CN102221814A - Multi-jointed plate testboard - Google Patents
Multi-jointed plate testboard Download PDFInfo
- Publication number
- CN102221814A CN102221814A CN 201010148922 CN201010148922A CN102221814A CN 102221814 A CN102221814 A CN 102221814A CN 201010148922 CN201010148922 CN 201010148922 CN 201010148922 A CN201010148922 A CN 201010148922A CN 102221814 A CN102221814 A CN 102221814A
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- China
- Prior art keywords
- base
- drop front
- test
- flaps
- test board
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 230000003139 buffering effect Effects 0.000 claims description 3
- 230000007306 turnover Effects 0.000 abstract 3
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 4
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- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a multi-jointed plate testboard, which is mainly used for testing quartz watch movements and mainly solves the problem of testing efficiency. The multi-jointed plate testboard adopts the technical scheme as follows: a body structure of the testboard is formed by a base, a cylinder and a movable panel; more than two regions are divided on the movable panel according to the sizes and shapes of turnover plates; and test pins are correspondingly mounted on each region according to the distribution situations of test nodes of movements on the turnover plates. More than two turnover plates are correspondingly fixed on the base and the fixing positions are located by technical bolts. The multi-jointed plate testboard has the advantage of improving efficiency by times.
Description
Technical field
The present invention relates to a kind of testing apparatus, refer in particular to the test board of Quartzcrystal watch movement.
Background technology
At present, common test board is made of parts such as base, cylinder, drop fronts, and movement to be measured generally is fixed on all flaps, and all flaps are placed on the base; Flexible testing needle on drop front, the testing needle correspondence test node, and along with the upper and lower slip of drop front, testing needle leaves node or contact node.Common test board is tested all flap at every turn.Testing power supply line and signal wire generally all directly are welded on the flexibility test pin.
Summary of the invention
Purpose: invent a kind of test board that can test all flaps more than 2 and 2 simultaneously.
Technical scheme: the test board agent structure is made of base, cylinder, drop front, on drop front, by the size and dimension of all flaps, tell the zone more than 2 or 2, in each zone, according to the test node distribution situation of movement on all flaps, the corresponding arrangement gone up testing needle.
On drop front, settle the single or multiple lift wiring board, by the wiring on the wiring board, testing needle is connected with the corresponding terminal of wiring board periphery, calibrating terminal is again by in wire harness and the corresponding test instrumentation connection.This wire laying mode can increase wiring density on the one hand, maintains easily on the one hand.
On the test board base, all flap fixed stations are arranged, the subregion of corresponding drop front, can corresponding fix all flaps more than 2 or 2 on the fixed station, there is the arrangement fabrication hole fixed position, during test by technology latch location on all flaps, latch is plugged corresponding fabrication hole, fixedly all flaps of polylith.
Along with sliding up and down of drop front, the testing needle of subregion just can disconnect or be connected simultaneously with all flaps of the polylith on the fixed station, by test instrumentation, just can carry out batch testing, significantly improves efficient.
On base, between base and drop front, be mounted with elastic buffering mechanism, be used to protect testing needle, prolong the life-span of test board.
Advantage: serious testing, raise the efficiency; The terminal wiring maintains easily.
Description of drawings
Fig. 1 is the front schematic view of test board, and Fig. 2 is the schematic top plan view of test board.Among the figure, 1-cylinder, 2-flexibility test pin canned paragraph, 3-connecting terminal block, 4-multilayer circuit board, the 5-drop front, 6-flexibility test pin active segment, 7-week flap fixed station, 8-latch, 9-snubber assembly, 10-test board base, 11 (11-1,11-2,11-3)-the testing needle zone.
Embodiment
Below, reach embodiment in conjunction with the accompanying drawings, the present invention will be further described.
Embodiment is 3 test boards of even piecing together, and its main structural components is: 1-cylinder, 2-flexibility test pin canned paragraph, the 3-connecting terminal block, 4-multilayer circuit board, 5-drop front, 6-flexibility test pin active segment, 7-week flap fixed station, 8-latch, 9-snubber assembly, 10-test board base, 11 (11-1,11-2,11-3)-the testing needle zone.
Wherein, cylinder (1) adopts the cylinder that guide rail structure is arranged, and the stiff end of cylinder is fixed on the test board base, and the movable end of cylinder is fixed on the drop front.Motion by cylinder drives moving up and down of drop front.
On drop front (5),, 3 zone (11-1 have been told by the size and dimension (generally being rectangle sheet material) of all flaps, 11-2,11-3), in each zone, according to the test node distribution situation of Quartzcrystal watch movement on all flaps, the corresponding arrangement gone up testing needle (2).
