN105676109B CN 105676109 B CN105676109 B CN 105676109B CN 201610012934 A CN201610012934 A CN 201610012934A CN 105676109 B CN105676109 B CN 105676109B
- Authority
- CN
- China
- Prior art keywords
- mainboard
- signal
- channel
- tested
- test equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The embodiment of the present invention provides a kind of motherboard test method and equipment, is related to test macro, can be realized automatic detection mainboard, improves detection efficiency and accuracy rate, and then ensure that mainboard quality.The mainboard test equipment includes: automatic switching component and the detection circuit that connect with automatic switching component；Wherein, automatic switching component, for when mainboard test equipment detects mainboard to be measured access, mainboard to be measured is driven to be communicated with mainboard test equipment, or carry out data transmission with mainboard test equipment, it for each channel of mainboard to be measured, generates the first signal and transmits the first signal via mainboard to be measured, obtain the second signal of mainboard output to be measured；Detection circuit, for, in each channel of mainboard to be measured the first signal generated and the second signal got, determining mainboard to be measured with the presence or absence of failure according to automatic switching component.
Description
Technical Field
The present invention relates to test systems, and in particular, to a method and apparatus for testing a motherboard.
Background
Along with the continuous development of the technology, the intelligent terminal is applied more and more, and the functions which can be realized by the intelligent terminal are more and more abundant. Consequently, the number of novel functional modules and wiring terminals contained in the main board of the intelligent terminal is increasing.
The main board of the intelligent terminal must be subjected to various functional tests before being produced. At present, each equipment manufacturer tests a main board of an intelligent terminal mainly by operating a relevant test fixture by an operator to detect each test function of the main board, and determining whether the main board of the intelligent terminal has a fault according to each test function.
The testing method not only depends on the proficiency and technical skill of the operator, but also depends on the current working state of the operator, so that the testing efficiency is low, and the quality of the main board of the intelligent terminal cannot be guaranteed. For example, if the operator is in a fatigue state, the proficiency is not sufficient, and the like, the testing efficiency is low, the judgment is wrong, and the product quality of the whole intelligent terminal is further affected.
Disclosure of Invention
The embodiment of the invention provides a mainboard testing method and equipment, which can realize automatic mainboard detection, improve the detection efficiency and accuracy and further ensure the mainboard quality.
In order to achieve the above purpose, the embodiment of the invention adopts the following technical scheme:
the embodiment of the invention provides mainboard test equipment which comprises an automatic switching component and a detection circuit connected with the automatic switching component; wherein,
the automatic switching component is used for driving the mainboard to be tested to communicate with the mainboard testing equipment or carrying out data transmission with the mainboard testing equipment when the mainboard testing equipment detects that the mainboard to be tested is accessed, generating a first signal for each channel of the mainboard to be tested, transmitting the first signal through the mainboard to be tested, and acquiring a second signal output by the mainboard to be tested;
the detection circuit is used for determining whether the mainboard to be tested has a fault according to a first signal generated by the automatic switching component in each channel of the mainboard to be tested and an acquired second signal.
The mainboard test equipment in the embodiment of the invention comprises an automatic switching component and a detection circuit. When the automatic switching assembly detects that the mainboard to be tested is accessed, the detection of each channel of the mainboard to be tested is automatically completed, and the detection circuit can detect whether each channel has faults or not. The mainboard test equipment provided by the embodiment of the invention can automatically switch the test of the mainboard and automatically complete the test of each mainboard connected with the mainboard test equipment, thereby realizing the automatic detection of the mainboard, having higher test efficiency than the manual test of the mainboard by operators, improving the test accuracy and further ensuring the quality of the mainboard.
Specifically, the automatic switching assembly comprises a control circuit, a signal generator connected with the control circuit, and an electronic interface connected with both the control circuit and the signal generator; wherein,
the control circuit is used for generating an excitation signal when the mainboard test equipment detects that a mainboard to be tested is accessed, and sending the excitation signal to the electronic interface, wherein the excitation signal comprises an identifier of the mainboard to be tested, and is used for sequentially generating control signals and sending the control signals to the signal generator and the mainboard to be tested, and the control signals comprise an identifier of a channel to be tested;
the signal generator is used for receiving the control signal, switching the channel of the signal generator into a channel to be detected indicated by the identifier of the channel to be detected according to the identifier of the channel to be detected in the control signal, generating a first signal in the channel to be detected, and sending the first signal to the mainboard to be detected and the detection circuit;
and the electronic interface is used for receiving the excitation signal, driving the mainboard to be tested to communicate with the mainboard test equipment according to the excitation signal, or carrying out data transmission with the mainboard test equipment, so that the mainboard to be tested receives the control signal and switches the channel of the mainboard to be tested into the channel to be tested.
