CN109274807B - Test method, device and system - Google Patents
Test method, device and system Download PDFInfo
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- CN109274807B CN109274807B CN201811390207.9A CN201811390207A CN109274807B CN 109274807 B CN109274807 B CN 109274807B CN 201811390207 A CN201811390207 A CN 201811390207A CN 109274807 B CN109274807 B CN 109274807B
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- 238000010998 test method Methods 0.000 title claims abstract description 18
- 238000012360 testing method Methods 0.000 claims abstract description 418
- 238000004891 communication Methods 0.000 claims abstract description 72
- 238000000034 method Methods 0.000 claims abstract description 51
- 238000002360 preparation method Methods 0.000 claims abstract description 33
- 238000004590 computer program Methods 0.000 claims description 13
- 238000012544 monitoring process Methods 0.000 claims description 7
- 230000000977 initiatory effect Effects 0.000 claims 1
- 230000008569 process Effects 0.000 abstract description 14
- 230000006870 function Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 230000005540 biological transmission Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M2250/00—Details of telephonic subscriber devices
- H04M2250/02—Details of telephonic subscriber devices including a Bluetooth interface
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M2250/00—Details of telephonic subscriber devices
- H04M2250/06—Details of telephonic subscriber devices including a wireless LAN interface
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Abstract
The application discloses a test method, a test device and a test system. The method is applied to the test terminal and comprises the following steps: establishing communication connection with a control terminal; receiving a test starting instruction sent by a control terminal through communication connection; entering a factory test mode according to the test starting instruction; and sending a preparation completion notice to the control terminal, wherein the preparation completion notice is used for indicating the control terminal to test the component to be tested. In the embodiment of the application, the control terminal and the test terminal are in communication connection in advance, then the control terminal sends the test starting instruction to the test terminal based on the communication connection, the test terminal can automatically enter the factory test mode according to the test starting instruction so as to provide a test environment required by factory test, and the process does not need technicians to manually input the engineering mode instruction, so that the time required by the test terminal to enter the factory test mode can be saved, and the test efficiency is improved.
Description
Technical Field
The embodiment of the application relates to the technical field of terminal testing, in particular to a testing method, a testing device and a testing system.
Background
Currently, terminal manufacturers need to perform factory testing on terminals before they are shipped and sold. Before Factory testing of the terminal, the terminal needs to enter a Factory Test Mode (FTM).
In the related art, a technician needs to input a corresponding engineering mode command, for example, "# 33466 #" on a dial pad of a terminal, and then the terminal enters a factory test mode according to the engineering mode command, and then a designated test meter performs a factory test on the terminal in the factory test mode.
Disclosure of Invention
The embodiment of the application provides a test method, a test device and a test system. The technical scheme is as follows:
in one aspect, an embodiment of the present application provides a testing method, where the method is applied to a testing terminal, and the method includes:
establishing communication connection with a control terminal;
receiving a test starting instruction sent by the control terminal through the communication connection;
entering a factory test mode according to the test starting instruction, wherein the factory test mode is used for providing an environment for testing a component to be tested in the test terminal;
and sending a preparation completion notice to the control terminal, wherein the preparation completion notice is used for indicating the control terminal to test the component to be tested.
On the other hand, an embodiment of the present application provides a test method, where the method is applied to a control terminal, and the method includes:
establishing communication connection with a test terminal;
sending a test starting instruction to the test terminal through the communication connection, wherein the test starting instruction is used for indicating the test terminal to enter a factory test mode, and the factory test mode is used for providing an environment for testing a to-be-tested component in the test terminal;
receiving a preparation completion notification sent by the test terminal after entering the factory test mode;
and testing the component to be tested according to the preparation completion notice.
In another aspect, an embodiment of the present application provides a testing apparatus, where the testing apparatus is applied in a testing terminal, and the testing apparatus includes:
the first establishing module is used for establishing communication connection with the control terminal;
the instruction receiving module is used for receiving a test starting instruction sent by the control terminal through the communication connection;
the mode entering module is used for entering a factory testing mode according to the test starting instruction, and the factory testing mode is used for providing an environment for testing a to-be-tested component in the testing terminal;
and the notification sending module is used for sending a preparation completion notification to the control terminal, wherein the preparation completion notification is used for indicating the control terminal to test the component to be tested.
