[go: up one dir, main page]

CN103067013B - Craft imbalance non-sensitive cyclic analog-digital converter and conversion method - Google Patents

Craft imbalance non-sensitive cyclic analog-digital converter and conversion method Download PDF

Info

Publication number
CN103067013B
CN103067013B CN201210555862.1A CN201210555862A CN103067013B CN 103067013 B CN103067013 B CN 103067013B CN 201210555862 A CN201210555862 A CN 201210555862A CN 103067013 B CN103067013 B CN 103067013B
Authority
CN
China
Prior art keywords
capacitor
linkage
terminal
linkage switch
negative
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201210555862.1A
Other languages
Chinese (zh)
Other versions
CN103067013A (en
Inventor
徐江涛
聂凯明
姚素英
史再峰
高静
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TIANJIN SAIXIANG ELECTROMECHANICAL ENGINEERING CO LTD
Original Assignee
Tianjin University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tianjin University filed Critical Tianjin University
Priority to CN201210555862.1A priority Critical patent/CN103067013B/en
Publication of CN103067013A publication Critical patent/CN103067013A/en
Application granted granted Critical
Publication of CN103067013B publication Critical patent/CN103067013B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Amplifiers (AREA)

Abstract

本发明涉及微电子学的集成电路设计领域。为降低Cyclic ADC对工艺失调的敏感度,提升Cyclic ADC的线性度,为达到上述目的,本发明采取的技术方案是,工艺失调非敏感的循环式模数转换器,由乘法数模转换器进行模数转换和循环乘2操作,还包括数字校正电路、寄存器;乘法数模转换器由1.5bit子ADC、DAC、联动开关S1-S13、联动开关Sw1-Sw2和电容C1P、C1N、C2P、C2N、C3P、C3N组成。本发明主要应用于集成电路设计。

The present invention relates to the field of integrated circuit design in microelectronics. In order to reduce the sensitivity of Cyclic ADC to process misadjustment and improve the linearity of Cyclic ADC, in order to achieve the above-mentioned purpose, the technical solution adopted by the present invention is that the non-sensitive cyclic analog-to-digital converter of process misalignment is performed by a multiplication digital-to-analog converter. Analog-to-digital conversion and circular multiplication by 2 operations, including digital correction circuits and registers; the multiplication digital-to-analog converter consists of 1.5bit sub-ADC, DAC, linkage switches S 1 -S 13 , linkage switches S w1 -S w2 and capacitor C 1P , Composed of C 1N , C 2P , C 2N , C 3P , and C 3N . The invention is mainly applied to integrated circuit design.

Description

工艺失调非敏感的循环式模数转换器及转换方法Process offset insensitive cyclic analog-to-digital converter and conversion method

技术领域technical field

本发明涉及微电子学的集成电路设计领域,尤其涉及一种工艺失调非敏感的循环式模数转换器及转换方法。The invention relates to the field of integrated circuit design of microelectronics, in particular to a non-sensitive circulation analog-to-digital converter and a conversion method of process imbalance.

背景技术Background technique

Cyclic ADC(Cyclic Analog-to-Digital Converter,循环式模数转换器)具有结构简单、速度高、功耗低和面积小的优点,其被广泛应用在各种传感器读出电路中,例如CMOS图像传感器。对于每次循环输出1.5bit的Cyclic ADC的等效电路结构如图1所示,模拟输入信号经过MDAC(Multiplying Digital-to-analog,乘法数模转换器)进行模数转换和循环乘2操作,所有循环输出的数字信号经过RSD(Redundant Signed Digit)数字校正电路处理后还原为最终转换后的数字信号,最后由寄存器进行输出。Cyclic ADC工作中需要对模拟信号进行精确的乘2操作以保证ADC具有足够的线性度。乘2电路一般是通过开关电容电路实现,其中电容的失配会影响乘2的精度。随着集成电路工艺特征尺寸的减小,集成电路消耗的功耗也在逐步降低,但是器件的失配变得更加严重,这就更加恶化了Cyclic ADC中乘2电路的增益精度,进而降低了Cyclic ADC的线性度。在现有技术中可采用数字校准的方法来解决器件失配的问题,但是这样势必会增加数字电路的规模和复杂度。现有技术提供的Cyclic ADC失调消除方法是采用反馈电容交叉反接存入负向失调电压,然后与每次循环的正向失调进行叠加消除,此方法可以将Cyclic ADC的等效输入失调电压变为近似为0,但是失调存储阶段系统存在正、负两个反馈环路,必须负反馈的强度大于正反馈系统才可稳定,因此系统存在不稳定因素,降低了系统的稳定性。Cyclic ADC (Cyclic Analog-to-Digital Converter, Cyclic Analog-to-Digital Converter) has the advantages of simple structure, high speed, low power consumption and small area, and it is widely used in various sensor readout circuits, such as CMOS image sensor. The equivalent circuit structure of a Cyclic ADC that outputs 1.5 bits per cycle is shown in Figure 1. The analog input signal is converted by MDAC (Multiplying Digital-to-analog, multiplication digital-to-analog) for analog-to-digital conversion and cycle multiplication by 2. All the cyclically output digital signals are processed by the RSD (Redundant Signed Digit) digital correction circuit and then restored to the final converted digital signal, which is finally output by the register. Cyclic ADC needs to accurately multiply the analog signal by 2 to ensure that the ADC has sufficient linearity. The multiplication by 2 circuit is generally implemented by a switched capacitor circuit, and the mismatch of the capacitance will affect the accuracy of the multiplication by 2. With the reduction of the feature size of the integrated circuit process, the power consumption of the integrated circuit is also gradually reduced, but the mismatch of the device becomes more serious, which further deteriorates the gain accuracy of the multiplied by 2 circuit in the Cyclic ADC, thereby reducing the Linearity of Cyclic ADC. In the prior art, a digital calibration method can be used to solve the problem of device mismatch, but this will inevitably increase the scale and complexity of the digital circuit. The Cyclic ADC offset elimination method provided by the prior art is to store the negative offset voltage in the cross-reverse connection of the feedback capacitor, and then superimpose and eliminate it with the positive offset of each cycle. This method can change the equivalent input offset voltage of the Cyclic ADC to is approximately 0, but there are positive and negative feedback loops in the system in the imbalance storage stage, and the negative feedback must be stronger than the positive feedback system to be stable, so there are unstable factors in the system, which reduces the stability of the system.