Further, the mainboard test equipment further comprises a display;
the display is a screen and/or an indicator light, the display is used for displaying a first detection result determined by the detection circuit, and the first detection result is used for indicating whether the mainboard to be detected has a fault.
Specifically, the detection circuit is specifically configured to determine whether each channel of the motherboard to be detected has a fault according to a first signal and an acquired second signal of the automatic switching component in each channel of the motherboard to be detected, and determine whether the motherboard to be detected has a fault according to a detection result of each channel.
Specifically, for each channel of the motherboard to be detected, the detection circuit is specifically configured to determine whether the second signal meets a preset condition, where the preset condition is that the second signal is the same as the first signal, or a difference between an attribute value of the second signal and an attribute value of the first signal is smaller than a preset threshold, and the attribute value is an amplitude or a phase of the signal; if the second signal meets the preset condition, determining that no fault exists in the channel; and if the second signal does not meet the preset condition, determining that the channel has a fault.
Further, if the display is the screen, the display is further configured to display the first signal and the second signal of each channel.
Another embodiment of the present invention provides a motherboard testing method, where when a motherboard testing device detects that a motherboard to be tested is accessed, it detects whether n channels of the motherboard to be tested have a fault, and records n detection results, where n is greater than or equal to 1; the mainboard test equipment determines whether the mainboard to be tested has a fault or not according to the n detection results; and the mainboard test equipment displays a determination result, and the determination result is used for indicating whether the mainboard to be tested has a fault.
In the embodiment of the invention, when the mainboard test equipment detects that the mainboard to be tested is accessed, whether n (n is more than or equal to 1) channels of the mainboard to be tested have faults or not is detected, n detection results are recorded, then the mainboard test equipment determines whether the mainboard to be tested has the faults or not according to the n detection results, and finally the mainboard test equipment displays a determination result for indicating whether the mainboard to be tested has the faults or not. Through this scheme, mainboard test equipment can switch the test to the mainboard by oneself to accomplish the test to each mainboard of access mainboard test equipment by oneself, realized the automatic mainboard that detects, the efficiency of software testing of manual test mainboard of operating personnel is high, and has improved the test accuracy, and then has guaranteed mainboard quality.
For a first channel of the n channels, the main board test equipment detects whether the first channel has a fault, and records a first detection result, wherein the first detection result is used for identifying whether the first channel has the fault.
Specifically, the detecting, by the motherboard testing device, whether the first channel has a fault specifically includes:
A. the mainboard test equipment generates a control signal containing the identifier of the first channel and sends the control signal to the mainboard to be tested, so that the mainboard to be tested switches the channel of the mainboard to be tested to the first channel according to the identifier of the first channel, wherein the identifier of the first channel indicates the first channel;
B. the mainboard test equipment sends a first signal to the mainboard to be tested, so that the first signal is transmitted through the first channel and a second signal is output;
C. the mainboard test equipment judges whether a second signal output by the mainboard to be tested meets a preset condition, wherein the preset condition is that the second signal is the same as the first signal or the difference value between the attribute value of the second signal and the attribute value of the first signal is smaller than a preset threshold value, and the attribute value is the amplitude or the phase of the signal;
D. if the second signal meets the preset condition, the mainboard test equipment determines that the first channel has no fault;
E. if the second signal does not meet the preset condition, repeatedly executing B and C;
F. and if the E is repeatedly executed for m times, the mainboard test equipment determines that the first channel has a fault, wherein m is more than or equal to 1.
Further, before the motherboard testing device sends the first signal to the motherboard to be tested, the motherboard testing method further includes:
the mainboard test equipment switches a channel of the mainboard test equipment into the first channel and generates the first signal in the first channel.
Specifically, the determining, by the motherboard testing device, whether the to-be-tested motherboard has a fault according to the n detection results includes:
and if the first detection result indicates that the first channel has a fault, the mainboard test equipment determines that the mainboard to be tested has a fault.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a first schematic structural diagram of a motherboard testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a motherboard testing apparatus according to an embodiment of the present invention;
fig. 3 is a schematic flowchart of a motherboard testing method according to an embodiment of the present invention;
fig. 4 is a schematic flowchart of testing a first channel according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In addition, the term "and/or" herein is only one kind of association relationship describing an associated object, and means that there may be three kinds of relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
When embodiments of the present invention refer to the ordinal numbers "first", "second", etc., it should be understood that the terms are used for distinguishing between them unless the context clearly dictates otherwise.
Example one
An embodiment of the present invention provides a motherboard testing device, as shown in fig. 1, the motherboard testing device may include an automatic switching component 10, a detection circuit 11, and a system bus 12.
