CN101390379A - Delay circuit for readout of S/H array - Google Patents
Delay circuit for readout of S/H array Download PDFInfo
- Publication number
- CN101390379A CN101390379A CNA2007800068106A CN200780006810A CN101390379A CN 101390379 A CN101390379 A CN 101390379A CN A2007800068106 A CNA2007800068106 A CN A2007800068106A CN 200780006810 A CN200780006810 A CN 200780006810A CN 101390379 A CN101390379 A CN 101390379A
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- delay
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- delay circuit
- address
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- 238000005070 sampling Methods 0.000 claims description 22
- 230000001934 delay Effects 0.000 abstract description 2
- 239000003990 capacitor Substances 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 230000006399 behavior Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/767—Horizontal readout lines, multiplexers or registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/7795—Circuitry for generating timing or clock signals
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Pulse Circuits (AREA)
Abstract
An image sensor includes a plurality of pixels for capturing an image; a sample and hold circuit array having a plurality of units for receiving signals from the plurality of pixels representing the captured image; a decoder for selecting each of the units of the sample and hold circuit array for output; and a delay circuit that includes an adjustable time delay to the decoder for compensating for time delays.
Description
Technical field
The present invention relates generally to the cmos image sensor field, more particularly, relate to this imageing sensor that is used to proofread and correct the programmable delay circuit that the lack of balance that caused by location bus longways in column decoder output place postpones that has.
Background technology
Because the size and the speed sustainable growth of cmos image, row sampling and keep array becoming greatly, and it is shorter to read the time that is listed as the S/H circuit.Need decoder circuit to be addressed to each independent S/H circuit in this S/H array of output.By being generally the long bus of pixel column size, the Input Address code is delivered to the input of decoder.Because big resistance and electric capacity in the electric wire, when when reading row S/H gate array one by one away from the direction of decoder address driver, these decoder addresses exist increasing delay when being sent to decoder.These delays have reduced effective readout time, and produce noise at the output of row S/H array.The additional delay that reduces when reading row samplings and keeping array be added to the decoder address bus with compensation because the delay that bus dead resistance and electric capacity cause.
Therefore, needing a kind of cmos image sensor to proofread and correct in column decoder output place is postponed by the lack of balance that location bus longways causes.
Summary of the invention
The present invention is intended to overcome above-mentioned one or more problems.Brief overview according to an aspect of the present invention, the invention reside in a kind of imageing sensor, comprises a plurality of pixels that are used to catch image; Sampling and holding circuit array have be hunted down a plurality of unit of signal of image of the representative that is used to receive from these a plurality of pixels; Decoder, be used to select to sample and each unit of holding circuit array with output; And delay circuit, the adjustable time delay that is included in decoder is used for compensating time delay.
By looking back the detailed description of following preferred embodiment and claims, and with reference to accompanying drawing, these and other aspect of the present invention, purpose, feature and advantage will be by clearer understanding and evaluation.
Beneficial effect of the present invention
The present invention has the following advantages, and promptly proofreaies and correct in output place of column decoder to be postponed by the lack of balance that location bus longways causes.The present invention has also improved the effective sensor reading speed, and has reduced the mistake sampling of next stage circuit to the S/H circuit.
Description of drawings
Fig. 1 is the schematic diagram of exemplary pixels of the present invention;
Fig. 2 is the calcspar of imageing sensor of the present invention;
Fig. 3 is the calcspar of delay management circuit of the present invention;
Fig. 4 is the calcspar of programmable delay circuit of the present invention; With
Fig. 5 is the end view of digital camera of the present invention.
Embodiment
Fig. 1 shows the active image sensor pixel of typical 4-transistor CMOS.Photodiode PD gathers electric charge in response to incident light.Transistor M1 by the voltage control that puts on its grid TG will accumulate in the charge transfer of PD to unsteady diffused capacitor C when " height " at TG
FDDiffused capacitor C floats
FDWith charge conversion is voltage.When " height " voltage put on its grid RG, transistor M2 was to the diffused capacitor C that floats
FDReset.Selectable pixel output buffer amplifier is made of M3 and M4.M3 is that amplifier input transistors and M4 are that row selecting transistor is to start amplifier.The voltage of diffusion FD of floating puts on the input of pixel amplifier and the voltage that spreads FD of will floating when " height " voltage puts on the grid RS of transistor M4 is delivered to the sampling and the holding circuit array of pel array outside.
