CN102489817B - Apparatus for removing a half semiconductor chip - Google Patents
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- CN102489817B CN102489817B CN201110402497.6A CN201110402497A CN102489817B CN 102489817 B CN102489817 B CN 102489817B CN 201110402497 A CN201110402497 A CN 201110402497A CN 102489817 B CN102489817 B CN 102489817B
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 50
- 238000010438 heat treatment Methods 0.000 claims abstract description 110
- 239000000463 material Substances 0.000 claims abstract description 3
- 239000000758 substrate Substances 0.000 claims description 15
- 238000000034 method Methods 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001256 stainless steel alloy Inorganic materials 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Abstract
Description
技术领域 technical field
本发明涉及一种加热装置,尤其涉及一种有效防止对象损毁破裂的加热装置。 The invention relates to a heating device, in particular to a heating device which can effectively prevent objects from being damaged and broken. the
背景技术Background technique
在许多的电子产品中会使用半导体芯片,这些半导体芯片通常藉由焊锡或异向性导电胶膜固定在一基板上。当半导体芯片与基板的电性连接不良或是半导体芯片本身存有缺陷时,有必要移除已固定在基板上的半导体芯片。 Semiconductor chips are used in many electronic products, and these semiconductor chips are usually fixed on a substrate by solder or anisotropic conductive adhesive film. When the electrical connection between the semiconductor chip and the substrate is poor or the semiconductor chip itself has defects, it is necessary to remove the semiconductor chip fixed on the substrate. the
在现有技术中,并无适当的装置或设备将固定在基板上的半导体芯片移除。通常是通过手工的方式,利用一加热设备来加热半导体芯片,再以一夹具将半导体芯片拔除。在上述操作过程中,很容易造成半导体芯片破裂损毁,而无法进行后续分析或进行重工(rework)。 In the prior art, there is no proper device or equipment to remove the semiconductor chips fixed on the substrate. Usually, a heating device is used to heat the semiconductor chip manually, and then a jig is used to remove the semiconductor chip. During the above operation process, the semiconductor chip is likely to be broken and damaged, making subsequent analysis or rework impossible. the
另一方面,在许多电子产品中,半导体芯片的周围设置有其它组件。若以手工方式移除半导体芯片,常常发生移除半导体芯片时,损坏周边的其它组件。 On the other hand, in many electronic products, semiconductor chips are surrounded by other components. If the semiconductor chip is removed manually, it often happens that other surrounding components are damaged when the semiconductor chip is removed. the
有鉴于此,如何设计一种崭新的设备,来移除已固定在基板上的半导体芯片,是业内技术人员亟需解决的一项课题。 In view of this, how to design a brand-new device to remove the semiconductor chips fixed on the substrate is a problem that technicians in the industry need to solve urgently. the
发明内容Contents of the invention
针对现有技术中,存在的以手工方式移除半导体芯片,会损坏周边的其它组件的缺陷,本发明提供了一种加热装置。 Aiming at the defect in the prior art that manually removing the semiconductor chip will damage other surrounding components, the present invention provides a heating device. the
根据本发明的一个方面提供一种加热装置,使能移除固设于基材上的一对象,且在移除的过程中,能有效地避免对象损毁或破裂。此加热装置包含一加热部以及一推抵部。加热部具有一加热面,用以加热欲移除的对象。推抵部由加热部的一端向下延伸,推抵部邻近加热面的一侧具有一推抵面,且推抵面大致垂直加热面。 According to one aspect of the present invention, there is provided a heating device capable of removing an object fixed on a substrate and effectively preventing the object from being damaged or broken during the removal process. The heating device includes a heating part and a pushing part. The heating part has a heating surface for heating the object to be removed. The pushing portion extends downward from one end of the heating portion, and the pushing portion has a pushing surface on a side adjacent to the heating surface, and the pushing surface is substantially perpendicular to the heating surface. the
