CN101923505A - Test system and test method for Peripheral Component Interconnect (PCI) fast slot - Google Patents

Abstract

The invention discloses a test system and a test method of a peripheral component interconnect express slot, wherein the test system comprises: the peripheral component interconnect express pin interface, the peripheral component interconnect express slot interface, the processing module, the data transmission module and the power supply module. The peripheral component interconnect fast pin interface is used for connecting the mainboard; the peripheral component interconnection quick slot interface is used for connecting a board to be tested; the processing module carries out a mainboard test program through the peripheral component interconnection quick pin interface; the data transmission module is switched to different data transmission modes to provide the data transmission mode corresponding to the mainboard according to the mainboard test program, and further to enable the mainboard and the board to be tested to carry out the test program of the board to be tested; and the power module is used for supplying or cutting off the power supply of the board to be tested so as to provide hot plugging function.

Description

Test system and test method for peripheral component interconnection fast slot

technical field

The present invention relates to a testing system for a peripheral component interconnect express, and in particular to a testing system and a testing method for a peripheral component interconnect express.

Background technique

Peripheral component interconnection fast interface is a widely used computer data transmission interface. Common motherboards in the market are often provided with such interfaces for data transmission. However, in the test of the fast interface for interconnecting peripheral components, the manufacturer needs to test the main board and the function card with the fast interface for interconnecting peripheral components, such as a network card, a display card or a sound card, respectively, and cannot test the main board and the fast interface of the peripheral component at the same time. The function card is tested in both directions. Moreover, when the function card is tested, if the function card is to be replaced, the power supply of the motherboard must be cut off before the replacement can be performed, so as to avoid serious hardware errors in the system. Such a testing process is very time-consuming and inconvenient.

Therefore, how to design a new test system and test method for interconnecting fast slots of peripheral components can test the main board and the function card at the same time, and provide a function card that can be replaced without cutting off the power supply of the main board to continue The testing mechanism is an urgent problem for the industry.

Contents of the invention

Therefore, the purpose of the present invention is to provide a kind of test system and test method of quick slot interconnection of peripheral components, can test motherboard and function card at the same time, and provide a function card that can be replaced without cutting off the power supply of the motherboard. to continue the testing mechanism.

In order to achieve the above object, the present invention provides a test system for a peripheral component interconnection quick slot, comprising: a peripheral component interconnection quick pin interface, a peripheral component interconnection quick slot interface, a processing module, a data transmission module and a power supply module . The peripheral component interconnection quick pin interface is used to connect the motherboard; the peripheral component interconnection quick slot interface is used to connect the board to be tested; the processing module is used to perform the motherboard test on the motherboard through the peripheral component interconnection quick pin interface program; the data transmission module is used to switch between different data transmission modes, so as to provide the data transmission mode corresponding to the motherboard according to the motherboard test program, so as to further interconnect the fast pin interface and the peripheral component interconnection fast slot interface through the peripheral components The test program of the board under test is carried out between the main board and the board under test; and the power supply module is used to supply or cut off the power supply of the board under test when the board under test is connected to the fast slot interface of the peripheral component interconnection, so as to provide hot plug pulling effect.

In order to achieve the above object, the present invention also provides a method for testing a peripheral component interconnection quick slot, comprising the following steps: providing a test system for a peripheral component interconnection quick slot, including a peripheral component interconnection quick pin interface and a peripheral component The interconnection fast slot interface is used to connect the motherboard and the board to be tested respectively; the motherboard test program is performed on the motherboard; the power supply of the board to be tested is supplied; the data transmission mode of the corresponding motherboard is switched according to the motherboard test program; Transmission mode, through the peripheral component interconnection fast pin interface and the peripheral component interconnection fast slot interface, the test program of the board under test is carried out between the main board and the board under test; and the hot plug function of the board under test is provided for After the board test is completed, when the main board is powered off, cut off the power supply of the board to be tested, so as to directly remove the board to be tested.