In another aspect, an embodiment of the present application provides a testing apparatus, where the testing apparatus is applied to a control terminal, and the apparatus includes:
the second establishing module is used for establishing communication connection with the test terminal;
the instruction sending module is used for sending a test starting instruction to the test terminal through the communication connection, wherein the test starting instruction is used for indicating the test terminal to enter a factory test mode, and the factory test mode is used for providing an environment for testing a component to be tested in the test terminal;
a notification receiving module, configured to receive a preparation completion notification sent by the test terminal after entering the factory test mode;
and the testing module is used for testing the component to be tested according to the preparation completion notice.
In another aspect, the present application provides a terminal, where the terminal includes a processor and a memory, where the memory stores a computer program, and the computer program is loaded and executed by the processor to implement the above-mentioned test method on the side of the test terminal.
In another aspect, the present application provides a terminal, where the terminal includes a processor and a memory, where the memory stores a computer program, and the computer program is loaded and executed by the processor to implement the above-mentioned test method for controlling the terminal side.
In still another aspect, an embodiment of the present application provides a computer-readable storage medium, in which a computer program is stored, and the computer program is loaded and executed by a processor to implement the above-mentioned test method on the test terminal side.
In still another aspect, an embodiment of the present application provides a computer-readable storage medium, where a computer program is stored, and the computer program is loaded and executed by a processor to implement the above-mentioned control terminal-side test method.
The technical scheme provided by the embodiment of the application can bring the following beneficial effects:
through establishing communication connection in advance by control terminal and test terminal, later control terminal sends the test start instruction to test terminal based on this communication connection, and test terminal can be according to this test start instruction automatic entering mill test mode to provide the required test environment of mill test, this process need not the technical staff manual input engineering mode instruction, can save test terminal and get into the required time of mill test mode, and then promote efficiency of software testing.
Drawings
FIG. 1 is a schematic diagram of a test system provided in one embodiment of the present application;
FIG. 2 is a flow chart of a testing method provided by an embodiment of the present application;
FIG. 3 is a flow chart of a testing method provided in another embodiment of the present application;
FIG. 4 is a flow chart of a testing method provided in another embodiment of the present application;
FIG. 5 is a flow chart of a testing method provided in another embodiment of the present application;
FIG. 6 is a flow chart of a testing method provided in another embodiment of the present application;
FIG. 7 is a block diagram of a testing device provided in one embodiment of the present application;
FIG. 8 is a block diagram of a test apparatus provided in one embodiment of the present application;
fig. 9 is a block diagram of a terminal according to an embodiment of the present application.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
Referring to fig. 1, a schematic diagram of a test system according to an embodiment of the present application is shown. The test system comprises a test terminal 11 and a control terminal 12.
The test terminal 11 refers to a terminal that needs to be factory tested. The test terminal 11 is provided with a component to be tested, which may be a radio Frequency component, such as a Wireless Fidelity (WIFI) component, a Bluetooth (Bluetooth) component, a Frequency Modulation (FM) component, a Global Positioning System (GPS) component, a Near Field Communication (NFC) component, and the like. The test terminal 11 may be a terminal device such as a mobile phone, a tablet computer, or the like.
The control terminal 12 is used for testing the test terminal 11. Optionally, an automated test program is run in the control terminal 12, and the test terminal 11 is tested by the automated test program. The control terminal 12 may be a terminal device such as a personal computer.
A communication connection is established between the test terminal 11 and the control terminal 12. The communication connection may be a wired connection, such as a Universal Serial Bus (USB) connection, or a wireless connection, such as a bluetooth connection or a WIFI connection. It should be noted that, if the component to be tested is a WIFI component, the communication connection is not a WIFI connection; if the to-be-tested component is the Bluetooth component, the communication connection is not the Bluetooth connection.
