CN108595296A - A kind of high/low temperature test method and terminal to be measured - Google Patents
A kind of high/low temperature test method and terminal to be measured Download PDFInfo
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- CN108595296A CN108595296A CN201810393548.5A CN201810393548A CN108595296A CN 108595296 A CN108595296 A CN 108595296A CN 201810393548 A CN201810393548 A CN 201810393548A CN 108595296 A CN108595296 A CN 108595296A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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Abstract
The present embodiments relate to field of hardware, disclose a kind of high/low temperature test method and terminal to be measured.In the present invention, a kind of high/low temperature test method is provided, is applied to terminal to be measured, terminal to be measured is positioned in test incubator, and the target temperature tested in incubator changes automatically according to preset instructions, tests in incubator and temp-sensing device is arranged, temp-sensing device is communicated to connect with terminal to be measured, and test method includes：The environment temperature of test incubator is obtained by temp-sensing device；Detect the own temperature of terminal to be measured at ambient temperature；During the target temperature in testing incubator changes automatically according to preset instructions, the own temperature of the environment temperature of the test incubator of acquisition and the terminal to be measured of detection is recorded as test file, so that test method is time saving and energy saving, it is very convenient for tester.
Description
Technical Field
The embodiment of the invention relates to the field of hardware testing, in particular to a high-low temperature testing method and a terminal to be tested.
Background
At present, in the test of a terminal to be tested, a person usually goes to a test incubator at each specific temperature point to check the temperature of the test incubator and the temperature of the terminal to be tested, and only the temperature of the terminal to be tested can be known in a screenshot per minute form, and a pop-up warning prompt box can be seen. In actual testing, the temperature value of the test terminal is usually manually observed to approach or reach the environmental temperature value of the test incubator, and then the next environmental temperature value is manually set.
However, the inventors found that at least the following problems exist in the prior art: the existing testing method cannot know the difference between the temperature value of the terminal to be tested and the ambient temperature in the testing incubator, and the checking of a large number of screenshots is time-consuming, and the checking is basically manually carried out at a specific time point in the actual testing to ensure the testing accuracy, so that the testing method in the prior art is time-consuming and labor-consuming, and is very inconvenient for testers.
Disclosure of Invention
The embodiment of the invention aims to provide a high-low temperature testing method and a terminal to be tested, so that the testing method is time-saving and labor-saving, and is very convenient for testing personnel.
In order to solve the above technical problems, an embodiment of the present invention provides a high and low temperature testing method, which is applied to a terminal to be tested, the terminal to be tested is placed in a testing incubator, a target temperature in the testing incubator automatically changes according to a preset instruction, a temperature sensing device is arranged in the testing incubator, and the temperature sensing device is in communication connection with the terminal to be tested, and the testing method includes: acquiring the environmental temperature of the test incubator through a temperature sensing device; detecting the self temperature of the terminal to be detected at the ambient temperature; and recording the acquired environmental temperature of the test incubator and the detected self temperature of the terminal to be detected into a test file in the process that the target temperature in the test incubator automatically changes according to a preset instruction.
The embodiment of the present invention further provides a terminal to be tested, including: at least one processor; and a memory communicatively coupled to the at least one processor; the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute the high and low temperature testing method.
Compared with the prior art, the terminal to be tested is placed in the test incubator, the target temperature in the test incubator automatically changes according to the preset instruction, the target temperature of the test incubator is favorably avoided needing to be manually adjusted, and therefore the purpose of saving manpower is achieved. The temperature sensing device is arranged in the test incubator and is in communication connection with the terminal to be tested, so that the test terminal can accurately acquire the ambient temperature of the test incubator through the temperature sensing device. The test method comprises the following steps: the environmental temperature of the test incubator is obtained through the temperature sensing device, and the self temperature of the terminal to be tested under the environmental temperature is detected, so that the current values of the environmental temperature and the self temperature can be known in time, and the difference value between the terminal to be tested and the environmental temperature can be obtained conveniently. In the process that the target temperature in the test incubator automatically changes according to a preset instruction, the acquired environment temperature of the test incubator and the detected self temperature of the terminal to be tested are recorded into a test file, and meanwhile the test file which records the environment temperature of the test incubator and the self temperature of the terminal to be tested facilitates the test personnel to check the test files when needed at the later stage. The whole test process does not need a tester to look over the ambient temperature and the self temperature of the terminal to be tested specially at a specific time point so as to ensure the test accuracy, and in the process that the target temperature in the test incubator automatically changes according to a preset instruction, the automatically recorded test file provides certain guarantee for the test accuracy, so that the test process is time-saving and labor-saving, and convenience is provided for the tester.
