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CN101850942B - Micro-Electro-Mechanical System Package Structure - Google Patents

Micro-Electro-Mechanical System Package Structure Download PDF

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Publication number
CN101850942B
CN101850942B CN2009101340705A CN200910134070A CN101850942B CN 101850942 B CN101850942 B CN 101850942B CN 2009101340705 A CN2009101340705 A CN 2009101340705A CN 200910134070 A CN200910134070 A CN 200910134070A CN 101850942 B CN101850942 B CN 101850942B
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chip
packaging structure
moisture
substrate
lid
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CN101850942A (en
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洪立群
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Advanced Semiconductor Engineering Inc
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Advanced Semiconductor Engineering Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
    • H01L2224/8592Applying permanent coating, e.g. protective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/162Disposition
    • H01L2924/16235Connecting to a semiconductor or solid-state bodies, i.e. cap-to-chip

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Abstract

The invention discloses a micro electro mechanical system packaging structure which comprises a chip, a cover body, a substrate, a plurality of wires, a sealing colloid and a moisture-resistant material layer. The chip is provided with an active area, and the chip is provided with at least one micro-electromechanical element in the active area. The cover body covers the chip, and the substrate is used for bearing the chip and the cover body. The plurality of wires are electrically connected between the substrate and the chip, and the sealing colloid is sealed around the cover body and exposes the upper surface of the cover body. The moisture-resistant material layer covers the sealing colloid to improve the sealing property and the moisture resistance of the sealing colloid.

Description

微机电系统封装结构Micro-Electro-Mechanical System Package Structure

【技术领域】【Technical field】

本发明涉及一种芯片封装结构,且特别是涉及一种微机电系统封装结构。The present invention relates to a chip packaging structure, and in particular to a micro-electromechanical system packaging structure.

【背景技术】【Background technique】

微机电系统(MEMS)是在微小化的封装结构中所制作的微型电子机械元件,其制造的技术十分类似于制造积体电路的技术,但MEMS装置与其周遭环境互动的方式则多于传统的积体电路,例如力学、光学或磁力上的互动。Micro-Electro-Mechanical Systems (MEMS) are tiny electro-mechanical components manufactured in miniaturized packages. The manufacturing technology is very similar to the technology of manufacturing integrated circuits, but MEMS devices interact with their surroundings in more ways than traditional Integrated circuits, such as mechanical, optical or magnetic interactions.

MEMS装置可包括极小的电子机械元件(例如开关、镜面、电容器、加速度计、感应器、电容感测器或引动器等),而MEMS装置可以单块方式与积体电路整合,同时大幅改善整个固态装置的插入损耗及电隔离效果。然而,MEMS装置在整个封装结构的巨观世界中是极微脆弱的,随时都可能被微小的静电或表面张力影响而造成故障。也因此,为了避免MEMS装置受到污染或损害,通常将其微机电元件密封于晶圆与盖板之间的一空腔中。MEMS devices can include extremely small electromechanical components (such as switches, mirrors, capacitors, accelerometers, inductors, capacitive sensors or actuators, etc.), and MEMS devices can be integrated with integrated circuits in a monolithic manner, while greatly improving Insertion loss and electrical isolation of the entire solid-state device. However, MEMS devices are extremely fragile in the macroscopic world of the entire packaging structure, and may be affected by tiny static electricity or surface tension at any time to cause failure. Therefore, in order to prevent the MEMS device from being polluted or damaged, its MEMS components are usually sealed in a cavity between the wafer and the cover plate.

图1是现有的一种微机电系统封装结构的示意图。请参照图1,将盖板110以胶框112固定于晶圆100上,以使微机电元件104密封于晶圆100与盖板110之间的一空腔106中。接着,将晶圆100以及盖板110切割为各个独立单元,以使微机电元件104密封在各个独立的MEMS结构中。由于微机电元件104被保护在空腔106中,因而确保微机电元件104能正常地作动。接着,再将各个MEMS结构以封胶体(图未示)密封,以完成微机电系统封装结构。FIG. 1 is a schematic diagram of a conventional MEMS packaging structure. Referring to FIG. 1 , the cover plate 110 is fixed on the wafer 100 by the glue frame 112 , so that the MEMS element 104 is sealed in a cavity 106 between the wafer 100 and the cover plate 110 . Next, the wafer 100 and the cover plate 110 are cut into individual units, so that the MEMS elements 104 are sealed in each independent MEMS structure. Since the MEMS element 104 is protected in the cavity 106 , it is ensured that the MEMS element 104 can operate normally. Next, each MEMS structure is sealed with an encapsulant (not shown in the figure) to complete the micro-electro-mechanical system packaging structure.

