CN106950237B - A Scanning Laue Diffraction Spectrum Analysis Method Based on Peak-to-Peak Angle Comparison - Google Patents

Abstract

The invention discloses a kind of scan-type Laue diffraction atlas analysis methods compared based on peak-to-peak angle, comprising the following steps: step 1: carrying out peak-seeking operation to all diffracting spectrums of experiment gained, obtains position and the integrated intensity of diffraction maximum.Step 2: the base peak differential seat angle sequence D of parameter point is defined_S,iMethod.Step 3: definition compare two o'clock whether be same crystal grain method.Step 4: selecting a kind of traversal method, traverses to all the points in Experimental Area, completes the calibration for answering all-pair in Experimental Area the peak of diffracting spectrum, and obtains the crystalline substance in Experimental Area/phase boundary distribution；It is small with calculation amount, time-consuming short feature.

Description

A Scanning Laue Diffraction Spectrum Analysis Method Based on Peak-to-Peak Angle Comparison

technical field

The present invention relates to the technical field of characterization methods for crystal microstructures, in particular to an analysis of scanning Laue diffraction patterns, in which the diffraction peaks in the scanning Laue diffraction patterns are calibrated and at the same time the crystals/crystals in the scanning area of scanning Laue diffraction experiments are obtained. Method for Phase Boundary Segmentation Information.

Background technique

The microstructure of materials has a significant impact on the mechanical properties of materials, thus affecting the service use of materials. Therefore, it is of great significance to characterize the microstructure of materials to study the mechanical behavior and failure mechanism of materials, so as to improve the material processing technology of related materials. The commonly used characterization methods for the microstructure of materials include optical microscope, scanning electron microscope (SEM), transmission electron microscope (TEM), electron backscatter diffraction (EBSD), traditional X-ray diffraction (XRD), neutron diffraction, etc.

Metallographic microscopy uses an optical microscope to observe the surface topography of materials. However, due to the limited resolution of optical microscopes, it is impossible to observe the microstructure of materials. Scanning electron microscope (SEM) observations generally have two signal sources, which are secondary electrons and backscattered electrons. Among them, the secondary electron signal is sensitive to the surface morphology of the sample, and the backscattered electrons are sensitive to the element distribution of the sample. However, for small-scale structures, such as dislocations and small-angle grain boundaries, this method is difficult to distinguish. However, the spatial resolution of traditional XRD and neutron diffraction is not enough to distinguish the microstructural characteristics of materials such as crystal orientation, defects, and twins. Although the transmission electron microscope (TEM) has a high resolution, its efficiency is low, the preparation of the sample is complicated, the observation area is small, it is difficult to perform statistical observation, and the ability to distinguish strain is weak.

Scanning Laue Diffraction uses a synchrotron radiation source as an X-ray source with high spatial resolution (submicron level) (Kunz, M., et al., A dedicated superbend x-raymicrodiffraction beamline for materials , geo-, and environmental sciences at the advanced light source[J],Rev.Sci.Instrum.,2009), high angular resolution (~0.01°)(Tamura,N.,et al.,High spatial resolution grain orientation and strainmapping in thin films using polychromatic submicron x-ray diffraction[J], Appl. Phys. Lett., 2002), strong penetrating power, simple sample preparation and other advantages. The advantages of the scanning Laue diffraction technique are a great complement to the shortcomings of the above-mentioned various material characterization techniques, thus reflecting the importance of this technique in the field of material analysis and characterization.

However, the scanning Laue diffraction experiment requires stationary point scanning of the sample experimental area to obtain a large number of diffraction patterns (ranging from a few thousand to hundreds of thousands). The existing technology for processing diffraction patterns is to perform index calculation independently for each pattern. Then do other analyses. This process is computationally intensive and extremely time-consuming. Computing on cluster computers still takes tens of hours or weeks. This disadvantage severely limits the application of this technology.