发明内容Contents of the invention

本发明旨在克服现有技术的不足,降低Cyclic ADC对工艺失调的敏感度,提升CyclicADC的线性度,为达到上述目的,本发明采取的技术方案是,工艺失调非敏感的循环式模数转换器,由乘法数模转换器进行模数转换和循环乘2操作,还包括数字校正电路、寄存器;乘法数模转换器由1.5bit子ADC、DAC、联动开关S1-S13、联动开关Sw1-Sw2和电容C1P、C1N、C2P、C2N、C3P、C3N组成,Vinp经联动开关S1连接到电容C1P负极,C1P正极经联动开关S4分为四路,一路经联动开关Sw1接运放同相输入端,一路经联动开关Sw2接运放反相输入端,一路经联动开关S13连接到电容C2P正端,电容C2P负端经联动开关S11连接到输出端VoutP,一路经联动开关S10连接到电容C3P正端,电容C3P负端经联动开关S3连接到输出端VoutP;电容C3P两端间接有联动开关S9,电容C3P正极经联动开关S8接地;The present invention aims to overcome the deficiencies of the prior art, reduce the sensitivity of Cyclic ADC to process imbalance, and improve the linearity of CyclicADC. The multiplication digital-to-analog converter performs analog-to-digital conversion and circular multiplication by 2 operations, and also includes digital correction circuits and registers; the multiplication digital-to-analog converter consists of 1.5bit sub-ADC, DAC, linkage switches S 1 -S 13 , linkage switch S w1 -S w2 is composed of capacitors C 1P , C 1N , C 2P , C 2N , C 3P , and C 3N . V inp is connected to the negative pole of capacitor C 1P via linkage switch S 1 , and the positive pole of C 1P is divided into four via linkage switch S 4 One way is connected to the non-inverting input terminal of the op amp through the linkage switch Sw 1 , the other is connected to the inverting input terminal of the op amp through the linkage switch Sw 2 , and the other way is connected to the positive terminal of the capacitor C 2P through the linkage switch S 13 , and the negative terminal of the capacitor C 2P is linked The switch S 11 is connected to the output terminal V outP , one path is connected to the positive terminal of the capacitor C 3P through the linkage switch S 10 , and the negative terminal of the capacitor C 3P is connected to the output terminal V outP through the linkage switch S 3 ; there are linkage switches at both ends of the capacitor C 3P S 9 , the positive pole of capacitor C 3P is grounded through linkage switch S 8 ;

VinN经联动开关S1连接到电容C1N负极,C1N正极经联动开关S4分为四路,一路经开关联动Sw2接运放同相输入端,一路经联动开关Sw1接运放反相输入端;一路经联动开关S13连接到电容C2N正端,电容C2N负端经联动开关S11连接到输出端VoutN,一路经联动开关S10连接到电容C3N正端,电容C3N负端经联动开关S3连接到输出端VoutN;电容C3N两端间接有联动开关S9,电容C3N正极经联动开关S8接地;V inN is connected to the negative pole of capacitor C 1N through the linkage switch S 1 , and the positive pole of C 1N is divided into four circuits through the linkage switch S 4. One path is connected to the non-inverting input terminal of the op amp through the linkage switch Sw 2 , and the other path is connected to the op amp reverse terminal through the linkage switch Sw 1 . Phase input terminal; one path is connected to the positive terminal of capacitor C 2N through linkage switch S 13 , the negative terminal of capacitor C 2N is connected to output terminal V outN through linkage switch S 11 , one path is connected to the positive terminal of capacitor C 3N through linkage switch S 10 , and the capacitor The negative terminal of C 3N is connected to the output terminal V outN through the linkage switch S 3 ; the linkage switch S 9 is indirectly connected to both ends of the capacitor C 3N , and the positive pole of the capacitor C 3N is grounded through the linkage switch S 8 ;