In addition, after detecting the self temperature of the terminal to be measured under the environment temperature, the method further comprises the following steps: the self temperature of the terminal to be tested and the acquired environment temperature of the test incubator are displayed on the screen of the terminal to be tested, so that the difference value of the two temperatures can be easily known by a tester when the tester wants to check the environment temperature of the test incubator displayed on the screen of the terminal to be tested and the self temperature of the terminal to be tested, and the current temperature state of the terminal to be tested is correctly evaluated.
In addition, when detecting that the terminal to be tested is abnormal, the method further comprises the following steps: and automatically capturing the screen of the terminal to be detected and storing the captured image. The screenshot storage is carried out when the abnormity occurs, so that the intuition of a tester is facilitated, and the test data displayed on the screen when the abnormity occurs is clearly checked through the stored screenshot.
In addition, in the process that the target temperature in the test incubator automatically changes according to a preset instruction, when the abnormal condition of the terminal to be tested is detected, a first mark is added to the self temperature of the terminal to be tested and the environment temperature of the test incubator; the test file is particularly the test file added with the first mark, so that data with the first mark can be easily found in the test file, and a tester can conveniently check and analyze the data.
In addition, the terminal to be tested is connected with a charging wire, and the test method further comprises the following steps: detecting the charging voltage and/or the charging current of the terminal to be detected; recording the acquired environmental temperature of the test incubator and the detected self temperature of the terminal to be tested into a test file, which specifically comprises the following steps: and recording the acquired environmental temperature of the test incubator, the detected self temperature of the terminal to be tested and the charging voltage and/or the charging current into a test file. The charging voltage and/or the charging current of the terminal to be tested when the terminal to be tested is connected with the charging wire are/is acquired, and the charging voltage and/or the charging current are/is included in the test file, so that the charging state of the terminal to be tested in the current test environment can be known by a tester according to the data recorded in the test file.
In addition, in the process that the target temperature in the test incubator automatically changes according to a preset instruction, when the charge cut-off or charge recovery of the terminal to be tested is detected, adding a second mark to the acquired environment temperature of the test incubator, the detected self temperature of the terminal to be tested and the charging voltage and/or the charging current; the test file is specifically a test file added with a second mark. The test file with the second mark enables the environmental temperature when the charging is stopped or recovered and the self temperature of the terminal to be tested to be easily found in the test data, and is very convenient for a tester.
In addition, M key temperatures are preset, wherein M is a natural number greater than 1; recording the acquired environmental temperature of the test incubator and the self temperature of the detected terminal to be tested into a test file, and specifically comprising the following steps: in the process that the target temperature in the test incubator automatically changes according to a preset instruction, judging whether the self temperature of the currently detected terminal to be tested is equal to one of M key temperatures or judging whether the actual environment temperature of the currently acquired test incubator is equal to one of the M key temperatures; if the self temperature of the terminal to be tested is equal to one of the M key temperatures, or the actual environment temperature of the test incubator is equal to one of the M key temperatures, carrying out third marking on the self temperature of the terminal to be tested and the actual environment temperature of the test incubator; the test file is specifically the test file added with the third mark. Through the preset key temperature, when the environment temperature or the self temperature reaches the key temperature in the testing process, the terminal to be tested can automatically carry out third marking on the current environment temperature and the self temperature, so that the testing personnel can obtain key data, and the inconvenience caused by the fact that the testing personnel search the key data in a large amount of testing data is avoided.