The advantage of applying the present invention is that the same test system can be used to test both the mainboard and the board to be tested through the test program of the mainboard and the test program of the board to be tested, and provide a hot-swapping mechanism without disconnecting the mainboard. In the case of electricity, directly replace the board to be tested to test other boards to be tested, so as to easily achieve the above purpose.

Description of drawings

In order to make the above and other objects, features, advantages and embodiments of the present invention more comprehensible, the accompanying drawings are described as follows:

Fig. 1 is the block diagram of the test system of the quick socket of peripheral component interconnection of an embodiment of the present invention;

Fig. 2 is the perspective view of the test system of an embodiment of the present invention, main board and board under test joint; And

FIG. 3 is a flowchart of a testing method for a peripheral component interconnect express slot according to another embodiment of the present invention.

[Description of main component symbols]

10: Test system 100: Peripheral component interconnection fast pin interface

101: Power supply 104: Processing module

102: Peripheral component interconnection fast slot interface 106: Data transmission module

108: Power module 110: Serial electrical erasable read-only memory

12: Motherboard 121: Test data

120: Express slot interface for interconnection of peripheral components of the motherboard 14: Board to be tested

140: Quick pin interface for interconnection of peripheral components of the board to be tested 141: Test results

Detailed ways

Please refer to FIG. 1 , which is a block diagram of a test system 10 for a peripheral component interconnect express socket according to an embodiment of the present invention. The testing system 10 includes: a peripheral component interconnection quick pin interface 100 , a peripheral component interconnection quick slot interface 102 , a processing module 104 , a data transmission module 106 and a power supply module 108 . The peripheral component interconnection quick pin interface 100 is used for connecting the motherboard 12 , and the peripheral component interconnection quick socket interface 102 is used for connecting the board under test 14 . It should be noted that the motherboard 12 substantially also includes the peripheral component interconnection quick slot interface 120 of the motherboard, and the board under test 14 also includes the peripheral component interconnection quick pin interface 140 of the board under test. Therefore, the peripheral component interconnection quick pin interface 100 of the test system 10 is connected to the motherboard peripheral component interconnection quick slot interface 120 of the motherboard 12, and the peripheral component interconnection quick slot interface 102 of the test system 10 is connected to the The board peripheral components under test of board 14 are interconnected with quick pin interface 140 .

Please also refer to Figure 2. FIG. 2 is a perspective view of the connection of the test system 10 , the main board 12 and the board under test 14 according to an embodiment of the present invention. In this embodiment, the test system 10 is a test board, which forms a three-layer structure after connecting the main board 12 and the board under test 14 .

Please continue to refer to Figure 1. The processing module 104 is used for performing a motherboard test program on the motherboard 12 through the peripheral component interconnection quick pin interface 100 . The motherboard test program essentially includes a hot-plug test, a bus width test, a bus speed test, and a power supply test. The connection test is used to confirm that a substantial connection has been established between the PII quick pin interface 100 of the testing system 10 and the MPI quick slot interface 120 of the motherboard 12 . The bus width test and the bus speed test are used to test the transmission bandwidth and transmission speed of the motherboard peripheral components interconnection express slot interface 120 of the motherboard 12 . The power test is used to test whether the power supply of the motherboard 12 is normal. The above-mentioned tests are all necessary tests for the pins on the motherboard peripheral component interconnection quick slot interface 120 of the motherboard 12 to ensure normal operation of both data transmission and power supply.

In other embodiments, in response to other functions, the user can also add functions such as system management bus (system management bus; SM bus), data transmission pressure, programming and remote wake-up when setting the test system 10. The test to make the motherboard test program for each pin more complete. Wherein the system management bus test is used to test other modules with known addresses on the main board 12, and the data transmission stress test is used to test the fast slot interface 120 of the main board peripheral component interconnection after continuous and a large amount of data transmission. whether it still works properly. In one embodiment, the test system 10 also includes a serial electrical erasable read-only memory (Electrically Erasable Programmable Read Only Memory; EEPROM) 110, and the burning test is used for the serial electrical erasable read-only memory. The memory 110 performs a test of the programming operation. The remote wake-up test is used to test the wake-up action of the motherboard 12 through network packets (not shown).