Optionally, the test system further comprises a test meter 13. The control terminal 12 controls the test meter 13 to test the test terminal 11. The test meter 13 may be a spectrum analyzer, a network analyzer, a signal source tester, or the like. The test meter 13 may establish a communication connection with the control terminal 12, and the communication connection may be a wired connection or a wireless connection.
In the related art, the terminal enters a factory test mode depending on an engineering mode instruction manually input by a technician, and the process is low in efficiency. Based on this, the embodiment of the application provides a test method, a test device and a test system. In the embodiment of the application, the control terminal and the test terminal are in communication connection in advance, then the control terminal sends the test starting instruction to the test terminal based on the communication connection, the test terminal can automatically enter the factory test mode according to the test starting instruction so as to provide a test environment required by factory test, and the process does not need technicians to manually input the engineering mode instruction, so that the time required by the test terminal to enter the factory test mode can be saved, and the test efficiency is improved.
Referring to fig. 2, a flowchart of a testing method according to an embodiment of the present application is shown. The method is applied to the test terminal in the test system shown in fig. 1, and the method may include the following steps:
The communication connection may be a wired connection or a wireless connection. In the embodiment of the present application, the communication connection may be any one of: USB connection, bluetooth connection, WIFI connection. In addition, it should be noted that if the component to be tested is a WIFI component, the communication connection is not a WIFI connection; if the to-be-tested component is the Bluetooth component, the communication connection is not the Bluetooth connection.
And the starting test instruction is sent by the control terminal and is used for indicating the test terminal to enter a factory test mode. The start test instruction may be a diagnostic instruction or an Android Debug Bridge (Adb) instruction.
The Diag instructions are menu driven programs that are typically run by Root users to perform certain hardware problems. The Diag instructions may provide the following tasks and services: running diagnostics, displaying test patterns, disk maintenance, backing up and restoring media, recording repair operations, displaying microcode levels, and the like. In the embodiment of the application, a related technician may customize a Diag instruction according to the type of the component to be tested and the testing process, and a subsequent terminal may enter a factory testing mode according to the customized Diag instruction.
The Adb instructions are provided by an android debug bridge tool, which may assist technicians in managing test terminals or simulators. Specifically, it may implement the following functions: running the command line of the device, managing the simulator or port mapping of the device, uploading/downloading files between the computer and the device, installing local apk software to the simulator or android device, and so forth.
The Diag instruction differs from the Adb instruction in that: the transmission protocols used are different, but all can play the role of making the test terminal enter the factory test mode.
The factory test mode is used for providing an environment for testing a component to be tested in the test terminal.
Alternatively, step 203 may be implemented as:
step 203a, closing the component to be tested;
in the running process of the component to be tested, the first driver is also in a running state, and the first driver cannot be unloaded at the moment, so that the testing terminal needs to close the component to be tested in advance.
Step 203b, unloading a first drive corresponding to the component to be tested;
the first driver refers to a driver required by the to-be-tested component to run in a non-test environment. A non-test environment refers to the environment provided by the test terminal when not in factory test mode. Taking the to-be-tested component as the WIFI component as an example, the first driver refers to a WIFI normal driver.
Step 203c, loading a second driver corresponding to the component to be tested to enter a factory test mode.
The second driver is the driver required by the tested component to run under the test environment. The test environment refers to the environment provided by the test terminal when in factory test mode. Taking the to-be-tested component as the WIFI component as an example, the second driver refers to a WIFI FTM driver.
In the embodiment of the application, the test terminal enters a factory test mode after the first drive is uninstalled and the second drive is downloaded and installed.
The preparation completion notification is used for indicating that the test terminal has completed the preparation work before the test, that is, the control terminal can test the component to be tested. The preparation completion notification may carry an identifier of the test terminal, an identifier of the component to be tested, and the like. The component to be tested may be a radio frequency component, which may be any one of: WIFI subassembly, bluetooth subassembly, FM subassembly, GPS subassembly, NFC subassembly.
Accordingly, the control terminal receives the preparation completion notification sent by the test terminal.