The automatic switching module 10 and the detection circuit 11 are connected by a system bus 12 to complete communication therebetween.
Specifically, the automatic switching component 10 is configured to drive the to-be-tested motherboard to communicate with the motherboard testing device when the motherboard testing device detects that the to-be-tested motherboard is connected, or to perform data transmission with the motherboard testing device, and to each channel of the to-be-tested motherboard, generate a first signal and transmit the first signal via the to-be-tested motherboard, and acquire a second signal output by the to-be-tested motherboard.
It can be understood that, when the mainboard to be tested is connected to the mainboard test equipment, the mainboard test equipment automatically drives the mainboard to be tested to communicate with the mainboard test equipment or to perform data transmission. Therefore, when a plurality of mainboards to be tested are connected to the mainboard test equipment, the mainboard test equipment can drive each mainboard to be tested to communicate with the mainboard test equipment or transmit data according to the power-on time sequence of each mainboard to be tested.
In practical application, each mainboard to be tested comprises at least one channel, and for each channel, the mainboard test equipment generates a first signal and sends the first signal to the mainboard to be tested, so that the first signal is transmitted through the mainboard to be tested, and a second signal is output.
The channel in the embodiment of the present invention is an Audio channel, a VGA (Video Graphics Array) channel, a YPbPr channel, an HDMI (High Definition Multimedia Interface) channel, an AV (Audio Video) channel, or a TV (Television) channel.
It should be noted that the passages in the embodiments of the present invention are not limited to the above.
Specifically, as shown in fig. 1, the automatic switching assembly 10 includes a control circuit 101, a signal generator 102, and an electronic interface 103.
The signal generator 102 and the electronic interface 103 are both connected to the control circuit 101, and the signal generator 102 and the electronic interface 103 are both connected to the detection circuit 11.
The control circuit 101 is configured to generate an excitation signal when the motherboard testing device detects that the motherboard to be tested is connected, and send the excitation signal to the electronic interface 103, where the excitation signal includes an identifier of the motherboard to be tested, and is configured to sequentially generate control signals and send the control signals to the signal generator 102 and the motherboard to be tested, where the control signals include an identifier of a channel to be tested.
Optionally, the identifier of the channel to be tested in the embodiment of the present invention may be a code value of the channel to be tested.
Specifically, the control circuit 101 is configured to generate a control signal carrying a code value of the channel to be tested in a preset time period during which the excitation signal is generated, where the control signal is used to instruct the signal generator 102 and the motherboard to be tested to switch respective channels according to the code value.
Optionally, the control circuit 101 in the embodiment of the present invention may include a single chip microcomputer for encoding, the control circuit 101 generates an infrared encoded signal within a preset time period for generating an excitation signal, and the single chip microcomputer performs NEC encoding on the infrared encoded signal to generate an NEC code value, or performs RC5 encoding to generate an RC5 code value.
And the signal generator 102 is configured to receive the control signal, switch the channel of the signal generator 102 into the channel to be tested indicated by the identifier of the channel to be tested according to the identifier of the channel to be tested in the control signal, generate a first signal in the channel to be tested, and send the first signal to the main board to be tested and the detection circuit 11.
It is easily understood that, in the embodiment of the present invention, the motherboard testing device determines whether the motherboard to be tested has a fault according to the first signal and the second signal output by the motherboard to be tested after the first signal is transmitted through the motherboard to be tested, and the motherboard to be tested includes at least one channel, so that the channel of the motherboard to be tested and the channel of the signal generator need to be switched to the same channel.
And the electronic interface 103 is used for receiving the excitation signal, driving the mainboard to be tested to communicate with the mainboard test equipment according to the excitation signal, or transmitting data with the mainboard test equipment, so that the mainboard to be tested receives the control signal, and the channel of the mainboard to be tested is switched into a channel to be tested.
The electronic interface 102 in the embodiment of the present invention is used to carry or connect a motherboard to be tested, and the electronic interface in the embodiment of the present invention may carry or connect at least one motherboard to be tested.
Specifically, if at least two to-be-tested motherboards are connected to the motherboard testing device, the pad interface 102 in the embodiment of the present invention may include a relay, and the electronic interface 102 selects the to-be-tested motherboard through the relay according to the to-be-tested motherboard identifier included in the control signal.
The detection circuit is configured to determine whether the to-be-detected motherboard has a fault according to a first signal generated by the automatic switching component 10 in each channel of the to-be-detected motherboard and an acquired second signal.
Further, as shown in fig. 2, the main board test apparatus further includes a display 12 connected to the detection circuit 11.