The data transmission module 106 is used for switching between different data transmission modes, so as to provide a data transmission mode corresponding to the motherboard 12 according to the motherboard test program. In one embodiment, the data transmission modes may include Gen1x4, Gen1x8, Gen1x16, Gen2x4, Gen2x8, and Gen2x16. After the aforementioned main board test program is completed, the processing module 104 can know the data transmission speed and width of the main board peripheral component interconnection fast slot interface 120, and can further make the data transmission module 106 switch to the corresponding main board 12. The data transmission mode of the motherboard peripheral component interconnection fast slot interface 120 . After determining the data transmission mode, the test system 10 can further pass the peripheral component interconnection fast pin interface 100 and the peripheral component interconnection fast slot interface 102, so that the motherboard 12 and the board under test 14 can be tested for the board under test. program.

The test program of the board under test includes system management bus test, burning test, bus width test, bus speed test and board function test. The bus width and bus speed tests are used to test the data transmission width and speed of the fast pin interface 140 for interconnecting the peripheral components of the board to be tested. The system management bus test is used to test other modules with known addresses on the board 14 to be tested. The board 14 to be tested may also include a serial electrical erasable read-only memory (not shown) in one embodiment, and the burning test is used to test the serial electrical erasable read-only memory on the board 14 Read the memory to test the burning action. The function of the board to be tested is essentially different functional tests for different boards to be tested. For example, the board under test 14 can be a display card, a sound card or a network card. Therefore, the function test of the board under test can be performed according to the above-mentioned different types, such as display test, sound effect play test or network transmission test, and so on. Wherein, the test data 121 for carrying out the test program of the board to be tested is transmitted to The board to be tested 14. The test result 141 generated by the test program of the board under test is transmitted from the board under test 14 to the motherboard 12 via the peripheral component interconnection quick slot interface 102 , the data transmission module 106 and the peripheral component interconnection quick pin interface 104 .

The power module 108 is used to supply or cut off the power supply 101 of the board under test 14 when the board under test 14 is connected to the peripheral component interconnection quick slot interface 102 , so as to provide a hot swap function. Therefore, when the power supply of the motherboard 12 is maintained, through the setting of the power module 108 , the power of the board under test 14 can be directly cut off to remove the board under test, and the next board under test can be tested after replacement. Such a design method will avoid serious hardware errors caused by directly removing the board under test when the main board is not powered off. Compared with the previous testing process where the power of the motherboard must be turned off to proceed with other boards to be tested, it will be an advantage of saving time and effort.

FIG. 3 is a flowchart of a testing method for a peripheral component interconnect express slot according to another embodiment of the present invention. Please refer to Fig. 3, the test method of the peripheral component interconnection express slot comprises the following steps: in step 301, the test system of the peripheral component interconnection express slot is provided, comprising the peripheral component interconnection express pin interface and the peripheral component interconnection express socket The slot interface is used to connect the main board and the board under test respectively. Then in step 302, a motherboard test procedure is performed on the motherboard. In step 303, power is supplied to the board under test. It should be noted that step 303 is not limited to be performed after step 302 , but can directly start supplying power after the board under test is connected to the peripheral component interconnection express slot of the test system. Then in step 304, switch to the data transmission mode of the corresponding motherboard according to the motherboard testing program. According to the data transmission mode, step 305 can be carried out, and the board test program is carried out between the motherboard and the board to be tested through the peripheral component interconnection fast pin interface and the peripheral component interconnection fast slot interface; finally in step 306, the test system Provide the function of hot-swapping of the board under test, so that after the test of the board is completed, when the power supply of the main board is cut off, the power of the board under test is cut off, so that the board under test can be removed directly.

