CN100453269C - Substrate holder and fixing member thereof - Google Patents
Substrate holder and fixing member thereof Download PDFInfo
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- CN100453269C CN100453269C CNB2006101693099A CN200610169309A CN100453269C CN 100453269 C CN100453269 C CN 100453269C CN B2006101693099 A CNB2006101693099 A CN B2006101693099A CN 200610169309 A CN200610169309 A CN 200610169309A CN 100453269 C CN100453269 C CN 100453269C
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- 239000000758 substrate Substances 0.000 title claims abstract description 93
- 238000005498 polishing Methods 0.000 claims abstract description 40
- 239000000463 material Substances 0.000 claims description 9
- 238000001179 sorption measurement Methods 0.000 claims description 4
- 239000004033 plastic Substances 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 10
- 239000011521 glass Substances 0.000 description 13
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- 239000004696 Poly ether ether ketone Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000004417 polycarbonate Substances 0.000 description 2
- 229920002530 polyetherether ketone Polymers 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
技术领域technical field
本发明涉及一种研磨装置,尤其涉及一种研磨装置的基板支架及其固定构件。The invention relates to a grinding device, in particular to a substrate support of the grinding device and its fixing components.
背景技术Background technique
平面显示器,例如:有机发光显示器(organic light emitting display;OLED)及液晶显示器(liquid crystal display;LCD),已广泛地应用于计算机及通讯领域。Flat panel displays, such as organic light emitting displays (OLED) and liquid crystal displays (LCD), have been widely used in computer and communication fields.
玻璃基板为平面显示器的关键材料之一,其主要应用在平面显示器上的薄膜晶体管及彩色滤光片。由于平面显示器所使用的玻璃基板需要有较高的光洁度,因此,玻璃材料经由成型制造过程形成玻璃基板后,大多需再经过抛光、研磨等后续加工步骤。另外,彩色滤光片(color filter;CF)上的像素由具有染料的光致抗蚀剂形成,例如包括红色、绿色及蓝色;然而由于制造过程参数、机台设备等因素,光致抗蚀剂会形成不平坦的结构而影响显示面板的画质表现,因此在制造过程中一般需再经过研磨制造过程以平坦化彩色滤光片的光致抗蚀剂。Glass substrate is one of the key materials of flat-panel displays, and it is mainly used in thin-film transistors and color filters on flat-panel displays. Since the glass substrate used in the flat panel display needs to have a high degree of smoothness, after the glass material is formed into a glass substrate through a molding manufacturing process, most of them need to go through subsequent processing steps such as polishing and grinding. In addition, the pixels on the color filter (color filter; CF) are formed by photoresists with dyes, such as including red, green and blue; however, due to factors such as manufacturing process parameters and machine equipment, photoresist The etchant will form an uneven structure and affect the image quality of the display panel. Therefore, in the manufacturing process, the photoresist of the color filter generally needs to be polished to flatten the photoresist.
传统的研磨方法是使用一外框将玻璃基板限制于框体内,以进行研磨。请参照图1A与图1B,传统研磨设备的基板支架是将定位框体130贴附于定盘110的表面上,而研磨垫(back pad)120位于定位框体130内,定位框体130的尺寸对应于欲研磨的玻璃基板140的尺寸,以将玻璃基板140限制于定位框体130内,进而进行玻璃基板140的加工制造过程。The traditional grinding method is to use an outer frame to confine the glass substrate in the frame for grinding. Please refer to Fig. 1A and Fig. 1B, the substrate support of traditional grinding equipment is that
另一传统基板支架则在研磨垫120及定位框体130的外侧增设一抵挡构件150,以限制定位框体130的移动,如图2所示。Another conventional substrate holder adds a resisting
在公知技术中,需使用定位框体将玻璃基板限制于框内以进行研磨;而实际上进行研磨时,此定位框体容易造成玻璃基板碰撞,而造成破片。另外,此定位框体为背胶式,当面积较大且贴附不佳时易造成渗水问题。并且,当欲进行研磨的玻璃基板的尺寸改变时,需全部更换基板支架或其上的定位框体,且更换操作既费时又费工。In the prior art, it is necessary to use a positioning frame to confine the glass substrate in the frame for grinding; however, during actual grinding, the positioning frame is likely to cause the glass substrate to collide and cause fragments. In addition, the positioning frame is adhesive-backed, which may easily cause water seepage when the area is large and the attachment is not good. Moreover, when the size of the glass substrate to be ground changes, it is necessary to completely replace the substrate support or the positioning frame on it, and the replacement operation is time-consuming and labor-intensive.
