CN100505207C - Versatile Platform in Substrate Inspection Units - Google Patents
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- 239000000758 substrate Substances 0.000 title claims abstract description 76
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- 238000006073 displacement reaction Methods 0.000 description 6
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- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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Abstract
Description
技术领域 technical field
本发明涉及基片检查装置,尤其涉及用于液晶显示器(LCD)、等离子显示器板(PDP)或类似物的基片检查装置中的多用途平台,其中在一个平台上可以检查不同尺寸的基片。The present invention relates to a substrate inspection device, and more particularly to a multipurpose platform used in a substrate inspection device for a liquid crystal display (LCD), plasma display panel (PDP) or the like, wherein substrates of different sizes can be inspected on one platform .
背景技术 Background technique
众所周知,在用于检查例如液晶显示器(LCD)、等离子显示板(PDP)以及类似装置这样的平面显示器的玻璃基片的缺陷的装置中,有一种装置,其中宏观观察可以转到微观观察。在宏观观察中,一束照明光线被照射到玻璃基片的表面,并对例如裂纹和污点这样的缺陷部分进行检查;在微观观察中,将在宏观观察中发现的缺陷部位放大,并进行更准确地检查。Known among devices for inspecting defects of glass substrates of flat panel displays such as liquid crystal displays (LCDs), plasma display panels (PDPs) and the like, there is a device in which macroscopic observation can be shifted to microscopic observation. In macroscopic observation, a beam of illuminating light is irradiated onto the surface of the glass substrate, and defective parts such as cracks and stains are inspected; in microscopic observation, defective parts found in macroscopic observation are enlarged and more Exactly check.
在现有技术的用于检查基片的装置中,日本专利公开号第H5-322783披露了一种装置,其中一个基片被放置在可以沿X-Y方向移动的X-Y平台上,该X-Y平台二维地移动到一个具有宏观观测功能的宏观观察系统和一个具有微观观察功能的微观观察系统,该装置不适合用于检查目前尺寸正在不断增大的平面显示器。Among prior art devices for inspecting substrates, Japanese Patent Laid-Open No. H5-322783 discloses a device in which a substrate is placed on an X-Y stage movable in the X-Y direction, and the X-Y stage is two-dimensional Moving to a macroscopic observation system with a macroscopic observation function and a microscopic observation system with a microscopic observation function, this device is not suitable for inspecting flat-panel displays that are currently increasing in size.
为了解决上述基片检查装置的问题,韩国实用新型专利公开号第20-0238929(2001年10月8日)披露了一种装置,其中一个基片被放置在一个可以旋转的平台上,在宏观观察平台被旋转至倾斜的状态下,通过使用来自一个设置在该装置上方的光源的一束照明光进行宏观观察检测,在该可以旋转的平台处于水平的状态下,当沿水平方向在可以旋转的平台上面移动一个具有自备照明装置的微观观察系统时,进行微观观察检测。In order to solve the above-mentioned problems of the substrate inspection device, Korean Utility Model Publication No. 20-0238929 (October 8, 2001) discloses a device in which a substrate is placed on a rotatable platform and viewed macroscopically. When the observation platform is rotated to an inclined state, macroscopic observation and detection are carried out by using a beam of illumination light from a light source arranged above the device. When the rotatable platform is in a horizontal state, when it can be rotated When a microscopic observation system with self-contained lighting device is moved on the platform, the microscopic observation detection is carried out.
然而,上述现有技术的检查基片的装置有一个问题,由于用来固定待检基片的平台被设计为只能用于一种尺寸的基片,如果想要检查其它尺寸的基片,就需要更换一个与所要检查的尺寸相符的平台,或者更换检查装置本身,这对使用者来说是一个增加费用的负担,造成基片的制造成本增加。However, there is a problem with the above-mentioned device for inspecting substrates in the prior art. Since the platform used to fix the substrates to be inspected is designed to be used only for substrates of one size, if it is desired to inspect substrates of other sizes, It is necessary to replace a platform conforming to the size to be inspected, or to replace the inspection device itself, which is a burden of increased cost for the user, resulting in an increase in the manufacturing cost of the substrate.
