CN107390077B - Test method, test device and computer readable storage medium - Google Patents
Test method, test device and computer readable storage medium Download PDFInfo
- Publication number
- CN107390077B CN107390077B CN201710646331.6A CN201710646331A CN107390077B CN 107390077 B CN107390077 B CN 107390077B CN 201710646331 A CN201710646331 A CN 201710646331A CN 107390077 B CN107390077 B CN 107390077B
- Authority
- CN
- China
- Prior art keywords
- current value
- delay time
- power device
- test
- leakage current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a test method, which comprises the following steps: acquiring a first preset delay time, and setting the delay time of the delayer according to the first preset delay time; when the setting of the delayer is finished, acquiring a preset test voltage, and controlling an output signal of the power supply according to the preset test voltage; when the ammeter is detected to receive the electric signal transmitted by the delayer, acquiring a current value of the ammeter, and taking the current value as a leakage current value corresponding to the preset delay time; and judging whether the leakage current value meets a preset condition or not. The invention also discloses a testing device and a computer readable storage medium. The invention realizes the acquisition of the leakage current value of the power device at a specific moment, the specific moment can be obtained by setting the delay time of the delayer, the test of the power device is further realized by judging the leakage current value, and the accuracy and the efficiency of the test of the device are improved.
Description
Technical Field
The present invention relates to the field of testing technologies, and in particular, to a testing method and apparatus, and a computer-readable storage medium.
Background
The leakage current has an important influence on the electromagnetic compatibility of the power device, circuit applications, and the like. When measuring the leakage current between the collector and the emitter of the power device, the conventional test method is to set the voltage between the collector and the emitter to a rated voltage under the conditions of short circuit between the gate and the emitter and turn off of the device, then read out the leakage current through an ammeter or a current probe, and then turn off the power supply. The method assumes that the generation of the leakage current is a static process, the time interval from the voltage application to the reading of the numerical value is generally more than one second, and the traditional test means of strict control is not carried out, only the numerical value after the leakage current is basically stable is read, and the same leakage current range is adopted for comparison; in practice, the value of the leakage current of the power device is dynamically changed, i.e. the value of the leakage current may be different at different times.
Therefore, in the existing leakage current testing process of a large number of power devices, because the stability duration required by the leakage currents of different power devices is different, the time points for reading the leakage current values are not uniform, and the accuracy of the power device testing is low.
Disclosure of Invention
The invention mainly aims to provide a testing method, a testing device and a computer readable storage medium, and aims to solve the technical problem that the existing power device is low in testing accuracy.
In order to achieve the above object, the present invention provides a test method, comprising the steps of:
acquiring a first preset delay time, and setting the delay time of the delayer according to the first preset delay time;
when the setting of the delayer is finished, acquiring a preset test voltage, and controlling an output signal of the power supply according to the preset test voltage;
when the ammeter is detected to receive the electric signal transmitted by the delayer, acquiring a current value of the ammeter, and taking the current value as a leakage current value corresponding to the preset delay time;
and judging whether the leakage current value meets a preset condition, wherein when the leakage current value meets the preset condition, the leakage current test of the power device is judged to pass.
In an embodiment, the step of determining whether the leakage current value satisfies a preset condition includes:
acquiring a preset current range of the leakage current value;
and judging whether the leakage current value is within the preset current range, and if the leakage current value is within the preset current range, determining that the leakage current value meets the preset condition.
In an embodiment, after the step of determining whether the leakage current value satisfies the preset condition, the test method further includes:
when the leakage current value meets the preset condition, acquiring a second delay time of the power device, wherein the second delay time comprises a plurality of delay time periods;
sequentially obtaining delay time periods in the second delay time period, setting the delay time of the delayer according to the obtained delay time periods, and obtaining the current value of the current meter when the setting of the delayer is completed and the current meter detects that the current meter receives the electric signal transmitted by the delayer;
and taking the maximum current value in the acquired current values as a standard leakage current value, and taking a delay time period corresponding to the maximum current value in the current values as a standard delay time length.
In an embodiment, after the step of obtaining the current value of the ammeter when the setting of the delayer is completed and it is detected that the ammeter receives the electric signal transmitted by the delayer, the test method further includes:
drawing a current curve according to the obtained delay time period corresponding to each current value and each obtained current value;
and taking the current curve as a standard current curve.
In an embodiment, after the step of drawing a current curve according to the delay time period corresponding to each obtained current value and each obtained current value, the test method further includes:
determining a coordinate point with the maximum current value in the current curve;
and taking the current value corresponding to the coordinate point as a standard leakage current value, and taking the delay time period corresponding to the coordinate point as standard delay time.
In an embodiment, before the step of obtaining a first preset delay time and setting the delay time of the delayer according to the first preset delay time, the test method further includes:
acquiring test requirement information;
and when the test requirement information is a test of a leakage current value between a collector and an emitter of the power device, controlling the positive electrode of the power supply to be connected to the collector of the power device and the negative electrode of the power supply to be connected to the emitter of the power device, and controlling the grid and the emitter of the power device to be in short circuit.
