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CN100590421C - System and method for phase measurement - Google Patents

System and method for phase measurement Download PDF

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CN100590421C
CN100590421C CN200480020838A CN200480020838A CN100590421C CN 100590421 C CN100590421 C CN 100590421C CN 200480020838 A CN200480020838 A CN 200480020838A CN 200480020838 A CN200480020838 A CN 200480020838A CN 100590421 C CN100590421 C CN 100590421C
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CN1826518A (en
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克里斯托弗·M·方严
加布里埃尔·波普斯克
杨昌辉
亚当·P·沃克斯
拉曼查德·R·戴萨瑞
迈克尔·S·费尔德
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Massachusetts Institute of Technology
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Abstract

The preferred embodiments of the present invention are primarily directed to phase measurement systems that address the phase noise problem through a combination of several strategies including, but not limited to, common-path interferometry, phasing references, active stabilization, and differential measurement. Embodiments relate to optical devices for imaging small organisms with light. These embodiments can be applied, for example, in the fields of cell physiology and neuroscience. These preferred embodiments are based on the principles of phase measurement and imaging techniques. Scientific motivation for using phase measurement and imaging techniques stems, for example, from sub-micron levels of cell biology, which can include, without limitation, imaging sources of dysplasia, cellular communication, neuronal transmission, and genetic code execution. The structure and dynamics of subcellular components have not been universally studied in their natural state using existing methods and techniques (including, for example, X-ray and neutron scattering). In contrast, lightwave-based techniques with nanometer resolution allow the study of cellular structures in their native state. Thus, a preferred embodiment of the invention comprises a system based on the principle of interferometry and/or phase measurement and is used to study cell physiology. The system comprises the principle of Low Coherence Interferometry (LCI) using optical interferometry for measuring phase, or the principle of Light Scattering Spectroscopy (LSS) in which interference within cellular components is used, or in the alternative, the principles of LCI and LSS can be combined to obtain the system of the invention.

Description

用于相位测量的系统和方法 Systems and methods for phase measurement

技术领域 technical field

这份申请是美国专利申请第10/823,389号(2004年4月13日提交)的部份后继申请,而第10/823,389号专利是第10/024,455号的部份后继申请(2001年12月18日提交),并且要求美国专利临时申请第60/479,732号(2003年6月19日提交)的权益。This application is a successor-in-part of U.S. Patent Application No. 10/823,389 (filed April 13, 2004), which is a successor-in-part of U.S. Patent Application No. 10/024,455 (filed December 2001 18), and claims the benefit of US Patent Provisional Application No. 60/479,732 (filed June 19, 2003).

上述申请的全部内容在此通过引证被完整地并入。The entire content of the above application is hereby incorporated by reference in its entirety.

背景技术 Background technique

以相位为基础的光学干涉测量技术已被广泛地用于需要亚波长距离灵敏度的光学距离测量。光学距离被定义为折射指数和长度的乘积。然而,大多数这样的技术被在该领域中众所周知的问题限制在能被定义为叙述轴向扫描的干涉图彼此远离方面的困难的2π模糊度或整周模糊度。以未修改的谐波相位为基础的低相干性干涉测量法(LCI)能用来确定差值光学距离(nλ2-nλ1)L,其中L是实际距离,nλ1和nλ2是在各自的波长λ1,λ2下的折射指数,如果光学距离逐渐增加以致用LCI测量的差相位能通过它的2π叠加被跟踪。为了确定溶液中DNA的(nλ2-nλ1),举例来说,DNA浓度在测量试管中逐渐增加。尽管这样的测量方式在受控的环境中正常工作,但是它在样品的可操作性较低的情况下无法实现。例如,该方法对被迫完整保存的固定的厚板材料不起作用。Phase-based optical interferometry techniques have been widely used for optical distance measurements requiring subwavelength distance sensitivity. Optical distance is defined as the product of refractive index and length. However, most such techniques are limited by problems well known in the field to 2π ambiguity or integer ambiguity which can be defined as describing the difficulty in axially scanning interferograms moving away from each other. Low-coherence interferometry (LCI) based on the unmodified harmonic phase can be used to determine the difference optical distance (n λ2 -n λ1 )L, where L is the actual distance and n λ1 and n λ2 are in the respective The refractive index at the wavelength λ 1 , λ 2 , if the optical distance is gradually increased so that the difference phase measured with LCI can be tracked by its 2π superposition. In order to determine (n λ2 −n λ1 ) of DNA in a solution, for example, the DNA concentration is gradually increased in a measuring tube. Although such a measurement works well in a controlled environment, it cannot be achieved when the sample is less manipulable. For example, this method does not work on fixed slab material that is forced to be preserved intact.

问题在于未修改的LCI不能叙述轴向扫描的干涉图彼此远离这一事实,在此被描述为2π模糊度问题。这是困扰大多数基于相位的光学干涉测量技术的问题。因此,这些技术不能完全地确定光学距离。所以,大多数这样的技术被用于诸如计算连续表面的结构或探测随时间改变的距离变化之类的应用,其中相位展开通过在相邻点之间或在小的时间增量之上的相位的比较是可能的。The problem is that unmodified LCI cannot account for the fact that the axially scanned interferograms are far from each other, described here as a 2π ambiguity problem. This is the problem that plagues most phase-based optical interferometry techniques. Therefore, these techniques cannot fully determine the optical distance. Therefore, most such techniques are used in applications such as computing the structure of continuous surfaces or detecting time-varying distance changes, where the phase unwrapping is achieved by the Comparisons are possible.

在许多应用中,重要的是定量地测量透过样品或从样品反射的光波的相位。具体地说,透过生物样品或从生物样品反射的光波的相位光波能在活的或无生命的细胞中形成有效的结构和功能探头。In many applications, it is important to quantitatively measure the phase of light waves transmitted through or reflected from a sample. Specifically, phased light waves transmitted through or reflected from biological samples can form effective probes of structure and function in living or non-living cells.

干涉测量法是用来测量光波的相位的用途广泛的技术。定量的干涉测量法的一个共同问题是对由于诸如振动、空气运动和热漂移之类的外部微扰造成的相位噪声的敏感性。因此,仍然需要解决相位噪音问题的相位测量系统。Interferometry is a widely used technique for measuring the phase of light waves. A common problem with quantitative interferometry is the sensitivity to phase noise due to external perturbations such as vibrations, air motion, and thermal drift. Therefore, there remains a need for a phase measurement system that addresses the phase noise problem.

于涉测量法是得到与样品相关联的相位信息的一种途径。诸如相位对比和Nomarski显微镜之类的技术仅仅作为对比要素使用光学相位,不提供关于它的数量的定量信息。存在一些用来测量透过几乎透明的样品的光波的相位的技术。这些包括数字记录型干涉显微镜(DRIMAPS)和经由强度方程传递的相位分布图的非干涉仪探测。Interferometry is one way to obtain phase information associated with a sample. Techniques such as phase contrast and Nomarski microscopy use optical phase only as a contrast element and do not provide quantitative information about its magnitude. Several techniques exist for measuring the phase of light waves transmitted through a nearly transparent sample. These include digital recording interferometric microscopy (DRIMAPS) and non-interferometric detection of phase profiles delivered via intensity equations.

反射干涉测量法能够有比所用光波的波长小很多的灵敏度。按几分之一纳米或更小比例的测量在度量衡学和微细结构表征方面是常见的。然而,在诸如生物细胞和组织之类微弱反射样品上用纳米级的干涉测量法的已经完成的工作很少。光学相干性断层摄影术(OCT)——使用生物样品的干涉测量技术——主要是与振幅有关而不是与来自反射光波的干涉的相位有关,所以在分辨率方面被局限于所用光波的相干长度,通常是2-20微米。Reflection interferometry can have a sensitivity much smaller than the wavelength of the light wave used. Measurements on the scale of fractions of a nanometer or smaller are common in metrology and microstructural characterization. However, little work has been done using nanoscale interferometry on weakly reflective samples such as biological cells and tissues. Optical coherence tomography (OCT) - an interferometry technique using biological samples - is primarily related to amplitude rather than phase from interference of reflected light waves, so is limited in resolution to the coherence length of the light waves used , usually 2-20 microns.

引用相位的反射干涉测量法已经用来测量单层细胞的体积变化。所用的基于谐波相位的干涉仪需要两个光源,是相对低的(5赫兹),而且在所述带宽有大约20mrad的相位灵敏度。因此,仍然需要解决相位噪声问题并且帮助开发不同的成像应用的有效的相位测量系统。Phase-inducing reflection interferometry has been used to measure volume changes in monolayers of cells. The harmonic phase-based interferometer used requires two light sources, is relatively low (5 Hz), and has a phase sensitivity of about 20 mrad across the bandwidth. Therefore, there remains a need for efficient phase measurement systems that address the phase noise issue and aid in the development of different imaging applications.

发明内容 Contents of the invention

本发明的优选实施方案涉及处理诸如相位噪声之类的问题的相位测量系统,例如,使用包括但不限于共向光程干涉测量法、相位参比、主动稳定和差动测量的若干种策略的组合。实施方案涉及用光波使组织或小的生物体成像的光学装置。这些实施方案能被应用于,例如,细胞生理学和神经科学领域。所述优选的实施方案以相位测量和成像技术的原理为基础。使用相位测量和成像技术的科学动机起源于,例如,亚微米水平的细胞生物学,它能不受限制地包括发育异常、细胞通讯、神经元传输和使用遗传密码的程序的执行的成像源。亚细胞组份的结构和动力学现在不能使用现有的方法和技术(包括,例如,X射线和中子散射)在它们的自然状态进行研究。反之,纳米分辨率的以光波为基础的技术使细胞机器能够在其自然状态进行研究。因此,本发明的优选实施方案包括以干涉测量法和/或相位测量的原理为基础的系统,并且被用于研究细胞生理学。这些系统包括使用光学干涉仪测量相位的低相干性干涉测量法(LCI),或其中使用细胞组份本身之内的干涉光波散射光谱学(LSS)的原理,或在替代方案中,LCI和LSS的原理能被结合起来导致本发明的系统。Preferred embodiments of the invention relate to phase measurement systems that deal with problems such as phase noise, for example, using several strategies including, but not limited to, co-directional optical path interferometry, phase referencing, active stabilization, and differential measurement combination. Embodiments relate to optical devices for imaging tissue or small organisms with light waves. These embodiments can be applied, for example, to the fields of cell physiology and neuroscience. The preferred embodiment is based on the principles of phase measurement and imaging techniques. The scientific motivation to use phase measurement and imaging techniques arises, for example, from cell biology at the submicron level, which can include without limitation imaging sources of developmental abnormalities, cellular communication, neuronal transmission, and execution of programs using the genetic code. The structure and dynamics of subcellular components cannot currently be studied in their native state using existing methods and techniques (including, for example, X-ray and neutron scattering). Conversely, nanometer-resolution light-wave-based techniques enable cellular machinery to be studied in its natural state. Accordingly, preferred embodiments of the present invention include systems based on the principles of interferometry and/or phase measurement and used to study cell physiology. These systems include low-coherence interferometry (LCI), which uses optical interferometers to measure phase, or where the principle of interferometric light-wave scattering spectroscopy (LSS) is used within the cellular components themselves, or, in the alternative, LCI and LSS The principles of can be combined to lead to the system of the present invention.

相位测量和成像系统的优选实施方案包括主动稳定的干涉仪、隔离干涉仪、共向光程干涉仪,而且能包括使用空间光波调制的相衬显微镜。Preferred embodiments of phase measurement and imaging systems include actively stabilized interferometers, isolation interferometers, co-directional optical path interferometers, and can include phase contrast microscopy using spatial light wave modulation.

在优选的实施方案中,本发明的方法涉及优选以亚纳米精度的,基于精确的相位测量任意长的光学距离的技术。本发明的优选实施方案使用有谐波关系的光源(一个连续波(CW)和有低相干性(LC)的第二光源)的干涉仪,例如,Michelson干涉仪。低相干性来源提供宽广的光谱带宽,优选的是,就1微米(μm)的波长而言带宽大于5nm,例如,必需的带宽能随着波长和应用变化。通过在目标样品的扫描之间微调低相干光源的中心波长,在CW和低相干性光波的外差信号之间的相位关系能用来以亚纳米精度测量反射界面之间的分离。因为这种方法是完全没有困扰大多数基于相位的技术的问题——2π模糊度,所以能用来在不降低精度的情况下测量任意长的光学距离。本发明的方法的优选实施方案的应用是在已知实际厚度的样品的给定波长下精确确定样品的折射指数。本发明的方法的优选实施方案的另一个应用是用已知的折射指数精确确定样品的实际厚度。本发明的方法的优选实施方案的进一步的应用是在两个给定的波长下精确确定折射指数比。In a preferred embodiment, the method of the present invention involves the technique of precise phase-based measurement of arbitrarily long optical distances, preferably with sub-nanometer precision. A preferred embodiment of the invention uses an interferometer with harmonically related sources (one continuous wave (CW) and a second source with low coherence (LC)), eg, a Michelson interferometer. Low coherence sources provide broad spectral bandwidth, preferably greater than 5 nm for a wavelength of 1 micrometer (μm), eg, the necessary bandwidth can vary with wavelength and application. By fine-tuning the central wavelength of the low-coherence light source between scans of the target sample, the phase relationship between the heterodyne signals of the CW and low-coherence light waves can be used to measure the separation between reflective interfaces with sub-nanometer precision. Because this method is completely free of the 2π ambiguity that plagues most phase-based techniques, it can be used to measure arbitrarily long optical distances without loss of accuracy. An application of a preferred embodiment of the method of the invention is the precise determination of the refractive index of a sample at a given wavelength of known actual thickness. Another application of the preferred embodiment of the method of the present invention is the precise determination of the actual thickness of a sample using a known index of refraction. A further application of the preferred embodiment of the method of the invention is the precise determination of the refractive index ratio at two given wavelengths.

在其它可能的优选实施方案中,低相干光源提供带宽足够宽的光波,优选大于5nm,以便同时提供各自的中心波长彼此分开大约2nm以上的第一低相干波长和第二低相干波长。所述低相干波长的频谱不充分地重叠。附加的探测器和滤波器被安排在干涉仪中以便传输和探测两个低相干波长。In other possible preferred embodiments, the low-coherence light source provides light waves with a bandwidth sufficiently wide, preferably greater than 5 nm, to simultaneously provide a first low-coherence wavelength and a second low-coherence wavelength with respective center wavelengths separated from each other by more than about 2 nm. The spectrum of the low coherence wavelengths does not sufficiently overlap. Additional detectors and filters are arranged in the interferometer to transmit and detect two low coherence wavelengths.

优选实施方案的方法能用来进行精确的光学距离测量。依据这样的测量结果,目标物体的光学性质能被精确地测量。通过测量目标的色散分布图,可以估计目标的结构和/或化学性质。该色散分布图把各种不同的波长下的折射指数差绘成图。在生物医学背景中,本发明的优选实施方案通过非接触和非侵入的方式精确确定生物组织的色散性质。所述色散测定能用在眼睛的角膜或水样液上。所实现的灵敏度足以探测依葡萄糖浓度而定的光学变化。在本发明方法的优选实施方案中,血液的葡萄糖水平能通过非侵入测量眼睛的水样液和/或玻璃体或角膜的色散分布图被确定下来。本发明的优选实施方案能作为半导体制造中的测量技术被应用于测量在制造集成电路和/或光电部件期间形成的小特征。因为所述方法的优选实施方案是非接触的和非破坏性的,所以能够在制造半导体结构或光学部件的时候监测它们的厚度。The method of the preferred embodiment can be used to make precise optical distance measurements. Based on such measurement results, the optical properties of the target object can be accurately measured. By measuring the dispersion profile of a target, the structural and/or chemical properties of the target can be estimated. The dispersion profile plots the difference in refractive index at various wavelengths. In a biomedical context, preferred embodiments of the present invention provide precise determination of the dispersion properties of biological tissue in a non-contact and non-invasive manner. The dispersion measurement can be used on the cornea or aqueous fluid of the eye. The achieved sensitivity is sufficient to detect optical changes that are dependent on glucose concentration. In a preferred embodiment of the method of the invention, the blood glucose level can be determined by non-invasively measuring the dispersion profile of the aqueous fluid of the eye and/or the vitreous or cornea. Preferred embodiments of the present invention can be applied as a metrology technique in semiconductor manufacturing to measure small features formed during the manufacture of integrated circuits and/or optoelectronic components. Because preferred embodiments of the method are non-contact and non-destructive, the thickness of semiconductor structures or optical components can be monitored while they are being manufactured.

依照本发明使用Mach-Zender外差式干涉仪的优选实施方案,用来测量经过一部分样品的光波的相位的方法包括如下步骤:提供光波的第一波长;沿着第一光程和第二光程引导第一波长的光波,第一光程延伸到要测量的样品媒介物上而第二路径经历路径长度方面的改变,以及探测来自样品媒介物的光波和来自第二光程的光波以便测量光波通过样品媒介物上两个分开的点在相位方面的改变。媒介物包含生物组织,例如,神经元。该方法包括使用光电二极管阵列或与光电二极管耦合的光纤束使样品的相位在众多的位置同时成像。该方法进一步包括在第二光程中频移所述的光波。该方法包括提供发射第一波长的氦氖激光源()或低相干光源。According to a preferred embodiment of the present invention using a Mach-Zender heterodyne interferometer, the method for measuring the phase of a light wave passing through a portion of a sample comprises the steps of: providing a first wavelength of the light wave; The optical path guides light waves of a first wavelength, the first optical path extends onto the sample medium to be measured and the second path undergoes a change in path length, and detects light waves from the sample medium and light waves from the second optical path for measurement The change in phase of a light wave passing through two separate points on a sample medium. The vehicle comprises biological tissue, eg, neurons. The method involves simultaneously imaging the phase of the sample at numerous locations using a photodiode array or a fiber optic bundle coupled to the photodiodes. The method further includes frequency shifting said light waves in a second optical path. The method includes providing a HeNe laser source ( ) or a low coherence light source emitting at a first wavelength.

依照本发明的另一方面,主动稳定的干涉仪被用于测量通过一部分样品的光波的相位的方法,该方法包括如下步骤:提供分别由第一光源和第二光源产生的第一信号和第二信号,第二光源是低相干性来源。该方法包括沿着第一光程和第二光程引导第一信号和第二信号;改变第一光程和第二光程之间的路径长度差;产生指示其间有光程延迟的第一和第二信号之和的输出信号;在干涉仪锁定调制频率下调制该输出信号;以及借助干涉仪锁定相位的时间进展来确定样品的相位。第一和第二信号是两个低相干性信号。该方法进一步包括用混频器或锁定放大器解调第一信号。该方法包括用电子学方法产生干涉仪锁定相位。According to another aspect of the invention, an actively stabilized interferometer is used in a method of measuring the phase of light waves passing through a portion of a sample, the method comprising the steps of: providing a first signal and a second signal generated by a first light source and a second light source, respectively For two signals, the second light source is a low coherence source. The method includes directing a first signal and a second signal along a first optical path and a second optical path; varying a path length difference between the first optical path and the second optical path; generating a first signal indicative of an optical path delay therebetween. an output signal summed with the second signal; modulating the output signal at an interferometer lock modulation frequency; and determining the phase of the sample by means of the time progression of the interferometer lock phase. The first and second signals are two low coherence signals. The method further includes demodulating the first signal with a mixer or a lock-in amplifier. The method includes electronically generating an interferometer-locked phase.

依照本发明的另一方面,双光束反射干涉仪被用于测量经过一部分样品的光波的相位的系统。该系统包括产生第一信号的第一光源;产生靠时间延迟与第一信号分开两个脉冲的第二信号的干涉仪;从干涉仪与样品联系的第一光程和从干涉仪与基准面联系的第二光程;以及依据分别来自样品和基准面的第一和第二信号和从样品和基准面反射的光波之间的干涉测量第一外差信号的探测器系统。该系统包括探测指示样品反射相对于基准面反射的相位的外差信号的相位。第一信号是低相干性信号。光波的第一来源能不受限制地包括超级发光二极管或多模激光二极管之一。干涉仪的第二路径进一步包括第一路径和第二路径,而且第二路径有声光调制器。该系统包括包含光纤的光路。该系统包括隔震的外差Michelson干涉仪。该干涉仪进一步包括附着到平移台上调节光程长度差的反射镜。所述的探测系统包括探测从样品反射的信号的第一探测器和探测从基准面反射的信号的第二探测器。According to another aspect of the invention, a two-beam reflective interferometer is used in a system for measuring the phase of light waves passing through a portion of a sample. The system includes a first light source that generates a first signal; an interferometer that generates a second signal that is two pulses separated from the first signal by a time delay; a linked second optical path; and a detector system for measuring the first heterodyne signal based on the interference between the first and second signals respectively from the sample and the reference surface and light waves reflected from the sample and the reference surface. The system includes detecting a phase of a heterodyne signal indicative of a phase of a sample reflection relative to a reference surface reflection. The first signal is a low coherence signal. The first source of light waves can include without limitation one of a super light emitting diode or a multimode laser diode. The second path of the interferometer further includes the first path and the second path, and the second path has an acousto-optic modulator. The system includes an optical path including optical fibers. The system includes a seismically isolated heterodyne Michelson interferometer. The interferometer further includes mirrors attached to the translation stage to adjust the difference in optical path length. The detection system includes a first detector for detecting signals reflected from the sample and a second detector for detecting signals reflected from the reference surface.

依照另一方面,本发明提供使用相衬显微镜和空间光波调制使样品成像的方法。在各种不同的实施方案中,所述方法包括照亮样品,由于源于照亮样品的光波有低频空间组份和高频空间组份。低频空间组份的相位被偏移以便提供至少三个被移相的低频空间组份。优选的是,相位是按,例如,π/2的增量偏移的,以便产生相移π/2、π和3π/2的低频空间组份。According to another aspect, the invention provides a method of imaging a sample using phase contrast microscopy and spatial light wave modulation. In various embodiments, the method includes illuminating the sample, since light waves originating from illuminating the sample have a low frequency spatial component and a high frequency spatial component. The phases of the low frequency spatial components are shifted to provide at least three phase shifted low frequency spatial components. Preferably, the phase is shifted by, for example, increments of π/2 to produce low frequency spatial components phase shifted by π/2, π and 3π/2.

未偏移的低频空间组份和至少三个被移相的低频空间组份沿着共向光程分开干涉高频空间组份,产生每个分开干涉的强度信号。然后,例如,使用至少四个强度信号产生样品的图像或相位图像。The unshifted low-frequency spatial component and the at least three phase-shifted low-frequency spatial components separately interfere with the high-frequency spatial components along the co-directional optical path, producing an intensity signal for each separately interfered. Then, for example, an image or a phase image of the sample is generated using at least four intensity signals.

依照另一方面,本发明提供非接触式光学测量有反射表面的样品的方法,该方法有如下步骤:提供产生第一信号的第一光源;使用双光束干涉仪产生靠时间延迟与第一信号分开两个脉冲的第二信号;提供从干涉仪与样品联系的第一光程和从干涉仪与基准面联系的第二光程;依据分别来自样品和基准面的第一和第二信号和从样品和基准面反射的光波之间的干涉测量第一外差信号;以及探测指示样品反射相对于基准面反射的相位的外差信号的相位。According to another aspect, the present invention provides a method of non-contact optical measurement of a sample having a reflective surface, the method having the steps of: providing a first light source for generating a first signal; A second signal that separates the two pulses; providing a first optical path from the interferometer to the sample and a second optical path from the interferometer to the reference plane; based on the first and second signals from the sample and reference plane respectively and interferometrically measuring the first heterodyne signal between light waves reflected from the sample and the reference surface; and detecting a phase of the heterodyne signal indicative of a phase of the sample reflection relative to the reference surface reflection.

在优选的实施方案中,第一信号是低相干性信号。第一光源可能是超级发光二极管或多模激光二极管。所述干涉仪进一步包括第一路径和第二路径,第二路径有声光调制器。所述方法进一步包括包含光学光纤的光路。所述样品可能是神经细胞的一部分。In a preferred embodiment, the first signal is a low coherence signal. The first light source may be a super light emitting diode or a multimode laser diode. The interferometer further includes a first path and a second path, the second path having an acousto-optic modulator. The method further includes an optical path comprising an optical fiber. The sample may be a portion of a nerve cell.

在优选的实施方案中,所述干涉仪包括隔震的外差式Michelson干涉仪。该干涉仪进一步包括附着到平移台上可控制地调节光程长度差的反射镜。优选的实施方案包括完成神经膨胀的第一种非接触的和第一种干涉测量法的测量的外差式低相干性干涉仪。神经膨胀的生物物理学机制能依照本发明的优选实施方案使用个别的轴突成像和分析。双光束低相干性干涉仪在测量活细胞的纳米级运动方面可能有许多其它的应用。其它的实施方案能包括以干涉仪为基础探测单一神经元与动作电位相关联的机械变化的显微镜。相关的干涉测量方法也用来测量在被培养的单层细胞中细胞体积变化。In a preferred embodiment, the interferometer comprises a vibration-isolated heterodyne Michelson interferometer. The interferometer further includes mirrors attached to the translation stage to controllably adjust the optical path length difference. A preferred embodiment includes a heterodyne low-coherence interferometer performing the first non-contact and first interferometric measurements of nerve expansion. The biophysical mechanism of nerve expansion can be imaged and analyzed using individual axons according to a preferred embodiment of the present invention. Two-beam low-coherence interferometers may have many other applications in measuring nanoscale motion in living cells. Other embodiments can include interferometer-based microscopy to detect the mechanical changes associated with action potentials in single neurons. A related interferometry method is also used to measure cell volume changes in cultured monolayers.

本发明的另一方面包括用来使样品光学成像的光纤探头,该光纤探头包括有近端和远端的外壳;在外壳的近端与光源耦合的光纤准直仪;以及在外壳远端的折射率渐变透镜,该透镜有第一和第二表面,其中第一表面是基准表面,而且该探头的数值孔径提供来自样品的散射表面的有效的光波聚集。该探头进一步包括装在平移式载物台上的光纤探头以便至少完成二维相位成像和三维共焦相位成像之一。平移式载物台包括扫描压电转换器。探头的数值孔径在大约0.4到0.5的范围内。Another aspect of the present invention includes a fiber optic probe for optically imaging a sample, the fiber optic probe comprising a housing having a proximal end and a distal end; a fiber optic collimator coupled to a light source at the proximal end of the housing; and a A graded index lens having first and second surfaces, wherein the first surface is a reference surface, and the numerical aperture of the probe provides efficient collection of light waves from the diffuse surface of the sample. The probe further includes a fiber optic probe mounted on a translational stage for at least one of two-dimensional phase imaging and three-dimensional confocal phase imaging. The translating stage includes scanning piezoelectric transducers. The numerical aperture of the probe is in the range of about 0.4 to 0.5.

所述的用于相位测量的系统和方法的上述的和其它的特征和优势从下面的在相似的基准字符在不同的视图中处处表示相同的部份的附图中举例说明的系统和方法的优选实施方案的更具体的描述将变得明显。这些图画不必依比例绘制,而是强调举例说明本发明的原理。The above and other features and advantages of the described system and method for phase measurement are illustrated from the following figures of the system and method in which like reference characters denote the same parts everywhere in different views A more specific description of preferred embodiments will become apparent. The drawings are not necessarily to scale, emphasis instead being placed upon illustrating the principles of the invention.

附图说明 Description of drawings

图1是依照本发明测量光学距离的系统的优选实施方案的示意图;Figure 1 is a schematic diagram of a preferred embodiment of a system for measuring optical distances according to the present invention;

图2依照优选实施方案举例说明与反射界面相关联的低相干性外差信号,其中调节低相干性波长压缩或扩展界面周围的外差信号(取决于低相干光源的中心波长的调节方向);Figure 2 illustrates a low coherence heterodyne signal associated with a reflective interface, wherein tuning of the low coherence wavelength compresses or expands the heterodyne signal around the interface (depending on the direction of modulation of the center wavelength of the low coherence source), according to a preferred embodiment;

图3依照优选实施方案举例说明与样品中的两个反射界面相关联的外差信号,其中减少低相干性波长压缩界面周围的外差信号;Figure 3 illustrates heterodyne signals associated with two reflective interfaces in a sample, wherein the heterodyne signal around the low coherence wavelength compressing interface is reduced, according to a preferred embodiment;

图4依照本发明的优选实施方案举例说明有两个界面的样品的扫描,(a)低相干性外差信号,(b)痕迹,其中放大图表示相位条纹,每个条纹与λCW的光学距离相对应,(c)在Δ的两个差值处的痕迹,其中箭头指出相位交点,垂直轴以弧度为单位;Figure 4 illustrates a scan of a sample with two interfaces, (a) a low-coherence heterodyne signal, (b) traces, in accordance with a preferred embodiment of the present invention, where the enlarged view shows phase fringes, each fringe is optically related to λ CW Distance correspondence, (c) Traces at the two differences of Δ, where arrows indicate phase intersections, and the vertical axis is in radians;

图5举例说明依照本发明的优选实施方案确定通过选择使基于SPhase和SfrigE的估计之间的误差减到最少的数值实测的(n775nmL)的正确估计的方法;Figure 5 illustrates a method for determining the correct estimate of (n 775nm L) measured by selecting a value that minimizes the error between S Phase and S frigE based estimates in accordance with a preferred embodiment of the present invention;

图6A和6B是举例说明依照本发明的优选实施方案测量光学距离的方法的流程图;6A and 6B are flowcharts illustrating a method of measuring optical distance according to a preferred embodiment of the present invention;

图7是依照本发明测量光学距离的系统的其它可能的优选实施方案的示意图;Figure 7 is a schematic diagram of other possible preferred embodiments of the system for measuring optical distances according to the present invention;

图8A和8B是举例说明依照本发明的优选实施方案测量光学距离的替代方法的流程图;8A and 8B are flowcharts illustrating alternative methods of measuring optical distance in accordance with a preferred embodiment of the present invention;

图9示意地举例说明测量诸如玻璃板、组织样品或组织层之类光学透明的材料的厚度的基于光纤的系统的优选实施方案;Figure 9 schematically illustrates a preferred embodiment of a fiber optic based system for measuring the thickness of an optically transparent material such as a glass plate, tissue sample or tissue layer;

图10举例说明依照本发明用于玻璃体和/或水样体液葡萄糖测量系统的本发明的系统的优选实施方案;Figure 10 illustrates a preferred embodiment of the system of the present invention for use in a vitreous and/or aqueous humoral glucose measurement system according to the present invention;

图11举例说明主动稳定的Michelson干涉仪,其中依照本发明的优选实施方案M是反射镜,MM是移动反射镜,BS是分光镜,PM是相位调制器,D是探测器,LO是本地振荡源,MX是混频器,S是求和放大器;Figure 11 illustrates an actively stabilized Michelson interferometer where M is a mirror, MM is a moving mirror, BS is a beam splitter, PM is a phase modulator, D is a detector, and LO is a local oscillator according to a preferred embodiment of the invention source, MX is the mixer, S is the summing amplifier;

图12举例说明用于光学延迟相敏低相干性干涉测量法(LCI)的稳定的干涉仪,其中DBS依照本发明的优选实施方案是二色分光镜;Figure 12 illustrates a stabilized interferometer for optical delay phase-sensitive low-coherence interferometry (LCI), wherein the DBS is a dichroic beamsplitter according to a preferred embodiment of the present invention;

图13举例说明当光程长度差ΔL依照本发明的优选实施方案改变时的一对界面的样品解调干涉图,;Figure 13 illustrates sample demodulation interferograms of a pair of interfaces when the optical path length difference ΔL is varied according to a preferred embodiment of the present invention;

图14A举例说明用于稳定的相敏低相干性干涉测量法(LCI)的系统,其中LC1和LC2依照本发明的优选实施方案是低相干性光束;Figure 14A illustrates a system for stable phase-sensitive low-coherence interferometry (LCI), wherein LC1 and LC2 are low-coherence beams according to a preferred embodiment of the present invention;

图14B举例说明依照本发明使用压电转换器产生相位变化的用于主动稳定的相敏低相干性干涉测量法(LCI)的系统的替代实施方案;Figure 14B illustrates an alternative embodiment of a system for actively stabilized phase-sensitive low-coherence interferometry (LCI) in accordance with the present invention using piezoelectric transducers to generate phase changes;

图15A和15B是LC1和LC2的解调的条纹图,其中LC2信号的两个峰依照本发明的优选实施方案代表盖玻片反射(大的)和来自样品的反射(小的);15A and 15B are demodulated fringe plots of LC1 and LC2, where the two peaks of the LC2 signal represent the coverslip reflection (large) and the reflection from the sample (small) according to a preferred embodiment of the invention;

图16举例说明依照本发明的优选实施方案用于稳定的相敏低相干性干涉测量法的成像系统;Figure 16 illustrates an imaging system for stable phase-sensitive low-coherence interferometry in accordance with a preferred embodiment of the present invention;

图17举例说明用于二维相位成像的展开的光学设计,其中依照本发明的优选实施方案,实线表示入射光线,而虚线表示反向散射的光线;Figure 17 illustrates an unwrapped optical design for two-dimensional phase imaging, wherein solid lines represent incident light rays and dashed lines represent backscattered light rays, in accordance with a preferred embodiment of the present invention;

图18A依照本发明的优选实施方案举例说明两点Mach-Zender外差干涉仪;Figure 18A illustrates a two-point Mach-Zender heterodyne interferometer according to a preferred embodiment of the present invention;

图18B依照本发明的优选实施方案举例说明成像Mach-Zender外差干涉仪;Figure 18B illustrates an imaging Mach-Zender heterodyne interferometer in accordance with a preferred embodiment of the present invention;

图18C举例说明与参照图18B描述的实施方案相关联的外差信号和选通信号;Figure 18C illustrates the heterodyne and gating signals associated with the embodiment described with reference to Figure 18B;

图18D依照本发明的优选实施方案举例说明成像双光束外差式干涉仪;Figure 18D illustrates an imaging two-beam heterodyne interferometer in accordance with a preferred embodiment of the present invention;

图19依照本发明的优选实施方案举例说明隔离的双光束外差式低相干性干涉仪;Figure 19 illustrates an isolated two-beam heterodyne low-coherence interferometer in accordance with a preferred embodiment of the present invention;

图20依照本发明的优选实施方案举例说明双基准面外差式低相干性干涉仪;Figure 20 illustrates a dual datum heterodyne low coherence interferometer according to a preferred embodiment of the present invention;

图21依照本发明的优选实施方案举例说明光学参比干涉仪的优选实施方案;Figure 21 illustrates a preferred embodiment of an optical reference interferometer in accordance with a preferred embodiment of the present invention;

图22依照本发明的优选实施方案示意地举例说明由于作为抽样对象的基准面点位于同一表面(玻璃)上造成的实测相位的组份;Figure 22 schematically illustrates the components of the measured phase due to the fact that the datum point as the sampling object is located on the same surface (glass) according to a preferred embodiment of the present invention;

图23A和23B依照本发明的优选实施方案就参照图21举例说明的实施方案分别图解式地举例说明压电转换器(PZT)的电压和对应的相位变化;23A and 23B diagrammatically illustrate the voltage and corresponding phase changes of a piezoelectric transducer (PZT), respectively, for the embodiment illustrated with reference to FIG. 21 , in accordance with a preferred embodiment of the present invention;

图24依照图21举例说明的干涉仪以弧度为单位图解式地举例说明噪声性能;Figure 24 graphically illustrates noise performance in units of radians in accordance with the interferometer illustrated in Figure 21;