On drop front, settled multilayer circuit board (4), by the wiring on the wiring board, testing needle (2) is connected with the corresponding terminal (3) of wiring board periphery, calibrating terminal again by wire harness with on corresponding test instrumentation connects.This wire laying mode can increase wiring density on the one hand, maintains easily on the one hand.
On test board base (10), all flap fixed stations (7) are arranged, the subregion (11) of corresponding drop front, can correspondence fix 3 all flaps on the fixed station, there is the arrangement fabrication hole fixed position, during test by technology latch (8) location on all flaps, latch is plugged corresponding fabrication hole, can fix 3 all flaps.
Along with sliding up and down of drop front, the testing needle of subregion just can disconnect or be connected simultaneously with 3 all flaps on the fixed station, by test instrumentation, just can carry out batch testing, significantly improves efficient.
On base, between base and drop front, be mounted with elastic buffering mechanism (9), be used to protect testing needle, prolong the life-span of test board.
Claims (4)
1. jigsaw test board more than a kind is made of base, cylinder, drop front, it is characterized in that: on drop front, by the size and dimension of all flaps, tell the zone more than 2 or 2, in each zone, according to the test node distribution situation of movement on all flaps, the corresponding arrangement gone up testing needle.
2. many jigsaw test board as claimed in claim 1 is characterized in that: on drop front, settle the single or multiple lift wiring board, by the wiring on the wiring board, testing needle is connected with the corresponding terminal of wiring board periphery.
3. many jigsaw test board as claimed in claim 1 is characterized in that: on the test board base, all flap fixed stations are arranged, the subregion of corresponding drop front can corresponding be fixed all flaps more than 2 or 2 on the fixed station, and the fixed position is located by the technology latch.
4. many jigsaw test board as claimed in claim 1 is characterized in that: on base, between base and drop front, be mounted with elastic buffering mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010148922 CN102221814A (en) | 2010-04-19 | 2010-04-19 | Multi-jointed plate testboard |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010148922 CN102221814A (en) | 2010-04-19 | 2010-04-19 | Multi-jointed plate testboard |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102221814A true CN102221814A (en) | 2011-10-19 |
Family
ID=44778390
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010148922 Pending CN102221814A (en) | 2010-04-19 | 2010-04-19 | Multi-jointed plate testboard |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102221814A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104460298A (en) * | 2013-09-16 | 2015-03-25 | 无锡百科知识产权有限公司 | Test method of timepiece movements |
| CN105004361A (en) * | 2015-08-05 | 2015-10-28 | 四川永贵科技有限公司 | Multifunctional general wiring harness detection platform |
| CN109597296A (en) * | 2018-10-19 | 2019-04-09 | 珠海经济特区南森科技有限公司 | A kind of auto clock ageing management system and method |
| CN118707832A (en) * | 2024-08-29 | 2024-09-27 | 深圳市高进实业有限公司 | A watch button detection method and system |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6617843B2 (en) * | 2001-01-15 | 2003-09-09 | Techwing Co., Ltd. | Contactor of the device for testing semiconductor device |
| CN1959425A (en) * | 2005-10-31 | 2007-05-09 | 富士通株式会社 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method |
| CN101258416A (en) * | 2005-09-07 | 2008-09-03 | 日本电气株式会社 | Semiconductor device inspecting apparatus and power supply unit |
| CN201749132U (en) * | 2010-03-18 | 2011-02-16 | 深圳市瑞必达电源有限公司 | Test fixture |
-
2010
- 2010-04-19 CN CN 201010148922 patent/CN102221814A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6617843B2 (en) * | 2001-01-15 | 2003-09-09 | Techwing Co., Ltd. | Contactor of the device for testing semiconductor device |
| CN101258416A (en) * | 2005-09-07 | 2008-09-03 | 日本电气株式会社 | Semiconductor device inspecting apparatus and power supply unit |
| CN1959425A (en) * | 2005-10-31 | 2007-05-09 | 富士通株式会社 | Semiconductor apparatus testing arrangement and semiconductor apparatus testing method |
| CN201749132U (en) * | 2010-03-18 | 2011-02-16 | 深圳市瑞必达电源有限公司 | Test fixture |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104460298A (en) * | 2013-09-16 | 2015-03-25 | 无锡百科知识产权有限公司 | Test method of timepiece movements |
| CN105004361A (en) * | 2015-08-05 | 2015-10-28 | 四川永贵科技有限公司 | Multifunctional general wiring harness detection platform |
| CN109597296A (en) * | 2018-10-19 | 2019-04-09 | 珠海经济特区南森科技有限公司 | A kind of auto clock ageing management system and method |
| CN118707832A (en) * | 2024-08-29 | 2024-09-27 | 深圳市高进实业有限公司 | A watch button detection method and system |
| CN118707832B (en) * | 2024-08-29 | 2024-10-25 | 深圳市高进实业有限公司 | Watch button detection method and system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20111019 |