In fact, because the orientation difference of points in the same crystal grain is very small, the scanning Laue diffraction patterns of points in the same crystal grain have great similarity. Therefore, only a few points of each crystal grain are selected for index calculation, and the index processing of these diffraction patterns can be completed by finding and utilizing the similarity of the diffraction patterns corresponding to the points belonging to the same grain. This greatly reduces the number of index calculations actually performed, thereby greatly shortening the time consumption of the entire data processing process and saving computer resources. Not only that, through this method, while completing the indexing processing of each diffraction pattern, the crystal/phase boundary distribution in the scanning area of the scanning Laue diffraction experiment is also obtained, which brings convenience to the subsequent analysis process.

Contents of the invention

In order to meet the above-mentioned technical requirements, the present invention aims to provide a scanning Laue diffraction pattern analysis method based on peak-to-peak angle comparison. Compared with other current analysis methods for scanning Laue diffraction patterns, this method has the advantages of The calculation amount is small and the time consumption is short.

In order to achieve the above object, technical scheme of the present invention is as follows:

A scanning Laue diffraction pattern analysis method based on peak-to-peak angle comparison, comprising the steps of:

Step 1: Perform a peak-finding operation on all the Laue diffraction patterns obtained by the Scanning Laue diffraction experiment (Scanning Laue Diffraction), to obtain the positions and integral intensities of all diffraction peaks on each Laue diffraction pattern;

Step 2: Calculate the standard peak angle difference sequence D _S,i of all the calibrated diffraction peaks on the Laue diffraction pattern of the indexed point, including the following specific operation steps:

1) Carry out indexing calculation on the Laue diffraction pattern corresponding to the indexing point, and obtain the positions, integral intensities and crystal plane Miller indices of all the calibrated diffraction peaks; take appropriate calculations including the number of peaks n (generally n Take one-eighth of the total number of diffraction peaks), according to the integrated intensity of the peak, calculate the direction vector k _S,i (1 ≤i≤n);

2) For the direction vector k _S,i , calculate the angle between it and other direction vectors, and obtain the standard angle difference sequence D _S,i (1≤i≤n) composed of (n-1) angles;

Step 3: Determine whether the two points in the scanning Laue diffraction experiment area are the same grain, including the following specific steps:

1) Define the standard angle difference sequence D _{S, the known point of i} is the comparison origin, the standard angle difference sequence D _{S, the unknown point of i} is the compared point;

2) Take an appropriate extension to include the number of peaks Δn (Δn is generally taken as a quarter of n), and calculate the strongest (n+Δn) of all diffraction peaks in the Laue diffraction pattern of the compared point according to the integrated intensity of the diffraction peak ) direction vector k _i (1≤i≤n+Δn) of the diffraction peaks in the detector coordinate system;

3) For the direction vector k _i , calculate the angle between it and other direction vectors, and obtain the comparison angle difference sequence D _i (1≤i≤n+Δn) composed of (n+Δn-1) angles;

4) Determine whether there is a comparison angle difference sequence D _i of the compared point corresponding to each standard angle difference sequence D _S,i of the comparison origin; the specific method is as follows:

a) Define the component in the comparison angle difference sequence D _i of the compared point as δ _i,j . Compare it with the component δ _S,i,j in the standard angle difference sequence D _S,i of the comparison origin. like

It is considered that δ _i,j is equal to δ _S,i,j . Generally T ₁ takes 0.05;

b) Assume that the number of equal components in D _i and D _S,i is m _i , if satisfy

m _i ≥ T ₂ ·n

It is considered that D _i corresponds to D _S,i , and its corresponding peaks also correspond; generally T ₂ is taken as 0.8;