In addition, when the terminal to be tested is detected to be abnormal, the high and low temperature testing method further comprises the following steps: and sending prompt information, wherein the prompt information is used for prompting a tester that the terminal to be tested is abnormal. By sending prompt information, the terminal to be tested can be informed of the abnormity of the terminal to be tested in time by testing personnel.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
FIG. 1 is a schematic flow chart of a high and low temperature test method according to a first embodiment of the present invention;
FIG. 2 is a schematic flow chart of a high and low temperature testing method according to a second embodiment of the present invention;
FIG. 3 is a schematic flow chart of a high and low temperature testing method according to a third embodiment of the present invention;
FIG. 4 is a schematic flow chart of a high and low temperature testing method according to a fourth embodiment of the present invention;
fig. 5 is a schematic structural diagram of a terminal to be tested according to a fifth embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that numerous technical details are set forth in order to provide a better understanding of the present application in various embodiments of the present invention. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments.
The first embodiment of the present invention relates to a high and low temperature testing method, which is applied to a terminal to be tested, where the terminal to be tested may be a terminal device such as a smart phone and a tablet computer. The cell-phone is placed in the test incubator, is provided with the temperature-sensing device in the test incubator, and the temperature-sensing device can be temperature sensor, infrared detector etc. can detect the device of temperature, and temperature-sensing device and cell-phone communication connection can also be through wireless connection through wired connection promptly, and the ambient temperature of test incubator that the temperature-sensing device will detect sends for the cell-phone. The target temperature in the test incubator automatically changes according to a preset instruction, so that the mobile phone can automatically complete tests at different target temperatures in the test incubator. A schematic flow chart of the high and low temperature testing method in this embodiment is shown in fig. 1, and specifically includes:
step 101: and acquiring the ambient temperature of the test incubator through the temperature sensing device.
Specifically, the temperature sensing device placed in the test incubator detects the current ambient temperature in the test incubator, and the terminal to be tested can receive the ambient temperature actively sent by the temperature sensing device and can also directly access data detected by the temperature sensing device, so that the ambient temperature of the test incubator is obtained. The target temperature in the test incubator is automatically changed according to a preset instruction, so that the current environment temperature of the test incubator can be acquired in real time or periodically.
Step 102: and detecting the self temperature of the terminal to be detected at the ambient temperature.
Specifically, the temperature of the terminal to be measured is the temperature inside the terminal to be measured, a device capable of detecting the temperature, for example, a temperature sensor, may be built inside the terminal to be measured, and the temperature of the terminal to be measured in the current environmental temperature is detected by the temperature sensor. The self temperature of the terminal to be detected may change under different environmental temperatures, so that the self temperature of the terminal to be detected under the current environmental temperature can be detected in real time or periodically.
It should be noted that step 101 and step 102 are not consecutive, and in practical applications, step 102 may be executed first and then step 101 is executed, or both steps may be executed simultaneously.
Step 103: and recording the acquired environmental temperature of the test incubator and the detected self temperature of the terminal to be detected into a test file in the process that the target temperature in the test incubator automatically changes according to a preset instruction.
Specifically, in the process that the target temperature in the test incubator automatically changes according to a preset instruction, a plurality of environment temperatures can be acquired, the self temperature of the terminal to be tested at a plurality of different environment temperatures can be detected, each time one environment temperature and the self temperature at the environment temperature are acquired, the terminal to be tested can be recorded as a test file, the test file can comprise a document, and the difference value of the two temperatures can be easily seen from the environment temperature of the test incubator recorded in the document and the self temperature of the terminal to be tested at the environment temperature.
Compared with the prior art, the terminal to be tested is placed in the test incubator, the target temperature in the test incubator automatically changes according to the preset instruction, the target temperature of the test incubator is favorably avoided needing to be manually adjusted, and therefore the purpose of saving manpower is achieved. The temperature sensing device is arranged in the test incubator and is in communication connection with the terminal to be tested, so that the test terminal can accurately acquire the ambient temperature of the test incubator through the temperature sensing device. The test method comprises the following steps: the environmental temperature of the test incubator is obtained through the temperature sensing device, and the self temperature of the terminal to be tested under the environmental temperature is detected, so that the current values of the environmental temperature and the self temperature can be known in time, and the difference value between the terminal to be tested and the environmental temperature can be obtained conveniently. In the process that the target temperature in the test incubator automatically changes according to a preset instruction, the acquired environment temperature of the test incubator and the detected self temperature of the terminal to be tested are recorded into a test file, and meanwhile the test file which records the environment temperature of the test incubator and the self temperature of the terminal to be tested facilitates the test personnel to check the test files when needed at the later stage. The whole test process does not need a tester to look over the ambient temperature and the self temperature of the terminal to be tested specially at a specific time point so as to ensure the test accuracy, and in the process that the target temperature in the test incubator automatically changes according to a preset instruction, the automatically recorded test file provides certain guarantee for the test accuracy, so that the test process is time-saving and labor-saving, and convenience is provided for the tester.
