Disclosure of Invention
In view of the deficiencies in the prior art, it is an object of the present invention to address one or more of the problems in the prior art as set forth above. For example, one of the objectives of the present invention is to provide a reflection point optimization method in seismic reflection tomography, which optimizes continuous reflection points conforming to geological structures through the guidance of the dip angle of underground structures.
In order to achieve the purpose, the invention provides a reflection point optimization method in seismic reflection tomography. The preferred method of reflection point comprises the steps of: forming a dip profile; picking points with residual moveout on the offset gathers; projecting the picked points with residual time difference onto the dip angle profile to obtain chromatographic reflection points; and sequentially selecting the chromatographic reflection point with the smallest inclination angle direction deviating from the last chromatographic reflection point along the inclination angle section direction as the preferred chromatographic reflection point.
According to the reflection point optimization method in seismic reflection tomography of the exemplary embodiment of the invention, the step of selecting the optimal tomography reflection point may include: and determining an included angle between a connecting line of the last chromatographic reflection point and the adjacent chromatographic reflection point to be optimized and a horizontal line along the section direction of the inclination angle, and selecting the chromatographic reflection point with the minimum included angle from a plurality of chromatographic reflection points adjacent to the last reflection point as the optimized chromatographic reflection point.
According to the preferred method for reflecting points in seismic reflection tomography, the distance between the last reflecting point and a plurality of tomography reflecting points adjacent to the last reflecting point can be not more than 100-200 m.
According to the reflection point optimization method in seismic reflection tomography, the dip profile is formed by acquiring the constructed dip of the subsurface reflection points.
According to the reflection point optimization method in seismic reflection tomography, a scanning method based on coherence, a scanning method based on complex seismic channel analysis or a method based on gradient structure tensor can be adopted to obtain the construction inclination angle of the underground reflection point.
In another aspect, the invention provides a method for modeling prestack depth migration velocity. The method for modeling the prestack depth migration velocity comprises the following steps: in the pre-stack depth migration velocity modeling process, reflection points are preferred using the reflection point preferred method in seismic reflection tomography as described above.
A method of pre-stack depth migration velocity modeling in accordance with an exemplary embodiment of the present invention may include the steps of: (A1) carrying out prestack depth migration on the prestack depth migration speed model, and outputting a migration distance gather; (A2) judging whether the offset gather reaches a preset leveling degree or not; (A3) if the offset gather does not reach the preset leveling degree, the step of optimizing the chromatographic reflection point is carried out; (A4) performing reflection ray tracing on the preferred reflection point; (A5) establishing a reflection chromatography equation and solving; (A6) updating a pre-stack depth migration velocity model according to the solution of the chromatographic equation; (A7) and repeating the steps (A1) to (A6) until the offset gather reaches a preset leveling degree. Wherein the prestack depth migration initial velocity model may be established from the prestack time migration velocity model.
Compared with the prior art, the method can accurately and efficiently select the chromatographic reflection points, integrally control the distribution of the reflection points and enhance the distribution rationality of the chromatographic reflection points.
Detailed Description
Hereinafter, a preferred method of reflection points in seismic reflection tomography of the present invention will be described in detail with reference to the accompanying drawings and exemplary embodiments.
The invention provides a method for optimizing reflection points in seismic reflection chromatography, which optimizes continuous reflection points according with geological structures through underground structure inclination angles.
A preferred method of reflection points in seismic reflection tomography according to an exemplary embodiment of the present invention may include the steps of:
A. and acquiring the structural inclination angle of the underground reflection point through a correlation algorithm (such as an inclination angle scanning method) to form an inclination angle profile.
Wherein, the correlation algorithm may include a tilt angle scanning method, and the conventional tilt angle scanning method may include: a scanning method based on coherence, a scanning method based on complex seismic trace analysis or a method based on gradient structure tensor, preferably a scanning method based on coherence. The scanning method based on the complex seismic trace analysis and the method based on the gradient structure tensor are not widely applied due to the limitation of the scanning precision. The similarity-based scanning method is used and developed by most people with its high computational accuracy. The calculation method comprises the steps of performing dip angle scanning along two-dimensional seismic survey lines, abstracting a three-dimensional curved surface to two dimensions for dip angle estimation, and obtaining dip angle data which are in a strip shape and are not accurate enough; finn (1986) proposed the definition of the dip and azimuth angles in three dimensions and practiced in two dimensions; marfurt (1998, 2000) proposes a three-dimensional similarity-based dip scanning method, which, in agreement with the C2 algorithm in the coherent attribute, mentions the algorithms of Finn and Backus (1986) in a true three-dimensional sense; as the algorithm adopts a central scanning window, a smoothing effect exists on the structures at two sides of an analysis point during calculation, in order to improve the point, Marfurt (2006) provides a multi-window scanning mode, and the method can relatively accurately scan the change of the dip angle at two sides of a fault as a robust dip angle and azimuth angle estimation method.