C1N正极、C1P正极分别经联动开关S5接地,C1N负极、C1P负极分别经联动开关S2接地;C1N负极、C1P负极分别经联动开关S3接地对应连接到输出端VoutN、VoutPThe positive pole of C 1N and the positive pole of C 1P are respectively grounded through the linkage switch S 5 , the negative pole of C 1N and the negative pole of C 1P are respectively grounded through the linkage switch S 2 ; the negative pole of C 1N and the negative pole of C 1P are respectively connected to the output terminal V through the grounding of the linkage switch S 3 outN , V outP ;

运放同相、反相输入端分别经联动开关S1对应连接到运放负、正输出端;运放负输出端分别经联动开关Sw1、Sw2对应连接到输出端VoutP、VoutN;运放正输出端分别经联动开关Sw1、Sw2对应连接到输出端VoutN、VoutPThe non-inverting and inverting input terminals of the operational amplifier are respectively connected to the negative and positive output terminals of the operational amplifier through the linkage switch S1 ; the negative output terminals of the operational amplifier are respectively connected to the output terminals V outP and V outN through the linkage switches Sw 1 and Sw 2 ; The positive output terminals of the operational amplifier are respectively connected to the output terminals V outN and V outP through the linkage switches Sw 1 and Sw 2 ;

DAC的VDAC+分别经联动开关S6、S7连接到电容C1P、电容C3P的负端;V DAC+ of the DAC is connected to the negative terminals of capacitor C 1P and capacitor C 3P through linkage switches S 6 and S 7 respectively;

DAC的VDAC-分别经联动开关S6、S7连接到电容C1N、电容C3N的负端;V DAC- of the DAC is connected to the negative terminals of capacitor C 1N and capacitor C 3N through linkage switches S 6 and S 7 respectively;

1.5bit子ADC分别连接输出端VoutN、VoutPThe 1.5bit sub-ADC is respectively connected to the output terminals V outN and V outP .

工艺失调非敏感的循环式模数转换方法,借助于前述转换器实现,并包括如下步骤:The process offset-insensitive cyclic analog-to-digital conversion method is realized by means of the aforementioned converter, and includes the following steps:

通过操控联动开关S1-S13、联动开关Sw1-Sw2,使运放依次工作在八种状态:By manipulating the linkage switches S 1 -S 13 and linkage switches S w1 -S w2 , the op amp can work in eight states in sequence:

a:VinN、Vinp分别对应经电容C1N、C1P对应连接到运放反相、同相输入端,运放同相端接负反馈并经电容C2P接地,运放反相端接正反馈并经电容C2N接地,电容C3P、C3N两端短接到地;a: V inN and V inp are respectively connected to the inverting and non-inverting input terminals of the op amp through the capacitors C 1N and C 1P respectively . And grounded through the capacitor C 2N , the two ends of the capacitor C 3P and C 3N are shorted to the ground;

b:地经电容C1N、C1P对应连接到运放反相、同相输入端,运放同相端经电容C2P接负反馈,运放反相端经电容C2N接正反馈,电容C3P、C3N两端短接到地;b: The ground is connected to the inverting and non-inverting input terminals of the op amp through the capacitors C 1N and C 1P , the non-inverting terminal of the op amp is connected to the negative feedback through the capacitor C 2P , the inverting terminal of the op amp is connected to the positive feedback through the capacitor C 2N , and the capacitor C 3P , C 3N both ends are shorted to ground;

c:地经电容C2N、C2P对应连接到运放反相、同相输入端,运放同相端经电容C1P接负反馈,运放反相端经电容C1N接正反馈,正、负反馈端分别经电容C3P、C3N接地;c: The ground is connected to the inverting and non-inverting input terminals of the operational amplifier through capacitors C 2N and C 2P . The feedback terminals are respectively grounded through capacitors C 3P and C 3N ;

d:b中的电容C1N、C1P位置换为电容C3N、C3P,且电容C3N、C3P对应b中的电容C1N、C1P接地的极板分别接DAC的正负输出VDAC+、VDAC-,电容C1N、C1P浮空;d: Capacitors C 1N and C 1P in b are replaced by capacitors C 3N and C 3P , and capacitors C 3N and C 3P correspond to capacitors C 1N and C 1P in b. The grounded plates are respectively connected to the positive and negative output V of the DAC DAC+ , V DAC- , capacitors C 1N , C 1P floating;

e:运放同相端经电容C1P接负反馈,运放反相端经电容C1N接正反馈,正、负反馈端分别经电容C3P、C3N接地,电容C2P、C2N浮空;e: The non-inverting terminal of the operational amplifier is connected to the negative feedback through the capacitor C 1P , the inverting terminal of the operational amplifier is connected to the positive feedback through the capacitor C 1N , the positive and negative feedback terminals are respectively grounded through the capacitors C 3P and C 3N , and the capacitors C 2P and C 2N are floating ;

f:c中的C1P与C3P、C1N与C3N调换位置;f: C 1P and C 3P , C 1N and C 3N in c are exchanged;

g:d中的C1P与C3P、C1N与C3N调换位置;g: C 1P and C 3P , C 1N and C 3N in d are exchanged;

h:e中的C1P与C3P、C1N与C3N调换位置;h: C 1P and C 3P , C 1N and C 3N in e are exchanged;

