CN109580996A - A kind of hardware testing frame - Google Patents
A kind of hardware testing frame Download PDFInfo
- Publication number
- CN109580996A CN109580996A CN201811454918.8A CN201811454918A CN109580996A CN 109580996 A CN109580996 A CN 109580996A CN 201811454918 A CN201811454918 A CN 201811454918A CN 109580996 A CN109580996 A CN 109580996A
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- CN
- China
- Prior art keywords
- hardware
- testing frame
- hardware testing
- frame according
- fixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 238000012360 testing method Methods 0.000 title claims abstract description 79
- 239000000523 sample Substances 0.000 claims abstract description 28
- 210000002683 foot Anatomy 0.000 claims abstract description 26
- 230000009471 action Effects 0.000 claims description 6
- 238000009413 insulation Methods 0.000 claims description 5
- 238000003466 welding Methods 0.000 abstract description 8
- 230000000694 effects Effects 0.000 description 7
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 241000252254 Catostomidae Species 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The present invention provides a kind of hardware testing frame, comprising: at least two fixed feets intersect at a crosspoint, are removably fixed in hardware surface to be measured；Probe is fixed on the crosspoint, and one end is in contact with the test point of the hardware to be measured.Hardware testing frame of the invention can carry out the test of one or more test points without welding, greatly improve the efficiency of hardware testing, reduce the damage to hardware.
Description
Technical field
The present invention relates to the technical fields of testing jig, more particularly to a kind of hardware testing frame.
Background technique
In the prior art, it generally requires to be tested in many test points when carrying out hardware debugging, or part is surveyed
Pilot needs to be measured with oscillograph simultaneously.
Existing hardware testing mode mainly includes following two:
(1) welding lead is used, butt welding point carries out welding extraction wire, then measures to conductor wire end
However, causing the testing time to extend since solder joint is more and portion is difficult to solder to, testing cost increases；And
Hardware damage is easily caused, causes test validity lower.
(2) it directlys adopt handheld probe and carries out push type test
However, which cannot test multiple test points simultaneously, cause testing efficiency low.
Summary of the invention
In view of the foregoing deficiencies of prior art, the purpose of the present invention is to provide a kind of hardware testing framves, without weldering
The test that can carry out one or more test points is connect, the efficiency of hardware testing is greatly improved, reduces the damage to hardware
Wound.
In order to achieve the above objects and other related objects, the present invention provides a kind of hardware testing frame, comprising: at least two is solid
Determine foot, intersect at a crosspoint, is removably fixed in hardware surface to be measured；Probe is fixed on the crosspoint, and
One end is in contact with the test point of the hardware to be measured.
In one embodiment of the invention, the number of the fixed feet is three.
In one embodiment of the invention, the bottom end of the fixed feet is provided with sucker, is fixed on by the sucker described
Hardware surface to be measured.
Further include insulation sleeve in one embodiment of the invention, is coated on the probe surface.
In one embodiment of the invention, the fixed feet is retractable structure.
In one embodiment of the invention, the retractable structure is bolted.
In one embodiment of the invention, it is provided with slot in the probe, for being connected with external testing instrument.
In one embodiment of the invention, the probe include the pressing section being sequentially connected from top to bottom, telescopic segment and
Contact-segment；The pressing section is for being downwardly applied to pressing force；The telescopic segment is used under the action of the pressing force to described
Contact-segment applies down force；The contact-segment is used to connect under the action of the down force with test point fixation
Touching.
In one embodiment of the invention, the telescopic segment uses spring.
In one embodiment of the invention, the top of the pressing section is provided with briquetting.
As described above, hardware testing frame of the invention, has the advantages that
(1) test of one or more test points can be carried out without welding, it is easy to remove；
(2) the hardware testing frame stationarity is good, and probe elastic force pressure holding degree is strong, and test signal stabilization is high；
(3) reduce the damage to hardware, reduce testing cost, increase testing efficiency.
Detailed description of the invention
Fig. 1 is shown as the structural schematic diagram of hardware testing frame of the invention in an embodiment.
Component label instructions
1 fixed feet
11 suckers
2 probes
21 briquettings
Specific embodiment
Embodiments of the present invention are illustrated by particular specific embodiment below, those skilled in the art can be by this explanation
Content disclosed by book is understood other advantages and efficacy of the present invention easily.