图25A和25B是依照本发明的优选实施方案用于样品信号和基准面信号的标定组件的示意表达;25A and 25B are schematic representations of calibration components for sample and datum signals in accordance with a preferred embodiment of the present invention;

图26示意地举例说明依照本发明的优选实施方案的干涉仪系统的优选实施方案;Figure 26 schematically illustrates a preferred embodiment of an interferometer system according to a preferred embodiment of the present invention;

图27举例说明依照本发明的优选实施方案测量神经位移的系统的示意图;Figure 27 illustrates a schematic diagram of a system for measuring nerve displacement in accordance with a preferred embodiment of the present invention;

图28A和28B依照本发明的优选实施方案图解式地举例说明有关于时间(ms)的神经位移(nm)和电势(μV);28A and 28B graphically illustrate neural displacement (nm) and potential (μV) with respect to time (ms), according to a preferred embodiment of the present invention;

图29依照本发明的优选实施方案图解式地举例说明单一神经的峰值电势(十字)和位移(圆),其中变量刺激电流振幅;Figure 29 schematically illustrates peak potentials (crosses) and displacements (circles) of a single nerve with variable stimulus current amplitudes in accordance with a preferred embodiment of the present invention;

图30举例说明依照本发明的优选实施方案用于双光束干涉仪的扫描系统的光学设计;Figure 30 illustrates the optical design of a scanning system for a two-beam interferometer in accordance with a preferred embodiment of the present invention;

图31举例说明依照本发明的优选实施方案检流计位置和使用Lissajous扫描从空的盖玻片收集的相位数据;Figure 31 illustrates galvanometer positions and phase data collected from empty coverslips using Lissajous scanning in accordance with a preferred embodiment of the present invention;

图32A和32B依照本发明的优选实施方案分别举例说明使用在图31中表现和图解式举例说明的数据的相位图像的彩色映射图和回射强度图像;Figures 32A and 32B illustrate a color map and a retroreflected intensity image, respectively, of a phase image using the data represented and graphically illustrated in Figure 31, in accordance with a preferred embodiment of the present invention;

图33示意地举例说明借助本发明的优选实施方案解决的聚焦问题;Figure 33 schematically illustrates the focus problem solved by means of the preferred embodiment of the present invention;

图34举例说明依照本发明的优选实施方案用于双焦透镜的设计;Figure 34 illustrates a design for a bifocal lens according to a preferred embodiment of the present invention;

图35举例说明依照本发明的优选实施方案用于双焦透镜的替代设计;Figure 35 illustrates an alternative design for a bifocal lens in accordance with a preferred embodiment of the present invention;

图36举例说明依照本发明的优选实施方案计算透镜f3(双焦透镜)和f2之间的最佳距离;Figure 36 illustrates the calculation of the optimum distance between lenses f3 (bifocal lens) and f2 according to a preferred embodiment of the present invention;

图37举例说明依照本发明的优选实施方案制造双焦透镜;Figure 37 illustrates the fabrication of a bifocal lens in accordance with a preferred embodiment of the present invention;

图38举例说明依照本发明的优选实施方案,当物镜向玻璃盖玻片扫描时通过光学循环器测量的回射强度;Figure 38 illustrates retroreflected intensity measured by an optical circulator as an objective lens is scanned towards a glass coverslip, in accordance with a preferred embodiment of the present invention;

图39举例说明依照本发明的优选实施方案,回射强度随使用双焦透镜f3的物镜焦点位置变化;Figure 39 illustrates retroreflection intensity as a function of focus position of an objective using bifocal lens f3, in accordance with a preferred embodiment of the present invention;

图40举例说明依照本发明的优选实施方案在两种盖玻片反射的情况下,回射强度随使用双焦透镜的物镜焦点位置变化;Figure 40 illustrates retroreflection intensity as a function of focus position of an objective using a bifocal lens for two coverslip reflections in accordance with a preferred embodiment of the present invention;

图41举例说明依照本发明的优选实施方案,当f2和f3之间的距离被调节到与在前后玻璃表面之间的空隙相配时,在两种盖玻片反射的情况下回射强度随使用双焦透镜的物镜焦点位置变化;Fig. 41 illustrates, in accordance with a preferred embodiment of the present invention, when the distance between f2 and f3 is adjusted to match the gap between the front and rear glass surfaces, the retroreflection intensity varies with the use of two coverslip reflections. The focus position of the objective lens of the bifocal lens changes;

统称为图42的图42A和42B依照本发明的优选实施方案举例说明由于轴向的和边缘的光束在光学系统中耦合形成额外的较小的峰;Figures 42A and 42B, collectively referred to as Figure 42, illustrate the formation of additional smaller peaks due to axial and marginal beam coupling in an optical system, in accordance with a preferred embodiment of the present invention;

图43A举例说明依照本发明的优选实施方案作为整体元件有基准面表面的双光束探头;Figure 43A illustrates a dual beam probe having a datum surface as a monolithic element in accordance with a preferred embodiment of the present invention;

图43B是双光束干涉仪探头的另一个优选实施方案;Figure 43B is another preferred embodiment of a dual-beam interferometer probe;

图43C是两个神经纤维的图像;Figure 43C is an image of two nerve fibers;

图43D是外差信号振幅作为位置的函数的图像;Figure 43D is a graph of heterodyne signal amplitude as a function of position;

图43E是在图43D中见到的同一样品的反射相位图像;Figure 43E is a reflection phase image of the same sample seen in Figure 43D;

图44是依照本发明的优选实施方案,适用于研究在动作电位期间在神经中观察到的位移效果的几何学的双光束探头的图表示例;Figure 44 is a schematic illustration of a dual-beam probe suitable for studying the geometry of displacement effects observed in nerves during action potentials, in accordance with a preferred embodiment of the present invention;

图45是依照本发明的优选实施方案用来通过扫描探头或样品成像的双光束探头系统;Figure 45 is a dual beam probe system for imaging by scanning the probe or sample in accordance with a preferred embodiment of the present invention;

图46A-46C举例说明依照本发明的优选实施方案,使用双焦双光束显微镜从干燥的人类面颊上皮细胞反向散射的光波的强度图像、相位图像和明视场图像;46A-46C illustrate intensity, phase, and bright field images of light waves backscattered from dried human buccal epithelial cells using a bifocal two-beam microscope, in accordance with a preferred embodiment of the present invention;

图46D-46G举例说明在图43中举例说明的双光束显微镜的轮廓曲线测定能力,其中图46D是图46E举例说明的平凸透镜系统的中心部分的强度图像,图46F是反射光波的相位映射图,而图46G是相位图像的横截面,依照本发明的优选实施方案通过二次拟合展开的相位。Figures 46D-46G illustrate the profiling capabilities of the dual beam microscope exemplified in Figure 43, where Figure 46D is an intensity image of the central portion of the plano-convex lens system illustrated in Figure 46E, and Figure 46F is a phase map of reflected light waves , while Figure 46G is a cross-section of a phase image, phase unfolded by quadratic fitting according to a preferred embodiment of the present invention.

图47A-47E依照本发明的优选实施方案分别举例说明移相干涉测量法系统的示意图、相位步进和桶式整合;47A-47E illustrate a schematic diagram of a phase shifting interferometry system, phase stepping and barrel integration, respectively, in accordance with a preferred embodiment of the present invention;

图48A-48C分别举例说明依照本发明的优选实施方案的频闪式外差干涉测量系统和桶式整合的原理;48A-48C illustrate the principle of stroboscopic heterodyne interferometry system and barrel integration, respectively, according to a preferred embodiment of the present invention;

图49A举例说明依照本发明的优选实施方案的双光束频闪式外差干涉仪;Figure 49A illustrates a two-beam stroboscopic heterodyne interferometer in accordance with a preferred embodiment of the present invention;

图49B和49C举例说明表现依照本发明的优选实施方案的双光束探头聚焦在静止的玻璃表面上的相位噪声的数据;49B and 49C illustrate data representing the phase noise of a dual-beam probe focused on a stationary glass surface in accordance with a preferred embodiment of the present invention;

图50A举例说明另一个优选实施方案,其中来自分开的路径的光波被引向公共路径而且被聚焦在被测量的材料的不同区域;Figure 50A illustrates another preferred embodiment in which light waves from separate paths are directed towards a common path and are focused on different regions of the material being measured;

图50B是使用图50A所示系统的双光束系统的优选实施方案;Figure 50B is a preferred embodiment of a dual beam system using the system shown in Figure 50A;

图50C提供关于在图50B举例说明的系统之内的偏振组份的细节;Figure 50C provides details about the polarization components within the system illustrated in Figure 50B;

图51A-51D是这种依照本发明的优选实施方案的图像描述的各种特征的示意表达;Figures 51A-51D are schematic representations of various features of such image descriptions in accordance with a preferred embodiment of the present invention;

图52示意地举例说明依照本发明以透射几何学为基础的显微镜系统的各种不同的实施方案;Figure 52 schematically illustrates various embodiments of microscope systems based on transmission geometry in accordance with the present invention;

图53示意地举例说明依照本发明以反射几何学为基础的显微镜系统的各种不同的实施方案;Figure 53 schematically illustrates various embodiments of microscope systems based on reflection geometry in accordance with the present invention;

统称为图54的图54A和54B示意地举例说明用光学显微镜整合本发明的各种实施方案的一个实施方案;Figures 54A and 54B, collectively referred to as Figure 54, schematically illustrate one embodiment of integrating various embodiments of the present invention with an optical microscope;

图55示意地举例说明本发明利用4-f系统的系统和方法的各种不同的实施方案;Figure 55 schematically illustrates various embodiments of the systems and methods of the present invention utilizing the 4-f system;

图56示意地举例说明依照本发明利用空间光波调制(SLM)的相衬显微镜系统的一个实施方案;Figure 56 schematically illustrates one embodiment of a phase contrast microscope system utilizing spatial lightwave modulation (SLM) in accordance with the present invention;

图57A和57B依照本发明的优选实施方案示意地举例说明在振幅模式和相位模式中在图像的象素上的光电效应;Figures 57A and 57B schematically illustrate the photoelectric effect on a pixel of an image in amplitude mode and phase mode, in accordance with a preferred embodiment of the present invention;

图58A-58C是依照本发明的优选实施方案操作的SLM模式的各种不同的实施方案的方框图;58A-58C are block diagrams of various embodiments of SLM modes of operation in accordance with a preferred embodiment of the present invention;

图59是依照本发明的优选实施方案针对按振幅模式操作的仪器获得的标定曲线的例子;Figure 59 is an example of a calibration curve obtained for an instrument operating in amplitude mode in accordance with a preferred embodiment of the present invention;

图60A-60D展示依照本发明的优选实施方案使用反射几何学的系统在四种不同的相位移动下获得的图像;60A-60D show images acquired at four different phase shifts by a system using reflection geometry in accordance with a preferred embodiment of the present invention;

图61示意地举例说明依照本发明的优选实施方案在电磁场矢量E和电磁场的高频波矢量组份EH和电磁场的低频波矢量组份EL之间的关系;Figure 61 schematically illustrates the relationship between the electromagnetic field vector E and the high frequency wave vector component E H of the electromagnetic field and the low frequency wave vector component E L of the electromagnetic field according to a preferred embodiment of the present invention;

图62是依照本发明的优选实施方案使用例如在图35A-35D和等式55中举例说明的数据产生的标定样品的Δφ图像;Figure 62 is a Δφ image of a calibration sample generated using data such as illustrated in Figures 35A-35D and Equation 55 in accordance with a preferred embodiment of the present invention;

图63是使用依照本发明的系统和方法的实施例1的标定样品的相位图像;Figure 63 is a phase image of a calibration sample of Example 1 using the systems and methods in accordance with the present invention;

图64展示依照本发明的优选实施方案使用透射几何学获得的相位图像;Figure 64 shows a phase image obtained using transmission geometry in accordance with a preferred embodiment of the present invention;

图65展示依照本发明的优选实施方案获得的洋葱细胞强度图像;Figure 65 shows onion cell intensity images obtained in accordance with a preferred embodiment of the present invention;

图66展示依照本发明使用透射几何学获得的洋葱细胞相位图像;Figure 66 shows an onion cell phase image obtained using transmission geometry in accordance with the present invention;

图67依照优选的实施方案举例说明实验装备,其中VPS是虚拟的点光源;CL是矫正透镜;IP是成像平面;P是偏光波镜;BS是光束分离器;FL是傅立叶透镜;PPM是可编程的相位调制器;CCD是电荷耦合器件,PC是个人计算机;67 illustrates the experimental setup according to a preferred embodiment, wherein VPS is a virtual point source; CL is a correction lens; IP is an imaging plane; P is a polarizer; BS is a beam splitter; FL is a Fourier lens; Programmed phase modulator; CCD is charge-coupled device, PC is personal computer;

图68A和68B举例说明依照优选的实施方案使用10×显微镜物镜获得的关于聚苯乙烯微球浸没在100%丙三醇中的实验结果,其中图68A是强度图像,图68B是定量的相位图像。彩色条代表以nm表达的相位;Figures 68A and 68B illustrate experimental results for polystyrene microspheres immersed in 100% glycerol obtained using a 10x microscope objective according to a preferred embodiment, wherein Figure 68A is an intensity image and Figure 68B is a quantitative phase image . Colored bars represent phase expressed in nm;

图69A-69C举例说明依照优选实施方案使用40×显微镜物镜获得的LCPM图像,其中图69A是经历有丝分裂的HE1A癌细胞的相位图像,图69B是整个血涂片的相位图像,而图69C是与缺乏细胞的点相关联的瞬时相位变动(标准偏差σ被指出)。彩色条代表以nm表达的相位。69A-69C illustrate LCPM images obtained using a 40× microscope objective according to a preferred embodiment, wherein FIG. 69A is a phase image of HE1A cancer cells undergoing mitosis, FIG. 69B is a phase image of an entire blood smear, and FIG. 69C is a phase image with Points lacking cells are associated with instantaneous phase shifts (standard deviation σ is indicated). Colored bars represent phase expressed in nm.

具体实施方式 Detailed ways

用于距离测量的谐波干涉测量法:Harmonic interferometry for distance measurement:

本发明涉及以相位相交为基础测量光学距离的系统和方法,所述系统和方法通过在干涉仪中引进色散不平衡解决整数或2π模糊度问题。所述方法的优选实施方案能精确测量表面上两个毗连的点的相对高度差。此外,业已发现样品的折射指数的准确度仅仅受实验测量样品实际厚度的精度的限制。The present invention relates to a system and method for measuring optical distance based on phase intersection, which solves the integer or 2π ambiguity problem by introducing dispersion imbalance in the interferometer. A preferred embodiment of the method is capable of accurately measuring the relative height difference of two adjoining points on a surface. Furthermore, it has been found that the accuracy of the refractive index of the sample is only limited by the accuracy of the experimental measurement of the actual thickness of the sample.

在基于谐波相位的干涉测量法(HPI)中用连续波(CW)光源代替其中一个低相干光源允许使用相关联的CW外差信号作为测量低相干性外差信号的光学标尺的形式。低相干光源提供光谱带宽,例如,对于1微米波长大于5nm。使用所述改进的HPI的优势之一是实测相位现在对长度标尺nL而不是对(nλ2-nλ2)L敏感,其中n是在低相干波长下的折射指数。数量n实际上比合成数量(nλ2-nλ2)有用得多。通过把低相干波长略微调节,例如,大约2nm,人们能发现数值nL没有2π模糊度而有亚纳米级的灵敏度。这种方法使用CW外差干涉信号作为测量光学距离的基准面光学标尺。Replacing one of the low coherence light sources with a continuous wave (CW) light source in harmonic phase based interferometry (HPI) allows the use of the associated CW heterodyne signal as a form of optical scale for measuring the low coherence heterodyne signal. Low coherence light sources provide spectral bandwidth, for example greater than 5 nm for 1 micron wavelength. One of the advantages of using the improved HPI is that the measured phase is now sensitive to the length scale nL instead of (n λ2 −n λ2 )L, where n is the refractive index at low coherence wavelengths. The quantity n is actually much more useful than the composite quantity (n λ2 -n λ2 ). By adjusting the low-coherence wavelength slightly, for example, around 2nm, one can find the value nL without 2π ambiguity but with sub-nanometer sensitivity. This method uses the CW heterodyne interference signal as a datum optical scale for measuring optical distance.

使用容易得到的低相干光源测量干涉光学距离的系统已实现大约几十个波长的分辨率。尽管这种技术是比较不敏感的,但是它不必解决2π模糊度问题。优选实施方案包括使用相位以亚纳米精度测量任意长的光学距离的低相干性干涉测量法。这种方法使用低相干性相位相交技术来确定整数干涉条纹并且使用来自测量的附加的相位信息来准确地获得分数条纹。除此之外,它提供深度分辨率并且能被用于成层样品的X射线断层剖面测定。因为所述方法能精确测量长的光学距离,所以它能用来准确地确定众多材料的折射指数。因为这是基于相位的方法,所以这样发现的折射指数是相位折射指数而不是群体折射指数。Systems for measuring interferometric optical distances using readily available low-coherence light sources have achieved resolutions on the order of tens of wavelengths. Although this technique is relatively insensitive, it does not have to resolve the 2π ambiguity problem. Preferred embodiments include low-coherence interferometry using phase to measure arbitrarily long optical distances with sub-nanometer precision. This method uses a low-coherence phase intersection technique to determine integer interference fringes and additional phase information from the measurements to accurately obtain fractional fringes. Among other things, it provides depth resolution and can be used for X-ray tomographic profiling of layered samples. Because the method can accurately measure long optical distances, it can be used to accurately determine the refractive index of numerous materials. Since this is a phase-based approach, the refractive index thus found is a phase refractive index rather than a population refractive index.

图1举例说明本发明的包括改进的Michelson干涉仪的系统10的优选实施方案。输入光波12是由来自Ti:蓝宝石激光器的(例如,以775.0nm发射的)150-fs锁模光波和来自例如半导体激光器的连续波(CW)1550.0nm的光波组成的双色复合光束。在优选的实施方案中,所述方法根据CW波长(在这个实施方案中准确地说是1550.0nm)算出光学距离,而且所有的光学距离都是基于这个基础计算的。复合光束在分光镜14处被一分为二。一部份信号入射到目标样品16上,而另一部分入射到优选以(例如)大约0.5毫米/秒的速度移动的基准反射镜32上,后者在基准光束34上诱发多普勒偏移。多普勒偏移可以是用其它装置诱发的,例如,通过使用电光调制器。背反射的光束在分光镜14处被再次结合,借助二向色镜18被分成它们的波长组份,而且被光电探测器20、22分开测量。由此产生的信号借助模数转换器(ADC)24(例如,16位100kHz的A/D转换器)数字化。诸如个人计算机(PC)26之类的数据处理器与ADC24通信,以便进一步处理数据。由此产生的外差信号在它们各自的多普勒偏移频率下有在它们各自的中心外差频率周围的通频带而且被进行Hilbert变换以便推断出外差信号对应的相位,φCW和φLC。下标CW和LC分别表示1550.0nm的连续波组份和775.0nm的低相干性波长组份。Figure 1 illustrates a preferred embodiment of a system 10 of the present invention comprising a modified Michelson interferometer. The input light wave 12 is a two-color composite beam consisting of a 150-fs mode-locked light wave (e.g. emitting at 775.0 nm) from a Ti:sapphire laser and a continuous wave (CW) 1550.0 nm light wave from a semiconductor laser, for example. In a preferred embodiment, the method calculates the optical distance based on the CW wavelength (1550.0 nm to be precise in this embodiment), and all optical distances are calculated on this basis. The composite beam is split in two at the beam splitter 14 . A portion of the signal is incident on the target sample 16 and another portion is incident on a reference mirror 32 which induces a Doppler shift in the reference beam 34, preferably moving at a speed of, for example, about 0.5 mm/sec. Doppler shift can be induced by other means, for example, by using electro-optic modulators. The back-reflected light beams are recombined at the beam splitter 14 , split into their wavelength components by means of the dichroic mirror 18 and measured separately by the photodetectors 20 , 22 . The resulting signal is digitized by means of an analog-to-digital converter (ADC) 24 (for example, a 16-bit 100 kHz A/D converter). A data processor, such as a personal computer (PC) 26, communicates with ADC 24 for further processing of the data. The resulting heterodyne signals have passbands around their respective central heterodyne frequencies at their respective Doppler-shifted frequencies and are Hilbert transformed to deduce the corresponding phases of the heterodyne signals, φ CW and φ LC . The subscripts CW and LC represent the continuous wave component of 1550.0 nm and the low coherence wavelength component of 775.0 nm, respectively.

然后,把低相干性光波的中心波长调节大约1-2nm,而且测量第二组φCW和φLC数值。依据这两组读数,能以亚纳米精度使目标样品中的各种不同的界面定域。用于定域的数据处理在下文予以描述。Then, adjust the center wavelength of the low-coherence light wave by about 1-2nm, and measure the second set of φ CW and φ LC values. From these two sets of readouts, various interfaces in the sample of interest can be localized with sub-nanometer precision. Data processing for localization is described below.

考虑由距分光镜14未知距离x1的单一界面所组成的样品。从分光镜14到基准反射镜32的距离x在基准反射镜的扫描中在每个时间点都是已知量。Consider a sample consisting of a single interface at an unknown distance x 1 from beamsplitter 14 . The distance x from beamsplitter 14 to reference mirror 32 is a known quantity at each point in time during the scan of the reference mirror.

寻找x1的近似值的方法是通过在重新组合的低相干性光束中扫描x和监测由此产生的外差信号。当x近似等于x1的时候,外差信号振幅的峰值是预期的。这种方法的精确度受光源的相干长度LC和外差信号的信噪比质量限制。在现实的实验条件下,确定的x1的误差不可能好于相干长度的五分之一。An approximation of x is found by scanning x in the recombined low-coherence beam and monitoring the resulting heterodyne signal. The peaking of the heterodyne signal amplitude is expected when x is approximately equal to x1 . The accuracy of this method is limited by the coherence length L C of the light source and the signal-to-noise quality of the heterodyne signal. Under realistic experimental conditions, the error in determining x1 cannot be better than one-fifth of the coherence length.

假定典型的低相干光源的相干长度名义上是大约10μm。这意味着所述确定长度的方法的误差被限制到大约2μm。Assume that the coherence length of a typical low-coherence light source is nominally about 10 μm. This means that the error of the method for determining the length is limited to approximately 2 μm.

在考虑外差信号的相位时,检测到的外差信号的不同组份能被表示成:When considering the phase of the heterodyne signal, the different components of the detected heterodyne signal can be expressed as:

II heterodyneheterodyne == EE. refref ee ii (( 22 kxx -- ωtωt )) EE. sigsig ee -- ii (( 22 kxx 11 -- ωtωt )) ++ cc .. cc ..

== 22 EE. refref EE. sigsig coscos (( 22 kk (( xx -- xx 11 )) )) -- -- -- (( 11 ))

其中ErEf和Esig分别是基准电磁场振幅和信号电磁场振幅,k是光学波数,ω是光学频率。指数中的因子2表示光波两次经过该路径即照射到反射镜/样品和返回分光镜。Where ErEf and E sig are the reference electromagnetic field amplitude and the signal electromagnetic field amplitude respectively, k is the optical wavenumber, and ω is the optical frequency. A factor of 2 in the index means that the light wave travels the path twice, hitting the mirror/sample and returning to the beamsplitter.

请注意,当x精确地与x1相配的时候,外差信号被期望达到峰值。两个返回的光束处在相长干涉之中。所以,这个性质被用来定域界面。x1是通过寻找两个光束处于相长干涉时的x数值找到的。由于相位能被准确地测量,所以这种方法给出大约5nm的长度灵敏度。不幸的是,这种方法是需要加强计算的,因为有多个外差信号达到峰值的x值;明确地说,外差信号在x满足下式的时候达到峰值:Note that the heterodyne signal is expected to peak when x matches x1 exactly. The two returning beams are in constructive interference. Therefore, this property is used to localize the interface. x1 is found by finding the value of x where the two beams are in constructive interference. Since the phase can be accurately measured, this method gives a length sensitivity of about 5 nm. Unfortunately, this approach is computationally intensive because there are multiple values of x at which the heterodyne signal peaks; specifically, the heterodyne signal peaks when x satisfies:

x=x1+aλ/2            (2)x=x 1 +aλ/2 (2)

其中a是整数,λ是光学波长。这是2π模糊度问题的表现。where a is an integer and λ is the optical wavelength. This is a manifestation of the 2π ambiguity problem.

优选的实施方案包括辨别正确的峰的方法。请注意,当x确切地等于x1的时候,不管光学波长,外差信号达到峰值。另一方面,如同在图2中举例说明的那样,后来的峰取决于波长。图2举例说明与样品中的反射界面52相关联的低相干性外差信号。所以,通过调节低相干性波长,该外差信号被压缩在界面和与能确切地区别x-x1的情形相关联的正确的峰的周围。人们应该注意到外差信号可能在界面周围被压缩或扩展,取决于调节方向。肉眼观察定域的直观方法是画出挤进x确切地等于x1的条纹或远离x确切地等于x1的条纹扩展的外差信号。Preferred embodiments include methods to identify the correct peak. Note that the heterodyne signal peaks when x is exactly equal to x1 , regardless of the optical wavelength. On the other hand, as illustrated in Fig. 2, the later peaks depend on the wavelength. Figure 2 illustrates a low coherence heterodyne signal associated with a reflective interface 52 in a sample. So, by adjusting the low coherence wavelength, the heterodyne signal is compressed around the interface and the correct peak associated with the case that xx 1 can be clearly distinguished. One should note that the heterodyne signal may be compressed or expanded around the interface, depending on the direction of accommodation. An intuitive way to observe localization with the naked eye is to draw the heterodyned signal squeezed into or extended away from the fringes where x is exactly equal to x1 .

由于以下两个原因在所述定域方法中需要CW光源。第一,实际上在干涉仪中绝对准确地识别该数值是非常困难的。干涉仪的CW组份允许在扫描基准反射镜的时候,非常精确地测量x。在特定的优选实施方案中,为了确定样品中两个界面之间的距离,数出发生在x1等于到图1所示的第一界面的距离的位置和x2(x2=x1+nL,其中n是样品的折射指数)等于到第二界面的距离的位置之间的CW干涉条纹的数目。图3举例说明与样品中两个反射界面相关联的外差信号。调节低相干性波长把外差信号78、80压缩82、84到界面周围。A CW light source is required in the localized approach for two reasons. First, it is very difficult to identify this value with absolute accuracy in practical interferometers. The CW component of the interferometer allows very precise measurements of x while scanning the reference mirror. In a particularly preferred embodiment, in order to determine the distance between two interfaces in a sample, the positions occurring at x 1 equal to the distance to the first interface shown in FIG. 1 and x 2 (x 2 =x 1 + nL, where n is the refractive index of the sample) is the number of CW interference fringes between positions equal to the distance to the second interface. Figure 3 illustrates the heterodyne signal associated with two reflective interfaces in the sample. Adjusting the low coherence wavelength compresses 82, 84 the heterodyne signals 78, 80 around the interface.

第二,如果有与反射过程相关联的相位偏移,前面描述的界面定域方法可能部分地失败。例如,如果表面是金属的,那么相位偏移并非是微不足道的,而且当x确切地等于x1时外差信号的相位具有某个其它的数值。尽管先前的方法允许在x=x1之时识别正确的干涉条纹,然而亚波长灵敏度可能是折衷的。CW外差信号的出现允许借助HPI方法发现差相位。对这个数值的了解允许以高水平的灵敏度使界面定域。Second, the previously described methods of interface localization may partially fail if there is a phase shift associated with the reflection process. For example, if the surface is metallic, then the phase shift is not trivial, and the phase of the heterodyne signal has some other value when x is exactly equal to x1 . Although previous methods allow identification of correct interference fringes when x = x 1 , subwavelength sensitivity may be a tradeoff. The presence of a CW heterodyne signal allows finding the difference phase by means of the HPI method. Knowledge of this value allows the interface to be localized with a high level of sensitivity.

HPI方法的原理能通过可仿效的,在775nm的波长下折射指数为n775nm的,厚度为L样品的实施方案举例说明。该样品的两个界面处在距分光镜的光学距离分别为x1和x2(其中x2=x1+n775nmL)的位置。请注意,如果光学距离间隔大于相干长度,例如,典型地在低相干光源的1微米和100微米之间,该方法才能工作。否则,与界面相关联的外差相位信号合并在一起并且导致错误的界面定域。为了解释清楚,与反射相关联的相位偏移的结合被推迟到后面。The principle of the HPI method can be illustrated by an exemplary implementation of a sample of thickness L having a refractive index n 775 nm at a wavelength of 775 nm. The two interfaces of the sample are located at optical distances x 1 and x 2 from the beam splitter (where x 2 =x 1 +n 775nm L). Note that this method will only work if the optical distance separation is larger than the coherence length, eg typically between 1 µm and 100 µm for low-coherence sources. Otherwise, the heterodyned phase signals associated with the interface merge together and result in erroneous interface localization. For clarity of explanation, the incorporation of phase shifts associated with reflections is postponed until later.

图4是举例说明数学描述的扫描。该扫描是有两个界面的样品。信号100是低的相干性外差信号。痕迹102是φCW(x)。放大视图104展示相位条纹。每个条纹对应于λCW的光学距离。较低的φD(x)痕迹是两个不同的Δ值。箭头106、110指出相位交点。垂直轴以弧度为单位。当扫描基准反射镜的时候,低相干性外差信号的相位用下式给出:Figure 4 is a scan illustrating the mathematical description. This scan is of a sample with two interfaces. Signal 100 is a low coherence heterodyne signal. Trace 102 is φ CW (x). The enlarged view 104 shows phase fringes. Each fringe corresponds to an optical distance of λ CW . The lower φ D (x) traces are two different delta values. Arrows 106, 110 indicate phase intersections. The vertical axis is in radians. When scanning the reference mirror, the phase of the low-coherence heterodyne signal is given by:

ψψ LCLC (( xx ))

== modmod 22 ππ (( argarg (( RR LCLC ,, 11 ee ii 22 kk LCLC (( xx -- xx 11 )) ee -- (( 22 aa (( xx -- xx 11 )) )) 22 ++ RR LCLC ,, 22 ee ii 22 kk LCLC (( xx -- xx 22 )) ee -- (( 22 aa (( xx -- xx 22 )) )) 22 )) ))

≈≈ hh cc (( xx -- xx 11 )) modmod 22 ππ (( 22 kk LCLC (( xx -- xx 11 )) )) ++ hh cc (( xx -- xx 22 )) modmod 22 ππ (( 22 kk LCLC (( xx -- xx 22 )) )) ,, -- -- -- (( 33 ))

其中RLCj是在低相干性波长下界面j的反射率,k是光学波数,a=4ln(2)/lc,lc是相干长度,x是基准反射镜到分光镜的距离,hc(x)是分段连续函数,|x|<2lc时,其数值为1,否则为0。指数中的因子2是由于在回射几何学中光程被有效地加倍。公式3反映由于噪声不能测量远远超过相干性包络线的相位这一事实。虽然建立模型的相干性包络线在轮廓上是高斯型的,但是同样的相位处理对于任何缓慢变化的包络线的轮廓都是有效的。where R LCj is the reflectivity of interface j at the low coherence wavelength, k is the optical wavenumber, a=4ln(2)/l c , l c is the coherence length, x is the distance from the reference mirror to the beamsplitter, h c (x) is a piecewise continuous function, when |x|<2l c , its value is 1, otherwise it is 0. The factor of 2 in the index is due to the fact that the optical path length is effectively doubled in the retroreflective geometry. Equation 3 reflects the fact that phase far beyond the coherence envelope cannot be measured due to noise. Although the modeled coherence envelope is Gaussian in profile, the same phase treatment is valid for the profile of any slowly varying envelope.

CW外差信号的相位是用下式给出的:The phase of the CW heterodyne signal is given by:

&psi;&psi; cwcw (( xx )) == modmod 22 &pi;&pi; (( argarg (( RR cwcw ,, 11 ee ii 22 kk cwcw (( xx -- xx 11 )) ++ RR cwcw ,, 22 ee ii 22 kk cwcw (( xx -- (( xx 11 ++ nno 15501550 nmnm LL )) )) ))

== modmod 22 &pi;&pi; (( argarg (( RR &OverBar;&OverBar; ee ii 22 kk cwcw (( xx -- xx &OverBar;&OverBar; )) )) )) == modmod 22 &pi;&pi; (( 22 kk cwcw (( xx -- xx &OverBar;&OverBar; )) )) ,, -- -- -- (( 44 ))

其中RCWj是界面j在CW波长下的反射率,n1550nm是样品的折射指数,R和X分别是有效平均反射率和到分光镜的有效平均距离。如果两个光源中心波长是这样选定的,以致where R CWj is the reflectance of interface j at CW wavelength, n 1550nm is the refractive index of the sample, R and X are the effective average reflectance and the effective average distance to the beamsplitter, respectively. If the center wavelengths of the two sources are chosen such that

kLC=2kCW+Δ,(5)k LC =2k CW +Δ, (5)

其中Δ是小的有意附加的偏移,那么这种形式的差相位φD被获得:where Δ is a small intentionally added offset, then a difference phase φ D of the form is obtained:

ψD(x)=ψLC(x)-2ψcw(x)ψ D (x) = ψ LC (x)-2ψ cw (x)

=hc(x-x1)mod(4kcw(x-x1)+2Δ(x-x1))       (6)=h c (xx 1 )mod (4k cw (xx 1 )+2Δ(xx 1 )) (6)

+hc(x-x2)mod(4kcw(x-x2)+2Δ(x-x2))+h c (xx 2 )mod (4k cw (xx 2 )+2Δ(xx 2 ))

上述的量提供在间隔(x2-x1)中条纹的大体数目和提供亚波长精度的分数条纹两者。The above quantities provide both the approximate number of fringes in the interval (x 2 -x 1 ) and the fractional fringes that provide sub-wavelength precision.

当参数Δ被少量改变时(对应于大约1-2nm的波长偏移),φD(x)的斜率围绕x=x1和x=x2的点转动。换句话说,在不同的Δ值与所述点相交的地方扫描相位。从x1到x2的光学距离能通过计算φCW(x)在两个相位交点之间经过的条纹找出来。如此找到的数量的两倍用非整数Sfringe指出,而且对应于低相干波长下的条纹数目。就单一界面而言,若出现多个相位交点,与界面位置相对应的点能通过以多个附加的Δ值进行多样的扫描找出来。界面位置是唯一的位置,在该位置φD(x)对于所有的Δ值都将相交。When the parameter Δ is changed by a small amount (corresponding to a wavelength shift of about 1-2 nm), the slope of φ D (x) rotates around the points x=x 1 and x=x 2 . In other words, the phase is swept where different values of delta intersect the point. The optical distance from x 1 to x 2 can be found by computing the fringes that φ CW (x) passes between two phase intersection points. Twice the number so found is indicated by the non-integer S fringe and corresponds to the number of fringes at low coherence wavelengths. For a single interface, if there are multiple phase intersections, the point corresponding to the interface position can be found by performing various scans with multiple additional Δ values. The interface location is the only location where φ D (x) will intersect for all values of Δ.

相位偏移信息用来进一步使界面间距定域。明确地说,在x=x1和x=x2处的相位偏移之间的差是:The phase offset information is used to further localize the interfacial spacing. Specifically, the difference between the phase offsets at x= x1 and x= x2 is:

SS phasephase == modmod 22 &pi;&pi; (( &psi;&psi; DD. (( xx == xx 11 )) -- &psi;&psi; DD. (( xx == xx 22 )) )) 22 &pi;&pi; == modmod 22 &pi;&pi; (( 44 kk cwcw (( xx 22 -- xx 11 )) )) 22 &pi;&pi; .. -- -- -- (( 77 ))

这用高灵敏度测量分数条纹。This measures fractional fringes with high sensitivity.