发明内容 Contents of the invention
相应地,本发明涉及一种基片检查装置中的多用途平台,该多用途平台基本上消除了由于现有技术的局限和缺点而产生的一个或多个问题。Accordingly, the present invention is directed to a multipurpose platform in a substrate inspection apparatus that substantially obviates one or more of the problems due to limitations and disadvantages of the related art.
本发明的一个目的在于提供一种基片检查装置中的多用途平台,其中一个基片固定装置的位置可以通过一个简单的系统和操作进行改变,以便将不同尺寸的基片稳定地固定在一个平台上。An object of the present invention is to provide a multi-purpose platform in a substrate inspection apparatus, in which the position of a substrate holding device can be changed by a simple system and operation in order to stably hold substrates of different sizes on a single substrate. on the platform.
本发明的其他特点和优点将会在后面的说明中描述,本领域普通技术人员通过阅读以下的说明或者通过实施本发明可以部分地了解这些特点和优点。本发明的这些目的和其他优点可以通过本申请的说明书、本申请的保护范围和附图中说明的结构来实现和获得。Other features and advantages of the present invention will be described in the following descriptions, and those skilled in the art can partially understand these features and advantages by reading the following descriptions or by implementing the present invention. These objects and other advantages of the present invention can be realized and obtained by the description of the present application, the protection scope of the present application and the structures illustrated in the accompanying drawings.
为了实现这些目的和其他优点,并且根据本发明的目的,正如具体实施方式中介绍的和这里所概括说明的,该基片检查装置中的多用途平台包括:一个矩形的框架;多个在所述框架上的移位装置,每个移位装置用于对应待检基片的尺寸移动自己的位置;以及在每个移位装置上的固定装置,所述固定装置用于固定或释放基片的角部,其中固定装置包括:多个固定件,可旋转地安装在移位装置上,用于与框架上的基片的一个角接触,和一个固定件操纵装置,与固定件的一侧相连,用于将固定件转动到一个需要的角度,使固定件与基片的角接触,和释放该接触。In order to achieve these objects and other advantages, and according to the object of the present invention, as introduced in the detailed description and summarized here, the multipurpose platform in the substrate inspection device includes: a rectangular frame; The shifting device on the frame, each shifting device is used to move its position corresponding to the size of the substrate to be inspected; and the fixing device on each shifting device, the fixing device is used to fix or release the substrate The corner portion, wherein the fixing device includes: a plurality of fixing members, rotatably mounted on the shifting device, for contacting a corner of the substrate on the frame, and a fixing member manipulator, with one side of the fixing member Connected for turning the fixture to a desired angle, bringing the fixture into corner contact with the substrate, and releasing the contact.
根据本发明,由于通过所述移位装置,用于固定或者释放该框架上的基片的固定装置的位置可以对应于基片的尺寸移动,不同尺寸的基片可以固定在一个平台上或者从该平台上释放。According to the present invention, since the positions of the fixing means for fixing or releasing the substrates on the frame can be moved corresponding to the size of the substrates through the shifting means, substrates of different sizes can be fixed on one platform or from released on this platform.
该移位装置包括:一个在该框架上的第一导向件,一个与该第一导向件连接用于沿第一导向件移动的第一移动板,一个用于沿该第一导向件移动该第一移动板的第一驱动装置,一个沿与该第一导向件的方向不同的方向安装在该第一移动板上的第二导向件,一个与该第二导向件连接用于沿第二导向件移动的第二移动板,和一个用于沿该第二导向件移动该第二移动板的第二驱动装置。The displacement device includes: a first guide on the frame, a first moving plate connected to the first guide for moving along the first guide, and a first moving plate for moving the first guide along the first guide. The first driving device of the first moving plate, a second guide member installed on the first moving plate in a direction different from the direction of the first guide member, and a second guide member connected with the second guide member for moving along the second guide member. a second moving plate moved by the guide, and a second driving device for moving the second moving plate along the second guide.
可以理解,本发明的上述说明和以下的详细说明都是说明性的和解释性的,其目的在于对本发明要求保护的范围提供进一步的解释。It can be understood that the above description and the following detailed description of the present invention are illustrative and explanatory, and the purpose is to provide further explanation for the scope of protection claimed by the present invention.