A second embodiment of the invention relates to a high and low temperature test method. The second embodiment is a further improvement of the first embodiment, and the main improvements are as follows: in the second embodiment of the present invention, after detecting the temperature of the terminal to be tested at the ambient temperature, the method further includes: and displaying the detected self temperature of the terminal to be tested and the acquired environment temperature of the test incubator on a screen of the terminal to be tested. A schematic flow chart of the high and low temperature testing method in this embodiment is shown in fig. 2, and specifically includes:
step 201: and acquiring the ambient temperature of the test incubator through the temperature sensing device.
Step 202: and detecting the self temperature of the terminal to be detected at the ambient temperature.
Step 201 and step 202 are substantially the same as step 101 and step 102 in the first embodiment, and are not described again to avoid repetition.
Step 203: and displaying the detected self temperature of the terminal to be tested and the acquired environment temperature of the test incubator on a screen of the terminal to be tested.
Specifically, the terminal to be tested may have a display screen, such as a display screen of a mobile phone. The self temperature of the inside of the mobile phone that can show the present detection on the display screen of cell-phone and the ambient temperature of the test incubator who obtains, when the self temperature that the cell-phone detected or the ambient temperature who obtains change, the data that show on the cell-phone can change in time, and the cell-phone screen direct display is under current test environment, self temperature and ambient temperature, and the tester can be at any time more directly perceived, clear, accurate look over current test data.
Step 204: and in the process of automatically changing the target temperature in the test incubator according to a preset instruction, judging whether the abnormality of the terminal to be tested is detected, if so, executing the step 205, otherwise, directly executing the step 206.
Specifically, the abnormal condition of the terminal to be tested may be understood as that the terminal to be tested detects that the temperature of the terminal to be tested is greatly different from the ambient temperature, or the terminal to be tested has abnormal performance at the current ambient temperature, and cannot normally operate. In the process that the target temperature in the test incubator automatically changes according to the preset instruction, if the terminal to be tested detects an abnormality, the step 205 is entered, otherwise, the step 206 is directly executed.
Step 205: and automatically capturing the screen of the terminal to be detected and storing the captured image.
Specifically, in the process that the target temperature in the test incubator automatically changes according to a preset instruction, the terminal to be tested can control automatic screen capture when detecting an abnormality, and detection data in the abnormality can be easily distinguished by storing the screen capture when the abnormality occurs.
In practical application, when the terminal to be tested is detected to be abnormal, a first mark can be added to the self temperature of the terminal to be tested and the environmental temperature of the test incubator, and the first mark is used for distinguishing normal data from abnormal data.
Step 206: and recording the acquired environmental temperature of the test incubator and the detected self temperature of the terminal to be tested into a test file.
Specifically, step 206 is similar to step 103 in the first embodiment, except that in this embodiment, the test file includes not only the ambient temperature of the test incubator and the temperature of the terminal to be tested, but also a screen capture image when the terminal to be tested is detected to be abnormal during the process that the target temperature in the test incubator automatically changes according to a preset instruction, that is, the test file includes not only document information but also picture information.
In practical application, if a first mark is added to the self temperature of the terminal to be tested and the environmental temperature of the test incubator when the terminal to be tested is abnormal, the recorded test file is the test file added with the first mark. For example, the data in the abnormal state is automatically thickened or marked with yellow in the document to show the difference from the normal data, of course, the added first mark is not limited to be thickened or marked with yellow, and any mark capable of distinguishing the normal data from the abnormal data is within the protection scope of the embodiment.