优选地,推抵面邻接加热面。 Preferably, the abutment surface adjoins the heating surface. the
优选地,加热面以及推抵面实质上为平面。 Preferably, the heating surface and the pushing surface are substantially plane. the
优选地,加热部具有多个第一气孔,且每一些第一气孔具有一开口位于加热面上。 Preferably, the heating part has a plurality of first air holes, and each of the first air holes has an opening on the heating surface. the
优选地,推抵部具有多个第二气孔,且每一些第二气孔具有一开口位于推抵面上。 Preferably, the pushing portion has a plurality of second air holes, and each of the second air holes has an opening on the pushing surface. the
优选地,此加热装置更包含一连接部,连接部实体连接加热部,并用以传递热能至加热部。 Preferably, the heating device further includes a connection part, the connection part is physically connected to the heating part, and is used for transferring heat energy to the heating part. the
优选地,加热面的一宽度为1mm至5mm,且加热面的一长度为0.5公分至3公分。 Preferably, a width of the heating surface is 1 mm to 5 mm, and a length of the heating surface is 0.5 cm to 3 cm. the
优选地,推抵部具有一底面连接推抵面,且底面垂直推抵面。 Preferably, the pushing portion has a bottom surface connected to the pushing surface, and the bottom surface is perpendicular to the pushing surface. the
优选地,推抵部远离加热面的一侧具有一斜面,且推抵部的一底部的厚度为0.5mm至3mm。 Preferably, the side of the pushing portion away from the heating surface has an inclined surface, and a bottom of the pushing portion has a thickness of 0.5 mm to 3 mm. the
根据本发明的另一个方面提供一种用以移除一半导体芯片的装置,半导体芯片系通过一导电层固定于一基材上。此装置包含一加热部以及一推抵部。加热部具有一加热面,用以接触并加热 半导体芯片的一上表面,藉此使导电层受热熔化。推抵部由加热部的一端向下延伸,推抵部邻近加热面的一侧具有一推抵面,且推抵面大致垂直加热面,推抵部用以对半导体芯片施予一接触力,以移除半导体芯片。 According to another aspect of the present invention, there is provided an apparatus for removing a semiconductor chip fixed on a substrate through a conductive layer. The device includes a heating part and a pushing part. The heating part has a heating surface for contacting and heating an upper surface of the semiconductor chip, thereby causing the conductive layer to be heated and melted. The pushing portion extends downward from one end of the heating portion, and the pushing portion has a pushing surface adjacent to the heating surface, and the pushing surface is substantially perpendicular to the heating surface, and the pushing portion is used to exert a contact force on the semiconductor chip, to remove the semiconductor chip. the
采用本发明可以迅速地移除原本固设在基材上的对象,并且有效地防止对象损毁破裂。 The invention can quickly remove the object originally fixed on the base material, and effectively prevent the object from being damaged and broken. the
附图说明 Description of drawings
读者在参照附图阅读了本发明的具体实施方式以后,将会更清楚地了解本发明的各个方面。其中, Readers will have a clearer understanding of various aspects of the present invention after reading the detailed description of the present invention with reference to the accompanying drawings. in,
图1示出本发明一实施方式的加热装置的立体示意图。 Fig. 1 shows a schematic perspective view of a heating device according to an embodiment of the present invention. the
图2示出本发明另一实施方式的加热装置的剖面示意图。 Fig. 2 shows a schematic cross-sectional view of a heating device according to another embodiment of the present invention. the
图3示出本发明又一实施方式的加热装置的剖面示意图。 Fig. 3 shows a schematic cross-sectional view of a heating device according to another embodiment of the present invention. the
图4示出本发明再一实施方式的加热装置的剖面示意图。 Fig. 4 shows a schematic cross-sectional view of a heating device according to yet another embodiment of the present invention. the
【主要组件符号说明】 【Description of main component symbols】
100:加热装置 100: heating device
110:加热部 110: heating department
110a:加热部的一端 110a: one end of the heating part
112:加热面 112: heating surface
114:第一气孔 114: First stomata
114a:开口 114a: opening
120:推抵部 120: Pushing Department
