Accompanying drawing explanation
Fig. 1 represents the sensing apparatus according to the embodiment of the present invention;
The signal timing diagram of the sensing apparatus 1 of Fig. 2 presentation graphs 1;
Fig. 3 represents the phase inverter according to the embodiment of the present invention;
Fig. 4 represents the comparer according to the embodiment of the present invention; And
Fig. 5 represents the electronic equipment according to the embodiment of the present invention.
[main element symbol description]
Fig. 1:
1~sensing apparatus; 10~photo-sensitive cell;
11~comparator circuit; 12~logical circuit;
110~phase inverter; 111~Resetting Switching;
112~low-pass filter; 113~Sheffer stroke gate;
114~comparer; 120,121~phase inverter;
122~SR-latch; 123~with door;
Cr~replacement capacitor; Cf~feedback condenser;
Iphoto~current signal;
N10, N11, N12, N13~node;
VN10, VN12, VN13~voltage signal;
V114~compare result signal;
BV114~anti-phase compare result signal;
VBQ~anti-phase latch output signal;
VQ~latch output signal; Vout~sensing output signal;
Vreset~reset signal; VDD, VSS~voltage source;
The replacement input end of R~SR-latch;
The set input of S~SR-latch;
The output terminal of Q, BQ~SR-latch.
Fig. 2:
During Ps~setting; Pd~during sensing.
Fig. 3:
30-32~PMOS transistor; 33-34~nmos pass transistor;
IN30~input end; OUT30~output terminal.
Fig. 4:
40-42~PMOS transistor; 43-45~nmos pass transistor;
IN40~input end; OUT40~output terminal;
N40, N41~node.
Fig. 5:
5~electronic equipment; 50~panel.
Embodiment
For above-mentioned purpose of the present invention, feature and advantage can be become apparent, a preferred embodiment cited below particularly, and coordinate accompanying drawing, be described in detail below.
Fig. 1 represents the sensing apparatus according to the embodiment of the present invention.Consult Fig. 1, sensing apparatus 1 is in order to light sensing, and produces sensing output signal Vout according to the intensity of light.Sensing apparatus 1 comprises photo-sensitive cell 10, comparator circuit 11, logical circuit 12, replacement capacitor Cr and feedback condenser Cf.In this embodiment, photo-sensitive cell 10 is realized with photodiode (photodiode), and its negative electrode couples voltage source V DD, and its anode couples node N10.The first end of replacement capacitor Cr receives reset signal Vreset, and its second end couples node N10.Feedback condenser Cf is coupled between logical circuit 12 and node N10.
Consult Fig. 1, comparator circuit 11 comprises phase inverter 110, Resetting Switching 111, low-pass filter 112, Sheffer stroke gate 113 and comparer 114.The input end of phase inverter 110 couples node N10, and its output terminal couples node N11.Resetting Switching 111 is coupled between node N10 and N11.The input end of low-pass filter 112 couples node N11, and its output terminal couples node N12.One input end of Sheffer stroke gate 113 couples node N12, its another input end receives reset signal Vreset and its output terminal couples node N13.The input end of comparer 114 couples node N13, and its output terminal signal V114 that bears results.
Logical circuit 12 comprise phase inverter 120 and 121, SR-latch 122 and with door 123.The input end of phase inverter 120 couples the output terminal of comparer 114 with reception result signal V114, and the output terminal of phase inverter 120 produces anti-phase consequential signal BV114.The replacement input end R of SR-latch 122 couples the output terminal of phase inverter 120 to receive anti-phase consequential signal BV114, and its set input S receives reset signal Vreset.The output terminal Q of SR-latch 122 produces latch output signal VQ, and its output terminal BQ produces anti-phase latch output signal VBQ.The output terminal that couples phase inverter 120 with an input end of door 123 couples SR-latch 122 output terminal BQ to receive anti-phase consequential signal BV114, its another input end produces sensing output signal Vout to receive anti-phase latch output signal VBQ and its output terminal.