附图说明 Description of drawings
本发明通过附图来进行进一步的说明,这些附图结合在本申请中并构成本申请的一部分,与说明书一起对本发明的实施例进行说明,阐明本发明的发明构思。在附图中:The present invention is further described by means of the accompanying drawings, which are incorporated in this application and constitute a part of the present application, together with the description, illustrate the embodiments of the present invention and clarify the inventive concept of the present invention. In the attached picture:
图1是说明采用本发明的多用途平台的基片检查装置的一个实例的侧视图;1 is a side view illustrating an example of a substrate inspection apparatus employing the multipurpose platform of the present invention;
图2是根据本发明的一个优选实施例的多用途平台的主视图;Figure 2 is a front view of a multipurpose platform according to a preferred embodiment of the present invention;
图3是图2中的多用途平台的关键部件的部分主视图;Fig. 3 is a partial front view of key components of the multipurpose platform in Fig. 2;
图4是显示图2的多用途平台中的移位装置在一个状态的部分主视图;Fig. 4 is a partial front view showing the shifting device in the multipurpose platform of Fig. 2 in a state;
图5是显示图2的多用途平台中的移位装置在另一状态的部分主视图;Fig. 5 is a partial front view showing the shifting device in the multipurpose platform of Fig. 2 in another state;
图6是图2中的多用途平台中的移位装置的关键部件的剖视图。Fig. 6 is a cross-sectional view of key components of the displacement device in the multipurpose platform in Fig. 2 .
具体实施方式 Detailed ways
现在将详细参照本发明的优选实施例,结合附图对本发明的内容进行详细说明。为了更好地理解本发明的多用途平台,将参照图1说明一个基片检查装置的例子。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will now be described in detail with reference to preferred embodiments of the present invention and with reference to the accompanying drawings. In order to better understand the multipurpose platform of the present invention, an example of a substrate inspection apparatus will be described with reference to FIG. 1 .
如图1所示,该基片检查装置包括:一个平台2,该平台在一个基座部件1的上方可旋转地安装在一个轴2a上,该平台用于固定所要检查的基片(待检基片);一个背光装置3,该背光装置沿上/下方向可移动地安装在平台2与基座部件1的上表面之间,用于将一束光照射到该平台2的背面。As shown in Figure 1, this substrate inspection device comprises: a
为了上/下移动该背光装置3,有一个提升装置,它包括:一个在基座部件1上的底座部件8,用于将背光装置放置在上面;多个连接杆5,该连接杆从下面通过基座部件1与底座部件8连接;和一个提升气缸10,该提升气缸在基座部件1的下面用于沿上/下方向移动一个操作板9。In order to move the backlight unit 3 up/down, there is a lifting device, which includes: a
为了使提升装置将平台2旋转到一个目标角度,连杆13分别与平台2的相对侧通过铰链连接,以便可以自由旋转,一个操纵杆12的一端与连杆13的下端通过铰链连接,以便分别地通过安装在基座部件1下面的电机11转动。这样,当操纵杆12随电机11转动时,与操纵杆12的端部连接的连杆13被折叠或者打开,使平台2旋转。In order to make the hoisting device rotate the
虽然没有显示,但一个微观观察系统可以安装在前述基片检查装置上,以便在进行线性往复运动时,对放置在水平状态的平台上的基片进行微观观察。Although not shown, a microscopic observation system may be mounted on the aforementioned substrate inspection apparatus to perform microscopic observation of a substrate placed on a stage in a horizontal state while performing linear reciprocating motion.