Specifically, the display 12 is a screen and/or an indicator light, the display 12 is configured to display a first detection result determined by the detection circuit 11, and the first detection result is used to indicate whether the to-be-detected motherboard has a fault.
The detection circuit 11 is specifically configured to determine whether each channel of the motherboard to be detected has a fault according to a first signal and an acquired second signal of the automatic switching component 10 in each channel of the motherboard to be detected, and determine whether the motherboard to be detected has a fault according to a detection result of each channel.
Specifically, for each channel of the motherboard to be detected, the detection circuit 11 is specifically configured to determine whether the second signal meets a preset condition, where the preset condition is that the second signal is the same as the first signal, or a difference between an attribute value of the second signal and an attribute value of the first signal is smaller than a preset threshold, and the attribute value is an amplitude or a phase of the signal; if the second signal meets the preset condition, determining that no fault exists in the channel; and if the second signal does not meet the preset condition, determining that the channel has a fault.
The first signal in the embodiment of the present invention may be a sound accompanying signal or an image signal, which is not limited in this embodiment of the present invention. Correspondingly, if the first signal is an audio signal, the second signal is also an audio signal. If the first signal is an image signal, the second signal is also an image signal.
Alternatively, for an audio signal, the detection circuit may detect an attribute value of the signal. For an image signal, the detection circuit may detect the color of the signal.
Specifically, the detection circuit 11 sequentially detects whether each channel of the main board to be detected has a fault, and then determines whether the main board to be detected has a fault according to each detection result.
If the display is the screen, the screen can be used for displaying the first signal and the second signal of each channel, that is, a more direct detection result is displayed, so that an administrator can determine where the fault of the mainboard to be tested occurs.
If the display is an indicator light, the detection result is displayed after the detection circuit 11 determines whether the mainboard to be detected has a fault.
Optionally, the color of the indicator light is red, which represents that the main board to be tested has a fault. The pilot lamp colour is green, represents that the mainboard that awaits measuring does not have the trouble.
It is to be understood that the motherboard testing device provided in the embodiment of the present invention may further include a memory (not shown in the drawings), and the memory may mainly include a storage program area and a storage data area, where the storage program area may store an operating system, an application program (such as a message sending function) required by at least one function, and the like; the storage data area may store a detection result of each channel, and the like.
The mainboard test equipment in the embodiment of the invention comprises an automatic switching component and a detection circuit. When the automatic switching assembly detects that the mainboard to be tested is accessed, the detection of each channel of the mainboard to be tested is automatically completed, and the detection circuit can detect whether each channel has faults or not. The mainboard test equipment provided by the embodiment of the invention can automatically switch the test of the mainboard and automatically complete the test of each mainboard connected with the mainboard test equipment, thereby realizing the automatic detection of the mainboard, having higher test efficiency than the manual test of the mainboard by operators, improving the test accuracy and further ensuring the quality of the mainboard.
Example two
The invention provides a mainboard test method, wherein an execution main body is mainboard test equipment, the mainboard test equipment can test at least one mainboard to be tested at one time, and the method for testing each mainboard to be tested by the mainboard test equipment is the same, so the embodiment of the invention only takes the mainboard test equipment to test one mainboard to be tested as an example to carry out detailed description.
An embodiment of the present invention provides a motherboard testing method, as shown in fig. 3, the method includes:
s101, when the mainboard test equipment detects that the mainboard to be tested is accessed, whether n channels of the mainboard to be tested have faults or not is detected, and n detection results are recorded, wherein n is larger than or equal to 1.
The channel in the embodiment of the present invention may be an audio channel, a VGA channel, a YPbPr channel, an HDMI channel, an AV channel, or a TV channel, which is not specifically limited in the embodiment of the present invention.
In practical application, the main board to be tested comprises at least one channel. For each mainboard to be tested, when the mainboard test equipment is used for testing, each channel of the mainboard to be tested needs to be tested so as to determine whether each channel has a fault, and then whether the mainboard to be tested has the fault is determined according to the test results of all the channels.
Specifically, when the mainboard test equipment detects that the mainboard to be tested is connected, the mainboard test equipment automatically drives the mainboard to be tested to communicate with the mainboard test equipment or to transmit data. Therefore, when a plurality of mainboards to be tested are connected to the mainboard test equipment, the mainboard test equipment can drive each mainboard to be tested to communicate with the mainboard test equipment or transmit data according to the power-on time sequence of each mainboard to be tested.
For each mainboard to be tested, the mainboard test equipment detects whether n (n is more than or equal to 1) channels of the mainboard to be tested have faults or not, and records n detection results.
For a first channel in the n channels, the main board test equipment detects whether the first channel has a fault, and records a first detection result of whether the first channel has the fault, wherein the first channel is any one of the n channels.