It should be noted that when detecting that the terminal to be tested is abnormal, the terminal to be tested also sends a prompt message, for example, the terminal to be tested is prompted to be abnormal by a voice prompt method, the terminal to be tested and the mobile terminal of the tester can also be in communication connection in advance, when detecting the abnormality, the prompt message is directly sent to the mobile terminal of the tester, and the sent prompt message can carry data currently detected to be abnormal. By sending prompt information, the terminal to be tested can be informed of the abnormity of the terminal to be tested in time by testing personnel.
Compared with the prior art, the embodiment of the invention displays the detected self temperature of the terminal to be tested and the acquired environment temperature of the test incubator on the screen of the terminal to be tested, so that a tester can easily know the difference value of the two temperatures through the environment temperature of the test incubator displayed on the screen of the terminal to be tested and the self temperature of the terminal to be tested when the tester wants to check the temperature, and the current temperature state of the terminal to be tested is correctly evaluated. The screenshot storage is carried out when the abnormity occurs, so that the intuition of a tester is facilitated, and the test data displayed on the screen when the abnormity occurs is clearly checked through the stored screenshot.
A third embodiment of the present invention relates to a high and low temperature test method. The third embodiment is a further improvement of the first embodiment, and the main improvements are as follows: in a third embodiment of the present invention, a terminal to be tested is connected to a charging line, and the testing method further includes: detecting the charging voltage and/or the charging current of the terminal to be detected; recording the acquired environmental temperature of the test incubator and the detected self temperature of the terminal to be tested into a test file, which specifically comprises the following steps: and recording the acquired environmental temperature of the test incubator, the detected self temperature of the terminal to be tested and the charging voltage and/or the charging current into a test file. A schematic flow chart of the high and low temperature testing method in this embodiment is shown in fig. 3, and specifically includes:
step 301: and acquiring the ambient temperature of the test incubator through the temperature sensing device.
Step 302: and detecting the self temperature of the terminal to be detected at the ambient temperature.
Step 303: and detecting the charging voltage and/or the charging current of the terminal to be detected.
Specifically, the terminal to be tested is connected to a charging line, and may be considered to be in a charging state, so that the terminal to be tested may detect a current charging voltage and/or charging current, and the charging voltage or charging current of the terminal to be tested may change at different environmental temperatures in the high and low temperature tests. In practical application, the terminal to be tested can display the acquired environmental temperature of the test incubator, the detected self temperature of the terminal to be tested, and the charging voltage and/or the charging current on a screen of the terminal to be tested.
It should be noted that, in this embodiment, only one possible execution order of steps 301 to 303 is provided, but the execution order of steps 301 to 303 is not limited.
Step 304: and judging whether the charge cut-off or the charge recovery of the terminal to be detected is detected, if so, executing the step 305, and if not, directly executing the step 306.
Specifically, in the process that the target temperature in the test incubator automatically changes according to the preset instruction, whether charge cut-off or charge restoration occurs may be determined according to the detected charge voltage and/or charge current, where charge cut-off may be understood as the case where the charge voltage and/or charge current is from greater than 0 to equal to 0, and charge restoration may be understood as the case where the charge voltage and/or charge current is from equal to 0 to greater than 0. If the charging of the terminal to be tested is detected to be cut off or the charging is detected to be recovered, step 305 is executed first, otherwise step 306 is executed directly.
Step 305: and adding a second mark to the acquired environment temperature of the test incubator, the detected self temperature of the terminal to be detected and the charging voltage and/or the charging current.
Specifically, when the charge cut-off or the charge recovery of the terminal to be tested is detected, the terminal to be tested adds a second mark to the acquired environmental temperature of the test incubator, the detected self temperature of the terminal to be tested, and the charging voltage and/or the charging current. The method for adding the second mark is substantially the same as that of the first mark in the second embodiment, and is not repeated herein for avoiding redundancy.
In practical application, when the charge cut-off or charge recovery of the terminal to be detected is detected, the current display screen of the terminal to be detected can be captured, and the captured picture is stored.