在c状态,完成第一次循环的1.5bit输出,在f状态,完成第二次循环的1.5bit输出,在完成h状态的操作后继续进行c状态的操作,即完成了第三次循环的1.5bit输出,之后不断循环的从c状态依次变换到h状态直至达到所需的转换位数。In the c state, the 1.5bit output of the first cycle is completed. In the f state, the 1.5bit output of the second cycle is completed. After the operation of the h state is completed, the operation of the c state is continued, that is, the third cycle is completed. 1.5bit output, and then continuously cycle from c state to h state until the required number of conversion bits is reached.

本发明的技术特点及效果:Technical characteristics and effects of the present invention:

通过改进的MDAC结构和控制时序,使得Cyclic ADC的乘2增益与电容的比值无关,通过开关Sw1和Sw2控制完成对运放正负输入输出端互换操作,进而消除了运放的失调电压。最终使得Cyclic ADC每次循环输出电压值均与电容比值和运放失调无关,进而降低了CyclicADC对工艺失调的敏感度,提升了Cyclic ADC的线性度,同时降低了其输出失调。Through the improved MDAC structure and control timing, the multiplied gain of the Cyclic ADC is independent of the ratio of the capacitor, and the positive and negative input and output terminals of the op amp are interchanged through the control of switches Sw1 and Sw2, thereby eliminating the offset voltage of the op amp. Ultimately, the output voltage value of each cycle of the Cyclic ADC is independent of the capacitance ratio and the offset of the operational amplifier, thereby reducing the sensitivity of the Cyclic ADC to process offsets, improving the linearity of the Cyclic ADC, and reducing its output offset.

附图说明Description of drawings

图1Cyclic ADC的结构示意图。Figure 1 Schematic diagram of the structure of Cyclic ADC.

图2本发明描述的Cyclic ADC中MDAC电路结构。MDAC circuit structure in the Cyclic ADC described in the present invention of Fig. 2.

图3本发明描述的Cyclic ADC控制时序图。Fig. 3 is the timing diagram of Cyclic ADC control described in the present invention.

图4本发明描述的Cyclic ADC不同状态等效电路图。Fig. 4 is an equivalent circuit diagram of different states of the Cyclic ADC described in the present invention.

具体实施方式Detailed ways

本发明改进Cyclic ADC中的MDAC电路结构,使其乘2增益精度与电容的失配无关,通过翻转运放正负输入和输出消除MOS器件失配引入的失调电压,进而在保证电路稳定性的前提下提升Cyclic ADC的线性度并降低其输出失调,降低Cyclic ADC对工艺失调的敏感度。The present invention improves the MDAC circuit structure in the Cyclic ADC, so that the gain accuracy multiplied by 2 has nothing to do with the mismatch of the capacitor, and eliminates the offset voltage introduced by the mismatch of the MOS device by flipping the positive and negative input and output of the op amp, thereby ensuring the stability of the circuit Under the premise, improve the linearity of Cyclic ADC and reduce its output offset, and reduce the sensitivity of Cyclic ADC to process offset.

本发明描述的Cyclic ADC中的MDAC电路结构如图2所示,此MDAC由1.5bit子ADC、1.5Bit子DAC、开关S1-S13、开关Sw1-Sw2和三组电容C1P,N、C2P,N、C3P,N组成,其中V1和V2两个电压源用于模拟运放的等效输入差分失调电压,并假设运放的等效总失调电压为Vos。此MDAC的控制时钟如图3所示,在此时钟控制下MDAC一共有a-h八种状态,这8种状态的等效电路结构如图4(a)-4(h)所示。本发明描述的Cyclic ADC工作过程为:在MDAC的c状态,ADC完成第一次循环的1.5bit输出,在MDAC的f状态,ADC完成第二次循环的1.5bit输出,在MDAC完成h状态的操作后继续进行c状态的操作,即完成了第三次循环的1.5bit输出,之后MDAC不断循环的从c状态依次变换到h状态直至达到所需的转换位数。根据电荷守恒方程可以得到MDAC处于c状态时输出表达式为:The MDAC circuit structure in the Cyclic ADC described in the present invention is shown in Figure 2. The MDAC consists of a 1.5bit sub-ADC, a 1.5Bit sub-DAC, switches S 1 -S 13 , switches S w1 -S w2 and three sets of capacitors C 1P, N , C 2P, N , C 3P, N , where the two voltage sources V1 and V2 are used to simulate the equivalent input differential offset voltage of the op amp, and assume that the equivalent total offset voltage of the op amp is V os . The control clock of this MDAC is shown in Figure 3. Under the control of this clock, the MDAC has eight states ah, and the equivalent circuit structures of these eight states are shown in Figure 4(a)-4(h). The working process of the Cyclic ADC described in the present invention is: in the c state of MDAC, the ADC completes the 1.5bit output of the first cycle, in the f state of MDAC, the ADC completes the 1.5bit output of the second cycle, and completes the h state of the MDAC After the operation, the operation of the c state is continued, that is, the 1.5bit output of the third cycle is completed, and then the MDAC is continuously cyclically transformed from the c state to the h state until the required number of conversion bits is reached. According to the charge conservation equation, the output expression when MDAC is in the c state can be obtained as:

Voutp1-Voutn1=Vinp-Vinn                                        (1)V outp1 -V outn1 =V inp -V inn (1)

同样根据电荷守恒方程可以得到MDAC处于f状态时的输出表达式为:Also according to the charge conservation equation, the output expression of MDAC in f state can be obtained as:

Voutp2-Voutn2=2(Voutp1-Voutn1)-(VDAC1+-VDAC1-)                 (2)V outp2 -V outn2 =2(V outp1 -V outn1 )-(V DAC1 +-V DAC1- ) (2)

同理,当MDAC再次进入c状态时其输出表达式为:Similarly, when MDAC enters the c state again, its output expression is:

Voutp3-Voutn3=2(Voutp2-Voutn2)-(VDAC2+-VDAC2-)                 (3)V outp3 -V outn3 =2(V outp2 -V outn2 )-(V DAC2+ -V DAC2- ) (3)

可见,MDAC经过a、b和c三个状态后完成第一次循环,此后每经过三个相邻状态的操作完成一次循环,直至完成所需的循环次数。从公式1-3可以看出,MDAC每次循环输出的电压值是上次循环输出电压值的2倍,且此2倍增益与电容比值无关,此外MDAC输出中也不包含运放的失调电压。It can be seen that MDAC completes the first cycle after passing through the three states a, b and c, and then completes a cycle every time it passes through the operations of three adjacent states until the required number of cycles is completed. It can be seen from formula 1-3 that the voltage value output by MDAC in each cycle is twice the output voltage value in the previous cycle, and this double gain has nothing to do with the capacitance ratio. In addition, the output of MDAC does not include the offset voltage of the op amp. .

本发明描述的Cyclic ADC可工作在1.8V电源电压下,可使用的正负参考电压Vrefp和Vrefn分别为1.3V和0.5V,因此其量化的输入信号范围为-0.8V~+0.8V。MDAC中电容可采用大小为200fF的MIM电容,MDAC每个状态的操作时间为100ns,经过10次有效循环后输出10位数字信号。因为每次有限循环MDAC需要经过三个状态的操作,因此Cyclic ADC完成一次10bit的模数转换需要经过3μs的时间,即转换时间为3μs。Cyclic ADC的功耗约为220μW。The Cyclic ADC described in the present invention can work at a power supply voltage of 1.8V, and the usable positive and negative reference voltages Vrefp and Vrefn are 1.3V and 0.5V respectively, so the quantized input signal range is -0.8V~+0.8V. The capacitor in the MDAC can be a MIM capacitor with a size of 200fF. The operation time of each state of the MDAC is 100ns, and a 10-bit digital signal is output after 10 effective cycles. Because each finite-cycle MDAC needs to go through three-state operations, it takes 3 μs for the Cyclic ADC to complete a 10-bit analog-to-digital conversion, that is, the conversion time is 3 μs. The power consumption of Cyclic ADC is about 220μW.

Claims (2)