5) Assuming that the total number of D _i and D _S,i corresponding to the comparison origin and the compared point is s, if it satisfies

s≥T ₃ ·n

It is considered that the comparison origin and the compared point belong to the same grain. And the crystal plane Miller index of the calibrated diffraction peak in the comparison origin is assigned to the corresponding diffraction peak in the compared point, and the crystal plane Miller index is also defined as the calibrated diffraction peak; if not satisfied, compare The origin and the compared point do not belong to the same grain. Generally, _T3 takes 0.9;

Step 4: Choose one of the scanning traversal method and the radial traversal method as the traversal method for all points in the scanning area of the scanning Laue diffraction experiment; set the boundary of the entire area as a grain boundary before starting the traversal; and then according to The selected traversal method completes the traversal of all points in the scanning Laue diffraction experiment area, and obtains the crystal plane Miller indices of all calibrated diffraction peaks corresponding to these points on the diffraction pattern.

The scanning traversal method described in step 4 of the technical solution includes the following specific steps:

Step 1: Scan and traverse the entire experimental area of the scanning Laue diffraction experiment by column; define the scanning direction of the ongoing column as the forward direction, and the direction of changing columns to the next column as the side column direction; the traversal process starts from a certain area of the area. start at a corner;

Step 2: After the traversal starts and proceeds to a certain point in the area, judge whether the adjacent point in the opposite direction of the forward direction of the point and the opposite direction of the side row direction is set as a grain boundary, and then distinguish the following situations and perform different operations :

1) If the adjacent points in the opposite direction of the forward direction and the opposite direction of the side row direction are all grain boundaries, this point is considered as an index point, and the standard peak angle difference sequence D _S,i of this point is calculated;

2) If the adjacent point in the opposite direction of the forward direction is a grain boundary, and the adjacent point in the opposite direction of the side column is not a grain boundary, it is considered that this point and the adjacent point in the opposite direction of the forward direction belong to the same grain, and the standard of this point The peak angle difference sequence D _S,i is also the same as the standard peak angle difference sequence of the adjacent point in the opposite direction of the forward direction;

3) If the adjacent point in the opposite direction of the forward direction is not a grain boundary, and the adjacent point in the opposite direction of the side row direction is a grain boundary, it is considered that this point and the adjacent point in the opposite direction of the side row direction belong to the same grain, and the point’s The standard peak angle difference sequence D _S,i is also the same as the standard peak angle difference sequence of the adjacent point in the opposite direction of the side row direction;

4) If the adjacent point in the opposite direction of the forward direction and the opposite direction of the side column direction is not a grain boundary, it is considered that this point and the adjacent point in the opposite direction of the side column direction belong to the same grain, and the standard peak angle difference sequence D of this point _S,i is taken to be the same as the standard peak angle difference sequence of adjacent points in the opposite direction to the side column direction;

Step 3: Use the method defined in step 3 of the technical plan to judge whether the adjacent points in the forward direction and side column direction of the point belong to the same grain as the point; Set as a grain boundary;

Step 4: According to the scanning direction determined in step 1, calculate the next point, repeat step 2 and step 3, until the traversal of all points in the scanning Laue diffraction experiment area is completed.

The radial traversal method described in step 4 of the technical solution includes the following specific steps:

Step 1: Randomly select a point from the unjudged points in the entire experimental area of the scanning Laue diffraction experiment as an index point, and calculate the standard peak angle difference sequence D _S,i of this point;

Step 2: For each point on the grain boundary, if the adjacent points are not all grain boundaries, define this point as an expandable point, and then use the method defined in step 2 and step 3 in the technical requirements to judge the point Whether the point of the non-grain boundary and the point adjacent to it belong to the same grain. If they belong to the same grain, record the adjacent point as a point in this grain, and the standard peak angle difference sequence D S,i of the adjacent point is the same as the standard peak angle difference sequence D _{S ,i} of the extensible point The same; if not, set the adjacent point as a grain boundary. Repeat the above operations of defining an expandable point and judging whether it is a grain until there is no expandable point on the boundary of the grain;

Step 3: Repeat steps 1 and 2 until the traversal of all points in the scanning Laue diffraction experiment area is completed.