To sum up, the technical scheme provided by the embodiment of the application establishes communication connection with the test terminal in advance through the control terminal, then the control terminal sends a test starting instruction to the test terminal based on the communication connection, the test terminal can automatically enter a factory test mode according to the test starting instruction so as to provide a test environment required by factory test, and the process does not need technicians to manually input an engineering mode instruction, so that the time required by the test terminal to enter the factory test mode can be saved, and the test efficiency is further improved.
Referring to fig. 3, a flowchart of a testing method provided by an embodiment of the present application is shown, where the method is applied to a control terminal in the implementation environment shown in fig. 1, and the method includes the following steps:
The start test instruction is used for instructing the test terminal to enter a factory test mode, and the factory test mode is used for providing an environment for testing the components to be tested in the test terminal.
Alternatively, the control terminal may send a test start instruction to the test terminal after monitoring that the communication connection has been successfully established with the test terminal. Optionally, the control terminal sends a test starting instruction to the test terminal after the specified application program is started and run. Optionally, the control terminal sends the start test instruction after receiving a trigger signal for triggering sending of the start test instruction. The embodiment of the present application does not limit the transmission timing of the start test instruction.
Step 303, receiving a preparation completion notification sent by the test terminal after entering the factory test mode.
And step 304, testing the component to be tested according to the preparation completion notice.
In this application embodiment, control terminal still is connected with the test instrument, and control terminal tests the subassembly that awaits measuring through controlling this test instrument. Taking the to-be-tested component as the WIFI component as an example, the test instrument can test parameters of the WIFI component, such as transmission power, modulation parameters, phase noise, spectrum flatness, and receiving sensitivity. Specifically, control terminal control test terminal transmission signal, this signal is received to the test instrument to carry out spectral analysis to this signal, in order to obtain each item parameter of WIFI subassembly. Wherein the test meter may be the test meter 13 in the implementation environment shown in fig. 1.
To sum up, the technical scheme provided by the embodiment of the application establishes communication connection with the test terminal in advance through the control terminal, then the control terminal sends a test starting instruction to the test terminal based on the communication connection, the test terminal can automatically enter a factory test mode according to the test starting instruction so as to provide a test environment required by factory test, and the process does not need technicians to manually input an engineering mode instruction, so that the time required by the test terminal to enter the factory test mode can be saved, and the test efficiency is further improved.
Referring to fig. 4, a flow chart of a testing method according to an embodiment of the present application is shown. The method may be applied to the implementation environment shown in fig. 1.
Step 401, the control terminal establishes a communication connection with the test terminal.
Step 402, the control terminal sends a test start instruction to the test terminal through the communication connection.
Accordingly, the test terminal receives the test starting instruction sent by the control terminal.
In step 403, the test terminal enters a factory test mode according to the test starting instruction.
In step 404, the test terminal sends a preparation completion notification to the control terminal.
Accordingly, the control terminal receives the preparation completion notification sent by the test terminal.
And 405, the control terminal tests the to-be-tested component according to the preparation completion notice.
And step 406, after the control terminal completes the test, sending a test ending instruction to the test terminal.
The end test instruction is used for indicating that the test is completed, namely indicating that the test terminal exits the factory test mode. The end test instruction may be a Diag instruction or an Adb instruction. The explanation of the above two instructions can refer to step 202, which is not described herein.
In step 407, the test terminal exits the factory test mode according to the test termination instruction.
Optionally, step 407 may be implemented as:
step 407a, unloading a second drive corresponding to the component to be tested;
the second drive is the drive required by the to-be-tested component when running in the test environment;
step 407b, load the first driver corresponding to the component to be tested to exit the factory test mode.
The first driver refers to a driver required by the to-be-tested component to run in a non-test environment.
In an embodiment of the application, the test terminal exits the factory test mode after uninstalling the second drive and downloading and installing the first drive. Optionally, the test terminal may also restart the component to be tested after exiting the factory test mode.
The testing method provided by the embodiment of the application will be explained below by taking the to-be-tested component as the WIFI component as an example.