The method for detecting whether the first channel has a fault by the motherboard testing device is explained later, and is not described herein again.
S102, the mainboard test equipment determines whether the mainboard to be tested has faults or not according to the n detection results.
After the mainboard test equipment detects the n channels of the mainboard to be tested, the mainboard test equipment determines whether the mainboard to be tested has a fault according to the n detection results.
It can be understood that, as long as one detection result exists in the n detection results and is used for indicating that the corresponding channel has a fault, it indicates that the main board to be tested has a fault. And if the n detection results indicate that no fault exists, the mainboard to be detected has no fault.
Specifically, if the first detection result is used to indicate that the first channel has a fault, the main board testing device determines that the main board to be tested has a fault.
S103, the mainboard test equipment displays a determination result, wherein the determination result is used for indicating whether the mainboard to be tested has a fault.
And the mainboard test equipment displays the determined result after whether the mainboard to be tested has the fault.
Specifically, the motherboard testing device may display the determination result through an indicator light. For example, if the motherboard testing device determines that the motherboard to be tested has a fault, an indicator light of the motherboard testing device displays red.
Further, the motherboard testing device may also display the determination result through a screen.
Specifically, the screen displays both the signal input into the mainboard to be tested and the signal output by the mainboard to be tested, so that an administrator of the mainboard test equipment can directly know which channel of the mainboard to be tested has a fault by watching the screen.
Specifically, as shown in fig. 4, for a first channel of the n channels, the method for the motherboard testing device to detect whether a fault exists and record a first detection result includes:
s201, the mainboard test equipment generates a control signal containing the identification of the first channel and sends the control signal to the mainboard to be tested, so that the mainboard to be tested switches the channel of the mainboard to be tested to the first channel according to the control signal.
Wherein the identification of the first channel indicates the first channel.
S202, the mainboard test equipment sends a first signal to the mainboard to be tested, so that the first signal is transmitted through the first channel, and a second signal is output.
S203, the mainboard test equipment judges whether the second signal output by the mainboard to be tested meets a preset condition.
The preset condition is that the second signal is the same as the first signal or the difference value between the attribute value of the second signal and the attribute value of the first signal is smaller than a preset threshold value, and the attribute value is the amplitude or the phase of the signal.
And S204, if the second signal meets the preset condition, the mainboard test equipment determines that the first channel has no fault.
S205, if the second signal does not meet the preset condition, repeatedly executing S202 and S203, and if the second signal still does not meet the preset condition after repeatedly executing S202 and S203 m times, the mainboard testing equipment determines that the first channel has a fault, wherein m is larger than or equal to 1.
Because the mainboard to be tested comprises n channels, when the mainboard test equipment detects whether the first channel of the mainboard to be tested has a fault, the mainboard to be tested needs to switch the channel of the mainboard to be tested into the first channel at first.
Specifically, the mainboard test equipment sends a control signal to the mainboard to be tested, so that the mainboard to be tested switches the channel of the mainboard to be tested into the first channel according to the control signal.
Optionally, the control signal in the embodiment of the present invention is a digital signal.
After the mainboard to be tested switches the channel of the mainboard to be tested into the first channel, the mainboard test equipment sends a first signal to the mainboard to be tested, so that the first signal is transmitted through the first channel of the mainboard to be tested.
The first signal is a signal generated after the mainboard test equipment switches the own channel into the first channel according to the control signal.
It is easy to understand that when the motherboard testing device detects the first channel of the motherboard to be tested, it needs to ensure that the channel of the motherboard testing device is the same as the first channel. Therefore, when the first signal is transmitted through the first channel, the first signal does not change greatly.
Specifically, the motherboard testing device also includes at least one channel, and the at least one channel of the motherboard testing device is the same as the n channels of the motherboard to be tested. Therefore, the mainboard test equipment can complete the detection of n channels of the mainboard to be tested.
Furthermore, after the mainboard test equipment sends the first signal to the mainboard to be tested, the first signal is transmitted through the first channel of the mainboard to be tested, the mainboard to be tested outputs a second signal after responding to the first signal, and at the moment, the mainboard test equipment utilizes the second signal to determine whether the first channel has a fault.
Specifically, the motherboard testing device determines whether the second signal meets a preset condition, where the preset condition is that the second signal is the same as the first signal, or a difference between an attribute value of the second signal and an attribute value of the first signal is smaller than a preset threshold, and the attribute value of the signal is an amplitude or a phase of the signal.
The signal in the embodiment of the present invention may be a sound accompanying signal or an image signal, and the embodiment of the present invention is not particularly limited in this respect.