1.一种工艺失调非敏感的循环式模数转换器,由乘法数模转换器进行模数转换和循环乘2操作,其特征是,还包括数字校正电路、寄存器;乘法数模转换器由1.5bit子ADC、DAC、联动开关S1-S13、联动开关Sw1-Sw2和电容C1P、C1N、C2P、C2N、C3P、C3N组成,Vinp经联动开关S1连接到电容C1P负极,C1P正极经联动开关S4分为四路,一路经联动开关Sw1接运放同相输入端,一路经联动开关Sw2接运放反相输入端,一路经联动开关S13连接到电容C2P正端,电容C2P负端经联动开关S11连接到输出端VoutP,一路经联动开关S10连接到电容C3P正端,电容C3P负端经联动开关S3连接到输出端VoutP;电容C3P两端间接有联动开关S9,电容C3P正极经联动开关S8接地;1. A non-sensitive circulating analog-to-digital converter of process offset, carries out analog-to-digital conversion and cycle by 2 operation by multiplication digital-to-analog converter, is characterized in that, also comprises digital correction circuit, register; Multiplication digital-to-analog converter is composed of Composed of 1.5bit sub-ADC, DAC, linkage switches S 1 -S 13 , linkage switches S w1 -S w2 and capacitors C 1P , C 1N , C 2P , C 2N , C 3P , and C 3N , V inp passes through linkage switch S 1 Connect to the negative pole of capacitor C 1P , and the positive pole of C 1P is divided into four circuits through the linkage switch S4 , one path is connected to the non-inverting input terminal of the op amp through the linkage switch Sw 1 , one path is connected to the inverting input terminal of the op amp through the linkage switch Sw 2 , and one path is connected to the inverting input terminal of the op amp through the linkage switch Sw 2. The switch S 13 is connected to the positive terminal of the capacitor C 2P , the negative terminal of the capacitor C 2P is connected to the output terminal V outP through the linkage switch S 11 , one path is connected to the positive terminal of the capacitor C 3P through the linkage switch S 10 , and the negative terminal of the capacitor C 3P is connected to the linkage switch S 3 is connected to the output terminal V outP ; there is a linkage switch S 9 indirectly at both ends of the capacitor C 3P , and the positive pole of the capacitor C 3P is grounded through the linkage switch S 8 ; VinN经联动开关S1连接到电容C1N负极,C1N正极经联动开关S4分为四路,一路经联动开关Sw2接运放同相输入端,一路经联动开关Sw1接运放反相输入端;一路经联动开关S13连接到电容C2N正端,电容C2N负端经联动开关S11连接到输出端VoutN,一路经联动开关S10连接到电容C3N正端,电容C3N负端经联动开关S3连接到输出端VoutN;电容C3N两端间接有联动开关S9,电容C3N正极经联动开关S8接地;V inN is connected to the negative pole of capacitor C 1N through the linkage switch S 1 , and the positive pole of C 1N is divided into four circuits through the linkage switch S 4. One path is connected to the non-inverting input terminal of the op amp through the linkage switch Sw 2 , and the other path is connected to the op amp reverse terminal through the linkage switch Sw 1 . Phase input terminal; one path is connected to the positive terminal of capacitor C 2N through linkage switch S 13 , the negative terminal of capacitor C 2N is connected to output terminal V outN through linkage switch S 11 , one path is connected to the positive terminal of capacitor C 3N through linkage switch S 10 , and the capacitor The negative terminal of C 3N is connected to the output terminal V outN through the linkage switch S 3 ; the linkage switch S 9 is indirectly connected to both ends of the capacitor C 3N , and the positive pole of the capacitor C 3N is grounded through the linkage switch S 8 ; C1N正极、C1P正极分别经联动开关S5接地,C1N负极、C1P负极分别经联动开关S2接地;C1N负极、C1P负极分别经联动开关S3对应连接到输出端VoutN、VoutPThe positive pole of C 1N and the positive pole of C 1P are respectively grounded through the linkage switch S 5 , the negative pole of C 1N and the negative pole of C 1P are respectively grounded through the linkage switch S 2 ; the negative pole of C 1N and the negative pole of C 1P are respectively connected to the output terminal V outN through the linkage switch S 3 , V outP ; 运放同相、反相输入端分别经联动开关S1对应连接到运放负、正输出端;运放负输出端分别经联动开关Sw1、Sw2对应连接到输出端VoutP、VoutN;运放正输出端分别经联动开关Sw1、Sw2对应连接到输出端VoutN、VoutPThe non-inverting and inverting input terminals of the operational amplifier are respectively connected to the negative and positive output terminals of the operational amplifier through the linkage switch S1 ; the negative output terminals of the operational amplifier are respectively connected to the output terminals V outP and V outN through the linkage switches Sw 1 and Sw 2 ; The positive output terminals of the operational amplifier are respectively connected to the output terminals V outN and V outP through the linkage switches Sw 1 and Sw 2 ; DAC的VDAC+分别经联动开关S6、S7连接到电容C1P、电容C3P的负端;V DAC + of the DAC is respectively connected to the negative terminals of capacitor C 1P and capacitor C 3P via linkage switches S 6 and S 7 ; DAC的VDAC-分别经联动开关S6、S7连接到电容C1N、电容C3N的负端;The V DAC of the DAC is connected to the negative terminals of the capacitor C 1N and the capacitor C 3N through the linkage switches S 6 and S 7 respectively; 1.5bit子ADC分别连接输出端VoutN、VoutPThe 1.5bit sub-ADC is respectively connected to the output terminals V outN and V outP . 2.一种工艺失调非敏感的循环式模数转换方法,其特征是,借助于前述转换器实现,并包括如下步骤:2. A non-sensitive cyclic analog-to-digital conversion method for process imbalance, characterized in that it is realized by means of the aforementioned converter, and comprises the steps: 通过操控联动开关S1-S13、联动开关Sw1-Sw2,使运放依次工作在八种状态:By manipulating the linkage switches S 1 -S 13 and linkage switches S w1 -S w2 , the op amp can work in eight states in sequence: a:VinN、Vinp分别对应经电容C1N、C1P对应连接到运放反相、同相输入端,运放同相端接负反馈并经电容C2P接地,运放反相端接正反馈并经电容C2N接地,电容C3P、C3N两端短接到地;a: V inN and V inp are respectively connected to the inverting and non-inverting input terminals of the op amp through the capacitors C 1N and C 1P respectively . And grounded through the capacitor C 2N , the two ends of the capacitor C 3P and C 3N are shorted to the ground; b:地经电容C1N、C1P对应连接到运放反相、同相输入端,运放同相端经电容C2P接负反馈,运放反相端经电容C2N接正反馈,电容C3P、C3N两端短接到地;b: The ground is connected to the inverting and non-inverting input terminals of the op amp through the capacitors C 1N and C 1P , the non-inverting terminal of the op amp is connected to the negative feedback through the capacitor C 2P , the inverting terminal of the op amp is connected to the positive feedback through the capacitor C 2N , and the capacitor C 3P , C 3N both ends are shorted to ground; c:地经电容C2N、C2P对应连接到运放反相、同相输入端,运放同相端经电容C1P接负反馈,运放反相端经电容C1N接正反馈,正、负反馈端分别经电容C3P、C3N接地;c: The ground is connected to the inverting and non-inverting input terminals of the operational amplifier through capacitors C 2N and C 2P . The feedback terminals are respectively grounded through capacitors C 3P and C 3N ; d:b中的电容C1N、C1P位置换为电容C3N、C3P,且电容C3N、C3P对应b中的电容C1N、C1P接地的极板分别接DAC的正负输出VDAC+、VDAC-,电容C1N、C1P浮空;d: Capacitors C 1N and C 1P in b are replaced by capacitors C 3N and C 3P , and capacitors C 3N and C 3P correspond to capacitors C 1N and C 1P in b. The grounded plates are respectively connected to the positive and negative output V of the DAC DAC+ , V DAC- , capacitors C 1N , C 1P floating; e:运放同相端经电容C1P接负反馈,运放反相端经电容C1N接正反馈,正、负反馈端分别经电容C3P、C3N接地,电容C2P、C2N浮空;e: The non-inverting terminal of the operational amplifier is connected to the negative feedback through the capacitor C 1P , the inverting terminal of the operational amplifier is connected to the positive feedback through the capacitor C 1N , the positive and negative feedback terminals are respectively grounded through the capacitors C 3P and C 3N , and the capacitors C 2P and C 2N are floating ; f:c中的C1P与C3P、C1N与C3N调换位置;f: C 1P and C 3P , C 1N and C 3N in c are exchanged; g:d中的C1P与C3P、C1N与C3N调换位置;g: C 1P and C 3P , C 1N and C 3N in d are exchanged; h:e中的C1P与C3P、C1N与C3N调换位置;h: C 1P and C 3P , C 1N and C 3N in e are exchanged; 在c状态,完成第一次循环的1.5bit输出,在f状态,完成第二次循环的1.5bit输出,在完成h状态的操作后继续进行c状态的操作,即完成了第三次循环的1.5bit输出,之后不断循环的从c状态依次变换到h状态直至达到所需的转换位数。In the c state, the 1.5bit output of the first cycle is completed. In the f state, the 1.5bit output of the second cycle is completed. After the operation of the h state is completed, the operation of the c state is continued, that is, the third cycle is completed. 1.5bit output, and then continuously cycle from c state to h state until the required number of conversion bits is reached.
CN201210555862.1A 2012-12-18 2012-12-18 Craft imbalance non-sensitive cyclic analog-digital converter and conversion method Expired - Fee Related CN103067013B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210555862.1A CN103067013B (en) 2012-12-18 2012-12-18 Craft imbalance non-sensitive cyclic analog-digital converter and conversion method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210555862.1A CN103067013B (en) 2012-12-18 2012-12-18 Craft imbalance non-sensitive cyclic analog-digital converter and conversion method

