CN106094193A - Automatic focusing microscopic imaging system for planet surface substance in-place detection - Google Patents
Automatic focusing microscopic imaging system for planet surface substance in-place detection Download PDFInfo
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Abstract
本发明提出了一种行星表面物质就位探测的自动调焦显微成像系统,包括照明单元、显微成像单元、图像采集单元、调焦传动单元、上位机单元;照明单元与显微成像单元位于同一光路,显微成像单元包括显微镜物镜、镜筒;调焦传动单元是齿轮外噬合传动装置,其设置方向与照明单元垂直,该单元将齿轮的传动,转化成显微镜筒的移动;图像采集单元与显微镜筒在同一光路,图像采集单元与调焦传动单元连接;上位机单元对采集到图像的清晰度评判,控制整个系统处于准焦状态。本发明能够对采集到的待测样品的图像进行清晰度判别,通过拟合调焦函数,快速找到准焦位置,提高了调焦的速度和精度,且该装置采用单元化设计,具有体积小、功能强等优点。
The present invention proposes an automatic focusing microscopic imaging system for in-situ detection of planetary surface materials, including an illumination unit, a microscopic imaging unit, an image acquisition unit, a focusing transmission unit, and a host computer unit; the lighting unit and the microscopic imaging unit are located at the same The optical path, the microscopic imaging unit includes the microscope objective lens and the lens barrel; the focusing transmission unit is a gear external engagement transmission device, and its setting direction is perpendicular to the lighting unit, which converts the transmission of the gear into the movement of the microscope barrel; the image acquisition unit In the same optical path as the microscope tube, the image acquisition unit is connected with the focusing transmission unit; the host computer unit evaluates the clarity of the collected images and controls the entire system to be in a quasi-focus state. The invention can judge the sharpness of the collected image of the sample to be tested, quickly find the quasi-focus position by fitting the focusing function, and improve the speed and precision of focusing, and the device adopts a unitized design and has the advantages of small size , strong functions and other advantages.
Description
技术领域technical field
本发明属于光学工程领域,尤其涉及一种自动调焦的显微成像装置,利用图像清晰度评价函数快速实现对焦过程,获取待测样品清晰的显微图像。The invention belongs to the field of optical engineering, and in particular relates to an automatic focusing microscopic imaging device, which utilizes an image definition evaluation function to quickly realize the focusing process and obtain a clear microscopic image of a sample to be tested.
背景技术Background technique
深空探测领域,显微成像系统作为就位探测的光学载荷,通过对行星地质表层土壤、岩石样品成像,根据图像尺寸、纹理、颜色等特征,可以从微观角度来认知地形地貌、进而判断土壤元素组成、矿物成分分析等。如美国的“机遇号”上携带的显微成像仪(MI)、“凤凰号”火星着陆器携带的光学显微镜(OM)、“好奇号”携带的MAHLI相机、欧空局“ExoMars”号携带的MicroOmega高光谱显微镜等都能从微观角度对采集到的土壤样品进行成像、分析等。In the field of deep space exploration, the microscopic imaging system is used as an optical load for in-situ detection. By imaging planetary geological surface soil and rock samples, according to the image size, texture, color and other characteristics, it is possible to recognize the topography from a microscopic point of view, and then judge Soil element composition, mineral composition analysis, etc. For example, the microscopic imager (MI) carried by the "Opportunity" of the United States, the optical microscope (OM) carried by the "Phoenix" Mars lander, the MAHLI camera carried by the "Curiosity" and the "ExoMars" carried by the European Space Agency. The MicroOmega hyperspectral microscope can image and analyze the collected soil samples from a microscopic perspective.
显微成像载荷获取清晰图像时,传统方法一般是在不同物距下分别对待测样品成像,然后在采集到的一系列图像中选取清晰图像,这种方法采集到的图像较多,耗时较长,效率低下。When microscopic imaging loads acquire clear images, the traditional method is to image the samples to be tested at different object distances, and then select clear images from a series of images collected. This method collects more images and takes more time. Long and inefficient.
发明内容Contents of the invention
为了解决背景技术中所存在的技术问题,本发明提出了一种自动调焦的显微成像系统装置,该装置能够对采集到的待测样品的图像进行清晰度判别,通过拟合调焦函数,快速找到准焦位置,提高了调焦的速度和精度,且该装置采用单元化设计,具有体积小、功能强等优点,符合航天载荷的轻小化设计原则。In order to solve the technical problems existing in the background technology, the present invention proposes an automatic focusing microscopic imaging system device, which can judge the sharpness of the collected image of the sample to be tested, and by fitting the focusing function , to quickly find the quasi-focus position, which improves the speed and accuracy of focusing, and the device adopts a unitized design, which has the advantages of small size and strong functions, and conforms to the light and small design principle of aerospace payloads.