Fig. 2 shows the calcspar of cmos image sensor 10.Imageing sensor 10 comprises pel array 20, row decoder 30, row sampling and holding circuit array 40 and column decoder 50.In pel array 20, generate picture signal, and with its line by line (shown in solid arrow) be sent to row samplings and holding circuit array 40.By the delegation of sampling and 40 samplings of holding circuit array and maintenance picture signal, this sampling and holding circuit array comprise that 60, one of a plurality of unit are used for each picture element signal.Sampling and holding circuit array 40 1 next ground, unit transmit a signal to the output 70 of sampling and holding circuit array 40 from each unit 60.The particular sequence that column decoder 50 selects which signal value from sampling and holding circuit array 40 will be output to output bus 75 and output to output bus 75.Column decoder address driver 80 is used to drive the address bus of column decoder 50.In case send out delegation's signal from sampling and holding circuit array 40, another row picture signal just is moved to sampling and holding circuit array 40 from pel array 20.Repeating this process ends until all behaviors of handling a two field picture.
Fig. 3 shows programmable delay circuit 90, address synchronizer 100 and decoder address driving circuit 80.Programmable delay circuit 90 is added to time delay on the master clock.The clock delay of output changes according to the particular address of column decoder.For example, address 000 (first address) receives maximum delay, and address 111 (last address) receives delay or minimum delay zero or that be substantially zero.Address 000 expression is from the nearest sampling of driver 80 and the physical address of holding circuit 40, and address 111 expressions are from driver 80 sampling farthest and the physical address of holding circuit 40.Owing to having inherent delay when signal when the bus of column decoder 50 is advanced, therefore this delay postpones the intrinsic time that compensated decoder address bus 110 has.First address 000 will have the inherent delay that is substantially zero from bus 110, so the maximum time that it receives from delay circuit 90 postpones.The maximum intrinsic time that the address, end will have from decoder bus 110 postpones, and the minimum time that will receive from delay circuit 90 postpones.This produces equilibrium or the balanced basically delay of crossing over column decoder array 50.The output of 100 pairs of Input Address of synchronizer and programmable delay circuit 90 is carried out synchronously, will postpone to be added to the Input Address of decoder 50 thus.
With reference to the accompanying drawings 4, show the detailed maps of delay circuit 90.Delay circuit 90 comprises a plurality of delay cells 120 with identical time delay.Multiplexer (multiplexer) 130 is connected to the output of delay cell 120, is used to select an output of delay cell 120.This output is corresponding to needed time delay.For example, output D0 comprises zero delay cells, and output D1 comprises a delay cell, and output DK comprises K delay cell.Particular address determine multiplexer 130 selected which output to described output.
With reference to the accompanying drawings 5, show and have the digital camera 140 that is included in imageing sensor of the present invention 10 wherein, be used to illustrate the typical commercial embodiment (end user's product) of ordinary consumer custom.
List of parts
10 imageing sensors
20 pel arrays
30 row decoders
40 row sampling and holding circuit arrays
50 column decoders
70 outputs
75 output buss
80 decoder address driver
90 programmable delay circuits
100 address synchronizer
110 address buss
120 delay cells
130 multiplexers
140 digital cameras
Claims (10)
1. imageing sensor comprises:
(a) be used to catch a plurality of pixels of image;
(b) sampling and holding circuit array have be hunted down a plurality of unit of signal of image of the representative that is used to receive from described a plurality of pixels;
(c) decoder is used to select each unit of this sampling and holding circuit array to be used for output; And
(d) delay circuit, the adjustable time delay that is included in decoder is used for compensating time delay.