Publications (2)

Publication Number Publication Date
CN103067013A CN103067013A (en) 2013-04-24
CN103067013B true CN103067013B (en) 2014-06-25

Family

ID=48109496

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210555862.1A Expired - Fee Related CN103067013B (en) 2012-12-18 2012-12-18 Craft imbalance non-sensitive cyclic analog-digital converter and conversion method

Country Status (1)

Country Link
CN (1) CN103067013B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104506192A (en) * 2014-12-26 2015-04-08 电子科技大学 Building method for ADC (analog to digital converter) design parameter and performance index quantitative model

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1866749A (en) * 2006-06-23 2006-11-22 清华大学 Method for reducing analog-digital converter capacitance mismatch error based on capacitance match
CN101330291A (en) * 2008-07-22 2008-12-24 中国电子科技集团公司第二十四研究所 Trimming Method of High Precision Digital-to-Analog Converter Resistor Network
CN101355363A (en) * 2007-07-23 2009-01-28 联发科技股份有限公司 Pipelined Analog-to-Digital Converter and Gain Error Correction Method
CN101917195A (en) * 2010-08-18 2010-12-15 中国电子科技集团公司第五十八研究所 A High Precision Low Offset Charge Comparator Circuit
CN102324940A (en) * 2011-06-29 2012-01-18 中国电子科技集团公司第二十四研究所 Multiplying DAC Corrects for Finite Gain Errors