In an embodiment, after the step of obtaining the test requirement information, the test method further includes:
and when the test requirement information is used for testing the leakage current value between the grid electrode and the emitter electrode of the power device, controlling the positive electrode of the power supply to be connected to the grid electrode of the power device, controlling the negative electrode of the power supply to be connected to the emitter electrode of the power device, and controlling the emitter electrode and the collector electrode of the power device to be in short circuit.
In addition, in order to achieve the above object, the present invention further provides a testing apparatus, which is applied to a power device testing system, wherein the power device testing system comprises a power device, a power supply, an ammeter and a delayer; two ends of the power device are respectively and electrically connected with the power supply and the ammeter; the power supply is electrically connected with the ammeter; two ends of the delayer are respectively and electrically connected with the power supply and the ammeter;
the test device includes: the device comprises a memory, a processor and a test program which is stored on the memory and can run on the processor, wherein the test program realizes the steps of any one of the test methods when being executed by the processor.
In addition, to achieve the above object, the present invention further provides a computer readable storage medium, having a test program stored thereon, where the test program, when executed by a processor, implements the steps of the test method according to any one of the above.
The invention sets the delay time of the delayer according to the first preset delay time by obtaining the first preset delay time, then obtains the preset test voltage when the delayer is set, controls the output signal of the power supply according to the preset test voltage, then obtains the current value of the current meter when the current meter is detected to receive the electric signal transmitted by the delayer, takes the current value as the leakage current value corresponding to the preset delay time, and then judges whether the leakage current value meets the preset condition, wherein, when the leakage current value meets the preset condition, the leakage current test of the power device is judged to be passed, thereby realizing the acquisition of the leakage current value of the power device at the specific time, and the specific time can be obtained by setting the delay time of the delayer, further realizing the test of the power device by judging the leakage current value, the accuracy rate of device testing and the efficiency of testing are improved.
Drawings
Fig. 1 is a schematic structural diagram of a terminal to which a test apparatus belongs in a hardware operating environment according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a first embodiment of the testing method of the present invention;
FIG. 3 is a schematic circuit diagram of a power device testing system according to the testing method of the present invention;
FIG. 4 is a detailed flowchart of the step of determining whether the leakage current value satisfies the predetermined condition according to the first embodiment of the testing method of the present invention;
FIG. 5 is a schematic flow chart of a testing method according to a third embodiment of the present invention;
FIG. 6 is a schematic flow chart of a testing method according to a fourth embodiment of the present invention;
FIG. 7 is a schematic flow chart of a fifth embodiment of the testing method of the present invention;
FIG. 8 is a schematic flow chart of a testing method according to a sixth embodiment of the present invention;
FIG. 9 is a flowchart illustrating a testing method according to a seventh embodiment of the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1, fig. 1 is a schematic structural diagram of a terminal belonging to a test apparatus in a hardware operating environment according to an embodiment of the present invention.
The terminal of the embodiment of the invention can be a PC, and can also be a mobile terminal device with a display function, such as a smart phone, a tablet computer, an electronic book reader, an MP3(Moving Picture Experts Group Audio Layer III, dynamic video Experts compress standard Audio Layer 3) player, an MP4(Moving Picture Experts Group Audio Layer IV, dynamic video Experts compress standard Audio Layer 4) player, a portable computer, and the like.
As shown in fig. 1, the terminal may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, a communication bus 1002. Wherein a communication bus 1002 is used to enable connective communication between these components. The user interface 1003 may include a Display screen (Display), an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface). The memory 1005 may be a high-speed RAM memory or a non-volatile memory (e.g., a magnetic disk memory). The memory 1005 may alternatively be a storage device separate from the processor 1001.
Optionally, the terminal may further include a camera, a Radio Frequency (RF) circuit, a sensor, an audio circuit, a WiFi module, and the like. Such as light sensors, motion sensors, and other sensors. Specifically, the light sensor may include an ambient light sensor that may adjust the brightness of the display screen according to the brightness of ambient light, and a proximity sensor that may turn off the display screen and/or the backlight when the mobile terminal is moved to the ear. As one of the motion sensors, the gravity acceleration sensor can detect the magnitude of acceleration in each direction (generally, three axes), detect the magnitude and direction of gravity when the mobile terminal is stationary, and can be used for applications (such as horizontal and vertical screen switching, related games, magnetometer attitude calibration), vibration recognition related functions (such as pedometer and tapping) and the like for recognizing the attitude of the mobile terminal; of course, the mobile terminal may also be configured with other sensors such as a gyroscope, a barometer, a hygrometer, a thermometer, and an infrared sensor, which are not described herein again.
Those skilled in the art will appreciate that the terminal structure shown in fig. 1 is not intended to be limiting and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components.
As shown in fig. 1, a memory 1005, which is a kind of computer storage medium, may include therein an operating system, a network communication module, a user interface module, and a test program.
In the terminal shown in fig. 1, the network interface 1004 is mainly used for connecting to a backend server and performing data communication with the backend server; the user interface 1003 is mainly used for connecting a client (user side) and performing data communication with the client; and the processor 1001 may be used to invoke a test program stored in the memory 1005.
Based on the above terminal hardware structure, various embodiments of the present invention are proposed.
The invention provides a testing method, and referring to fig. 2, fig. 2 is a schematic flow chart of a first embodiment of the testing method of the invention.
In this embodiment, the test method is applied to a power device test system, where the power device test system includes a power device, a power supply, an ammeter, and a delayer; two ends of the power device are respectively and electrically connected with the power supply and the ammeter; the power supply is electrically connected with the ammeter; and two ends of the delayer are respectively and electrically connected with the power supply and the ammeter.
The test method comprises the following steps:
step S10, acquiring a first preset delay time, and setting the delay time of the delayer according to the first preset delay time;
in this embodiment, the first preset delay time is a preset delay time, and before testing the power device, the delay time of the delayer needs to be set; specifically, a first preset delay time is obtained, then the delay time of the delayer is set according to the first preset delay time, and the first preset delay time set by the delayer, namely the first preset delay time indicates that the delayer delays the received signal for the first preset delay time and then outputs the signal; for the actual working environment of the power device which is often a high-voltage working environment, the leakage current value of the power device can be dynamically tested by setting the delay time of the delayer, and the continuous high-voltage input to a power supply can be reduced; in addition, before the first delay time is obtained, test requirement information is required to be obtained, a specific test target can be determined to be a leakage current value between a collector and an emitter of the test power device or a leakage current value between a grid and the emitter of the test power device through the test requirement information, a test circuit is determined according to different test requirement information, then a first preset delay time is obtained, and a delayer in the test circuit is set according to the first preset delay time.
Step S20, when the setting of the delayer is finished, acquiring a preset test voltage, and controlling an output signal of the power supply according to the preset test voltage;
in this embodiment, the preset test voltage is a preset test required voltage, when the delay time setting of the delayer is completed, a voltage required for the test (i.e., the preset test voltage) is obtained, the output signal of the power supply is controlled according to the preset test voltage, and a corresponding current is generated in the test loop when the preset test voltage is applied to the two ends of the power device, where the current is a leakage current of the tested power device; specifically, due to the existence of leakage current of the power device, when the preset test voltage is applied to two ends of the power device in the test loop, the power device generates corresponding current in the test loop, and the current displays corresponding current value when detected by the ammeter; in addition, the output signal of the power supply is controlled according to the preset test voltage, and the output signal is output by delaying a first preset delay time when the delay unit receives the output signal.
Step S30, when detecting that the ammeter receives the electric signal transmitted by the delayer, obtaining the current value of the ammeter, and taking the current value as the leakage current value corresponding to the preset delay time;
in this embodiment, the value of the leakage current is dynamically changed, i.e. the value of the leakage current may be different at different times, the delay time of the delayer indicates that the delayer delays the first preset delay time when the received signal is delayed and then outputs the signal, wherein, the electric signal is an output signal which is output by delaying the first preset delay time length by the delayer, therefore, when the ammeter is detected to receive the electric signal, the current value of the ammeter is obtained, and the current value is the current in the current test loop when the time interval after the power device is electrified reaches the first preset delay time, namely, the current leakage of the power device at the current moment, therefore, the current value at a certain moment after the power device is powered on can be determined and obtained by setting the delay time of the delayer, and the current value is the current value corresponding to the delay time of the delayer.
Referring to fig. 3, fig. 3 includes a power device 1, a power supply 2, a delay 3 and an ammeter 4; in the circuit diagram, a power supply is connected with an ammeter through a delayer, the parts of the power supply, the delayer and the ammeter which are connected do not influence the current in the circuit, and a complete current loop is a power device, the power supply and the ammeter; when the delayer receives an output signal transmitted by the power supply through voltage control, the delayer delays a first preset delay time length to output the output signal, and the output signal delayed by the delayer by the first preset delay time length is an electric signal; when the ammeter is detected to receive the electric signal, the current value of the current ammeter is obtained, and the current value is the leakage current value of the power device to be detected.
And step S40, judging whether the leakage current value meets a preset condition, wherein when the leakage current value meets the preset condition, the leakage current test of the power device is judged to pass.
In this embodiment, the preset condition is a preset current range, and it is determined whether the leakage current value of the tested power device satisfies the preset condition, that is, whether the leakage current value is within the preset current range, and if the leakage current value of the tested power device is within the preset current range, it indicates that the leakage current value of the tested power device satisfies the preset condition, that is, the leakage current test of the power device passes; specifically, the leakage current value of the power device to be tested is within the preset current range, which means that the leakage current value of the power device to be tested is smaller than the upper limit of the preset current range (i.e. the maximum value of the preset current range), and if the leakage current value of the power device to be tested is smaller than the upper limit of the preset current range, it means that the power device meets the preset condition.
The testing method provided by this embodiment includes obtaining a first preset delay time, setting a delay time of the delayer according to the first preset delay time, obtaining a preset testing voltage when the delayer is set, controlling an output signal of the power supply according to the preset testing voltage, obtaining a current value of the current meter when the current meter is detected to receive an electrical signal transmitted by the delayer, taking the current value as a leakage current value corresponding to the preset delay time, and then judging whether the leakage current value meets a preset condition, wherein when the leakage current value meets the preset condition, it is determined that a leakage current test of the power device passes, so that a leakage current value of the power device is obtained at a specific time, and the specific time can be obtained by setting the delay time of the delayer, furthermore, the test of the power device is realized by judging the leakage current value, and the accuracy and the efficiency of the device test are improved.
Based on the first embodiment, a second embodiment of the testing method of the present invention is proposed, and referring to fig. 4, in this embodiment, step S40 includes:
step S41, acquiring a preset current range of the leakage current value;
in this embodiment, the preset current range is a range of leakage current allowed by the power device, and the leakage current value of the power device can be determined by obtaining the preset current range of the leakage current value; if the leakage current value of the test power device is within the preset current range, the leakage current value meets the preset condition, and the leakage current test of the power device passes, wherein the leakage current value is represented within the preset current range, the leakage current value is smaller than the upper limit of the preset current range (namely the maximum value of the preset current range), and the leakage current value is represented within the preset current range when the leakage current value is smaller than the upper limit of the preset current range.
Step S41, determining whether the leakage current value is within the preset current range, and if the leakage current value is within the preset current range, determining that the leakage current value satisfies the preset condition.
In this embodiment, by determining whether the tested leakage current value is within a preset current range, if the tested leakage current value is within the preset current range, it indicates that the current value meets a preset condition; for example, for a power device a, the preset current range of the power device is 6mA to 10mA, if the leakage current value of the power device is 7mA through testing, and the leakage current value of the power device is within the preset current range, it is determined that the leakage current value meets the preset condition, and the leakage current test of the power device passes; if the leakage current value of the power device is 5mA through the test, the leakage current value is also determined to meet the preset condition, and the leakage current test of the power device is passed; if the leakage current value of the power device is 11mA through the test, the leakage current value does not meet the preset condition, and the leakage current test of the power device fails.
According to the testing method provided by the embodiment, the preset current range of the leakage current value is obtained, whether the leakage current value is within the preset current range is judged, if the leakage current value is within the preset current range, the leakage current value is determined to meet the preset condition, the detection of the leakage current value of the tested power device is realized, the power device which fails in the leakage current value test is screened through the judgment of the leakage current value of the tested power device, and the use safety of the power device is improved.
Based on the first embodiment, a third embodiment of the testing method of the present invention is proposed, and referring to fig. 5, in this embodiment, after step S40, the testing method further includes:
step S50, when the leakage current value meets the preset condition, obtaining a second delay time of the power device, wherein the second delay time comprises a plurality of delay time periods;
in this embodiment, the second delay duration is a delay duration different from the first preset delay duration, the second delay duration includes a plurality of different delay periods, and the second delay duration may also include the first preset delay duration; when the leakage current value of the power device meets the preset condition, the leakage current test of the power device passes, and the obtained delay time period and the leakage current value of the power device passing the leakage current test can be used as the standard and the research object for the subsequent power device test judgment by obtaining the leakage current values of the power device passing the leakage current test corresponding to other multiple delay time periods.
Step S60, sequentially obtaining delay time periods in the second delay time period, setting the delay time of the delayer according to the obtained delay time periods, and obtaining the current value of the current ammeter when the setting of the delayer is completed and the ammeter is detected to receive the electric signal transmitted by the delayer;
in this embodiment, the delay time of the delayer is sequentially and respectively set according to each delay time period in the second delay time period, and when the setting of the delayer is completed, the power supply sends an output signal to the delayer; when the delayer receives an output signal sent by a power supply, the delayer delays the set delay time period to output the output signal, wherein the output signal output by the delayer in the delay time period is an electric signal; when the ammeter receives the electric signal, the current value detected by the ammeter is obtained, and the current value is the leakage current value corresponding to the delay time period.
Step S70, the maximum current value among the acquired current values is taken as a standard leakage current value, and the delay period corresponding to the maximum current value among the current values is taken as a standard delay duration.
In this embodiment, each current value corresponding to each delay time period is sequentially obtained, the maximum current value among the obtained current values is determined, the maximum current value is used as a standard leakage current value, and the delay time period corresponding to the maximum current value is used as a standard delay time length, wherein each current value is obtained by testing a power device; determining the maximum current value in the current values, selecting a delay time period corresponding to the maximum current value as the delay time length of the delayer when testing other power devices in the follow-up process, and determining that the leakage current test of the tested power device passes if the current value corresponding to the delay time length of other power devices in the follow-up process is smaller than the maximum current value of the power device; therefore, the maximum current value passing through the power device is used as the standard leakage current value, and the delay time period corresponding to the maximum current value is used as the standard delay time length, so that a certain judgment standard can be provided for the measurement of other subsequent power devices.
In the testing method provided by this embodiment, when the leakage current value meets the preset condition, a second delay duration of the power device is obtained, where the second delay duration includes a plurality of delay time periods, then the delay time periods in the second delay duration are sequentially obtained, the delay time of the delayer is set according to the obtained delay time periods, when the setting of the delayer is completed and the ammeter is detected to receive an electrical signal transmitted by the delayer, the current value of the ammeter is obtained, then the largest current value in the obtained current values is used as a standard leakage current value, and the delay time period corresponding to the largest current value in the obtained current values is used as a standard delay time period, so that the obtaining of the standard delay duration and the standard leakage current value is realized, and the standard delay duration and the standard leakage current value can be used as judgment conditions for subsequent large-batch testing of the power device, the test accuracy and the test efficiency of the power device are improved.
Based on the third embodiment, a fourth embodiment of the testing method of the present invention is proposed, and referring to fig. 6, in this embodiment, after step S60, the testing method further includes:
step S80, drawing a current curve according to the delay time period corresponding to each obtained current value and each obtained current value;
in this embodiment, when the delay time period and each current value corresponding to each current value are obtained, the delay time period is used as an abscissa and the current value is used as an ordinate, where the delay time period is each delay time period included in the second delay time period, the obtained current values and the delay time periods corresponding to the current values are used as parameters, and a current curve of the current value to the delay time period can be formed by fitting according to the parameters.
And step S90, taking the current curve as a standard current curve.
In this embodiment, the current value of the current curve is obtained by selecting a plurality of different delay time periods to set the delayer, and then testing the passing power device according to the selected plurality of different delay time periods, so as to obtain each current value corresponding to the passing power device; namely, each delay time period on the current curve and each current value corresponding to each delay time period are values obtained by testing the power device, so that the drawn current curve is set as a standard current curve, and the standard current curve can be used as a reference curve for selecting the delay time period of the power device to be tested subsequently.
According to the testing method provided by the embodiment, the current curve is drawn according to the delay time period corresponding to each obtained current value and each obtained current value, and then the current curve is used as the standard current curve, so that the standard current curve is obtained, the accuracy and the efficiency of testing power devices in a large scale in the subsequent process are further improved by obtaining the standard current curve, and in addition, the research on the generation process of the leakage current is facilitated according to the standard current curve.
A fifth embodiment of the testing method of the present invention is proposed based on the fourth embodiment, and referring to fig. 7, in the present embodiment, after step S90, the testing method further includes:
step S110, determining a coordinate point with the maximum current value in the current curve;
in this embodiment, a point of the current curve with the largest current value is selected, and a delay period corresponding to the largest current value is obtained, where the coordinate point is the largest current value and the delay period corresponding to the largest current value.
And step S120, taking the current value corresponding to the coordinate point as a standard leakage current value, and taking the delay time period corresponding to the coordinate point as a standard delay time length.
In this embodiment, the maximum current value and the delay time period corresponding to the maximum current value are both obtained by the standard current curve, and the standard current curve is obtained by testing a passing power device, so that the maximum current value can be set as a standard leakage current value, and the delay time period corresponding to the maximum current value is taken as a standard delay time; when testing the power device, selecting the delay time of the delayer, and selecting the standard delay time, for example, when testing the power device S, if the measured leakage current value of the power device corresponding to the standard delay time is smaller than the set standard leakage current value, determining that the power device passes the test, and the power device passes the leakage current test; if the measured leakage current value of the power device corresponding to the standard delay time length is larger than the set standard leakage current value, other delay time periods need to be selected according to a standard current curve, and whether the leakage current of the power device S meets the preset condition or not is judged by testing the leakage current value and the standard leakage current value of the power device S corresponding to the other delay time periods.
According to the testing method provided by the embodiment, the coordinate point with the maximum current value in the current curve is determined, then the current value corresponding to the coordinate point is used as the standard leakage current value, the delay time period corresponding to the coordinate point is used as the standard delay time, the standard delay time and the standard current value are obtained, the standard delay time and the standard leakage current value are used as the judgment conditions for the subsequent large-batch testing of the power device, and the testing accuracy and the testing efficiency of the power device are further improved.
Based on the above embodiments, a sixth embodiment of the testing method of the present invention is proposed, and referring to fig. 8, in this embodiment, before step S10, the testing method further includes:
step S130, obtaining test requirement information;
in this embodiment, the test requirement information is target information of a test, that is, the target of the test is a leakage current value between a collector and an emitter of the test power device, or a leakage current value between a gate and an emitter of the test power device; for the leakage current value between the collector and the emitter of the power device and the leakage current value between the gate and the emitter, the leakage current values are different, so that the target to be tested is to test the leakage current value between the collector and the emitter of the power device or the leakage current value between the gate and the emitter of the power device before testing the leakage current value of the power device; specifically, different leakage current values can be tested by different connections of the circuits, and the conversion of the circuits can be realized by a circuit conversion switch, such as a relay; for example, the leakage current value between the collector and the emitter of the test power device is set when the left key of the circuit transfer switch is pressed, and the leakage current value between the grid and the emitter of the test power device is set when the right key of the circuit transfer switch is pressed; and when the obtained test requirement information is the leakage current value between the grid electrode and the emitter electrode of the test power device, controlling the circuit transfer switch to be pressed down by a left key.
Step S140, when the test requirement information is to test a leakage current value between the collector and the emitter of the power device, controlling the positive electrode of the power supply to be connected to the collector of the power device, and the negative electrode of the power supply to be connected to the emitter of the power device, and controlling the gate and the emitter of the power device to be short-circuited.
In this embodiment, when the test requirement information is a value of leakage current between the collector and the emitter of the test power device, the gate of the test power device is short-circuited with the emitter, and the positive pole of the power supply is connected to the collector of the test power device, and the negative pole of the power supply is connected to the emitter of the test power device.
According to the testing method provided by the embodiment, through obtaining the testing requirement information, and then when the testing requirement information is used for testing the leakage current value between the collector and the emitter of the power device, the anode of the power supply is controlled to be connected to the collector of the power device, the cathode of the power supply is controlled to be connected to the emitter of the power device, and the grid and the emitter of the power device are controlled to be short-circuited, so that different circuits are selected according to different testing requirement information, further the testing of the leakage current value between the collector and the emitter of the power device is realized according to different connection modes of the circuits, and the testing accuracy is improved.
Based on the sixth embodiment, a seventh embodiment of the testing method of the present invention is proposed, and referring to fig. 9, in this embodiment, after step S130, the testing method further includes:
and step S150, when the test requirement information is to test a leakage current value between the grid electrode and the emitter electrode of the power device, controlling the positive electrode of the power supply to be connected to the grid electrode of the power device, and the negative electrode of the power supply to be connected to the emitter electrode of the power device, and controlling the emitter electrode and the collector electrode of the power device to be in short circuit.
In this embodiment, when the test requirement information is a value of leakage current between the gate and the emitter of the test power device, the emitter and the collector of the test power device need to be short-circuited, and the positive pole of the power supply is connected to the gate of the test power device, and the negative pole of the power supply is connected to the emitter of the test power device.
According to the testing method provided by the embodiment, when the testing requirement information is used for testing the leakage current value between the grid electrode and the emitter electrode of the power device, the anode of the power supply is controlled to be connected to the grid electrode of the power device, the cathode of the power supply is controlled to be connected to the emitter electrode of the power device, the emitter electrode and the collector electrode of the power device are controlled to be in short circuit, different circuits are selected according to different testing requirement information, the testing of the leakage current value between the grid electrode and the emitter electrode of the power device is further realized according to different connection modes of the circuits, and the testing accuracy is improved.
In addition, in order to achieve the above object, the present invention further provides a testing apparatus, which is applied to a power device testing system, wherein the power device testing system comprises a power device, a power supply, an ammeter and a delayer; two ends of the power device are respectively and electrically connected with the power supply and the ammeter; the power supply is electrically connected with the ammeter; two ends of the delayer are respectively and electrically connected with the power supply and the ammeter;
the test device includes: a memory, a processor, and a test program stored on the memory and executable on the processor, the test program when executed by the processor performing the following:
acquiring a first preset delay time, and setting the delay time of the delayer according to the first preset delay time;
when the setting of the delayer is finished, acquiring a preset test voltage, and controlling an output signal of the power supply according to the preset test voltage;
when the ammeter is detected to receive the electric signal transmitted by the delayer, acquiring a current value of the ammeter, and taking the current value as a leakage current value corresponding to the preset delay time;
and judging whether the leakage current value meets a preset condition, wherein when the leakage current value meets the preset condition, the leakage current test of the power device is judged to pass.
Further, the test program when executed by the processor further performs the following operations:
acquiring a preset current range of the leakage current value;
and judging whether the leakage current value is within the preset current range, and if the leakage current value is within the preset current range, determining that the leakage current value meets the preset condition.
Further, the test program when executed by the processor further performs the following operations:
when the leakage current value meets the preset condition, acquiring a second delay time of the power device, wherein the second delay time comprises a plurality of delay time periods;
sequentially obtaining delay time periods in the second delay time period, setting the delay time of the delayer according to the obtained delay time periods, and obtaining the current value of the current meter when the setting of the delayer is completed and the current meter detects that the current meter receives the electric signal transmitted by the delayer;
and taking the maximum current value in the acquired current values as a standard leakage current value, and taking a delay time period corresponding to the maximum current value in the current values as a standard delay time length.
Further, the test program when executed by the processor further performs the following operations:
drawing a current curve according to the obtained delay time period corresponding to each current value and each obtained current value;
and taking the current curve as a standard current curve.
Further, the test program when executed by the processor further performs the following operations:
determining a coordinate point with the maximum current value in the current curve;
and taking the current value corresponding to the coordinate point as a standard leakage current value, and taking the delay time period corresponding to the coordinate point as standard delay time.
Further, the test program when executed by the processor further performs the following operations:
acquiring test requirement information;
and when the test requirement information is a test of a leakage current value between a collector and an emitter of the power device, controlling the positive electrode of the power supply to be connected to the collector of the power device and the negative electrode of the power supply to be connected to the emitter of the power device, and controlling the grid and the emitter of the power device to be in short circuit.
Further, the test program when executed by the processor further performs the following operations:
and when the test requirement information is used for testing the leakage current value between the grid electrode and the emitter electrode of the power device, controlling the positive electrode of the power supply to be connected to the grid electrode of the power device, controlling the negative electrode of the power supply to be connected to the emitter electrode of the power device, and controlling the emitter electrode and the collector electrode of the power device to be in short circuit.
Furthermore, the present invention also provides a computer-readable storage medium having a test program stored thereon, which when executed by a processor, implements the following operations:
acquiring a first preset delay time, and setting the delay time of the delayer according to the first preset delay time;
when the setting of the delayer is finished, acquiring a preset test voltage, and controlling an output signal of the power supply according to the preset test voltage;
when the ammeter is detected to receive the electric signal transmitted by the delayer, acquiring a current value of the ammeter, and taking the current value as a leakage current value corresponding to the preset delay time;
and judging whether the leakage current value meets a preset condition, wherein when the leakage current value meets the preset condition, the leakage current test of the power device is judged to pass.
Further, the test program when executed by the processor further performs the following operations:
acquiring a preset current range of the leakage current value;
and judging whether the leakage current value is within the preset current range, and if the leakage current value is within the preset current range, determining that the leakage current value meets the preset condition.
Further, the test program when executed by the processor further performs the following operations:
when the leakage current value meets the preset condition, acquiring a second delay time of the power device, wherein the second delay time comprises a plurality of delay time periods;
sequentially obtaining delay time periods in the second delay time period, setting the delay time of the delayer according to the obtained delay time periods, and obtaining the current value of the current meter when the setting of the delayer is completed and the current meter detects that the current meter receives the electric signal transmitted by the delayer;
and taking the maximum current value in the acquired current values as a standard leakage current value, and taking a delay time period corresponding to the maximum current value in the current values as a standard delay time length.
Further, the test program when executed by the processor further performs the following operations:
drawing a current curve according to the obtained delay time period corresponding to each current value and each obtained current value;
and taking the current curve as a standard current curve.
Further, the test program when executed by the processor further performs the following operations:
determining a coordinate point with the maximum current value in the current curve;
and taking the current value corresponding to the coordinate point as a standard leakage current value, and taking the delay time period corresponding to the coordinate point as standard delay time.
Further, the test program when executed by the processor further performs the following operations:
acquiring test requirement information;
and when the test requirement information is a test of a leakage current value between a collector and an emitter of the power device, controlling the positive electrode of the power supply to be connected to the collector of the power device and the negative electrode of the power supply to be connected to the emitter of the power device, and controlling the grid and the emitter of the power device to be in short circuit.
Further, the test program when executed by the processor further performs the following operations:
and when the test requirement information is used for testing the leakage current value between the grid electrode and the emitter electrode of the power device, controlling the positive electrode of the power supply to be connected to the grid electrode of the power device, controlling the negative electrode of the power supply to be connected to the emitter electrode of the power device, and controlling the emitter electrode and the collector electrode of the power device to be in short circuit.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) as described above and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present invention.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (8)
1. A test method is applied to a power device test system and is characterized in that the power device test system comprises a power device, a power supply, an ammeter and a delayer; two ends of the power device are respectively and electrically connected with the power supply and the ammeter; the power supply is electrically connected with the ammeter; two ends of the delayer are respectively and electrically connected with the power supply and the ammeter; the test method comprises the following steps:
acquiring a first preset delay time, and setting the delay time of the delayer according to the first preset delay time;
when the setting of the delayer is finished, acquiring a preset test voltage, and controlling an output signal of the power supply according to the preset test voltage;
when the ammeter is detected to receive the electric signal transmitted by the delayer, acquiring a current value of the ammeter, and taking the current value as a leakage current value corresponding to the preset delay time;
judging whether the leakage current value meets a preset condition or not, and acquiring a second delay time of the power device when the leakage current value meets the preset condition, wherein the second delay time comprises a plurality of delay time periods; sequentially obtaining delay time periods in the second delay time period, setting the delay time of the delayer according to the obtained delay time periods, and obtaining the current value of the current meter when the setting of the delayer is completed and the current meter detects that the current meter receives the electric signal transmitted by the delayer; drawing a current curve according to the obtained delay time period corresponding to each current value and each obtained current value; taking the current curve as a standard current curve;
and when the leakage current value meets the preset condition, judging that the leakage current test of the power device passes.
2. The method as claimed in claim 1, wherein the step of determining whether the leakage current value satisfies a predetermined condition comprises:
acquiring a preset current range of the leakage current value;
and judging whether the leakage current value is within the preset current range, and if the leakage current value is within the preset current range, determining that the leakage current value meets the preset condition.
3. The testing method of claim 1, wherein after the step of determining whether the leakage current value satisfies a predetermined condition, the testing method further comprises:
and taking the maximum current value in the acquired current values as a standard leakage current value, and taking a delay time period corresponding to the maximum current value in the current values as a standard delay time length.
4. The testing method according to claim 3, wherein after the step of drawing a current curve according to the delay time period corresponding to each obtained current value and each obtained current value, the testing method further comprises:
determining a coordinate point with the maximum current value in the current curve;
and taking the current value corresponding to the coordinate point as a standard leakage current value, and taking the delay time period corresponding to the coordinate point as standard delay time.
5. The testing method according to any one of claims 1 to 4, wherein before the step of obtaining a first preset delay time and setting the delay time of the delayer according to the first preset delay time, the testing method further comprises:
acquiring test requirement information;
and when the test requirement information is a test of a leakage current value between a collector and an emitter of the power device, controlling the positive electrode of the power supply to be connected to the collector of the power device and the negative electrode of the power supply to be connected to the emitter of the power device, and controlling the grid and the emitter of the power device to be in short circuit.
6. The testing method of claim 5, wherein after the step of obtaining the testing requirement information, the testing method further comprises:
and when the test requirement information is used for testing the leakage current value between the grid electrode and the emitter electrode of the power device, controlling the positive electrode of the power supply to be connected to the grid electrode of the power device, controlling the negative electrode of the power supply to be connected to the emitter electrode of the power device, and controlling the emitter electrode and the collector electrode of the power device to be in short circuit.
7. A testing device is applied to a power device testing system and is characterized in that the power device testing system comprises a power device, a power supply, an ammeter and a delayer; two ends of the power device are respectively and electrically connected with the power supply and the ammeter; the power supply is electrically connected with the ammeter; two ends of the delayer are respectively and electrically connected with the power supply and the ammeter;
the test device includes: memory, a processor and a test program stored on the memory and executable on the processor, the test program, when executed by the processor, implementing the steps of the test method according to any one of claims 1 to 6.
8. A computer-readable storage medium, characterized in that the computer-readable storage medium has stored thereon a test program which, when executed by a processor, implements the steps of the test method according to any one of claims 1 to 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710646331.6A CN107390077B (en) | 2017-07-31 | 2017-07-31 | Test method, test device and computer readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710646331.6A CN107390077B (en) | 2017-07-31 | 2017-07-31 | Test method, test device and computer readable storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107390077A CN107390077A (en) | 2017-11-24 |
| CN107390077B true CN107390077B (en) | 2020-04-17 |
Family
ID=60344273
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710646331.6A Active CN107390077B (en) | 2017-07-31 | 2017-07-31 | Test method, test device and computer readable storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107390077B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110825064B (en) * | 2018-08-09 | 2021-02-09 | 广州汽车集团股份有限公司 | Testing method and device for pure electric vehicle anti-theft system and storage medium |
| CN111693847B (en) * | 2020-05-18 | 2022-08-12 | 大唐微电子技术有限公司 | Chip testing method and device |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7960998B2 (en) * | 2008-02-15 | 2011-06-14 | National Semiconductor Corporation | Electrical test structure and method for characterization of deep trench sidewall reliability |
| CN101545945B (en) * | 2008-03-25 | 2011-08-03 | 中芯国际集成电路制造(上海)有限公司 | Method for testing leakage current of MOS device |
| CN201837713U (en) * | 2010-09-21 | 2011-05-18 | 东莞市贝尔试验设备有限公司 | A battery short circuit testing machine |
| CN204101685U (en) * | 2014-09-10 | 2015-01-14 | 广东美的集团芜湖制冷设备有限公司 | Power device leak current detection device and Intelligent Power Module checkout equipment |
| CN204649834U (en) * | 2015-04-28 | 2015-09-16 | 吴京蓁 | A kind of integral and intelligent electric energy meter with leakage current monitoring and protecting function |
| CN105743062B (en) * | 2016-04-01 | 2018-12-11 | 中国神华能源股份有限公司 | The method and apparatus that zero energy protection is carried out to electricity generation system |
-
2017
- 2017-07-31 CN CN201710646331.6A patent/CN107390077B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN107390077A (en) | 2017-11-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107966209B (en) | Ambient light detection method, ambient light detection device, storage medium, and electronic apparatus | |
| CN108663627B (en) | Battery self-discharge detection method and battery self-discharge detection device | |
| CN107908551A (en) | Terminal software test method, device, terminal and computer-readable storage medium | |
| CN105208639A (en) | Wearable device and power consumption optimization method thereof | |
| CN106776301B (en) | Subelement testing method and device | |
| CN110426967B (en) | Analog simulation method, device and storage medium for household load data | |
| CN110324831A (en) | A kind of distribution method, apparatus, electronic equipment, terminal and storage medium | |
| CN103476145A (en) | Wireless-network connection processing method and device | |
| CN107390077B (en) | Test method, test device and computer readable storage medium | |
| CN112199246A (en) | Terminal testing method and device, storage medium and mobile terminal | |
| CN105227598B (en) | Resource sharing method, device and system based on cloud storage | |
| US20140285177A1 (en) | Mobile current measurement equipment, current measurement terminal and current measurement method | |
| CN111818499B (en) | Fast pairing method, device, equipment and computer-readable storage medium | |
| CN104346262B (en) | Method, device and mobile terminal for acquiring power consumption information of application programs | |
| CN108845261B (en) | Electric quantity prompting method and terminal equipment | |
| CN109860743B (en) | A charging method and terminal device | |
| CN111564145A (en) | Backlight brightness adjustment method, device, terminal equipment and storage medium | |
| CN107864442B (en) | Test method based on intelligent voice equipment, intelligent voice equipment and storage medium | |
| CN112987597B (en) | FSU control method, device, equipment and computer-readable storage medium | |
| CN103412707A (en) | Displaying method, device and equipment for display frame | |
| CN111339196B (en) | Data processing method and system based on block chain and computer readable storage medium | |
| CN110958352B (en) | Network signal display method, device, storage medium and mobile terminal | |
| CN111596827A (en) | Icon display control method and device, storage medium and mobile terminal | |
| CN115878457A (en) | Test data verification method and device, electronic equipment and storage medium | |
| CN111521375B (en) | Gamma value determination method and device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20230113 Address after: 400064 plant 1, No. 70, Meijia Road, Nan'an District, Chongqing Patentee after: Meiken Semiconductor Technology Co.,Ltd. Address before: 528311, 26-28, B District, Mei headquarters building, 6 Mei Road, Beijiao Town, Shunde District, Foshan, Guangdong. Patentee before: GD MIDEA AIR-CONDITIONING EQUIPMENT Co.,Ltd. |