2. imageing sensor as claimed in claim 1, wherein this decoder comprises from a plurality of element addresses of 1 to N serial number, and wherein adjustable delay reduces along with the increase of element address.
3. imageing sensor as claimed in claim 1, wherein adjustable delay circuit comprises a plurality of delay cells and the one or more multiplexer that is used for according to decoder address choice delay cell.
4. imageing sensor as claimed in claim 1, wherein this delay circuit is a programmable delay circuit.
5. imageing sensor as claimed in claim 1 further comprises synchronizer, is used for output of this delay circuit synchronously and the address input of arriving this decoder.
6. a camera comprises imageing sensor, and this imageing sensor comprises:
(a) be used to catch a plurality of pixels of image;
(b) sampling and holding circuit array have be hunted down a plurality of unit of signal of image of the representative that is used to receive from described a plurality of pixels;
(c) decoder is used to select each unit of this sampling and holding circuit array to be used for output; And
(d) delay circuit, the adjustable time delay that is included in decoder is used for compensating time delay.
7. camera as claimed in claim 6, wherein this decoder comprises from a plurality of element addresses of 1 to N serial number, and wherein adjustable delay reduces along with the increase of element address.
8. camera as claimed in claim 6, wherein adjustable delay circuit comprises a plurality of delay cells and the one or more multiplexer that is used for according to decoder address choice delay cell.
9. camera as claimed in claim 6, wherein this delay circuit is a programmable delay circuit.
10. camera as claimed in claim 6 further comprises synchronizer, is used for output of this delay circuit synchronously and the address input of arriving this decoder.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/363,130 US7593050B2 (en) | 2006-02-27 | 2006-02-27 | Delay management circuit for reading out large S/H arrays |
| US11/363,130 | 2006-02-27 | ||
| PCT/US2007/003880 WO2007100498A1 (en) | 2006-02-27 | 2007-02-14 | Delay circuit for reading out s/h arrays |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101390379A true CN101390379A (en) | 2009-03-18 |
| CN101390379B CN101390379B (en) | 2011-10-19 |
Family
ID=38068735
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007800068106A Active CN101390379B (en) | 2006-02-27 | 2007-02-14 | Delay circuit for reading out s/h arrays |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7593050B2 (en) |
| EP (1) | EP1989875B1 (en) |
| JP (1) | JP4917616B2 (en) |
| KR (1) | KR101332073B1 (en) |
| CN (1) | CN101390379B (en) |
| TW (1) | TWI395474B (en) |
| WO (1) | WO2007100498A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105847714A (en) * | 2016-05-24 | 2016-08-10 | 中国科学院长春光学精密机械与物理研究所 | Delayed correction system for input image data of CMOS |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7667746B2 (en) * | 2006-07-11 | 2010-02-23 | Aptina Imaging Corporation | Method and apparatus for programmably setting a sampling delay in an image sensor device |
| JP5458582B2 (en) * | 2009-01-28 | 2014-04-02 | ソニー株式会社 | Solid-state imaging device, driving method of solid-state imaging device, and electronic apparatus |
| JP2015029259A (en) | 2013-07-03 | 2015-02-12 | キヤノン株式会社 | IMAGING DEVICE, IMAGING SYSTEM, SENSOR, AND OPERATION METHOD OF IMAGING DEVICE |
| US11657010B2 (en) | 2018-08-22 | 2023-05-23 | Google Llc | Dynamic timing calibration systems and methods |
| US11622087B2 (en) * | 2021-02-04 | 2023-04-04 | Omnivision Technologies, Inc. | Image sensor with in-pixel background subtraction and motion detection |