120a:底部 120a: Bottom
122:推抵面 122: push face
124:第二气孔 124: second stomata
124a:开口 124a: opening
126:底面 126: bottom surface
128:斜面 128: Bevel
130:连接部 130: Connecting part
130a:顶部 130a: Top
132:凹槽 132: Groove
134:供气通道 134: air supply channel
140:半导体芯片 140: Semiconductor chip
142:导电层 142: Conductive layer
144:主动数组基板 144: Active array substrate
146:彩色滤光片 146: color filter
W:宽度 W: width
L:长度 L: Length
T:厚度 T: Thickness
F:箭头 F: Arrow
具体实施方式 Detailed ways
为了使本揭示内容的叙述更加详尽与完备,下文针对了本发明的实施方式与具体实施例提出了说明性的描述;但这并非实施或运用本发明具体实施例的唯一形式。以下所揭露的各实施例,在有益的情形下可相互组合或取代,也可在一实施例中附加其它的实施例,而无须进一步的记载或说明。 In order to make the description of the present disclosure more detailed and complete, the following provides illustrative descriptions for the implementation modes and specific examples of the present invention; but this is not the only form for implementing or using the specific embodiments of the present invention. The various embodiments disclosed below can be combined or replaced with each other when beneficial, and other embodiments can also be added to one embodiment, without further description or illustration. the
在以下描述中,将详细叙述许多特定细节以使读者能够充分理解以下的实施例。然而,可在无此等特定细节的情况下实践本发明的实施例。在其它情况下,为简化图式,熟知的结构与装置仅示意性地绘示于图中。 In the following description, numerous specific details will be set forth in order to enable readers to fully understand the following embodiments. However, embodiments of the invention may be practiced without these specific details. In other instances, well-known structures and devices are only schematically shown in order to simplify the drawings. the
下面参照附图,对本发明的具体实施方式作进一步的详细描述。图1示出本发明一实施方式的加热装置100的立体示意图。参照图1,加热装置100包含加热部110以及推抵部120。 The specific implementation manners of the present invention will be described in further detail below with reference to the accompanying drawings. FIG. 1 shows a schematic perspective view of a heating device 100 according to an embodiment of the present invention. Referring to FIG. 1 , the heating device 100 includes a heating part 110 and a pushing part 120 . the
加热部110具有加热面112,用以加热一对象。加热部110可为诸如不锈钢材料或铝合金等金属材料所制成,使加热部具有良好的热传导性能。在一实施例中,加热面112实质上为平面。加热面112的宽度W可例如为1mm至5mm,具体地为约2mm。加热面112的长度L可例如为0.5公分至3公分,具体地为1至2公分。加热部110可使加热面112产生300℃以上的高温。 The heating part 110 has a heating surface 112 for heating an object. The heating part 110 can be made of metal materials such as stainless steel or aluminum alloy, so that the heating part has good thermal conductivity. In one embodiment, the heating surface 112 is substantially flat. The width W of the heating surface 112 may be, for example, 1 mm to 5 mm, specifically about 2 mm. The length L of the heating surface 112 may be, for example, 0.5 cm to 3 cm, specifically 1 to 2 cm. The heating unit 110 can generate a high temperature of 300° C. or higher on the heating surface 112 . the
在一实施方式中,加热装置100更包含一连接部130。连接部130实体连接加热部110,并用以传递热能至加热部110。举例而言,连接部130的顶部130a可用以连接至一热源,例如热风枪或烙铁。因此,热量可经由连接部130而传递至加热部110的加热面112。 In one embodiment, the heating device 100 further includes a connecting portion 130 . The connection part 130 is physically connected to the heating part 110 and is used for transferring heat energy to the heating part 110 . For example, the top 130a of the connecting portion 130 can be used to connect to a heat source, such as a heat gun or a soldering iron. Therefore, heat can be transferred to the heating surface 112 of the heating part 110 through the connection part 130 . the