The advantage of applying the present invention is that the same test system can be used to test both the mainboard and the board to be tested through the test program of the mainboard and the test program of the board to be tested, and provide a hot-swapping mechanism without disconnecting the mainboard. In the case of power failure, directly replace the board to be tested to test other boards to be tested.

Although the present invention has been disclosed above in terms of implementation, it is not intended to limit the present invention. Any person familiar with this technology can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, this The protection scope of the invention should be determined by the scope defined in the claims.

Claims (10)

1. the test macro of a peripheral component interconnection rapid slot is characterized in that, comprises:

The quick pin interface of one periphery component interconnection is in order to connect a motherboard;

One peripheral component interconnection rapid slot interface is in order to connect a board under test;

One processing module is in order to carry out the host board testing program to this motherboard by the quick pin interface of this periphery component interconnection;

One data transmission module, in order to switch on different data-transmission modes, so that a pair of data-transmission mode that should motherboard to be provided according to this host board testing program, carry out a board under test test procedure between this motherboard and this board under test further to make by the quick pin interface of this periphery component interconnection and this peripheral component interconnection rapid slot interface; And

A power supply of this board under test is supplied or cut off to one power module when being used to this board under test and being connected in this peripheral component interconnection rapid slot interface,, so that a hot plug action to be provided.

2. the test macro of peripheral component interconnection rapid slot according to claim 1 is characterized in that, this host board testing program comprises one and connects test, highway width test, bus speed test and a power supply test.

3. the test macro of peripheral component interconnection rapid slot according to claim 2 is characterized in that, this host board testing program also comprises System Management Bus test, a data transmission pressure test, burning test and Remote Wake Up test.

4. the test macro of peripheral component interconnection rapid slot according to claim 3 is characterized in that, also comprises a string type electric EEPROM, and this burning test is that this string type electric EEPROM is tested.

5. the test macro of peripheral component interconnection rapid slot according to claim 1, it is characterized in that this board under test test procedure comprises System Management Bus test, burning test, highway width test, bus speed test and board under test functional test.

6. the test macro of peripheral component interconnection rapid slot according to claim 5, it is characterized in that, in order to the test data of carrying out this board under test test procedure is to transfer to this board under test by this motherboard via the quick pin interface of this periphery component interconnection, this data transmission module and this peripheral component interconnection rapid slot interface, and the test result that this board under test test procedure produces is to transfer to this motherboard by this board under test via the quick pin interface of this peripheral component interconnection rapid slot interface, this data transmission module and this periphery component interconnection.

7. the method for testing of a peripheral component interconnection rapid slot is characterized in that, comprises the following step:

The test macro of one peripheral component interconnection rapid slot is provided, comprises a quick pin interface of a periphery component interconnection and a peripheral component interconnection rapid slot interface, respectively in order to connect a motherboard and a board under test;

This motherboard is carried out a host board testing program;

Supply this board under test one power supply;

Switch to data-transmission mode that should motherboard according to this host board testing program;

According to this data-transmission mode, make by the quick pin interface of this periphery component interconnection and this peripheral component interconnection rapid slot interface and to carry out a board under test test procedure between this motherboard and this board under test; And

This board under test one hot plug action is provided, after finishing, when this motherboard does not cut off the power supply, cuts off this power supply of this board under test, directly to remove this board under test in this board under test test.

8. the method for testing of peripheral component interconnection rapid slot according to claim 7 is characterized in that, the step of this motherboard being carried out this host board testing program also comprises the following step:

Carry out one and connect test;

Carry out highway width test;

Carry out bus speed test; And

Carry out a power supply test.

9. the method for testing of peripheral component interconnection rapid slot according to claim 8, it is characterized in that, this host board testing program also comprises System Management Bus test, a data transmission pressure test, burning test and Remote Wake Up test, and this board under test test procedure comprises System Management Bus test, burning test, highway width test, bus speed test and board under test functional test.

10. the method for testing of peripheral component interconnection rapid slot according to claim 9, it is characterized in that, this test macro also comprises a string type electric EEPROM, and this burning test is that this string type electric EEPROM is tested.

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