绝对的光学间距(x2-x1)能通过下面的公式精确地从Sfringe和SPhase确定:The absolute optical spacing (x 2 -x 1 ) can be precisely determined from S fringe and S Phase by the following formula:

(( xx 22 -- xx 11 )) measuredmeasured == (( nno 775775 nmnm LL )) measuredmeasured ==

&lambda;&lambda; cwcw 44 (( [[ intint (( SS fringefringe )) ++ Uu (( &Delta;S&Delta;S -- 11 22 )) -- Uu (( -- &Delta;S&Delta;S -- 11 22 )) ]] ++ SS phasephase ))

其中ΔS=rEs(Sfringe)-SPhase,U()是单位步骤函数。在这里,int()和res()分别表示自变量的整数部分和分数部份。第一项通过将SPhase和Sfringe的分数部分之间的误差减到最小以定域光学距离到条纹的正确的整数数目。光学间距测定误差仅仅受SPhase的测量误差限制。在实施方案中,这样的误差转换到在大约0.5nm的(n775nmL)measued中的误差。SPhase的测量误差只需要小于半个条纹,以便正确的干涉条纹能被建立;满足了这个判据,它不进入(n775nmL)measued的误差。最大的可测量的光学距离仅仅取决于系统准确地数出在两个交点之间的条纹数目的能力和光源的频率稳定性。Where ΔS=rEs(S fringe )-S Phase , U() is the unit step function. Here, int() and res() represent the integer part and the fractional part of the argument, respectively. The first term localizes the correct integer number of optical distances to fringes by minimizing the error between S Phase and the fractional part of S fringe . The optical distance measurement error is only limited by the S Phase measurement error. In an embodiment, such an error translates to an error in (n 775nm L) measured of about 0.5nm. The measurement error of S Phase only needs to be less than half a fringe, so that the correct interference fringe can be established; this criterion is met, it does not enter the (n 775nm L) measured error. The maximum measurable optical distance depends only on the system's ability to accurately count the number of fringes between two intersection points and the frequency stability of the light source.

上述公式是用来发现正确条纹和分数条纹的方法的精练表达。操作能通过下面的实施例和展示通过选择使基于SPhase和Sfringe之间的估计误差最小的数值确定正确估计的图5来举例说明。假定Sfringe和SPhase是26.7和0.111。从SPhase的测量结果,光学距离的数值是:The above formula is a concise expression of the method used to find the correct and fractional stripes. Operation can be exemplified by the following example and Figure 5 showing that the correct estimate is determined by choosing the value that minimizes the error based on the estimate between S Phase and S fringe . Assume that S fringe and S Phase are 26.7 and 0.111. From the measurement results of S Phase , the value of the optical distance is:

(n775nmL)measued=λCW(a+0.111)/4         (9)(n 775nm L) measured = λ CW (a+0.111)/4 (9)

其中a是整数。给出Sfringe的数值,可能的(n775nmL)measued数值限定在下列三个数值:λCW(25.111)/4、λCW(26.111)/4和λCW(27.111)/4。如果λCW(27.111)/4的数值最接近λCW(Sfringe)/4,那么它就是(n775nmL)measued的正确估计。where a is an integer. Given the value of S fringe , the possible (n 775nm L) measured values are limited to the following three values: λ CW (25.111)/4, λ CW (26.111)/4 and λ CW (27.111)/4. If the value of λ CW (27.111)/4 is closest to λ CW (S fringe )/4, then it is the correct estimate of (n 775nm L) measured .

在用于谐波关系光源为基础的干涉测量法测量的优选实施方案中,适当地选定的光源对和推断出差相位的方法允许最小化并优选消除干涉仪中以别的方式使高精度光学距离测量变成不可能的抖动效应。消除抖动还允许比较在不同时间完成的扫描。In a preferred embodiment for light source-based interferometry measurements of harmonic relations, appropriately selected light source pairs and methods of inferring the differential phase allow minimizing and preferably eliminating the otherwise high precision optics in the interferometer. Distance measurement becomes impossible due to jitter effects. Dejittering also allows comparison of scans done at different times.

为了证明该方法的优选实施方案的能力,所述系统被用来探察实际厚度L=237±3μm的熔凝石英盖玻片的顶部表面和底部表面之间的光学距离。在这个实施方案中,存在与来自第一界面的反射相关联的π相位偏移,这标志正折射指数跃迁。因此,在公式1和2中有与因子RLC,1和Rcw,1相关联的e-iπ项。这导致关于Sfringe和SPhase的二分之一的校正因子。图4展示在773.0nm和777.0nm的LC波长下典型的扫描结果。四组扫描结果被概括在表示关于石英盖玻片的(n775nmL)的测量结果的表1中。实验数据的重复性表明光源在频率方面是足够稳定的。To demonstrate the capability of a preferred embodiment of the method, the system was used to probe the optical distance between the top and bottom surfaces of a fused silica coverslip of actual thickness L=237±3 μm. In this embodiment, there is a π phase shift associated with the reflection from the first interface, which marks a positive refractive index transition. Thus, in Equations 1 and 2 there are e -iπ terms associated with the factors R LC,1 and R cw,1 . This results in a correction factor of one-half for S fringe and S Phase . Figure 4 shows typical scan results at LC wavelengths of 773.0 nm and 777.0 nm. The results of the four sets of scans are summarized in Table 1 showing the measurements of (n 775nm L) on the quartz coverslip. The repeatability of the experimental data shows that the light source is sufficiently stable in terms of frequency.

表1Table 1

  λ<sub>CW</sub>S<sub>fringe</sub>/4(μm) λ<sub>CW</sub>S<sub>fringe</sub>/4(μm)   λ<sub>CW</sub>S<sub>Phase</sub>/4(μm) λ<sub>CW</sub>S<sub>Phase</sub>/4(μm)  (n<sub>775nm</sub>L)<sub>measued</sub>(μm) (n<sub>775nm</sub>L)<sub>measured</sub>(μm)   组1 Group 1   350.86±0.17 350.86±0.17   0.3496±0.0004 0.3496±0.0004  351.0371±0.0004 351.0371±0.0004   组2 Group 2   351.08±0.17 351.08±0.17   0.3497±0.0004 0.3497±0.0004  351.0372±0.0004 351.0372±0.0004   组3 Group 3   351.15±0.16 351.15±0.16   0.3502±0.0004 0.3502±0.0004  351.0377±0.0004 351.0377±0.0004   组4 Group 4   351.04±0.18 351.04±0.18   0.3498±0.0004 0.3498±0.0004  351.0373±0.0004 351.0373±0.0004   平均 average  351.0373±0.0004 351.0373±0.0004

实验数据产生有亚纳米精度的绝对光学距离测量结果。所发现的光学距离与低相干光源相关联。CW外差信号充当光学标尺。如果石英盖玻片的L是精确地已知的,那么石英在775.0nm波长下的n775nm就能从(n775nmL)measued以非常高的准确度确定。The experimental data yield absolute optical distance measurements with sub-nanometer precision. The optical distances found are associated with low coherence light sources. The CW heterodyne signal acts as an optical scale. If the L of the quartz coverslip is known precisely, then the n 775nm of the quartz at a wavelength of 775.0nm can be determined with very high accuracy from (n 775nm L) measured .

作为替代,不知道L的精确数值,在两个不同的波长下折射指数比能通过使用在这些波长下的低相干光波和在它们各自的谐波下的CW光波测量对应的光学距离来确定。使用一系列低相干性波长,材料的色散分布图能被准确地确定。色散分布图把各种不同波长下的折射指数差绘成图。依照优选的实施方案,这些实验结果预测大约七位有效数字的精确度能用大约1毫米厚的样品实现。Alternatively, without knowing the exact value of L, the refractive index ratio at two different wavelengths can be determined by measuring the corresponding optical distances using low coherence lightwaves at these wavelengths and CW lightwaves at their respective harmonics. Using a range of low coherence wavelengths, the dispersion profile of a material can be accurately determined. A dispersion profile plots the difference in refractive index at various wavelengths. According to a preferred embodiment, these experimental results predict that an accuracy of about seven significant figures can be achieved with samples about 1 millimeter thick.

在另一个优选实施方案中,所述系统的光源改为以1550.0nm发射的低相干性超级发光二极管(SLD)和以775.0nm发射的CWTi:蓝宝石激光器。通过调节通过SLD的工作电流,中心波长被改变大约2nm;这适合实现相位相交。使用本发明系统的所述优选实施方案,光学距离能在1550.0nm测量。采用所述测量结果与前面的测量结果之比,石英的折射指数比n775nm/n1550nm能被确定。人们应该注意到所发现的折射指数比由于在所述优选实施方案中所用的光源适合于谐波关系波长。其它波长的折射指数比能用适当选择的其它光源测量。为了比较,玻璃和丙烯酸塑料对应的数据被列于表2中作为不同材料的n775nm/n1550nm的测量结果。In another preferred embodiment, the light source of the system is changed to a low coherence super light emitting diode (SLD) emitting at 1550.0 nm and a CWTi:sapphire laser emitting at 775.0 nm. By adjusting the operating current through the SLD, the center wavelength is changed by about 2nm; this is suitable for achieving phase crossing. Using the described preferred embodiment of the system of the present invention, optical distance can be measured at 1550.0 nm. Using the ratio of said measurements to the previous measurements, the refractive index ratio n 775nm /n 1550nm of quartz can be determined. One should note that the refractive index ratios found are due to the harmonic relationship wavelengths for the light sources used in the preferred embodiment. Refractive index ratios at other wavelengths can be measured with appropriately selected other light sources. For comparison, the corresponding data for glass and acrylic plastic are listed in Table 2 as n 775nm /n 1550nm measurements for different materials.

表2Table 2

  n<sub>775nm</sub>/n<sub>1550nm</sub> n<sub>775nm</sub>/n<sub>1550nm</sub>   石英 Quartz   1.002742±0.000003 1.002742±0.000003   玻璃(German Borosilicate) Glass (German Borosilicate)   1.008755±0.000005 1.008755±0.000005   丙烯酸塑料 Acrylic plastic   1.061448±0.000005 1.061448±0.000005

请注意,当低相干性波长是CW波长的一半的时候所用的一些公式略微不同于先前在此出现的公式。例如:Note that some of the formulas used when the low coherence wavelength is half the CW wavelength are slightly different from those previously presented here. For example:

&psi;&psi; LCLC (( xx ))

== modmod 22 &pi;&pi; (( argarg (( RR LCLC ,, 11 ee ii 22 kk LCLC (( xx -- xx 11 )) ee -- (( 22 ll cc (( xx -- xx 11 )) )) 22 ++ RR LCLC ,, 22 ee ii 22 kk LCLC (( xx -- xx 22 )) ee -- (( 22 ll cc (( xx -- xx 22 )) )) 22 )) ))

&ap;&ap; hh cc (( xx -- xx 11 )) modmod 22 &pi;&pi; (( 22 kk LCLC (( xx -- xx 11 )) )) ++ hh cc (( xx -- xx 22 )) modmod 22 &pi;&pi; (( 22 kk LCLC (( xx -- xx 22 )) )) ,, -- -- -- (( 1010 ))

&psi;&psi; cwcw (( xx )) == modmod 22 &pi;&pi; (( argarg (( RR cwcw ,, 11 ee ii 22 kk cwcw (( xx -- xx 11 )) ++ RR cwcw ,, 22 ee ii 22 kk cwcw (( xx -- (( xx 11 ++ nno 15501550 nmnm LL )) )) ))

== modmod 22 &pi;&pi; (( argarg (( RR &OverBar;&OverBar; ee ii 22 kk cwcw (( xx -- xx &OverBar;&OverBar; )) )) )) == modmod 22 &pi;&pi; (( 22 kk cwcw (( xx -- xx &OverBar;&OverBar; )) )) ,, -- -- -- (( 1111 ))

2kLC=kCW+Δ                                (12)2k LC =k CW +Δ (12)

ψD(x)=2ψLC(x)-ψcw(x)ψ D (x)=2ψ LC (x)-ψ cw (x)

=hc(x-x1)mod(4kLC(x-x1)+2Δ(x-x1))      (13)=h c (xx 1 )mod (4k LC (xx 1 )+2Δ(xx 1 )) (13)

+hc(x-x2)mod(4kLC(x-x2)+2Δ(x-x2))+h c (xx 2 )mod (4k LC (xx 2 )+2Δ(xx 2 ))

SS phasephase == modmod 22 &pi;&pi; (( &psi;&psi; DD. (( xx == xx 11 )) -- &psi;&psi; DD. (( xx == xx 22 )) )) 22 &pi;&pi; == modmod 22 &pi;&pi; (( 44 kk LCLC (( xx 22 -- xx 11 )) )) 22 &pi;&pi; .. -- -- -- (( 1414 ))

(( xx 22 -- xx 11 )) measuredmeasured == (( nno 775775 nmnm LL )) measuredmeasured

== &lambda;&lambda; LCLC 44 (( [[ intint (( SS fringefringe )) ++ Uu (( &Delta;S&Delta;S -- 11 22 )) -- Uu (( -- &Delta;S&Delta;S -- 11 22 )) ]] ++ SS phasephase )) -- -- -- (( 1515 ))

用来解决2π模糊度的方法的优选实施方案在诸如高精度深度测距和薄膜固态材料的高精度折射指数确定之类的应用中是非常有用的。Preferred embodiments of the method to resolve 2π ambiguity are useful in applications such as high-precision depth ranging and high-precision refractive index determination of thin-film solid materials.

优选方法的使用能通过考虑玻璃平板来举例说明。有一些能非常准确地测量从系统到玻璃平板平均中心的距离的系统。还有一些能非常准确地测量玻璃表面粗糙程度的系统。本发明系统的优选实施方案以纳米灵敏度测量玻璃平板端面的厚度。The use of the preferred method can be exemplified by considering a glass plate. There are some systems that can measure the distance from the system to the mean center of the glass plate very accurately. There are also systems that measure the roughness of glass surfaces very accurately. A preferred embodiment of the system of the present invention measures the thickness of the end face of a glass plate with nanometer sensitivity.

落实用来确定光学距离的方法的优选实施方案的步骤是用图6A和6B中的流程图124举例说明的。方法124包括在Michelson干涉仪中使用两个谐波关系光源,其中一个是CW光源,而另一个是低相干光源。需要测量其界面之间的光学距离的样品每逢步骤126都被用作干涉仪信号臂的末端反射镜。干涉仪基准臂中的基准反射镜每逢步骤128都被扫描。该方法包括把来自信号臂和基准臂的反射合并然后按照波长分开的步骤130。进而,每逢步骤132探测组合光波强度的外差振荡。然后,每逢步骤134借助,例如,Hilbert变换或任何相位推断出替代方法找出两种波长的外差信号的相位。每逢步骤136都通过从较短波长的相位两次减去较长波长的相位估算整个扫描的差相位。每逢步骤137都用被略微失谐的光波波长重复扫描。然后,重复步骤130-136。The steps for implementing a preferred embodiment of the method for determining optical distances are illustrated by flow diagram 124 in FIGS. 6A and 6B. Method 124 involves using two harmonically related light sources in a Michelson interferometer, one of which is a CW light source and the other is a low coherence light source. The sample whose optical distance between interfaces needs to be measured is used every step 126 as the end mirror of the signal arm of the interferometer. The reference mirror in the reference arm of the interferometer is scanned every step 128 . The method includes the step 130 of combining reflections from the signal arm and the reference arm and then separating them by wavelength. Further, at each step 132 a heterodyne oscillation of the combined light wave intensity is detected. Then, each step 134 finds the phase of the heterodyne signal at the two wavelengths by means of, for example, the Hilbert transform or any phase derivation alternative. Each step 136 estimates the difference phase for the entire scan by twice subtracting the longer wavelength phase from the shorter wavelength phase. Each step 137 repeats the scan with the slightly detuned optical wavelength. Then, steps 130-136 are repeated.

然后,每逢步骤138都把从两次扫描发现的两个差相位重叠在用x轴表示基准反射镜的位移的曲线图上。人们应该注意到,差相位的推断出也能用适当的光源或滤色镜或对单一扫描的软件/硬件信号处理来完成。Then, each step 138 superimposes the two difference phases found from the two scans on a graph with the x-axis representing the displacement of the reference mirror. One should note that derivation of the differential phase can also be done with appropriate light sources or filters or software/hardware signal processing of a single scan.

在方法124中接下来的步骤包括:每逢140步骤在曲线图上确定相位交点以便标出样品界面的位置。每逢步骤142,通过计算与CW光波相关联的外差信号在两个交点之间用2π叠起的次数,以大约达到波长的分数(例如,大约0.2)的准确性确定界面之间的光学间距。通过测量在交点的差相位,进一步使该间距定域和/或精炼到波长的非常小的分数,例如,大约0.001。Subsequent steps in method 124 include determining phase intersection points on the graph at each step 140 to mark the location of the sample interface. At each step 142, the optical distance between the interface is determined with an accuracy of approximately a fraction of the wavelength (e.g., approximately 0.2) by counting the number of times the heterodyne signal associated with the CW light wave overlaps with 2π between the two points of intersection. spacing. This spacing is further localized and/or refined to very small fractions of wavelength, eg, about 0.001, by measuring the difference phase at the intersection point.

在用作为测量光学距离的系统的示意图的图7举例说明的另一个优选实施方案中,低相干光源在带宽方面可能是足够宽的,例如,超过4nm。在探测结束时,为两个探测器166、176增添第三个探测器174。这导致低相干性光波信号168被进一步一分为二。在到达探测器之前,两个光束通过不同的滤波器170、172。这两个滤波器传输光谱中的不同部份。一个让波长较长的频谱组份通过,而第二个让波长较短的频谱组份通过。优选的是两个透射光束在它们的光谱方面被分开2nm以上。In another preferred embodiment illustrated in Figure 7, which is used as a schematic diagram of a system for measuring optical distances, the low-coherence light source may be sufficiently wide in bandwidth, eg, exceeding 4 nm. At the end of detection, a third detector 174 is added to the two detectors 166,176. This results in the low coherence lightwave signal 168 being further split in two. The two beams pass through different filters 170, 172 before reaching the detector. These two filters transmit different parts of the spectrum. One passes spectral components with longer wavelengths, while the second passes spectral components with shorter wavelengths. It is preferred that the two transmitted beams are separated by more than 2 nm in their spectra.

然后,光束入射到探测器上,而且它们的外差信号以参照图1讨论过的方式进行处理。依照其它可能的优选实施方案的方法的优势在于该方法用经过调节的低相干性波长消除程序的重复。这两个信号是在同一次扫描中获得的。The beams are then incident on the detectors and their heterodyned signals are processed in the manner discussed with reference to FIG. 1 . An advantage of the method according to other possible preferred embodiments is that the method eliminates repetitions of the procedure with adjusted low coherence wavelengths. These two signals were acquired in the same scan.

图8A和8B举例说明依照本发明的优选实施方案测量光学距离的替代方法的流程图184。方法184包括在干涉仪中使用两个谐波关系光源,其中一个是CW光源,而另一个是低相干光源。每逢步骤186,需要测量光学距离的样品都被用作干涉仪信号臂的末端反射镜。每逢步骤188,干涉仪基准臂中的基准反射镜都被扫描。该方法进一步包括每逢步骤190把来自信号臂和基准臂的反射合并然后按照波长把它们分开。每逢步骤192,使用滤波器把低相干性波长进一步分开。方法184包括用至少三个探测器探测外差振荡的步骤194。下一个步骤196包括探测组合光波强度的外差振动。然后,每逢步骤198都借助,例如,Hilbert变换或任何相位推断出替代方法找出两个波长的外差信号的相位。然后,每逢步骤200,都算出每个低相干性信号与CW信号的差相位。8A and 8B illustrate a flowchart 184 of an alternative method of measuring optical distance in accordance with a preferred embodiment of the present invention. Method 184 includes using two harmonically related light sources in an interferometer, one of which is a CW light source and the other is a low coherence light source. At each step 186, the sample whose optical distance is to be measured is used as the end mirror of the signal arm of the interferometer. At each step 188, the reference mirror in the reference arm of the interferometer is scanned. The method further includes combining the reflections from the signal arm and the reference arm at each step 190 and separating them by wavelength. At each step 192, filters are used to further separate the low coherence wavelengths. Method 184 includes a step 194 of detecting heterodyne oscillations with at least three detectors. The next step 196 involves detecting heterodyned vibrations of the combined light wave intensity. Then, each step 198 finds the phase of the heterodyne signal at the two wavelengths by means of, for example, the Hilbert transform or any phase derivation alternative. Then, at every step 200, the phase difference between each low-coherence signal and the CW signal is calculated.

然后,每逢步骤202,都在曲线图中表示基准反射镜的位移的x-轴上把两个差相位彼此重叠。剩余的步骤204、206、208类似于参照图6B讨论过的步骤140、142、144。Then, every step 202, the two difference phases are superimposed on each other on the x-axis of the graph representing the displacement of the reference mirror. The remaining steps 204, 206, 208 are similar to steps 140, 142, 144 discussed with reference to Fig. 6B.

该方法的优选实施方案绝对能用来以亚纳米精度测量任意长的光学距离。该系统的优选实施方案能以自由空间为基础或以光纤为基础。图9举例说明以光纤为基础测量光学距离的系统的优选实施方案。Preferred embodiments of the method can absolutely be used to measure arbitrarily long optical distances with sub-nanometer precision. Preferred embodiments of the system can be free space based or fiber optic based. Figure 9 illustrates a preferred embodiment of an optical fiber based system for measuring optical distance.

输入光波256包括在光纤251中传播的近似谐波关系低相干性光波(波长λ1)和CW光束(波长λ2)。复合光束被一分为二,一部分信号入射到目标透镜254和样品256上并且在光纤253中传输,而另一部分信号经由透镜268入射到基准反射镜266上并且在光纤251中传输。基准反射镜的运动在反射光束上引进多普勒偏移。反射光束被再次合并,然后,借助二向色镜258被分成它们的组成波长组份。所述波长组份是借助光电探测器260、262分开测量的。这些在它们各自的多普勒偏移频率下产生的外差信号有在它们各自的中心外差频率周围的通频带,而且被完成Hilbert变换,以便推断出外差信号对应的相位φCW和φLCThe input light waves 256 include approximately harmonically low coherence light waves (wavelength λ 1 ) and CW light beams (wavelength λ 2 ) propagating in the optical fiber 251 . The composite beam is split in two, one part of the signal is incident on the objective lens 254 and the sample 256 and transmitted in the optical fiber 253 , while the other part of the signal is incident on the reference mirror 266 via the lens 268 and transmitted in the optical fiber 251 . Movement of the reference mirror introduces a Doppler shift in the reflected beam. The reflected beams are combined again and then, by means of dichroic mirror 258, separated into their constituent wavelength components. The wavelength components are measured separately by means of photodetectors 260 , 262 . These heterodyne signals generated at their respective Doppler shifted frequencies have passbands around their respective central heterodyne frequencies and are Hilbert transformed to deduce the corresponding phases φ CW and φ LC of the heterodyne signals .

优选实施方案的方法能用来进行精确的光学距离测量。依据这样的测量,目标物体的光学性质能被精确地测定。通过测量目标的色散分布图,目标的结构性质和/或化学性质能被算出。在生物医学领域,本发明的优选实施方案能用来以非接触和非侵入的方式精确地确定生物学组织的色散性质。这样的色散测定能用在眼睛的角膜或水样液上。所实现的灵敏度足以探测依葡萄糖浓度而定的光学变化。在本发明方法的优选实施方案中,血糖水平能通过非侵入式测量眼睛的水样液或玻璃液或角膜的色散分布图来确定。The method of the preferred embodiment can be used to make precise optical distance measurements. From such measurements, the optical properties of the target object can be accurately determined. By measuring the dispersion profile of the target, the structural and/or chemical properties of the target can be calculated. In the biomedical field, preferred embodiments of the present invention can be used to accurately determine the dispersion properties of biological tissues in a non-contact and non-invasive manner. Such dispersion measurements can be used on the cornea or aqueous fluid of the eye. The achieved sensitivity is sufficient to detect optical changes that are dependent on glucose concentration. In a preferred embodiment of the method of the invention, the blood glucose level can be determined by non-invasive measurement of the dispersion profile of the aqueous or vitreous fluid of the eye or of the cornea.

如同上文讨论的那样,基于相位的干涉测量法能够非常灵敏地测量光学距离。然而,所述测量法在它们的应用方面受到例如2π模糊度之类的在该领域中众所周知的问题的限制。这个问题的症结在于不可能把10.1个波长的长度与11.1个波长的长度区分开。本发明的优选实施方案克服了这个限制而且允许亚纳米准确度的绝对光学距离测量。As discussed above, phase-based interferometry can measure optical distance very sensitively. However, said measurements are limited in their application by problems well known in the field such as 2π ambiguity. The crux of the problem is that it is impossible to distinguish a length of 10.1 wavelengths from a length of 11.1 wavelengths. Preferred embodiments of the present invention overcome this limitation and allow absolute optical distance measurements with sub-nanometer accuracy.

有许多以近似纳米范围的灵敏度测量光学距离变化的基于相位的方法。只要这种变化很小而且是渐进的,所述变化就能被连续地跟踪。存在测量绝对光学距离的低相干性方法,所述方法通过跟踪到达从反射镜灵敏度大约为数微米的不同的界面反射的光波的探测器的延迟来测量绝对光学距离。如同上文讨论的那样,在干涉仪中CW光源和低相干光源的同时使用为测量光学距离的方法创造条件。与两种波长相关联的信号的外差相位本质上是相关的。通过处理每个优选实施方案的相位,运动噪声被减到最小并且优选从我们的测量中消除。There are many phase-based methods for measuring optical distance changes with sensitivities in the approximate nanometer range. As long as the change is small and gradual, the change can be continuously tracked. There are low-coherence methods of measuring absolute optical distance by tracking the delay to the detector for light waves reflected from different interfaces whose mirror sensitivity is on the order of microns. As discussed above, the simultaneous use of a CW source and a low coherence source in an interferometer allows for a method of measuring optical distance. The heterodyned phases of the signals associated with the two wavelengths are inherently correlated. By manipulating the phase of each preferred embodiment, motion noise is minimized and preferably eliminated from our measurements.

优选实施方案的应用是使用眼睛的玻璃体液和/或水样液的折射指数的测量结果确定葡萄糖水平。这种技术的灵敏度提供以临床上恰当的灵敏度测量化学浓度的能力。优选实施方案的方法的比较明显的应用之一是通过在眼睛上完成的测量确定血糖水平。眼睛中流体的葡萄糖水平用临床上无关紧要的时间延迟反映血液的葡萄糖水平。An application of the preferred embodiment is the determination of glucose levels using measurements of the refractive index of the vitreous and/or aqueous fluid of the eye. The sensitivity of this technique provides the ability to measure chemical concentrations with clinically appropriate sensitivity. One of the more obvious applications of the method of the preferred embodiment is the determination of blood glucose levels by measurements done on the eye. The glucose level of the fluid in the eye mirrors the glucose level of the blood with a clinically insignificant time delay.

优选实施方案的方法使用图10举例说明的至少两个分开的波长组测量眼睛中的玻璃体液和/或水样液层的光程长度。该方法测量低相干性波长下的折射指数和两个界面之间的实际间距的乘积。通过改变低相干光源的波长(而且为了匹配适当地改变CW波长),以不同的波长测量折射指数差。例如,一组测量是用可调谐的500nm的低相干光源和1微米的CW光源完成的,以便析取n500nmL,其中L是玻璃体液和/或水样液在测量点的实际厚度。另一组测量是用可调谐的1000nm的低相干光源和1800nm的CW光源完成的,以便析取n900nmL。通过取得这两个测量结果的比,玻璃体液和/或水样液的折射指数比n500nm/n900nm被推断出。采用现有的灵敏度,例如,0.5nm光程灵敏度,该系统的优选实施方案能针对厚度与人类的玻璃体液和/或水样液的材料测量灵敏度为10-8的折射指数比n500nm/n900nm。这把该灵敏度提供给大约0.25毫克/分升的葡萄糖水平变化。假定典型的血糖水平是大约100毫克/分升,本发明的优选实施方案非常适合血糖化验。光学波长的选择是灵活的,以上使用的波长只是为了举例说明。就最高的灵敏度而言,波长间隔优选尽可能大。优选实施方案包括大于500nm的间隔。The method of the preferred embodiment measures the optical path length of the vitreous humor and/or aqueous fluid layer in the eye using at least two separate sets of wavelengths as illustrated in FIG. 10 . This method measures the product of the index of refraction at low coherence wavelengths and the actual separation between two interfaces. The refractive index difference is measured at different wavelengths by varying the wavelength of the low coherence light source (and appropriately varying the CW wavelength for matching). For example, one set of measurements was done with a tunable 500nm low-coherence light source and a 1-micron CW light source to extract n 500nm L, where L is the actual thickness of the vitreous humor and/or aqueous fluid at the point of measurement. Another set of measurements was done with a tunable 1000nm low-coherence light source and a 1800nm CW light source to extract n 900nm L. By taking the ratio of these two measurements, the refractive index ratio n 500nm /n 900nm of the vitreous humor and/or aqueous fluid is deduced. Using existing sensitivities, e.g., 0.5 nm optical path sensitivity, a preferred embodiment of the system is capable of measuring a refractive index ratio n 500 nm /n with a sensitivity of 10 −8 for materials of thickness and human vitreous humor and/or aqueous fluid 900nm . This provides the sensitivity to glucose level changes of approximately 0.25 mg/dl. Assuming typical blood glucose levels are about 100 mg/dl, preferred embodiments of the present invention are well suited for blood glucose assays. The choice of optical wavelength is flexible and the wavelengths used above are for illustration only. For highest sensitivity, the wavelength separation is preferably as large as possible. Preferred embodiments include spacings greater than 500nm.

在这样的折射指数比由于在玻璃体液和/或水样液中出现正在变化的其它化学药品不足以确定绝对血糖水平的情况下,更完全的一系列光程长度测量能在一系列其它波长下进行。这组更完全的测量结果允许通过使测量结果与已知的葡萄糖和其它化学药品的色散分布图拟合确定葡萄糖水平和其它化学的浓度。In cases where such refractive index ratios are insufficient to determine absolute blood glucose levels due to the presence of other chemicals that are changing in the vitreous humor and/or aqueous fluid, a more complete set of optical path length measurements can be made at a range of other wavelengths. conduct. This more complete set of measurements allows determination of glucose levels and concentrations of other chemicals by fitting the measurements to known dispersion profiles of glucose and other chemicals.

本发明的优选实施方案能作为测量技术应用于半导体制造业。因为所述方法的优选实施方案是非接触性的和非破坏性的,所以它能用来在制造过程中监测半导体结构的厚度。除此之外,半导体结构的组成能以与就玻璃体液和/或水样液测量的特色讨论的同样多的方式进行化验。The preferred embodiment of the invention can be applied as a measurement technique in the semiconductor manufacturing industry. Because the preferred embodiment of the method is non-contact and non-destructive, it can be used to monitor the thickness of semiconductor structures during fabrication. In addition, the composition of the semiconductor structure can be assayed in as many ways as discussed with respect to the characteristics of vitreous humor and/or aqueous fluid measurements.

相位测量和成像系统:Phase Measurement and Imaging Systems:

本发明的其它可能的优选实施方案涉及用光波使小的生物体或特征成像。这些实施方案能应用于诸多领域,例如,细胞生理学和神经科学。这些优选实施方案以相位测量和成像技术的原理为基础。使用相位测量和成像技术的科学动机起源于,例如,能没有限制地包括发育异常、细胞通讯、神经元传输和遗传密码执行的成像起因的亚微米水平的细胞生物学。亚细胞组份的结构和动力学现在不能使用现有的方法和技术(包括,例如,X射线和中子的散射)以它们的自然状态进行研究。反之,以光波基础的纳米级分辨率的技术使细胞机器能够以其自然状态进行研究。因此,本发明的优选实施方案包括以干涉测量法和/或相位测量的原理为基础的系统并且被用来研究细胞生理学。这些系统包括使用光学干涉仪测量相位的低相干性干涉测量法(LCI)或其中使用细胞组份本身之内的干涉的光波散射光谱学(LSS)的原理,或在替代方案中LCI和LSS的原理能在本发明的系统中合并。Other possible preferred embodiments of the invention involve imaging small organisms or features with light waves. These embodiments can be applied in many fields, for example, cell physiology and neuroscience. These preferred embodiments are based on the principles of phase measurement and imaging techniques. The scientific motivation to use phase measurement and imaging techniques arises, for example, from submicron level cell biology that can include without limitation developmental abnormalities, cellular communication, neuronal transmission, and imaging causes of genetic code execution. The structure and dynamics of subcellular components cannot currently be studied in their native state using existing methods and techniques including, for example, scattering of X-rays and neutrons. Conversely, lightwave-based techniques with nanoscale resolution enable cellular machinery to be studied in its natural state. Accordingly, preferred embodiments of the present invention include systems based on the principles of interferometry and/or phase measurement and used to study cell physiology. These systems include the principles of low-coherence interferometry (LCI), which uses optical interferometers to measure phase, or light-wave scattering spectroscopy (LSS), in which interference within the cellular components themselves is used, or, in the alternative, the combination of LCI and LSS. The principles can be combined in the system of the present invention.

用于相位测量和成像系统的优选实施方案包括主动稳定的干涉仪、隔离干涉仪、共向光程干涉仪和提供差动测量的干涉仪。涉及差动测量系统的实施方案包括两点外差干涉仪和双光束干涉仪。使用共向光程干涉仪的实施方案能包括使用空间光波调制的相衬显微镜。Preferred embodiments for phase measurement and imaging systems include actively stabilized interferometers, isolation interferometers, codirectional optical path interferometers, and interferometers providing differential measurements. Embodiments involving differential measurement systems include two-point heterodyne interferometers and two-beam interferometers. Embodiments using co-directional interferometers can include phase contrast microscopy using spatial light wave modulation.

光学低相干性干涉测量法(LCI)已经在生物媒介物的研究方面找到许多应用。最广泛使用的LCI技术是使生物样品的2D或3D反向散射轮廓成像的光学相干断层摄影术(OCT)。Drexder,W.等人已经在“In vivo ultrahigh-resolution optical Coherencetomography”(Optics Letters,Volume 24,No.17,pages 1221-1223)中描述过LCI技术,在此通过引证将其全部教导并入。OCT有受所用光源的相干长度限制的深度灵敏度。超宽带光源已能分辨大约1微米的尺寸特征。Optical low-coherence interferometry (LCI) has found many applications in the study of biological media. The most widely used LCI technique is optical coherence tomography (OCT) imaging the 2D or 3D backscatter profile of biological samples. Drexder, W. et al. have described the LCI technique in "In vivo ultrahigh-resolution optical Coherencetomography" (Optics Letters, Volume 24, No. 17, pages 1221-1223), the entire teachings of which are hereby incorporated by reference. OCT has depth sensitivity limited by the coherence length of the light source used. Ultra-broadband light sources have been able to resolve features on the order of 1 micron in size.