Referring to fig. 5 in combination, which provides a flowchart of a testing method on the control terminal side according to an embodiment of the present application, a computer (i.e. a control terminal) needs to perform the following steps: the method comprises the steps of firstly connecting a mobile phone test port, then sending a WIFI FTM Diag entering instruction to indicate a WIFI component of a mobile phone end (namely a test terminal) to enter a test mode, then carrying out a WIFI FTM test on the WIFI component by a computer end, and finally sending a WIFI FTM Diag exiting instruction to enable the WIFI component of the mobile phone end to be normally used.
Referring to fig. 6 in combination, which provides a flowchart of a testing method at a testing terminal side according to an embodiment of the present application, a mobile phone (also called a testing terminal) needs to perform the following steps: the method comprises the steps that after the mobile phone is started, the service for monitoring the Diag instruction is started, when the Diag instruction entering is received, the WIFI component is closed, the drive of the WIFI component in normal operation is unloaded, the WIFI FTM drive is loaded to enter a factory test mode, when the Diag instruction exiting is received, the WIFI FTM drive is unloaded, the drive of the WIFI component in normal operation is loaded to exit the factory test mode.
To sum up, according to the technical scheme provided by the embodiment of the application, the control terminal sends the test termination instruction to the test terminal based on the communication connection, the test terminal can automatically exit the factory test mode according to the test termination instruction, a technician does not need to manually input an engineering mode instruction in the process, the time required for the test terminal to enter the factory test mode can be saved, and the test efficiency is further improved.
The following are embodiments of the apparatus of the present application that may be used to perform embodiments of the method of the present application. For details which are not disclosed in the embodiments of the apparatus of the present application, reference is made to the embodiments of the method of the present application.
Referring to fig. 7, a block diagram of a testing apparatus according to an embodiment of the present application is shown. The device has the function of realizing the test terminal side of the method example, and the function can be realized by hardware or by hardware executing corresponding software. The device includes:
a first establishing module 701, configured to establish a communication connection with a control terminal.
An instruction receiving module 702, configured to receive, through the communication connection, a test starting instruction sent by the control terminal.
A mode entering module 703, configured to enter a factory test mode according to the test starting instruction, where the factory test mode is used to provide an environment for testing a component to be tested in the test terminal.
A notification sending module 704, configured to send a preparation completion notification to the control terminal, where the preparation completion notification is used to instruct the control terminal to test the component to be tested.
To sum up, the technical scheme provided by the embodiment of the application establishes communication connection with the test terminal in advance through the control terminal, then the control terminal sends a test starting instruction to the test terminal based on the communication connection, the test terminal can automatically enter a factory test mode according to the test starting instruction so as to provide a test environment required by factory test, and the process does not need technicians to manually input an engineering mode instruction, so that the time required by the test terminal to enter the factory test mode can be saved, and the test efficiency is further improved.
In an optional embodiment provided based on the embodiment shown in fig. 7, the mode entering module 703 is configured to:
closing the component to be tested;
unloading a first drive corresponding to the component to be tested, wherein the first drive is a drive required by the component to be tested when the component to be tested operates in a non-testing environment;
and loading a second drive corresponding to the component to be tested, wherein the second drive is a drive required by the component to be tested when the component to be tested operates in a test environment.
In an optional embodiment provided based on the embodiment shown in fig. 7, the apparatus further comprises: a mode exit module (not shown).
The instruction receiving module 702 is configured to receive, through the communication connection, a test termination instruction sent by the control terminal.
And the mode exit module is used for exiting the factory test mode according to the test ending instruction.
Optionally, the mode exit module is configured to:
unloading a second drive corresponding to the component to be tested, wherein the second drive is a drive required by the component to be tested when the component to be tested operates in a test environment;
and loading a first drive corresponding to the component to be tested, wherein the first drive is a drive required by the component to be tested when the component to be tested operates in a non-testing environment.
In an alternative embodiment provided based on the embodiment shown in fig. 7, the start test instruction is a diag instruction or an adb instruction, and the end test instruction is a diag instruction or an adb instruction.