For example, if the first signal is a first image signal and the second signal is a second image signal, the motherboard testing device may determine whether an image color of a preset position in the second image signal is the same as an image color of a preset position in the first image signal. If the first signal is a first audio signal and the second signal is a second audio signal, the mainboard test equipment can judge that the difference value between the amplitude of the second audio signal and the amplitude of the first audio signal is smaller than a preset threshold value.
Specifically, if the second signal meets the preset condition, the main board testing device determines that the first channel has no fault. And if the second signal does not meet the preset condition, repeatedly executing S202 and S203, and if the second signal still does not meet the preset condition after repeatedly executing S202 and S203 m times, the mainboard test equipment determines that the first channel has a fault, wherein m is more than or equal to 1.
It can be understood that, in order to prevent misjudgment, the main board testing device repeatedly tests the first channel of the main board to be tested when determining that the second signal does not satisfy the preset condition. The mainboard test equipment can determine that the first channel has no fault as long as the second signal meets the preset condition in one test process.
The mainboard test equipment sequentially detects n channels of the mainboard to be tested by adopting the method, and records whether each channel has a fault.
In the embodiment of the invention, when the mainboard test equipment detects that the mainboard to be tested is accessed, whether n (n is more than or equal to 1) channels of the mainboard to be tested have faults or not is detected, n detection results are recorded, then the mainboard test equipment determines whether the mainboard to be tested has the faults or not according to the n detection results, and finally the mainboard test equipment displays a determination result for indicating whether the mainboard to be tested has the faults or not. Through this scheme, mainboard test equipment can switch the test to the mainboard by oneself to accomplish the test to each mainboard of access mainboard test equipment by oneself, realized the automatic mainboard that detects, the efficiency of software testing of manual test mainboard of operating personnel is high, and has improved the test accuracy, and then has guaranteed mainboard quality.
It will be clear to those skilled in the art that, for convenience and simplicity of description, the foregoing division of the functional modules is merely used as an example, and in practical applications, the above function distribution may be performed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to perform all or part of the above described functions. For the specific working processes of the system, the apparatus and the unit described above, reference may be made to the corresponding processes in the foregoing method embodiments, and details are not described here again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.
Claims (9)
1. The mainboard test equipment is characterized by comprising an automatic switching component and a detection circuit connected with the automatic switching component; wherein,
the automatic switching component is used for driving the mainboard to be tested to communicate with the mainboard testing equipment or to transmit data to each channel of the mainboard to be tested, generating a first signal and transmitting the first signal via the mainboard to be tested to obtain a second signal output by the mainboard to be tested when the mainboard testing equipment detects the access of the mainboard to be tested, and comprises a control circuit:
the control circuit is used for generating an excitation signal and sending the excitation signal to an electronic interface when the mainboard test equipment detects that a mainboard to be tested is accessed, wherein the excitation signal comprises an identifier of the mainboard to be tested, and the control circuit is used for sequentially generating control signals and sending the control signals to the signal generator and the mainboard to be tested, and the control signals comprise an identifier of a channel to be tested;
the detection circuit is used for determining whether the mainboard to be tested has a fault according to a first signal generated by the automatic switching component in each channel of the mainboard to be tested and an acquired second signal;
the automatic switching assembly comprises the electronic interface, the electronic interface bears or is connected with at least one mainboard to be tested, and the electronic interface selects the mainboard to be tested through a relay.
2. The motherboard testing apparatus of claim 1, wherein the automatic switching assembly comprises a signal generator connected to the control circuit, an electronic interface connected to both the control circuit and the signal generator, both the signal generator and the electronic interface connected to the detection circuit; wherein,
the signal generator is used for receiving the control signal, switching the channel of the signal generator into a channel to be detected indicated by the identifier of the channel to be detected according to the identifier of the channel to be detected in the control signal, generating a first signal in the channel to be detected, and sending the first signal to the mainboard to be detected and the detection circuit;
and the electronic interface is used for receiving the excitation signal, driving the mainboard to be tested to communicate with the mainboard test equipment according to the excitation signal, or carrying out data transmission with the mainboard test equipment, so that the mainboard to be tested receives the control signal and switches the channel of the mainboard to be tested into the channel to be tested.
3. The motherboard testing device of claim 1 or 2, further comprising a display connected to the detection circuit;
the display is a screen and/or an indicator light, the display is used for displaying a first detection result determined by the detection circuit, and the first detection result is used for indicating whether the mainboard to be detected has a fault.
4. Motherboard testing device according to claim 3,
the detection circuit is specifically configured to determine whether each channel of the mainboard to be detected has a fault according to a first signal and an acquired second signal of the automatic switching component in each channel of the mainboard to be detected, and determine whether the mainboard to be detected has a fault according to a detection result of each channel.