发明内容Contents of the invention
鉴于以上的问题,本发明提供一种研磨装置及其基板支架和固定构件,由此解决现有技术所揭露的易碰撞造成破片且换线不易的问题。In view of the above problems, the present invention provides a grinding device and its substrate support and fixing components, thereby solving the problems disclosed in the prior art that are easily broken due to collision and difficult to change wires.
本发明所揭示的基板支架应用于一研磨装置上,以吸附欲研磨的基板,并且该基板支架包括一定盘及一固定构件。The substrate holder disclosed by the present invention is applied to a grinding device to absorb the substrate to be polished, and the substrate holder includes a fixed plate and a fixing member.
该固定构件包括研磨垫与制止件。The fixing member includes a polishing pad and a stopper.
研磨垫设置于定盘的表面上,其具有多个开孔,且这些开孔的位置对应于基板的尺寸。The polishing pad is arranged on the surface of the fixed disk, and has a plurality of openings, and the positions of the openings correspond to the size of the substrate.
制止件则穿过研磨垫上的开孔而设置于定盘的表面上,并且这些制止件突出于研磨垫,从而在制止件之间形成一容置区域以设置基板。The stoppers pass through the holes on the polishing pad and are arranged on the surface of the fixed disk, and these stoppers protrude from the polishing pad, so as to form an accommodating area between the stoppers for setting the substrate.
其中,研磨垫可为一吸附式研磨垫,且可由具有高摩擦系数的材料制成。Wherein, the polishing pad can be an adsorption type polishing pad, and can be made of materials with high friction coefficient.
具体而言,根据本发明的一个技术方案,提供一种固定构件,用以吸附基板,包括:研磨垫,其具有多个第一开孔,其中所述第一开孔的位置对应于该基板的尺寸;及多个制止件,其分别一一对应地设置于所述多个第一开孔中,其中所述制止件突出于该研磨垫,且在所述制止件之间形成一容置区域以设置该基板。Specifically, according to a technical solution of the present invention, a fixing member is provided for absorbing a substrate, comprising: a polishing pad having a plurality of first openings, wherein the positions of the first openings correspond to the positions of the substrate size; and a plurality of stoppers, which are respectively arranged in the plurality of first openings in a one-to-one correspondence, wherein the stoppers protrude from the polishing pad, and a housing is formed between the stoppers area to set up the substrate.
根据本发明的另一方案,提供一种基板支架,用以吸附一基板,包括:定盘;研磨垫,其设置于该定盘的表面上,并且具有多个第一开孔,其中所述第一开孔的位置对应于该基板的尺寸;及多个制止件,其分别一一对应地穿过所述多个第一开孔而设置于该定盘的表面上,其中所述制止件突出于该研磨垫,以在所述制止件之间形成一容置区域以设置该基板。According to another aspect of the present invention, there is provided a substrate support for absorbing a substrate, including: a fixed plate; a polishing pad, which is arranged on the surface of the fixed plate, and has a plurality of first openings, wherein the The position of the first opening corresponds to the size of the substrate; and a plurality of stoppers, which respectively pass through the plurality of first openings in one-to-one correspondence and are arranged on the surface of the fixed plate, wherein the stoppers protruding from the grinding pad to form a receiving area between the stoppers for setting the substrate.
本发明的有益技术效果在于:一旦在制造过程中需要进行换线,只需改变制止件的设置位置即可进行不同尺寸的基板的研磨,有效地降低了制造过程的时间及成本。The beneficial technical effects of the present invention are: once the line needs to be changed in the manufacturing process, substrates of different sizes can be ground only by changing the setting position of the stopper, which effectively reduces the time and cost of the manufacturing process.
有关本发明的特征与实例,现配合附图对优选实施例详细说明如下。Regarding the characteristics and examples of the present invention, the preferred embodiments are described in detail below in conjunction with the accompanying drawings.
附图说明Description of drawings
图1A为传统研磨设备的基板支架的截面图;1A is a cross-sectional view of a substrate holder of a conventional grinding device;
图1B为传统研磨设备的基板支架的立体分解图;FIG. 1B is a three-dimensional exploded view of a substrate support of a conventional grinding device;
图2为另一传统研磨设备的基板支架的截面图;2 is a cross-sectional view of a substrate holder of another conventional grinding device;
图3A为根据本发明的基板支架的第一实施例的立体分解图;3A is an exploded perspective view of a first embodiment of a substrate holder according to the present invention;
图3B为根据本发明的基板支架的第二实施例的俯视图;3B is a top view of a second embodiment of a substrate holder according to the present invention;
图4为根据本发明的基板支架的第三实施例的俯视图;以及4 is a top view of a third embodiment of a substrate holder according to the present invention; and
图5为根据本发明的基板支架的第四实施例的俯视图。5 is a top view of a fourth embodiment of a substrate holder according to the present invention.