Step 306: and recording the acquired environmental temperature of the test incubator, the detected self temperature of the terminal to be detected and the charging voltage and/or the charging current into a test file in the process that the target temperature in the test incubator automatically changes according to a preset instruction.
Specifically, step 306 is similar to step 103 in the first embodiment, except that in this embodiment, the test file includes not only the ambient temperature of the test oven and the temperature of the terminal to be tested, but also the charging voltage and/or charging current record. Preferably, the test file may be recorded as a test file with the second mark added thereto. In practical application, the test file may further include a screenshot when it is detected that the charging of the terminal to be tested is cut off or the charging is resumed.
Compared with the prior art, the embodiment of the invention has the advantages that the charging voltage and/or the charging current are/is also included in the test file, so that the tester can know the charging state of the terminal to be tested in the current test environment according to the data recorded in the test file. The test file with the second mark enables the environmental temperature when the charging is stopped or recovered and the self temperature of the terminal to be tested to be easily found in the test data, and is very convenient for a tester.
A fourth embodiment of the present invention relates to a high and low temperature test method. The fourth embodiment is a further improvement of the first embodiment, and the main improvements are as follows: in a fourth embodiment of the present invention, M key temperatures are preset, where M is a natural number greater than 1; recording the acquired environmental temperature of the test incubator and the self temperature of the detected terminal to be tested into a test file, and specifically comprising the following steps: in the process that the target temperature in the test incubator automatically changes according to a preset instruction, judging whether the self temperature of the currently detected terminal to be tested is equal to one of M key temperatures or judging whether the currently acquired environment temperature of the test incubator is equal to one of the M key temperatures; if the self temperature of the terminal to be tested is equal to one of the M key temperatures, or the environment temperature of the test incubator is equal to one of the M key temperatures, carrying out third marking on the self temperature of the terminal to be tested and the environment temperature of the test incubator; the test file is specifically the test file added with the third mark. A flow chart of the high and low temperature testing method in this embodiment is shown in fig. 4, and specifically includes:
step 401: and acquiring the ambient temperature of the test incubator through the temperature sensing device.
Step 402: and detecting the self temperature of the terminal to be detected at the ambient temperature.
Step 401 and step 402 are substantially the same as step 101 and step 102 in the first embodiment, and are not repeated herein to avoid repetition.
Step 403: and judging whether the self temperature of the currently detected terminal to be detected is equal to one of the M key temperatures, if so, executing the step 404, otherwise, directly executing the step 405.
Specifically, M key temperatures can be preset by a tester and stored in a terminal to be tested, M is a natural number greater than 1, and the key temperatures can be selected by the tester according to actual needs. After detecting the self temperature, the terminal to be tested judges whether the self temperature detected currently is equal to one of the M key temperatures, if so, the step 404 is performed, otherwise, the step 405 is directly performed.
In practical application, after acquiring the ambient temperature of the test incubator, the terminal to be tested may further determine whether the current ambient temperature is equal to one of the M critical temperatures, if so, go to step 404, otherwise, directly execute step 405. That is to say, in the self temperature of the terminal to be tested or the environmental temperature of the test oven, as long as any one of the self temperature or the environmental temperature is equal to one of the M critical temperatures, step 404 is executed first, and after step 404 is executed, step 405 is executed.
Step 404: and carrying out third marking on the self temperature of the terminal to be tested and the environmental temperature of the test incubator.
Specifically, when the self temperature of the terminal to be tested detected is equal to one of the M key temperatures, the self temperature of the terminal to be tested and the ambient temperature of the test incubator are marked by the third marker, and the method for adding the third marker is substantially the same as that for adding the first marker in the second embodiment, and is not repeated here to avoid repetition.
In practical applications, the third marking may also be performed when the currently detected ambient temperature of the test incubator is equal to one of the M critical temperatures. When the self temperature of the currently detected terminal to be tested or the environment temperature of the test incubator is equal to one of the M key temperatures, screenshot storage can be directly carried out on the screen of the currently detected terminal to be tested, so that testers can see the screenshot of the data to be seen.
Step 405: and recording the acquired environmental temperature of the test incubator and the detected self temperature of the terminal to be detected into a test file in the process that the target temperature in the test incubator automatically changes according to a preset instruction.