相敏低相干性干涉测量法对样品亚波长光程的变化是敏感的。相敏LCI的主要困难是在干涉仪双臂中光程变动造成的相位噪声。通过几乎同一光程的不同波长的激光束能用来测量干涉仪相位噪声,然后把所述相位噪声从有类似的噪声的样品信号中减去,以便析取真实的样品相位偏移。其它的研究员已经使用沿着共向光程正交的激光偏振来测量高相位灵敏度的微分相衬或双折射。在这两种技术中,都扫描基准臂路径,而且需要计算机计算,以便从由此产生的条纹数据(经由Hilbert变换)推断出相位;除此之外,必须使用相位展开算法消除相位测量中的2π模糊度。条纹扫描和信息处理程序实质上降低测量速度而且可能增加噪声。Phase-sensitive low-coherence interferometry is sensitive to subwavelength pathlength variations of the sample. The main difficulty of phase-sensitive LCI is the phase noise caused by the optical path variation in the arms of the interferometer. Laser beams of different wavelengths passing through nearly the same optical path can be used to measure the interferometer phase noise, which is then subtracted from a similarly noisy sample signal in order to extract the true sample phase shift. Other researchers have used laser polarization orthogonal along a common optical path to measure differential phase contrast or birefringence with high phase sensitivity. In both techniques, the reference arm path is scanned and computer calculations are required to deduce the phase from the resulting fringe data (via the Hilbert transform); in addition, phase unwrapping algorithms must be used to remove the 2π ambiguity. The fringe scanning and information processing routines substantially reduce measurement speed and may increase noise.

包括主动稳定的干涉仪的系统:Systems including actively stabilized interferometers:

本发明的优选实施方案使用LCI方法,其中干涉仪借助基准光束的主动稳定允许以高带宽和最少的计算机处理不间断地探测非常小的相位偏移。锁定在任意相位角的基准光束在没有基准臂扫描的情况下给出直接的样品相位测量结果。优选的实施方案提供二维和三维相位成像。A preferred embodiment of the invention uses the LCI method, where active stabilization of the interferometer by means of a reference beam allows uninterrupted detection of very small phase shifts with high bandwidth and minimal computer processing. A reference beam locked at an arbitrary phase angle gives direct sample phase measurements without reference arm scanning. Preferred embodiments provide two-dimensional and three-dimensional phase imaging.

优选的实施方案依赖Michelson干涉仪借助基准激光束的主动稳定。主动稳定的干涉仪300的优选实施方案的示意图被展示在图11中。主动稳定的Michelson干涉仪系统300包括反射镜306;移动反射镜310;分光镜304;相位调制器308;探测器318;本地振荡源320、322;混频器316和求和放大器312。被分光镜304分开的连续波激光束横越两个干涉仪臂并且在探测器318处被重新组合。干涉仪的一个臂包含相位调制元件308,例如光电调制器或安装在压电转换器上的反射镜。对光程差的大幅度调节可以借助平移反射镜310或任何其它可变的光学延迟线来完成。处理装置(例如,计算机315)与用来提供反馈和处理相位偏移测量结果的电子器件通信。电子图像显示器317用来显示相位偏移和相关的图像。A preferred embodiment relies on active stabilization of the Michelson interferometer by means of a reference laser beam. A schematic diagram of a preferred embodiment of an actively stabilized interferometer 300 is shown in FIG. 11 . Actively stabilized Michelson interferometer system 300 includes mirror 306 ; moving mirror 310 ; beamsplitter 304 ; phase modulator 308 ; detector 318 ; local oscillator sources 320 , 322 ; The continuous wave laser beam split by beamsplitter 304 traverses the two interferometer arms and is recombined at detector 318 . One arm of the interferometer contains a phase modulating element 308, such as an optoelectronic modulator or a mirror mounted on a piezoelectric transducer. Large adjustments to the optical path difference can be accomplished by means of translating mirror 310 or any other variable optical delay line. The processing means (eg, computer 315) is in communication with electronics for providing feedback and processing the phase offset measurements. Electronic image display 317 is used to display the phase shift and associated images.

两个干涉仪臂之间的相位差是按正弦曲线调制的:The phase difference between the two interferometer arms is modulated sinusoidally:

φ=φ+φdsin(Ωt)                   (16)φ=φ+φ d sin(Ωt) (16)

其中φ=k(L1-L2)=kΔL是两个臂之间的相位差,φd<2π是调制深度,而Ω是调制频率。被探测的干涉仪信号是用来自干涉仪两个臂的光束的相干加法给出的:where φ=k(L 1 −L 2 )=kΔL is the phase difference between the two arms, φ d < 2π is the modulation depth, and Ω is the modulation frequency. The detected interferometer signal is given by the coherent addition of the beams from the two arms of the interferometer:

I=I1+I2+2(I1I2)1/2cosφ            (17)I=I 1 +I 2 +2(I 1 I 2 ) 1/2 cosφ (17)

I和φ之间的非线性关系导致被探测的信号有在调制频率Ω的许多谐波频率下的组份。第一(IΩ)和第二(I)谐波项是用下式给出的:The non-linear relationship between I and φ causes the detected signal to have components at many harmonic frequencies of the modulation frequency Ω. The first (I Ω ) and second (I ) harmonic terms are given by:

IΩ=4J1d)(I1I2)1/2sinφsin(Ωt)            (18) =4J 1d )(I 1 I 2 ) 1/2 sinφsin(Ωt) (18)

I=4J2d)(I1I2)1/2cosφcos(2Ωt)          (19)I =4J 2d )(I 1 I 2 ) 1/2 cosφcos(2Ωt) (19)

IΩ和I分别按Ω和2Ω解调是借助混频器316或锁定放大器完成的,而且两个信号都作为φ的函数被放大,以便给出相等的振幅:The demodulation of I Ω and I into Ω and 2Ω respectively is done by means of a mixer 316 or a lock-in amplifier, and both signals are amplified as a function of φ to give equal amplitudes:

V1=V0sinφ         (20)V 1 =V 0 sinφ (20)

V2=V0cosφ         (21)V 2 =V 0 cosφ (21)

使用模拟或数字电路,线性组合V0是用随时间变化的参数θ计算的:Using an analog or digital circuit, the linear combination V0 is computed with a time-varying parameter θ:

Vθ=cosθ*V1-sinθ*V2=V0sin(φ-θ)       (22)V θ =cosθ*V 1 -sinθ*V 2 =V 0 sin(φ-θ) (22)

这个信号被用作误差信号把干涉仪锁定在有正斜率的任何零交点。Vθ(t)在被反馈到相位调制器(高频)和路径长度调制器(低频)之前被积分、滤波和放大以便主动消除干涉仪噪声。线性组合Vθ(t)被用作误差信号以便允许锁定到任意相位θ。This signal is used as an error signal to lock the interferometer to any zero crossing with a positive slope. V θ (t) is integrated, filtered and amplified before being fed back to the phase modulator (high frequency) and path length modulator (low frequency) to actively cancel the interferometer noise. The linear combination V θ (t) is used as the error signal to allow locking to an arbitrary phase θ.

稳定的干涉仪可以如同在此描述的那样与相敏低相干性干涉测量法结合。在此被描述的系统组件全部可以借助自由空间光学系统或光纤光学系统来实现。为了清楚,例证展示自由空间光学系统的实现。Stabilized interferometers can be combined with phase-sensitive low-coherence interferometry as described herein. The system components described here can all be realized by means of free-space optics or fiber optics. For clarity, the illustration shows the implementation of a free-space optical system.

用于光学延迟相敏LCI的靠基准光束稳定的干涉仪的示意图展示在图12中。来自低相干光源的光束353在稳定的干涉仪中通过与锁定光束355相同的路径。通过改变干涉仪两个臂之间的(稳定)路径长度差,准备由按干涉仪锁定调制频率调制的其间有非常稳定的连续可变的光程延迟的两份LC光束“副本”之和组成的输出光束。A schematic diagram of a reference beam stabilized interferometer for optical delay phase-sensitive LCI is shown in FIG. 12 . Beam 353 from a low-coherence source travels the same path as lock-in beam 355 in a stabilized interferometer. By varying the (stable) path length difference between the two arms of the interferometer, the preparation consists of the sum of two "copies" of the LC beam modulated at the interferometer lock modulation frequency with a very stable continuously variable optical path delay between them output beam.

样品382被放在盖玻片上,该盖玻片已在与样品接触的侧面上涂上一层防LC波长反射的涂层。LC光束是借助显微镜物镜380通过盖玻片和样品聚焦的。反向散射光波是用同一光学系统收集的并且聚焦在探测器366上。被探测的信号是反向散射扫描电磁场与时间延迟ΔL/c的自相关。它能被展示,以便显示在零延迟和与图13举例说明的依照到样品臂中的数对散射或反射表面之间的两倍光程长度相对应的延迟下的干涉图。具体地说,盖玻片没有涂层的侧面位于距离样品大约一个盖玻片厚度d的位置;来自样品的干涉信号在玻璃的折射指数为n的情况下是按光程延迟nd看到的。Sample 382 was placed on a coverslip that had been coated on the side in contact with the sample with an anti-reflection coating at the LC wavelength. The LC beam is focused through the coverslip and sample by means of microscope objective 380 . The backscattered light waves are collected using the same optical system and focused on a detector 366 . The detected signal is the autocorrelation of the backscattered scanning electromagnetic field with the time delay ΔL/c. It can be displayed to show the interferogram at zero delay and a delay corresponding to twice the optical path length between pairs of scattering or reflecting surfaces according to the sample arms illustrated in FIG. 13 . Specifically, the uncoated side of the coverslip is located approximately one coverslip thickness d away from the sample; the interference signal from the sample is seen with an optical path delay nd given the refractive index n of the glass.

由于ΔL=~2nd,样品信号借助混频器或锁定放大器按调制频率被解调,提供样品相位的连续测量。为了锁定解调的低相干性信号中的零交点,干涉仪锁定相位θ可以依次用电子学方法改变。以所述方式,干涉仪锁定相位的时间进展被用作样品相位的直接测量。所述锁定方案有独立于样品信号的振幅的优势。Since ΔL=~2nd, the sample signal is demodulated at the modulation frequency by means of a mixer or lock-in amplifier, providing a continuous measurement of the sample phase. The interferometer lock phase θ can in turn be changed electronically in order to lock to zero crossings in the demodulated low-coherence signal. In the described manner, the time progression of the locked phase of the interferometer is used as a direct measure of the phase of the sample. The locking scheme has the advantage of being independent of the amplitude of the sample signal.

所述系统依照优选实施方案类似于双光束光学计算机断层摄影术(OCT)技术,因为光学延迟在低相干性光波进入样品之前已准备好,而且被探测的信号对样品和干涉仪之间的距离变化是不敏感的。在其它可能的优选实施方案中,也可以使用Mach-Zender干涉仪配置准备低相干性光束。The system according to the preferred embodiment is similar to the two-beam optical computed tomography (OCT) technique in that the optical delay is prepared before the low-coherence light waves enter the sample, and the detected signal is sensitive to the distance between the sample and the interferometer. Changes are insensitive. In other possible preferred embodiments, a Mach-Zender interferometer configuration can also be used to prepare low coherence beams.

通过把可变的衰减器引入干涉仪的一个或两个臂,两个时间延迟的电磁场的相对振幅能为了优化干涉信号而被调制。By introducing variable attenuators into one or both arms of the interferometer, the relative amplitudes of the two time-delayed electromagnetic fields can be modulated in order to optimize the interfering signal.

靠基准光束稳定的相敏的LCI的示意图被展示在图14A中。该系统组件与图11类似,但是用盖玻片430上的样品代替干涉仪的一个反射镜。来自两个低相干光源(LC1和LC2)的两个光束422、424是干涉仪输入端上的入射光束。基准光束有相当于或大于盖玻片厚度(例如,大约150微米)的相干长度。盖玻片反射被用来锁定干涉仪。短的相干长度的基准光束防止干涉仪锁定受来自显微镜物镜和其它表面的虚假反射的影响。A schematic of a phase-sensitive LCI stabilized by a reference beam is shown in Figure 14A. The system components are similar to FIG. 11 , but with the sample on a cover glass 430 instead of one mirror of the interferometer. Two beams 422, 424 from two low coherence light sources (LC1 and LC2) are the incident beams on the input of the interferometer. The reference beam has a coherence length equal to or greater than the thickness of the coverslip (eg, approximately 150 microns). The coverslip reflection was used to lock the interferometer. The short coherence length of the reference beam prevents interferometer locking from being affected by spurious reflections from microscope objectives and other surfaces.

为了区分样品表面和后表面的反射,信号光束有比盖玻片厚度小好几倍的相干长度。基准臂长度是为了给出来自样品的干涉图而被调节的,而且如同先前描述的那样,该信号是为了给出图15A和15B举例说明的样品相位而被解调的。干涉仪关于盖玻片无涂层侧面的锁定导致与这个界面相关的样品相位测量,而且几乎排除所有外部的干涉仪噪声。In order to distinguish between reflections from the sample surface and the rear surface, the signal beam has a coherence length several times smaller than the thickness of the cover glass. The reference arm length is adjusted to give the interferogram from the sample and, as previously described, the signal is demodulated to give the sample phase as illustrated in Figures 15A and 15B. Locking of the interferometer with respect to the uncoated side of the coverslip results in a phase measurement of the sample relative to this interface and virtually excludes all external interferometer noise.

与参照图11描述的光学延迟方法比较,这个优选实施方案有信号光束和基准光束两者都作为样品上的入射光束的缺点。对于生物材料,尤其是活细胞,这或许限制可能使用的基准光束功率,从而导致降低锁定质量。另一方面,扫描基准反射镜允许更直截了当地辨认来自样品的反射。诸如计算机453之类的处理装置与用来提供反馈和处理相位偏移测量结果的电子器件通信。电子图像显示器455用来显示相位偏移和相关的图像。Compared to the optical delay method described with reference to Figure 11, this preferred embodiment has the disadvantage of having both the signal beam and the reference beam as incident beams on the sample. For biological materials, especially living cells, this may limit the reference beam power that can be used, resulting in reduced locking quality. Scanning the reference mirror, on the other hand, allows more straightforward identification of reflections from the sample. Processing means such as a computer 453 is in communication with the electronics used to provide feedback and process the phase offset measurements. Electronic image display 455 is used to display the phase shift and associated images.

优选的实施方案能使用两种方法使某个区域上的样品相位成像。在优选的第一种方法中,入射光束可以如同在大多数OCT设备中那样沿着X-Y方向在样品上扫描。在包括靠基准光束稳定的LCI的实施方案中,务必在光束扫描的时候维持基准光束干涉仪锁定。依照第二种方法,电荷耦合器件(CCD)或光电二极管阵列可以用来探测这些信号而不需要扫描。图16举例说明用于稳定的相敏LCI的成像系统500。这个光学系统用来照明扩大范围的区域并且使散射光在探测器上成像。图17举例说明系统配置的简化的展开方案,以便依照本发明的优选实施方案举例说明光学设计。实线表示入射光线,而虚线表示反向散射光线。A preferred embodiment can phase image a sample over a region using two methods. In the preferred first method, the incident beam can be scanned across the sample along the X-Y direction as in most OCT devices. In implementations that include an LCI that is stabilized by a reference beam, it is important to maintain reference beam interferometer lock while the beam is scanning. According to the second method, a charge-coupled device (CCD) or photodiode array can be used to detect these signals without scanning. Figure 16 illustrates an imaging system 500 for a stable phase-sensitive LCI. This optical system is used to illuminate the extended area and image the scattered light on the detector. Figure 17 illustrates a simplified development of a system configuration to illustrate optical design in accordance with a preferred embodiment of the present invention. Solid lines represent incident rays, while dashed lines represent backscattered rays.

就CCD成像而言,相对相位的测量可以通过分析4幅图像的序列完成,每幅都在相位方面不同于前一幅,相差π/2。图14B举例说明在用于依照本发明使用带压电转换器(PZT)461的反射镜产生相位偏移的主动稳定的相敏低相干性干涉测量法的系统中使用CCD成像的实施方案。电路469是用来使用PZT产生相位偏移的电子器件和用于探测相位偏移的电子器件。CCD是被集成到一片紧凑的电子芯片之中的象素阵列。本身与诸如计算机478之类的处理装置连接的CCD控制器477与CCD通信。图像显示器479用来显示相位偏移和相关的图像。In the case of CCD imaging, the measurement of relative phase can be done by analyzing a sequence of 4 images, each different in phase from the previous one by π/2. Figure 14B illustrates an embodiment using CCD imaging in a system for actively stabilized phase-sensitive low-coherence interferometry using mirrors with piezoelectric transducers (PZT) 461 to produce phase shifts in accordance with the present invention. Circuit 469 is the electronics to generate the phase shift using the PZT and the electronics to detect the phase shift. A CCD is an array of pixels integrated into a compact electronic chip. A CCD controller 477, itself connected to a processing device such as a computer 478, communicates with the CCD. Image display 479 is used to display the phase shift and associated images.

对于高带宽相位成像,来自光电二极管阵列的信号可以按第一谐波和第二谐波个别地解调;这允许明确地测量每个象素的相位。For high-bandwidth phase imaging, the signal from the photodiode array can be individually demodulated in first and second harmonics; this allows unambiguous measurement of the phase of each pixel.

本发明的干涉测量系统的优选实施方案的较高的灵敏度和带宽为在生物学的或非生物学的媒介物中测量小的光学相位偏移提供新的可能性。例如,这些优选实施方案能研究细胞膜的运动和波动。双波长的相敏LCI已经用来观察人类结肠细胞培养物的细胞体积调节和膜动力学。最近,已在培养物中添加叠氮化钠之后观察到细胞膜的低频振荡。优选的LCI实施方案允许按较小的时间刻度研究膜动力学,在这种情况下热驱动的波动和机械振动可能是更重要的。依照本发明的优选实施方案的二维成像方法允许在收集互相影响的细胞时研究膜波动。振荡和相互关系能提供关于细胞发信号的信息。The higher sensitivity and bandwidth of preferred embodiments of the interferometry system of the present invention provide new possibilities for measuring small optical phase shifts in biological or non-biological media. For example, these preferred embodiments enable the study of cell membrane motion and fluctuations. Dual-wavelength phase-sensitive LCI has been used to observe cell volume regulation and membrane dynamics in human colonic cell cultures. Recently, low frequency oscillations of cell membranes have been observed after addition of sodium azide in culture. Preferred LCI implementations allow the study of membrane dynamics on smaller time scales, where thermally driven fluctuations and mechanical vibrations may be more important. The two-dimensional imaging method according to a preferred embodiment of the present invention allows the study of membrane fluctuations while collecting interacting cells. Oscillations and correlations can provide information about cellular signaling.

本发明的优选实施方案能用于神经元动作电位的测量。在神经科学中对于改进的非侵入式地监测神经元的电信号的光学方法有很大的兴趣。现在的方法仰靠对钙敏感或对电压敏感的染料,它们有许多问题,包括寿命短、光致毒性和缓慢的响应时间。Preferred embodiments of the present invention can be used for the measurement of neuronal action potentials. There is great interest in neuroscience in improved optical methods for non-invasively monitoring electrical signals of neurons. Current approaches rely on calcium-sensitive or voltage-sensitive dyes, which suffer from a number of problems, including short lifetimes, phototoxicity, and slow response times.

几十年前人们就已经知道动作电位在神经纤维和细胞体中伴有光学变化。除此之外,在刺激期间,神经已经表明呈现短暂的体积增加。这些变化已经根据细胞膜中的相位转变和由于细胞膜中的偶极子的重新定向造成的指数偏移得到解释。It has been known for decades that action potentials are accompanied by optical changes in nerve fibers and cell bodies. In addition to this, nerves have been shown to exhibit transient volume increases during stimulation. These changes have been explained in terms of phase transitions in the cell membrane and exponential shifts due to the reorientation of dipoles in the cell membrane.

依照优选实施方案的相敏LCI方法可以用来测量与动作电位相关联的光学和机械变化。增大的带宽允许按大约1ms的动作电位时标灵敏地测量相位。本发明的优选实施方案能用来提供神经信号的非侵入式的长期测量和提供使许多神经元同时成像的能力。这些实施方案帮助分析神经活动的时间空间图式形成对于了解大脑是重要的。已知与动作电位相伴的小的(≈10-4rad)指数偏移和膜波动在本发明的提供高水平敏感速度和高带宽(>1kHz)的优选实施方案中能被探测出来。这些实施方案使用消除噪声的方法,例如,防止噪声进入的隔离法;使用反馈元件消除噪声的稳定法;提供不用反馈消除噪声把噪声影响减到最小的共向光程干涉测量法的差动测量。The phase-sensitive LCI method according to the preferred embodiment can be used to measure optical and mechanical changes associated with action potentials. The increased bandwidth allows sensitive measurement of phase on an action potential timescale of approximately 1 ms. Preferred embodiments of the invention can be used to provide non-invasive long-term measurements of neural signals and provide the ability to image many neurons simultaneously. These embodiments help analyze the spatiotemporal patterning of neural activity that is important for understanding the brain. The small ( ≈10-4 rad) exponential shifts and membrane fluctuations known to accompany action potentials can be detected in preferred embodiments of the invention which provide high levels of sensitivity speed and high bandwidth (>1 kHz). These embodiments use methods of noise cancellation such as isolation to prevent noise ingress; stabilization to cancel noise using feedback elements; differential measurements to provide common path interferometry without feedback noise cancellation to minimize noise effects .

在此描述的实施方案能被用于许多医学应用。例如,皮层映射能在神经外科手术期间完成,与现有技术的电极法相比较在速度和分辨率方面有进步。此外,这些优选实施方案能在神经外科手术期间用来使癫痫焦点定域。这些实施方案也能监测眼睛中的视网膜神经活动。本发明的优选实施方案的其它应用包括归因于这些实施方案提供的高速度的二维和三维扫描;光电二极管探测器提供的高动态范围和DC抑制;细胞生物学方面的纳米级成像;上皮组织的表征和膜的振动的探测,例如,但不限于,听觉细胞和血管。The embodiments described herein can be used in many medical applications. For example, cortical mapping can be accomplished during neurosurgery with improvements in speed and resolution compared to prior art electrode methods. Additionally, these preferred embodiments can be used to localize epileptic focus during neurosurgery. These embodiments are also capable of monitoring retinal neural activity in the eye. Other applications of preferred embodiments of the present invention include two-dimensional and three-dimensional scanning due to the high speed provided by these embodiments; high dynamic range and DC suppression provided by photodiode detectors; nanoscale imaging in cell biology; epithelial Characterization of tissues and detection of membrane vibrations, such as, but not limited to, auditory cells and blood vessels.

包括双光束干涉仪的系统:Systems including a dual-beam interferometer:

本发明的优选实施方案包括集成在传统的光波显微镜中的以光纤为基础的光学延迟相敏低相干性干涉仪。同步的电学和光学测量能在海马神经元的培养物中完成。优选的实施方案包括包含光电二极管阵列或快速扫描光束的成像系统。用于光学刺激神经元的方法与动作电位的LCI测量相结合能形成用来研究神经网络动力学、突触可塑性和神经科学方面的其它基本问题的极其有用的新型工具。A preferred embodiment of the invention includes a fiber-based optical retardation phase-sensitive low-coherence interferometer integrated in a conventional lightwave microscope. Simultaneous electrical and optical measurements can be made in cultures of hippocampal neurons. Preferred embodiments include imaging systems comprising photodiode arrays or rapidly scanning beams. Methods for optically stimulating neurons combined with LCI measurements of action potentials could form extremely useful new tools for studying neural network dynamics, synaptic plasticity and other fundamental questions in neuroscience.

另一个实施方案将相敏成像技术应用于脑切片,甚至活体神经元。跟踪和补偿脑表面的运动的是有重大意义的挑战。光学散射限制可能提取神经元信号的深度,但是大约100微米的深度可能是可能的。Another embodiment applies phase-sensitive imaging techniques to brain slices and even living neurons. Tracking and compensating for motion on the brain surface presents significant challenges. Optical scattering limits the depth at which neuronal signals may be extracted, but depths of approximately 100 micrometers may be possible.

在此以前描述的主动稳定的干涉仪的优选实施方案已经包括两个波长系统,其中第一波长被用于稳定而第二波长被用于相位测量。图18A举例说明两点式Mach-Zender外差干涉仪系统的示意图,其中使用一个波长。这种点稳定的/基准干涉仪系统测量通过样品586上两个点的光波的相位差。几乎共向光程的几何学降低干涉仪的相位噪声。The preferred embodiment of the actively stabilized interferometer described heretofore has included a two wavelength system, where the first wavelength is used for stabilization and the second wavelength is used for phase measurement. Figure 18A illustrates a schematic diagram of a two-point Mach-Zender heterodyne interferometer system in which one wavelength is used. This point-stabilized/reference interferometer system measures the phase difference of light waves passing through two points on a sample 586. The geometry of the nearly co-directional optical path reduces the phase noise of the interferometer.

准直激光束或低相干光源被分光镜584分成样品586路径和基准路径。样品光束通过样品586和透镜L1(物镜透镜)588和在最后的分光镜592前面的L2(管透镜)590。透镜L1588和L2590分别有焦距f1和f2而且构成放大倍率M=f2/f1的显微镜。这些透镜排成一线,以致样品586和L1588之间的距离是f1,L1和L2之间的距离是f1+f2,而成像平面位于距L2的距离为f2的位置。A collimated laser beam or low coherence light source is split by a beam splitter 584 into a sample 586 path and a reference path. The sample beam passes through the sample 586 and lenses L 1 (objective lens) 588 and L2 (tube lens) 590 in front of the final beam splitter 592 . Lenses L1 588 and L2 590 have focal lengths f1 and f2 respectively and constitute a microscope of magnification M= f2 / f1 . These lenses are aligned such that the distance between sample 586 and L 1 588 is f 1 , the distance between L 1 and L 2 is f 1 + f 2 , and the imaging plane lies at a distance f 2 from L 2 Location.

基准光束通过用频率分别为ω1和ω2的射频RF电磁场驱动的两个声光调制器594,AOM1和AOM2。可变光栏用来选择来自AOM1的+1级衍射光束和来自AOM2的-1级衍射光束。所以,以频率ω0在AOM1入射的光波以频率ωR=ω0+Ω(其中Ω=ω12)从第二针孔射出。这种双AOM配置是为了获得大约100kHz的比较低的外差频率Ω而被采用的。低的外差频率对于高灵敏度光电探测器的使用可能是优选的而且也有利于光学对准,因为在光束方向改变非常小的情况下,Ω可能被设定为等于零。如果需要较高的外差频率,可以使用单个AOM。诸如计算机609和图像显示器611之类的处理装置与所述系统通信。The reference beam passes through two acousto-optic modulators 594, AOM 1 and AOM 2 , driven with radio frequency RF electromagnetic fields of frequencies ω 1 and ω 2 respectively. The variable diaphragm is used to select the +1st order diffracted beam from AOM 1 and the -1st order diffracted beam from AOM 2 . Therefore, a light wave incident on AOM 1 at frequency ω 0 exits the second pinhole at frequency ω R0 +Ω (where Ω=ω 1 −ω 2 ). This dual AOM configuration is used to obtain a relatively low heterodyne frequency Ω of about 100kHz. A low heterodyne frequency may be preferable for the use of high-sensitivity photodetectors and also facilitates optical alignment, since Ω may be set equal to zero for very small beam direction changes. If a higher heterodyne frequency is required, a single AOM can be used. Processing means such as computer 609 and image display 611 are in communication with the system.

频移的基准光束的频率被分开的距离等于其焦距之和的透镜L3598和L4600扩展。在两个成像平面的信号电磁场和基准电磁场能以复数记号法用下式描述:The frequency of the frequency shifted reference beam is extended by lenses L3 598 and L4 600 separated by a distance equal to the sum of their focal lengths. The signal electromagnetic field and the reference electromagnetic field in the two imaging planes can be described in complex notation by the following formula:

ES(x,y,t)=ES 0(x,y)exp[i(φs(x,y,t)+φN,S(x,y,t)-ωt)]  (23)E S (x, y, t) = E S 0 (x, y) exp[i(φ s (x, y, t) + φ N, S (x, y, t) - ωt)] (23)

ER(x,y,t)=ER 0(x,y)exp[iφN,R(x,y,t)-(ω+Ω)t]            (24)E R (x, y, t) = E R 0 (x, y) exp[iφ N, R (x, y, t)-(ω+Ω)t] (24)

在这里x和y是沿着光程的横向坐标,φS(x,y,t)是正在研究的样品相位,φN,S(x,y,t)和φN,R(x,y,t)表示样品臂和基准臂中的干涉仪噪声,而ES 0(x,y),ER 0(x,y)是电磁场振幅轮廓,它们可能是,例如,但不限于,高斯型的。Here x and y are the transverse coordinates along the optical path, φ S (x, y, t) is the phase of the sample under study, φ N, S (x, y, t) and φ N, R (x, y , t) represent the interferometer noise in the sample and reference arms, while E S 0 (x, y), E R 0 (x, y) are the electromagnetic field amplitude profiles, which may be, for example, but not limited to, Gaussian of.

样品相位φS(x,y,t)可以用样品随时间变化的折射指数分布nS(x,y,z,t)来表达:The sample phase φ S (x, y, t) can be expressed by the refractive index distribution n S (x, y, z, t) of the sample over time:

&phi;&phi; SS (( xx ,, ythe y ,, tt )) == &Integral;&Integral; zz 11 zz 22 nno SS (( xx // Mm ,, ythe y // Mm ,, zz ,, tt )) dzdz

其中z是轴向坐标,而且积分是在样品的深度之上完成的。请注意放大因子M。在两个成像平面的强度是用下式给出的:where z is the axial coordinate and integration is done over the depth of the sample. Note the magnification factor M. The intensities at the two imaging planes are given by:

I±=|ES±ER|2=|ES 0|2+|ER 0|2 I ± =|E S ±E R | 2 =|E S 0 | 2 +|E R 0 | 2

                                               (26)(26)

±2|ES 0||ER 0|cos[φS(x,y,t)+φN,S(x,y,t)-φN,R(x,y,t)+Ωt]±2|E S 0 ||E R 0 |cos[φ S (x, y, t) + φ N, S (x, y, t) - φ N, R (x, y, t) + Ωt]

外差信号是用定位在位置(x1,y1)和(x2,y2)的两个光电二极管PD1 604和PD2 606探测的。光波可能是通过光纤或针孔收集的。被探测强度的AC分量是用下式给出的:The heterodyne signal is detected with two photodiodes PD1 604 and PD2 606 positioned at positions (x 1 , y 1 ) and (x 2 , y 2 ). Light waves may be collected through optical fibers or pinholes. The AC component of the detected intensity is given by:

I1(t)=2|ES 0||ER 0|cos[φS(x1,y1,t)+φN,S(x1,y1,t)-φN,R(x1,y1,t)+Ωt]   (27)I 1 (t)=2|E S 0 ||E R 0 |cos[φ S (x 1 , y 1 , t)+φ N, S (x 1 , y 1 , t)-φ N, R ( x 1 ,y 1 ,t)+Ωt] (27)

I2(t)=-2|ES 0||ER 0|cos[φS(x2,y2,t)+φN,S(x2,y2,t)-φN,R(x2,y2,t)+Ωt]  (28)I 2 (t)=-2|E S 0 ||E R 0 |cos[φ S (x 2 , y 2 , t )+φ N, S (x 2 , y 2 , t)-φ N, R (x 2 , y 2 , t)+Ωt] (28)

然后用锁定放大器或相位探测器电路608测量外差信号I1和-I2之间的相位差。The phase difference between the heterodyne signals I 1 and -I 2 is then measured with a lock-in amplifier or phase detector circuit 608 .

Φ12(t)=[φS(x1,y1,t)+φN,S(x1,y1,t)-φN,R(x1,y1,t)]-[φS(x2,y2,t)+φN,S(x2,y2,t)-φN,R(x2,y2,t)]Φ 12 (t) = [φ S (x 1 , y 1 , t) + φ N, S (x 1 , y 1 , t) - φ N, R (x 1 , y 1 , t)] - [φ S (x 2 , y 2 , t)+φ N, S (x 2 , y 2 , t)-φ N, R (x 2 , y 2 , t)]

=φS(x1,y1,t)-φS(x2,y2,t)+φN,S(x1,y1,t)-φN,S(x2,y2,t)-φN,R(x1,y1,t)+φN,R(x2,y2,t)= φ S (x 1 , y 1 , t) - φ S (x 2 , y 2 , t) + φ N, S (x 1 , y 1 , t) - φ N, S (x 2 , y 2 , t)-φ N, R (x 1 , y 1 , t)+φ N, R (x 2 , y 2 , t)

(29)(29)

如果现在假定干涉仪噪声与横向位置无关,即,If it is now assumed that the interferometer noise is independent of lateral position, i.e.,

φN,S(x1,y1,t)=φN,S(x2,y2,t)    (30a)φ N, S (x 1 , y 1 , t) = φ N, S (x 2 , y 2 , t) (30a)

φN,R(x1,y1,t)=φN,R(x2,y2,t)    (30b),φ N, R (x 1 , y 1 , t) = φ N, R (x 2 , y 2 , t) (30b),

那么实测的相位差只是样品相位在选定的点的差:Then the measured phase difference is simply the difference in sample phase at the chosen point:

φ12(t)=φS(x1,y1,t)-φS(x2,y2,t)  (31)φ 12 (t) = φ S (x 1 , y 1 , t) - φ S (x 2 , y 2 , t) (31)

依照本发明优选实施方案的方法可以用在仅仅服从物理限制的成像平面的许多光电探测器来实现。光电二极管阵列或光电二极管耦合光纤束可以用来使许多位置的相位同时成像。任何单一的探测器都可以被选作相对于它测量所有其它点的相位差的“基准”探测器。The method according to the preferred embodiment of the present invention can be implemented with many photodetectors in the imaging plane subject only to physical constraints. Photodiode arrays or photodiode-coupled fiber bundles can be used to image the phases of many locations simultaneously. Any single detector can be chosen as a "reference" detector against which to measure the phase difference of all other points.

成像Mach-Zender的外差干涉仪的示意图被展示在图18B中。装置670使已通过样品673的光波的相位成像。A schematic diagram of a heterodyne interferometer imaging Mach-Zender is shown in Figure 18B. Device 670 images the phase of light waves that have passed through sample 673 .

&phi;&phi; SS (( xx ,, ythe y ,, tt )) == &Integral;&Integral; zz 11 zz 22 nno SS (( xx // Mm ,, ythe y // Mm ,, zz ,, tt )) dzdz

光学设计类似于结合图18A描述的两点式Mach-Zeder外差干涉仪,但是有两个改变:(i)成像探测器(例如,电荷耦合器件(CCD)682)位于成像平面之一,以及(ii)使用光电偏振调制器672和偏光片681来完成频闪式探测。定量的相位图像是用相移干涉测量法获得的。The optical design is similar to the two-point Mach-Zeder heterodyne interferometer described in connection with FIG. 18A , but with two changes: (i) the imaging detector (e.g., a charge-coupled device (CCD) 682) is located in one of the imaging planes, and (ii) Use the photoelectric polarization modulator 672 and the polarizer 681 to perform stroboscopic detection. Quantitative phase images were obtained using phase-shift interferometry.