本发明的技术解决方案是:一种行星表面物质就位探测的自动调焦显微成像系统,其特征在于:所述系统包括照明单元、显微成像单元、图像采集单元、调焦传动单元、上位机单元;The technical solution of the present invention is: an automatic focusing microscopic imaging system for in-situ detection of planetary surface materials, characterized in that: the system includes an illumination unit, a microscopic imaging unit, an image acquisition unit, a focusing transmission unit, and a host computer unit;
所述照明单元与显微成像单元位于同一光路,显微成像单元包括显微镜物镜、镜筒。调焦传动单元是齿轮外噬合传动装置,其设置方向与照明单元垂直,该单元将齿轮的传动,转化成显微镜筒的移动。The illumination unit and the microscopic imaging unit are located on the same optical path, and the microscopic imaging unit includes a microscope objective lens and a lens barrel. The focus transmission unit is a gear external engagement transmission device, and its setting direction is perpendicular to the lighting unit. This unit converts the transmission of the gear into the movement of the microscope tube.
图像采集单元与显微镜筒在同一光路,图像采集单元与调焦传动单元连接;The image acquisition unit and the microscope barrel are in the same optical path, and the image acquisition unit is connected with the focusing transmission unit;
上位机单元对采集到图像的清晰度评判,拟合调焦曲线,并发送调焦指令,控制整个系统处于准焦状态。The upper computer unit evaluates the clarity of the collected images, fits the focusing curve, and sends focusing instructions to control the entire system to be in a quasi-focus state.
上述调焦传动单元包括主动轮、从动轮、磁珠、电机以及霍尔传感器;电机驱动主动轮带动从动轮传动;磁珠设置在从动轮上,磁珠与霍尔传感器用来标定齿轮传动时的起点位置;从动轮连接显微镜筒和图像采集单元。The above-mentioned focusing transmission unit includes a driving wheel, a driven wheel, a magnetic bead, a motor and a Hall sensor; the motor drives the driving wheel to drive the driven wheel; the magnetic bead is arranged on the driven wheel, and the magnetic bead and the Hall sensor are used to calibrate the gear transmission. The starting position; the driven wheel connects the microscope tube and the image acquisition unit.
上述图像采集单元是CCD相机。The above-mentioned image acquisition unit is a CCD camera.
本发明具有如下优点:The present invention has the following advantages:
1)本发明采用照明成像共光路的成像单元,使得整个系统集成度更高。1) The present invention adopts an imaging unit with a common light path for illumination and imaging, so that the integration of the whole system is higher.
2)照明光源的波长可选,针对不同样品选用不同波长的光源,以更加全面灵活的分析样品特征。2) The wavelength of the illumination light source is optional, and light sources with different wavelengths are selected for different samples to analyze the characteristics of the sample more comprehensively and flexibly.
3)本装置通过霍尔传感器的标定作用,有效的消除了齿轮传动机构回程差对定位精度的影响。3) The device effectively eliminates the impact of the backstroke difference of the gear transmission mechanism on the positioning accuracy through the calibration function of the Hall sensor.
附图说明Description of drawings
图1是本发明的结构示意图;Fig. 1 is a structural representation of the present invention;
图2是本发明自动调焦显微成像系统工作流程图;Fig. 2 is a work flow diagram of the automatic focusing microscopic imaging system of the present invention;
具体实施方式detailed description
参见图1,本发明是一种行星表面物质就位探测的自动调焦显微成像系统装置,整个系统包括:照明单元、显微光学成像单元、图像采集单元(CCD相机9)、调焦传动单元(主动轮、从动轮、磁珠、电机、霍尔传感器)、上位机单元。本装置对被测样品进行显微成像时,上位机通过对图像清晰度的判别,计算出准焦位置,并发送相应指令,控制成像系统到达指定位置,快速得到被测物体清晰的显微图像。Referring to Fig. 1, the present invention is a kind of auto-focusing microscopic imaging system device of planetary surface material in-situ detection, whole system comprises: illumination unit, microscopic optical imaging unit, image acquisition unit (CCD camera 9), focusing transmission unit ( Drive wheel, driven wheel, magnetic beads, motor, Hall sensor), host computer unit. When the device performs microscopic imaging of the sample under test, the host computer calculates the quasi-focus position by judging the image clarity, and sends corresponding instructions to control the imaging system to reach the designated position, and quickly obtain a clear microscopic image of the measured object .