Compared with the prior art, the present invention has the following advantages:

The method of the present invention can quickly obtain the visual analysis of the scanning Laue diffraction experimental data, and the calculation amount of the processing process is small; compared with the existing method for processing the scanning Laue diffraction, the entire data processing process takes less time and consumes less time. The computer resources are few, so that the cluster calculation that originally needs to be performed on the cluster computer can be completed by ordinary calculation on the personal computer.

Description of drawings

Fig. 1 is the flowchart of the method of the present invention.

Fig. 2 is the included angle between the [0 0 1] direction and the normal direction of the sample surface of the samples of the examples.

Fig. 3 is the calibration of the diffraction pattern corresponding to point A on the experimental area and its upper peak in the embodiment.

Fig. 4 is the calibration of the diffraction pattern corresponding to point B on the experimental area and its upper peak in the embodiment.

Fig. 5 is the calibration of the diffraction pattern corresponding to point C on the experimental region and its upper peak in the embodiment.

Fig. 6 is the grain boundary distribution result obtained by the present invention in the embodiment.

Specific implementation method

In order to make the above-mentioned purpose, features and advantages of the present invention more obvious and easy to understand, the specific implementation method of the present invention will be described in detail below in conjunction with the example sample shown in FIG. 2 .

The example sample shown in Fig. 2 is 304 stainless steel. In Fig. 2, the crystal orientation information of each point in the sample can be seen, and the distribution of grain boundaries can be clearly seen.

As shown in Figure 1, the scanning Laue diffraction pattern analysis method based on the angle between peaks in this embodiment includes the following steps:

Step 1: Using a known method, perform a peak-finding operation on all the Laue diffraction patterns obtained from the scanning Laue diffraction experiment, and obtain the positions and integral intensities of all diffraction peaks on each Laue diffraction pattern.

Step 2: Calculate the standard peak angle difference sequence D _S,i of all the calibrated diffraction peaks on the Laue diffraction pattern of the indexed point, including the following specific operation steps:

1) Perform indexing calculation on the Laue diffraction pattern corresponding to the indexing point by a known method, and obtain the positions, integral intensities and crystal plane Muller indices of all calibrated diffraction peaks. Take appropriate calculations including peak number n=6, according to the integrated intensity of the peaks, calculate the direction vector k _S,i of the six calibrated diffraction peaks in the detector coordinate system with the highest integrated intensity among all the calibrated diffraction peaks (1≤ i≤6).

The calculation method of k _S,i is: read the space rotation angle α (pitch), β (roll) and γ (yaw) of the detector. Have

After obtaining the matrix A, read the distance d from the irradiation point on the sample to the detector plane, and use the formula to get

2) For the direction vector k _S,i , calculate the included angles between it and other direction vectors, and obtain the standard angle difference sequence D _S,i (1≤i≤6) composed of 5 included angles. Have

Step 3: Define the method for judging whether two points in the scanning Laue diffraction experiment area are the same grain, including the following specific steps:

1) Define the point where the standard angle difference sequence D _S,i is known as the comparison origin, and the point where the standard angle difference sequence D _S,i is unknown is the compared point.

2) Take the number of peaks included in the extension Δn=4, and calculate the direction vector k _i of the ten strongest diffraction peaks among all the diffraction peaks in the Laue diffraction pattern of the compared point in the detector coordinate system according to the integrated intensity of the diffraction peaks (1≤i≤10). Its calculation method is the same as that described in Step 2.