The signal timing diagram of the sensing apparatus 1 of Fig. 2 presentation graphs 1.Consult Fig. 1 and Fig. 2, sensing apparatus 1, before entering during sensing Pd, can be introduced into and set period P s.Setting period P s, reset signal Vreset is enabled, and becomes high logic level from low logic level.Resetting Switching 111 is according to the reset signal Vreset of high logic level and not conducting.In addition, replacement capacitor C r charges according to reset signal Vreset, and the level of the voltage signal VN10 of node N10 is improved.Due to the positive light sensing of photo-sensitive cell 10 and generation current Iphoto, make to reduce gradually at the level of setting voltage signal VN10 in period P s.Voltage signal VN10 via the performed operated in anti-phase of phase inverter 110 after, input to low-pass filter 112.Low-pass filter 112 carries out High frequency filter to the inversion signal of voltage signal VN10, to produce the voltage signal VN12 of low logic level on node N12.Sheffer stroke gate 113 receives the voltage signal VN12 of low logic level and the reset signal Vreset of high logic level.Sheffer stroke gate 113 is carried out logical operation to voltage signal VN12 and reset signal Vreset, and produces the voltage signal VN13 of high logic level in node N13.Comparer 114 receiver voltage signal VN13, and by voltage signal VN13 and a threshold value comparison, with the signal V114 that bears results.Consult Fig. 2, setting period P s, the level of voltage signal VN13, higher than threshold value, makes consequential signal V114 in low logic level.Consequential signal V114 then provides to the input end of the interior phase inverter 120 of logical circuit 12.After the operated in anti-phase of the consequential signal V114 of low logic level via phase inverter 120, produced the anti-phase consequential signal BV114 of high logic level by the output terminal of phase inverter 120.Now, the anti-phase consequential signal BV114 of high logic level is sent to the replacement input end R of SR-latch 122.The set input S of SR-latch 122 receives reset signal Vreset.SR-latch 122 produces the latch output signal VQ of high logic level in output terminal Q according to the reset signal Vreset of the anti-phase consequential signal BV114 of high logic level and high logic level, and produce the anti-phase latch output signal VBQ of low logic level in output terminal BQ.Receive the anti-phase consequential signal BV114 of high logic level with an input end of door 123, and its another input end receives the anti-phase latch output signal VBQ of low logic level.Therefore produce the sensing output signal Vout of low logic level with door 123.
In the process reducing gradually at the level of voltage signal VN10, voltage signal VN12 and VN13 also can be along with changes.Consult Fig. 2, when the level of voltage signal VN10 is during lower than a specific voltage, comparer 114 compares voltage signal VN13 lower than threshold value, and consequential signal V114 becomes high logic level.In this embodiment, this specific voltage value is 2.28V.After the operated in anti-phase of the consequential signal V114 of high logic level via phase inverter 120, produced the anti-phase consequential signal BV114 of low logic level by the output terminal of phase inverter 120.Now, the anti-phase consequential signal BV114 of low logic level is sent to the replacement input end R of SR-latch 122.SR-latch 122 produces the latch output signal VQ of low logic level in output terminal Q according to the reset signal Vreset of the anti-phase consequential signal BV114 of low logic level and high logic level, and produce the anti-phase latch output signal VBQ of high logic level in output terminal BQ.Receive the anti-phase consequential signal BV114 of low volume of level and the anti-phase latch output signal VBQ of high logic level with door 123.Therefore, maintain the sensing output signal Vout of output low logic level with door 123.
Now, the signal that transmits high level via the operated in anti-phase of phase inverter 121 due to the latch output signal VQ of low logic level is to feedback condenser Cf, and therefore feedback condenser Cf charging, improves again the level of the voltage signal VN10 of node N10 once again.Afterwards, photo-sensitive cell 10 still continues light sensing with generation current Iphoto, and the level of voltage signal VN10 is also reduced gradually.The inversion signal of the voltage signal VN10 that low-pass filter 112 produces phase inverter 110 carries out High frequency filter, to produce the voltage signal VN12 of low logic level on node N12.The voltage signal VN12 of Sheffer stroke gate 113 to low logic level and the reset signal Vreset of high logic level carry out logical operation, make voltage signal VN13 get back to once again high logic level.Because voltage signal VN13 is higher than threshold value, therefore, comparer 114 via comparative voltage signal VN13 and threshold value after, the consequential signal V114 of its generation becomes low logic level from high logic level.The anti-phase consequential signal BV114 that phase inverter 120 produces becomes high logic level from low logic level.Now, SR-latch 122 continues to produce the latch output signal VQ of low logic level in output terminal Q according to the reset signal Vreset of the anti-phase consequential signal BV114 of high logic level and high logic level, and continue to produce the anti-phase latch output signal VBQ of high logic level in output terminal BQ.Therefore,, according to the anti-phase latch output signal VBQ of the anti-phase consequential signal BV114 of high logic level and high logic level, the sensing output signal Vout producing with door 123 is converted to high logic level by low logic level.