在CCD成像平面随时间变化的强度分布用下式给出:The time-varying intensity distribution at the CCD imaging plane is given by:

I_(x,y,t)=|ES±ER|2I_(x, y, t)=|E S ±E R | 2

(32a)(32a)

|ES 0|2+|ER 0|2-2|ES 0||ER 0|cos[φS(x,y,t)+φN,S(x,y,t)-φN,R(x,y,t)+Ωt]|E S 0 | 2 +|E R 0 | 2 -2|E S 0 ||E R 0 |cos[φ S (x, y, t)+φ N, S (x, y, t)-φ N,R (x,y,t)+Ωt]

频闪式相位干涉测量法用来以相敏方式使这个外差干涉图成像。这需要“门控”CCD的探测而且能以几种方式完成。增强的CCD能通过控制增强器电压被门控。在CCD前面的大孔径光电元件能作为快速光闸使用。在图18B举例说明的系统中,光电偏振开关用来控制干涉仪的输入光束的偏振。两种偏振能被标为“面内”和“面外”,对应于图18B。线偏振片681被放在CCD成像装置682前面,以便仅仅探测面内偏振光;面外偏振光的被偏振片吸收或反射。Stroboscopic phase interferometry is used to image this heterodyne interferogram in a phase-sensitive manner. This requires detection by "gated" CCDs and can be done in several ways. Enhanced CCDs can be gated by controlling the intensifier voltage. The large-aperture photoelectric element in front of the CCD can be used as a fast shutter. In the system illustrated in Figure 18B, an optoelectronic polarization switch is used to control the polarization of the input beam to the interferometer. The two polarization energies are labeled "in-plane" and "out-of-plane", corresponding to Figure 18B. A linear polarizer 681 is placed in front of the CCD imaging device 682 to detect only in-plane polarized light; out-of-plane polarized light is absorbed or reflected by the polarizer.

对准第一成像平面(如果需要,经由光纤)的光电二极管阵列用来获得两点式外差干涉仪中的下列信号:A photodiode array aligned to the first imaging plane (via fiber optics, if desired) is used to obtain the following signals in a two-point heterodyne interferometer:

I1(t)=2|ES 0||ER 0|cos[φS(x1,y1,t)+φN,S(x1,y1,t)-φN,R(x1,y1,t)+Ωt] (32b)I 1 (t)=2|E S 0 ||E R 0 |cos[φ S (x 1 , y 1 , t)+φ N, S (x 1 , y 1 , t)-φ N, R ( x 1 , y 1 , t)+Ωt] (32b)

然后,门控信号起源于外差信号I1,如下所述。电子比较器当外差信号是正的而且有正斜率的时候输出“高电平”。这对应于在相位0的门控信号。在相移为π/2,π和3π/2的类似信号能通过当外差信号分别为正的而且有负斜率、负的而且有负斜率和负的而且有正斜率的时候触发产生。依照本发明的优选实施方案,外差信号687和门控信号688-691被展示在图18C中。The gating signal is then derived from the heterodyne signal I 1 as described below. The electronic comparator outputs "high level" when the heterodyne signal is positive and has a positive slope. This corresponds to the gating signal at phase 0. Similar signals at phase shifts of π/2, π and 3π/2 can be generated by triggering when the heterodyne signal is positive with a negative slope, negative with a negative slope, and negative with a positive slope, respectively. In accordance with a preferred embodiment of the present invention, heterodyne signal 687 and gating signals 688-691 are shown in Figure 18C.

然后,门控信号被用于连续地门控CCD探测器。该序列受计算机685控制。只有当门控信号处于“高电乎”的时候,才允许光波落到CCD上。对应于四个门控信号而不是相等数目的外差周期的四次曝光被CCD捕获,以便获得四次曝光时对应的强度。四个实测的条纹图像被称为I0(x,y)、Iπ/2(x,y)、Iπ(x,y)、I3π/2(x,y)。于是,相对的样品相位能用下式计算出来:The gating signal is then used to continuously gate the CCD detector. The sequence is under computer 685 control. Only when the gating signal is "high", light waves are allowed to fall on the CCD. Four exposures corresponding to four gating signals instead of an equal number of heterodyne cycles are captured by the CCD in order to obtain the corresponding intensities at the four exposures. The four measured fringe images are called I 0 (x, y), I π/2( x, y), I π (x, y), I 3π/2 (x, y). Then, the relative sample phase can be calculated by:

&phi;&phi; SS (( xx ,, ythe y )) tanthe tan -- 11 (( II 33 &pi;&pi; // 22 (( xx ,, ythe y )) -- II &pi;&pi; // 22 (( xx ,, ythe y )) II 00 (( xx ,, ythe y )) -- II &pi;&pi; (( xx ,, ythe y )) )) -- -- -- (( 3232 cc ))

由于相位在四帧之中每一帧之间偏移。用来改变相位和计算相位的其它方法能被使用,例如,在此通过引证将其全部教导并入的Creath,K在“Phase-Measurement Interferometry Techniques”,Progress in Optics,Vol.XXVI,E.Wolf,Ed.,Elsevier SciencePublishers,Amsterdam,1988,pp,349-393中描述的那些。此外,干涉仪噪声只要它在图像平面上是常数就能借助基准有相关关系的噪声外差信号I1(t)被消除。频闪式相位成像能被看作是“桶式”积分形式,其中积分是根据共同的外差基准信号对时间完成的。Since the phase is shifted between each of the four frames. Other methods for changing the phase and calculating the phase can be used, for example, Creath, K. in "Phase-Measurement Interferometry Techniques", Progress in Optics, Vol.XXVI, E.Wolf, the entire teaching of which is hereby incorporated by reference , Ed., those described in Elsevier Science Publishers, Amsterdam, 1988, pp, 349-393. Furthermore, interferometer noise can be eliminated by means of the reference correlated noise heterodyne signal I 1 (t) as long as it is constant in the image plane. Stroboscopic phase imaging can be viewed as a form of "barrel" integration where integration is done versus time from a common heterodyne reference signal.

依照本发明的优选实施方案,频闪式相位成像也能用双光束外差干涉仪完成。这需要能够被CCD探测的低相干性波长,例如850nm。与下文描述的图19相比较,它还需要把样品光束递送系统修改成图18D所示的成像系统。在这个实施方案中,用来产生四个门控信号的基准外差信号是由光学基准信号提供的。探测信号的模板可能是借助光纤开关或偏振调制器用偏振片完成的。According to a preferred embodiment of the present invention, stroboscopic phase imaging can also be accomplished with a two-beam heterodyne interferometer. This requires a low coherence wavelength, such as 850nm, that can be detected by the CCD. It also requires modification of the sample beam delivery system to the imaging system shown in FIG. 18D as compared to FIG. 19 described below. In this embodiment, the reference heterodyne signals used to generate the four gating signals are provided by optical reference signals. Masking of the probe signal may be done with polarizers by means of fiber optic switches or polarization modulators.

本发明的优选实施方案包括双光束反射干涉仪。双光束反射干涉测量法的优选实施方案包括隔离双光束外差LCI。外差式双光束干涉仪620被展示在图19。所述干涉仪用来测量来自样品的反射光波相对于位于样品之前的部份反射表面的相位变化。例如,人们可能测量从玻璃薄片上的样品反射的光波的相位。作为另一个例子,测量可能是相对于来自放在被研究的样品附近的光纤探头顶端的反射进行的。A preferred embodiment of the invention includes a two-beam reflective interferometer. A preferred embodiment of two-beam reflection interferometry involves isolating two-beam heterodyne LCI. A heterodyne two-beam interferometer 620 is shown in FIG. 19 . The interferometer is used to measure the phase change of reflected light waves from the sample relative to a partially reflecting surface located in front of the sample. For example, one might measure the phase of light waves reflected from a sample on a glass slide. As another example, measurements may be made relative to reflections from a fiber optic probe tip placed near the sample under study.

诸如超级发光二极管(SLD)或多模激光二极管之类的低相干性来源622被耦合到通过真空馈通进入真空室640的单模光纤之中。被封闭在该真空室里面的是隔震的自由空间外差Michelson干涉仪。低相干性光束经由准直透镜从光纤发射,然后被分光镜626分离。干涉仪的两个臂(叫做1(656)和2(658))包含被频率分别为ω1和ω2的射频电磁场驱动的声光调制器(AOM1 628和AOM2634))。在每个臂中,正偏移的一阶衍射光束是借助针孔选定的。光波被透镜630和636聚焦,然后被反射镜M1 632和M2 638反射回两个AOM。透镜被放在距离AOM和反射镜两者一倍焦距的位置。这种设计允许AOM回射校正继续保持低相干性(广谱的)光波的光谱。A low-coherence source 622 such as a superluminescent diode (SLD) or a multimode laser diode is coupled into a single-mode optical fiber that enters the vacuum chamber 640 through a vacuum feedthrough. Enclosed within this vacuum chamber is a shock-isolated free-space heterodyne Michelson interferometer. The low-coherence light beam is emitted from the fiber via a collimating lens, and then split by a beam splitter 626 . The two arms of the interferometer (called 1 (656) and 2 (658)) contain acousto-optic modulators (AOM1 628 and AOM2634) driven by radio frequency electromagnetic fields at frequencies ω1 and ω2 , respectively. In each arm, a positively offset first-order diffracted beam is selected by means of a pinhole. The light waves are focused by lenses 630 and 636 and then reflected by mirrors M1 632 and M2 638 back to the two AOMs. The lens is placed one focal length away from both the AOM and the mirror. This design allows the AOM retroreflective correction to continue to preserve the spectrum of low coherence (broad spectrum) light waves.

由于AOM是在双光路配置中操作的,以频率ω0入射的光波在通过臂1(656)和2(658)之后被分别偏移到ω0+2ω1和ω0+2ω2。两个通过臂1和2的光束之间的频率差是Ω=2(ω12)。Since the AOM is operated in a dual optical path configuration, light waves incident at frequency ω 0 are shifted to ω 0 +2ω 1 and ω 0 +2ω 2 after passing through arms 1 ( 656 ) and 2 ( 658 ), respectively. The frequency difference between the two beams passing arms 1 and 2 is Ω=2(ω 1 −ω 2 ).

反射镜之一M1(632)附着在平移台上,以便调节两个臂之间的光程长度差Δl=l1-l2。在通过两个臂之后,组合光束可以被看作是被时间延迟Δl/c分开两个脉冲的光束。来自两个干涉仪臂的反射借助准直仪660被聚焦返回光纤并且退出舱室640。One of the mirrors M1 (632) is attached to the translation stage in order to adjust the optical path length difference Δl=l 1 -l 2 between the two arms. After passing through both arms, the combined beam can be seen as a beam of two pulses separated by a time delay Δl/c. The reflections from the two interferometer arms are focused back into the fiber optic by means of collimator 660 and exit chamber 640 .

光循环器用来把回射光束与入射光束分开。光波作为自由空间光束被另一个准直仪662发射并且被聚焦在样品642上,因此首先通过部份反射的表面664。反向散射的光波被同一准直仪收集并且在通过另一个光循环器之后被光电二极管650探测。调节Michelson干涉仪的光学延迟,以便与来自样品S的反射和来自基准表面的反射之间的光程差Δs相配。当条件ΔL=Δs维持在光源的相干长度L之内时,在频率Ω下的外差信号由于从表面S642和R 664反射的光波之间的干涉而被探测。外差信号的相位代表样品反射相对于基准反射的相位的度量,所述外差信号相位相对于通过两个AOM驱动的电磁场的混合和加倍提供的本地振荡器测量。为了阻止由单一表面反射产生外差信号,长度Δs必须实质上大于相干长度LC。假定,样品厚度小于玻璃厚度Δs,以致信号涉及玻璃表面,而不涉及来自样品的散射。Optical circulators are used to separate the retroreflected beam from the incident beam. The light wave is emitted by another collimator 662 as a free-space beam and is focused on the sample 642 , thus first passing through a partially reflecting surface 664 . Backscattered light waves are collected by the same collimator and detected by a photodiode 650 after passing through another optical circulator. The optical retardation of the Michelson interferometer is adjusted to match the optical path difference Δs between the reflection from the sample S and the reflection from the reference surface. When the condition ΔL=Δs is maintained within the coherence length L of the light source, a heterodyne signal at frequency Ω is detected due to interference between light waves reflected from surfaces S642 and R664. The phase of the heterodyne signal represents a measure of the phase of the sample reflection relative to the reference reflection, measured relative to a local oscillator provided by the mixing and doubling of the electromagnetic fields driven by the two AOMs. To prevent heterodyning signals from single surface reflections, the length Δs must be substantially greater than the coherence length LC. It is assumed that the sample thickness is smaller than the glass thickness Δs, so that the signal relates to the glass surface and not to scattering from the sample.

干涉仪的定量描述如下。首先考虑波数为k0的单色光源。在Michelson干涉仪的输入端的电磁场振幅能用下式描述:A quantitative description of the interferometer follows. Consider first a monochromatic light source with wavenumber k 0 . The electromagnetic field amplitude at the input of the Michelson interferometer can be described by:

Ei=Aicos(k0z-ω0t)             (33)E i =A i cos(k 0 z-ω 0 t) (33)

通过AOM之后从分光镜返回的电磁场是用来自干涉仪两个臂的电磁场之和给出的:The electromagnetic field returning from the beamsplitter after passing through the AOM is given by the sum of the electromagnetic fields from the two arms of the interferometer:

Em=E1+E2=Aicos(2k1l1-(ω0+2ω1)t)+Aicos(2k2l2-(ω0+2ω2)t)(34)E m =E 1 +E 2 =A i cos(2k 1 l 1 -(ω 0 +2ω 1 )t)+A i cos(2k 2 l 2 -(ω 0 +2ω 2 )t)(34)

其中k1=k0+2ω1/c而k2=k0+2ω2/c。where k 1 =k 0 +2ω 1 /c and k 2 =k 0 +2ω 2 /c.

双重光束现在是样品上的入射光束。令s1是对基准反射的光学距离和s2是对样品反射的光学距离。如果基准反射和样品反射的反射率分别是R1和R2,而且忽略多次反射,那么从样品反射的电磁场是用下式给出的:The double beam is now the incident beam on the sample. Let s1 be the optical distance for the reference reflection and s2 the optical distance for the sample reflection. If the reflectances of the reference and sample reflections are R 1 and R 2 , respectively, and multiple reflections are neglected, then the electromagnetic field reflected from the sample is given by:

EE. sthe s == AA ii RR 11 coscos [[ 22 kk 11 (( ll 11 ++ sthe s 11 )) -- (( &omega;&omega; 00 ++ 22 &omega;&omega; 11 tt )) ]] ++ AA ii RR 11 coscos [[ 22 kk 22 (( ll 22 ++ sthe s 11 )) -- (( &omega;&omega; 00 ++ 22 &omega;&omega; 22 )) tt ]]

++ AA ii RR 22 coscos [[ 22 kk 11 (( ll 11 ++ sthe s 11 )) -- (( &omega;&omega; 00 ++ 22 &omega;&omega; 11 )) tt ]] ++ AA ii RR 22 coscos [[ 22 kk 22 (( ll 11 ++ sthe s 22 )) -- (( &omega;&omega; 00 ++ 22 &omega;&omega; 22 )) tt ]] -- -- -- (( 3535 ))

探测到的强度iD与电磁场振幅的平方成比例:The detected intensity i D is proportional to the square of the electromagnetic field amplitude:

ii DD. &Proportional;&Proportional; << || EE. sthe s || 22 >> == (( RR 11 ++ RR 22 )) (( 11 ++ coscos (( 22 kk 00 &Delta;l&Delta;l -- &Omega;t&Omega;t )) ++

22 RR 11 RR 22 [[ 22 coscos (( 22 kk 00 &Delta;s&Delta;s )) ++ coscos (( 22 kk 00 (( &Delta;l&Delta;l ++ &Delta;s&Delta;s -- &Omega;t&Omega;t )) )) ++ coscos (( 22 kk 00 (( &Delta;l&Delta;l -- &Delta;s&Delta;s -- &Omega;t&Omega;t )) )) ]] -- -- -- (( 3636 ))

其中光学频率振荡项已被忽略,而且假定频率偏移造成的波数偏移Ω/c与路径长度差Δs和Δl的逆相比较是可以忽略。The optical frequency oscillation term has been neglected, and it is assumed that the wavenumber shift Ω/c caused by the frequency shift is negligible compared with the inverse of the path length difference Δs and Δl.

为了建立低相干性(宽带)光源模型,假定它有高斯功率频谱密度,其中心波数为k0而且全波长的半最大值(FWHM)频谱带宽为Δk。To model a low-coherence (broadband) source, it is assumed to have a Gaussian power spectral density with a central wavenumber k 0 and a full-wavelength half-maximum (FWHM) spectral bandwidth of Δk.

SS (( kk )) == 22 lnln 22 &Delta;k&Delta;k &pi;&pi; expexp [[ -- (( kk -- kk 00 &Delta;k&Delta;k // (( 22 lnln 22 )) )) 22 ]] -- -- -- (( 3737 ))

对低相干性辐射探测到的强度是通过在频谱分布上积分单色结果发现的:The detected intensity for low coherence radiation is found by integrating the monochromatic result over the spectral distribution:

ii DD. ~~ == &Integral;&Integral; ii DD. (( kk )) SS (( kk )) dkdk == (( RR 11 ++ RR 22 )) (( 11 ++ Ff (( &Delta;l&Delta;l )) coscos (( 22 kk 00 &Delta;l&Delta;l -- &Omega;t&Omega;t ))

++ 22 RR 11 RR 22 [[ 22 Ff (( &Delta;s&Delta;s )) coscos (( 22 kk 00 &Delta;s&Delta;s )) ++ Ff (( &Delta;l&Delta;l ++ &Delta;s&Delta;s )) coscos (( 22 kk 00 (( &Delta;l&Delta;l ++ &Delta;s&Delta;s -- &Omega;t&Omega;t )) )) -- -- -- (( 3838 ))

++ Ff (( &Delta;l&Delta;l -- &Delta;s&Delta;s )) coscos (( 22 kk 00 (( &Delta;l&Delta;l -- &Delta;s&Delta;s -- &Omega;t&Omega;t )) )) ]]

其中in

Ff (( xx )) == expexp [[ -- (( xx ll cc // (( 22 lnln 22 )) )) 22 ]] -- -- -- (( 3939 ))

是选定频谱密度的光源相干性函数。在这里lc是相干长度is the source coherence function of the selected spectral density. Here l c is the coherence length

ll cc == 44 (( lnln 22 )) &Delta;k&Delta;k == 22 (( lnln 22 )) &lambda;&lambda; 00 22 &pi;&Delta;&lambda;&pi;&Delta;&lambda; -- -- -- (( 4040 ))

如果路径长度差被这样选定,以致在相干长度之内Δl=Δs,而且Δl>>lc,那么依支配时间而定的信号有如下形式:If the path length difference is chosen such that within the coherence length Δl=Δs, and Δl>>l c , then the dominant time-dependent signal has the form:

ii DD. ~~ (( ACAC )) == 22 RR 11 RR 22 [[ Ff (( &Delta;l&Delta;l -- &Delta;s&Delta;s )) coscos (( 22 kk 00 (( &Delta;l&Delta;l -- &Delta;s&Delta;s -- &Omega;t&Omega;t )) )) ]] -- -- -- (( 4141 ))

通过测量这个信号相对于本地振荡器652 LO=cos(Ωt)的相位,Δs的改变能被测量。请注意,为了阻止相位噪声通过Δl的改变影响测量结果,Michelson干涉仪的隔离是必不可少的。By measuring the phase of this signal relative to the local oscillator 652 LO=cos(Ωt), the change in Δs can be measured. Note that the isolation of the Michelson interferometer is essential in order to prevent phase noise from affecting the measurement results through changes in Δl.

图20依照本发明的优选实施方案举例说明隔离的双重基准外差低相干性干涉仪。干涉仪用来测量从选定的样品深度反射的光波相对于来自不同的样品深度的散射的相位。因为不需要玻璃反射表面,这种组件优于比较简单的双光束干涉仪。这个系统对于活体测量是理想的。双重基准Michelson干涉仪能用来在足够薄或透明的样品中使神经活动在三维体积上成像。所述系统能用来研究神经网络的生长。Figure 20 illustrates an isolated dual reference heterodyne low coherence interferometer in accordance with a preferred embodiment of the present invention. An interferometer is used to measure the phase of light waves reflected from selected sample depths relative to scattering from different sample depths. This assembly is superior to simpler two-beam interferometers because no glass reflective surfaces are required. This system is ideal for in vivo measurements. Dual reference Michelson interferometers can be used to image neural activity in three-dimensional volumes in sufficiently thin or transparent samples. The system can be used to study the growth of neural networks.

来自低相干光源702的光波被光纤耦合器706分离到上面的和下面的路径之中。上面的路径类似于上文结合图19描述的双光束干涉仪,频移为ω1的双光路AOM代替现在位于所述干涉仪的下面的路径之中的样品。两个电磁场在另一个光纤耦合器742中被重新组合。光电二极管746、748是按双平衡模式安排的。Light waves from low coherence light source 702 are split by fiber coupler 706 into upper and lower paths. The upper path is similar to the two-beam interferometer described above in connection with Figure 19, with a two-beam AOM shifted by ω1 replacing the sample now in the lower path of the interferometer. The two electromagnetic fields are recombined in another fiber coupler 742 . Photodiodes 746, 748 are arranged in a double-balanced pattern.

在单色光源情况下,干涉仪的定量描述如下。上面路径的电磁场可以写作:In the case of a monochromatic light source, the quantitative description of the interferometer is as follows. The electromagnetic field for the above path can be written as:

E1=Aicos(2k0l1-(ω0+2ω1-2ω3)t)+Aicos(2k0l2-(ω0+2ω2-2ω3)t)E 1 =A i cos(2k 0 l 1 -(ω 0 +2ω 1 -2ω 3 )t)+A i cos(2k 0 l 2 -(ω 0 +2ω2-2ω 3 )t)

(42)(42)

而下面路径是(再次假定样品包含在位置s1和s2的两个反射):And the following path is (again assuming the sample contains two reflections at positions s1 and s2 ):

EE. 22 == AA ii RR 11 coscos [[ 22 kk 00 sthe s 11 -- &omega;&omega; 00 tt ]] ++ AA ii RR 22 coscos [[ 22 kk 00 sthe s 22 -- &omega;&omega; 00 tt ]] -- -- -- (( 4343 ))

已假定光纤电缆的路径长度在两个臂之间是相等的。与频率为ω3的AOM 736相关联的反射镜740可以被平移,以使路径长度相等。It has been assumed that the path lengths of the fiber optic cables are equal between the two arms. The mirror 740 associated with the AOM 736 at frequency ω3 can be translated so that the path lengths are equal.

光电探测器信号的AC分量用下式给出:The AC component of the photodetector signal is given by:

ii DD. &Proportional;&Proportional; << || EE. 11 ++ EE. 22 || 22 >> ACAC == RR 11 [[ coscos (( 22 kk 00 (( ll 11 -- sthe s 11 )) -- &Omega;&Omega; 1313 tt )) ++ coscos (( 22 kk 00 (( ll 22 -- sthe s 11 )) -- &Omega;&Omega; 23twenty three tt )) ]] -- -- -- (( 4444 ))

++ RR 22 [[ coscos (( 22 kk 00 (( ll 11 -- sthe s 22 )) -- &Omega;&Omega; 1313 tt )) ++ coscos (( 22 kk 00 (( ll 22 -- sthe s 22 )) -- &Omega;&Omega; 23twenty three tt )) ]]

其中Ω13=2(ω13),而Ω23=2(ω23)。就高斯频谱分布而言,多色情况给出:Where Ω 13 =2(ω 1 −ω 3 ), and Ω 23 =2(ω 2 −ω 3 ). In terms of a Gaussian spectral distribution, the polychromatic case gives:

ii DD. ~~ == &Integral;&Integral; ii DD. (( kk )) SS (( kk )) dkdk &Proportional;&Proportional; RR 11 [[ Ff (( ll 11 -- sthe s 11 )) coscos (( 22 kk 00 (( ll 11 -- sthe s 11 )) -- &Omega;&Omega; 1313 tt ))

++ Ff (( ll 22 -- sthe s 11 )) coscos (( 22 kk 00 (( ll 22 -- sthe s 11 )) -- &Omega;&Omega; 23twenty three tt )) ]]

++ RR 22 [[ Ff (( ll 11 -- sthe s 22 )) coscos (( 22 kk 00 (( ll 11 -- sthe s 22 )) -- &Omega;&Omega; 1313 tt )) ++ Ff (( ll 22 -- sthe s 22 )) coscos (( 22 kk 00 (( ll 22 -- sthe s 22 )) -- &Omega;&Omega; 23twenty three tt )) ]] -- -- -- (( 4545 ))

假如在相干长度之内,l1≈s1,l2≈s2,而且Δl,Δs<<lc,那么主项是If within the coherence length, l 1 ≈ s 1 , l 2 ≈ s 2 , and Δl, Δs<<l c , then the main term is

ii DD. ~~ &Proportional;&Proportional; RR 11 Ff (( ll 11 -- sthe s 11 )) coscos (( 22 kk 00 (( ll 11 -- sthe s 11 )) -- &Omega;&Omega; 1313 tt )) ++ Ff (( ll 22 -- sthe s 22 )) coscos (( 22 kk 00 (( ll 22 -- sthe s 22 )) -- &Omega;&Omega; 23twenty three tt )) ]] -- -- -- (( 4646 ))

接下来,这两个频率组份在混频器中被组合起来,而且通带滤波器选择差频Ω12=Ω1323=ω12Next, these two frequency components are combined in a mixer, and a passband filter selects the difference frequency Ω 12132312 :

Xx == RR 11 RR 22 Ff (( ll 11 -- sthe s 11 )) Ff (( ll 22 -- sthe s 22 )) coscos (( 22 kk 00 (( ll 11 -- ll 22 -- (( sthe s 11 -- sthe s 22 )) )) -- &Omega;&Omega; 1212 tt )) -- -- -- (( 4747 ))

然后,相敏探测器测量信号相对于在通过AOM驱动电磁场的混频和加倍产生的Ω12下的本地振荡器的相位。该实测的相位是φ=2k0(Δl-Δs)。A phase-sensitive detector then measures the phase of the signal relative to a local oscillator at Ω generated by mixing and doubling of the AOM-driven electromagnetic field. The measured phase is φ=2k 0 (Δl−Δs).

移相器用来抵消可能不顾它的微分特性对相位测量有一些影响的干涉仪噪声。光电二极管信号组份的相位The phase shifter is used to cancel interferometer noise which may have some influence on the phase measurement despite its differential properties. Phase of photodiode signal components

RR 11 Ff (( ll 11 -- sthe s 11 )) coscos (( 22 kk 00 (( ll 11 -- sthe s 11 )) -- &Omega;&Omega; 1313 tt )) -- -- -- (( 4848 ))

被测量并且被用作误差信号,将来自s1的反射借助移相器锁定到恒定不变的相位。is measured and used as an error signal, locking the reflection from s1 to a constant phase with the aid of a phase shifter.

在使用真实样品的实施方案中,除了散射分布之外将没有两个反射。通过设定基准臂位置,干涉仪测量从两个不同深度散射的光波之间的相位差。In an embodiment using a real sample, there will be no two reflections other than the scatter distribution. By setting the reference arm position, the interferometer measures the phase difference between light waves scattered from two different depths.

结合图19描述的实施方案测量光学外差信号相对于通过声光调制器(AOM)射频电磁场混频产生的电信号的相位。有为数众多的与实施方案相关联的噪声来源。它们包括或许归因于来自射频电磁场的AOM加热的约为数分钟大约一个波长(1λ)的缓慢漂移和在60Hz和120Hz的相位噪声。此外,振幅出现在AOM调谐电压中而且或许归因于传输线噪声。在舱室外面的光纤移动时改变的宽带振幅和相位噪声的其它来源最有可能归因于光循环器中的偏振模色散(PMD)。The embodiment described in connection with FIG. 19 measures the phase of an optical heterodyne signal relative to an electrical signal generated by mixing with an acousto-optic modulator (AOM) radio-frequency electromagnetic field. There are numerous sources of noise associated with the implementation. They include a slow drift of about one wavelength (1λ) on the order of minutes and phase noise at 60 Hz and 120 Hz perhaps due to AOM heating from radio frequency electromagnetic fields. In addition, amplitudes appear in the AOM tuning voltage and may be due to transmission line noise. Other sources of broadband amplitude and phase noise that change as the fiber moves outside the chamber are most likely due to polarization mode dispersion (PMD) in the optical circulator.

本发明的优选实施方案最大限度地减少并优选消除噪声并且包括光学基准测量、或使用精确电压电源提供的AOM调谐电压或作为替代使用维持偏振的纤维光学部件以减少漂移和噪声。图21举例说明最大限度减少噪声的光学基准干涉仪的优选实施方案。所述实施方案解决结合图19描述的系统所经历的漂移和噪声问题。参照图21举例说明的实施方案是外差式双光束干涉仪。干涉仪用来使用可能作为样品物体或个别元素上不同的横向点的基准测量来自样品的反射光波的相位改变。诸如SLD之类的低相干性光源762被耦合到通过真空馈通进入真空室782的单模光纤之中。外差Michelson干涉仪如同图19描述那样操作。来自两个干涉仪臂的反射被准直仪766、792聚焦返回两个光纤并且退出该舱室。附加光程提供作为在个别元素上不同的横向点的基准。反向散射光波分别被两个准直仪788、790收集并且在通过光循环器794和798之后被两个光电二极管796、800探测。Preferred embodiments of the present invention minimize and preferably eliminate noise and include optical reference measurements, or AOM tuning voltages using precision voltage supplies or alternatively using polarization maintaining fiber optics to reduce drift and noise. Figure 21 illustrates a preferred embodiment of an optical reference interferometer that minimizes noise. The implementation addresses the drift and noise issues experienced by the system described in connection with FIG. 19 . The embodiment illustrated with reference to Figure 21 is a heterodyne two-beam interferometer. Interferometers are used to measure the phase change of reflected light waves from a sample using different transverse points that may serve as references on the sample object or individual elements. A low-coherence light source 762, such as an SLD, is coupled into a single-mode optical fiber that enters the vacuum chamber 782 through a vacuum feedthrough. The heterodyne Michelson interferometer operates as described for FIG. 19 . Reflections from the two interferometer arms are focused by collimators 766, 792 back into the two optical fibers and exit the chamber. Additional optical paths are provided as references for different lateral points on individual elements. The backscattered light waves are collected by two collimators 788, 790 and detected by two photodiodes 796, 800 after passing through optical circulators 794 and 798, respectively.

在双重基准干涉测量法实施方案中,把横向基准点和反射-基准相位测量结合起来。理想的是,基准点和样品物体都位于同一玻璃之上。对消除盖玻片中的任何倾斜、振动和/或膨胀效应有附加好处。如图22所示,实测的相位是:In a dual-reference interferometry implementation, transverse fiducial and reflection-reference phase measurements are combined. Ideally, both the fiducial and the sample object are on the same glass. This has the added benefit of eliminating any tilt, vibration and/or expansion effects in the coverslip. As shown in Figure 22, the measured phase is:

φ(t)=(φ11′)-(φ22′)        (49)φ(t)=(φ 11 ′)-(φ 22 ′) (49)

双重基准干涉仪的优选实施方案包括有相似的增益和频率响应的光电探测器,以便消除噪声。此外,维持偏振的组份和光纤能用来处理光纤中的偏振效应。具体地说,光循环器中的偏振模色散在两个正交偏振之间产生导致能通过使用维持偏振的部件减轻的振幅和相位噪声的可变延迟。在优选的实施方案中,数字式通带滤波器用来处理在光学信号中发现的谐波。A preferred embodiment of a dual reference interferometer includes photodetectors with similar gain and frequency response to eliminate noise. In addition, polarization-maintaining components and fibers can be used to address polarization effects in fibers. Specifically, polarization mode dispersion in optical circulators produces a variable delay between two orthogonal polarizations that results in amplitude and phase noise that can be mitigated through the use of polarization-maintaining components. In a preferred embodiment, digital passband filters are used to process harmonics found in optical signals.

图23A图解式地举例说明用来标定结合图21描述的系统的压电转换器(PZT)的电压。PZT标定组件是在图25A中举例说明的。FIG. 23A schematically illustrates the voltages used to scale the piezoelectric transducer (PZT) of the system described in connection with FIG. 21 . The PZT calibration assembly is illustrated in Figure 25A.

与反射镜888的位移相对应的相位改变是在图23B中图解式地举例说明的。这个相位变化对应于27nm的标定距离变化。The phase change corresponding to the displacement of mirror 888 is illustrated diagrammatically in Figure 23B. This phase change corresponds to a nominal distance change of 27nm.

图24图解式地以弧度为单位举例说明在50ms的总时间周期里与图21举例说明的干涉仪相关联的噪声性能,其中干涉仪的两个臂是相等的。FIG. 24 graphically illustrates, in radians, the noise performance associated with the interferometer illustrated in FIG. 21 over a total time period of 50 ms, where the two arms of the interferometer are equal.

图25A和25B是依照本发明优选实施方案用于样品信号和基准信号的标定组件的示意表达。在反射镜和分光镜之间的间隔是随着PZT改变的。PZT的运动是通过监测光源(He-Ne或Ti:蓝宝石)的发射标定的。25A and 25B are schematic representations of calibration components for a sample signal and a reference signal in accordance with a preferred embodiment of the present invention. The spacing between mirrors and beamsplitters is varied with PZT. The motion of the PZT is calibrated by monitoring the emission of the light source (He-Ne or Ti:sapphire).

本发明的优选实施方案涉及系统包括用来在动作电位期间完成诸如神经移位运动之类的弱反射表面的细微运动的非接触测量的双光束低相干性干涉仪。神经纤维在动作电位期间呈现迅速向外侧面移位。这种通常归因于水流入轴突的“膨胀”现象最初是在螃蟹神经中观察到的,后来是在许多其它的无脊椎动物和脊椎动物的实验标本中观察到的。所有的神经膨胀观察迄今仍然倚赖与神经实际接触的光学传感器或压电传感器。用来测量神经移位的非接触式光学方法能消除与接触相关的人工制品并且允许多条神经的活动以它们的天然状态同时成像。A preferred embodiment of the invention involves a system comprising a two-beam low-coherence interferometer for non-contact measurement of subtle movements of weakly reflective surfaces such as nerve displacement movements during action potentials. Nerve fibers exhibit a rapid lateral displacement during the action potential. This "bulging" of axons, usually attributed to water influx, was first observed in crab nerves and later in many other experimental specimens of invertebrates and vertebrates. All observations of nerve expansion to date have relied on optical or piezoelectric sensors in physical contact with the nerve. Noncontact optical methods for measuring nerve displacement can eliminate contact-related artifacts and allow simultaneous imaging of the activity of multiple nerves in their native state.

本发明的优选实施方案包括双光束外差式低相干性干涉仪及其在测量龙虾神经束的膨胀效应中的应用。现有的用干涉仪观察神经膨胀的方法尚未成功,因为灵敏度低和无法探测任何与青蛙或龙虾神经的动作电位相关联的运动。最近,已使用透射光波干涉仪成功地测量了神经在动作电位期间的折射指数变化。Preferred embodiments of the invention include a two-beam heterodyne low-coherence interferometer and its use in measuring the expansion effect of lobster nerve bundles. Existing interferometric methods of observing nerve expansion have not been successful because of low sensitivity and the inability to detect any movement associated with action potentials in frog or lobster nerves. Recently, changes in the refractive index of nerves during action potentials have been successfully measured using transmitted light wave interferometry.