然而,现有以有机高分子化合物做为胶框112或封胶体时,无法完全隔绝湿气。长时间下来,胶框112或封胶体的密封性变差,因而影响微机电元件104的正常作动。However, conventionally, when an organic polymer compound is used as the plastic frame 112 or the sealing body, the moisture cannot be completely isolated. Over a long period of time, the sealability of the plastic frame 112 or the sealing body becomes poor, thereby affecting the normal operation of the MEMS element 104 .

因此,有必要提供一种微机电系统封装结构,以解决现有技术所存在的问题。Therefore, it is necessary to provide a MEMS packaging structure to solve the problems existing in the prior art.

【发明内容】【Content of invention】

本发明的主要目的是提供一种微机电系统封装结构,其通过抗湿气材料来提高封胶体的密封性及抗湿气性。The main purpose of the present invention is to provide a micro-electro-mechanical system packaging structure, which improves the sealing performance and moisture resistance of the encapsulant through the anti-moisture material.

达上述目的,本发明提供一种微机电系统封装结构,其包括一芯片、一盖体、一基板、多条导线、一封胶体以及一抗湿气材料层(moisture resistivelayer)。芯片具有一作用区,而芯片于作用区设有至少一微机电元件。盖体覆盖于芯片上,而基板用以承载芯片以及盖体。多条导线电性连接基板与芯片之间。封胶体密封于盖体的周围,并显露盖体的上表面。抗湿气材料层覆盖于封胶体上,以提高封胶体的密封性及抗湿气性。To achieve the above purpose, the present invention provides a micro-electro-mechanical system packaging structure, which includes a chip, a cover, a substrate, a plurality of wires, encapsulant, and a moisture resistant layer. The chip has an active area, and the chip is provided with at least one micro-electromechanical element in the active area. The cover covers the chip, and the substrate is used for carrying the chip and the cover. A plurality of wires are electrically connected between the substrate and the chip. The sealant is sealed around the cover and exposes the upper surface of the cover. The anti-moisture material layer covers the sealing body to improve the sealing performance and moisture resistance of the sealing body.

相较于现有技术,本发明的微机电系统封装结构,通过抗湿气材料,确实可以提高封胶体的密封性及抗湿气性。Compared with the prior art, the MEMS packaging structure of the present invention can indeed improve the sealing performance and moisture resistance of the encapsulant through the anti-moisture material.

【附图说明】【Description of drawings】

图1:现有的一种微机电系统封装结构的示意图。Figure 1: A schematic diagram of an existing MEMS packaging structure.

图2:本发明一实施例的微机电系统封装结构的示意图。Fig. 2: A schematic diagram of a MEMS packaging structure according to an embodiment of the present invention.

图3:本发明另一实施例的微机电系统封装结构的示意图。Fig. 3: A schematic diagram of a MEMS package structure according to another embodiment of the present invention.

【具体实施方式】【Detailed ways】

为让本发明上述目的、特征及优点更明显易懂,下文特举本发明较佳实施例,并配合附图,作详细说明如下:In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and understandable, the preferred embodiments of the present invention will be specifically cited below, together with the accompanying drawings, for a detailed description as follows:

请参照图2是本发明一实施例的微机电系统封装结构的示意图,图3是本发明另一实施例的微机电系统封装结构的示意图。Please refer to FIG. 2 , which is a schematic diagram of a MEMS packaging structure according to an embodiment of the present invention, and FIG. 3 is a schematic diagram of a MEMS packaging structure according to another embodiment of the present invention.

微机电系统封装结构包括一芯片200、一盖体210、一基板220、多条导线230、一封胶体240以及一抗湿气材料层(moisture resistive layer)250。芯片200具有一作用区202,而芯片200于作用区202设有至少一微机电元件204。盖体210覆盖于芯片200上,且盖体210具有一上表面212。基板220用以承载芯片200以及盖体210。多条导线230电性连接基板220与芯片200之间。封胶体240密封于盖体210的周围,并显露盖体210的上表面212。抗湿气材料层250覆盖于封胶体240上。芯片200例如是电荷耦合元件(CCD)或互补金属氧化半导体(CMOS)之类的光感测芯片,而作用区202例如是光感测区。The MEMS packaging structure includes a chip 200 , a cover 210 , a substrate 220 , a plurality of wires 230 , encapsulant 240 and a moisture resistant layer 250 . The chip 200 has an active area 202 , and the chip 200 is provided with at least one MEMS device 204 in the active area 202 . The cover 210 covers the chip 200 , and the cover 210 has an upper surface 212 . The substrate 220 is used to carry the chip 200 and the cover 210 . A plurality of wires 230 are electrically connected between the substrate 220 and the chip 200 . The encapsulant 240 is sealed around the cover 210 and exposes the upper surface 212 of the cover 210 . The anti-moisture material layer 250 covers the encapsulant 240 . The chip 200 is, for example, a charge-coupled device (CCD) or a complementary metal oxide semiconductor (CMOS) photo-sensing chip, and the active area 202 is, for example, a photo-sensing area.