B. Points with residual time difference (RMO) are picked on the offset gathers. Wherein the position information of the picked-up points with the residual time difference has an application in the following.
C. The picked-up points with residual moveout (also called picked-up points) are projected onto the tilt profile.
In this step, the picked points with residual moveout on the offset gathers are projected onto the dip profile to obtain tomographic reflection points.
D. And sequentially selecting the chromatographic reflection point with the smallest inclination angle direction deviating from the last chromatographic reflection point along the inclination angle section direction as the preferred chromatographic reflection point.
The picked points (tomographic reflection points) are screened along the direction of the dip profile. The selection of the adjacent point (i.e. the chromatographic reflection point) can be judged according to the inclination angle direction, specifically, the principle of selecting the selection points is that the inclination angle direction deviating from the last reflection point is the smallest, namely, the chromatographic reflection point deviating from the inclination angle direction of the last chromatographic reflection point is selected as the preferred chromatographic reflection point from the chromatographic reflection points adjacent to the last chromatographic reflection point to be preferred. Here, the selection of the adjacent reflection points may be determined according to the distance, for example, the points which are not more than 100-200 meters away from the previous horizon reflection point, but the invention is not limited thereto, and the adjacent horizon reflection points may be determined in other manners as required.
Wherein, the dip profile has a value at each position, that is, each tomographic reflection point on the dip profile has a structural dip value. The tilt direction refers to a direction along the value of the tilt of the position having the remaining time difference point, i.e. along the tilt, e.g. a tilt of 20 ° at a point, the tilt direction is a direction forming 20 ° from said point and the horizontal plane.
In this embodiment, the step of selecting the preferred tomographic reflection point comprises: and determining an included angle between a connecting line of the last chromatographic reflection point and the adjacent chromatographic reflection point to be optimized and a horizontal line along the section direction of the inclination angle, and selecting the chromatographic reflection point with the minimum included angle from a plurality of chromatographic reflection points adjacent to the last reflection point as the optimized chromatographic reflection point.
As shown in FIG. 1, point p is a selected tomographic reflection point, and is preferably selected from points a, b, c, d, and e adjacent to point p, wherein the structural inclination angle θ of point p is 30 °, and the included angle between point a and point p is 30 °ap(i.e., the angle between the line connecting point p and point a and the horizontal) is 51 DEG, and the angle between point b and point p is 51 DEGbpIs 38 DEG, and the angle between point c and point pcpIs 32 DEG, and the angle between the point d and the point p isdpIs 18 DEG, the angle between point e and point pepIs-23 deg. Wherein,cpthe difference from θ is minimal, so point c is the point chosen along the direction of the build slope, and the remaining points a, b, d and e are the rejected points.
It should be noted that, in the present invention, the preferred reflection point is obtained by selecting the angle with the closest angle to the structure inclination angle, and if two or more angles are the same and both angles are the closest angle to the structure inclination angle, then selecting the tomographic reflection point with the closest distance to the reflection point.
According to another aspect of the invention, a method for modeling prestack depth migration velocity is provided, and in the prestack depth migration velocity modeling process, a method for optimizing reflection points in seismic reflection tomography is adopted to determine appropriate reflection points.
In an exemplary embodiment, the prestack depth velocity migration modeling method according to the present invention may include the steps of:
(A1) and carrying out prestack depth migration on the prestack depth migration speed model, and outputting a migration distance gather.
(A2) And judging whether the offset gather reaches a preset leveling degree.
(A3) And if the offset gather does not reach the preset leveling degree, adopting the method for optimizing the reflection point in the seismic reflection tomography to optimize the reflection point, and determining a reasonable reflection point.
(A4) And performing reflection ray tracing on the preferred reflection point. Specifically, a preferred reflection point is used as a ray tracing point, the previous round of prestack time migration velocity model is used as a ray tracing model, and reflection ray tracing is carried out; the first round of prestack time migration velocity model is a ground prestack depth migration initial velocity model established according to the prestack time migration velocity model.
(A5) And establishing a reflection chromatography equation and solving.
(A6) And updating the prestack depth migration velocity model according to the solution of the chromatographic equation.
(A7) And repeating the steps (A1) to (A6) until the offset gather reaches a preset leveling degree. The preset leveling degree may be a reasonable leveling degree value determined according to actual needs, for example, leveling all offset gathers.
In conclusion, according to the reflection point optimization method in seismic reflection tomography, the distribution of the reflection points is controlled integrally by constructing dip angle optimization tomography reflection points, the distribution rationality of the tomography reflection points is enhanced, and a better application effect is obtained in prestack depth migration modeling.
Although the present invention has been described above in connection with exemplary embodiments, it will be apparent to those skilled in the art that various modifications and changes may be made to the exemplary embodiments of the present invention without departing from the spirit and scope of the invention as defined in the appended claims.