测量在毫秒时间范围内约为数纳米的神经位移需要能够从低反射率表面记录的快速的和稳定的干涉仪测量系统。依照优选的实施方案,由单模光纤和自由空间元素组成的双光束系统被展示在图26中。来自与超级发光二极管922(Optospeed SLD,FWHM的中心波长为1550nm,带宽为40nm)耦合的光纤的光波准直后进入包含在双光路配置中校直的并且由频率为ω=110.1MHz和ω2=110MHz的射频电磁场驱动的声光调制器(AOM)946、952的Michelson干涉仪。安装在平移台上的反射镜允许控制在两个干涉仪臂之间往返光程差ΔL。光波通过光纤准直仪进出Michelson干涉仪。Measuring neural displacements on the order of nanometers in the millisecond time scale requires fast and stable interferometric measurement systems capable of recording from low reflectivity surfaces. According to a preferred embodiment, a dual-beam system consisting of single-mode fiber and free-space elements is shown in FIG. 26 . The light wave from the optical fiber coupled with the super light-emitting diode 922 (Optospeed SLD, FWHM has a central wavelength of 1550nm and a bandwidth of 40nm) collimates and then enters the optical fiber that is included in the dual optical path configuration and is composed of frequencies ω=110.1MHz and ω 2 = 110 MHz RF electromagnetic field driven acousto-optic modulator (AOM) 946, 952 Michelson interferometer. Mirrors mounted on the translation stage allow control of the optical path difference ΔL to and fro between the two interferometer arms. Light waves enter and exit the Michelson interferometer through a fiber collimator.

来自Michelson干涉仪的两个口之中每个口的输出是由有不同的频移和可变的延迟的两个低相干性电磁场组成的双重光束。双重光束之一是神经舱室组件(在图27中详细说明)上的入射光束,而另一个是基准间隙上的入射光束。神经组件和基准间隙每个都包含被可调节距离分开的两个反射表面,而且被校直以便将入射光波反射回其各自的光纤。这些表面之一几乎是在空气和无涂层玻璃之间的界面。在样品中第二反射来自在空气和神经表面之间的界面。The output from each of the two ports of the Michelson interferometer is a dual beam consisting of two low coherence electromagnetic fields with different frequency shifts and variable delays. One of the dual beams is the incident beam on the neural compartment assembly (detailed in Figure 27), while the other is the incident beam on the fiducial gap. The neural assembly and reference gap each contain two reflective surfaces separated by an adjustable distance, and are aligned to reflect incident light waves back to their respective optical fibers. One of these surfaces is almost the interface between air and uncoated glass. The second reflection in the sample comes from the interface between the air and the nerve surface.

ΔLS和ΔLR分别是来自样品和基准间隙的表面1和2的反射之间的往返光程差。调节各种不同的组份以致三个路径长度ΔL、ΔLS和ΔLR全部等于在光源相干长度之内。当条件满足时,光电探测器932、962(新的聚焦2011)记录由于(1)横越Michelson干涉仪的臂1并且从样品(或基准间隙)的表面2反射的光波和(2)横越Michelson干涉仪的臂2并且从样品(或基准间隙)的表面1反射的光波之间的干涉造成的频率为Ω=2(ω12)=200kHz的外差信号。两个外差信号之间的相位差(多达2π的倍数)是φ(t)=k0[(ΔLS-ΔL)-(ΔLR-ΔL)]=k0(ΔLS-ΔLR),其中k0是来源的中心波数。最易受相位噪声影响的量——Michelson路径延迟ΔL在这种差动测量方法中被删除。与偏振无关的光循环器926、930、960用来使探测到的功率达到最大值并且阻止反射光波再次进入Michelson干涉仪。偏振控制器(未展示)用来最大限度地减少纤维光学组份中的偏振模色散的效果。ΔL S and ΔL R are the round-trip optical path differences between reflections from surfaces 1 and 2 of the sample and reference gap, respectively. The various components are adjusted so that the three path lengths ΔL, ΔL S and ΔL R are all equal to within the coherence length of the source. When the conditions are met, photodetectors 932, 962 (new focus 2011) record light waves due to (1) traversing arm 1 of the Michelson interferometer and reflected from surface 2 of the sample (or reference gap) and (2) traversing Michelson interference The interference between the arm 2 of the instrument and the reflected light waves from the surface 1 of the sample (or reference gap) results in a heterodyne signal of frequency Ω=2(ω 1 −ω 2 )=200 kHz. The phase difference (up to a multiple of 2π) between two heterodyne signals is φ(t)=k 0 [(ΔL S -ΔL)-(ΔL R -ΔL)]=k 0 (ΔL S -ΔL R ) , where k0 is the central wavenumber of the source. The quantity most susceptible to phase noise, the Michelson path delay ΔL, is deleted in this differential measurement method. Polarization independent optical circulators 926, 930, 960 are used to maximize the detected power and prevent reflected light waves from re-entering the Michelson interferometer. A polarization controller (not shown) is used to minimize the effect of polarization mode dispersion in the fiber optic component.

为了测量相位差φ(t),光电探测器的输出被12位的A/D卡(美国国家仪器公司PCI-6110)以每秒五百万个样品的速率数字化。计算机中的指令序列借助Hilbert变换计算两个信号之间的相位差而且把该相位偏移表达成相对的表面位移d(t)=φ(t)/2k0To measure the phase difference φ(t), the output of the photodetector was digitized by a 12-bit A/D card (National Instruments PCI-6110) at a rate of five million samples per second. The instruction sequence in the computer calculates the phase difference between the two signals by means of the Hilbert transformation and expresses this phase shift as the relative surface displacement d(t)=φ(t)/2k 0 .

为了检验干涉仪完成了位移测量,神经组件被使用压电转换器以300Hz频率和27nm振幅按正弦曲线调制谐振腔间隔的平面Fabry-Perot谐振腔代替。当谐振腔在若干微米范围内被扫描的时候,双光束干涉仪的振幅和频率测量结果与通过监测632.8nm氦-氖激光器光束的传输确定的数值很好地一致。To verify that the interferometer accomplished the displacement measurements, the neural component was replaced by a planar Fabry-Perot resonator that modulated the resonator spacing sinusoidally using a piezoelectric transducer at a frequency of 300 Hz and an amplitude of 27 nm. The two-beam interferometer's amplitude and frequency measurements agree well with those determined by monitoring the transmission of a 632.8-nm He-Ne laser beam when the cavity is scanned over several micrometers.

依照优选的实施方案,来自美国龙虾(美洲龙虾)的步足神经(~1mm直径,~50毫米长)被解剖并且被放在图27所示的用丙烯酸树脂机械加工而成的神经舱室上。该舱室包含五个充满龙虾盐水溶液的容器,而在各容器之间的神经被凡士林绝缘层包围着,以使容器之间电阻最大。刺激隔离器递送振幅可变的电流脉冲(0-10mA,持续时间1ms)以便通过刺激电极刺激神经。刺激隔离器所递送的电流由于通过盐水的平行电导或许比通过神经的真实电流大得多。在神经中产生的复合动作电位是用一对记录电极998a、998b探测的,而且是以增益104放大的。在中心孔中,神经被放置在小玻璃台上,以致它没有浸没在盐水溶液中。在解剖和数据收集期间,神经用盐水保持潮湿。According to a preferred embodiment, an ambulatory nerve (~1 mm diameter, ~50 mm long) from the American lobster (L. americana) was dissected and placed on the nerve compartment machined from acrylic resin as shown in FIG. 27 . The chamber contained five containers filled with lobster saline solution, and the nerves between the containers were surrounded by a layer of petroleum jelly insulation to maximize electrical resistance between the containers. The stimulation isolator delivered current pulses of variable amplitude (0-10 mA, duration 1 ms) to stimulate the nerve through the stimulation electrodes. The current delivered by the stimulation isolator may be much greater than the true current through the nerve due to the parallel conductance through the saline. Compound action potentials generated in the nerve are detected with a pair of recording electrodes 998a, 998b and amplified with a gain of 104. In the central hole, the nerve is placed on a small glass stage so that it is not submerged in saline solution. Nerves were kept moist with saline during dissection and data collection.

图28A和28B举例说明依照本发明的优选实施方案在一个试验里的电位和神经的光学法实测位移。在电信号中时间零点处的尖峰是人为刺激造成的。它后面跟着一系列描述神经束中多个轴突的动作电位的峰。光学信号展示高度大约为5nm、FWHM持续时间大约为10ms的峰,其方向对应于上表面位移。光学信号展示单一的峰,而不是像电信号那样多个尖峰;这可能是由于位移信号的单相(单一符号)特性造成的。位移测量的rms噪声对于1kHz带宽大约为0.25nm。Figures 28A and 28B illustrate the electrical potential and optically measured displacement of a nerve in an experiment according to a preferred embodiment of the present invention. The spike at time zero in the electrical signal is artificially stimulated. It is followed by a series of spikes describing the action potentials of multiple axons in the nerve tract. The optical signal exhibits a peak with a height of approximately 5 nm and a FWHM duration of approximately 10 ms, the direction of which corresponds to the upper surface displacement. The optical signal exhibits a single peak, rather than multiple spikes like the electrical signal; this may be due to the single-phase (single-symbol) nature of the displacement signal. The rms noise of the displacement measurement is about 0.25nm for a 1kHz bandwidth.

位移是在大约一半神经标本中观察到的而且对于5mA刺激振幅从0nm变化到8nm。大的易变性可以反映出在神经本身或准备程序方面的差异。相似的位移振幅也已经有使用螃蟹和小龙虾的神经的报告。在使用光学杠杆的龙虾神经膨胀最新研究中大约~10次较小的位移被观察到,这可能反映技术的人为现象。Shifts were observed in approximately half of the neural specimens and varied in amplitude from 0 nm to 8 nm for 5 mA stimulation. Large variability may reflect differences in the nerve itself or preparation procedures. Similar displacement amplitudes have also been reported using nerves from crabs and crayfish. About ~10 smaller displacements were observed in a recent study of lobster nerve expansion using optical levers, which may reflect technical artifacts.

为了控制诸如来自欧姆加热的热膨胀之类由于刺激电流造成的神经加热的人为现象,单一神经的峰值电信号和位移信号是在改变刺激电流时测量的(如图29所示)。电信号和位移信号呈现几乎同一的阈电流(大约1.5mA)和饱和电流(大约5mA),从而暗示观察到的位移与动作电位相关联。相反,欧姆效应将以与电流的二次依存关系为特色而与饱和无关。因此,依照本发明的优选实施方案提供能控制人为刺激的神经位移研究。优选的实施方案包括完成首次非接触式的和首次干涉测量法的神经膨胀测量的外差低相干性干涉仪。依照本发明的优选实施方案,神经膨胀的生物物理机制能就个别的轴突成像和分析。双光束低相干性干涉仪可能在测量活细胞的纳米级的运动方面有许多其它的应用。其它的实施方案能包括以干涉仪为基础探测与动作电位相关联的单一神经元的机械改变的显微镜。相关的干涉测量法也用来测量在被培养的单层细胞中细胞体积的改变。To control for artifacts of nerve heating due to stimulation current, such as thermal expansion from ohmic heating, the peak electrical and displacement signals of a single nerve were measured while varying the stimulation current (as shown in Figure 29). The electrical and displacement signals exhibited nearly identical threshold currents (approximately 1.5 mA) and saturation currents (approximately 5 mA), suggesting that the observed displacements were associated with action potentials. In contrast, the Ohmic effect will feature a quadratic dependence on current independent of saturation. Accordingly, preferred embodiments in accordance with the present invention provide neural displacement studies capable of controlling artificial stimulation. A preferred embodiment includes a heterodyne low-coherence interferometer that performs the first non-contact and first interferometric nerve dilation measurements. According to a preferred embodiment of the present invention, the biophysical mechanisms of nerve expansion can be imaged and analyzed for individual axons. Two-beam low-coherence interferometers may have many other applications in measuring nanoscale motion in living cells. Other embodiments can include interferometer-based microscopy to detect mechanical changes in single neurons associated with action potentials. Correlative interferometry is also used to measure changes in cell volume in cultured monolayers.

图30依照本发明的优选实施方案,举例说明双光束干涉仪的扫描系统的光学设计。安装在机动化检流计1024、1030上的反射镜被放置在成像系统的傅立叶平面并且允许光束以不变的角度扫过样品。反射镜以大约30Hz、1-2度振幅(在样品上50-100nm)扫描。检流计可以按Lissajous图1052被设置光栅或扫描。Figure 30 illustrates the optical design of the scanning system of a two-beam interferometer, in accordance with a preferred embodiment of the present invention. Mirrors mounted on motorized galvanometers 1024, 1030 are placed in the Fourier plane of the imaging system and allow the beam to sweep across the sample at a constant angle. The mirror was scanned at approximately 30 Hz with 1-2 degree amplitude (50-100 nm on the sample). The galvanometer can be set to raster or scan according to the Lissajous diagram 1052 .

图31举例说明依照本发明的优选实施方案检流计位置和使用Lissajous扫描从空白盖玻片收集的相位数据。总视场大约是100微米。垂直轴是实测的相位。噪声轮廓是在1kHz上大约25mrad。Figure 31 illustrates galvanometer positions and phase data collected from blank coverslips using Lissajous scanning in accordance with a preferred embodiment of the present invention. The total field of view is approximately 100 microns. The vertical axis is the measured phase. The noise profile is about 25 mrad at 1 kHz.

图32A和32B举例说明依照本发明的优选实施方案回射的相位图像和强度(振幅)图像的彩色映射图。光束扫描数据是从空白盖玻片收集的。噪声轮廓是在1kHz上大约25mrad。功率由于当光束离开光轴移动的时候发生的未对准和修剪在中心最高。图像中的黑点对应于用Lissajous图不被访问的象素。32A and 32B illustrate color maps of retroreflected phase and intensity (amplitude) images in accordance with a preferred embodiment of the present invention. Beam scan data were collected from blank coverslips. The noise profile is about 25 mrad at 1 kHz. Power is highest at the center due to misalignment and clipping that occurs when the beam moves off the optical axis. Black dots in the image correspond to pixels that are not accessed with the Lissajous map.

图33示意地举例说明借助本发明的实施方案解决的聚焦问题。细胞2002放置在双光束显微镜的玻璃盖玻片2004上。实线代表聚焦在玻璃上表面和细胞上的光束。虚线代表从玻璃的底面反射的光束。相位-基准干涉测量系统是依照本发明优选实施方案的双光束干涉测量法,并且需要不仅收集从兴趣样品散射的光波而且也收集来自位于样品前面的固定的基准表面的反射。样品和基准不同的轴向位置应对有效地同时收集基准和样品两者的散射,尤其是对于高数值孔径的光学系统。焦点问题的两种解决办法是由优选实施方案之中允许在数值孔径为0.50的情况下有效地收集样品和基准的光波的两种系统提供的。首先,双焦透镜系统通过把数值孔径分为通过双焦点光学元件中曲率不同的部分的边缘光线和近轴光线把样品表面和基准表面同时带进焦点。双焦元件能通过在平凸透镜的凸面上磨平中心区域构成。把双焦透镜放置在显微镜的傅立叶平面附近允许经由用于样品成像的反射镜检流计的光束扫描。Figure 33 schematically illustrates the focus problem solved by an embodiment of the present invention. Cells 2002 are placed on a glass coverslip 2004 of a dual-beam microscope. Solid lines represent beams focused on the upper glass surface and cells. Dashed lines represent beams reflected from the bottom surface of the glass. A phase-reference interferometry system is a two-beam interferometry method according to a preferred embodiment of the present invention, and entails collecting not only light waves scattered from the sample of interest but also reflections from a fixed reference surface located in front of the sample. The different axial positions of the sample and fiducial should effectively collect the scattering from both the fiducial and the sample simultaneously, especially for high numerical aperture optics. Two solutions to the focus problem are provided by two systems in the preferred embodiment that allow efficient collection of sample and reference light waves at a numerical aperture of 0.50. First, the bifocal lens system brings the sample surface and the reference surface into focus simultaneously by splitting the numerical aperture into marginal and paraxial rays that pass through differently curved portions of the bifocal optic. Bifocal elements can be constructed by flattening the central region on the convex surface of a plano-convex lens. Placing the bifocal lens near the Fourier plane of the microscope allows scanning of the beam via the mirror galvanometer for sample imaging.

图34举例说明依照本发明优选实施方案的双焦透镜设计。把双焦透镜放在物镜前面而不是后面是比较容易的。所述实施方案使平移变得容易。Figure 34 illustrates a bifocal lens design in accordance with a preferred embodiment of the present invention. It is easier to place the bifocal lens in front of the objective rather than behind it. Said embodiment facilitates translation.

图35举例说明依照本发明的优选实施方案的双焦透镜系统的另一种设计。双焦透镜系统2050通过把双焦透镜放在成像系统的傅立叶平面或该平面附近允许光束扫描。光束2068是近轴光束,而光束2070是边缘光束。所述光学性质对一阶倾斜光束是不变的。Figure 35 illustrates another design of a bifocal lens system in accordance with a preferred embodiment of the present invention. Bifocal lens system 2050 allows beam scanning by placing the bifocal lens at or near the Fourier plane of the imaging system. Beam 2068 is a paraxial beam, while beam 2070 is a marginal beam. The optical properties are invariant to first order inclined beams.

图36举例说明透镜f3(双焦点的)和f2之间的最佳距离的计算,以致在物镜后面的两个焦距之间的间距依照本发明的优选实施方案等于Δ=100微米。所述光学设计是通过光线跟踪提供的。Figure 36 illustrates the calculation of the optimal distance between lenses f3 (bifocal) and f2 such that the spacing between the two focal lengths behind the objective equals Δ=100 microns according to a preferred embodiment of the invention. The optical design is provided by ray tracing.

图37举例说明依照本发明优选实施方案的双焦透镜的制造。双焦透镜能通过抛光平凸透镜的中心部分制作。除去非常小的玻璃厚度(大约2-10μm)。小的改变导致信号和基准之间的路径长度差。Figure 37 illustrates the fabrication of a bifocal lens in accordance with a preferred embodiment of the present invention. Bifocal lenses can be made by polishing the center portion of a plano-convex lens. Very small glass thicknesses (approximately 2-10 μm) are removed. Small changes result in path length differences between the signal and reference.

图38举例说明当物镜依照本发明的优选实施方案向玻璃盖玻片扫描的时候通过光循环器的实测回射强度。来自背面和正面的反射被分开大约100微米。没有重叠并因此没有干涉。Figure 38 illustrates the measured retroreflection intensity through the optical circulator as the objective lens scans across the glass coverslip in accordance with a preferred embodiment of the present invention. Reflections from the back and front are separated by approximately 100 microns. There is no overlap and therefore no interference.

图39就依照本发明的优选实施方案有来自反射镜的单一反射的双焦透镜而言举例说明回射强度与物镜焦点位置之间的关系。使用双焦透镜f3,(当物镜位置被扫描时)来自反射镜的单峰被一分为二,对应于以不同的物镜焦点位置在反射镜聚焦的近轴光束和边缘光束。峰之间的间距取决于透镜f2和f3之间的距离。在本实施方案中,间距是大约100微米。Figure 39 illustrates the relationship between retroreflection intensity and objective focal point position for a bifocal lens with a single reflection from a mirror in accordance with a preferred embodiment of the present invention. Using the bifocal lens f3, (as the objective lens position is scanned) the single peak from the mirror is split in two, corresponding to the paraxial and marginal beams focused at the mirror at different objective focus positions. The spacing between the peaks depends on the distance between lenses f2 and f3. In this embodiment, the pitch is about 100 microns.

图40举例说明依照本发明的优选实施方案在有双面盖玻片反射的情况下使用双焦透镜时的回射强度和物镜焦点位置之间的关系。这张图将早先的两张图放在一起,提供四个主峰和几个较小的峰。Figure 40 illustrates the relationship between retroreflection intensity and objective focal point position when using a bifocal lens with double-sided coverslip reflection in accordance with a preferred embodiment of the present invention. This graph puts the two earlier graphs together to provide four major peaks and several smaller peaks.

图41举例说明依照本发明的优选实施方案当f2和f3之间的距离被调节到与前后玻璃表面之间的间距相匹配的时候回射强度和物镜焦点位置之间的关系。边缘光线在后背面上聚焦,在相同位置近轴光线在前背面上聚焦。这提供可以在中心见到的大峰。Figure 41 illustrates the relationship between retroreflection intensity and objective focal point position when the distance between f2 and f3 is adjusted to match the spacing between the front and rear glass surfaces in accordance with a preferred embodiment of the present invention. The marginal rays focus on the posterior back, at the same position the paraxial rays focus on the anterior back. This provides the large peak that can be seen in the center.

图42举例说明由于依照本发明的优选实施方案近轴光束和边缘光束的耦合产生的额外的较小的峰。这些额外的峰能通过在中途精确地发生在两个峰之间的从近轴向边缘光束耦合得到解释。额外的峰的振幅高度地取决于光学对准并且能通过微调光学系统被减到最小并优选被消除。Figure 42 illustrates an additional smaller peak due to the coupling of paraxial and marginal beams according to a preferred embodiment of the present invention. These extra peaks can be explained by the near-axis edge beam coupling occurring precisely halfway between the two peaks. The amplitude of the extra peaks is highly dependent on optical alignment and can be minimized and preferably eliminated by fine-tuning the optics.

图43A举例说明依照本发明的优选实施方案作为集成元件的有基准表面的双光束探头。该探头由光纤准直仪2382和折射率渐变(GRIN)透镜2390组成。GRIN透镜的无涂层的后表面提供基准反射。由于不需要分开的基准表面,所以该探头非常适合于活体内应用。为了完成二维相位成像或三维共焦相位成像,该探头可能被装在快速扫描压电转换器上。所述实施方案提供容易用于位移测量的预先对准的光纤探头。该探头有高数值孔径(NA),在大约0.4-0.5的范围内,提供从散射表面有效的光波聚集。整体基准表面解决景深造成的问题。所述优选实施方案的探头代替复杂光学器件的集合而且适合于活体内使用。Figure 43A illustrates a dual beam probe with reference surface as an integrated component in accordance with a preferred embodiment of the present invention. The probe consists of a fiber optic collimator 2382 and a graded index of refraction (GRIN) lens 2390 . The uncoated back surface of the GRIN lens provides the reference reflection. Since no separate reference surface is required, the probe is well suited for in vivo applications. For 2D phase imaging or 3D confocal phase imaging, the probe may be mounted on a fast scanning piezoelectric transducer. The described embodiments provide pre-aligned fiber optic probes that are easily used for displacement measurements. The probe has a high numerical aperture (NA), in the range of approximately 0.4-0.5, providing efficient focusing of light waves from scattering surfaces. Integral datum surfaces solve problems caused by depth of field. The probe of the preferred embodiment replaces an assembly of complex optics and is suitable for in vivo use.

图43B举例说明的是光纤型双光束干涉仪探头2381的另一个优选实施方案。在这个例子中,基准反射是由光纤夹层末端2385提供的。在这种情况中,末端2385被抛光成与光纤轴成直角。光纤2383安装在插进外壳2387的玻璃套环2389中。光纤末端2385发出的光波是用折射率渐变(GRIN)透镜聚焦的,在这个例子中该透镜有大约0.29或0.3的节距。被校直光纤的有近似等于3.5的放大倍数M,以使光纤(NA=0.13)和GRIN透镜(NA=0.50)的数值孔径相匹配。光束聚焦在样品上,在这个例子中样品距探头的远端表面大约300微米。FIG. 43B illustrates another preferred embodiment of the fiber-optic dual-beam interferometer probe 2381 . In this example, the reference reflection is provided by the end 2385 of the fiber interlayer. In this case, the end 2385 is polished at right angles to the fiber axis. The optical fiber 2383 is mounted in a glass ferrule 2389 inserted into the housing 2387. The light waves from fiber end 2385 are focused using a graded index of refraction (GRIN) lens, which in this example has a pitch of approximately 0.29 or 0.3. The straightened fiber has a magnification M approximately equal to 3.5 to match the numerical apertures of the fiber (NA=0.13) and the GRIN lens (NA=0.50). The beam is focused on the sample, which in this example is approximately 300 microns from the distal surface of the probe.

图43C是来自鼠海马培养物的两个神经纤维(轴突或枝晶体)的明视场显微镜图像。图43D是作为使用双焦双光束显微镜扫描样品实测的位置函数的外差信号振幅的表达。Figure 43C is a bright field microscope image of two nerve fibers (axons or dendrites) from a culture of rat hippocampus. Figure 43D is a representation of the heterodyne signal amplitude as a function of position measured using a bifocal two-beam microscope to scan the sample.

图43E是在图43D中见到同一样品的反射相位图像。Figure 43E is a reflection phase image of the same sample seen in Figure 43D.

图44是依照本发明的优选实施方案用来研究在动作电位期间在神经中观察到的位移效应的几何学的双光束探头的示意图2400。通过改变探头的角度,能测量不同方向的位移。44 is a schematic diagram 2400 of a dual-beam probe used to study the geometry of displacement effects observed in nerves during action potentials in accordance with a preferred embodiment of the present invention. By changing the angle of the probe, displacements in different directions can be measured.

图45举例说明依照本发明的优选实施方案能通过扫描探头或样品用于成像的双光束探头系统。为了避免引进由于样品运动造成的人为现象,扫描探头是优选的。探头由于它的重量轻(大约2-3克)能被非常快地(大约1kHz)扫描。因为基准表面被集成在探头中,(强度和相位两者的)三维共焦成像是可能的。列举的双重光束探头系统能测量透射或反射。优选的实施方案包括扫描型双光束探头显微镜,所以物镜到样品的距离是高度稳定的。Figure 45 illustrates a dual beam probe system that can be used for imaging by scanning the probe or sample in accordance with a preferred embodiment of the present invention. To avoid introducing artifacts due to sample motion, scanning probes are preferred. The probe can be scanned very fast (about 1 kHz) due to its light weight (about 2-3 grams). Because the reference surface is integrated in the probe, three-dimensional confocal imaging (both intensity and phase) is possible. The dual beam probe systems listed can measure either transmission or reflection. Preferred embodiments include scanning dual-beam probe microscopes, so the objective-to-sample distance is highly stable.

图46A-46C分别举例说明依照本发明的优选实施方案使用双焦点的双光束显微镜从放在有防反射涂层的玻璃盖玻片上的干燥的人类面颊上皮细胞(或两个重叠细胞)获得的强度图像、反向散射光波的实测相位图像和明视场图像。这些图像是通过扫描有电动平移装置的显微镜载物台产生的。图46A和46B的图像(水平方向130微米×垂直方向110微米的视场,扫描是100×100象素)分别显示外差信号的振幅和相位。图46C是同一面颊细胞的明视场图像(视场大约为60微米×40微米)。该相位图像显示少于一个波的对比这可能反映由于与玻璃基体接触几乎平坦的细胞下表面的形貌。Figures 46A-46C illustrate, respectively, images obtained from dried human cheek epithelial cells (or two overlapping cells) placed on anti-reflective coated glass coverslips using a bifocal two-beam microscope in accordance with a preferred embodiment of the present invention. Intensity images, measured phase images of backscattered light waves, and bright field images. These images are generated by scanning a microscope stage with a motorized translation mechanism. The images of Figures 46A and 46B (field of view 130 microns horizontal x 110 microns vertical, scan is 100 x 100 pixels) show the amplitude and phase of the heterodyne signal, respectively. Figure 46C is a bright field image of the same cheek cells (field of view approximately 60 microns x 40 microns). The phase image shows less than one wave of contrast which likely reflects the topography of the lower surface of the cell due to the nearly flat surface in contact with the glass substrate.

图46D-46G举例说明图43举例说明的双光束显微镜的轮廓曲线测定能力,25毫米焦距的平凸透镜的凹面如图46E所示被放到盖玻片上,所述盖玻片的顶部有防1.5微米波长反射的涂层。图46D举例说明透镜中心部分的强度图像。图46F是反射光波的相位映射图。图46G举例说明相位图像的横截面,相位通过二次拟合展开。二阶项的系数对应于与已知的透镜表面曲率一致的11.7毫米的曲率半径。在强度图像和相位图像中的边远点可能是透镜上的尘粒或凹陷造成的。Figures 46D-46G illustrate the profilometry capabilities of the two-beam microscope illustrated in Figure 43. The concave surface of a plano-convex lens with a focal length of 25 mm is placed on a coverslip as shown in Figure 46E, and the top of the coverslip has an anti-1.5 Coatings reflective at micron wavelengths. Figure 46D illustrates an intensity image of the central portion of the lens. Figure 46F is a phase map of reflected light waves. Figure 46G illustrates a cross-section of a phase image, with the phase unwrapped by a quadratic fit. The coefficient of the second order term corresponds to a radius of curvature of 11.7 millimeters consistent with the known curvature of the lens surface. Outlying spots in the intensity and phase images can be caused by dust particles or dents on the lens.

图47A-47E举例说明移相干涉测量法的原理,包括干涉图和依照本发明的优选实施方案收集诸如相位步进(图47B和47C)和桶式积分(图47D和47E)之类画面的不同方法的示意图。该方法包括调制相位、记录三个画面的最小值和计算光学相移。47A-47E illustrate the principle of phase-shifting interferometry, including interferograms and collection of frames such as phase stepping (FIGS. 47B and 47C) and barrel integration (FIGS. 47D and 47E) in accordance with a preferred embodiment of the present invention. Schematic illustration of different methods. The method involves modulating the phase, recording the minimum of the three frames and calculating the optical phase shift.

图48A-48C举例说明依照本发明优选实施方案的频闪式外差干涉测量系统的原理。为了给出非常低的相位噪声,这个系统包括导致除了桶式切换涉及相关的噪声基准外差信号以外类似于桶式积分的连续相位斜升的声光调制。反之,频闪式外差干涉仪提供连续的测量,因为没有机械式反射镜位移造成的停顿。48A-48C illustrate the principles of a stroboscopic heterodyne interferometry system in accordance with a preferred embodiment of the present invention. To give very low phase noise, this system includes acousto-optic modulation that results in a continuous phase ramp similar to barrel integration except that barrel switching involves a correlated noise-referenced heterodyne signal. In contrast, stroboscopic heterodyne interferometers provide continuous measurements because there are no pauses caused by mechanical mirror displacements.

图49举例说明依照本发明的优选实施方案的频闪式双光束外差干涉仪2570的示意图。来自双光束干涉仪的光波被准直然后进入光电偏振调制器2594。光波从分光镜2582反射出来,通过呈望远镜配置的两个透镜2580、2576(f1和f0,物镜),然后作为准直光束照射样品。来自样品(例如,细胞2573)和盖玻片后表面的回射光波被物镜和f1收集到CCD 2586上。透镜f1被调整到距CCD一个焦距和距傅立叶平面(FP)2578一个焦距。物镜f02576同样是距傅立叶平面一个焦距和距样品一个焦距。光电偏振调制器与在CCD前面的偏振片2584组合充当快速的光学开关。光电偏振调制器是依照作为来自双光束干涉仪中的基准间隙的外差信号的基准信号的相位实施门控的。820nm的SLD被用于优选实施方案。样品2573上的光波被准直,因此预先排除任何焦点问题。Figure 49 illustrates a schematic diagram of a stroboscopic two-beam heterodyne interferometer 2570 in accordance with a preferred embodiment of the present invention. The light waves from the two-beam interferometer are collimated and then enter the optoelectronic polarization modulator 2594. The light waves reflect from beam splitter 2582, pass through two lenses 2580, 2576 (f1 and f0, objective) in a telescopic configuration, and then illuminate the sample as a collimated beam. Retroreflected light waves from the sample (e.g., cell 2573) and the rear surface of the coverslip are collected by the objective and f1 onto the CCD 2586. Lens f1 is adjusted to be one focal distance from the CCD and one focal distance from the Fourier plane (FP) 2578 . The objective f02576 is also one focal length from the Fourier plane and one focal length from the sample. The optoelectronic polarization modulator in combination with the polarizer 2584 in front of the CCD acts as a fast optical switch. The optoelectronic polarization modulator is gated according to the phase of the reference signal which is the heterodyne signal from the reference gap in the two-beam interferometer. An 820nm SLD is used in the preferred embodiment. The light waves on sample 2573 were collimated, so any focus problems were precluded.

图49B和49C举例说明依照本发明的优选实施方案展示图43所示的双光束探头聚焦在静止的玻璃表面上造成的相位噪声的数据。Figures 49B and 49C illustrate data showing the phase noise caused by the dual beam probe shown in Figure 43 focusing on a stationary glass surface in accordance with a preferred embodiment of the present invention.

结合图26展示和描述的系统向尝试在典型的例子中把光波聚焦在被轴向分开大约100微米的反射表面和样品上提出挑战。在数值孔径>0.1的情况下,这比景深大得多。改变双焦光学系统或探头设计解决这个问题是可能的,然而,双焦系统通常有采用高数值孔径物镜时变得更差的低收集效率,而且来自透镜离轴部分的绕射能产生边缘效应。探头设计受表面基准与样品分开和NA在采用GRIN透镜时被限制在0.5这一事实的限制。The system shown and described in connection with FIG. 26 presents a challenge to attempting to focus light waves on a reflective surface and sample that are axially separated by about 100 microns in a typical example. In the case of numerical aperture > 0.1, this is much larger than the depth of field. It is possible to change the bifocal optics or probe design to solve this problem, however, bifocal systems generally have low collection efficiencies that are worsened with high numerical aperture objectives, and diffraction from off-axis parts of the lenses can produce edge effects . The probe design is limited by the fact that the surface fiducial is separated from the sample and the NA is limited to 0.5 when using GRIN lenses.

图50A举例说明的是来自两条路径的光波在被引到样品上之前先沿着共向光程合并的系统2700。来自路径1的光波聚焦在表面1上,而来自路径2的光波聚焦在表面2上。Figure 50A illustrates a system 2700 in which light waves from two paths are combined along a co-directional optical path before being directed onto a sample. Light waves from path 1 are focused on surface 1, while light waves from path 2 are focused on surface 2.

把这个特征并入的干涉仪被展示在图50B的双光束系统2800中。系统2800有光源2801,两个移动反射镜2803、2805和把来自两条路径的光波引向样品2807表面和基准2809表面的偏振分光镜2811。偏振组份的方向被清楚地展示在图50C中。干涉仪的每个臂被引到一个表面上。光波因此被更有效地使用。光束被分开聚焦,没有来自双焦透镜的边缘效应。不存在由此产生的数值孔径方面的折衷,而且该系统交易能被配置在自由空间中不需要光纤耦合,除了非必选地来自光源的光纤耦合之外。这能改善光波收集效率。An interferometer incorporating this feature is shown in the dual beam system 2800 of Figure 50B. The system 2800 has a light source 2801, two moving mirrors 2803, 2805 and a polarizing beamsplitter 2811 that directs the light waves from the two paths to the surface of the sample 2807 and the surface of the reference 2809. The orientation of the polarization components is clearly shown in Figure 50C. Each arm of the interferometer is directed onto a surface. Light waves are thus used more efficiently. The beams are focused separately without fringing effects from bifocal lenses. There is no resulting numerical aperture tradeoff, and the system transaction can be configured in free space requiring no fiber coupling, except optionally from the light source. This improves light wave collection efficiency.

使用空间光波调制的定量相衬显微镜:Quantitative Phase Contrast Microscopy Using Spatial Lightwave Modulation:

另一方面,本发明提供把相衬显微镜与和相移干涉测量法结合起来的显微镜系统和方法。本发明的系统和方法能应用于透射几何学和反射几何学。在各种不同的实施方案中,所述方法和系统把共向光程用于不同空间频率的波并且偏移发源于样品上同一点的不同空间频率的波之间的相位。In another aspect, the present invention provides microscopy systems and methods that combine phase contrast microscopy with phase shift interferometry. The systems and methods of the present invention can be applied to both transmission and reflection geometries. In various embodiments, the methods and systems use a co-directional optical path for waves of different spatial frequencies and shift the phase between waves of different spatial frequencies originating from the same point on the sample.