5. Motherboard testing device according to claim 4,
for each channel of the mainboard to be detected, the detection circuit is specifically configured to determine whether the second signal meets a preset condition, where the preset condition is that the second signal is the same as the first signal, or that a difference between an attribute value of the second signal and an attribute value of the first signal is smaller than a preset threshold, and the attribute value is an amplitude or a phase of the signal; if the second signal meets the preset condition, determining that no fault exists in the channel; and if the second signal does not meet the preset condition, determining that the channel has a fault.
6. Motherboard testing device according to claim 5,
and if the display is the screen, the display is also used for displaying the first signal and the second signal of each channel.
7. A mainboard test method is characterized by comprising the following steps:
the mainboard test equipment selects a mainboard to be tested through a relay;
when the mainboard test equipment detects that the mainboard to be tested is accessed, detecting whether n channels of the mainboard to be tested have faults or not, and recording n detection results, wherein n is more than or equal to 1;
the method for testing the mainboard is characterized in that for a first channel in the n channels, the mainboard testing equipment detects whether the first channel has a fault and records a first detection result, wherein the first detection result is used for identifying whether the first channel has the fault;
the main board testing equipment detects whether the first channel has a fault, and specifically includes:
A. the mainboard test equipment generates a control signal containing the identifier of the first channel and sends the control signal to the mainboard to be tested, so that the mainboard to be tested switches the channel of the mainboard to be tested to the first channel according to the identifier of the first channel, wherein the identifier of the first channel indicates the first channel;
B. the mainboard test equipment sends a first signal to the mainboard to be tested, so that the first signal is transmitted through the first channel and a second signal is output;
C. the mainboard test equipment judges whether a second signal output by the mainboard to be tested meets a preset condition, wherein the preset condition is that the second signal is the same as the first signal or the difference value between the attribute value of the second signal and the attribute value of the first signal is smaller than a preset threshold value, and the attribute value is the amplitude or the phase of the signal;
D. if the second signal meets the preset condition, the mainboard test equipment determines that the first channel has no fault;
E. if the second signal does not meet the preset condition, repeatedly executing B and C;
F. if the E is repeatedly executed m times, the main board testing equipment determines that the first channel has a fault, wherein m is more than or equal to 1;
the mainboard test equipment determines whether the mainboard to be tested has a fault or not according to the n detection results;
and the mainboard test equipment displays a determination result, and the determination result is used for indicating whether the mainboard to be tested has a fault.
8. The motherboard testing method of claim 7, wherein before the motherboard testing device sends the first signal to the motherboard under test, the motherboard testing method further comprises:
the mainboard test equipment switches the channel of the mainboard test equipment into the first channel;
the mainboard test equipment generates the first signal in the first channel.
9. The motherboard testing method according to claim 7 or 8, wherein the determining, by the motherboard testing device, whether the motherboard to be tested has a fault according to the n detection results comprises:
and if the first detection result indicates that the first channel has a fault, the mainboard test equipment determines that the mainboard to be tested has a fault.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610012934.6A CN105676109B (en) | 2016-01-08 | 2016-01-08 | A kind of motherboard test method and equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610012934.6A CN105676109B (en) | 2016-01-08 | 2016-01-08 | A kind of motherboard test method and equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105676109A CN105676109A (en) | 2016-06-15 |
| CN105676109B true CN105676109B (en) | 2019-08-02 |
Family
ID=56299635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610012934.6A Active CN105676109B (en) | 2016-01-08 | 2016-01-08 | A kind of motherboard test method and equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105676109B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405383B (en) * | 2016-08-31 | 2019-04-26 | 成都天奥信息科技有限公司 | The embedded board Auto-Test System and method of view-based access control model detection technique |
| CN110336998A (en) * | 2019-07-04 | 2019-10-15 | 深圳市康冠技术有限公司 | Show mainboard detection method, display mainboard detection device and readable storage medium storing program for executing |
| CN110769249A (en) * | 2019-10-15 | 2020-02-07 | 深圳创维－Rgb电子有限公司 | Mainboard detection method, equipment, system and storage medium |