Specifically, step 405 is similar to step 103 in the first embodiment, except that in this embodiment, the test file may be recorded as a test file with the third mark added thereto. In practical application, the test file may further include a screenshot performed on a screen when the current detected temperature of the terminal to be tested or the environment temperature of the test incubator is equal to one of the M key temperatures.
Compared with the prior art, in the embodiment of the invention, the preset key temperature is adopted, so that the terminal to be tested can automatically carry out third marking on the current environment temperature and the self temperature when the environment temperature or the self temperature reaches the key temperature in the testing process, the key data can be obtained by the testing personnel, and the inconvenience brought by the fact that the testing personnel searches for the key data in a large amount of testing data is avoided.
The steps of the above methods are divided for clarity, and the implementation may be combined into one step or split some steps, and the steps are divided into multiple steps, so long as the same logical relationship is included, which are all within the protection scope of the present patent; it is within the scope of the patent to add insignificant modifications to the algorithms or processes or to introduce insignificant design changes to the core design without changing the algorithms or processes.
A fifth embodiment of the present invention relates to a terminal to be tested, as shown in fig. 5, including at least one processor 501; and a memory 502 communicatively coupled to the at least one processor 501; the memory 502 stores instructions executable by the at least one processor 501, and the instructions are executed by the at least one processor 501, so that the at least one processor 501 can perform the above-mentioned high and low temperature testing method.
The memory 502 and the processor 501 are coupled by a bus, which may include any number of interconnected buses and bridges that couple one or more of the various circuits of the processor 501 and the memory 502 together. The bus may also connect various other circuits such as peripherals, voltage regulators, power management circuits, and the like, which are well known in the art, and therefore, will not be described any further herein. A bus interface provides an interface between the bus and the transceiver. The transceiver may be one element or a plurality of elements, such as a plurality of receivers and transmitters, providing a means for communicating with various other apparatus over a transmission medium. The data processed by the processor 501 is transmitted over a wireless medium through an antenna, which further receives the data and transmits the data to the processor 501.
The processor 501 is responsible for managing the bus and general processing and may also provide various functions including timing, peripheral interfaces, voltage regulation, power management, and other control functions. And memory 502 may be used to store data used by processor 501 in performing operations.
That is, as can be understood by those skilled in the art, all or part of the steps in the method for implementing the embodiments described above may be implemented by a program instructing related hardware, where the program is stored in a storage medium and includes several instructions to enable a device (which may be a single chip, a chip, or the like) or a processor (processor) to execute all or part of the steps of the method described in the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice.
Claims (10)
1. The high and low temperature testing method is applied to a terminal to be tested, the terminal to be tested is placed in a testing incubator, the target temperature in the testing incubator automatically changes according to a preset instruction, a temperature sensing device is arranged in the testing incubator and is in communication connection with the terminal to be tested, and the testing method comprises the following steps:
acquiring the ambient temperature of the test incubator through the temperature sensing device;
detecting the self temperature of the terminal to be detected at the environmental temperature;
and recording the acquired environment temperature of the test incubator and the detected self temperature of the terminal to be detected into a test file in the process that the target temperature in the test incubator automatically changes according to a preset instruction.
2. The method according to claim 1, further comprising, after the detecting the self temperature of the terminal under test at the environmental temperature, the steps of:
and displaying the detected self temperature of the terminal to be tested and the acquired environment temperature of the test incubator on a screen of the terminal to be tested.
3. The high and low temperature test method according to claim 2, wherein in the process that the target temperature in the test incubator automatically changes according to a preset instruction, when the terminal to be tested is detected to be abnormal, the screen of the terminal to be tested is automatically captured and a captured image is stored.
4. The high and low temperature test method according to claim 1, wherein in the process that the target temperature in the test incubator automatically changes according to a preset instruction, when the terminal to be tested is detected to be abnormal, a first mark is added to the self temperature of the terminal to be tested and the environmental temperature of the test incubator;
the test file is specifically the test file added with the first mark.