Because the level of voltage signal VN10 reduces gradually, when voltage signal VN13 is during lower than threshold value, the consequential signal V114 that comparer 114 produces becomes high logic level from low logic level.Therefore, anti-phase consequential signal BV114 becomes low logic level from high logic level.Now, the anti-phase consequential signal BV114 of low logic level is sent to the replacement input end R of SR-latch 122.SR-latch 122 continues to produce the latch output signal VQ of low logic level in output terminal Q according to the reset signal Vreset of the anti-phase consequential signal BV114 of low logic level and high logic level, and continue to produce the anti-phase latch output signal VBQ of high logic level in output terminal BQ.Receive the anti-phase consequential signal BV114 of low volume of level and the anti-phase latch output signal VBQ of high logic level with door 123.Therefore the sensing output signal Vout, producing with door 123 becomes low logic level from high logic level.During being maintained at high logic level, sensing output signal Vout is called during sensing Pd.
According to above-mentioned, in comparator circuit 11, owing to disposing low-pass filter 112 before comparer 114, therefore can filtering be present in the radio-frequency component/noise in current signal Iphoto, make comparer 114 can correctly compare operation, and follow-up logical circuit 12 also correctly actuating logic operate to produce sensing output signal Vout.In this embodiment, the cutoff frequency of low-pass filter 112 is less than 20kHz.
In addition, in this embodiment, the gain of comparator circuit 11 (being the equivalent gain summation of phase inverter 110 and comparer 114) is lower, for example, be less than 10.Therefore,, even if current signal Iphoto has radio-frequency component/noise, because the gain of comparator circuit 11 is lower, making sensing output signal Vout can seriously not be subject to radio-frequency component/noise affects.
Moreover in this embodiment, replacement capacitor Cr and feedback condenser Cf have larger capacitance, its capacitance scope is 50fF to 500fF.Therefore reduce the impact on current signal Iphoto of high-frequency signal or noise.
Fig. 3 represents the phase inverter 110 according to the embodiment of the present invention.Consult Fig. 3, phase inverter 110 comprises PMOS transistor 30-32 and nmos pass transistor 33-34.The input end IN30 receiver voltage signal VN10 of phase inverter 110, and its output terminal OUT30 produces the inversion signal of voltage signal VN10.PMOS transistor 30 and 31 is series between voltage source V DD and output terminal OUT30.The grid of PMOS transistor 30 and 31 is by input end IN30 receiver voltage signal VN10.Nmos pass transistor 33 and 34 is series between output terminal OUT30 and voltage source V SS.The grid of nmos pass transistor 30 and 31 is by input end IN30 receiver voltage signal VN10.PMOS transistor 32 is coupled between input end IN30 and output terminal OUT30, and its grid receives reset signal Vreset.
Fig. 4 represents the comparer 114 according to the embodiment of the present invention.Consult Fig. 4, comparer 114 comprises PMOS transistor 40-42 and nmos pass transistor 43-45.The input end IN40 receiver voltage signal VN13 of comparer 114, and its output terminal OUT40 signal V114 that bears results.PMOS transistor 40 and 41 is series between voltage source V DD and output terminal OUT40.The grid of PMOS transistor 40 and 41 is by input end IN40 receiver voltage signal VN13. Nmos pass transistor 43 and 44 is series between output terminal OUT40 and voltage source V SS.The grid of nmos pass transistor 43 and 44 is by input end IN40 receiver voltage signal VN13.PMOS transistor 42 is coupled between voltage source V SS and the common tie point N40 of transistor 40 and 41, and its grid reception result signal V114.Nmos pass transistor 45 is coupled between voltage source V DD and the common tie point N41 of transistor 43 and 44, and its grid receives compare result signal V114.The phase inverter of the 3rd and 4 figure and comparer are only as the example of demonstration, are not limited to this.
Fig. 5 represents the electronic equipment according to the embodiment of the present invention.Consult Fig. 5, electronic equipment 5 comprises the sensing apparatus 1 and panel 50 of Fig. 1.Sensing apparatus 1 sensitive context brightness and generation sensing output signal Vout are with the brightness of control panel 50.50 of panels show corresponding image with the brightness being determined according to sensing output signal Vout.In this embodiment, electronic equipment 5 can be personal digital assistant (PDA), mobile phone (cellular phone), digital camera, TV, GPS (GPS), vehicle display, display, digital frame (digital photo frame), mobile computer or desktop PC for aviation.
Though the present invention with preferred embodiment openly as above; so it is not in order to limit scope of the present invention, those skilled in the art, without departing from the spirit and scope of the present invention; when doing a little change and retouching, therefore protection scope of the present invention is when being as the criterion depending on the appended claims person of defining.