3) For the direction vector k _i , calculate the included angles between it and other direction vectors, and obtain a comparison angle difference sequence D _i (1≤i≤9) composed of 9 included angles. Have

4) Determine whether there is a comparison angle difference sequence D _i of the compared point corresponding to each standard angle difference sequence D _S,i of the comparison origin. The specific method is as follows:

a) Define the component in the comparison angle difference sequence D _i of the compared point as δ _i,j . Compare it with the component δ _S,i,j in the standard angle difference sequence D _S,i of the comparison origin. like

It is considered that δ _i,j is equal to δ _S,i,j .

b) Assume that the number of equal components in D _i and D _S,i is m _i , if satisfy

m _i ≥ 0.8·n

It is considered that D _i corresponds to D _S,i , and its corresponding peaks also correspond.

5) Assuming that the total number of D _i and D _S,i corresponding to the comparison origin and the compared point is s, if it satisfies

s≥0.9·n

It is considered that the comparison origin and the compared point belong to the same grain. The crystal plane Miller index of the calibrated diffraction peak in the comparison origin is assigned to the corresponding diffraction peak in the compared point, and the crystal plane Miller index is also defined as the calibrated diffraction peak.

Step 4: For this embodiment, if the scanning traversal method is selected, all points in the scanning area of the scanning Laue diffraction experiment are traversed. Before the traversal begins, the boundaries of the entire experimental region are set as grain boundaries.

1) Define the scan to proceed from bottom to top and from left to right. That is, from bottom to top is the forward direction, and from left to right is the side row direction. The traversal process starts from the lower left corner of the area (point A). The Laue diffraction pattern and the calibrated diffraction peaks at point A are shown in Figure 3.

2) Starting from the lower left corner, there are grain boundaries below and to the left. This point is the index point, and the standard peak angle difference sequence D _S,i of this point is calculated. Use the method defined in step 3 to judge that it is the same crystal grain as the point on its right side (point B). The Laue diffraction pattern of point B and the calibrated diffraction peak are shown in Figure 4, but with the point above (point C) It is not the same crystal grain, the Laue diffraction pattern of point C and the calibrated diffraction peak are shown in Figure 5. This point is set as a grain boundary, and the standard peak angle difference sequence D _S,i of the point on the right is the same as it.

3) Complete the traversal of all points in the experimental area with the operation method described in 2) and in the order of 1).

For this embodiment, if the scanning traversal method is selected, all points in the scanning area of the scanning Laue diffraction experiment are traversed. Before the traversal begins, the boundaries of the entire experimental region are set as grain boundaries.

1) Randomly select a point from the unjudged points in the area as the indexing point. Here, point F in the region is selected as the indexing point. Calculate the standard peak angle difference sequence D _S,i of this point.

2) The first point of this grain itself is a point on the boundary of this grain, and it is not a grain boundary. Use the method defined in step 2 and step 3 to judge whether its four adjacent points belong to the same grain. It is found that the adjacent points in the three directions of left, right, and bottom are the same grain as it. Then the standard peak angle difference sequence D _S,i of these three points is the same as this point, which is a point in this grain. Then these three adjacent points are taken as the boundary of the grain, and point F is set as the grain boundary. Then compare the adjacent undetermined points of the present grain boundary point with whether they are the same grain, so as to expand the grain until the grain boundaries are all grain boundaries.

3) Taking the operations described in 1) and 2) as an example, it is repeated until the traversal of all points in the scanning Laue diffraction experiment area is completed.

Use the grain boundary distribution of the region shown in Figure 2 that the inventive method obtains as shown in Figure 6, as can be seen from the figure, use the grain boundary distribution that this method obtains to correspond to the crystal orientation distribution shown in Figure 2, It shows that the result obtained by this method is correct. For the 2550 Laue diffraction patterns in the region, only 108 of them are indexed, accounting for 4.23%, and the amount of calculation is much smaller than the existing methods.

To sum up, the present invention can automatically process the scanning Laue diffraction pattern, reducing the time required for analysis and calculation of the scanning Laue diffraction pattern. It is a simple and feasible method.