5. The high and low temperature test method according to claim 1, wherein the terminal to be tested is connected with a charging wire, and the test method further comprises:
detecting the charging voltage and/or the charging current of the terminal to be detected;
recording the acquired environment temperature of the test incubator and the detected self temperature of the terminal to be tested into a test file, which specifically comprises the following steps:
and recording the acquired environmental temperature of the test incubator, the detected self temperature of the terminal to be tested and the charging voltage and/or the charging current into a test file.
6. The high and low temperature test method according to claim 5, wherein in the process that the target temperature in the test incubator automatically changes according to a preset instruction, when the charge cut-off or charge recovery of the terminal to be tested is detected, a second mark is added to the acquired environment temperature of the test incubator, the detected self temperature of the terminal to be tested, and the charging voltage and/or charging current;
the test file is specifically the test file added with the second mark.
7. The method according to claim 6, further comprising, after the detecting the charging voltage and/or the charging current of the terminal under test:
and displaying the acquired environment temperature of the test incubator, the detected self temperature of the terminal to be tested and the charging voltage and/or the charging current on a screen of the terminal to be tested.
8. The high and low temperature test method according to claim 1, wherein M key temperatures are preset, wherein M is a natural number greater than 1;
recording the acquired environment temperature of the test incubator and the detected self temperature of the terminal to be tested into a test file, and specifically comprising the following steps of:
in the process that the target temperature in the test incubator automatically changes according to a preset instruction, judging whether the self temperature of the terminal to be tested which is detected currently is equal to one of the M key temperatures or judging whether the environment temperature of the test incubator which is obtained currently is equal to one of the M key temperatures;
if the self temperature of the terminal to be tested is equal to one of the M key temperatures, or the environment temperature of the test incubator is equal to one of the M key temperatures, carrying out third marking on the self temperature of the terminal to be tested and the environment temperature of the test incubator;
the test file is specifically the test file added with the third mark.
9. The method according to claim 2, wherein when the terminal under test is detected to be abnormal, the method further comprises:
and sending prompt information, wherein the prompt information is used for prompting a tester that the terminal to be tested is abnormal.
10. A terminal to be tested, comprising:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the high and low temperature testing method of any one of claims 1 to 9.
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| CN201810393548.5A CN108595296A (en) | 2018-04-27 | 2018-04-27 | A kind of high/low temperature test method and terminal to be measured |
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| CN201810393548.5A CN108595296A (en) | 2018-04-27 | 2018-04-27 | A kind of high/low temperature test method and terminal to be measured |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111556522A (en) * | 2020-05-13 | 2020-08-18 | 上海加糖科技有限公司 | Reliability test method for Internet of things module |
| CN113640606A (en) * | 2021-08-17 | 2021-11-12 | 重庆蓝岸通讯技术有限公司 | A terminal charging function debugging method, device and terminal equipment |
| CN115962863A (en) * | 2022-12-30 | 2023-04-14 | 曙光信息产业股份有限公司 | Temperature testing method, device, computer equipment and storage medium |
| CN117198365A (en) * | 2023-11-02 | 2023-12-08 | 合肥康芯威存储技术有限公司 | Processing system and processing method of memory |
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2018
- 2018-04-27 CN CN201810393548.5A patent/CN108595296A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111556522A (en) * | 2020-05-13 | 2020-08-18 | 上海加糖科技有限公司 | Reliability test method for Internet of things module |
| CN113640606A (en) * | 2021-08-17 | 2021-11-12 | 重庆蓝岸通讯技术有限公司 | A terminal charging function debugging method, device and terminal equipment |
| CN113640606B (en) * | 2021-08-17 | 2023-07-07 | 重庆蓝岸科技股份有限公司 | Terminal charging function debugging method and device and terminal equipment |
| CN115962863A (en) * | 2022-12-30 | 2023-04-14 | 曙光信息产业股份有限公司 | Temperature testing method, device, computer equipment and storage medium |
| CN117198365A (en) * | 2023-11-02 | 2023-12-08 | 合肥康芯威存储技术有限公司 | Processing system and processing method of memory |
| CN117198365B (en) * | 2023-11-02 | 2024-02-06 | 合肥康芯威存储技术有限公司 | Processing system and processing method of memory |
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Application publication date: 20180928 |