In an alternative embodiment provided based on the embodiment shown in fig. 7, the components to be tested are radio frequency components including a combination of one or more of the following: the device comprises a Bluetooth assembly, a wireless fidelity WIFI assembly, a frequency modulation FM assembly, a global positioning system GPS assembly and a near field communication NFC assembly.
Referring to fig. 8, a block diagram of a testing apparatus according to an embodiment of the present application is shown. The device has the function of realizing the control terminal side of the method example, and the function can be realized by hardware or by hardware executing corresponding software. The device includes:
a second establishing module 801, configured to establish a communication connection with the test terminal.
An instruction sending module 802, configured to send a test starting instruction to the test terminal through the communication connection, where the test starting instruction is used to instruct the test terminal to enter a factory test mode, and the factory test mode is used to provide an environment for testing a component to be tested in the test terminal.
A notification receiving module 803, configured to receive a preparation completion notification sent by the test terminal after entering the factory test mode.
A testing module 804, configured to test the component to be tested according to the preparation completion notification.
To sum up, the technical scheme provided by the embodiment of the application establishes communication connection with the test terminal in advance through the control terminal, then the control terminal sends a test starting instruction to the test terminal based on the communication connection, the test terminal can automatically enter a factory test mode according to the test starting instruction so as to provide a test environment required by factory test, and the process does not need technicians to manually input an engineering mode instruction, so that the time required by the test terminal to enter the factory test mode can be saved, and the test efficiency is further improved.
In an optional embodiment provided based on the embodiment shown in fig. 8, the instruction sending module 802 is further configured to send an end test instruction to the test terminal through the communication connection, where the end test instruction is used to instruct the test terminal to exit the factory test mode.
It should be noted that, when the apparatus provided in the foregoing embodiment implements the functions thereof, only the division of the functional modules is illustrated, and in practical applications, the functions may be distributed by different functional modules according to needs, that is, the internal structure of the apparatus may be divided into different functional modules to implement all or part of the functions described above. In addition, the apparatus and method embodiments provided by the above embodiments belong to the same concept, and specific implementation processes thereof are described in the method embodiments for details, which are not described herein again.
The embodiment of the application also provides a test system which comprises a test terminal and a control terminal. The test terminal is used to implement the steps of the test method provided in the embodiment of fig. 2, and the steps performed by the test terminal in the test method provided in the embodiment of fig. 4. The control terminal is used to implement the steps of the test method provided in the embodiment of fig. 3, and the steps performed by the control terminal in the test method provided in the embodiment of fig. 4.
Referring to fig. 9, a block diagram of a terminal according to an exemplary embodiment of the present application is shown. A terminal in the present application may include one or more of the following components: a processor 910 and a memory 920.
Alternatively, the processor 910, when executing the program instructions in the memory 920, implements the terminal-side testing method provided in the various method embodiments described below, or controls the terminal-side testing method.
The Memory 920 may include a Random Access Memory (RAM) or a Read-Only Memory (Read-Only Memory). Optionally, the memory 920 includes a non-transitory computer-readable medium. The memory 920 may be used to store instructions, programs, code sets, or instruction sets. The memory 920 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function, instructions for implementing the various method embodiments described above, and the like; the storage data area may store data created according to the use of the terminal, and the like.
The structure of the terminal described above is only illustrative, and in actual implementation, the terminal may include more or less components, such as: a display screen, etc., which are not limited in this embodiment.
Those skilled in the art will appreciate that the configuration shown in fig. 9 does not constitute a limitation of terminal 900, and may include more or fewer components than those shown, or may combine certain components, or may employ a different arrangement of components.
An exemplary embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored, which, when being loaded and executed by a processor, implements the positioning method provided by the above-mentioned method embodiments.
An exemplary embodiment of the present application further provides a computer program product containing instructions, which when run on a computer, cause the computer to perform the positioning method described in the above embodiments.
It should be understood that reference to "a plurality" herein means two or more. "and/or" describes the association relationship of the associated objects, meaning that there may be three relationships, e.g., a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship.
The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.