其中,附图标记说明如下:Wherein, the reference signs are explained as follows:
110定盘 120研磨垫 130定位框体110
140玻璃基板 150抵挡构件 210定盘140
220研磨垫 222开孔 230制止件 240基板220
具体实施方式Detailed ways
以下举出具体实施例以详细说明本发明的内容,并以附图作为辅助说明。说明书中提及的附图标记请参照附图中的附图标记。Specific embodiments are given below to describe the content of the present invention in detail, and the accompanying drawings are used as auxiliary descriptions. For the reference signs mentioned in the description, please refer to the reference signs in the drawings.
参照图3A,其为根据本发明的基板支架的第一实施例的立体分解图,此基板支架可应用于一研磨装置上,以在研磨装置进行基板240(例如:玻璃基板、晶片等)研磨时,吸附住欲研磨的基板240。Referring to FIG. 3A, it is an exploded perspective view of a first embodiment of a substrate holder according to the present invention. This substrate holder can be applied to a grinding device for grinding a substrate 240 (such as a glass substrate, a wafer, etc.) in the grinding device. , the
此基板支架包括:一定盘210及一固定构件。且固定构件包括研磨垫220与制止件230。The substrate support includes: a
在这里,研磨垫220的一表面贴附于定盘210的表面上,且在研磨垫220上与基板240的尺寸相对应地设置有多个开孔222。制止件230则分别穿过开孔222而设置于定盘210的表面上,并且制止件230突出于研磨垫220,以在制止件230之间形成一容置区域。在进行基板240研磨时,则可将欲研磨的基板240设置于容置区域(即,将欲研磨的基板240限制在制止件230之间),使其吸附于研磨垫220的另一表面。Here, one surface of the
举例来说,参照图3B,当欲研磨一矩形基板240时,研磨垫220上可具有大致上排列于矩形四周的孔洞(图中未示出),制止件230则分别经由研磨垫220上的孔洞而设置于定盘(图中未示出)上,由于制止件230高于研磨垫220,因此可在制止件230之间形成与欲研磨的基板240的尺寸相对应的容置区域,而欲研磨的基板240即可设置于此容置区域上,以利用制止件230限制住欲研磨的基板240的位置。For example, referring to FIG. 3B , when a
研磨垫可为一吸附式研磨垫,并且其可由具有高摩擦系数的材料制成,在一优选实施例中,研磨垫的摩擦系数大于1.3;此外,为发挥此材料的吸附特性,在研磨基板前可先将研磨垫上的水分去除,去除方式例如为刮刀刮干或以气体吹干。The grinding pad can be an adsorption type grinding pad, and it can be made of a material with a high coefficient of friction. In a preferred embodiment, the friction coefficient of the grinding pad is greater than 1.3; The moisture on the polishing pad can be removed first, such as by scraping with a scraper or blowing with air.
在这里,制止件230可设计为一矩形柱体(如图3B所示),此外也可设计为一L形柱体(如图4所示)。当制止件230为矩形柱体时,可分别在欲研磨的基板240的四周设置一个或多个制止件230。而当制止件230为L形柱体时,可利用两个制止件230分别设置于欲研磨的基板240的对角,以达到控制欲研磨的基板240的位置的效果;不过也可在欲研磨的基板240的四脚均设置一个制止件230,来控制欲研磨的基板240的位置。Here, the
其中这些制止件可由塑料材料制成,优选由耐磨且不易变形的材料制成,例如:PC(聚碳酸酯)或PEEK(聚醚醚酮)等材料。并且,这些制止件的高度可以大于等于研磨垫高度加上基板高度,且优选高度近似等于研磨垫高度加上基板高度。These stoppers can be made of plastic materials, preferably wear-resistant and non-deformable materials, such as PC (polycarbonate) or PEEK (polyether ether ketone) and other materials. Moreover, the height of these stoppers can be greater than or equal to the height of the polishing pad plus the height of the substrate, and preferably the height is approximately equal to the height of the polishing pad plus the height of the substrate.
在这里,虽然仅以矩形基板进行详细说明,但也可运用于各种形状的基板,此时只需要与基板的形状、尺寸相配合地设置研磨垫上的开孔,以在制止件设置于开孔内时,可形成对应于基板的形状、尺寸的容置区域。Here, although only a rectangular substrate is used for detailed description, it can also be applied to substrates of various shapes. At this time, it is only necessary to set the openings on the polishing pad in accordance with the shape and size of the substrate, so that when the stopper is arranged in the opening When inside the hole, an accommodating area corresponding to the shape and size of the substrate can be formed.