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| US4833695A (en) * | 1987-09-08 | 1989-05-23 | Tektronix, Inc. | Apparatus for skew compensating signals |
| JPH01161912A (en) * | 1987-12-18 | 1989-06-26 | Toshiba Corp | Semiconductor integrated circuit |
| JPH0271684A (en) * | 1988-09-06 | 1990-03-12 | Mitsubishi Electric Corp | Solid-state imaging device drive device |
| JPH0358673A (en) * | 1989-07-27 | 1991-03-13 | Canon Inc | Picture processing device |
| JP2773324B2 (en) * | 1989-11-27 | 1998-07-09 | ソニー株式会社 | Imaging device |
| JP3378667B2 (en) * | 1994-08-10 | 2003-02-17 | 株式会社アドバンテスト | Variable delay circuit for periodic clock |
| JP3319905B2 (en) * | 1995-03-24 | 2002-09-03 | 株式会社モリタ製作所 | Digital X-ray equipment |
| US6201573B1 (en) * | 1995-11-13 | 2001-03-13 | Hamamatsu Photonics K. K. | Solid state imaging apparatus for imaging a two dimensional optical image having a number of integration circuits |
| KR970072990A (en) * | 1996-04-10 | 1997-11-07 | 이데이 노부유끼 | Solid state imager |
| US6222175B1 (en) * | 1998-03-10 | 2001-04-24 | Photobit Corporation | Charge-domain analog readout for an image sensor |
| US6421085B1 (en) * | 1998-04-14 | 2002-07-16 | Eastman Kodak Company | High speed CMOS imager column CDS circuit |
| US6130423A (en) * | 1998-07-10 | 2000-10-10 | Pixel Cam, Inc. | Method and apparatus for a CMOS image sensor with a distributed amplifier |
| US6809767B1 (en) * | 1999-03-16 | 2004-10-26 | Kozlowski Lester J | Low-noise CMOS active pixel sensor for imaging arrays with high speed global or row reset |
| KR20020003929A (en) * | 2000-06-27 | 2002-01-16 | 김달수 | Amplifier capable of adjusting input node precharge voltage level and sample-and-hold circuit having the same |
| KR100400311B1 (en) | 2001-06-29 | 2003-10-01 | 주식회사 하이닉스반도체 | Signal delay control device of semiconductor memory device |
| JP2003259133A (en) * | 2002-03-05 | 2003-09-12 | Fuji Xerox Co Ltd | Image reading device |
| JP4655500B2 (en) * | 2004-04-12 | 2011-03-23 | ソニー株式会社 | AD converter, semiconductor device for detecting physical quantity distribution, and electronic apparatus |
| US7385636B2 (en) * | 2004-04-30 | 2008-06-10 | Eastman Kodak Company | Low noise sample and hold circuit for image sensors |
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2006
- 2006-02-27 US US11/363,130 patent/US7593050B2/en active Active
-
2007
- 2007-02-14 EP EP07750701.0A patent/EP1989875B1/en active Active
- 2007-02-14 KR KR1020087020843A patent/KR101332073B1/en active Active
- 2007-02-14 JP JP2008556353A patent/JP4917616B2/en active Active
- 2007-02-14 CN CN2007800068106A patent/CN101390379B/en active Active
- 2007-02-14 WO PCT/US2007/003880 patent/WO2007100498A1/en active Application Filing
- 2007-02-26 TW TW096106345A patent/TWI395474B/en active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105847714A (en) * | 2016-05-24 | 2016-08-10 | 中国科学院长春光学精密机械与物理研究所 | Delayed correction system for input image data of CMOS |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4917616B2 (en) | 2012-04-18 |
| TWI395474B (en) | 2013-05-01 |
| KR101332073B1 (en) | 2013-11-22 |
| EP1989875A1 (en) | 2008-11-12 |
| US7593050B2 (en) | 2009-09-22 |
| CN101390379B (en) | 2011-10-19 |
| KR20080113354A (en) | 2008-12-30 |
| TW200808049A (en) | 2008-02-01 |
| US20070200942A1 (en) | 2007-08-30 |
| WO2007100498A1 (en) | 2007-09-07 |
| EP1989875B1 (en) | 2014-07-30 |
| JP2009528721A (en) | 2009-08-06 |
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Owner name: FULL VISION TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: EASTMAN KODAK COMPANY (US) 343 STATE STREET, ROCHESTER, NEW YORK Effective date: 20110706 |
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