请参照图2,在本实施例中,将盖体210(例如是玻璃基板)以胶框214与其上方的金属环(例如是铜环,如斜线部分)固定于晶圆(图未示)上,以使微机电元件204密封于晶圆与盖体210之间的各个空腔206中。接着,将晶圆以及盖体210切割为各个独立单元,以使微机电元件204密封在各个独立的MEMS结构中。接着,将此MEMS结构配置于基板220上,并以打线接合的多条导线240电性连接于基板220与芯片200之间。接着,以点胶的方式将封胶体240密封于盖体210的周围,并显露盖体210的上表面212,以使光感测芯片的光感测区能接收穿透盖体210的光线,以进行后续的影像处理。Please refer to FIG. 2, in this embodiment, the cover body 210 (such as a glass substrate) is fixed to the wafer (not shown) by a plastic frame 214 and a metal ring (such as a copper ring, such as the hatched part) above it. , so that the MEMS components 204 are sealed in each cavity 206 between the wafer and the cover 210 . Next, the wafer and the cover body 210 are cut into individual units, so that the MEMS element 204 is sealed in each independent MEMS structure. Then, the MEMS structure is disposed on the substrate 220 , and electrically connected between the substrate 220 and the chip 200 by a plurality of wires 240 bonded by wires. Next, seal the encapsulant 240 around the cover 210 by dispensing glue, and expose the upper surface 212 of the cover 210, so that the light sensing area of the light sensing chip can receive the light penetrating the cover 210, for subsequent image processing.

值得注意的是,封胶体240为有机高分子化合物,例如是环氧树脂,由于有机化合物的分子结构中亲水性基团多,仅能阻挡外在的污染及部分湿气,但无法完全阻隔亲水性基团与湿气作用。因此,本发明以化学气相沉积或物理气相沉积技术形成一抗湿气材料层250,其覆盖于封胶体240上,以有效地阻隔封胶体240的亲水性基团与湿气作用。这样,微机电元件204能正常地作动于此微机电系统封装结构260a中。It is worth noting that the encapsulant 240 is an organic polymer compound, such as epoxy resin. Since the molecular structure of the organic compound has many hydrophilic groups, it can only block external pollution and some moisture, but cannot completely block Hydrophilic groups interact with moisture. Therefore, the present invention uses chemical vapor deposition or physical vapor deposition to form a moisture-resistant material layer 250 covering the encapsulant 240 to effectively block the interaction between the hydrophilic groups of the encapsulant 240 and moisture. In this way, the MEMS device 204 can normally operate in the MEMS package structure 260a.

在本实施例中,抗湿气材料层250的材质为密致性较高的无机绝缘材料,例如是氧化硅、氮化硅、氮氧化硅或其他不含亲水性基团的氮化物、氧化物及氮氧化物,其抗湿气能力大于封胶体240的抗湿气能力。也就是说,由于无机绝缘材料不含亲水性基团,因而不与湿气作用,所以能有效地阻绝湿气。长时间下来,胶框214或封胶体240的密封性不会改变。In this embodiment, the material of the anti-moisture material layer 250 is an inorganic insulating material with high density, such as silicon oxide, silicon nitride, silicon oxynitride or other nitrides without hydrophilic groups, Oxide and nitrogen oxide have a moisture resistance greater than that of the sealing body 240 . That is, since the inorganic insulating material does not contain a hydrophilic group, it does not interact with moisture, so it can effectively block moisture. Over a long period of time, the sealability of the plastic frame 214 or the sealing body 240 will not change.

在下一实施例中,同样以抗湿气材料层250覆盖于封胶体240上,仅有部分结构稍作改变,其中盖体210例如是透明基板或不透明的硅基板,请参照下列的说明。In the next embodiment, the anti-moisture material layer 250 is also used to cover the encapsulant 240 , with only some changes in the structure. The cover 210 is, for example, a transparent substrate or an opaque silicon substrate. Please refer to the following description.