同时,图2示意性地对平台2进行了说明。Meanwhile, FIG. 2 schematically illustrates the
参见图2,平台2包括:一个具有中间开口的矩形框架21,多个固定装置,每个固定装置安装在框架21的角上以便可以沿对角线或者长度方向移动,该固定装置用于固定基片的角部。Referring to Fig. 2,
参见图3,该固定装置包括:一个气缸231;一个操纵杆234,该操纵杆与气缸231上的操作杆232连接,该操纵杆用于随着操作杆232的移动沿LM导向件线性往复移动一定距离;和多个固定件235和236,每个固定件与操纵杆234连接,用于旋转一定角度以便固定或者释放放置在框架21上的基片的一个角部,进行检查。Referring to Fig. 3, the fixing device includes: a
对于固定件235和236,“L”形的固定件235固定基片的一个角的上侧和下侧,而“I”形固定件236固定该角的侧边。Of the
同时,该固定装置安装在一个移位装置上,该移位装置用于在框架21上沿对角线或者长度方向进行选择性的位置移动。以便移动到与待检基片的尺寸相对应的一个位置。At the same time, the fixing device is mounted on a displacement device for selective positional movement on the
该用于改变固定装置的位置的移位装置将参照图5和图6进行更详细地说明。该移位装置包括:在框架21的每个角的一个“L”形凹部22,用以安装该移位装置;多个LM导向件241(该实施例中有三个),LM导向件沿框架的对角线方向安装在“L”形凹部22中;以及一个“L”形的第一移动板243,该移动板在LM导向件241的LM块242上。The displacement means for changing the position of the fixing means will be described in more detail with reference to FIGS. 5 and 6 . The displacement device includes: an "L" shaped
而且,有一个第一气缸245,用于使该第一移动板243沿LM导向件241移动,一个固定块247在该第一气缸245的操作杆246的一端,该固定块固定在第一移动板243的底部。Moreover, there is a
在第一移动板243的上表面上沿框架的长度(或宽度)方向有多个LM导向件251(在该实施例中有两个),在LM导向件251的LM块252上有一个第二移动板253。There are a plurality of LM guides 251 (two in this embodiment) along the length (or width) direction of the frame on the upper surface of the first moving
为了移动该第二移动板253,在第一移动板243的上表面上有一个第二气缸255,一个固定块257在该第二气缸255的操作杆256的一端,该固定块固定在第二移动板253的底部。In order to move this second moving
在基片检查装置的控制单元(未显示)的控制下,当压缩空气被提供到里面时,第一和第二气缸245和255被驱动。Under the control of a control unit (not shown) of the substrate inspection apparatus, when compressed air is supplied inside, the first and
本发明的多用途平台的操作情况将说明如下。The operation of the multipurpose platform of the present invention will be described as follows.
本发明的上述实施例的多用途平台可以固定三种尺寸的基片:(长mm×宽mm)680×880、610×720、600×720。The multipurpose platform of the above embodiments of the present invention can fix substrates of three sizes: (length mm×width mm) 680×880, 610×720, 600×720.
当要将待检基片的尺寸改为610×720以便安装在平台上时,基片检查装置的控制单元将压缩空气提供到第一气缸245,使操作杆246向前移动,并且相应于操作杆246的移动,第一移动板243沿着LM导向件241在对角线方向向前移动,对应于此,(不同)固定装置之间的距离对应于基片的尺寸缩短。When the size of the substrate to be inspected is changed to 610×720 so as to be installed on the platform, the control unit of the substrate inspection device provides compressed air to the
在此状态下,当基片被放置在框架21上时,压缩空气被提供到气缸231,使操作杆232和与之相连的操纵杆234向前移动,固定件235和236旋转固定住基片的角。In this state, when the substrate is placed on the
当要安装尺寸为600×700的基片时,该基片比前面的待检基片短10mm。如前所述,压缩空气被提供到第一气缸245,使第一移动板243沿对角线方向向内移动,压缩空气被提供到第二气缸255,使操作杆256向前移动。然后,该与操作杆256连接的第二移动板253沿着LM导向件251在长度方向上向内移动10mm。When a substrate with a size of 600×700 is to be mounted, the substrate is 10 mm shorter than the previous substrate to be inspected. As previously described, compressed air is supplied to the
在此状态下,当基片被放置在框架21上时,如前所述,当压缩空气被提供到气缸231时,固定件235和236旋转,并固定住基片的角。In this state, when the substrate is placed on the
为了将基片从固定状态释放出来,气缸231上的操作杆232向后移动,沿相反方向旋转固定件。In order to release the substrate from the fixed state, the operating
同时,虽然在前面的实施例中说明了通过在对角线和长度方向移动第一和第二移动板243和253,该平台可以固定三种尺寸的基片,但与该实施例不同的是,也可能通过在宽度和长度、或者在对角线和宽度/长度方向上将第一和第二移动板243和253移动需要的距离,使该平台固定三种尺寸的基片。Meanwhile, although it has been described in the previous embodiment that the stage can fix substrates of three sizes by moving the first and second moving
通过使用其它驱动装置代替气缸,可以容易地实现移动板的逐步移动,用于移动移动板的驱动装置的例子有电机、滚珠丝杠系统、或者皮带和链轮系统、以及类似装置。Stepwise movement of the moving plate can easily be achieved by using other drive means instead of cylinders, examples of drive means for moving the moving plate are motors, ball screw systems, or belt and sprocket systems, and the like.