光学领域的相位多年来已被用来提供许多应用中需要的子波长准确性。例如,作为本质上弱的散射体的生物学系统通过使用相衬显微镜的原理已变成看得见的。干涉测量法是一种获取相位信息的途径,所以,在过去的数年中以重新获得与样品相关联的相位为目的已开发了各种不同的干涉测量技术。诸如相衬和Nomarski显微镜之类的技术虽然非常有用而且是流行的方法,但是仅仅使用光学相位作为反衬工具,不提供关于其它大小的定量信息。Phase in optics has been used for many years to provide the sub-wavelength accuracy required in many applications. For example, biological systems, which are inherently weak scatterers, have been made visible using the principles of phase contrast microscopy. Interferometry is one way to obtain phase information, so various interferometry techniques have been developed over the past few years with the aim of retrieving the phase associated with the sample. Techniques such as phase contrast and Nomarski microscopy, while very useful and popular methods, use only optical phase as a contrast tool and do not provide quantitative information about other sizes.

另一方面,移相技术能够定量地确定相位信息,而且各种不同的干涉测量方案在过去的数十年中已被提出。以偏振光学为基础的差动相衬技术已经与通常的光学相干性断层摄影术对接。桶式集成技术,作为移相干涉测量法的特定情况,也已被用于二维相位成像。然而,大多数这样的干涉仪需要形成两个物理上被分开的光束,这使它们易受无关联的环境噪声影响。为了主动地消除噪声,这个问题往往需要特定的措施。锁相环已被用于这个目的。所需要的是减少或消除来自干涉测量信号的无关联的噪声的显微镜系统和方法。On the other hand, phase shifting techniques can quantitatively determine phase information, and various interferometry schemes have been proposed in the past decades. Differential phase contrast techniques based on polarization optics have been interfaced with conventional optical coherence tomography. Barrel integration techniques, as a specific case of phase-shifting interferometry, have also been used for 2D phase imaging. However, most such interferometers require the formation of two physically separated beams, making them susceptible to uncorrelated environmental noise. This problem often requires specific measures in order to actively cancel the noise. Phase locked loops have been used for this purpose. What is needed are microscopy systems and methods that reduce or eliminate uncorrelated noise from interferometric signals.

本发明的系统和方法使用共向光程使发源于样品的不同空间频率的光波相干。在各种不同的实施方案中,本发明提出的系统和方法提供实质上没有无关联的环境相位噪声的样品相位图像。除此之外,在优选的实施方案中,本发明的方法在使用低相干性照明光源的时候即使存在相位奇点也能获得相位图像。The systems and methods of the present invention use co-directional optical paths to coherent light waves of different spatial frequencies emanating from a sample. In various embodiments, the systems and methods presented herein provide phase images of a sample that are substantially free of uncorrelated ambient phase noise. In addition, in preferred embodiments, the method of the present invention is capable of obtaining phase images even in the presence of phase singularities when using low coherence illumination sources.

在各种不同的优选实施方案中,本发明提供对环境相位噪声不敏感而且能在任意的曝光时间范围内提供非常精确和稳定的相位信息的仪器。在各种不同的实施方案中,本发明以作为干涉图的图像描述为基础。这种描述的一个例子是阿贝成像理论。图像平面中的每个点都被看作是相对于光轴以不同角度传播的波的重叠(干涉)。如果我们把来自样品的零阶散射作为干涉仪的基准考虑,那么该图像能被看作是零阶电磁场和离开光轴传播的电磁场之间的干涉。In various preferred embodiments, the present invention provides instruments that are insensitive to ambient phase noise and provide very accurate and stable phase information over an arbitrary range of exposure times. In various embodiments, the invention is based on image descriptions as interferograms. An example of such a description is the Abbe imaging theory. Each point in the image plane is seen as a superposition (interference) of waves propagating at different angles with respect to the optical axis. If we consider the zero-order scattering from the sample as the basis of the interferometer, then the image can be viewed as the interference between the zero-order electromagnetic field and the electromagnetic field propagating off the optical axis.

图51A-5D是这样的图像描述的各种不同特征的示意表达。图51A是由高空间频率组份1104和零阶组份1106形成的干涉图1102的示意表达1100。图51B是由低频组份1114和零阶组份1106形成的干涉图1112的示意表达1110。图51C是由空间频率宽广的光束1124在图像平面1126的重叠形成的衍射斑1122的示意表达1120。图51D是由较狭窄的空间频谱1134在图像平面1126产生的较宽的衍射斑1132的示意表达1130。除此之外,例如,零阶组份和较高阶的组份能被看作DC分量和AC分量。Figures 51A-5D are schematic representations of various features of such image descriptions. FIG. 51A is a schematic representation 1100 of an interferogram 1102 formed by high spatial frequency components 1104 and zero order components 1106 . FIG. 51B is a schematic representation 1110 of an interferogram 1112 formed by low frequency components 1114 and zero order components 1106 . FIG. 51C is a schematic representation 1120 of a diffraction spot 1122 formed by the overlapping of beams 1124 of broad spatial frequency at an image plane 1126 . FIG. 51D is a schematic representation 1130 of a wider diffraction spot 1132 at the image plane 1126 produced by a narrower spatial frequency spectrum 1134 . Besides, for example, zero-order components and higher-order components can be regarded as DC components and AC components.

在成像平面中电子场的振幅和图像平面中的强度能被表示成:The amplitude of the electron field in the imaging plane and the intensity in the image plane can be expressed as:

Figure C20048002083800681
Figure C20048002083800681

Figure C20048002083800682
Figure C20048002083800682

其中Eimage代表光波在成像平面上某点的电场振幅,

Figure C20048002083800683
代表光波的相位,Iimage代表光波在成像平面上某点的强度,而其中的下标0和1分别代表用于方程式50-56中的零阶组份和高阶组份,例如,单一的振幅已被考虑。方程式51举例说明对于在样品上与π相比较很小的相位变化
Figure C20048002083800684
图像平面中的强度缓慢地改变,这等于说图像缺乏反差。然而,通过把零阶相位
Figure C20048002083800691
偏移π/2,图像强度分布能被表示成:Where E image represents the electric field amplitude of the light wave at a point on the imaging plane,
Figure C20048002083800683
Represents the phase of the light wave, I image represents the intensity of the light wave at a point on the imaging plane, and the subscripts 0 and 1 represent the zero-order components and high-order components used in equations 50-56, for example, a single Amplitude has been taken into account. Equation 51 illustrates that for small phase changes on the sample compared to π
Figure C20048002083800684
The intensity in the image plane changes slowly, which is equivalent to saying that the image lacks contrast. However, by placing the zero-order phase
Figure C20048002083800691
Offset by π/2, the image intensity distribution can be expressed as:

Figure C20048002083800692
Figure C20048002083800692

方程式52举例说明现在图像平面的强度在数值

Figure C20048002083800693
的周围是非常敏感的,相当于该图像即使对于纯粹地调整物体相位也呈现明显的反差。Equation 52 illustrates that the intensity of the image plane is now at the value
Figure C20048002083800693
is very sensitive to the surroundings, which means that the image shows obvious contrast even for purely adjusting the phase of the object.

除了改善强度反差之外,偏移零阶光波组份的相位也能提供关于该物体的相位分布的定量信息。例如,考虑将零频率组份的相位偏移能被可控制地改变的数量δ。在图像平面中任何点(x,y)的总电场E(x,y)image和强度Iimage(x,y,δ)能用下式表示,从而记住零阶电磁场在图像平面上是不变的:In addition to improving intensity contrast, shifting the phase of the zero-order light component can also provide quantitative information about the phase distribution of the object. For example, consider shifting the phase of the zero frequency component by an amount [delta] that can be controllably varied. The total electric field E(x, y) image and the intensity I image (x, y, δ) at any point (x, y) in the image plane can be expressed by the following formula, thus remembering that the zero-order electromagnetic field is not changing:

Figure C20048002083800694
Figure C20048002083800694

Figure C20048002083800695
Figure C20048002083800695

其中I0是与低频组份相关联的强度,I1是与高频率组份相关联的强度。where I0 is the intensity associated with the low frequency component and I1 is the intensity associated with the high frequency component.

在此,我们一般地提到来自样品的光波的阶次。然而,当使用SLM的时候,在实践中,仅仅可控制地偏移来自样品的光波的零阶组份的相位是非常困难的。因此,在优选的实施方案中,我们偏移包含所有零阶光波的低频空间组份的相位。因此,人们将会理解,本发明的系统和方法能通过仅仅偏移零阶组份的相位被实践,而且偏移其它阶次的相位不是必需的。通过改变δ,能获得和表达式:Here we refer generally to the order of the light waves from the sample. However, when using SLMs, it is very difficult in practice to controllably shift only the phase of the zeroth order component of the light wave from the sample. Therefore, in a preferred embodiment, we shift the phase of the low frequency spatial components comprising all zeroth order light waves. Thus, it will be appreciated that the systems and methods of the present invention can be practiced by only shifting the phase of the zeroth order component, and that shifting the phases of other orders is not necessary. By changing δ, one can get and expressions:

与样品相关联的相位

Figure C20048002083800703
能使用方程式53和54获得,而这两个方程式本身使用,例如,总电场E(x,y)的相位表达式。与物体相关联的相位能用下式表示:phase associated with the sample
Figure C20048002083800703
can be obtained using Equations 53 and 54, which themselves use, for example, the phase expression for the total electric field E(x,y). The phase associated with an object can be expressed by:

Figure C20048002083800704
Figure C20048002083800704

在方程式56中,β=I1/I0而且代表分别与高空间频率组份和低空间频率组份相关联的强度之比。β的数值能被获得,例如,从四个数值δ下的Iimage(x,y,δ)获得。In Equation 56, β=I 1 /I 0 and represents the ratio of the intensities associated with the high and low spatial frequency components, respectively. The value of β can be obtained, for example, from I image (x, y, δ) at four values δ.

在各种不同的实施方案中,本发明的系统和方法以显微镜系统的透射几何学为基础。图52示意地依照本发明以透射几何学为基础举例说明显微镜系统1200的一个实施方案。参照图52,一对透镜,物镜透镜1204和管透镜1206按透射几何学使样品1210在图像平面P2 1212成像。透镜L3 1214能用于在空间光波调制器(SLM)1216上形成图像的傅立叶变换。SLM 1216上的中心区域能相对于SLM的其余部分把可控制的相位偏移δ应用于入射光束1220的中心区域而且反射整个入射光束1220。入射光束1220的中心区域对应于用光束内边界1222描绘的低空间频率波。外边界1224举例说明高频光束组份的路径,放大低频光束组份和高频光束组份两者的发散以便被看到。透镜L3 1214也能充当4-f系统的第二透镜,使用分光镜BS 1232在诸如电荷耦合器件(CCD)之类的探测器1230上形成最后的图像。In various embodiments, the systems and methods of the present invention are based on the transmission geometry of a microscope system. Figure 52 schematically illustrates one embodiment of a microscope system 1200 based on transmission geometry in accordance with the present invention. Referring to Figure 52, a pair of lenses, objective lens 1204 and tube lens 1206, image a sample 1210 at image plane P2 1212 in transmission geometry. Lens L 3 1214 can be used to form a Fourier transform of an image on a spatial lightwave modulator (SLM) 1216 . The central region on the SLM 1216 can apply a controllable phase shift δ to the central region of the incident beam 1220 relative to the rest of the SLM and reflect the entire incident beam 1220 . The central region of the incident beam 1220 corresponds to low spatial frequency waves delineated by the beam inner boundary 1222 . The outer boundary 1224 illustrates the path of the high frequency beam component, magnifying the divergence of both the low frequency beam component and the high frequency beam component to be seen. Lens L3 1214 can also act as the second lens of the 4-f system, using beam splitter BS 1232 to form the final image on a detector 1230 such as a Charge Coupled Device (CCD).

各式各样的装置都能用来控制SLM和获得样品图像。例如,在各种不同的实施方案中,计算机1250控制SLM 1216的调制从而使δ增加π/2而且优选使探测器1230的图像采集同步。方程式55的运算能被实时地完成;因此显示相位图像的速度在优选实施方案中仅仅受探测器1230的采集时间和SLM1216的刷新率的限制。A wide variety of devices can be used to control the SLM and obtain images of the sample. For example, in various embodiments, computer 1250 controls modulation of SLM 1216 to increase delta by π/2 and preferably synchronizes image acquisition by detector 1230. The computation of Equation 55 can be done in real time; thus the speed at which the phase image can be displayed is limited only by the acquisition time of the detector 1230 and the refresh rate of the SLM 1216 in the preferred embodiment.

各式各样的照明模式和照明光源能用来为本发明的透射几何学提供照明1260。该照明能在明视场模式或暗视场模式中完成。除此之外,对所用来源的相干性质没有特殊的要求。本发明的系统和方法能使用激光、部份相干的辐射或“白”光(例如,来自放电灯)。然而,照明光源应该有好的空间相干性。A wide variety of illumination modes and illumination sources can be used to provide illumination 1260 for the transmissive geometry of the present invention. This illumination can be done in bright field mode or dark field mode. Other than that, there are no special requirements on the coherent nature of the sources used. The systems and methods of the present invention can use laser light, partially coherent radiation, or "white" light (eg, from discharge lamps). However, the illumination source should have good spatial coherence.

如图52所示,相干的低频和高频电磁场是同一光束的组份;并因此分享共向光程。因此,低频组份和高频组份以类似的方式受相位噪声影响,因此本发明的系统的各种不同实施方案能被看作是无光学噪声的定量相衬显微镜。例如,在各种不同的实施方案中,在任意的采集时标范围内λ/1000的相位灵敏度是可能的。As shown in Figure 52, the coherent low frequency and high frequency electromagnetic fields are components of the same light beam; and thus share a common optical path. Thus, low frequency components and high frequency components are similarly affected by phase noise, and various embodiments of the system of the present invention can thus be viewed as optically noise-free quantitative phase contrast microscopes. For example, in various embodiments, a phase sensitivity of λ/1000 over an arbitrary range of acquisition timescales is possible.

在各种不同的实施方案中,本发明的系统和方法以适合于显微镜系统的反射几何学为基础。透射几何学和反射几何学之间的差别在于照明几何学。透射几何学能被转换成反射几何学。In various embodiments, the systems and methods of the present invention are based on reflection geometries suitable for microscope systems. The difference between transmission geometry and reflection geometry is the lighting geometry. Transmission geometry can be converted to reflection geometry.

图53示意地举例说明依照本发明以反射几何学为基础的显微镜系统1300的一个实施方案。低频组份和高频组份两者的路径外边界为了清楚起见在图53中未被举例说明。除此之外,在图53中光束的发散为了看得见被放大。在各种不同的实施方案,分光镜BS11301允许第二照明光源1302耦合到该系统之内并提供照明1303。在一个实施方案中,第二照明光源包括超级发光二极管(SLD)。为了避免由于在光程中各种不同界面的反射造成的干涉,诸如SLD之类的低相干性光源是符合需要的。Figure 53 schematically illustrates one embodiment of a reflection geometry based microscope system 1300 in accordance with the present invention. The path outer boundaries of both the low frequency component and the high frequency component are not illustrated in FIG. 53 for clarity. In addition, the divergence of the beam is exaggerated for visibility in FIG. 53 . In various embodiments, beamsplitter BS 1 1301 allows a second illumination source 1302 to be coupled into the system and provide illumination 1303 . In one embodiment, the second illumination source comprises a super light emitting diode (SLD). In order to avoid interference due to reflections from various interfaces in the optical path, a low coherence light source such as an SLD is desirable.

参照图53,一对透镜、物镜透镜1304和管透镜1306使样品1310在图像平面P21312成像。透镜L31314能用来使图像的傅立叶变换在空间光波调制器(SLM)1316上形成。SLM 1316上的中心区域1317能相对于SLM的其余部分把可控制的相移δ应用于入射光束1320的中心区域1318和反射整个入射光束1320。入射光束1320的中心区域1318对应于低空间频率波。透镜L31314也能充当4-f系统的第二透镜,在诸如CCD之类使用分光镜BS1332的探测器1330上形成最后的图像。Referring to FIG. 53 , a pair of lenses, objective lens 1304 and tube lens 1306 , image sample 1310 at image plane P 2 1312 . Lens L 3 1314 can be used to cause the Fourier transform of the image to be formed on a spatial lightwave modulator (SLM) 1316 . The central region 1317 on the SLM 1316 can apply a controllable phase shift delta to the central region 1318 of the incident beam 1320 and reflect the entire incident beam 1320 relative to the rest of the SLM. The central region 1318 of the incident light beam 1320 corresponds to low spatial frequency waves. Lens L3 1314 can also act as the second lens of the 4-f system forming the final image on a detector 1330 such as a CCD using beam splitter BS1332.

各式各样的装置能被用来控制SLM和获得样品图像。例如,在各种不同的实施方案中,计算机1350控制SLM 1316的调制使δ增加π/2而且优选使探测器1330的图像采集同步。方程式55的运算能被实时地完成;因此显示相位图像的速度在优选的实施方案中只受探测器1330的采集时间和SLM1316的刷新率限制。A wide variety of devices can be used to control the SLM and obtain images of the sample. For example, in various embodiments, computer 1350 controls modulation of SLM 1316 to increase delta by π/2 and preferably synchronizes image acquisition by detector 1330. The computation of Equation 55 can be done in real time; thus the speed at which the phase image can be displayed is limited only by the acquisition time of the detector 1330 and the refresh rate of the SLM 1316 in the preferred embodiment.

反射几何学依照本发明的优选实施方案也能包括诸如在透射几何学中使用的照明1360。适当的透射照明模式包括但不限于明视场和暗视场模式。如同依照本发明在透射几何学中那样,关于照明光源的相干性性质没有特殊的要求。本发明的系统和方法能使用激光、部份相干的辐射或诸如来自放电灯之类光源的“白”光。然而,照明光源应该有好的空间相干性。Reflective geometry according to preferred embodiments of the present invention can also include illumination 1360 such as is used in transmissive geometry. Suitable trans-illumination modes include, but are not limited to, bright field and dark field modes. As in the transmission geometry according to the invention, there are no special requirements regarding the coherence properties of the illumination source. The systems and methods of the present invention can use laser light, partially coherent radiation, or "white" light from sources such as discharge lamps. However, the illumination source should have good spatial coherence.

依照本发明在反射几何学中,相干的低频电磁场和高频电磁场也是同一光束的组份并因此分享共向光程。因此,低频组份和高频组份以类似的方式受相位噪声影响,而且本发明的系统的各种不同实施方案能被看作是无光学噪声的定量相衬显微镜。例如,在各种不同的实施方案中,λ/1000的相位灵敏度在任意的采集时标范围内都是可能的。In reflective geometry according to the present invention, the coherent low-frequency and high-frequency electromagnetic fields are also components of the same beam and thus share a common optical path. Thus, low frequency components and high frequency components are similarly affected by phase noise, and various embodiments of the system of the present invention can be viewed as optically noise-free quantitative phase contrast microscopes. For example, in various embodiments, a phase sensitivity of λ/1000 is possible at any range of acquisition timescales.

在各种不同的实施方案中,本发明提供利用空间光波调制的相衬显微镜系统,该系统包括成像组件和相位成像组件。成像组件和相位成像组件能,例如,被独立地建造,从而使它们更容易用于现有的光学显微镜。In various embodiments, the present invention provides a phase contrast microscope system utilizing spatial lightwave modulation, the system comprising an imaging component and a phase imaging component. Imaging components and phase imaging components can, for example, be built independently, making them easier to use with existing optical microscopes.

被统称为图54的图54A和54B示意地举例说明将本发明与光学显微镜整合的一个实施方案1400。低频组份和高频组份两者的路径外边界为了清楚起见没有在图54中举例说明。除此之外,光束的发散在图54中为了看得见被放大。Figures 54A and 54B, collectively referred to as Figure 54, schematically illustrate one embodiment 1400 of integrating the present invention with an optical microscope. The path outer boundaries of both the low and high frequency components are not illustrated in Figure 54 for clarity. In addition, the beam divergence is exaggerated for visibility in FIG. 54 .

相位成像头1450能使用,例如,显微镜的视频输出与光学显微镜1410对接。光学显微镜1410包括能操纵光波使之从样品1420到显微镜视频输出的一对透镜L11412、L21414和反射镜1416。通常,一部分光波被分光镜1424引向为了供人类眼睛1430观看将光波聚焦的目镜1426。Phase imaging head 1450 can interface with optical microscope 1410 using, for example, the video output of a microscope. Optical microscope 1410 includes a pair of lenses L 1 1412 , L 2 1414 and mirror 1416 capable of manipulating light waves from a sample 1420 to the microscope video output. Typically, a portion of the light waves are directed by beam splitter 1424 to eyepiece 1426 which focuses the light waves for viewing by human eye 1430 .

相位成像头1450包括用来在空间光波调制器(SLM)1456上形成图像的傅立叶变换的透镜L31454。SLM 1456的中心区域能相对于SLM的其余部分把可控制的相移δ应用于入射光束1460的中心区域并反射整个入射光束1460。入射光束1460的中心区域对应于低空间频率波。透镜L31454也充当4-f系统的第二透镜,在诸如CCD之类使用分光镜BS 1472的探测器1470上形成最后的图像。The phase imaging head 1450 includes a Fourier transformed lens L 3 1454 for forming an image on a spatial light modulator (SLM) 1456 . The central region of the SLM 1456 can apply a controllable phase shift delta to the central region of the incident beam 1460 relative to the rest of the SLM and reflect the entire incident beam 1460 . The central region of the incident beam 1460 corresponds to low spatial frequency waves. Lens L3 1454 also acts as the second lens of the 4-f system forming the final image on a detector 1470 such as a CCD using a beam splitter BS 1472.

SLM的控制和样品的图像采集可以被完成,例如,使用控制SLM 1456的调制使δ增加π/2并优选使探测器1470的图像采集同步的计算机1480。计算机可以是独立的计算机,例如,备有相位成像头,或者“计算机”能包括依照本发明驻留在与显微镜相关联的计算机上的指令。方程式55的运算能被实时地完成;因此,显示相位图像的速度在优选的实施方案中只受探测器1470的采集时间和SLM1456的刷新率限制。Control of the SLM and image acquisition of the sample can be accomplished, for example, using a computer 1480 that controls the modulation of the SLM 1456 to increase delta by π/2 and preferably synchronizes the image acquisition of the detector 1470. The computer may be a stand-alone computer, eg, equipped with a phase imaging head, or the "computer" can include instructions according to the present invention residing on a computer associated with the microscope. The computation of Equation 55 can be done in real time; therefore, the speed at which the phase image can be displayed is limited only by the acquisition time of the detector 1470 and the refresh rate of the SLM 1456 in the preferred embodiment.

在各种不同的实施方案中,本发明的系统的横向分辨率能借助4-f系统的扩充得到改善。4-f系统能用于透射几何学和反射几何学。除此之外,4-f系统能用于包括标定系统的系统。4-f系统使利用对图像完成的其它傅立叶操作变得容易。In various embodiments, the lateral resolution of the system of the present invention can be improved by extension of the 4-f system. The 4-f system can be used in both transmission and reflection geometries. In addition, the 4-f system can be used in a system including a calibration system. The 4-f system makes it easy to exploit other Fourier operations performed on the image.

图55示意地举例说明本发明方法利用4-f系统的系统1500和方法的一个实施方案。该4-f系统包括一对透镜L41504、L51506,而且能包括空间滤波器F 1508。空间滤波器F 1508提供个别空间频率的振幅控制。与依照本发明由SLM提供的相位控制相结合,所述振幅控制使,例如,研究细胞里面的小细胞器变得容易,因为高频组份的增强能改善对比度。人们能想象空间滤波器F能优先衰减某些空间频率的其它应用。Figure 55 schematically illustrates one embodiment of a system 1500 and method of the present method utilizing a 4-f system. The 4-f system includes a pair of lenses L 4 1504 , L 5 1506 and can include a spatial filter F 1508 . Spatial filter F 1508 provides amplitude control of individual spatial frequencies. Combined with the phase control provided by the SLM according to the invention, said amplitude control facilitates, for example, the study of small organelles inside cells, since the enhancement of the high frequency component improves contrast. One can imagine other applications where the spatial filter F preferentially attenuates certain spatial frequencies.

4-f系统能被加到本发明的各种不同的透射几何学实施方案和反射几何学实施方案上。反射光源(例如,图53中的第二照明光源1302)能很容易地依照本发明被原本熟悉这项技术的人使用本发明提供的揭示加到图55的实施方案中。The 4-f system can be added to various transmission and reflection geometry embodiments of the present invention. A reflective light source (eg, second illumination source 1302 in FIG. 53) can readily be added to the embodiment of FIG. 55 in accordance with the present invention by one of ordinary skill in the art using the disclosure provided herein.

用于利用空间光波调制的相衬显微镜的系统和方法有各式各样的应用。例如,这些系统和方法能用来使微米级和纳米级的结构成像。重要类别的应用在于研究细胞间和细胞内的组织、动力学和行为。通过将共向光程用于低频组份和高频组份提供的稳定性,以及按透射模式和反向散射模式完成测量的能力使本发明的各种不同的优选实施方案适合在延长的时间周期(从几个小时到数天)里研究单一细胞和细胞全体。因此,在各种不同的实施方案中,本发明的优选实施方案提供的相位成像被用来提供关于细胞的缓慢动态过程的信息,例如,活细胞在从有丝分裂到细胞死亡的生命周期中的大小和形状变化。Systems and methods for phase contrast microscopy utilizing spatial light wave modulation have a variety of applications. For example, these systems and methods can be used to image microscale and nanoscale structures. An important class of applications lies in the study of intercellular and intracellular organization, dynamics, and behavior. The stability provided by the use of co-directional optical paths for both low and high frequency components, and the ability to perform measurements in both transmission and backscatter modes make the various preferred embodiments of the present invention suitable for extended periods of time Study single cells and cell ensembles over a period of time (from hours to days). Thus, in various embodiments, the phase imaging provided by the preferred embodiments of the present invention is used to provide information about the slow dynamic processes of cells, for example, the size of living cells during their life cycle from mitosis to cell death and shape changes.

在各种不同的优选实施方案中,本发明的方法和系统被用来以纳米精度研究细胞在分裂之后的分离过程和提供关于细胞膜的尺寸、性质或两者的信息。近来已受到特别关注的现象是程序性细胞死亡——凋亡。假定凋亡能在实验室中受到控制,在各种不同的优选实施方案中,本发明的方法和系统被用来研究在这个过程中诱发的细胞变形。在各种不同的优选实施方案中,本发明的方法和系统用来研究和探测各种不同类型的细胞(例如,癌细胞与正常细胞)的生活周期的差异。In various preferred embodiments, the methods and systems of the present invention are used to study the separation process of cells after division with nanometer precision and to provide information about the size, properties, or both of cell membranes. A phenomenon that has received particular attention recently is programmed cell death - apoptosis. Given that apoptosis can be controlled in the laboratory, in various preferred embodiments, the methods and systems of the present invention are used to study the cellular deformation induced in this process. In various preferred embodiments, the methods and systems of the present invention are used to study and detect differences in the life cycle of various types of cells (eg, cancer cells versus normal cells).

人们期望细胞融合层有能导致集体机械行为的某种程度的共有的相互作用。在各种不同的优选实施方案中,本发明的方法和系统用来研究这种共有的相互作用,例如,通过完成依照本发明获得的相位图像的不同点之间的交叉相关。One would expect some degree of shared interaction of confluent layers of cells that leads to collective mechanical behavior. In various preferred embodiments, the methods and systems of the present invention are used to study such shared interactions, for example, by performing cross-correlations between different points of a phase image obtained in accordance with the present invention.

由本发明的优选实施方案提供的相位成像也能用来提供关于细胞的快速动态过程的信息,例如,对刺激的反应。例如,诸如细胞体积调整之类的过程是活细胞对生物化学刺激的反应。这个反应的时标可能在从数毫秒到数分钟之间而且应该能使用本发明的系统和方法的优选实施方案非常准确地测量。在各种不同的优选实施方案中,本发明的方法和系统用来研究细胞对生物化学刺激的反应并且测量细胞结构(例如,细胞骨架)的机械性质。The phase imaging provided by the preferred embodiments of the present invention can also be used to provide information about fast dynamic processes in cells, eg, responses to stimuli. For example, processes such as cell volume adjustments are responses of living cells to biochemical stimuli. The timescale for this response may be from milliseconds to minutes and should be very accurately measurable using preferred embodiments of the systems and methods of the present invention. In various preferred embodiments, the methods and systems of the invention are used to study cellular responses to biochemical stimuli and to measure mechanical properties of cellular structures (eg, the cytoskeleton).

在各种不同的优选实施方案中,本发明的方法和系统用来研究有重大意义的细胞结构信息,例如理解细胞中细胞器的转运现象以及创造人造生物材料。在各种不同的优选实施方案中,本发明的方法和系统用来研究细胞结构,例如,通过使用机械振动刺激细胞膜并测量细胞膜振荡的振幅以便,例如,使它们与细胞机械性质和细胞物质发生关系。传统上,使用磁性的或捕集的珠子来刺激这种运动。在各种不同的优选实施方案中,本发明的方法和系统用来使用磁性的或捕集的珠子刺激机械振动、毫微微秒激光脉冲的光子压力引起机械刺激或两者来研究细胞结构。In various preferred embodiments, the methods and systems of the present invention are used to study cell structure information of great interest, such as understanding the transport phenomena of organelles in cells and creating artificial biomaterials. In various preferred embodiments, the methods and systems of the present invention are used to study cellular structures, e.g., by stimulating cell membranes with mechanical vibrations and measuring the amplitude of cell membrane oscillations, e.g., to correlate them with cell mechanical properties and cellular matter relation. Traditionally, magnetic or trapping beads have been used to stimulate this movement. In various preferred embodiments, the methods and systems of the present invention are used to study cellular structures using magnetic or trapped beads to stimulate mechanical vibrations, mechanical stimulation induced by photon pressure of femtosecond laser pulses, or both.

一类重要的应用是研究胞内组织和细胞器动力学。在各种不同的优选实施方案中,本发明的方法和系统用来研究各种不同的粒子在细胞里面的转运。An important class of applications is the study of intracellular organization and organelle dynamics. In various preferred embodiments, the methods and systems of the present invention are used to study the transport of various particles within cells.

除了生物学研究的多样性之外,本发明的优选实施方案还适合工业应用,例如,研究半导体的纳米结构。半导体工业缺乏在纳米级加工过程中晶片质量的可靠的快速检验。在各种不同的实施方案中,本发明的方法和系统用来提供关于半导体结构的纳米级信息,例如,以定量的方式。在优选的实施方案中,纳米级信息拥有大约一秒的测量结果。In addition to the diversity of biological research, preferred embodiments of the present invention are also suitable for industrial applications, for example, studying the nanostructure of semiconductors. The semiconductor industry lacks reliable rapid inspection of wafer quality during nanoscale processing. In various embodiments, the methods and systems of the present invention are used to provide nanoscale information about semiconductor structures, eg, in a quantitative manner. In a preferred embodiment, nanoscale information possesses about one second of measurement.

图56示意地举例说明依照本发明利用空间光波调制(SLM)的相衬显微镜系统1600的一个实施方案。以1600举例说明的系统能使用反射几何学和透射几何学。除此之外,该系统拥有标定子系统。Figure 56 schematically illustrates one embodiment of a phase contrast microscope system 1600 utilizing spatial lightwave modulation (SLM) in accordance with the present invention. The system exemplified by 1600 can use both reflective and transmissive geometries. In addition, the system has a calibration subsystem.

参照图56,一对透镜、物镜透镜L11607和管透镜L21606使样品1610使用反射镜1613在平面P1612成像。成像可以是使用透射几何学完成的,例如,通过光纤耦合器(FC)1614和来自第一照明光源1620(在这里被举例说明为氦氖(HENE)激光源)的第一光纤1616光波与样品1610耦合。成像也能使用反射几何学完成,例如,通过FC 1614和第二光纤1622耦合来自第二照明光源1624(在这里被举例说明为SLD)的光波再使用第一分光镜1626把来自第二照明光源1624的光波引到样品1610上。Referring to FIG. 56 , a pair of lenses, objective lens L11607 and tube lens L21606 , image a sample 1610 using a mirror 1613 in a plane P1612 . Imaging can be accomplished using transmission geometry, for example, through a fiber coupler (FC) 1614 and a first fiber optic 1616 light wave from a first illumination source 1620 (exemplified here as a helium-neon (HENE) laser source) to the sample. 1610 coupling. Imaging can also be accomplished using reflection geometry, for example, by coupling light waves from a second illumination source 1624 (illustrated here as an SLD) through FC 1614 and second optical fiber 1622 and then using first beamsplitter 1626 to combine light waves from the second illumination source The light waves at 1624 are directed onto the sample 1610.

透镜L31630用来在第一空间光波调制器(SLM)1632上形成图像的傅立叶变换。SLM1632用来把可控制的相位偏移δ加到入射光束1634的中心区域。在一个实施方案中,透镜L3充当4-f系统的第二透镜1630使用第二分光镜1638在第一探测器1636(在这里被举例说明为CCD)上形成最后的图像。在一个实施方案中,图56所示的系统进一步包括第二个4-f系统,例如,在图49中示意地举例说明的。图50的系统也包括用来标定SLM的标定子系统。标定光波的路径是用虚线1640示意地举例说明的,而照明光波和成像光波的路径是用实线1642示意地举例说明的。标定子系统使用一对透镜L41652和L51654(形成光束扩张器)收集一部分来自第一分光镜1626的光波并且通过能用来在相位模式和振幅模式之间切换SLM操作的偏振片Pc1656传送该光波。为了标定,SLM1658按振幅模式从头到尾扫描从0到2π的相位偏移,因此产生的移相光波当它通过偏振片返回的时候被衰减。然后,光波通过透镜L61660被收集起来并且在探测器1664上聚焦。Lens L3 1630 is used to form the Fourier transform of the image on the first spatial light modulator (SLM) 1632 . The SLM 1632 is used to add a controllable phase shift δ to the central region of the incident beam 1634. In one embodiment, lens L 3 acts as the second lens 1630 of the 4-f system to form the final image on the first detector 1636 (exemplified here as a CCD) using a second beamsplitter 1638 . In one embodiment, the system shown in FIG. 56 further comprises a second 4-f system, eg, schematically exemplified in FIG. 49 . The system of Figure 50 also includes a calibration subsystem for calibrating the SLM. The paths of the calibration lightwaves are schematically illustrated by dashed lines 1640 , while the paths of the illumination and imaging lightwaves are schematically illustrated by solid lines 1642 . The calibration subsystem uses a pair of lenses L4 1652 and L5 1654 (forming a beam expander) to collect a portion of the light wave from the first beamsplitter 1626 and pass it through a polarizer Pc1656 which can be used to switch the SLM operation between phase mode and amplitude mode Send that light wave. For calibration, the SLM1658 scans across phase shifts from 0 to 2π in amplitude mode, so that the resulting phase-shifted light wave is attenuated as it returns through the polarizer. The light waves are then collected by lens L 6 1660 and focused on detector 1664 .

多种装置和方案能用来控制图50的系统和标定相位图像。在一个实施方案中,第一控制单元PC11670被用于借助第一探测器1636的图像采集,而第二控制单元PC21672用来控制第一和第二SLM1632、1658和通过示波器1674收集来自探测器1664的数据。控制单元PC1,PC2可能是分开的单元或单一单元。例如,PC1和PC2可能是分开的计算机或同一台计算机,所述的控制单元可以包括适合实现控制单元的功能的模拟和/或数字电路。Various devices and schemes can be used to control the system of Figure 50 and to calibrate the phase images. In one embodiment, a first control unit PC 1 1670 is used for image acquisition via the first detector 1636, while a second control unit PC 2 1672 is used to control the first and second SLM 1632, 1658 and to collect images via the oscilloscope 1674. Data from detector 1664. The control units PC 1 , PC 2 may be separate units or a single unit. For example, PC 1 and PC 2 may be separate computers or the same computer, and the control unit may include analog and/or digital circuits suitable for implementing the functions of the control unit.