It should be clear that this specification structure depicted in this specification institute accompanying drawings, ratio, size etc., only to cooperate specification to be taken off
The content shown is not intended to limit the invention enforceable qualifications so that those skilled in the art understands and reads, therefore
Do not have technical essential meaning, the modification of any structure, the change of proportionate relationship or the adjustment of size are not influencing the present invention
Under the effect of can be generated and the purpose that can reach, it should all still fall in disclosed technology contents and obtain the model that can cover
In enclosing.Meanwhile cited such as "upper" in this specification, "lower", "left", "right", " centre " and " one " term, be also only
Convenient for being illustrated for narration, rather than to limit the scope of the invention, relativeness is altered or modified, in no essence
It changes under technology contents, when being also considered as the enforceable scope of the present invention.
Hardware testing frame of the invention can carry out the test of test point without welding, and multiple hardware testing framves can be same
When work to realize the test of multiple test points, to reduce the damage to hardware, greatly improve the effect of hardware testing
Rate reduces the cost of labor of test.
As shown in Figure 1, in an embodiment, hardware testing frame of the invention includes:
At least two fixed feets 1, intersect at a crosspoint, are removably fixed in hardware surface to be measured.
Probe 2 is fixed on the crosspoint, and one end is in contact with the test point of the hardware to be measured.
Specifically, the fixed feet 1 is used as supporting mechanism, is used to support the probe 2.The fixed feet 1 is removable
Hardware surface to be measured is set dynamicly, so that the probe 2 can test the hardware surface to be measured any position
The test point at place avoids the loss welded to hardware to be measured without welding.
In order to guarantee the stability of at least two fixed feet 1, in one embodiment of the invention, of the fixed feet
Number is three, to constitute the tripod with common across point.
Preferably, the fixed feet 1, which is adopted, is made from an insulative material.
Since the size of different hardware to be measured is different, therefore the test scope of the probe 2 is also different.The fixation
The height limitation of foot 1 scope of activities of the probe 2, therefore need to adjust the probe 2 according to the actual situation
Scope of activities.In one embodiment of the invention, the fixed feet 1 is retractable structure, thus straight by the retractable structure
The height for adjusting the fixed feet 1, and then the position without the mobile fixed feet 1 are connect, the probe 2 can be adjusted
Scope of activities.Preferably, when the fixed feet 1 is adjusted to required length, the retractable structure is bolted, thus
Guarantee the stability of the fixed feet 1.
When the hardware testing frame is tested, the fixed feet 1 need to be fixed on the hardware surface to be measured, to guarantee
The stability of the probe 2.In one embodiment of the invention, the bottom end of the fixed feet 1 is provided with sucker 11, passes through institute
It states sucker 11 and is fixed on the hardware surface to be measured.The fixation of the fixed feet 1 can be realized without external force for the sucker,
Avoid the damage to the hardware surface to be measured.Meanwhile the sucker 11 is readily disassembled, and may make the fixed feet 1 in institute
It is mobile to state hardware surface to be measured.
In one embodiment of the invention, hardware testing frame of the invention further includes insulation sleeve, is coated on the probe 2
Surface.Since the probe 2 is conductive material, therefore insulation sleeve is coated on 2 surface of probe, so as to tester
Can the position manually to the probe 2 be adjusted flexibly, without use special insulating tool, such as insulation hand
Set.
For the ease of being communicated with external testing instrument, in one embodiment of the invention, it is provided in the probe 2
Slot, for being connected with external testing instrument.Therefore, the probe 2 will can directly test signal transmission collected
It is simple and convenient to external testing instrument, such as oscillograph, improve testing efficiency.
In order to further enhance the accurate testing degree of the probe 2, in one embodiment of the invention, the center is visited
Needle 2 includes pressing section, telescopic segment and the contact-segment being sequentially connected from top to bottom.Wherein, the pressing section is set to top, is used for
It is downwardly applied to pressing force；The telescopic segment be located at centre, under the action of the pressing force to the contact-segment apply to
Lower active force；The contact-segment is located below, and is directly in contact with the test point of the hardware to be measured, in the downward work
It contacts under the action of firmly with test point fixation, is tested with ten thousand.Due to the effect of elastic pressure, the center is increased
The signal collected stability of probe 2, improves measuring accuracy.
Preferably, the telescopic segment uses spring.
It is further preferable that the top of the pressing section is provided with briquetting 21, for being downwardly applied to active force, greatly mention
Test comfort level is risen.
In conclusion hardware testing frame of the invention can carry out the test of one or more test points without welding, just
In movement；The hardware testing frame stationarity is good, and probe elastic force pressure holding degree is strong, and test signal stabilization is high；Reduce to hardware
Damage, reduces testing cost, increases testing efficiency.So the present invention effectively overcomes various shortcoming in the prior art
And has high industrial utilization value.