推抵部120由加热部110的一端110a向下延伸。推抵部120邻近加热面112的一侧具有一推抵面122,并且推抵面122大致垂直加热面112。在一实施例中,推抵面122实质上为平面,并且推抵面122邻接于加热面112。在另一实施例中,推抵部120具有一底面126。底面126实质上也为一平面,底面126邻接并垂直于推 抵面122。换言之,底面126大致平行于加热面112。底面126与加热面112之间的垂直距离可例如为1-3mm。推抵部120的厚度T可例如为0.5-3mm。 The pushing portion 120 extends downward from the end 110 a of the heating portion 110 . The pushing portion 120 has a pushing surface 122 adjacent to the heating surface 112 , and the pushing surface 122 is substantially perpendicular to the heating surface 112 . In one embodiment, the pushing surface 122 is substantially flat, and the pushing surface 122 is adjacent to the heating surface 112 . In another embodiment, the pushing portion 120 has a bottom surface 126 . The bottom surface 126 is also substantially a plane, and the bottom surface 126 is adjacent to and perpendicular to the pushing surface 122. In other words, the bottom surface 126 is substantially parallel to the heating surface 112 . The vertical distance between the bottom surface 126 and the heating surface 112 may be, for example, 1-3 mm. The thickness T of the pushing portion 120 may be, for example, 0.5-3 mm. the
图2示出本发明另一实施方式的加热装置100的剖面示意图。在本实施方式中,加热装置100中具有供气信道134,供气信道134由连接部130内部延伸至加热部110以及推抵部120的内部。加热部110具有多个第一气孔114,第一气孔114具有一开口114a位于加热面112上。类似地,推抵部120具有多个第二气孔124,第二气孔124具有一开口124a位于推抵面122上。供气通道134连通这些第一气孔114以及第二气孔124。因此,可以藉由供气通道134供给高温空气A至第一气孔114以及第二气孔124,使高温空气A由开口114a及开口124a流出,而得以加热一物件。在一实施例中,可以仅配置加热部110的第一气孔114,而没有设置推抵部120的第二气孔124。 FIG. 2 shows a schematic cross-sectional view of a heating device 100 according to another embodiment of the present invention. In this embodiment, the heating device 100 has an air supply channel 134 , and the air supply channel 134 extends from the inside of the connection part 130 to the inside of the heating part 110 and the pushing part 120 . The heating part 110 has a plurality of first air holes 114 , and the first air holes 114 have an opening 114 a located on the heating surface 112 . Similarly, the pushing portion 120 has a plurality of second air holes 124 , and the second air holes 124 have an opening 124 a located on the pushing surface 122 . The air supply channel 134 communicates with the first air holes 114 and the second air holes 124 . Therefore, the high-temperature air A can be supplied to the first air hole 114 and the second air hole 124 through the air supply channel 134 , and the high-temperature air A can flow out from the opening 114 a and the opening 124 a to heat an object. In an embodiment, only the first air hole 114 of the heating part 110 may be configured without the second air hole 124 of the pushing part 120 . the
图3示出本发明又一实施方式的加热装置100的剖面示意图。在本实施方式中,推抵部120远离加热面112的一侧具有一斜面128。推抵部120的底部120a的厚度T可例如为0.5mm至3mm。 FIG. 3 shows a schematic cross-sectional view of a heating device 100 according to another embodiment of the present invention. In this embodiment, the pushing portion 120 has an inclined surface 128 on a side away from the heating surface 112 . The thickness T of the bottom 120 a of the pushing portion 120 may be, for example, 0.5 mm to 3 mm. the
本发明的加热装置100系用以移除固设在基材上的一对象。在一具体应用中,对象为半导体芯片140,且半导体芯片140通过导电层142固定于主动数组基板144上,如图3所示。导电层142例如为异向性导电胶层(ACF)。主动数组基板144上还配置有彩色滤光片146。当为了分析的需要或其它原因而必须移除半导体芯片 140时,便可使用加热装置100来移除半导体芯片。以下将详述其工作原理。 The heating device 100 of the present invention is used for removing an object fixed on a substrate. In a specific application, the object is a semiconductor chip 140 , and the semiconductor chip 140 is fixed on the active array substrate 144 through the conductive layer 142 , as shown in FIG. 3 . The conductive layer 142 is, for example, an anisotropic conductive layer (ACF). A color filter 146 is also disposed on the active array substrate 144 . When it is necessary to remove the semiconductor chip 140 for analysis or other reasons, the heating device 100 can be used to remove the semiconductor chip. How it works is described in detail below. the