| CN114697244B (en) * | 2022-03-24 | 2023-08-11 | 电信科学技术第五研究所有限公司 | Test system suitable for storage area network intermediate node equipment |
| CN114996069A (en) * | 2022-06-24 | 2022-09-02 | 浪潮商用机器有限公司 | A motherboard testing method, device and medium |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5485096A (en) * | 1994-04-05 | 1996-01-16 | Aksu; Allen | Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards |
| CN101360253A (en) * | 2007-07-31 | 2009-02-04 | 青岛海信电器股份有限公司 | Television automatic test method and system |
| CN101435841A (en) * | 2007-11-16 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | Test system and method |
| CN201340445Y (en) * | 2008-09-12 | 2009-11-04 | 惠州华阳通用电子有限公司 | Automatic testing system for electronic products |
| CN102087336A (en) * | 2010-12-06 | 2011-06-08 | 广州视源电子科技有限公司 | Method and system for detecting video/audio signal circuit board |
| CN201986083U (en) * | 2010-12-06 | 2011-09-21 | 广州视源电子科技有限公司 | Device for automatically detecting circuit board |
| CN102256158A (en) * | 2011-07-29 | 2011-11-23 | 广州视源电子科技有限公司 | Automatic television circuit board function testing method and system |
| CN102421011A (en) * | 2011-09-14 | 2012-04-18 | 厦门华侨电子股份有限公司 | Quick detecting system of TV set mainboard |
| CN104063322A (en) * | 2014-06-30 | 2014-09-24 | 广州视源电子科技股份有限公司 | Channel switching-based test method and device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5024740B2 (en) * | 2004-09-30 | 2012-09-12 | 学校法人慶應義塾 | LSI chip testing equipment |
-
2016
- 2016-01-08 CN CN201610012934.6A patent/CN105676109B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5485096A (en) * | 1994-04-05 | 1996-01-16 | Aksu; Allen | Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards |
| CN101360253A (en) * | 2007-07-31 | 2009-02-04 | 青岛海信电器股份有限公司 | Television automatic test method and system |
| CN101435841A (en) * | 2007-11-16 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | Test system and method |
| CN201340445Y (en) * | 2008-09-12 | 2009-11-04 | 惠州华阳通用电子有限公司 | Automatic testing system for electronic products |
| CN102087336A (en) * | 2010-12-06 | 2011-06-08 | 广州视源电子科技有限公司 | Method and system for detecting video/audio signal circuit board |
| CN201986083U (en) * | 2010-12-06 | 2011-09-21 | 广州视源电子科技有限公司 | Device for automatically detecting circuit board |
| CN102256158A (en) * | 2011-07-29 | 2011-11-23 | 广州视源电子科技有限公司 | Automatic television circuit board function testing method and system |
| CN102421011A (en) * | 2011-09-14 | 2012-04-18 | 厦门华侨电子股份有限公司 | Quick detecting system of TV set mainboard |
| CN104063322A (en) * | 2014-06-30 | 2014-09-24 | 广州视源电子科技股份有限公司 | Channel switching-based test method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105676109A (en) | 2016-06-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105676109B (en) | A kind of motherboard test method and equipment | |
| US20210217157A1 (en) | Display Device Failure Detection Method, Device and System | |
| CN102087336B (en) | Method and system for detecting video and audio signal circuit board | |
| CN102572503B (en) | Automatic test system for functions of television set and method thereof | |
| EP3350990B1 (en) | High definition multimedia interface test system | |
| CN103067736A (en) | Automatic test system based on character recognition | |
| EP2706526B1 (en) | Electronic device having self diagnosis function and self diagnosis method using the same | |
| CN101841732A (en) | Testing method and testing device for multimedia electronic equipment | |
| CN104378781A (en) | Method for detecting faults of mobile terminals and mobile terminals | |
| US20170163979A1 (en) | Testing device of display devices and testing method thereof | |
| CN104881344A (en) | Automatic testing method and system for PCBA | |
| TWI548262B (en) | Mutiple inspecting system for image signal and mutiple inspecting method thereof | |
| CN102843575A (en) | VGA (Video Graphics Array) port test device and test method thereof | |
| TWI405079B (en) | Output test method, system and platform for electrical device | |
| CN110232881A (en) | Front board measuring method | |
| CN101360253A (en) | Television automatic test method and system | |
| CN107465915A (en) | Fault detection device and system | |
| KR101552826B1 (en) | Test system for fail of display pane | |
| CN102479474A (en) | Detection system and detection method of display connection port | |
| CN207200894U (en) | Tooling plate and test system | |
| KR20230089895A (en) | Monitoring system of led display device based on big data using control signal | |
| CN108089110A (en) | Mainboard method for testing reliability and system | |
| CN101996613B (en) | Electronic device output test method, system and platform | |
| CN115514952B (en) | Synchronous detection method and device for multipath image data | |
| CN107566829A (en) | Fault detection system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 266555 Qingdao economic and Technological Development Zone, Shandong, Hong Kong Road, No. 218 Patentee after: Hisense Visual Technology Co., Ltd. Address before: 266555 Qingdao economic and Technological Development Zone, Shandong, Hong Kong Road, No. 218 Patentee before: QINGDAO HISENSE ELECTRONICS Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder |