CN108120918A - A kind of chip makes physical destroys online test method and device on effect circuit board - Google Patents
A kind of chip makes physical destroys online test method and device on effect circuit board Download PDFInfo
- Publication number
- CN108120918A CN108120918A CN201710666351.XA CN201710666351A CN108120918A CN 108120918 A CN108120918 A CN 108120918A CN 201710666351 A CN201710666351 A CN 201710666351A CN 108120918 A CN108120918 A CN 108120918A
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- 230000000694 effects Effects 0.000 title claims abstract description 30
- 238000010998 test method Methods 0.000 title claims description 9
- 238000005070 sampling Methods 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims abstract description 11
- 238000001514 detection method Methods 0.000 abstract description 8
- 230000006378 damage Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/022—Means for indicating or recording specially adapted for thermometers for recording
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- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Storage Device Security (AREA)
Abstract
The present invention provides a kind of chip makes physical and destroys on-line measuring device on effect circuit board, including temperature sensor, decision processor, temperature sensor is mounted on the back side of destroyed FLASH storage chips, the surface temperature of destroyed FLASH storage chips can be gathered in real time, and this temperature is sent to decision processor by data bus connection, the decision processor is connected with output device, transfers judging result.Determination methods are difference and time interval of the decision processor by comparing adjacent temperature sampling twice, calculate the rate that temperature rises after chip is powered, it if the rate that temperature rises is more than specified value, proves that chip is destroyed, otherwise proves that chip operation is normal.The present invention realize can on circuit boards on-line checking chip whether physical destroying, improve efficiency, saved the time, detection device volume is small, easy to use, and simply, detection result is accurate.
Description
Technical field
The present invention relates to a kind of chip makes physicals to destroy online test method and device on effect circuit board, for detection chip
Physical arrangement is destroyed in a manner that moment is loaded big electric energy, causes the effect destroyed during physical destroying, especially need not
Chip is separated from the circuit board of application system, the method and apparatus for directly carrying out on-line checking on circuit boards.
Background technology
It is extremely important in the special dimensions data safety such as finance and national defence, physics pin can be passed through in certain special cases
The method of the pin-saving chip ruined on Electronic saving carrier and control chip makes to be stored in data above thoroughly non-readable
Critical data to be avoided to reveal.How whether the destroyed chip of detection chip can be used after these chips are destroyed, common at present
Method have the data of online read-write storage and separate destroyed chip from circuit board and carry out visual inspection or electricity
Performance measurement two ways.The method that data are write in write-read is that the operations such as basic read-write can also be performed after destroyed based on chip
The situation of function, and chip has received destruction by internal physical structure after physical destroying, it is impossible to any exist including read-write
Interior feature operation so being not suitable for detecting by the chip of physical destroying, cannot especially detect and be loaded big electricity by moment
The mode of energy destroys physical arrangement, causes physical destroying effect during physical destroying.Chip is separated from circuit board
Detection method is suitble to detect the effect of physical destroying, and still needs are separated from circuit board chip by modes such as high temperature tip-ofves
Out, it is necessary to process and time it is longer.
The content of the invention
The present invention cannot measure physics pin effect for existing detection method or need to divide chip from circuit board
The shortcomings that separating out the actual destruction effect that physical arrangement is destroyed in a manner that moment is loaded big electric energy for could to detect, carries
Go out a kind of chip makes physical and destroy online test method and device on effect circuit board.Its technical solution is as described below：
A kind of chip makes physical destroys online test method on effect circuit board, comprises the following steps：
(1) temperature sensor is placed on chip to be detected, chip powers on, and temperature sensor starts real-time sampling chip
Temperature, and the temperature sampled is transmitted to decision processor；
(2) decision processor calculates chip energization by comparing the difference and time interval of adjacent temperature sampling twice
The rate that temperature rises afterwards if the rate that temperature rises is more than specified value, proves that chip is destroyed, otherwise proves core
Piece is working properly；
(3) when chip operation is normal, the process of repeated temperature sampling.
Further, decision processor uses microcontroller.
Further, in step (2), the specified value that sets of rate that temperature rises is 5 degree per second Celsius.
Further, in step (2), decision processor reads a next temperature of temperature sensor sampling every 100ms
Value.
A kind of chip makes physical destroys on-line measuring device on effect circuit board, including temperature sensor, decision processor, temperature
The back side that sensor is mounted on destroyed FLASH storage chips is spent, destroyed FLASH storage chips can be gathered in real time
Surface temperature, and this temperature is sent to decision processor, the decision processor and output device by data bus connection
It is connected, transfers judging result.
Decision processor reads a next temperature value of temperature sensor sampling every 100ms.
The decision processor can use vouching in the microcontroller of 89C51 kernels or PIC kernels microcontroller, ARM
Piece machine.
The working power when decision processor and destroyed FLASH storage chips work normally is multiplexed one.
The present invention realize can on circuit boards on-line checking chip whether physical destroying, improve efficiency, save
Time, detection device volume is small, easy to use, and simply, detection result is accurate.
Description of the drawings
Fig. 1 is the method schematic diagram that the chip makes physical destroys on-line checking on effect circuit board；
Fig. 2 is the structure diagram that the chip makes physical destroys on-line measuring device on effect circuit board.
Specific embodiment
The present invention adopts the technical scheme that when being loaded the destruction of big electric energy mode by moment according to chip, chip
It can be burned out.The chip burnt in this way can cause chip to flow through ratio when the power supply and ground terminal of chip have operating voltage
Big 20 times or more of electric current when chip works normally, this electric current, which flows through chip, can cause the temperature of chip rapid in a short time
Rise.According to this principle, the present invention places a temperature sensor on chip, as long as this temperature sensor chip powers on
A microcontroller is transmitted to regard to the temperature of real-time sampling chip, and the temperature sampled, the program performed on microcontroller passes through
The difference and time interval of more adjacent temperature sampling twice calculate the rate that temperature rises after chip is powered, if temperature
The rate of rising proves that chip is destroyed if being more than specified value (such as 5 degree per seconds Celsius), otherwise proves that chip operation is normal.
As shown in Figure 1, placing temperature sensor on chip to be detected, chip powers on, and temperature sensor starts to adopt in real time
The temperature of sample chip, and the temperature sampled is transmitted to decision processor.
Decision processor reads temperature T1 from temperature sensor, and temperature is read from temperature sensor after the 100ms that is delayed
T2 by comparing the difference and time interval of adjacent temperature sampling twice, calculates the rate that temperature rises after chip is powered, such as
The specified value that the rate that fruit temperature rises is set when the rate that temperature rises is more than specified value, is then proved as 5 degree per seconds Celsius
Chip is destroyed, otherwise proves that chip operation is normal；
Then, when chip operation is normal, the process of repeated temperature sampling.
As shown in Fig. 2, chip makes physical destroys on-line measuring device on effect circuit board, at temperature sensor 3, judgement
Device 4 is managed, temperature sensor 3 is mounted on the back side of destroyed FLASH storage chips 2, can gather destroyed FLASH in real time
The surface temperature of storage chip 2, and this temperature is sent to decision processor 4, the judgement processing by data bus connection 5
Device 4 is connected with output device, transfers judging result.
In FLASH storage devices, 1 is FLASH storage device mainboards, and 2 be destroyed FLASH storage chips, and 3 be temperature
Spend sensor, 4 be destroy effect decision processor, can including but not limited to the microcontroller of the 89C51 kernels of commercial type,
Either PIC kernel microcontrollers, ARM kernel microcontrollers；5 be the data company of temperature sensor 3 and destruction effect decision processor 4
Line；6 be single-pole double-throw switch (SPDT)；7 be working power when destroyed FLASH storage chips 2 work normally, and is stored by FLASH
Access outside device is usually 5V direct currents；8 be to destroy power supply, by being accessed outside FLASH storage devices, typically greater than 30V's
Direct current；9 be the power supply for destroying effect decision processor 4, is accessed by FLASH storage devices outside, usually 5V direct currents, Ke Yihe
Working power 7 when destroyed FLASH storage chips 2 work normally is multiplexed one；11 be FLASH read-write main control chips, can
With by being served as including but not limited to FPGA, the CPU with NAND FLASH read-write interfaces；10 be main control chip 11 and destroyed
The data bus interface of FLASH storage chips 2；13 be the data between FLASH storage devices and main equipment (such as computer, mobile phone)
Interface, can be including but not limited to USB interface, SATA interface, RS232 serial ports etc..
When FLASH storage devices 1 work normally, that is, when being not required destroyed, when single-pole double-throw switch (SPDT) 6 and normal work
Working power 7 turns on, and destroyed FLASH storage chips 2 are in normal operating conditions.When needing to destroy, single-pole double throw is opened
It closes 6 and destroys power supply 8 and turn on, destroyed FLASH storage chips 2, which have been accessed higher voltage, causes chip due to internal object
It manages destructurized formed and destroys effect.Since temperature sensor 3 is installed in the back side of destroyed FLASH storage chips 2,
The surface temperature of destroyed FLASH storage chips 2 can be gathered in real time, and this temperature is passed through 2 He of temperature sensor
The data bus connection 5 for destroying effect decision processor 4 is sent to destruction effect decision processor 4, destroys in effect decision processor 4
The program of face operation reads the temperature value that the sampling of temperature sensor 3 comes every 100ms, and will twice temperature value make it is poor,
Divided by 100ms, the rate of temperature change of current time destroyed chip 2 is obtained, if rate of temperature change is more than 5 degree per seconds Celsius,
It then can determine that chip by physical destroying.Otherwise the process of repeated temperature sampling.
Claims (8)
1. a kind of chip makes physical destroys online test method on effect circuit board, comprise the following steps：
(1) temperature sensor is placed on chip to be detected, chip powers on, and temperature sensor starts the temperature of real-time sampling chip
Degree, and the temperature sampled is transmitted to decision processor；
(2) decision processor calculates temperature after chip is powered by comparing the difference and time interval of adjacent temperature sampling twice
The rate risen is spent, if the rate that temperature rises is more than specified value, proves that chip is destroyed, otherwise proves chip work
Make normal；
(3) when chip operation is normal, the process of repeated temperature sampling.
2. chip makes physical according to claim 1 destroys online test method on effect circuit board, it is characterised in that：Judge
Processor uses microcontroller.
3. chip makes physical according to claim 1 destroys online test method on effect circuit board, it is characterised in that：Step
(2) in, the specified value that sets of rate that temperature rises is 5 degree per second Celsius.
4. chip makes physical according to claim 1 destroys online test method on effect circuit board, it is characterised in that：Step
(2) in, decision processor reads a next temperature value of temperature sensor sampling every 100ms.
5. a kind of chip makes physical destroys on-line measuring device on effect circuit board, it is characterised in that：Including temperature sensor, judge
Processor, temperature sensor are mounted on the back side of destroyed FLASH storage chips, can gather destroyed FLASH in real time
The surface temperature of storage chip, and this temperature is sent to decision processor, the decision processor by data bus connection
It is connected with output device, transfers judging result.
6. chip makes physical according to claim 5 destroys on-line measuring device on effect circuit board, it is characterised in that：Judge
Processor reads a next temperature value of temperature sensor sampling every 100ms.
7. chip makes physical according to claim 5 destroys on-line measuring device on effect circuit board, it is characterised in that：It is described
Decision processor can use the microcontroller of 89C51 kernels or PIC kernels microcontroller, ARM kernel microcontrollers.
8. chip makes physical according to claim 5 destroys on-line measuring device on effect circuit board, it is characterised in that：It is described
Working power when decision processor and destroyed FLASH storage chips work normally is multiplexed one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710666351.XA CN108120918A (en) | 2017-08-07 | 2017-08-07 | A kind of chip makes physical destroys online test method and device on effect circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710666351.XA CN108120918A (en) | 2017-08-07 | 2017-08-07 | A kind of chip makes physical destroys online test method and device on effect circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108120918A true CN108120918A (en) | 2018-06-05 |
Family
ID=62228157
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|---|---|---|---|
| CN201710666351.XA Pending CN108120918A (en) | 2017-08-07 | 2017-08-07 | A kind of chip makes physical destroys online test method and device on effect circuit board |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115240724A (en) * | 2022-08-04 | 2022-10-25 | 深圳佰维存储科技股份有限公司 | Solid state hard disk and temperature control method thereof |
| CN119758046A (en) * | 2025-03-07 | 2025-04-04 | 北京中天星控科技开发有限公司成都分公司 | General test method and device for isolated chip and readable storage medium |
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Cited By (2)
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| CN115240724A (en) * | 2022-08-04 | 2022-10-25 | 深圳佰维存储科技股份有限公司 | Solid state hard disk and temperature control method thereof |
| CN119758046A (en) * | 2025-03-07 | 2025-04-04 | 北京中天星控科技开发有限公司成都分公司 | General test method and device for isolated chip and readable storage medium |
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