The above description is only exemplary of the present application and should not be taken as limiting the present application, and any modifications, equivalents, improvements and the like that are made within the spirit and principle of the present application should be included in the protection scope of the present application.
Claims (13)
1. A test method is applied to a test terminal, and the method comprises the following steps:
starting a service for monitoring a test starting instruction, wherein the test starting instruction is a test mode Diag instruction or an android debug bridge Adb instruction;
establishing communication connection with a control terminal, wherein the communication connection is except the communication connection corresponding to the component to be tested in the test terminal;
receiving the test starting instruction sent by the control terminal through the communication connection;
when the test starting instruction is monitored through the service, entering a factory test mode according to the test starting instruction, wherein the factory test mode is used for providing an environment for testing a to-be-tested component in the test terminal;
and sending a preparation completion notice to the control terminal, wherein the preparation completion notice is used for indicating the control terminal to test the component to be tested.
2. The method of claim 1, wherein entering a factory test mode according to the start test command comprises:
closing the component to be tested;
unloading a first drive corresponding to the component to be tested, wherein the first drive is a drive required by the component to be tested when the component to be tested operates in a non-testing environment;
and loading a second drive corresponding to the component to be tested to enter the factory test mode, wherein the second drive is a drive required by the component to be tested when the component to be tested operates in a test environment.
3. The method of claim 1, wherein after entering a factory test mode according to the start test command, the method further comprises:
receiving a test ending instruction sent by the control terminal through the communication connection;
and exiting the factory test mode according to the test ending instruction.
4. The method of claim 3, wherein said exiting said factory test mode in accordance with said end test instruction comprises:
unloading a second drive corresponding to the component to be tested, wherein the second drive is a drive required by the component to be tested when the component to be tested operates in a test environment;
and loading a first drive corresponding to the component to be tested to exit the factory test mode, wherein the first drive is a drive required by the component to be tested when running in a non-test environment.
5. The method of any of claims 1 to 4, wherein the end test instruction is a Diag instruction or an Adb instruction.
6. The method of any of claims 1 to 4, wherein the component to be tested is any of: wireless fidelity WIFI subassembly, bluetooth subassembly, frequency modulation FM subassembly, global positioning system GPS subassembly, closely wireless communication technique NFC subassembly.
7. A test method is applied to a control terminal, and the method comprises the following steps:
establishing communication connection with a test terminal, wherein the communication connection is except the communication connection corresponding to a component to be tested in the test terminal;
sending a test starting instruction to the test terminal through the communication connection, wherein the test starting instruction is a test mode Diag instruction or an android debug bridge Adb instruction, the test terminal is used for entering a factory test mode after monitoring the test starting instruction through a service for monitoring the test starting instruction, and the factory test mode is used for providing an environment for testing a component to be tested in the test terminal;
receiving a preparation completion notification sent by the test terminal after entering the factory test mode;
and testing the component to be tested according to the preparation completion notice.
8. The method of claim 7, wherein after testing the component under test according to the preparation completion notification, further comprising:
and sending a test ending instruction to the test terminal through the communication connection, wherein the test ending instruction is used for indicating the test terminal to exit the factory test mode.
9. A testing apparatus, wherein the apparatus is applied in a testing terminal, the apparatus comprising:
means for initiating a service for listening for a start test instruction;
the device comprises a first establishing module, a second establishing module and a control module, wherein the first establishing module is used for establishing communication connection with a control terminal, and the communication connection is communication connection except communication connection corresponding to a component to be tested in the test terminal;
the instruction receiving module is used for receiving the test starting instruction sent by the control terminal through the communication connection, wherein the test starting instruction is a test mode Diag instruction or an android debug bridge Adb instruction;
the mode entering module is used for entering a factory testing mode according to the test starting instruction when the test starting instruction is monitored through the service, and the factory testing mode is used for providing an environment for testing a to-be-tested component in the testing terminal;
and the notification sending module is used for sending a preparation completion notification to the control terminal, wherein the preparation completion notification is used for indicating the control terminal to test the component to be tested.