The above-described embodiments merely illustrate the principles and effects of the present invention, and is not intended to limit the present invention.It is any ripe
The personage for knowing this technology all without departing from the spirit and scope of the present invention, carries out modifications and changes to above-described embodiment.Cause
This, institute is complete without departing from the spirit and technical ideas disclosed in the present invention by those of ordinary skill in the art such as
At all equivalent modifications or change, should be covered by the claims of the present invention.
Claims (10)
1. a kind of hardware testing frame, it is characterised in that: include:
At least two fixed feets intersect at a crosspoint, are removably fixed in hardware surface to be measured；
Probe is fixed on the crosspoint, and one end is in contact with the test point of the hardware to be measured.
2. hardware testing frame according to claim 1, it is characterised in that: the number of the fixed feet is three.
3. hardware testing frame according to claim 1, it is characterised in that: the bottom end of the fixed feet is provided with sucker, leads to
It crosses the sucker and is fixed on the hardware surface to be measured.
4. hardware testing frame according to claim 1, it is characterised in that: further include insulation sleeve, be coated on the center and visit
Wire surface.
5. hardware testing frame according to claim 1, it is characterised in that: the fixed feet is retractable structure.
6. hardware testing frame according to claim 5, it is characterised in that: the retractable structure is bolted.
7. hardware testing frame according to claim 1, it is characterised in that: be provided with slot in the probe, be used for
It is connected with external testing instrument.
8. hardware testing frame according to claim 1, it is characterised in that: the probe includes successively phase from top to bottom
Pressing section, telescopic segment and contact-segment even；The pressing section is for being downwardly applied to pressing force；The telescopic segment described for pressing
Apply down force to the contact-segment under the action of pressure；The contact-segment is used under the action of the down force
It is contacted with test point fixation.
9. hardware testing frame according to claim 8, it is characterised in that: the telescopic segment uses spring.
10. hardware testing frame according to claim 8, it is characterised in that: the top of the pressing section is provided with briquetting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811454918.8A CN109580996A (en) | 2018-11-30 | 2018-11-30 | A kind of hardware testing frame |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811454918.8A CN109580996A (en) | 2018-11-30 | 2018-11-30 | A kind of hardware testing frame |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109580996A true CN109580996A (en) | 2019-04-05 |
Family
ID=65925789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811454918.8A Pending CN109580996A (en) | 2018-11-30 | 2018-11-30 | A kind of hardware testing frame |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109580996A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2123758U (en) * | 1992-02-20 | 1992-12-02 | 冶金工业部钢铁研究总院 | Thin film internal stress tunneling current probe measurement device |
| CN101968502A (en) * | 2010-09-21 | 2011-02-09 | 四川长虹电器股份有限公司 | Testing needle bed and method for testing tape carrier package (TCP) driving chip by utilizing same |
| US20130021052A1 (en) * | 2008-03-13 | 2013-01-24 | Advanced Inquiry Systems, Inc. | Wafer prober integrated with full-wafer contacter |
| CN103063959A (en) * | 2012-12-29 | 2013-04-24 | 北京德天泉机电设备有限公司 | Bed-of-nails tool for detecting circuit board |
| CN103792483A (en) * | 2014-01-24 | 2014-05-14 | 苏州工业园区世纪福科技有限公司 | Novel testing device for PCBs of mobile phones |
| CN207764267U (en) * | 2018-01-03 | 2018-08-24 | 广东东方亮彩精密技术有限公司 | Using Circuit Inspection Multi-position Continuity Inspection Tool |
-
2018
- 2018-11-30 CN CN201811454918.8A patent/CN109580996A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2123758U (en) * | 1992-02-20 | 1992-12-02 | 冶金工业部钢铁研究总院 | Thin film internal stress tunneling current probe measurement device |
| US20130021052A1 (en) * | 2008-03-13 | 2013-01-24 | Advanced Inquiry Systems, Inc. | Wafer prober integrated with full-wafer contacter |
| CN101968502A (en) * | 2010-09-21 | 2011-02-09 | 四川长虹电器股份有限公司 | Testing needle bed and method for testing tape carrier package (TCP) driving chip by utilizing same |
| CN103063959A (en) * | 2012-12-29 | 2013-04-24 | 北京德天泉机电设备有限公司 | Bed-of-nails tool for detecting circuit board |
| CN103792483A (en) * | 2014-01-24 | 2014-05-14 | 苏州工业园区世纪福科技有限公司 | Novel testing device for PCBs of mobile phones |
| CN207764267U (en) * | 2018-01-03 | 2018-08-24 | 广东东方亮彩精密技术有限公司 | Using Circuit Inspection Multi-position Continuity Inspection Tool |
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Application publication date: 20190405 |