该自动调焦装置的照明部分及显微光学成像部分共光路。LED照明光源1发出的光线经过照明聚光镜照射到分光片上,照向被观测物体样品表面,样品反射回来的光线经过成像镜组成像在像面上。调焦机构为齿轮外噬合传动装置,通过步进电机2驱动主动轮3带动从动轮4传动,镜筒5逐步靠近或远离目标,也就是改变物距的方式,找到准焦位置。从动轮4上安装磁珠6,磁珠6与霍尔传感器7用来标定齿轮传动时的起点位置,以消除齿轮传动机构的回程差对定位精度的影响。步进电机2驱动镜头等步长前进,每走一步,采集一帧图像,上位机8计算该位置图像清晰度,若当前图像清晰度大于前一帧图像,则认为系统逐步靠近准焦位置,当连续四个位置的图像清晰度下降时,则取清晰度最大位置及左右两侧各取两个相邻位置和相应的图像清晰度,实现调焦曲线的拟合,找出峰值位置,发出相应指令,控制成像系统到达峰值位置处,实现调焦过程。The illumination part and the micro-optics imaging part of the automatic focusing device share an optical path. The light emitted by the LED lighting source 1 is irradiated on the spectroscopic sheet through the illuminating condenser, and shines on the sample surface of the observed object, and the light reflected by the sample is imaged on the image plane through the imaging mirror group. The focusing mechanism is a gear-to-gear transmission device. The driving wheel 3 is driven by the stepping motor 2 to drive the driven wheel 4. The lens barrel 5 gradually approaches or moves away from the target, that is, the method of changing the object distance to find the quasi-focus position. A magnetic bead 6 is installed on the driven wheel 4, and the magnetic bead 6 and the hall sensor 7 are used to calibrate the starting position of the gear transmission, so as to eliminate the influence of the backstroke difference of the gear transmission mechanism on the positioning accuracy. The stepping motor 2 drives the lens to move forward in equal steps, and collects a frame of image every step, and the host computer 8 calculates the image definition of this position. If the current image definition is greater than the previous frame image, it is considered that the system is gradually approaching the in-focus position. When the image clarity of four consecutive positions decreases, take the position with the maximum clarity and two adjacent positions on the left and right sides and the corresponding image clarity to realize the fitting of the focusing curve, find out the peak position, and send According to the instruction, the imaging system is controlled to reach the peak position to realize the focusing process.
具体实施过程如下:The specific implementation process is as follows:
上位机8发送调焦指令,步进电机2正向转动,通过齿轮传动机构,镜筒5逐步靠近待测样品,当霍尔传感器7首次感应到磁珠6磁场时,传感器发送信号至上位机8,将此位置标志为调焦行程起点。The upper computer 8 sends a focusing instruction, and the stepping motor 2 rotates in the forward direction. Through the gear transmission mechanism, the lens barrel 5 gradually approaches the sample to be tested. When the Hall sensor 7 senses the magnetic field of the magnetic bead 6 for the first time, the sensor sends a signal to the upper computer. 8. Mark this position as the starting point of the focusing stroke.
起点位置处,电机大步长驱动主动轮3转动,每隔等步长采集图像,上位机8判别图像清晰度。当连续四点清晰度下降时,即认为此时已越过准焦位置点,此时电机停转。上位机8则取清晰度最大位置及左右两侧各取两个相邻位置和相应的图像清晰度,实现调焦曲线的拟合,调焦曲线的峰值位置认为是准焦位置。At the starting point, the motor drives the driving wheel 3 to rotate with a large step length, and images are collected at equal step lengths, and the host computer 8 judges the image clarity. When the sharpness of four consecutive points drops, it is considered that the quasi-focus position point has been crossed at this time, and the motor stops at this time. The host computer 8 takes the maximum sharpness position and two adjacent positions on the left and right sides and the corresponding image sharpness to realize the fitting of the focusing curve, and the peak position of the focusing curve is regarded as the quasi-focus position.
电机反转,当霍尔传感器7再次感应到磁场信号时,说明到达起点位置。电机正转,直至驱动调焦机构运转至拟合的准焦位置处,采集图像。The motor reverses, and when the Hall sensor 7 senses the magnetic field signal again, it indicates that the starting position has been reached. The motor rotates forward until the focusing mechanism is driven to the fitted quasi-focus position to collect images.
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| CN205942080U (en) * | 2016-07-28 | 2017-02-08 | 中国科学院西安光学精密机械研究所 | Automatic focusing microscopic imaging system for planet surface substance in-place detection |
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| US20020105641A1 (en) * | 2001-02-05 | 2002-08-08 | Anderson Mark S. | Locally enhanced raman spectroscopy with an atomic force microscope |
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| CN205942080U (en) * | 2016-07-28 | 2017-02-08 | 中国科学院西安光学精密机械研究所 | Automatic focusing microscopic imaging system for planet surface substance in-place detection |
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