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1866749A (en) * 2006-06-23 2006-11-22 清华大学 Method for reducing analog-digital converter capacitance mismatch error based on capacitance match
CN101355363A (en) * 2007-07-23 2009-01-28 联发科技股份有限公司 Pipelined Analog-to-Digital Converter and Gain Error Correction Method
CN101330291A (en) * 2008-07-22 2008-12-24 中国电子科技集团公司第二十四研究所 Trimming Method of High Precision Digital-to-Analog Converter Resistor Network
CN101917195A (en) * 2010-08-18 2010-12-15 中国电子科技集团公司第五十八研究所 A High Precision Low Offset Charge Comparator Circuit
CN102324940A (en) * 2011-06-29 2012-01-18 中国电子科技集团公司第二十四研究所 Multiplying DAC Corrects for Finite Gain Errors

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
10位20MSPS流水线A/D转换器的研究;李全胜;《天津大学硕士学位论文》;20040131;全文 *
基于数字误差校正的流水线A/D转换器的研究;张文忠;《天津大学硕士学位论文》;20050131;全文 *
张文忠.基于数字误差校正的流水线A/D转换器的研究.《天津大学硕士学位论文》.2005,全文.
李全胜.10位20MSPS流水线A/D转换器的研究.《天津大学硕士学位论文》.2004,全文.

Also Published As

Publication number Publication date
CN103067013A (en) 2013-04-24

Similar Documents

Publication Publication Date Title
CN104967451B (en) Gradual approaching A/D converter
CN107046424B (en) ADC background calibration with dual conversion
CN104124972B (en) 10-bit ultra-low-power successive approximation register analog-to-digital converter based on charge redistribution
CN109120268B (en) A dynamic comparator offset voltage calibration method
CN109639282B (en) A Low-Power Synchronous Register-Type Successive Approximation ADC with Single-Ended Input
CN112803946B (en) Capacitor mismatch and offset voltage correction method applied to high-precision successive approximation ADC (analog to digital converter)
CN103178855B (en) Be applied to the syllogic capacitor array structure of high accuracy gradually-appoximant analog-digital converter
CN109787633A (en) The Σ Δ ADC suitable for mixed type ADC structure with chopped wave stabilizing
CN106921391B (en) System-Level Error Correction SAR Analog-to-Digital Converter
CN105322966A (en) Capacitor switching and averaging method for improving linearity of successive approximation analog-digital converter
CN111327324B (en) A Capacitor Array Structure Suitable for Successive Approximation Analog-to-Digital Converter
CN108832928B (en) Common-mode voltage correction circuit of SAR ADC capacitor array and correction method thereof
CN111446964A (en) Novel fourteen-bit assembly line-successive approximation type analog-digital converter
JP2008104142A (en) Analog-to-digital converter
CN114978165A (en) Time-interleaved pipelined successive approximation analog-to-digital converter
CN115425983A (en) High-precision MASH type high-order noise shaping analog-to-digital converter
CN106953638B (en) Correction circuit for input parasitic capacitance of comparator
CN110176930B (en) Multi-bit resolution sub-pipeline structure for measuring transition heights of transfer curves
US11075646B2 (en) Σ-Δmodulator and method for reducing nonlinear error and gain error
CN102339084A (en) Analog front-end detection circuit for giant magnetoresistance biosensor
CN103067013B (en) Craft imbalance non-sensitive cyclic analog-digital converter and conversion method
CN119135166A (en) A passive feedforward noise shaping SAR ADC structure and quantization method
CN104796146B (en) A kind of memory effect eliminates low-power consumption analog-digital converter
CN113114258A (en) Successive approximation type analog-to-digital converter using unit bridge capacitor and quantization method thereof
CN115913230A (en) SAR ADC segmented structure low-segment parasitic correction method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20220704

Address after: No.9, Haitai development road 4, Huayuan new technology industrial park, Binhai New Area, Tianjin

Patentee after: Tianjin Saixiang Technology Co.,Ltd.

Address before: 300072 Tianjin City, Nankai District Wei Jin Road No. 92

Patentee before: Tianjin University

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20230705

Address after: 300384 block D, No. 9, Haitai development Fourth Road, Huayuan Industrial Zone (outside the ring), Binhai New Area, Tianjin

Patentee after: TIANJIN SAIXIANG ELECTROMECHANICAL ENGINEERING Co.,Ltd.

Address before: No.9, Haitai development road 4, Huayuan new technology industrial park, Binhai New Area, Tianjin

Patentee before: Tianjin Saixiang Technology Co.,Ltd.

TR01 Transfer of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140625

CF01 Termination of patent right due to non-payment of annual fee