另外,虽然在前面的实施例中已说明该多用途平台可以固定三种尺寸的待检基片,但通过在不同方向移动固定装置,也可能用该多用途平台固定三种以上的基片,以便进行检查。In addition, although it has been described in the previous embodiments that the multipurpose platform can fix three types of substrates to be inspected, it is also possible to use the multipurpose platform to fix more than three kinds of substrates by moving the fixing device in different directions. for inspection.
正如前面已经说明的,本发明的基片检查装置中的多用途平台能够在不更换基片检查装置或者平台的情况下,通过移动固定装置(该固定装置相应于基片的尺寸固定住基片)的位置,在一个平台上固定不同尺寸的基片,以便进行检查。这样避免了由于更换基片检查装置或者平台造成的费用、时间、和劳动力的浪费。As has been explained above, the multipurpose platform in the substrate inspection device of the present invention can fix the substrate by moving the fixing device (the fixing device is corresponding to the size of the substrate) without changing the substrate inspection device or the platform. ) to fix substrates of different sizes on a platform for inspection. This avoids wasted expense, time, and labor due to replacement of substrate inspection devices or platforms.
以上所述仅为本发明的优选实施例而已,并不用于限制本发明,对于本领域的技术人员来说,本发明可以有各种更改和变化。凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and changes. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.
Claims (9)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2003-0044608A KR100530982B1 (en) | 2003-07-02 | 2003-07-02 | Multi-Stage for Substrate Inspection Device |
| KR1020030044608 | 2003-07-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1576827A CN1576827A (en) | 2005-02-09 |
| CN100505207C true CN100505207C (en) | 2009-06-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2003101001003A Expired - Fee Related CN100505207C (en) | 2003-07-02 | 2003-10-08 | Versatile Platform in Substrate Inspection Units |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR100530982B1 (en) |
| CN (1) | CN100505207C (en) |
| TW (1) | TWI226098B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100670288B1 (en) * | 2005-02-05 | 2007-01-16 | 삼성에스디아이 주식회사 | Jig device for fixing the board, leakage current measuring device having the same, and leakage current measuring method |
| KR100654808B1 (en) * | 2005-07-01 | 2006-12-08 | 삼성전자주식회사 | Panel support device |
| KR100686100B1 (en) * | 2005-07-20 | 2007-02-26 | 엘지전자 주식회사 | Impact test jig for liquid crystal display for mobile communication devices |
| KR101290743B1 (en) * | 2011-10-07 | 2013-07-29 | 삼성중공업 주식회사 | Fixing device for forming curved surface |
| CN103399020A (en) * | 2013-07-24 | 2013-11-20 | 惠晶显示科技(苏州)有限公司 | Glass testing device |
| KR102007907B1 (en) | 2016-07-26 | 2019-08-06 | 에이피시스템 주식회사 | Stage unit and substrate treatment apparatus including the same and processing method using the same |
| KR102184167B1 (en) * | 2020-04-29 | 2020-11-27 | 가온솔루션 주식회사 | Work stage for inspection equipment |
-
2003
- 2003-07-02 KR KR10-2003-0044608A patent/KR100530982B1/en not_active Expired - Fee Related
- 2003-09-30 TW TW092127110A patent/TWI226098B/en not_active IP Right Cessation
- 2003-10-08 CN CNB2003101001003A patent/CN100505207C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100530982B1 (en) | 2005-11-28 |
| TWI226098B (en) | 2005-01-01 |
| TW200503142A (en) | 2005-01-16 |
| CN1576827A (en) | 2005-02-09 |
| KR20050004434A (en) | 2005-01-12 |
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