首先,将加热装置100移动至适当位置,使加热部110的加热面112接触半导体芯片140的上表面,推抵部120的推抵面122接触半导体芯片140的侧表面。然后,藉由加热部110的加热面112来加热半导体芯片140,使半导体芯片140的温度升高,并通过热传导原理,使半导体芯片140下方的导电层142受热熔化。此时,沿箭头F的方向移动加热装置100,使推抵部120的推抵面122对半导体芯片140施予一接触力,而将半导体芯片140由主动数组基板144上移除。 First, move the heating device 100 to a proper position, make the heating surface 112 of the heating part 110 contact the upper surface of the semiconductor chip 140 , and the contact surface 122 of the contact part 120 contact the side surface of the semiconductor chip 140 . Then, the semiconductor chip 140 is heated by the heating surface 112 of the heating part 110 , the temperature of the semiconductor chip 140 is raised, and the conductive layer 142 under the semiconductor chip 140 is heated and melted by the principle of heat conduction. At this time, move the heating device 100 in the direction of the arrow F, so that the pushing surface 122 of the pushing portion 120 exerts a contact force on the semiconductor chip 140 to remove the semiconductor chip 140 from the active array substrate 144 . the
在上述应用中,因为半导体芯片140与彩色滤光片146之间的间隙宽度是有限制的,例如为3mm。因此,根据本发明的一实施方式,推抵部120的厚度T为0.5mm至3mm。此外,为了避免在移除半导体芯片140的过程中损害半导体芯片140,推抵面122大致垂直加热面112。所谓“大致垂直”是指推抵面122实质上垂直于加热面112,使加热面112与推抵面122可分别稳固地接触半导体芯片140的上表面及侧表面。例如,推抵面122与加热面112之间形成一夹角为85-95度,更明确地为约90度。 In the above application, the width of the gap between the semiconductor chip 140 and the color filter 146 is limited, for example, 3mm. Therefore, according to an embodiment of the present invention, the thickness T of the pushing portion 120 is 0.5 mm to 3 mm. In addition, in order to avoid damaging the semiconductor chip 140 during the process of removing the semiconductor chip 140 , the pushing surface 122 is substantially perpendicular to the heating surface 112 . The so-called “approximately vertical” means that the pushing surface 122 is substantially perpendicular to the heating surface 112 , so that the heating surface 112 and the pushing surface 122 can firmly contact the upper surface and the side surface of the semiconductor chip 140 respectively. For example, an included angle formed between the pushing surface 122 and the heating surface 112 is 85-95 degrees, more specifically about 90 degrees. the
图4示出本发明再一实施方式的加热装置100的剖面示意图。在本实施方式中,推抵面122不直接邻接或连接加热面112。具体而言,推抵面122与加热面112之间具有一凹槽132。凹槽132用以容置半导体芯片140的边缘144,以避免在移除半导体芯片140的过程中,造成半导体芯片140的边缘144破裂。 FIG. 4 shows a schematic cross-sectional view of a heating device 100 according to yet another embodiment of the present invention. In this embodiment, the pushing surface 122 is not directly adjacent to or connected to the heating surface 112 . Specifically, there is a groove 132 between the pushing surface 122 and the heating surface 112 . The groove 132 is used for accommodating the edge 144 of the semiconductor chip 140 , so as to prevent the edge 144 of the semiconductor chip 140 from being cracked during the process of removing the semiconductor chip 140 . the
由上述本发明实施方式可知,应用本发明可以迅速地移除原本固设在基材上的对象,并且有效地防止对象损毁破裂。根据本发明的实施方式,可适用于移除显示面板上的半导体芯片,避免半导体芯片在移除的过程中破裂。 From the above embodiments of the present invention, it can be seen that the application of the present invention can quickly remove the object originally fixed on the substrate, and effectively prevent the object from being damaged or broken. According to the embodiment of the present invention, it is applicable to remove the semiconductor chip on the display panel, so as to prevent the semiconductor chip from cracking during the removal process. the