在各种不同的实施方案中,本发明的系统和方法包括例如使用微透镜的动态焦点。在各种不同的实施方案中,本发明的系统和方法包括平行的焦点以便,例如,使样品上的两个或多个点同时成像。在各种不同的实施方案中,本发明的系统和方法包括适合于,例如,在深度方面同时访问几个点的相干函数。In various embodiments, the systems and methods of the present invention include dynamic focus using microlenses, for example. In various embodiments, the systems and methods of the invention include parallel focal points to, for example, simultaneously image two or more points on a sample. In various embodiments, the systems and methods of the present invention include coherence functions adapted, for example, to access several points simultaneously in depth.

本发明利用空间光波调制的相衬显微镜系统能按两种模式操作。在第一种模式(此后被称为“振幅模式”)中,获得傅立叶滤波并完成标定。在第二种模式(此后被称为“相位模式”)中,重建光波的波阵面并完成相位成像。The phase contrast microscope system of the present invention utilizing spatial light wave modulation can operate in two modes. In the first mode (hereinafter referred to as "amplitude mode"), Fourier filtering is obtained and calibration is done. In the second mode (hereafter referred to as "phase mode"), the wavefront of the light wave is reconstructed and phase imaging is performed.

在各种不同的实施方案中,在“相位模式”中,没有在SLM前面的偏振片,而且光波对准SLM的快速轴。入射光波是被移相,例如,按照在SLM上编址的数值。In various embodiments, in "phase mode", there is no polarizer in front of the SLM, and the light waves are aligned to the fast axis of the SLM. The incident light wave is phase shifted, for example, by the value addressed on the SLM.

在“振幅模式”中,偏振片放在SLM的前面。SLM上的入射光波是被移相位(如同,例如,在“相位模式”中那样),而且偏振是旋转的。当光波从SLM反射的时候,它通过偏振片返回,而且该信号被衰减。因此,在振幅方面有基于SLM相移的标定减少。In "amplitude mode", the polarizer is placed in front of the SLM. The incident light wave on the SLM is phase shifted (as, for example, in "phase mode"), and the polarization is rotated. When the light wave reflects from the SLM, it returns through the polarizer and the signal is attenuated. Therefore, there is a nominal reduction in amplitude based on the phase shift of the SLM.

图57A和57B示意地举例说明在振幅模式1700和相位模式1750中在图像的象素上的光电效应,其中Ei1702、1752是入射波阵面的电场发射,s轴1704、1754是SLM的慢速轴,而f轴1706、1756是SLM的快速轴。57A and 57B schematically illustrate the photoelectric effect on a pixel of an image in amplitude mode 1700 and phase mode 1750, where E i 1702, 1752 is the electric field emission of the incident wavefront and s-axis 1704, 1754 is the SLM's The slow axis, while the f-axis 1706, 1756 is the fast axis of the SLM.

图58A-58C是SLM操作模式的各种不同实施方案的方框图1800、1850、1855。图58A举例说明用于相位成像的设置的正常操作模式而且描述SLM操作。RGB 1802是控制单元(例如,计算机)获得的灰度值,它控制SLM(RGB到

Figure C20048002083800781
是在标定中确定的)。RGB被转换成电压而且用来确定象素在SLM1804上的地址。该电压被加到,例如,SLM上的液晶上,把相位偏移给予入射光波1806。标定结果能在振幅模式中获得。图58B举例说明发生在标定中的转化。强度是作为灰度图像的函数使用探测器1852(例如,光电探测器)获得的。然后,作为灰度图像的函数的强度被作为灰度的函数1854转换成相位。图58C举例说明控制-相位模式而且举例说明在各种不同的实施方案中标定结果(灰度)是怎样变成SLM控制和SLM引起的实际相移之间关系的。从此,例如,人们能制订用于该仪器的标定查询表。然后作为灰度的函数的相位被用来产生灰度图像1856(例如,用于计算机上的显示器)并且与SLM所引起的相移1858相关联。58A-58C are block diagrams 1800, 1850, 1855 of various embodiments of SLM modes of operation. Figure 58A illustrates the normal mode of operation of the setup for phase imaging and depicts SLM operation. RGB 1802 is the gray value obtained by the control unit (e.g. computer) which controls the SLM (RGB to
Figure C20048002083800781
is determined in the calibration). RGB is converted to voltages and used to address the pixels on the SLM1804. This voltage is applied to, for example, a liquid crystal on the SLM, imparting a phase shift 1806 to the incident light wave. Calibration results can be obtained in amplitude mode. Figure 58B illustrates the transformations that occur in calibration. The intensity is obtained as a function of the grayscale image using a detector 1852 (eg, a photodetector). The intensity as a function of the grayscale image is then converted 1854 to phase as a function of grayscale. Figure 58C illustrates the control-phase mode and illustrates calibration results in various implementations How (gray scale) becomes the relationship between the SLM control and the actual phase shift caused by the SLM. From this, for example, one can develop a calibration look-up table for the instrument. The phase as a function of grayscale is then used to generate a grayscale image 1856 (eg, for a display on a computer) and correlated to the phase shift 1858 caused by the SLM.

图59是对按振幅模式操作的仪器获得的标定曲线1900的例子。标定曲线1900是以弧度为单位的相移1902随以RGB数值为单位的灰度1904变化的曲线。所获得的合量曲线1906以标定查询表的格式展示SLM的计算机控制和SLM引起的实际相移之间的关系。图59能作为标定查询表。曲线1906中的分离点1908是相位的重叠。Figure 59 is an example of a calibration curve 1900 obtained for an instrument operating in the amplitude mode. Calibration curve 1900 is a curve of phase shift 1902 in radians versus grayscale 1904 in RGB values. The resultant curve 1906 obtained shows the relationship between the computer control of the SLM and the actual phase shift induced by the SLM in the format of a calibrated look-up table. Figure 59 can be used as a calibration lookup table. Separation point 1908 in curve 1906 is an overlap of phases.

实施例Example

提供了一些依照本发明使用透射几何学的实施例和一些依照本发明使用反射几何学的实施例。出现在,例如,在图62-66B中的旋转展开记号法表明2π模糊度已被消除。Some embodiments using transmissive geometry in accordance with the invention and some embodiments using reflective geometry in accordance with the invention are provided. The rotated expansion notation that appears, for example, in Figures 62-66B shows that the 2π ambiguity has been removed.

实施例1:标定样品的相位成像Example 1: Phase imaging of calibration samples

在这个实施例中,标定好的样品已被研究并且举例说明本发明能以纳米(nm)刻度提供定量信息。样品由玻璃基体上的金属沉积物组成,然后被蚀刻。金属沉积物图案呈数字“8”的形状而且金属层的厚度是用显微光波干涉仪实测的大约140nm。In this example, calibrated samples were studied and illustrated that the present invention can provide quantitative information at the nanometer (nm) scale. The samples consisted of metal deposits on a glass substrate, which were then etched. The metal deposit pattern is in the shape of a figure "8" and the thickness of the metal layer is about 140nm as measured by a microscopic light wave interferometer.

图60A-60D展示使用反射几何学的系统以四种不同的相移δ获得的图像。图60A是δ=0的图像2000;图60B是δ=π的图像2200;图60C是δ=π/2的图像2400;而图60D是δ=3π/2的图像2600。Figures 60A-60D show images acquired by the system using reflection geometry at four different phase shifts δ. Figure 60A is an image 2000 for δ=0; Figure 60B is an image 2200 for δ=π; Figure 60C is an image 2400 for δ=π/2; and Figure 60D is an image 2600 for δ=3π/2.

图61示意地举例说明电场矢量E 2102和该电场的高频波矢量组份EH和该电场的低频波矢量组份EL之间的关系2100。如图61所示,Y轴2110和X轴2112代表CCD象素尺寸。相位

Figure C20048002083800801
是物体的“真实”相位。Figure 61 schematically illustrates the relationship 2100 between the electric field vector E 2102 and the high frequency wave vector component E H of the electric field and the low frequency wave vector component E L of the electric field. As shown in Figure 61, the Y-axis 2110 and X-axis 2112 represent the CCD pixel size. phase
Figure C20048002083800801
is the "true" phase of the object.

图62是使用数据(例如,图60A-60D中举例说明的数据)和方程式55产生的标定样品2200的图像。在图62中,Y轴2202和X轴2204两者都以CCD上的象素为单位。图62右边的标尺2206代表以弧度为单位

Figure C20048002083800802
FIG. 62 is an image of a calibration sample 2200 generated using data (eg, the data illustrated in FIGS. 60A-60D ) and Equation 55. In FIG. 62, both the Y-axis 2202 and the X-axis 2204 are in units of pixels on the CCD. The scale 2206 on the right side of Figure 62 represents in radians
Figure C20048002083800802

图63是使用依照本发明的系统和方法标定的样品2300的相位图像。图63是使用方程式56和数据(例如,图62举例说明的数据)产生的。图63也能使用方程式55和56和数据(例如图60A-60D举例说明的数据)产生。Y轴2302和X轴2304都以在CCD象素为单位而垂直的标尺2306以nm为单位。Figure 63 is a phase image of a sample 2300 calibrated using the systems and methods in accordance with the present invention. Figure 63 was generated using Equation 56 and data (eg, the data illustrated in Figure 62). Figure 63 can also be generated using Equations 55 and 56 and data such as those illustrated in Figures 60A-60D. Both the Y-axis 2302 and the X-axis 2304 are in units of CCD pixels and the vertical scale 2306 is in units of nm.

如图63所示,人们能看到沉积金属图案2310的高度已被正确地恢复,以举例说明本发明的系统和方法提供定量特征信息的能力。相位图像2300中存在的噪声主要是由用于记录的低质量(8位)照相机造成的。As shown in Figure 63, one can see that the height of the deposited metal pattern 2310 has been correctly restored to illustrate the ability of the system and method of the present invention to provide quantitative feature information. The noise present in the phase image 2300 is mainly caused by the low quality (8 bit) camera used for recording.

实施例2:相栅的相位成像Example 2: Phase Imaging of Phase Grating

图64展示使用透射几何学获得的有名义上10微米宽和名义上266nm深的沟槽的相栅的相位图像2400。在图64中,Z轴2402以nm为单位,Y轴2404和X轴2406以CCD象素为单位。垂直标尺2408也以nm为单位并且是为了进一步帮助依据相位图像2400确定深度(Z轴尺寸)而提供的。Figure 64 shows a phase image 2400 of a phase grating with trenches nominally 10 microns wide and nominally 266 nm deep obtained using transmission geometry. In FIG. 64, the unit of Z-axis 2402 is nm, and the unit of Y-axis 2404 and X-axis 2406 is CCD pixel. Vertical scale 2408 is also in nm and is provided to further aid in determining depth (Z-axis dimension) from phase image 2400 .

实施例3:洋葱细胞的相位图像Example 3: Phase image of onion cells

在这个实施例中,洋葱细胞是依照本发明使用透射几何学相位成像的。洋葱细胞的强度图像2500被展示在图65中以便与在图66中展示的相位图像2550进行比较。在图65和图66中,y-轴2502、2552和x-轴2504、2554都以CCD象素为单位。图66中的标尺2556以nm为单位。In this example, onion cells were phase imaged using transmission geometry in accordance with the present invention. An intensity image 2500 of onion cells is shown in FIG. 65 for comparison with a phase image 2550 shown in FIG. 66 . In Figures 65 and 66, the y-axis 2502, 2552 and the x-axis 2504, 2554 are in units of CCD pixels. Scale bar 2556 in Figure 66 is in nm.

强度图像(图65)代表在低频组份和高频组份之间没有相位偏移δ=0的情况下取得的第一帧。如比较图65和图66所示,常规显微镜(强度)图像相对于依照本发明获得的相位图像有非常低的反差。如同在图66中见到的那样,在相位图像中反差被大大提高,在这种情况下,精细得多的细胞结构能被区分开。除此之外,相位图像中的信息被定量到纳米水平的精度而且能根据电磁场通过该细胞的光程长度换算。这个类型的信息代表不仅与常规光学显微镜有关而且与传统的相衬和Nomarski显微镜有关的很大的改进。The intensity image (FIG. 65) represents the first frame taken without a phase shift δ=0 between the low and high frequency components. As shown by comparing Figure 65 and Figure 66, the conventional microscope (intensity) image has very low contrast relative to the phase image obtained in accordance with the present invention. As seen in Figure 66, the contrast in the phase image is greatly enhanced, and in this case much finer cellular structures can be distinguished. In addition, the information in the phase image is quantified to nanometer-level precision and can be scaled according to the optical path length of the electromagnetic field through the cell. This type of information represents a great improvement not only with conventional light microscopy but also with conventional phase contrast and Nomarski microscopy.

本发明的优选实施方案包括使用相干分解把低相干性光学像场分解成两个能被可控制地相对于对方偏移相位的不同的空间组份以开发相位成像仪器。这种技术把典型的光学显微镜转变成以高准确性和λ/5500的灵敏度为特色的定量相衬显微镜。在活的生物细胞上获得的结果暗示依照本发明的优选实施方案的仪器对于定量地研究生物学结构和动力学有很大的潜力。A preferred embodiment of the invention involves the use of coherence decomposition to decompose a low coherence optical image field into two distinct spatial components that can be controllably phase shifted relative to each other to develop a phase imaging instrument. This technique transforms a typical light microscope into a quantitative phase contrast microscope featuring high accuracy and a sensitivity of λ/5500. The results obtained on living biological cells suggest that the apparatus according to the preferred embodiments of the present invention has great potential for quantitatively studying biological structures and dynamics.

相衬和差动干涉对比(DIC)显微镜能够提供透明生物结构的高反差强度图像,无需样品准备。在光波相位中编码的结构信息通过干涉过程被重新获得。然而,尽管两种技术都揭示横断(x-y)平面中的样品结构,但是在纵轴(z)上提供的信息在很大程度上是定性的。Phase contrast and differential interference contrast (DIC) microscopy provide high-contrast intensity images of transparent biological structures without the need for sample preparation. Structural information encoded in the phase of the light wave is retrieved through an interferometric process. However, while both techniques reveal sample structure in the transverse (x-y) plane, the information provided on the longitudinal axis (z) is largely qualitative.

如同本文在前面描述的那样,移相干涉测量法已经在相位样品的定量度量衡学中使用相当长的时间,而且各种不同的干涉测量技术已经被提出。由于空气波动和机械振动自然地出现在任何干涉仪中的相位噪声使与光学领域相关联的相位的定量恢复变成实践中的具体挑战。优选的实施方案包括相关的波长以便克服这个障碍。As described earlier in this paper, phase-shifting interferometry has been used for a considerable time in the quantitative metrology of phase samples, and various interferometry techniques have been proposed. Phase noise, which naturally occurs in any interferometer due to air fluctuations and mechanical vibrations, makes the quantitative recovery of the phase associated with the optical domain a specific challenge in practice. Preferred embodiments include correlated wavelengths to overcome this obstacle.

此外,已经为全场相位成像以耗时的数字计算为代价推荐以辐射照度迁移方程为基础的非干涉测量技术。和激光辐射一起使用空间光波调制以获得λ/30灵敏度的相位图像。自动移相的数字式记录干涉显微镜(DRIMAPS)是利用传统的干涉显微镜提供生物样品的相位图像的方法。虽然在DRIMAPS中没有采取预防最终限制任何相位测量技术的灵敏度的相位噪声的措施,但是这个仪器应用于细胞生物学的潜力已被证实。Furthermore, non-interferometric techniques based on the irradiance transfer equation have been proposed for full-field phase imaging at the expense of time-consuming numerical calculations. Spatial lightwave modulation is used with laser radiation to obtain phase images with λ/30 sensitivity. Digital Recording Interferometry Microscopy with Automatic Phase Shifting (DRIMAPS) is a method that utilizes conventional interference microscopy to provide phase images of biological samples. Although no measures are taken in DRIMAPS to prevent phase noise that ultimately limits the sensitivity of any phase measurement technique, the potential of this instrument for cell biology has been demonstrated.

本发明的优选实施方案包括作为用于生物学研究的新仪器的低相干性相衬显微镜(LCPM)。这种技术把传统的光学显微镜转变成以非常好的准确性和极低的噪声为特色的定量相衬显微镜。这项技术的原理依赖相干分解把与光学图像相关联的电磁场分解成它的空间平均的和在空间上变化的电磁场,这些电磁场能可控制地相对于对方移相。令E(x,y)是假定在整个空间域上静止的复数像场。这个场能被表示成A preferred embodiment of the present invention includes a low coherence phase contrast microscope (LCPM) as a new instrument for biological research. This technique transforms a conventional light microscope into a quantitative phase-contrast microscope featuring very good accuracy and extremely low noise. The principle of this technique relies on coherent decomposition to decompose the electromagnetic field associated with an optical image into its spatially averaged and spatially varying electromagnetic fields, which can be controllably phase-shifted relative to each other. Let E(x,y) be the complex image field assumed to be stationary over the entire spatial domain. This field can be expressed as

E(x,y)=E0+E1(x,y)            (57)E(x, y) = E 0 +E 1 (x, y) (57)

其中E0是空间平均值,E1是E在空间变化的组份。因此,任何图像都能被视为平面波(平均电磁场)和空间上变化的电磁场之间的干涉现象的结果。人们应该注意到,作为中心正确定理的结果,E0和E1能在图像的每个点中被比作电磁场E的零-和高-空间频率组份。所以,这两个空间组份能通过完成傅立叶分解很容易被分开和被独立地进行相位调制。where E 0 is the spatial average and E 1 is the component in which E varies in space. Therefore, any image can be viewed as the result of an interference phenomenon between a plane wave (mean electromagnetic field) and a spatially varying electromagnetic field. One should note that E 0 and E 1 can be compared to the zero- and high-spatial-frequency components of the electromagnetic field E in each point of the image as a consequence of the central right theorem. Therefore, these two spatial components can be easily separated and independently phase modulated by performing Fourier decomposition.

实验组件是在图67中描绘的。倒装显微镜(Axioert35,ZeissC0.)用来使样品在图像平面IP成像。由超级发光二极管发出的低相干性电磁场(中心波长在范围800-850中,例如,λ0=824nm、带宽Δλ=21nm,或者作为替代λ0=809nn、Δλ=20nm)被用于透射法。为了保证照明电磁场的全空间相干性,光波被耦合到单模光纤之中而且随后用光纤准直仪准直。从图像显现出来的光线痕迹用点线和连续线分别表示对应于电磁场E0和E1的不偏斜光波和高空间频率组份。为了把像场分解成方程式57中描述的组份,傅立叶透镜FL(50cm焦距)被放在距图像平面IP焦距的地方。人们在图67中能看到,在IP处形成的显微镜图像似乎是用作为用于照明的光纤末端的显微镜图像的虚拟点光源(VPS)照明的。所以,为了在FL的后焦平面获得像场的精确的(相位和振幅)傅立叶变换,校正透镜CL被放置在平面IP处。CL的焦距是这样的,以致VSP在无限远处成像;因此,样品的新图像保持它的位置和放大倍数,而且它似乎是用平面波照明的。在FL的傅立叶平面中,零空间频率组份E0在光轴上聚焦,而高频组份E1是离轴分布的。为了控制E0和E1之间的相位延迟,可编程的相位调制器(PPM)(Hamamatsu Co.)被放在傅立叶平面之中。PPM由光学编址的二维液晶阵列组成,它由于双折射性质在其表面反射的光波的相位范围内提供精确控制。在PPM表面上最小的可设定地址的面积是20×20μm2或作为替代是26×26μm2,而相位控制的动态范围在一个波长或2π范围内是8位。该PPM能以空间分辨方式修正入射电磁场的相位(操作的相位模式)或振幅(振幅模式),取决于偏振片P相对于液晶主轴的取向。被PPM反射的光波通过FL往回传播,并且在分光镜BS上反射之后被放在IP的共轭位置的CCD收集。因此,在缺乏PPM调制时,在IP处图像的精确的相位和振幅复制品被CCD记录。高空间频率组份的相位是按四个π/2增量连续地增加的,而且由此产生的辐照度分布能用CCD记录。PPM上的相位调制和CCD的采集速率是靠使用,例如,LabVIEW(美国国家仪器公司)的计算机PC同步的。使用标准的4-帧相移干涉测量法,E1和E0之间的相位差

Figure C20048002083800841
能被测量。它能被展示作为重要数量与像场相关联的空间相位分布有如下的表达式。Experimental components are depicted in Figure 67. An inverted microscope (Axioert35, Zeiss Co.) was used to image the sample IP in the image plane. A low coherence electromagnetic field (central wavelength in the range 800-850, eg λ 0 =824nm, bandwidth Δλ=21nm, or alternatively λ 0 =809nn, Δλ=20nm) emitted by a superluminescent diode is used for the transmission method. To ensure full spatial coherence of the illuminating electromagnetic field, the light waves are coupled into single-mode fibers and then collimated with a fiber collimator. Light traces emerging from the image are shown with dotted and continuous lines representing unbiased light waves and high spatial frequency components corresponding to electromagnetic fields E 0 and E 1 , respectively. To decompose the image field into the components described in Equation 57, a Fourier lens FL (50 cm focal length) is placed at a focal distance from the image plane IP. One can see in Figure 67 that the microscope image formed at IP appears to be illuminated with a virtual point source (VPS) that is the microscope image of the fiber end used for illumination. Therefore, in order to obtain an accurate (phase and amplitude) Fourier transform of the image field at the back focal plane of FL, corrective lens CL is placed at plane IP. The focal length of the CL is such that the VSP is imaged at infinity; thus, the new image of the sample maintains its position and magnification, and it appears to be illuminated with a plane wave. In the Fourier plane of FL, the zero-spatial-frequency component E0 is focused on the optical axis, while the high-frequency component E1 is distributed off-axis. To control the phase delay between E 0 and E 1 , a programmable phase modulator (PPM) (Hamamatsu Co.) was placed in the Fourier plane. The PPM consists of an optically addressed two-dimensional liquid crystal array that, due to its birefringent properties, provides precise control over the phase range of the light waves reflected by its surface. The smallest addressable area on the PPM surface is 20 x 20 µm 2 or alternatively 26 x 26 µm 2 , while the dynamic range of the phase control is 8 bits over one wavelength or 2π. The PPM can modify the phase (phase mode of operation) or amplitude (amplitude mode) of the incident electromagnetic field in a spatially resolved manner, depending on the orientation of the polarizer P relative to the liquid crystal axis. The light waves reflected by the PPM travel back through the FL and are collected by the CCD placed at the conjugate position of the IP after being reflected on the beam splitter BS. Thus, in the absence of PPM modulation, an exact phase and amplitude replica of the image at the IP is recorded by the CCD. The phase of the high spatial frequency component is continuously increased in four π/2 increments, and the resulting irradiance distribution can be recorded with a CCD. The phase modulation in PPM and the acquisition rate of the CCD are synchronized by a computer PC using, for example, LabVIEW (National Instruments). Using standard 4-frame phase-shift interferometry, the phase difference between E 1 and E 0
Figure C20048002083800841
can be measured. It can be shown as the spatial phase distribution of the important quantity associated with the image field with the following expression.

&phi;&phi; (( xx ,, ythe y )) == tanthe tan -- 11 [[ &beta;&beta; (( xx ,, ythe y )) sinsin [[ &Delta;&phi;&Delta;&phi; (( xx ,, ythe y )) ]] 11 ++ &beta;&beta; (( xx ,, ythe y )) coscos [[ &Delta;&phi;&Delta;&phi; (( xx ,, ythe y )) ]] ]] -- -- -- (( 5858 ))

在方程式58中,因子β代表两个电磁场组份的振幅比,β(x,y)=|E1(x,y)|/|E2|。参数β被测量,从而与π/2波平面(振幅模式)一样操作有选择地完成两个空间频率组份滤波的PPM。因此,使用方程式58,给定的透明样品的空间相位分布能被唯一地重新获得。傅立叶平面中同轴调制面积的最佳数值被发现是160×160μm2,而在同一平面与光学系统相关联的基于FWHM强度的衍射斑点有大约100μm的直径。由于方程式58的数字计算事实上是刻不容缓的,所以相位图像重新获得的速度只受PPM的刷新率限制,该刷新率在一个实施方案中是8Hz。然而,总的技术速度能通过使用诸如铁电液晶之类其它的空间调制器被潜在地增加。In Equation 58, the factor β represents the amplitude ratio of the two electromagnetic field components, β(x,y)=|E 1 (x,y)|/|E 2 |. The parameter β is measured so as to operate as a π/2 wave plane (amplitude mode) to selectively perform PPM filtering of the two spatial frequency components. Therefore, using Equation 58, the spatial phase distribution of a given transparent sample can be uniquely retrieved. The optimum value for the on-axis modulation area in the Fourier plane was found to be 160×160 μm 2 , while the diffraction spots based on the FWHM intensity associated with the optical system in the same plane had a diameter of about 100 μm. Since the numerical computation of Equation 58 is virtually instantaneous, the speed at which the phase image is retrieved is limited only by the PPM refresh rate, which in one embodiment is 8 Hz. However, the overall technology speed can potentially be increased by using other spatial modulators such as ferroelectric liquid crystals.

为了证明它实现定量相位成像的潜力,LCPM技术被应用于研究各种不同的标准样品。图68A和68B展示从聚苯乙烯微球成像获得的这种测量结果的实例。粒子直径是由制造商(DukeScientific)提供的3±0.045μm。为了更好地模拟透明的生物样品,球体浸没在100%丙三醇中然后被夹在两个盖玻片之间。在粒子和周围介质之间实现的折射指数差是Δn=0.12。在没有PPM上的调制的情况下,获得图68A展示的典型的透射强度图像。人们能看到这幅图像的反差由于样品的透明度非常不令人满意。图68B展示用上述的程序大纲获得的LCPM图像。在这里,所获得的反差实质上是比较高的,而第三维(Z轴)提供关于样品厚度的定量信息。使用通过图68B展示的球体中心的轮廓描绘,从对应的直径获得的数值是2.97±7.7%,这与制造商指出的数值很好地一致。现有的误差可能是光束质量不完美和溶液中存在的潜在杂质造成的。To demonstrate its potential for quantitative phase imaging, the LCPM technique was applied to study various standard samples. Figures 68A and 68B show examples of such measurements obtained from polystyrene microsphere imaging. Particle diameter was 3±0.045 μm as provided by the manufacturer (Duke Scientific). To better mimic transparent biological samples, the spheres were submerged in 100% glycerol and sandwiched between two coverslips. The refractive index difference achieved between the particle and the surrounding medium is Δn=0.12. The typical transmitted intensity image shown in Figure 68A was obtained without modulation in PPM. The contrast one can see in this image is very unsatisfactory due to the transparency of the sample. Figure 68B shows an LCPM image obtained with the program outline described above. Here, the obtained contrast is relatively high in nature, while the third dimension (Z-axis) provides quantitative information about the thickness of the sample. Using the contouring of the center of the sphere shown in Figure 68B, the value obtained from the corresponding diameter was 2.97 ± 7.7%, which is in good agreement with the value indicated by the manufacturer. Existing errors could be caused by imperfect beam quality and potential impurities present in the solution.

LCPM工具被进一步用来形成活生物细胞的相位图像。图69A展示HeLa癌细胞有丝分裂最后阶段的定量相位图像。人们应该注意到,细胞被培养介质包围着,在成像之前生活在典型的培养条件下没有任何附加的准备。先前已指出经过生物细胞传播的电磁场累积的相位延迟与细胞的非水质量成比例。因此,定量的相位图像应该在诸如有丝分裂、细胞生长和死亡之类各种不同的细胞生理学阶段的细胞运动学自动分析方面找到重要的应用。LCPM tools are further used to form phase images of living biological cells. Figure 69A shows quantitative phase images of the final stages of mitosis in HeLa cancer cells. One should note that cells were surrounded by culture medium and lived under typical culture conditions prior to imaging without any additional preparation. It has been previously pointed out that the phase delay accumulated by electromagnetic fields propagating through biological cells is proportional to the non-aqueous mass of the cells. Quantitative phase images should therefore find important application in the automatic analysis of cell kinematics at various stages of cell physiology such as mitosis, cell growth and death.

全血涂片的相位图像被展示在图69B中。样品是通过简单地把一小滴健康志愿者的新鲜全血夹在两个盖玻片之间制备的。人们能看到红血球(RBC)众所周知的扁圆形状被恢复。考虑血色素相对于血浆的折射指数的简单分析很容易提供关于细胞体积的定量信息。RBC分析中的这种细节水平当前仅仅适用于电子和原子力显微镜。非侵入的光学技术有可能提供病理快速筛选程序,因为众所周知的是RBC形状往往是细胞健康的好指标。除此之外,这项依照本发明优选实施方案的技术能监测的RBC细胞膜和周围蛋白质的复杂动态性质,是血液凝结的原因。A phase image of a whole blood smear is shown in Figure 69B. Samples were prepared by simply sandwiching a small drop of fresh whole blood from a healthy volunteer between two coverslips. One can see that the well-known oblate shape of red blood cells (RBCs) is restored. A simple analysis considering the refractive index of hemoglobin relative to plasma readily provides quantitative information on cell volume. This level of detail in RBC analysis is currently only available for electron and atomic force microscopy. Non-invasive optical techniques have the potential to provide a rapid screening procedure for pathology, as it is well known that RBC shape is often a good indicator of cell health. Among other things, the complex dynamic properties of the RBC cell membrane and surrounding proteins that this technique according to a preferred embodiment of the present invention can monitor are responsible for blood clotting.

为了评估仪器对抗相位噪声的稳定性并最终定量描述它的灵敏度,使只装了培养介质(没有细胞)的细胞容器在100分钟的时间周期里按15秒的间隔成像。图69C展示与包含在视场中的某点相关联的瞬时相位起伏的实例。相位数值是在0.6×0.6μm2的面积上的平均值,它代表显微镜的横向分辨率极限。这些起伏的标准偏差有0.15nm的数值,等价于λ/5500。结果证明LCPM仪器的非凡的灵敏度。表征仪器特色的极低的噪声能用两个相干的电磁场在空间上彼此重叠并且受类似的在干涉项中最终被抵消的相位噪声影响的光程中传播这一事实解释。与激光辐射相反,低相干性电磁场的使用有利于该方法的灵敏度,因为在各种不同的组份上的多重反射可能形成的条纹被消除。To assess the stability of the instrument against phase noise and ultimately quantify its sensitivity, cell vessels containing only culture medium (no cells) were imaged at 15 second intervals over a 100 minute time period. Figure 69C shows an example of instantaneous phase fluctuations associated with a point contained in the field of view. Phase values are averaged over an area of 0.6 × 0.6 μm, which represents the lateral resolution limit of the microscope. The standard deviation of these fluctuations has a value of 0.15 nm, which is equivalent to λ/5500. The results demonstrate the extraordinary sensitivity of the LCPM instrument. The extremely low noise that characterizes the instrument can be explained by the fact that two coherent electromagnetic fields spatially overlap each other and propagate in an optical path affected by similar phase noise that eventually cancels out in the interference term. In contrast to laser radiation, the use of low-coherence electromagnetic fields favors the sensitivity of the method, since possible fringes formed by multiple reflections on the various components are eliminated.

因此,本发明的优选实施方案包括以高准确性和λ/5500水平的灵敏度为特征的低相干性相衬显微镜。关于活的癌细胞和红血球的初步结果暗示所述的装置和方法有潜力变成用于生物学系统的结构和动力学研究的有价值的工具。通过把传统的光学显微镜并入该系统组件,依照本发明的优选实施方案的仪器以高度的多功能性和特别容易使用为特征。Accordingly, preferred embodiments of the present invention include a low coherence phase contrast microscope characterized by high accuracy and sensitivity at the level of lambda/5500. Preliminary results on living cancer cells and erythrocytes suggest that the described devices and methods have the potential to become valuable tools for structural and dynamical studies of biological systems. By incorporating a conventional optical microscope into the system components, the instrument according to the preferred embodiment of the present invention is characterized by a high degree of versatility and exceptional ease of use.

权利要求不应该被错误地当作局限于所描述的次序或元素,除非对那种效果另有说明。所以,所有出现在权利要求书及其等价文件的范围和精神范围内的实施方案都在本发明的权利要求范围内。The claims should not be falsely read as limited to the described order or elements unless stated otherwise to that effect. Therefore, all embodiments appearing within the scope and spirit of the claims and equivalents thereof are within the scope of the present invention.

Claims (24)

1. method that is used for measuring through the phase place of a part of vectorial light wave, this method comprises the steps:
Light wave from light emitted first wavelength;
Along first light path and second light path guide the light wave of first wavelength, first light path to comprise the first movable reflecting surface and by optical coupled to the media that will measure, second path has the second movable reflecting surface to be provided at the change of path aspect; And
Detection is from vectorial light wave with from the light wave of second light path, so that measure the phase change by the medium light wave.
2. according to the process of claim 1 wherein that described medium comprises the sample of biological tissue.
3. according to the method for claim 1, further comprise photodiode array is provided at least and with one of fibrous bundle of photodiode coupling so that the phase place of sample in a plurality of locations imaging simultaneously.
4. according to the method for claim 1, further comprise the step of the light wave in frequency displacement second light path.
5. according to the method for claim 1, further comprise the step that changes by at least two photodetection detecting phases.
6. according to the method for claim 1, further comprise the He-Ne Lasers light source that emission first wavelength is provided.
7. according to the method for claim 1, it is right further to comprise low-coherence light source and form light pulse.
8. according to the method for claim 1, further comprise first gap and second gap between second reference plane and the 3rd reference plane that are provided between reference plane and the sample.
9. according to the process of claim 1 wherein first reflecting surface experience displacement, second reflecting surface and low coherence light source optical coupled.
10. according to the method for claim 1, further comprise the step of using polarization discrimination sample gap signal and benchmark event signal.
11., further comprise sample arranged with respect to first reflecting surface and second reflecting surface according to the method for claim 1.
12. a twin-beam measuring system, comprising:
Light source;
Light wave from light source is divided into spectroscope at first component on first light path and second component on second light path;
Change the first movable reflecting surface of first optical path length;
Change the second movable reflecting surface of second optical path length; And
Guide the vectorial compositor that to measure into from the light wave of first light path and second light path.
13. according to the system of claim 12, wherein said compositor comprises the light beam spectroscope.
14. according to the system of claim 12, wherein said compositor is the reference field of guiding first reflecting surface that separates by the gap and second reflecting surface from the light wave of first light path and second light path into.
15. according to the system of claim 12, wherein the medium that will measure comprises the tissue that is placed between first reflecting surface and second reflecting surface.
16. according to the system of claim 15, wherein said tissue comprises nerve fiber.
17., comprise that further the light wave that makes from first light path focuses on vectorial first side and makes light wave from second light path focus on lens combination on vectorial second side according to the system of claim 12.
18., further comprise second compositor of light wave being guided into first polarization detector and second polarization detector according to the system of claim 1.
19., wherein be drawn towards the medium and the reference field that the second polarization component is arranged of the first polarization component from the light wave in first path according to the system of claim 1.
20., wherein be drawn towards and medium from the polarization of the light wave quadrature in first path from the light wave in second path according to the system of claim 19.
21., wherein guide the light wave of reference field and the light wave quadrature of guiding reference field from first path into into from second path according to the system of claim 20.
22. according to the system of claim 15, wherein said tissue comprises cancerous tissue.
23. according to the system of claim 12, wherein said light source comprises that low-coherence light source and optical system are right to form light pulse.
24., further comprise fiber coupler according to the system of claim 12.
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