So far, the principle and implementation of the angle comparison analysis method of the crystal scanning Laue diffraction pattern of the present invention have been described by using specific examples. The description of the above examples is only used to help understand the method and core idea of the present invention; At the same time, for ordinary technical operators in the field, when using the present invention, there are changes in the specific use method and scope according to the idea of the present invention. Therefore, the description of the present invention should not be interpreted as limiting the application mode and scope of the present invention, and the protection scope of the present invention should be determined by the claims.

Claims (5)

1. a scanning type Laue diffraction pattern analysis method based on peak-to-peak angle comparison, is characterized in that: comprise the steps: Step 1: Perform a peak-finding operation on all the Laue diffraction patterns obtained from the scanning Laue diffraction experiment to obtain the positions and integral intensities of all diffraction peaks on each Laue diffraction pattern; Step 2: Calculate the standard peak angle difference sequence D _S,i of all the calibrated diffraction peaks on the Laue diffraction pattern of the indexed point, including the following specific operation steps: 1) Perform index calculation on the Laue diffraction pattern corresponding to the index point, that is, calibrate the diffraction peak, and obtain the position, integral intensity and crystal plane Miller index of all the calibrated diffraction peaks; take the appropriate calculation including the number of peaks n, according to For the integrated intensity of the peak, calculate the direction vector k _S,i of the n calibrated diffraction peaks with the highest integrated intensity among all the calibrated diffraction peaks in the detector coordinate system, 1≤i≤n; 2) For the direction vector k _S,i , calculate the angle between it and other direction vectors, and obtain the standard peak angle difference sequence D _S,i composed of (n-1) angles, 1≤i≤n;

Step 3: Determine whether the two points in the scanning Laue diffraction experiment area are the same grain, including the following specific steps: 1) Define the standard peak angle difference sequence D _{S, the known point of i} is the comparison origin, the standard peak angle difference sequence D _{S, the unknown point of i} is the compared point; 2) Take the appropriate extension to include the number of peaks Δn, and the appropriate extension to include the number of peaks Δn to take a quarter of n, and calculate the strongest of all diffraction peaks in the Laue diffraction pattern of the compared point according to the integrated intensity of the diffraction peaks The direction vector k _i of (n+Δn) diffraction peaks in the detector coordinate system, 1≤i≤n+Δn; 3) For the direction vector k _i , calculate the angle between it and other direction vectors, and obtain the comparison angle difference sequence D _i composed of (n+Δn-1) angles, 1≤i≤n+Δn;

4) Determine whether there is a comparison angle difference sequence D _i of the compared point corresponding to each standard peak angle difference sequence D _S,i of the comparison origin; the specific method is as follows: a) Define the component in the comparison angle difference sequence D _i of the compared point as δ _i,j , and compare it with the component δ _S,i,j in the standard peak angle difference sequence D _S,i of the comparison origin ;like