上文中,参照附图描述了本发明的具体实施方式。但是,本领域中的普通技术人员能够理解,在不偏离本发明的精神和范围的情况下,还可以对本发明的具体实施方式作各种变更和替换。这些变更和替换都落在本发明权利要求书限定的范围内。 Hereinbefore, specific embodiments of the present invention have been described with reference to the accompanying drawings. However, those skilled in the art can understand that without departing from the spirit and scope of the present invention, various changes and substitutions can be made to the specific embodiments of the present invention. These changes and replacements all fall within the scope defined by the claims of the present invention. the
Claims (11)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110402497.6A CN102489817B (en) | 2011-12-02 | 2011-12-02 | Apparatus for removing a half semiconductor chip |
| TW101102206A TWI473177B (en) | 2011-12-02 | 2012-01-19 | Heating device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110402497.6A CN102489817B (en) | 2011-12-02 | 2011-12-02 | Apparatus for removing a half semiconductor chip |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102489817A CN102489817A (en) | 2012-06-13 |
| CN102489817B true CN102489817B (en) | 2015-02-04 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110402497.6A Expired - Fee Related CN102489817B (en) | 2011-12-02 | 2011-12-02 | Apparatus for removing a half semiconductor chip |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN102489817B (en) |
| TW (1) | TWI473177B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106292020A (en) * | 2015-05-27 | 2017-01-04 | 凌巨科技股份有限公司 | Heating body and heating unit |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2115852U (en) * | 1992-02-21 | 1992-09-16 | 吴泽民 | Tin soldering bit for quick welding electronic device |
| CN2189024Y (en) * | 1994-05-29 | 1995-02-08 | 孟凡寅 | Shovel shaped soldering iron |
| CN2329473Y (en) * | 1998-06-29 | 1999-07-21 | 周晓元 | Dual-purpose electric soldering iron for fast detaching integrated circuit chip |
| CN201397435Y (en) * | 2009-05-26 | 2010-02-03 | 上海晨兴希姆通电子科技有限公司 | IC removing device |
| CN102045953A (en) * | 2009-10-22 | 2011-05-04 | 西安中科麦特电子技术设备有限公司 | Heating component of reflow soldering machine |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6410696A (en) * | 1987-07-02 | 1989-01-13 | Fujitsu Ltd | Apparatus for removing flat-lead-type component |
| US5054681A (en) * | 1990-07-25 | 1991-10-08 | Kim Henry I | Component desoldering tool |
| US7168609B2 (en) * | 2002-09-03 | 2007-01-30 | International Business Machines Corporation | Method and apparatus for removing known good die |
| US6745932B2 (en) * | 2002-09-03 | 2004-06-08 | International Business Machines Corp. | Low strain chip removal apparatus |
-
2011
- 2011-12-02 CN CN201110402497.6A patent/CN102489817B/en not_active Expired - Fee Related
-
2012
- 2012-01-19 TW TW101102206A patent/TWI473177B/en not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2115852U (en) * | 1992-02-21 | 1992-09-16 | 吴泽民 | Tin soldering bit for quick welding electronic device |
| CN2189024Y (en) * | 1994-05-29 | 1995-02-08 | 孟凡寅 | Shovel shaped soldering iron |
| CN2329473Y (en) * | 1998-06-29 | 1999-07-21 | 周晓元 | Dual-purpose electric soldering iron for fast detaching integrated circuit chip |
| CN201397435Y (en) * | 2009-05-26 | 2010-02-03 | 上海晨兴希姆通电子科技有限公司 | IC removing device |
| CN102045953A (en) * | 2009-10-22 | 2011-05-04 | 西安中科麦特电子技术设备有限公司 | Heating component of reflow soldering machine |
Non-Patent Citations (1)
| Title |
|---|
| JP昭64-10696A 1989.01.13 * |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201324630A (en) | 2013-06-16 |
| CN102489817A (en) | 2012-06-13 |
| TWI473177B (en) | 2015-02-11 |
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