10. A test device, which is applied to a control terminal, the device comprising:
the second establishing module is used for establishing communication connection with the testing terminal, wherein the communication connection is communication connection except communication connection corresponding to a component to be tested in the testing terminal;
the instruction sending module is used for sending a test starting instruction to the test terminal through the communication connection, wherein the test starting instruction is a test mode Diag instruction or an android debug bridge Adb instruction, the test terminal is used for entering a factory test mode after monitoring the test starting instruction through a service for monitoring the test starting instruction, and the factory test mode is used for providing an environment for testing a component to be tested in the test terminal;
a notification receiving module, configured to receive a preparation completion notification sent by the test terminal after entering the factory test mode;
and the testing module is used for testing the component to be tested according to the preparation completion notice.
11. The test system is characterized by comprising a test terminal and a control terminal;
the test terminal is used for implementing the method according to any one of claims 1 to 6; the control terminal is used for implementing the method according to claim 7 or 8.
12. A terminal, characterized in that the terminal comprises a processor and a memory, the memory storing a computer program that is loaded and executed by the processor to implement a test method according to any one of claims 1 to 6, or a method according to claim 7 or 8.
13. A computer-readable storage medium, in which a computer program is stored, which computer program is loaded and executed by a processor to implement a test method according to any one of claims 1 to 6, or a method according to claim 7 or 8.
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| CN109887449B (en) * | 2019-02-20 | 2022-06-21 | 合肥惠科金扬科技有限公司 | Display and energy efficiency testing method and system thereof |
| CN112444350A (en) * | 2019-08-29 | 2021-03-05 | 长鑫存储技术有限公司 | Machine pressure leakage test method and device, storage medium and electronic equipment |
| CN112104998A (en) * | 2020-08-18 | 2020-12-18 | 东软集团股份有限公司 | Communication test method, device, storage medium and electronic equipment |
| CN113448317A (en) * | 2021-06-29 | 2021-09-28 | 上海移远通信技术股份有限公司 | Module testing system and module testing method |
| CN114116358A (en) * | 2021-12-03 | 2022-03-01 | 深圳市广和通无线股份有限公司 | Device debugging method and device, electronic device and computer readable storage medium |
| CN114385428A (en) * | 2022-01-12 | 2022-04-22 | 博为科技有限公司 | A test method for terminal equipment and related equipment |
| CN115396338B (en) * | 2022-08-18 | 2024-04-05 | 青岛鼎信通讯股份有限公司 | A load management terminal testing device and testing method |
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| CN102781019A (en) * | 2012-07-30 | 2012-11-14 | 迈普通信技术股份有限公司 | System and method for automatically testing wireless fidelity (WIFI) module |
| CN103501505B (en) * | 2013-09-18 | 2017-02-08 | 福州瑞芯微电子股份有限公司 | System capable of automatically testing WIFI module on Android device |
| CN103546345A (en) * | 2013-10-24 | 2014-01-29 | 广东欧珀移动通信有限公司 | A method and device for testing the performance of communication equipment |
| CN105898290A (en) * | 2015-08-07 | 2016-08-24 | 乐视致新电子科技（天津）有限公司 | Method and device for controlling intelligent device to enter factory test mode |
| CN105043455A (en) * | 2015-09-06 | 2015-11-11 | 上海卓易科技股份有限公司 | Factory test method, factory test system, test terminal, and tested terminal |
| CN105246094B (en) * | 2015-11-03 | 2018-11-09 | 青岛海信移动通信技术股份有限公司 | Communication means and test method |
| CN106569854B (en) * | 2016-11-02 | 2020-05-19 | 捷开通讯(深圳)有限公司 | Method and system for setting equipment firmware and realizing factory test |
| CN106776213A (en) * | 2016-12-12 | 2017-05-31 | 深圳铂睿智恒科技有限公司 | The factory testing method of intelligent terminal, system and factory testing equipment |
| CN108304326B (en) * | 2018-01-30 | 2021-11-19 | 广东天波信息技术股份有限公司 | Automatic testing system and method for android intelligent terminal |
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