请参照图3,在本实施例中,先将芯片200的背面贴附于基板220上,并以打线接合的多条导线230电性连接于基板220与芯片200之间。接着,将盖体210以胶框214与其上方的金属环(斜线部分)固定于基板220上,以使配置有微机电元件204的芯片200与多条导线230密封于基板220与盖体210之间的空腔206中。接着,以点胶的方式将封胶体240密封于盖体210的周围,并显露盖体210的上表面212。这样,微机电元件204能正常地作动于此微机电系统封装结构260b。Please refer to FIG. 3 , in this embodiment, the back surface of the chip 200 is first attached to the substrate 220 , and a plurality of wires 230 electrically connected between the substrate 220 and the chip 200 by wire bonding. Next, the cover 210 is fixed on the substrate 220 with the plastic frame 214 and the metal ring (hatched part) above it, so that the chip 200 configured with the micro-electromechanical element 204 and the plurality of wires 230 are sealed between the substrate 220 and the cover 210 In the cavity 206 between. Next, the encapsulant 240 is sealed around the cover 210 by dispensing glue, and the upper surface 212 of the cover 210 is exposed. In this way, the MEMS device 204 can normally operate on the MEMS package structure 260b.

在上述二实施例中,本发明的微机电封装结构先以封胶体(有机高分子材料)进行第一层的密封步骤,再以另一层密致度较高的抗湿气材料(无机绝缘材料)进行第二层的防湿气步骤,以覆盖于有机高分子材料上。因此,诸如开关、镜面、电容器、加速度计、感应器、电容感测器或引动器等微机电元件都可密封于空腔内,以避免外界的污染及湿气,所以能有效提高操作的可靠度。In the above two embodiments, the micro-electromechanical packaging structure of the present invention first uses the encapsulant (organic polymer material) to perform the sealing step of the first layer, and then uses another layer of high-density moisture-resistant material (inorganic insulating material) material) to carry out the moisture-proof step of the second layer to cover the organic polymer material. Therefore, MEMS components such as switches, mirrors, capacitors, accelerometers, inductors, capacitive sensors or actuators can be sealed in the cavity to avoid external pollution and moisture, so it can effectively improve the reliability of operation Spend.

Claims (5)

1. micro electromechanical system packaging structure, it is characterized in that: said micro electromechanical system packaging structure comprises:
One chip have an active region, and said chip is provided with at least one microcomputer electric component in said active region;
One lid is covered on the said chip, and said lid has a upper surface;
One substrate is in order to carry said chip and said lid;
Many leads electrically connect between said substrate and the said chip;
An one glue frame and a becket, said becket are above said glue frame, and said glue frame and said becket are connected between said chip and the said lid to form a cavity, and said microcomputer electric component is sealed in the said cavity;
One adhesive body is high-molecular organic material, be sealed in said lid around, and appear said upper surface; And
One moisture-resistant gas material layer for the inorganic insulating material of moisture-resistant gas ability greater than said adhesive body, is covered on the said adhesive body.
2. micro electromechanical system packaging structure as claimed in claim 1 is characterized in that: the material of said adhesive body is an epoxy resin.
3. micro electromechanical system packaging structure as claimed in claim 1 is characterized in that: the material of said moisture-resistant gas material layer is silica, silicon nitride or silicon oxynitride.
4. micro electromechanical system packaging structure as claimed in claim 1 is characterized in that: said chip is an optical sensing chip, and said active region is an optical sensing area.
5. micro electromechanical system packaging structure as claimed in claim 1 is characterized in that: said lid comprises transparent substrates or non-transparent substrates.
CN2009101340705A 2009-03-31 2009-03-31 Micro-Electro-Mechanical System Package Structure Active CN101850942B (en)

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CN102976262B (en) * 2012-11-28 2015-05-20 江苏物联网研究发展中心 Optically-measurable MEMS (Micro-electromechanical System) encapsulating structure provided with sealing cap electrode
US9359190B2 (en) * 2014-06-30 2016-06-07 Himax Display, Inc. MEMS package structure and method for fabricating the same
TWI605010B (en) * 2015-06-18 2017-11-11 立景光電股份有限公司 Mems package structure and manufacturing method thereof
TWI640073B (en) * 2017-08-16 2018-11-01 勝麗國際股份有限公司 Sensor package structure
JP7023724B2 (en) * 2018-01-24 2022-02-22 京セラ株式会社 Package and electronics
TWI693382B (en) 2019-01-24 2020-05-11 中光電智能感測股份有限公司 Force sensor
CN111473893B (en) * 2019-01-24 2022-03-29 中光电智能感测股份有限公司 Force sensor

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