此外,参照图3A与图5,在研磨垫220上的开孔222可对应于多种尺寸的基板240而设置;换句话说,研磨垫220可配合多种尺寸的基板240,先行设置与多种尺寸的基板相对应的开孔222。举例来说,参考图3A,为方便说明,将外侧开孔222称为第一开孔,而内侧开孔222称为第二开孔;当制止件230分别穿过第一开孔而设置于定盘210的表面上时,所形成的容置区域则可供一种尺寸的基板设置于其上;而当制止件230分别穿过第二开孔而设置于定盘210的表面上时,所形成的容置区域则可供另一种尺寸的基板设置于其上。如此一来,在制造过程中进行换线时,只需改变制止件的设置位置(即由其它开孔设置于定盘上),即可进行不同尺寸的基板的研磨,进而降低制造过程的时间及成本。In addition, referring to FIG. 3A and FIG. 5 , the
虽然本发明以前述的优选实施例披露如上,但是其并非用以限定本发明。本领域技术人员在不脱离本发明的精神和范围内可作多种更动与润饰。因此本发明的专利保护范围需以所附的权利要求书所限定的内容为准。Although the present invention is disclosed above with the aforementioned preferred embodiments, they are not intended to limit the present invention. Various changes and modifications can be made by those skilled in the art without departing from the spirit and scope of the present invention. Therefore, the patent protection scope of the present invention shall be determined by the contents defined in the appended claims.
Claims (17)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CNB2006101693099A CN100453269C (en) | 2006-12-12 | 2006-12-12 | Substrate holder and fixing member thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2006101693099A CN100453269C (en) | 2006-12-12 | 2006-12-12 | Substrate holder and fixing member thereof |
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| CN1962188A CN1962188A (en) | 2007-05-16 |
| CN100453269C true CN100453269C (en) | 2009-01-21 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN100493841C (en) * | 2007-07-25 | 2009-06-03 | 友达光电股份有限公司 | Grinding machine table, bearing jig and operation method of bearing jig |
| CN102717324B (en) * | 2012-05-29 | 2016-05-11 | 深圳莱宝高科技股份有限公司 | Substrate board treatment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1138745A (en) * | 1995-04-10 | 1996-12-25 | 松下电器产业株式会社 | Holding device for substrate to be polished Grinding device for substrate and method for polishing substrate |
| US5960310A (en) * | 1996-12-20 | 1999-09-28 | Samsung Electronics Co., Ltd. | Polishing methods for forming a contact plug |
| JP2001093864A (en) * | 1999-09-24 | 2001-04-06 | Toshiba Corp | Semiconductor wafer fixing jig and method of manufacturing semiconductor device |
| CN2517109Y (en) * | 2001-12-06 | 2002-10-16 | 陈水源 | Positioning ring for wafer grinding |
| CN1672873A (en) * | 2004-03-23 | 2005-09-28 | 力晶半导体股份有限公司 | Pseudo-manufacturing process of chemical-mechanical polishing process and adjustment method of polishing pad |
| JP2006055985A (en) * | 2004-07-20 | 2006-03-02 | Nakamura Tome Precision Ind Co Ltd | Peripheral edge grinding device for disk board |
-
2006
- 2006-12-12 CN CNB2006101693099A patent/CN100453269C/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1138745A (en) * | 1995-04-10 | 1996-12-25 | 松下电器产业株式会社 | Holding device for substrate to be polished Grinding device for substrate and method for polishing substrate |
| US5960310A (en) * | 1996-12-20 | 1999-09-28 | Samsung Electronics Co., Ltd. | Polishing methods for forming a contact plug |
| JP2001093864A (en) * | 1999-09-24 | 2001-04-06 | Toshiba Corp | Semiconductor wafer fixing jig and method of manufacturing semiconductor device |
| CN2517109Y (en) * | 2001-12-06 | 2002-10-16 | 陈水源 | Positioning ring for wafer grinding |
| CN1672873A (en) * | 2004-03-23 | 2005-09-28 | 力晶半导体股份有限公司 | Pseudo-manufacturing process of chemical-mechanical polishing process and adjustment method of polishing pad |
| JP2006055985A (en) * | 2004-07-20 | 2006-03-02 | Nakamura Tome Precision Ind Co Ltd | Peripheral edge grinding device for disk board |
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