Think that δ _i,j is equal to δ _S,i,j ; b) Assume that the number of equal components in D _i and D _S,i is m _i , if satisfy m _i ≥ T ₂ ·n It is considered that D _i corresponds to D _S,i , and its corresponding peaks also correspond; 5) Assuming that the total number of D _i and D _S,i corresponding to the comparison origin and the compared point is s, if it satisfies s≥T ₃ ·n It is considered that the comparison origin and the compared point belong to the same grain; and the crystal plane Miller index of the calibrated diffraction peak in the comparison origin is assigned to the corresponding diffraction peak in the compared point, and the diffraction peak that is assigned the crystal plane Miller index The peak is also defined as the calibrated diffraction peak; if it is not satisfied, the comparison origin and the comparison point do not belong to the same grain; Step 4: Choose one of the scanning traversal method and the radial traversal method as the traversal method for all points in the scanning area of the scanning Laue diffraction experiment; set the boundary of the entire area as a grain boundary before starting the traversal; and then according to The selected traversal method completes the traversal of all points in the scanning Laue diffraction experiment area, and obtains the crystal plane Miller indices of all calibrated diffraction peaks corresponding to these points on the diffraction pattern. 2. according to a kind of scanning type Laue diffraction pattern analysis method based on peak-to-peak angle comparison described in claim 1, it is characterized in that: the scanning type traversal method described in step 4 comprises following specific steps: Step 1: Scan and traverse the entire experimental area of the scanning Laue diffraction experiment by column; define the scanning direction of the ongoing column as the forward direction, and the direction of changing columns to the next column as the side column direction; the traversal process starts from a certain area of the area corner start; Step 2: After the traversal starts and proceeds to a certain point in the area, judge whether the adjacent point in the opposite direction to the forward direction of the point and the opposite direction to the side row direction is set as a grain boundary, and then distinguish the following situations and perform different operations: 1) If the adjacent points in the opposite direction of the forward direction and the opposite direction of the side column direction are all grain boundaries, this point is considered as an index point, and the standard peak angle difference sequence D _S,i of this point is calculated; 2) If the adjacent point in the opposite direction of the forward direction is a grain boundary, and the adjacent point in the opposite direction of the side column is not a grain boundary, it is considered that this point and the adjacent point in the opposite direction of the forward direction belong to the same grain, and the standard of this point The peak angle difference sequence D _S,i is also the same as the standard peak angle difference sequence D _S,i of the adjacent point in the opposite direction of the forward direction; 3) If the adjacent point in the opposite direction of the forward direction is not a grain boundary, and the adjacent point in the opposite direction of the side row direction is a grain boundary, it is considered that this point and the adjacent point in the opposite direction of the side row direction belong to the same grain, and the point’s The standard peak angle difference sequence D _S,i is also the same as the standard peak angle difference sequence D _S,i of the adjacent point in the opposite direction to the side column direction; 4) If the adjacent point in the opposite direction of the forward direction and the opposite direction of the side column direction is not a grain boundary, it is considered that this point and the adjacent point in the opposite direction of the side column direction belong to the same grain, and the standard peak angle difference sequence D of this point _S,i is the same as the standard peak angle difference sequence D _S,i of the adjacent point in the opposite direction to the side column direction; Step 3: Use the method in step 3 to judge whether the adjacent points in the forward direction and side column direction of the point belong to the same grain as the point; if there is a point that is not the same grain as it, then set the point as a grain boundary ; Step 4: According to the scanning direction determined in step 1, calculate the next point, repeat step 2 and step 3, until the traversal of all points in the scanning Laue diffraction experiment area is completed. 3. according to a kind of scanning type Laue diffraction pattern analysis method based on peak-to-peak angle ratio described in claim 1, it is characterized in that: the radial traversal method described in step 4 comprises following specific steps: Step 1: Randomly select a point from the unjudged points in the area as an index point, and calculate the standard peak angle difference sequence D _S,i of this point; Step 2: For each point on the grain boundary, if the adjacent points are not all grain boundaries, define this point as an extensible point, and then use the method in step 3 to judge the point and its adjacent non- Whether the point of the grain boundary belongs to the same grain; if it belongs to the same grain, record the adjacent point as the point in this grain, and the standard peak angle difference sequence D _S,i of the adjacent point is the same as the extensible point The standard peak angle difference sequence D _{S,i of} is the same; If it does not belong, set the adjacent point as a grain boundary; repeat the above-mentioned operations of defining an extensible point and judging whether it is a grain boundary, until there is no extensible point on the grain boundary; Step 3: Repeat steps 1 and 2 until the traversal of all points in the scanning Laue diffraction experiment area is completed. 4. according to a kind of scanning type Laue diffraction pattern analysis method based on the angle ratio between peaks described in claim 1, it is characterized in that: described appropriate calculation comprises peak number n and gets the eighth of total diffraction peak number one. 5. according to a kind of scanning type Laue diffraction pattern analysis method based on the angle ratio between peaks described in claim 1, it is characterized in that: T ₁ is 0.05, T ₂ is 0.8; T ₃ is 0.9.

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